CN107966311B - Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data - Google Patents
Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data Download PDFInfo
- Publication number
- CN107966311B CN107966311B CN201711194996.4A CN201711194996A CN107966311B CN 107966311 B CN107966311 B CN 107966311B CN 201711194996 A CN201711194996 A CN 201711194996A CN 107966311 B CN107966311 B CN 107966311B
- Authority
- CN
- China
- Prior art keywords
- thruster
- accelerating grid
- test
- data
- service life
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/005—Testing of complete machines, e.g. washing-machines or mobile phones
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Abstract
Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data, steps are as follows: 1) acquiring ion thruster machine life test data；2) accelerating grid parts test data is acquired；3) thruster service life form parameter is determined；4) reliability of ion thruster is assessed, obtains reliability.The present invention passes through the empirical relation model between the thruster service life in accelerating grid service life in the test of accelerating grid parts and machine life test, the form parameter in thruster service life is obtained using accelerating grid parts test data, and then ion thruster reliability is assessed, solve the problems, such as ion thruster reliability assessment in the case of machine life data few (only 1~2).
Description
Technical field
The invention belongs to ion thruster reliability assessment technical fields, and in particular to the minimum son based on accelerating grid data
Sample ion thruster reliability determines method more particularly to the few situation of machine life data.
Background technique
Electric propulsion system is a kind of advanced space propulsion system, has the characteristics that high specific impulse, high efficiency, low thrust, energy
Enough effectively improve satellite in-orbit service service life and bearing capacity, in recent years in space propultion using more and more common.Electricity pushes away
Into the outstanding advantage relative to chemical propulsion with high specific impulse, satellite booster agent carrying amount can be greatly reduced, to improve satellite
Payload ratio extends in-orbit life-span and reduces throw-weight.
Ion thruster is the important member of electric thruster family, and specific impulse and efficiency are especially prominent.As ion electric propulsion
One of core single machine of system, ion thruster are also the Main Weak Links for influencing electric propulsion system reliability simultaneously.To test
Ion thruster reliability is demonstrate,proved, in-orbit operating condition need to be simulated and carry out ground vacuum fire trial.But it is limited to development progress, examination
The factors such as funds are tested, engineering usually only arranges 1~2 thruster to be tested in practice.According to engineering development experience, thruster
Weibull distribution description generally can be used in service life.If carrying out ion thruster reliability merely with thruster machine life data
Assessment, due to service life discreteness (i.e. form parameter) poor in information, it may appear that the case where reliability assessment can not be carried out.
It is found by external correlative study report and previous work, accelerating grid failure is to determine ion thruster reliability
Critical failure mode.According to the consistent principle of failure mechanism, adding with same fault mechanism is can be used in machine life form parameter
The service life form parameter of fast grid is characterized.Relative ion thruster complete machine, accelerating grid have had accumulated more component-level examination
Test data.Based on this, the invention proposes a kind of extreme small sample ion thruster reliability determination sides based on accelerating grid data
Method, it is less (less than 3 in machine life data by the service life discreteness information (form parameter) of the identical accelerating grid of compages
It is a) in the case where, ion thruster reliability is assessed.
Summary of the invention
The technical solution that the present invention solves is: overcoming the deficiencies of the prior art and provide the minimum son based on accelerating grid data
Sample ion thruster reliability determines method, and solution ion thruster machine life data are few, can not carry out reliability assessment
The problem of.
The technical scheme is that the extreme small sample ion thruster reliability based on accelerating grid data determines method,
Include the following steps:
1) ion thruster machine life test data is acquired
If shared nuA platform ion thruster carries out machine life test, for jth, j=1,2 ..., nu；Platform thruster,
Acquire following data:
Accelerating grid thickness hu,j, gate hole diameter initial value D0,u,jWith acceleration gate current Iu,j；Wherein, h, D0It is respectively indicated with I
Accelerating grid thickness, accelerating grid gate hole diameter initial value and acceleration gate current, footmark " u " indicate that data come from thruster machine life
Test, footmark " j " indicate to come from jth platform thruster；
2) accelerating grid parts test data is acquired
If shared npA accelerating grid test specimen carries out parts test, for kth (k=1,2 ..., np) a accelerating grid test specimen,
Acquire following tests data: accelerating grid thickness hp,k, gate hole diameter initial value D0,p,kWith acceleration gate current Ip,k；Wherein, footmark " p "
Indicate that data are tested from accelerating grid parts, footmark " k " indicates to come from kth platform thruster；
3) thruster service life form parameter is determined
31) mathematic(al) expectation proportionality coefficient
For k-th of accelerating grid test specimen, the service life proportionality coefficient C of parts test and machine life testkAccording to the following formula
It calculates.
