CN107977626B - Grouping method for electronic equipment working data - Google Patents
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- CN107977626B CN107977626B CN201711244439.9A CN201711244439A CN107977626B CN 107977626 B CN107977626 B CN 107977626B CN 201711244439 A CN201711244439 A CN 201711244439A CN 107977626 B CN107977626 B CN 107977626B
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
- G06F2218/08—Feature extraction
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G06F2218/12—Classification; Matching
Abstract
A grouping method of electronic equipment working data is characterized in that sampling values of different working indexes in electronic equipment are collected at a fixed frequency, characteristic selection is carried out on the sampling values of the different working indexes to obtain the working index closest to the running state of the electronic equipment, the sampling values of the working indexes are used as basic training data, a grouping period of the working indexes is obtained through calculation, and grouping is carried out according to a time sequence; and then, judging the period of the fault according to the characteristic value of each piece of basic training data, grouping the basic training data according to the period of the fault, calculating two groups through a nonlinear state evaluation algorithm to obtain a fault threshold value, and realizing the universal fault detection of different types of electronic equipment.
Description
Technical Field
The invention relates to the technical field of fault monitoring, in particular to a grouping method of electronic equipment working data.
Background
At present, three maintenance modes of equipment are provided, namely, regular maintenance is carried out, and the maintenance method is high in cost and needs offline maintenance; secondly, after-fault maintenance, which is the mode of causing damage or other larger loss on equipment and belongs to after-fault maintenance; thirdly, some characteristic quantities of the equipment are monitored during the operation of the equipment to determine the state of the equipment (good, fault).
Obviously, the monitoring equipment has great advantages in operation, the maintenance cost is low, and meanwhile, the maintenance time and the equipment damage caused by faults are effectively reduced; however, the existing online monitoring alarm algorithm is poor in universality, is not suitable for different types of equipment, is high in cost of a simulated fault test, is difficult to obtain a fault sample, and cannot meet diversified requirements, for example, the fault sample is difficult to obtain during training, and the sample has an imbalance problem; the types of faults are many and are difficult to exhaust; the data volume is large, and the fault location is difficult.
Disclosure of Invention
Aiming at the technical problems and overcoming the defects in the prior art, the invention provides a method for grouping the working data of the electronic equipment, which realizes the good classification of the fault group and the normal data group.
In particular to a method for setting standard working indexes of electronic equipment, which comprises the following steps,
acquiring basic training data for training to generate standard working indexes of the electronic equipment; wherein the basic training data comprises sampling values of the running work of the electronic equipment sampled at a fixed frequency; the working index to which the sampling numerical value belongs is the same as the working index to which the standard working index belongs;
calculating a grouping period according to the basic training data, grouping the basic training data according to the grouping period, and determining the sequence number of each group according to the time sequence;
judging whether the basic training data group belongs to a fault group or not by calculating the time domain characteristic value of each basic training data group, and recording the group number of the fault group;
extracting a training sample group from the grouped basic training data according to the group number of the fault group; the group serial numbers of the basic training data groups included in the training sample group are continuous and do not belong to fault groups;
and calculating and generating a standard working index for judging whether the electronic equipment has faults during operation according to the training sample group.
As a further improvement, the calculating a grouping period according to the basic training data, grouping the basic training data according to the grouping period, and determining a sequence number of each group according to a time sequence includes the following steps,
performing Fourier transform on the sequence time domain characteristic value of the basic training data to obtain an intensity spectrum corresponding to the basic training data;
and screening the frequency component with the maximum amplitude from the intensity frequency spectrum, and taking the reciprocal of the frequency component with the maximum amplitude as a grouping period.
As a further improvement, the step of determining whether the basic training data group belongs to a fault group by calculating the time domain characteristic value of each basic training data group, and recording the group number of the fault group includes the steps of calculating the variance and the mean value of the basic training data of each group as the physical characteristic value of each group of basic training data, and if the recorded group number is recorded under the standard, determining that the basic training data group corresponding to the group number belongs to the group in which the fault belongs.
As a further improvement, the calculating and generating a standard working index for judging whether the electronic device has a fault during operation according to the training sample group comprises the following steps of dividing a grouped basic training data group into a training sample group and a testing sample group according to a group serial number of a group in which the fault exists in a time sequence; each basic training data group included in the training sample group does not belong to the group where the fault exists; the test sample group comprises at least one group in which the basic training data group is a fault group;
according to a nonlinear state evaluation algorithm, calculating each basic training data set in a training sample set to obtain a fault threshold value;
judging whether the group serial number of the basic training data group judged to have the fault in the test sample group is consistent with the recorded group serial number or not according to the fault threshold value;
and if so, taking the fault threshold value as a standard working index for judging whether the electronic equipment has faults or not in operation.
