CN107957637B - High-low temperature test environment providing device, adjusting method and testing device - Google Patents
High-low temperature test environment providing device, adjusting method and testing device Download PDFInfo
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- CN107957637B CN107957637B CN201810034262.8A CN201810034262A CN107957637B CN 107957637 B CN107957637 B CN 107957637B CN 201810034262 A CN201810034262 A CN 201810034262A CN 107957637 B CN107957637 B CN 107957637B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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Abstract
The embodiment of the invention provides a device, an adjusting method and a testing device for a high and low temperature testing environment, relates to the field of detection of display panels, and can solve the problem that the conventional testing device cannot provide a high and low temperature environment with a large space for a display panel due to the limitation of energy consumption and testing efficiency, so that optical tests such as visual angles and color cast and the like of the display panel requiring the large space cannot be performed in the high and low temperature environment. The providing device comprises a testing chamber and a gate capable of dividing the testing chamber into a first chamber and a second chamber, wherein the space of the first chamber is smaller than that of the second chamber; the providing device also comprises a panel bearing unit, a moving unit and a rotating unit; a panel inlet and a panel outlet are formed in the cavity of the first chamber, and a sealing door is arranged on the panel inlet and the panel outlet; a detection window is arranged on the cavity of the second chamber; a first temperature adjusting device and a first temperature detecting device are arranged in the first chamber, and a second temperature detecting device is arranged in the second chamber.
Description
Technical Field
The invention relates to the field of detection of display panels, in particular to a providing device, an adjusting method and a testing device for a high-temperature and low-temperature testing environment.
Background
A TFT-LCD (Thin Film Transistor-Liquid Crystal Display) is used as a flat panel Display device, and has the characteristics of small size, low power consumption, no radiation, relatively low manufacturing cost, and the like, so that it is increasingly applied to the field of high-performance Display.
For the liquid crystal display, the temperature will affect the energy of the movement of the liquid crystal molecules in the liquid crystal display panel and the corresponding viscosity coefficient; for example, when the temperature is high, the motion energy of the liquid crystal molecules is high, the viscosity coefficient is small, the liquid crystal molecules can be freely and rapidly twisted and arranged in the direction of the electric field under the driving of the electric field, and the response speed of the display is accelerated; when the temperature is low, the activity energy of the liquid crystal molecules is weakened, the viscosity coefficient is increased, when an electric field is applied to the liquid crystal molecules, the viscous resistance of the liquid crystal molecules is large, a long time is needed for reaching a due distortion angle, and the response speed of the display is slow; therefore, when the liquid crystal display is used outdoors or in some other harsh environments with high and low temperatures, problems such as black and white screens and slow response speed occur, so that when the liquid crystal display is manufactured, a high and low temperature environment test needs to be performed on the liquid crystal display panel to serve as an important evaluation means for the liquid crystal display panel to be poor in the severe environment.
However, in the prior art, when performing high and low temperature tests on a liquid crystal display panel, in consideration of the energy consumption problem and the test efficiency problem of the high and low temperature test apparatus, a small high and low temperature test chamber is generally provided so as to achieve a required high and low temperature test environment in a short time, thereby satisfying the actual test efficiency.
In addition, in the prior art, the liquid crystal display panel needs to be tested for the visual angle, the color cast and the like, and the panel generally needs to be rotated, so that a larger test space is needed, the visual angle, the color cast and the like of the liquid crystal display panel are often tested only in a room temperature environment in consideration of the energy consumption problem and the test efficiency of the high and low temperature environments, and the visual angle, the color cast and the like of the liquid crystal display panel are not tested in the high and low temperature test environment, that is, the prior art cannot evaluate the possible defects of the liquid crystal display panel in the severe environment based on the consideration of the energy consumption and the test efficiency.
Disclosure of Invention
The embodiment of the invention provides a providing device, an adjusting method and a testing device for a high-temperature and low-temperature testing environment, which can solve the problem that the conventional testing device cannot provide a high-temperature and low-temperature environment with a larger space for a display panel due to the limitation of energy consumption and testing efficiency, so that the optical testing of the display panel with the larger space, such as visual angle, color cast and the like, cannot be performed in the high-temperature and low-temperature environment.
