CN107908510A - The wireless test system of multiple servers and electronic product stability can be tested at the same time - Google Patents

The wireless test system of multiple servers and electronic product stability can be tested at the same time Download PDF

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Publication number
CN107908510A
CN107908510A CN201711108541.6A CN201711108541A CN107908510A CN 107908510 A CN107908510 A CN 107908510A CN 201711108541 A CN201711108541 A CN 201711108541A CN 107908510 A CN107908510 A CN 107908510A
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CN
China
Prior art keywords
host
module
microcontroller
sut
test
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711108541.6A
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Chinese (zh)
Inventor
曹翔
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Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Priority to CN201711108541.6A priority Critical patent/CN107908510A/en
Publication of CN107908510A publication Critical patent/CN107908510A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268Logging of test results
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2284Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses the wireless test system that can test multiple servers and electronic product stability at the same time, setting module is inputted including multiline message, Host microcontroller main control modules, coded excitation module, receiving module, SUT microcontroller main control modules are decoded, multiline message input setting module includes Host hosts, the transmission on Host hosts and receiving module, microcontroller main control module, real-time display test mode and storage inquiry test information are given according to the information output control information of input;Host microcontrollers main control module includes Host microcontrollers, microcontroller passes through RS232 serial ports and Host host communications, microcontroller is connected by PWBTN driving switch with SUT microcontroller main control modules, microcontroller is connected with coded excitation module, decoding receiving module, the driving switch of SUT microcontroller master control module controls Power Button, completes the open and close action of tester table Power Button.

Description

The wireless test system of multiple servers and electronic product stability can be tested at the same time
Technical field
The present invention relates to computer server and other electronic product stability test technical fields, and the present invention is on one Kind at the same time can carry out more electronic products the wireless Auto-Test System of stability test, be applied to service especially with respect to one kind The high precision wireless Auto-Test System of device and stability test.
Background technology
In the test of the electronic products such as server, DC Cycle tests must be surveyed in the test of the electronic products such as calculator Project, it is related to the reliability and stability of product, is the precondition of electronic product reliability and stability.It is but existing at present Some Power Cycling Tester can only carry out AC tests or DC tests, and function is single, can only pass through the interfaces such as serial ports With wire rod with the man-to-man test of product, and the information provided during test is not accurate enough, because the DC Cycle testing times are grown, When product is very much, the conflict and waste of equipment are be easy to cause, the extended testing system time, can increase R&D cycle of product.
The content of the invention
The present invention is aiming at deficiencies of the prior art, there is provided one kind can be at the same time to multiple servers and electronics Product carries out the high precision wireless Auto-Test System of DC Cycle project testings, and the present invention synchronously can be carried out also automatically respectively Test, realizes that DC Power Cycle are tested by circulating triggering Power Button power buttons, is set by Host hosts Parameter, record, display test information, using wireless communication from the limitation of test site, at any time addition test, improves service Device and quality and efficiency of the electronic product when Power Cycle are tested, improve measuring accuracy.
The present invention solve technical problem technical solution be:
A kind of wireless test system that can test multiple servers and electronic product stability at the same time, including multiline message are defeated Enter setting module, Host microcontroller main control modules, coded excitation module, decodes receiving module, SUT microcontroller main control modules, institute Stating multiline message input setting module includes Host hosts, the transmission on Host hosts and receiving module, for sending The information of testing setup and the test result information for receiving tester table feedback;Host microcontrollers main control module includes Host monolithics Machine, microcontroller pass through PWBTN driving switch and SUT microcontroller master control moulds by RS232 serial ports and Host host communications, microcontroller Block connects, and microcontroller is connected with coded excitation module, decoding receiving module, SUT microcontroller master control module controls Power The driving switch of Button, completes the open and close action of tester table Power Button.
The SUT microcontrollers main control module includes SUT microcontrollers, and SUT microcontrollers pass through RS232 serial ports and tester table SUT is communicated, the successful information of acceptance test board Power Cycle.
The coded excitation module include coding controller, wireless transmitter module, power amplifier module, coding controller, Wireless transmitter module, power amplifier module are sequentially connected electrically, and coding controller is connected with Host microcontrollers, carry out channelization codes with The transmitting of command signal.
The decoding receiving module includes decoding controller, the wireless receiving module being connected, decoding controller and Host Microcontroller connects, and carries out the decoding of channelization codes and command signal.
The Host microcontrollers send channelization codes signal and command signal to coding according to the input information of master control PC The coding controller coding of transmitting module, Host hosts are fed back to by the signal that wireless receiving module obtains by decoding controller Software parsed.
The Host hosts record during the test and real-time display test mode, until the test loop number of setting Complete, the program display test result that final system passes through Host hosts.
The Power Button switch for two pin, SUT microcontrollers connection relay, relay and Power Button Two pin switches be electrically connected, two Pin of the automatically controlled closure of relay switches, the closed action that simulation Power Buttonn are switched.
Beneficial effects of the present invention:
1. the present invention is for Power Cycling Tester existing in the prior art in problem present on test, there is provided At the same time multiple servers and electronic product can be carried out with the wireless Auto-Test System of DC Cycle project testings, touched by circulating Hair Power Button power buttons realize that DC Power Cycle are tested, and by Host hosts come setup parameter, improve service Device and quality and efficiency of the electronic product when Power Cycle are tested, reduce testing time and cost, shorten research and development week Phase, improves economic benefit.
2. the present invention is easy to operate easily can synchronously can also to be tested automatically respectively, fully functional, more can be carried out The automatic test of the DC Cycle of SUT, by Host hosts come setup parameter, record, display test information, using wireless communication Design, from the limitation of test site, add test at any time, not only lift testing efficiency, and improve measuring accuracy.
Brief description of the drawings
Fig. 1 is schematic structural view of the invention one;
Fig. 2 is schematic structural view of the invention two;
Fig. 3 is the DC Power Cycle test flow charts of the present invention.
Embodiment
For a better understanding of the present invention, embodiments of the present invention are explained in detail below in conjunction with the accompanying drawings.
With reference to Fig. 1 to Fig. 3, a kind of wireless test system that can test multiple servers and electronic product stability at the same time, The present invention at the same time can carry out multiple servers and electronic product DC Cycle tests, which includes multiline message input setting Module, Host microcontroller main control modules, coded excitation module, decodes receiving module, SUT microcontroller main control modules, the multichannel Information input setting module includes Host hosts, the transmission on Host hosts and receiving module, can send test in time The information of setting and the test result information for receiving tester table feedback;The channel that can be sent by software set wireless receiving Password, test loop number, the circulation time parameter such as interval, and can be according to the information of input, output control information is to single Piece machine main control module, also has the function of real-time display test mode and storage inquiry test information concurrently;Host microcontroller master controls Module includes Host microcontrollers, and microcontroller passes through PWBTN driving switch by RS232 serial ports and Host host communications, microcontroller It is connected with SUT microcontroller main control modules, microcontroller is connected with coded excitation module, decoding receiving module, SUT microcontroller master control moulds The driving switch of block control Power Button, completes the open and close action of tester table Power Button.Wherein Power Button is starting key, and starting key switchs for two pin, and boot action is exactly two Pin switch closures, and driving switch is relay Device switchs, and SUT microcontrollers trigger signal can automatically controlled closure Pin switches closure to relay, relay.SUT microcontrollers connection after Electric appliance, relay reconnect the two pin switches of Power Button, it is possible to which two Pin of automatically controlled closure are switched, analogue-key closure Action.
The SUT microcontrollers main control module includes SUT microcontrollers, and SUT microcontrollers pass through RS232 serial ports and tester table SUT is communicated, the successful information of acceptance test board Power Cycle.
The coded excitation module include coding controller, wireless transmitter module, power amplifier module, coding controller, Wireless transmitter module, power amplifier module are sequentially connected electrically, and coding controller is connected with Host microcontrollers, carry out channelization codes with The transmitting of command signal.
The decoding receiving module includes decoding controller, the wireless receiving module being connected, decoding controller and Host Microcontroller connects, and carries out the decoding of channelization codes and command signal.
The Host microcontrollers of the present invention can send channelization codes signal and command signal according to the input information of master control PC Coding controller to coded excitation module encodes, and the signal that wireless receiving module obtains is passed through decoding controller feedback Software to Host hosts is parsed.
The Host hosts record during the test and real-time display test mode, until the test loop number of setting Complete, final system shows test result automatically by the program of Host hosts.
The Host microcontroller of the present invention can carry out the automatic of wireless DC Cycle projects to more tester tables at the same time Test, without manually participating in, and can monitor the test status of each board in time, can reach multi-path monitoring, multi-channel control Effect.
The course of work of the present invention is that when use first passes through the selection of Host microcontrollers setting channel, time of loop test The parameter such as number and time, then starts operation program, master control PC photos and sending messages give Host microcontroller main control modules;When selection channel Afterwards, Host microcontrollers can recall corresponding channelization codes by coded excitation module according to the numbering of passage, then with Power After the command signal of On/Off is mixed into pulse code signal, encodes and then launch by coding controller.
SUT microcontrollers all at this time can all receive signal, but each SUT microcontrollers can be determined according to the signal after decoding , just can execute instruction after the password match that channelization codes are set with oneself.Carried out below by way of a specific passage example detailed Describe in detail bright:
When selector channel 1 carries out DC Power Cycle test, Host microcontrollers can recall pair according to the numbering of passage 1 1 password of channel answered, it is right to coding controller coding after then the command signal with Power On is mixed into pulse code signal After launch, SUT microcontrollers all at this time can all receive signal, but after channelization codes compare, only SUT-1 monolithics Machine module can perform the instruction of Power On, and the driving switch of SUT one-chip computer modules control Power Button closes once, phase Start when in the Power Button for pressing tester table, tester table SUT-1, photos and sending messages give SUT microcontrollers after starting successfully Module, SUT one-chip computer modules give Host hosts by Host one-chip computer modules feedback information, and Host hosts pass through wireless communication again Hair Power Off are instructed to tester table, so far complete one cycle, one cycle test.
Host hosts can record during the test and dispaly state, until the cycle-index completion of setting, final system Test result can be shown automatically by the software of master control PC.
Although embodiment that the present invention has shown that and the invention has been described, for those of ordinary skill in the art, can with These can be applied in the case where not departing from the principle of the present invention and spirit example by, which understanding, carries out a variety of change, modification, replacement and modification, all Belong to stating within claims for this present invention.

Claims (7)

1. a kind of wireless test system that can test multiple servers and electronic product stability at the same time, it is characterized in that, system includes Multiline message inputs setting module, and Host microcontroller main control modules, coded excitation module, decodes receiving module, SUT monolithic owners Module is controlled, the multiline message input setting module includes Host hosts, the transmission on Host hosts and receiving module, For sending the information of testing setup and receiving the test result information of tester table feedback;Host microcontroller main control modules include Host microcontrollers, microcontroller pass through PWBTN driving switch and SUT monolithics by RS232 serial ports and Host host communications, microcontroller Machine main control module connects, and microcontroller is connected with coded excitation module, decoding receiving module, SUT microcontroller master control module controls The driving switch of Power Button, completes the open and close action of tester table Power Button.
2. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the SUT microcontrollers main control module includes SUT microcontrollers, and SUT microcontrollers pass through RS232 serial ports and tester table SUT Communication, the successful information of acceptance test board Power Cycle.
3. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the coded excitation module includes coding controller, wireless transmitter module, power amplifier module, coding controller, nothing Line transmitting module, power amplifier module are sequentially connected electrically, and coding controller is connected with Host microcontrollers, carry out channelization codes with referring to Make the transmitting of signal.
4. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the decoding receiving module includes decoding controller, the wireless receiving module being connected, and decoding controller and Host are mono- Piece machine connects, and carries out the decoding of channelization codes and command signal.
5. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the Host microcontrollers send channelization codes signal and command signal to coding according to the input information of master control PC The coding controller coding of transmitting module, Host hosts are fed back to by the signal that wireless receiving module obtains by decoding controller Software parsed.
6. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the Power Button switch for two pin, and SUT microcontrollers connection relay, relay is with Power Button's Two pin switches are electrically connected, two Pin of the automatically controlled closure of relay switches, the closed action of simulation Power Buttonn switches.
7. the wireless test system of multiple servers and electronic product stability can be tested at the same time as claimed in claim 1, its It is characterized in, the Host hosts record during the test and real-time display test mode, until the test loop number of setting Complete, the program display test result that final system passes through Host hosts.
CN201711108541.6A 2017-11-09 2017-11-09 The wireless test system of multiple servers and electronic product stability can be tested at the same time Pending CN107908510A (en)

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CN201711108541.6A CN107908510A (en) 2017-11-09 2017-11-09 The wireless test system of multiple servers and electronic product stability can be tested at the same time

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216138A (en) * 1987-03-02 1988-09-08 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン Test circuit
CN102736012A (en) * 2011-04-02 2012-10-17 鸿富锦精密工业(深圳)有限公司 System and method for testing direct current circuit
CN106055443A (en) * 2016-06-07 2016-10-26 浪潮电子信息产业股份有限公司 Multi-path DC loop test system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216138A (en) * 1987-03-02 1988-09-08 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン Test circuit
CN102736012A (en) * 2011-04-02 2012-10-17 鸿富锦精密工业(深圳)有限公司 System and method for testing direct current circuit
CN106055443A (en) * 2016-06-07 2016-10-26 浪潮电子信息产业股份有限公司 Multi-path DC loop test system

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Application publication date: 20180413

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