As a further improvement, the calculating each basic training data set in the training sample set according to the nonlinear state estimation algorithm to obtain the failure threshold specifically includes:
data at any moment in the test sample group is an observation vector;
extracting historical observation vectors in a plurality of training sample groups;
constructing a memory matrix by the plurality of historical observation vectors;
inputting the observation vector into the memory moment output to obtain a prediction vector;
and calculating the difference value of each observation vector except the observation vector of the group moment of the fault and the corresponding prediction vector, and determining the maximum difference value in the difference values as the fault threshold value.
As a further improvement, the relational expression of the observation vector and the prediction vector is
Wherein, yestFor the prediction vector, yestAnd D is the memory matrix.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic overall flow chart of a first embodiment of the present invention;
FIG. 2 is a schematic diagram of a spectrum of a C-phase output voltage of a UPS according to a first embodiment of the present invention;
fig. 3 is a schematic diagram illustrating the failure threshold of the UPS three-phase power supply according to the first embodiment of the present invention.
Fig. 4 is a schematic overall structure diagram of a second embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 (S10-S50), fig. 1 shows a first embodiment of the present invention, which includes the following steps,
s10, sampling values of each working index of the running work of the electronic equipment at a fixed frequency, and forming a time sequence corresponding to the working index by all the sampled values of each working index;
in the embodiment, the UPS three-phase power supply is used as electronic equipment to explain working indexes, sampling numerical values and time sequence sequences; the UPS three-phase power supply comprises a plurality of working indexes, including battery voltage, input frequency, A-phase input voltage, B-phase input voltage, C-phase input voltage, sensor numbers, A-phase output current, B-phase output current, C-phase output current, output frequency, A-phase output load, B-phase output load, C-phase output load, output state (normal 0/abnormal 1), A-phase output voltage, B-phase output voltage, C-phase output voltage, commercial power state (normal 0/failure 1)) and state marking (normal and alarm) of samples; respectively collecting the plurality of working indexes at a fixed frequency of sampling once every 10 minutes; and arranging the sampling values of each working index according to the time sequence to form time sequence data.
S20, selecting the characteristics of the time sequence corresponding to each working index, determining the working index with the maximum correlation degree with the running state of the electronic equipment and the time domain characteristic value of the working index sequence with the maximum correlation degree, and training data on the basis of the sampling value corresponding to the maximum working index;
the above mentioned feature selection mode can adopt general data algorithms such as a sequence backward selection algorithm and the like;
specifically, the performing feature selection on the time sequence corresponding to each working index to determine the working index with the maximum correlation with the operating state of the electronic device includes: extracting the characteristic value of the time sequence corresponding to each working index, and combining all sequence time domain characteristic values into a characteristic complete set of the time sequence; selecting the characteristics of the characteristic complete set of the time sequence by adopting a sequence backward selection algorithm; substituting the extracted sequence time domain characteristic values after the characteristic selection into an evaluation function, and providing sequence time domain characteristic values with poor classification effect to obtain optimal time sequence characteristic values; and determining the working index corresponding to the optimal characteristic value as the working index with the maximum correlation degree with the running state of the electronic equipment. In the example of the UPS three-phase power supply, the "C-phase input voltage" is an optimal characteristic that the correlation between the C-phase input voltage and the UPS power state is the largest; in other words, when the UPS power supply fails, the input voltage of the C phase also becomes abnormal; the UPS power supply operates normally, and the C-phase input voltage also operates normally, so that the working state of the whole UPS power supply can be reflected to determine whether the working state of the whole UPS power supply fails or not by detecting the working state of the C-phase input voltage.
Specifically, the calculating a packet cycle according to the basic training data includes: performing Fourier transform on the basic training data to obtain an intensity spectrum corresponding to the basic training data; and screening the frequency component with the maximum amplitude from the intensity frequency spectrum, and taking the reciprocal of the frequency component with the maximum amplitude as a grouping period. In connection with the example of the UPS three-phase power supply, as shown in fig. 2, after the time-series sequence of the C-phase input voltage is fourier-transformed, the maximum frequency component is 23.9532 hours at f-1.16 e-0.5Hz, and the inverse of the maximum frequency component is equal to about 24 hours, so that the grouping period of the UPS three-phase power supply is 24 hours, that is, one day is equal to one grouping period.