In formula, tuAnd tpThruster service life and accelerating grid service life are respectively indicated,
32) thruster service life form parameter is calculated
The service life proportionality coefficient C obtained according to accelerating grid parts test datak, thruster service life shape is calculated according to the following formula
Shape parameter m.
4) ion thruster reliability assessment
If ion thruster shares n machine life data, wherein there is r fail data, the out-of-service time is respectively t1,
t2..., tr；, to stop data, the intermission is respectively t for remainingr+1, tr+2..., tn.For given task time t0, setting
Under reliability γ, ion thruster reliability unilateral side confidence lower limit RLIt is given by.
In formula For χ2The quantile of (υ) distribution, can look into GB/T 4086.2 and obtain.
The invention has the following advantages:
1) present invention by accelerating grid parts test in the accelerating grid service life and machine life test in the thruster service life it
Between empirical relation model, obtain the form parameter in thruster service life using accelerating grid parts test data, and then to ion
Thruster reliability is assessed, and solves ion thruster reliability in the case of machine life data few (only 1~2)
Evaluation problem.
2) present invention has fully considered current ion thruster failure mode distribution situation, according to ion thruster service life master
The status that depend on accelerating grid thickness direction corrosion rate establishes accelerating grid service life and complete machine in the test of accelerating grid parts
Thruster service life discreteness information is converted the accelerating grid service life by empirical relation model in life test between the thruster service life
With the discreteness information of the proportionality coefficient in thruster service life.On this basis, whole using the test of accelerating grid parts and thruster
Accelerating grid thickness, gate hole diameter initial value and accelerating grid current data in machine life test, are calculated the thruster service life
Form parameter.And accelerating grid thickness, gate hole diameter initial value and gate current is accelerated to have that test method is cured, can quickly obtain
The characteristics of taking, while the test of accelerating grid parts can put into relatively large sample size, can effectively solve thruster complete machine
The problem of lifetime data discreteness poor in information creates excellent basis for thruster reliability assessment.
3) this civilization combines the discreteness information in accelerating grid parts test data, can greatly improve ion thrust
The precision of device reliability assessment.
4) present invention can carry out the assessment of thruster reliability merely with 1~2 ion thruster machine life data,
Greatly reduce the economic cost of machine life test.
Detailed description of the invention
Fig. 1 is ion thruster accelerating grid structural schematic diagram of the invention.
Fig. 2 is ion thruster reliability assessment process of the invention.
Specific embodiment
Determine that method requires to accelerate grid structure identical based on the extreme small sample ion thruster reliability of accelerating grid data, and
And meet following two basic assumptions:
Assuming that one: ion thruster service life and accelerating grid Weibull Distributed Units.
Assuming that two: the corrosion of accelerating grid thickness direction penetrability is corroded prior to hole wall direction penetrability to be occurred.The basic assumption
It can be guaranteed by coordinating the margin design of accelerating grid thickness and gate hole dowel width.Accelerating grid structural schematic diagram is shown in Fig. 1.
Under above-mentioned basic assumption, the ion thruster service life depends primarily on the corrosion of accelerating grid thickness direction penetrability and corresponds to
The accelerating grid service life, according to the consistent principle of failure mechanism, the service life form parameter of ion thruster can be taken as accelerating grid service life shape
Shape parameter.In the situation known to thruster service life form parameter, Weibull distribution can be converted to exponential distribution, and then realize
Thruster reliability assessment in the case of 1~2 this extreme small sample of machine life data.
The basic principle determined below to thruster service life form parameter is illustrated.
According to engineering development experience, for identical structure accelerating grid, accelerating grid service life tpWith ion thruster service life tuBetween
There are following empirical relations:
tp=Ctu
Wherein C is service life proportionality coefficient,
Ion thruster machine life test usually only 1~2 estrade sample, and the service life t of separate unit thrusteruIt is determining
's.Therefore, accelerating grid service life tpForm parameter approximate can be taken as the form parameter of service life proportionality coefficient C.