In order to achieve the above purpose, the embodiment of the invention adopts the following technical scheme:
in one aspect, the present invention provides a device for providing a high and low temperature test environment, where the device includes a test chamber and a gate capable of dividing the test chamber into a first chamber and a second chamber, where a space of the first chamber is smaller than a space of the second chamber; the providing device further comprises a panel bearing unit, a moving unit for moving the panel bearing unit between the first chamber and the second chamber, and a rotating unit for rotating the panel bearing unit; a panel inlet and a panel outlet are formed in the cavity of the first chamber, and a sealing door is arranged on the panel inlet and the panel outlet; a detection window is arranged on the cavity of the second chamber; the first chamber is provided with a first temperature adjusting device and a first temperature detecting device, and the second chamber is provided with a second temperature detecting device.
Further, the panel bearing unit comprises a supporting rod; the rotating unit includes: the horizontal rotary table and the vertical rotary table are connected with the supporting rod; the horizontal turntable is positioned at the first end of the supporting rod, and the first end is connected with the cavity of the test chamber; the vertical rotary table is positioned at the second end of the supporting rod, and a fixing clamp for fixing the display panel is arranged on the vertical rotary table.
Further, the moving unit includes a first rail penetrating the first chamber and the second chamber, and a slider connected to the horizontal turntable, and the slider is mounted on the first rail.
Further, the providing device further comprises a second rail; one end of the second track is in butt joint with the first track, and the other end of the second track extends to the position of the sealing door.
Further, a second temperature adjusting device is arranged in the second chamber.
Further, the first temperature regulating device and/or the second temperature regulating device comprise an air inlet filled with heat carrying gas and an air outlet used for discharging the heat carrying gas.
Further, the supply device is provided with an air inlet at a position close to the panel bearing unit.
Further, the first chamber and/or the second chamber is provided with an air inlet at a position close to the gate.
The embodiment of the invention also provides a high-low temperature testing device, which comprises the high-low temperature testing environment providing device and a panel performance detecting device.
In another aspect, an embodiment of the present invention further provides a method for adjusting a device for providing a high and low temperature test environment, where the device for providing a high and low temperature test environment includes: the testing device comprises a testing chamber, a gate capable of dividing the testing chamber into a first chamber and a second chamber, and a panel bearing unit, wherein the space of the first chamber is smaller than that of the second chamber; the adjusting method comprises the following steps:
placing a display panel into the first chamber, wherein the display panel is carried by the panel carrying unit; adjusting the difference value between the temperature of the first chamber and the second chamber and the testing temperature to be less than or equal to a threshold value, and moving the panel bearing unit bearing the display panel from the first chamber to the second chamber; after the test of the display panel is finished, the panel bearing unit is moved to the first chamber from the second chamber through the gate, and after the gate is closed, the display panel is moved out of the test chamber through a panel inlet and a panel outlet formed in the first chamber.
The embodiment of the invention provides a high-low temperature test environment providing device, a regulating method and a test device, wherein the high-low temperature test environment providing device comprises a test chamber and a gate capable of dividing the test chamber into a first chamber and a second chamber, wherein the space of the first chamber is smaller than that of the second chamber; the panel loading device comprises a first chamber, a second chamber, a panel loading unit, a moving unit and a rotating unit, wherein the first chamber is used for accommodating the panel; a panel inlet and a panel outlet are formed in the cavity of the first chamber, and a sealing door is arranged on the panel inlet and the panel outlet; a detection window is arranged on the cavity of the second chamber; a first temperature adjusting device and a first temperature detecting device are arranged in the first chamber, and a second temperature detecting device is arranged in the second chamber.
In summary, the testing chamber is divided into the first chamber and the second chamber by the gate, on one hand, the first chamber and the second chamber can be combined into one by opening the gate, so that the display panel is ensured to have enough testing space; on the other hand, through closing the gate with first cavity and second cavity separation, under this condition, the temperature in the great second cavity in space can continue to maintain, and only need open the less first cavity in space, change display panel, and under the condition of consuming short time and less energy consumption, can adjust the temperature of this first cavity to being close normal atmospheric temperature or test temperature, thereby solved among the current testing arrangement because of energy consumption and test efficiency limited and can't provide the high low temperature environment that has great space for display panel, thereby can't carry out the visual angle under high low temperature environment to display panel, the problem of the optical test of colour cast etc. needs great space.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a device for providing a high and low temperature test environment according to an embodiment of the present invention;
FIG. 2 is a schematic cross-sectional view taken along line A-A' of FIG. 1;
FIG. 3 is a schematic structural diagram of another apparatus for providing a high and low temperature test environment according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a detection apparatus including a provision apparatus for providing a high and low temperature test environment according to an embodiment of the present invention.