S30, calculating a grouping period according to the time sequence characteristic quantity of the basic training data, grouping the basic training data according to the grouping period, and determining the sequence number of each group according to the time sequence; judging whether the basic training data group belongs to a group where the fault exists or not by calculating the sequence time domain characteristic value of each basic training data group, and recording the group serial number of the group where the fault exists;
calculating the variance and the mean value of each group of basic training data to serve as the physical characteristic value of each group of basic training data, and recording the serial number of the basic training group falling into the deviation range of the physical characteristic value; and judging the basic training data falling into the deviation range of the physical characteristic value as that the basic training data group corresponding to the group of serial numbers belongs to the group where the fault is located.
Calculating the mean value and the variance of a time sequence of C-phase output voltage in a period group, namely a day, by combining with the example of the UPS three-phase power supply, and determining the period of the fault; assuming that the C-phase output voltage in the UPS three-phase power supply is monitored for 81 days, a fault occurs on day 13; in other words, the 13 th day is a group where the fault is located, the data obtained by the physical characteristic value is a specific time period in the cycle, for example, the fault occurs at 8 th 20 th of the 13 th fault cycle, but the time interval of the specific time period in the cycle is too short, so that the grouping is too much; therefore, the fault is displayed at a time level, for example, the historical occurrence time of the fault is tracked, and the fault day (fault cycle) is displayed firstly, and then the accurate fault time period in the fault cycle is displayed.
S40, dividing the grouped basic training data set into a training sample set and a testing sample set according to the group serial number of the group where the fault is located; each basic training data group included in the training sample group does not belong to the group where the fault exists; the test sample group comprises at least one group in which the basic training data group is a fault group;
by combining the example of the UPS three-phase power supply, assuming that the 13 th day is a fault day (the 13 th group period is a group where the fault is located), the 30 th day is used as a boundary in the grouping of basic training data groups, the first 30 days are used as test sample groups, and the last 51 days are used as training sample groups; it is to be noted that the grouping interval of day 30 mentioned in the embodiments is only an example and does not limit the choice of the person skilled in the art to divide the test sample set and the base training data set.
S50, calculating each basic training data set in the training sample set according to a nonlinear state evaluation algorithm to obtain a fault threshold value;
judging whether the group serial number of the basic training data group judged to have the fault in the test sample group is consistent with the recorded group serial number or not according to the fault threshold value;
and if so, taking the fault threshold value as a standard working index for judging whether the electronic equipment has faults or not in operation.
The method comprises the following steps of calculating each basic training data set in a training sample set according to a nonlinear state evaluation algorithm to obtain a fault threshold value, wherein the data at any moment in a test sample set are observation vectors; extracting historical observation vectors in a plurality of training sample groups; constructing a process memory matrix by the plurality of historical observation vectors; inputting the observation vector into the memory moment output to obtain a prediction vector; calculating the difference value of each observation vector except the observation vector of the group moment of the fault and the corresponding prediction vector, and determining the maximum difference value in the difference values as the fault threshold value; it should be noted here that each observation vector except the observation vector at the moment of the group of faults is the normal operation condition of the UPS three-phase power supply, and in the normal operation condition, the most abnormal difference value is selected, and the most abnormal difference value in the normal operation condition is used as the fault standard, that is, the fault threshold.
As shown in fig. 3, in combination with the example of the UPS three-phase power supply, 17 sets of feature values are formed by averaging the feature values every three consecutive days in the training sample set of the last 51 days for calculating the similarity, the first 30 days are used as the test sample set, the nonlinear state evaluation is performed, the failure threshold is 300, and the cycle set (day) in which the failure occurs is determined to be day 13.
The relational expression of the observation vector and the prediction vector is
Wherein, yestFor the prediction vector, yobsIs the observation vector, D is the process memory matrix; for the sake of easy understanding of the relationship, the present embodiment further describes the reasoning of the formula,
assuming that a process or equipment has n correlated variables, at a certain time i, the observed n variables are recorded as observation vectors, that is
X(i)＝[x1,x2,...,xn]T
The construction of the process memory matrix is the first step of Nonlinear State Estimate Technology modeling. Collecting m historical observation vectors to form a process memory matrix of
Each column of observation vectors in the process memory matrix represents a normal operating state of the device. The subspace spanned by the m historical observation vectors (denoted by D) in the rationally selected process memory matrix can represent the entire dynamic process of the normal operation of the process or the equipment. Thus, the construction of the process memory matrix is essentially a learning process for the normal operating characteristics of the process or plant.
The input of the NSET is an observation vector y of the process or equipment at a certain moment0bsThe output of the model is the prediction vector y for that inputest. Constructing the residual of the input and output prediction vectors of the model as
r＝yobs-yest
Minimisation of residual errors, i.e.
Then the observation vector y can be derived for any one input0bsGenerate a m-dimensional weight vector of
W＝(DTD)-1DTyobs
So that
yest＝D(DTD)-1DTyobs
The practical problem is often "non-linear", and D is used to characterize the "degree of similarity" between vectorsTD and DTyobsThe multiplication operation in (1) is changed into
Is a nonlinear operator and is used for replacing the multiplication operation in the common matrix operation. Here, the euler distance is often taken:
the final result is:
as shown in fig. 4, fig. 4 is a second embodiment of the present invention, which provides a general machine learning device based on data mining, including a sampling unit, where the sampling unit samples a sampling value of each working index of operation of an electronic device at a fixed frequency, and all the sampling values sampled for each working index form a time sequence corresponding to the working index;
the characteristic selection unit is used for carrying out characteristic selection on the time sequence corresponding to each working index, determining the working index with the maximum correlation degree with the running state of the electronic equipment and the sequence time domain characteristic value of the working index with the maximum correlation degree, and training data on the basis of the sampling value corresponding to the determined maximum working index;
the grouping period unit calculates a grouping period according to the time sequence characteristic quantity of the basic training data, groups the basic training data according to the grouping period, and determines the sequence number of each group according to the time sequence;
the fault group judgment unit judges whether the basic training data group belongs to the fault group or not by calculating the physical characteristic value of each basic training data group and records the group serial number of the fault group;
the test training grouping unit divides the grouped basic training data group into a training sample group and a test sample group according to the group serial number of the group in which the fault is positioned and the time sequence; each basic training data group included in the training sample group does not belong to the group where the fault exists; the test sample group comprises at least one group in which the basic training data group is a fault group;
the fault threshold calculation unit is used for calculating each basic training data set in the training sample set according to a nonlinear state evaluation algorithm to obtain a fault threshold;
judging whether the group serial number of the basic training data group judged to have the fault in the test sample group is consistent with the recorded group serial number or not according to the fault threshold value;
and if so, taking the fault threshold value as a standard working index for judging whether the electronic equipment has faults or not in operation.
The sampling unit is further used for extracting sequence time domain characteristic values corresponding to each working index and combining all the sequence time domain characteristic values into a characteristic complete set of a time sequence; selecting the characteristics of the characteristic complete set of the time sequence by adopting a sequence backward selection algorithm; substituting the extracted sequence time domain characteristic value after the characteristic selection into an evaluation function to obtain an optimal sequence time domain characteristic value; and determining the working index corresponding to the optimal time domain characteristic value as the working index with the maximum correlation degree with the running state of the electronic equipment.
The packet cycle unit is further configured to,
performing Fourier transform on the sequence time domain characteristic value of the basic training data to obtain an intensity spectrum corresponding to the basic training data;
and screening the frequency component with the maximum amplitude from the intensity frequency spectrum, and taking the reciprocal of the frequency component with the maximum amplitude as a grouping period.
The group judgment unit where the fault is located is further used for,
and calculating the variance and the mean value of the basic training data of each group to be used as the physical characteristic value of each group of basic training data, recording the serial numbers of the basic training groups falling into the deviation range of the physical characteristic value, and if the recorded group serial numbers are recorded under the standard, judging that the basic training data group corresponding to the group serial numbers belongs to the group where the fault exists.
The fault threshold calculation unit is further used for calculating difference values of each observation vector except the observation vector of the group moment of the fault and the corresponding prediction vector, and determining the largest difference value in the difference values as the fault threshold;
data at any moment in the test sample group is an observation vector;
extracting historical observation vectors in a plurality of training sample groups;
constructing a process memory matrix by the plurality of historical observation vectors;
inputting the observation vector into the memory moment output to obtain a prediction vector;
the relational expression of the observation vector and the prediction vector is
Wherein, yestFor the prediction vector, yestFor the observation vector, D is the process memory matrix.
A third embodiment of the present invention further provides a general-purpose machine learning system based on data mining, the learning system of this embodiment includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, the processor executing the computer program, such as a program implementing a multi-screen display system;
illustratively, the computer program may be partitioned into one or more modules that are stored in the memory and executed by the processor to accomplish the present embodiments. The one or more modules may be a series of instruction segments of a computer program capable of performing specific functions, where the instruction segments are used to describe execution processes of the computer program in a terminal device of a control method of a multi-screen display system.
The learning system can be a desktop computer, a notebook, a palm computer, a cloud server and other computing devices.
The learning system may include, but is not limited to, a processor, memory, a display. It will be appreciated by those skilled in the art that the schematic diagram is merely an example of a learning system and is not intended to be limiting and may include more or fewer components than shown, or some components in combination, or different components, e.g., the learning system may also include input output devices, network access devices, buses, etc.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. The general purpose processor may be a microprocessor or the processor may be any conventional processor or the like that is the control center for the learning system and connects the various parts of the overall learning system using various interfaces and lines.
The memory may be used to store the computer programs and/or modules, and the processor may implement various functions of the learning system by running or executing the computer programs and/or modules stored in the memory, as well as by invoking data stored in the memory. The memory may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required by at least one function (such as a sound playing function, a text conversion function, etc.), and the like; the storage data area may store data (such as audio data, text message data, etc.) created according to the use of the cellular phone, etc. In addition, the memory may include high speed random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), at least one magnetic disk storage device, a Flash memory device, or other volatile solid state storage device.
Wherein, the module integrated with the learning system can be stored in a computer readable storage medium if it is realized in the form of software functional unit and sold or used as an independent product. Based on such understanding, all or part of the flow of the method according to the embodiments of the present invention may also be implemented by a computer program, which may be stored in a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method embodiments may be implemented. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
It should be noted that the above-described device embodiments are merely illustrative, where the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. In addition, in the drawings of the embodiment of the apparatus provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, and may be specifically implemented as one or more communication buses or signal lines. One of ordinary skill in the art can understand and implement it without inventive effort.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention.
Claims (5)
1. A method for grouping working data of electronic equipment is characterized by comprising the following steps:
acquiring basic training data for training to generate standard working indexes of the electronic equipment; wherein the basic training data comprises sampling values of the running work of the electronic equipment sampled at a fixed frequency; the working index to which the sampling numerical value belongs is the same as the working index to which the standard working index belongs;
judging whether the basic training data group belongs to a fault group or not by calculating the time domain characteristic value of each basic training data group, and recording the group number of the fault group;
performing Fourier transform on the sequence time domain characteristic value of the basic training data to obtain an intensity spectrum corresponding to the basic training data;
screening frequency components with the maximum amplitude from the intensity frequency spectrum, and taking the reciprocal of the frequency components with the maximum amplitude as a grouping period;
extracting a training sample group from the grouped basic training data according to the group number of the fault group; the group serial numbers of the basic training data groups included in the training sample group are continuous and do not belong to fault groups;
and calculating and generating a standard working index for judging whether the electronic equipment has faults during operation according to the training sample group.
2. The method according to claim 1, wherein the step of determining whether the basic training data group belongs to the fault group by calculating the time domain characteristic value of each basic training data group and recording the group number of the fault group comprises the steps of calculating the variance and the mean of the basic training data of each group as the physical characteristic value of each group of basic training data, recording the sequence number of the basic training group falling within the deviation range of the physical characteristic value, and if the recorded group number is recorded under the standard, determining that the basic training data group corresponding to the group number belongs to the group in which the fault exists.
3. The method according to claim 1, wherein the step of calculating and generating a standard working index for judging whether the electronic equipment has faults or not according to the training sample group comprises the steps of dividing a grouped basic training data group into a training sample group and a testing sample group according to the group serial number of the group in which the faults exist in a time sequence; each basic training data group included in the training sample group does not belong to the group where the fault exists; the test sample group comprises at least one group in which the basic training data group is a fault group;
according to a nonlinear state evaluation algorithm, calculating each basic training data set in a training sample set to obtain a fault threshold value;
judging whether the group serial number of the basic training data group judged to have the fault in the test sample group is consistent with the recorded group serial number or not according to the fault threshold value;
and if so, taking the fault threshold value as a standard working index for judging whether the electronic equipment has faults or not in operation.
4. The method according to claim 3, wherein the calculating each basic training data set in the training sample set according to the nonlinear state estimation algorithm to obtain the failure threshold value specifically comprises:
data at any moment in the test sample group is an observation vector;
extracting historical observation vectors in a plurality of training sample groups;
constructing a memory matrix by the plurality of historical observation vectors;
inputting the observation vector into the memory moment output to obtain a prediction vector;
and calculating the difference value of each observation vector except the observation vector of the group moment of the fault and the corresponding prediction vector, and determining the maximum difference value in the difference values as the fault threshold value.
5. The method of claim 4, wherein the relational expression between the observation vector and the prediction vector is
Wherein, yestFor the prediction vector, yestAnd D is the memory matrix.
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