Below by an example, the present invention will be described in detail.
Step 1 acquires ion thruster machine life test data
The test of this example ion thruster machine life only puts into 1 thruster, tests ion thruster machine life
Accelerating grid thickness hu, ion thruster machine life test gate hole diameter initial value D0,uWith ion thruster machine life
The acceleration gate current I of testuIt is acquired, is shown in Table 1.
1 ion thruster machine life test data of table
Step 2 acquires accelerating grid parts test data
Identical structure accelerating grid puts into 8 samples altogether and carries out parts test, to the accelerating grid test specimen portion group of each test specimen
The accelerating grid thickness h of part testp,k, accelerating grid test specimen parts test gate hole diameter initial value D0,p,kWith accelerating grid test specimen portion
The acceleration gate current I of assembly testp,k(k=1,2 ..., 8) is acquired, is shown in Table 2.
2 accelerating grid parts test data of table
Step 3 determines thruster service life form parameter
Step 3.1, mathematic(al) expectation proportionality coefficient
Using Tables 1 and 2 data, mathematic(al) expectation proportionality coefficient Ck, calculated result is shown in Table 3.
3 service life of table proportionality coefficient calculated result
Step 3.2, thruster service life form parameter is calculated
According to 3 data of table, thruster service life form parameter m=23.4764 is calculated.
Step 4, ion thruster reliability assessment
The type ion thruster there is no in-orbit flight to undergo, and ground life test only has 1 sample, pass through degraded data point
It is 11884.292h that analysis, which obtains life estimation, and is regarded as fail data processing, i.e. failure number r=1.
For given task time t0=10000h, under confidence level γ=0.6, the unilateral side of ion thruster reliability
Confidence lower limit are as follows:
In formula
Claims (1)
1. the extreme small sample ion thruster reliability based on accelerating grid data determines method, it is characterised in that including walking as follows
It is rapid:
1) ion thruster machine life test data is acquired；Specifically:
If shared nuPlatform ion thruster carries out machine life test, for jth platform thruster, acquires following data:
The accelerating grid thickness h of ion thruster machine life testu,j, ion thruster machine life test gate hole diameter at the beginning of
Initial value D0,u,jWith the acceleration gate current I of ion thruster machine life testu,j；Wherein, h, D0Accelerating grid thickness is respectively indicated with I
Degree, accelerating grid gate hole diameter initial value and acceleration gate current, footmark u indicate that data are tested from thruster machine life, footmark j
It indicates to come from jth platform thruster, j=1,2 ..., nu；
2) accelerating grid parts test data is acquired；Specifically:
If shared npA accelerating grid test specimen carries out parts test, for k-th of accelerating grid test specimen, acquires following tests data: adding
The accelerating grid thickness h of fast grid test specimen parts testp,k, accelerating grid test specimen parts test gate hole diameter initial value D0,p,kWith
The acceleration gate current I of accelerating grid test specimen parts testp,k；Wherein, footmark " p " indicates that data are tested from accelerating grid parts,
Footmark " k " indicates to come from kth platform thruster, k=1,2 ..., np；
3) ion thruster service life form parameter is determined；Specifically:
31) it calculates and obtains service life proportionality coefficient
For k-th of accelerating grid test specimen, the service life proportionality coefficient C of parts test and machine life testk
In formula, tuAnd tpThruster service life and accelerating grid service life are respectively indicated,
32) thruster service life form parameter is calculated
The service life proportionality coefficient C obtained according to accelerating grid parts test datak, thruster service life shape ginseng is calculated according to the following formula
Number m
4) reliability of ion thruster is assessed, obtains reliability；Specifically:
If ion thruster shares n machine life data, wherein there is r fail data, the out-of-service time is respectively t1, t2...,
tr；, to stop data, the intermission is respectively t for remainingr+1, tr+2..., tn；For given task time t0, in confidence level γ
Under, ion thruster reliability unilateral side confidence lower limit RLIt is given by