Reference numerals:
01-providing a device; 02-panel performance detection means; 10-a test chamber; 100-a display panel; 101-a first chamber; 1011-first temperature detecting means; 1012-first temperature regulating means; 102-a second chamber; 1021-second temperature detection means; 1022 — a second temperature regulating device; 110-a sealing door; 120-a detection window; 20-a gate; 200-an air inlet; 201-a first track; 202-a second track; 30-a panel carrying unit; 40-a rotation unit; 401-vertical turntable; 402-horizontal turntable.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the present invention provides a providing apparatus for a high and low temperature test environment, as shown in fig. 1, the providing apparatus 01 includes a test chamber 10 and a gate 20 capable of dividing the test chamber 10 into a first chamber 101 and a second chamber 102, wherein a space of the first chamber 101 is smaller than a space of the second chamber 102; the supply apparatus further includes a panel loading unit 30, a moving unit moving the panel loading unit 30 between the first chamber 101 and the second chamber 102, and a rotating unit 40 rotating the panel loading unit 30.
In addition, as shown in fig. 2 (a cross-sectional view taken along a-a' of fig. 1), a panel access is opened on the cavity of the first chamber 101, and a sealing door 110 is disposed on the panel access so as to replace the tested display panel through the panel access; as shown in fig. 1, a detection window 120 (generally made of high-transmittance insulating glass) is disposed on the cavity of the second chamber 102, so that the display panel in the second chamber can be detected through the detection window, for example, optical detection such as viewing angle and color cast can be performed; the relative positions of the sealing door and the detection window are only schematically shown in fig. 2, and the actual positions of the sealing door 110 (corresponding to the panel entrance) and the detection window 120 are not particularly limited in the present invention, as long as it is ensured that the display panel can be detected through the detection window located in the second chamber, and the first chamber is opened or closed through the sealing door.
Further, as shown in fig. 1, a first temperature detecting means 1011 and a first temperature adjusting means 1012 are provided in the first chamber 101, and a second temperature detecting means 1021 is provided in the second chamber 102.
It should be understood here that the first chamber 101 and the second chamber 102 are in communication with each other when the shutter 20 is open, and the first temperature regulating device 1012 in the first chamber 101 can regulate the temperatures of the first chamber 101 and the second chamber 102 at the same time, but in practice, the second temperature regulating device 1022 is preferably provided in the second chamber 102 when the shutter 20 is closed, so as to regulate the temperatures of the first chamber 101 and the second chamber 102 respectively, thereby accurately ensuring the temperatures of the first chamber 101 and the second chamber 102 to be consistent, as shown in fig. 1.
The first temperature detecting means 1011 and the second temperature detecting means 1021 are generally temperature sensors, and the first temperature adjusting means 1012 and the second temperature adjusting means 1022 may include: an air inlet for charging heat-carrying gas and an air outlet for discharging heat-carrying gas; in the present invention, the number and positions of the inlet port for introducing the heat carrier gas and the outlet port for discharging the heat carrier gas are not particularly limited, and the components of the heat carrier gas are not limited, and may be hydrogen, nitrogen dioxide, or the like.
It should be noted here that, first, the apparatus for providing a high and low temperature test environment in the present invention can provide a high and low temperature test environment for any type of display panel, such as a liquid crystal display panel, but is not limited thereto.
Secondly, the device for providing the high and low temperature tests in the invention means that the device for providing the high and low temperature tests can only provide a low temperature test environment; or only providing a high temperature test environment; the device can also provide a low-temperature test environment or a high-temperature test environment according to actual needs, for example, in the case of providing the low-temperature test environment, cold air can be filled into the air inlet; in the case of providing a high temperature test environment, the air inlet may be charged with hot air, which is not a limitation of the present invention.
In summary, the testing chamber is divided into the first chamber and the second chamber by the gate, on one hand, the first chamber and the second chamber can be combined into one by opening the gate, so that the display panel is ensured to have enough testing space; on the other hand, through closing the gate with first cavity and second cavity separation, under this condition, the temperature in the great second cavity in space can continue to maintain, and only need open the less first cavity in space, change display panel, and under the condition of consuming short time and less energy consumption, can adjust the temperature of this first cavity to being close normal atmospheric temperature or test temperature, thereby solved among the current testing arrangement because of energy consumption and test efficiency limited and can't provide the high low temperature environment that has great space for display panel, thereby can't carry out the visual angle under high low temperature environment to display panel, the problem of the optical test of colour cast etc. needs great space.
The panel carrying unit, the moving unit, and the rotating unit in the supply device will be further described in the following schematic.
As shown in fig. 1, the panel supporting unit 30 includes a supporting rod L, a first end B1 of the supporting rod L may be connected to the cavity of the testing chamber 10, and a second end B2 may be configured with a stage and a fixing clamp configured on the stage for fixing the display panel, so as to fix and support the display panel.
On the basis, in order to realize the rotation of the display panel to meet the optical tests of viewing angle, color shift and the like, the rotation unit 40 includes a horizontal turntable and a vertical turntable, illustratively, as shown in fig. 1, the horizontal turntable 402 may be disposed at the first end B1 of the supporting rod L (i.e., the first end of the supporting rod L is connected to the cavity of the test chamber 10 through the horizontal turntable 402, but is not limited thereto, the horizontal turntable 402 may also be disposed at the middle of the supporting rod L), the vertical turntable 401 is disposed at the second end B2 of the supporting rod L, and the aforementioned stage and the fixing clamp are disposed on the vertical turntable 401, so as to realize the rotation of the stage in the horizontal and/or vertical directions through the horizontal turntable 402 and/or the vertical turntable 401, so as to meet the multiple optical tests of the display panel fixed on the stage.
As shown in fig. 1, the moving unit may include a first rail 201 penetrating through the first chamber 101 and the second chamber 102, and a slider (not shown) connected to the horizontal turntable 402, and the slider is mounted on the first rail 201, so that the slider moves the horizontal turntable 402 and components (e.g., a support rod, a stage, etc.) connected thereto together when moving along the first rail.
In addition, in order to facilitate the replacement of the display panel, as shown in fig. 2, the supply device further includes a second rail 202; one end of the second rail 202 is abutted with the first rail 201, and the other end extends to the position of the sealing door 110, so that the whole panel carrier unit 30 can be moved to the position of the sealing door 110 through the second rail 202, thereby facilitating the replacement of the display panel carried by the panel carrier unit 30. Of course, in fig. 2 (in conjunction with fig. 1), the second rail 202 is illustrated as being vertically butted with the first rail 201, and in reality, the second rail 202 may be aligned with the first rail 201 (that is, the second rail 202 is located in the extending direction of the first rail 201), and both of them are integrated, which is not limited in the present invention.
Of course, fig. 1 only schematically shows a preferred arrangement of the panel carrier unit, the moving unit, and the rotating unit, but the present invention is not limited thereto, for example, the moving unit may be a telescopic robot arm connected to the cavity of the testing chamber 10, and the end of the robot arm is directly connected to the panel carrier unit through a multi-directional rotating mechanism to realize the movement and rotation of the panel carrier unit.
In addition, for the high and low temperature test environment providing device of the present invention, no matter for the low temperature test environment or the high temperature test environment, because the temperature difference between the inside and the outside of the test chamber is large, during the opening or closing process of the gate during the test, the gate itself will move outwards from the test chamber, or move inwards from the outside of the test chamber, in order to avoid the damage to itself and the whole providing device caused by the temperature difference, it is preferable that, as shown in fig. 3, the first chamber 101 and/or the second chamber 102 is provided with the air inlet 200 at a position close to the gate 20, wherein fig. 3 illustrates that the first chamber 101 and the second chamber 102 are provided with the air inlet 200 at a position close to the gate 20.
Thus, when a high-temperature test is carried out, zero-degree gas can be blown to the gate through the gas inlet 200 so as to prevent the gate and the supply device from being damaged by thermal expansion; when the low-temperature test is carried out, cold air can be blown to the gate through the air inlet to prevent the gate from frosting, so that the opening and closing of the gate are influenced.
For the same reason, in order to avoid that the panel carrying unit may excessively affect the replacement of the panel due to frosting between the room temperature environment and the detected temperature environment (e.g. low temperature environment) in the process of replacing the display panel carried on the panel carrying unit, based on this, the present invention preferably provides the air inlet at a position close to the panel carrying unit (e.g. the carrier) to blow zero-degree air or hot air to the panel carrying unit.
An embodiment of the present invention further provides a high and low temperature testing apparatus, as shown in fig. 4, the high and low temperature testing apparatus includes the providing apparatus 01 in the high and low temperature testing environment and a panel performance detecting apparatus 02, and the panel performance detecting apparatus 02 optically detects the display panel through a detecting window 120 located on the providing apparatus 01 in the high and low temperature testing environment; the panel performance detecting Device 02 is generally a test camera, such as a CCD (Charge Coupled Device), but is not limited thereto.
Since the high and low temperature test apparatus has the same structure and advantageous effects as the high and low temperature test environment providing apparatus provided in the foregoing embodiments. Since the foregoing embodiments have described the structure and advantageous effects of the providing apparatus for high and low temperature test environments in detail, detailed descriptions thereof are omitted.
The embodiment of the present invention further provides a method for adjusting a device for providing a high and low temperature test environment, and the following illustrates that the method for adjusting the device for providing a high and low temperature test environment provided in the foregoing embodiment is further described in order to provide the device for providing a high and low temperature test environment; it should be understood, of course, that the adjustment method is not limited to the provision of the apparatus in the embodiments of the present invention, and may be equally applicable to other corresponding types of provision, and that the adjustment method is merely illustrated for clarity and is not limiting to the invention.
Specifically, referring to fig. 1, the adjusting method includes:
first, the display panel 100 is placed in the first chamber 101, wherein the display panel 100 is carried by the panel carrying unit 30.
Then, the difference between the temperature of the first chamber 101 and the second chamber 102 and the test temperature is adjusted to be less than or equal to the threshold, and the panel bearing unit 30 bearing the display panel 100 is moved from the first chamber 101 to the second chamber 102 (it should be understood that the gate is in an open state at this time); the setting of the threshold may be selected according to the requirement, and the present invention is not limited to this, and for example, the threshold may be set to be less than or equal to 1 ℃, that is, the temperature difference between the temperature of the first chamber 101 and the second chamber 102 and the test temperature is within 1 ℃.
Specifically, the temperatures of the first chamber 101 and the second chamber 102 can be measured by a first temperature detection device 1011 disposed in the first chamber 101 and a second temperature detection device 1021 disposed in the second chamber 102; the temperature adjustment of the first chamber 101 and the second chamber 102 may be performed by a first temperature adjustment unit 1012 provided in the first chamber 101 and a second temperature adjustment unit 1022 provided in the second chamber 102, respectively.
Here, it should be noted that adjusting the temperature difference between the first chamber 101 and the second chamber 102 to be less than or equal to the threshold value may be: for example, in the case of testing the first display panel, the temperature difference between the test temperature and the overall temperature of the first chamber and the second chamber may be adjusted to be less than the threshold value in the state that the gate is opened; for another example, for a display panel to be replaced later, the temperature difference between the test temperature and the temperature of the first chamber and the second chamber needs to be adjusted to be less than the threshold value in the gate closed state.
Next, after the test of the display panel is completed, the panel loading unit 30 is moved from the second chamber 102 to the first chamber 101 through the shutter 20, and after the shutter 20 is closed, the display panel 100 is moved out of the test chamber 10 through the panel access 110 formed in the cavity of the first chamber 101.
The next display panel can then be replaced and the adjustment continued to be repeated according to the steps described above.
It should be noted that, in practice, in order to avoid damage to the display panel 100 due to too fast temperature change when the display panel 100 is removed from the testing chamber 10, generally, the temperature of the first chamber is adjusted to approach the room temperature at a rate of 1 ℃ per minute; of course, the temperature of the first chamber may also be adjusted to approach the test temperature at a rate of 1 c per minute after the display panel is replaced.
In summary, the testing chamber is divided into the first chamber and the second chamber by the gate, on one hand, the first chamber and the second chamber can be combined into one by opening the gate, so that the display panel is ensured to have enough testing space; on the other hand, through closing the gate with first cavity and second cavity separation, under this condition, the temperature in the great second cavity in space can continue to maintain, and only need open the less first cavity in space, change display panel, and under the condition of consuming short time and less energy consumption, can adjust the temperature of this first cavity to being close normal atmospheric temperature or test temperature, thereby solved among the current testing arrangement because of energy consumption and test efficiency limited and can't provide the high low temperature environment that has great space for display panel, thereby can't carry out the visual angle under high low temperature environment to display panel, the problem of the optical test of colour cast etc. needs great space.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
Claims (9)
1. The providing device for the high and low temperature test environment is characterized by comprising a test chamber and a gate capable of dividing the test chamber into a first chamber and a second chamber, wherein the space of the first chamber is smaller than that of the second chamber;
the providing device further comprises a panel bearing unit, a moving unit for moving the panel bearing unit between the first chamber and the second chamber, and a rotating unit for rotating the panel bearing unit;
a panel inlet and a panel outlet are formed in the cavity of the first chamber, and a sealing door is arranged on the panel inlet and the panel outlet; a detection window is arranged on the cavity of the second chamber;
a first temperature detection device and a first temperature adjusting device are arranged in the first chamber, and a second temperature detection device is arranged in the second chamber;
the panel bearing unit comprises a supporting rod;
the rotating unit includes: the horizontal rotary table and the vertical rotary table are connected with the supporting rod;
the horizontal turntable is positioned at the first end of the supporting rod, and the first end is connected with the cavity of the test chamber; the vertical rotary table is positioned at the second end of the supporting rod, and a fixing clamp for fixing the display panel is arranged on the vertical rotary table.
2. The supply device according to claim 1, wherein the moving unit includes a first rail penetrating the first chamber and the second chamber, and a slider connected to the horizontal turntable, and the slider is mounted on the first rail.
3. The providing device of claim 2 further comprising a second track;
one end of the second track is in butt joint with the first track, and the other end of the second track extends to the position of the sealing door.
4. The provision device according to claim 1, characterised in that a second temperature regulation device is provided in the second chamber.
5. Supply device according to claim 1 or 4, characterized in that said first temperature regulation means and/or said second temperature regulation means comprise an inlet for the filling of the heat carrier gases and an outlet for the evacuation of the heat carrier gases.
6. The supply device according to claim 1, wherein the supply device is provided with an air inlet at a position close to the panel carrying unit.
7. The supply device according to claim 1, wherein the first chamber and/or the second chamber is provided with an air inlet at a position close to the shutter.
8. A high and low temperature test apparatus, comprising the high and low temperature test environment providing apparatus of any one of claims 1 to 7, and a panel performance detecting apparatus.
9. A method for adjusting a provision apparatus of a high and low temperature test environment according to any one of claims 1 to 7,
placing a display panel into the first chamber, wherein the display panel is carried by the panel carrying unit;
adjusting the difference value between the temperature of the first chamber and the second chamber and the testing temperature to be less than or equal to a threshold value, and moving the panel bearing unit bearing the display panel from the first chamber to the second chamber;
after the test of the display panel is finished, the panel bearing unit is moved to the first chamber from the second chamber through the gate, and after the gate is closed, the display panel is moved out of the test chamber through a panel inlet and a panel outlet formed in the first chamber.
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| CN201810034262.8A CN107957637B (en) | 2018-01-12 | 2018-01-12 | High-low temperature test environment providing device, adjusting method and testing device |
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| CN201810034262.8A CN107957637B (en) | 2018-01-12 | 2018-01-12 | High-low temperature test environment providing device, adjusting method and testing device |
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| CN110426870B (en) * | 2019-07-09 | 2022-04-26 | 深圳市华星光电半导体显示技术有限公司 | Liquid crystal dripping assembly and liquid crystal dripping machine |
| CN115629493A (en) * | 2022-12-22 | 2023-01-20 | 江苏比微曼智能科技有限公司 | Vacuum lighting fixture |
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