In formula For χ2The quantile of (υ) distribution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711194996.4A CN107966311B (en) | 2017-11-24 | 2017-11-24 | Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711194996.4A CN107966311B (en) | 2017-11-24 | 2017-11-24 | Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107966311A CN107966311A (en) | 2018-04-27 |
| CN107966311B true CN107966311B (en) | 2019-08-09 |
Family
ID=61997816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711194996.4A Active CN107966311B (en) | 2017-11-24 | 2017-11-24 | Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107966311B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108959770B (en) * | 2018-07-03 | 2022-04-12 | 北京航空航天大学 | Satellite thruster reliability analysis method based on interval statistics |
| CN110263420B (en) * | 2019-06-17 | 2022-09-27 | 长安大学 | Loader drive axle minimum subsample reliability assessment method based on BP neural network |
| CN113279930B (en) * | 2021-06-30 | 2022-07-12 | 哈尔滨工业大学 | Grid component assembly structure and assembly method of micro ion thruster |
| CN114580118B (en) * | 2022-03-25 | 2023-12-15 | 兰州空间技术物理研究所 | Quantitative evaluation method for service life and reliability of ion thruster |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040117051A1 (en) * | 2000-06-06 | 2004-06-17 | Ford Dean M. | Method of determining a cumulative distribution function confidence bound |
| US6964396B2 (en) * | 2001-12-04 | 2005-11-15 | The Boeing Company | Automatic accel voltage tracking system for an ion thruster |
| CN103995970B (en) * | 2014-05-26 | 2017-04-19 | 北京航空航天大学 | Ion thrustor minimum subsample reliability assessment method |
| CN105844095B (en) * | 2016-03-22 | 2018-08-17 | 北京航空航天大学 | A kind of ion thruster System in Small Sample Situation reliability estimation method based on performance degradation |
-
2017
- 2017-11-24 CN CN201711194996.4A patent/CN107966311B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN107966311A (en) | 2018-04-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107966311B (en) | Method is determined based on the extreme small sample ion thruster reliability of accelerating grid data | |
| Anderson et al. | Inclusive μ-pair production at 150 GeV by π+ mesons and protons | |
| CN101976311B (en) | Bayesian appraisal method of accelerated degradation test based on drift Brownian motion model | |
| CN110260907B (en) | Temperature stress failure-free accelerated life test method for sensor | |
| CN108280253B (en) | Ion thruster service life evaluation method based on grid corrosion morphology and electronic backflow | |
| CN110196779B (en) | Method for calculating accelerated life test time of electronic product on satellite | |
| CN114580118B (en) | Quantitative evaluation method for service life and reliability of ion thruster | |
| Ma et al. | Real time reliability analysis based on the performance degradation data and Bayesian method | |
| Di Leva et al. | Experimental status of 7Be production and destruction at astrophysical relevant energies | |
| CN110736595A (en) | Method for evaluating service life of electronic equipment in rail transit cabin | |
| Armenise et al. | Measurement of the ratio of total and differential cross sections on neutrons and protons for charged-current neutrino events | |
| Mileo et al. | Probing sensitivity to charged scalars through partial differential widths: τ→ K π π ν τ decays | |
| CN109615255A (en) | A kind of bearing reliability appraisal procedure based on Performance Degradation Data | |
| CN103886186B (en) | A kind of entropy method determining that bearing capacity of concrete-filled steel tube design error is distributed | |
| CN117647563B (en) | Method and device for determining minimum dislocation threshold energy of material | |
| Luo et al. | System reliability demonstration with equivalent data from component accelerated testing based on reliability target transformation | |
| Barmin et al. | Search for K s 0→ 2γ decay | |
| CN105808434A (en) | Software reliability test system | |
| Martins et al. | Electrodisintegration of Cu 63 and Cu 65 | |
| CN117669164A (en) | Method for optimizing fatigue life data | |
| Mourão et al. | Computational investigation of Várzeas bridge steel under monotonic tensile via crystal plasticity finite element method | |
| Livanov et al. | Latest results concerning short range correlations obtained in the dp elastic and dp breakup processes at Nuclotron, JINR | |
| Janek et al. | Latest results concerning short range correlations obtained in the dp elastic and dp breakup processes at Nuclotron, JINR | |
| CN115186393A (en) | Low-sample-size C-P-S-N curve acquisition method for aeroengine structural part | |
| Xue et al. | The fatigue performance evaluation of pressure vessel steel using modified staircase method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |