CN107884339B - Adaptive laser spectrum suitable for deep space micro-area analysis and imaging method - Google Patents
Adaptive laser spectrum suitable for deep space micro-area analysis and imaging method Download PDFInfo
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Abstract
本发明公开了一种适合深空微区分析的自适应激光光谱及成像方法,该方法是在一种自适应激光光谱及成像探测系统上实现的,该方法包括预期焦斑自适应聚焦标定、探测对象单点紧聚焦、拉曼荧光及成像信息获取、拉曼荧光成像扫描微区分析、LIBS扫描微区分析及信息融合等五个步骤。本发明的有益效果是,提供了一种自适应激光光谱及成像探测方法,可在微区分析时自适应地调整聚焦光斑的直径;将电子目镜的区域平均灰度作为扫描成像点强度,同时满足自聚焦和宽谱扫描成像的要求;可同时实现三维空间LIBS元素分析、主动激光拉曼分子分析、高光谱荧光、可见宽谱扫描成像,提供多种信息以进行微区精细探测。
The invention discloses an adaptive laser spectrum and imaging method suitable for deep space micro-area analysis. The method is realized on an adaptive laser spectrum and imaging detection system, and the method includes the expected focal spot adaptive focusing calibration, There are five steps: single-point tight focusing of the detection object, Raman fluorescence and imaging information acquisition, Raman fluorescence imaging scanning micro-area analysis, LIBS scanning micro-area analysis and information fusion. The beneficial effect of the present invention is to provide an adaptive laser spectrum and imaging detection method, which can adaptively adjust the diameter of the focusing spot during micro-area analysis; It meets the requirements of self-focusing and wide-spectrum scanning imaging; it can simultaneously realize three-dimensional space LIBS elemental analysis, active laser Raman molecular analysis, hyperspectral fluorescence, and visible wide-spectrum scanning imaging, providing a variety of information for fine detection of micro-area.
Description
技术领域technical field
本发明涉及一种物质检测方法,尤其涉及一种采用扫描激光诱导等离子体LIBS、激光拉曼成像、激光诱导荧光成像及激光照明面阵宽谱扫描成像的物质检测方法,适用于深空探测行星开放环境下的物质探测,属于行星原位探测领域。The invention relates to a substance detection method, in particular to a substance detection method using scanning laser-induced plasma LIBS, laser Raman imaging, laser-induced fluorescence imaging and laser illumination surface array wide-spectrum scanning imaging, which is suitable for deep space exploration of planets Material detection in an open environment belongs to the field of planetary in-situ detection.
背景技术Background technique
对于未来的深空探测,对物质成分探测技术及方法提出了更高的要求,原位精细探测能力是各航天大国瞄准的技术至高点。精细探测即要求激光聚焦点更小,分析的物质量很小,元素及分子种类更丰富,定量化更准确同时又在极高空间分辨成像的监控下进行。For future deep space exploration, higher requirements are put forward for the detection technology and method of material composition. Fine detection requires a smaller laser focus point, a small amount of material to be analyzed, a richer variety of elements and molecules, and a more accurate quantification, while monitoring with extremely high spatial resolution imaging.
激光诱导等离子光谱(LIBS)、激光拉曼(Raman)及紫外激光诱导荧光为物质成分分析的重要手段,其中LIBS可实现物质组成元素的分析,激光Raman可实现物质分子组成的分析,而紫外激光诱导荧光除了可用于成像以外,还可用于一些元素尤其是稀土元素的分析。深空微区探测中的LIBS及拉曼物质分析比常规的激光光谱应用要求更高,主要面临的挑战及技术难点在于由于测试对象岩石、土壤中含有的矿物质组成复杂,同种矿物颗粒粒径极小。因此,在微区分析时要求激光聚焦光斑在1微米的量级,才能对矿物进行精确的微区分析,对显微光路要求极高,常规的拉曼探头受光纤传输模式的影响,其聚焦光斑受激光模式退化及衍射极限的影响,因此其聚焦光斑常大于5微米,无法满足要求;采用自由光路加短波长激光再加高倍率高数值孔径的显微物镜的综合,理论上可获取极小的聚焦光斑,但由于聚焦景深极小,因此,必须找到微区分析三维结构分析的合适的自聚焦方案,以及保证每点的聚焦光斑大小一致且与设计值相符,同时,如果自聚焦时间长,将使得扫描成像速度受到影响。因此,需要简捷快速的拉曼自聚焦及宽谱扫描成像方式,此外为了系统光路的紧凑,LIBS与拉曼探测也必须复用大部分光学组件。Laser Induced Plasma Spectroscopy (LIBS), Laser Raman (Raman) and UV Laser Induced Fluorescence are important means of material composition analysis. Among them, LIBS can realize the analysis of material composition elements, laser Raman can realize the analysis of material molecular composition, and UV laser can realize the analysis of material composition elements. Besides imaging, induced fluorescence can also be used for the analysis of some elements, especially rare earth elements. LIBS and Raman material analysis in deep space micro-area detection have higher requirements than conventional laser spectroscopy applications. The main challenges and technical difficulties are that due to the complex composition of minerals contained in the rocks and soils of the test objects, the same mineral particles Diameter is very small. Therefore, in micro-area analysis, the laser focusing spot is required to be on the order of 1 micron, in order to carry out accurate micro-area analysis of minerals, and the requirements for the microscopic optical path are extremely high. The conventional Raman probe is affected by the optical fiber transmission mode, its focusing The light spot is affected by the degradation of the laser mode and the diffraction limit, so the focusing spot is often larger than 5 microns, which cannot meet the requirements; the combination of free light path, short wavelength laser and high magnification and high numerical aperture microscope objective can theoretically obtain extremely Small focusing spot, but because the focusing depth of field is extremely small, it is necessary to find a suitable self-focusing solution for micro-analysis 3D structure analysis, and ensure that the focusing spot size of each point is consistent and consistent with the design value. At the same time, if the self-focusing time long, the scanning imaging speed will be affected. Therefore, a simple and fast Raman self-focusing and wide-spectrum scanning imaging method is required. In addition, for the compact optical path of the system, LIBS and Raman detection must also reuse most of the optical components.
针对以上深空微区激光光谱探测及成像需求,本发明提出一种采用扫描LIBS、扫描激光拉曼成像、扫描激光诱导荧光成像及面阵宽谱扫描成像的物质检测方法,适用于深空探测行星开放环境下的微区物质探测,可得到微区的三维形貌以及对应的原子、分子分布和稀土类荧光物质分布。In view of the above requirements for laser spectral detection and imaging in micro-area in deep space, the present invention proposes a substance detection method using scanning LIBS, scanning laser Raman imaging, scanning laser-induced fluorescence imaging and area array broad-spectrum scanning imaging, which is suitable for deep space detection The micro-area material detection in the open environment of the planet can obtain the three-dimensional morphology of the micro-area and the corresponding distribution of atoms, molecules and rare earth fluorescent substances.
发明内容SUMMARY OF THE INVENTION
本发明的目的在于提供一种深空微区自适应激光光谱及成像探测方法,可精确得到所需要的恒定聚焦光斑尺寸,并在LIBS、拉曼荧光光谱分布探测的同时,获得探测对象的微区三维形貌,满足微区原位物质分析的需求。The purpose of the present invention is to provide a deep space micro-area adaptive laser spectrum and imaging detection method, which can accurately obtain the required constant focusing spot size, and obtain the microscopic image of the detection object at the same time as the LIBS and Raman fluorescence spectral distribution detection. The three-dimensional morphology of the micro-area can meet the needs of in-situ material analysis in the micro-area.
本发明提出的自适应激光光谱及成像探测方法是在自适应激光光谱及成像探测系统上实现的,该系统由主控制器、光谱仪、光纤、三维电机驱动器、三维精密电动平台、数字脉冲延迟控制器与光学头部组成;The adaptive laser spectrum and imaging detection method proposed by the present invention is realized on the adaptive laser spectrum and imaging detection system. device and optical head;
其中光学头部由LIBS激光器、LIBS切入全反镜、切入控制器、紫外拉曼激光器、紫外干涉滤光片、次级电机驱动器、次级直线电动平台、低倍紫外显微物镜、双色镜、长工作距离高倍紫外显微物镜、主电机驱动器、主直线电动平台、紫外瑞利滤光片、比例分光片、显微物镜、管透镜和电子目镜组成;电子目镜内有成像镜头和图像传感器;The optical head consists of LIBS laser, LIBS cut-in total mirror, cut-in controller, ultraviolet Raman laser, ultraviolet interference filter, secondary motor driver, secondary linear motorized stage, low magnification ultraviolet microscope objective lens, dichroic mirror, Long working distance high magnification UV microscope objective lens, main motor driver, main linear motor stage, UV Rayleigh filter, proportional beam splitter, microscope objective lens, tube lens and electronic eyepiece; the electronic eyepiece has imaging lens and image sensor;
LIBS激光器其沿LIBS光轴发出的脉冲LIBS激光束与紫外拉曼激光器沿主光轴发出的连续激光具有相同的初始光束直径和相同的极小发散角;当处于非LIBS工作模式时,切入控制器将LIBS切入全反镜切出主光轴;当处于LIBS工作模式时,切入控制器将LIBS切入全反镜切入进主光轴,此时,LIBS激光器与紫外拉曼激光器的输出口到LIBS切入全反镜的距离相等,LIBS激光器沿LIBS光轴发出的脉冲LIBS激光束经LIBS切入全反镜全反后,进入主光轴传输,形成柱形近准直激光束穿过低倍紫外显微物镜,形成锥形激光束穿过双色镜后,经长工作距离高倍紫外显微物镜聚焦至探测目标,LIBS回波信号反向沿主光轴穿过长工作距离高倍紫外显微物镜,双色镜反射后沿接收光轴行进,到达比例分光片后分成正交的两路:一路经反射沿成像光轴行进,在LIBS模式下这路信号不用;另一路透过比例分光片后,经紫外瑞利滤光片将LIBS激光器波长的瑞利散射滤除后,再经显微物镜聚焦至光纤的入射端面,然后进入光谱仪进行分析;数字脉冲延迟控制器有两个控制端,分别接LIBS激光器与光谱仪的外部触发端口;数字脉冲延迟控制器用来设定LIBS激光器的工作频率以及LIBS激光器与光谱仪两者之间开启的延时;The pulsed LIBS laser beam emitted by the LIBS laser along the LIBS optical axis has the same initial beam diameter and the same extremely small divergence angle as the continuous laser beam emitted by the ultraviolet Raman laser along the main optical axis; when in the non-LIBS working mode, the switch-in control The controller cuts the LIBS into the total reflection mirror and cuts out the main optical axis; when in the LIBS working mode, the switch-in controller cuts the LIBS into the total reflection mirror into the main optical axis. At this time, the output ports of the LIBS laser and the ultraviolet Raman laser are sent to the LIBS The distances cut into the total reflection mirror are equal, and the pulsed LIBS laser beam emitted by the LIBS laser along the LIBS optical axis is cut into the total reflection mirror by the LIBS, and then enters the main optical axis for transmission, forming a cylindrical nearly collimated laser beam passing through the low magnification ultraviolet display. Micro-objective lens, after forming a cone-shaped laser beam and passing through the dichroic mirror, it is focused to the detection target by the long working distance high-power ultraviolet microscope objective lens, and the LIBS echo signal passes through the long working distance high-power ultraviolet microscope objective lens along the main optical axis in the reverse direction. After mirror reflection, it travels along the receiving optical axis, and reaches the proportional beam splitter and divides into two orthogonal paths: one path travels along the imaging optical axis after reflection, and this signal is not used in LIBS mode; the other path passes through the proportional beam splitter and passes through the ultraviolet The Rayleigh filter filters out the Rayleigh scattering at the wavelength of the LIBS laser, and then is focused on the incident end face of the optical fiber by the microscope objective lens, and then enters the spectrometer for analysis; the digital pulse delay controller has two control ends, which are respectively connected to the LIBS laser The external trigger port of the spectrometer; the digital pulse delay controller is used to set the operating frequency of the LIBS laser and the opening delay between the LIBS laser and the spectrometer;
紫外拉曼激光器沿主光轴发出的激光束穿过紫外干涉滤光片,可滤除紫外拉曼激光器发出的紫外激光的分频谐波干扰,使得其激发的拉曼信号信噪比更高;形成的柱形近准直激光束穿过低倍紫外显微物镜,形成锥形激光束;锥形激光束穿过双色镜后,到达长工作距离高倍紫外显微物镜的入瞳,在入瞳的位置处,锥形激光束的直径将大于入瞳的直径,由于锥形激光束的锥角为定值,因此低倍紫外显微物镜与长工作距离高倍紫外显微物镜的距离越远,锥形激光束的直径比入瞳的直径大得越多,穿过长工作距离高倍紫外显微物镜的激光能量越弱,但聚焦光斑越小;因此可通过调节低倍紫外显微物镜与长工作距离高倍紫外显微物镜的距离,在穿过长工作距离高倍紫外显微物镜的激光能量与聚焦光斑大小中做出取舍,即大能量大光斑,小能量小光斑;回波信号反向沿主光轴穿过长工作距离高倍紫外显微物镜,双色镜反射后沿接收光轴行进,到达比例分光片后分成正交的两路:一路经反射沿成像光轴行进,经管透镜聚焦至电子目镜内的成像镜头的一倍至二倍焦距之间,经成像镜头成放大的实像至图像传感器;另一路透过比例分光片后,经紫外瑞利滤光片将紫外拉曼激光器波长的瑞利散射滤除后,再经显微物镜聚焦至光纤的入射端面,然后进入光谱仪进行分析;低倍紫外显微物镜安装在次级直线电动平台上,可在次级电机驱动器的带动下沿主光轴作一维精密平动;长工作距离高倍紫外显微物镜安装在主直线电动平台上,可在主电机驱动器的带动下沿主光轴作一维精密平动;次级直线电动平台的平动主要用来改变低倍紫外显微物镜与长工作距离高倍紫外显微物镜的距离;主直线电动平台的平动主要用来使长工作距离高倍紫外显微物镜精确聚焦;LIBS光轴、主光轴、成像光轴、接收光轴四者共面;主光轴与成像光轴平行,且与LIBS光轴、接收光轴垂直;The laser beam emitted by the UV Raman laser along the main optical axis passes through the UV interference filter, which can filter out the frequency division harmonic interference of the UV laser emitted by the UV Raman laser, so that the Raman signal excited by it has a higher signal-to-noise ratio. ; The formed cylindrical near-collimated laser beam passes through the low-power UV microscope objective to form a cone-shaped laser beam; after the cone-shaped laser beam passes through the dichroic mirror, it reaches the entrance pupil of the long-working distance high-power UV microscope objective. At the position of the pupil, the diameter of the conical laser beam will be larger than the diameter of the entrance pupil. Since the cone angle of the conical laser beam is a fixed value, the farther the distance between the low-power UV microscope objective and the long working distance high-power UV microscope objective is , the larger the diameter of the cone laser beam is than the diameter of the entrance pupil, the weaker the laser energy passing through the long working distance high magnification UV microscope objective, but the smaller the focused spot; therefore, by adjusting the low magnification UV microscope objective and the The distance of the long working distance high power UV microscope objective lens is a trade-off between the laser energy passing through the long working distance high power UV microscope objective lens and the size of the focused spot, that is, a large spot with large energy, a small spot with small energy; the echo signal is reversed It passes through the long working distance high-power ultraviolet microscope objective along the main optical axis, travels along the receiving optical axis after being reflected by the dichroic mirror, and then divides into two orthogonal paths after reaching the proportional beam splitter: one travels along the imaging optical axis after reflection, and is focused by the tube lens to Between one and two times the focal length of the imaging lens in the electronic eyepiece, an enlarged real image is sent to the image sensor through the imaging lens; after the other way passes through the proportional beam splitter, the ultraviolet Rayleigh filter converts the wavelength of the ultraviolet Raman laser. After the Rayleigh scattering is filtered out, it is focused to the incident end face of the optical fiber by the microscope objective lens, and then enters the spectrometer for analysis; The main optical axis performs one-dimensional precision translation; the long working distance high-power ultraviolet microscope objective lens is installed on the main linear motorized stage, which can be driven by the main motor driver for one-dimensional precision translation along the main optical axis; the secondary linear motorized stage The translation is mainly used to change the distance between the low-power UV microscope objective and the long working distance high-power UV microscope objective; the translation of the main linear motorized stage is mainly used to make the long working distance high-power UV microscope objective focus accurately; LIBS optical axis , the main optical axis, the imaging optical axis, and the receiving optical axis are coplanar; the main optical axis is parallel to the imaging optical axis, and perpendicular to the LIBS optical axis and the receiving optical axis;
光学头部安装在三维精密电动平台上,三维精密电动平台可在三维电机驱动器的驱动下作亚微米级的三维精密运动;The optical head is installed on the 3D precision electric platform, and the 3D precision electric platform can perform sub-micron 3D precision motion under the drive of the 3D motor driver;
主控制器可对切入控制器、数字脉冲延迟控制器、三维电机驱动器、主电机驱动器、次级电机驱动器、紫外拉曼激光器、图像传感器、光谱仪发控制指令;主控制器还设置光谱仪的曝光时间,且可接收图像传感器的输出数字图像以及光谱仪的输出光谱信息;The main controller can send control commands to the cut-in controller, digital pulse delay controller, three-dimensional motor driver, main motor driver, secondary motor driver, ultraviolet Raman laser, image sensor, and spectrometer; the main controller also sets the exposure time of the spectrometer , and can receive the output digital image of the image sensor and the output spectral information of the spectrometer;
本发明提出的自适应激光光谱及成像探测方法包括以下步骤:The adaptive laser spectrum and imaging detection method proposed by the present invention includes the following steps:
(1)预期焦斑自适应聚焦标定(1) Adaptive focus calibration of expected focal spot
深空物质原位探测中,对不同的探测对象需要不同尺度的拉曼聚焦点,即预期焦斑,例如对分布较均匀的矿物质,可以采用略大尺寸的预期焦斑;而对于变化较多的矿物质,可采用极小尺寸的预期焦斑,以实现极精细微区分析;In the in situ detection of deep space matter, different scales of Raman focal points are required for different detection objects, that is, the expected focal spot. For example, for minerals with a relatively uniform distribution, a slightly larger expected focal spot can be used; A large amount of minerals can be used with an expected focal spot of extremely small size to achieve extremely fine micro-analysis;
首先,对于根据测试区域的探测对象基本性质,设定预期焦斑的直径;将测量分划板放置在长工作距离高倍紫外显微物镜下方的测试区域;测量分划板上有均匀刻线;First, set the diameter of the expected focal spot according to the basic properties of the detection object in the test area; place the measurement reticle in the test area under the long working distance high-power UV microscope objective; the measurement reticle has uniform scribe lines;
主控制器控制开启紫外拉曼激光器,其发出的紫外激光束依次经过紫外干涉滤光片、低倍紫外显微物镜、双色镜,然后经长工作距离高倍紫外显微物镜照亮并聚焦至测量分划板,形成实时焦斑;测量分划板的反射光沿反向沿主光轴穿过长工作距离高倍紫外显微物镜,经双色镜反射,再经比例分光片反射,经管透镜聚焦,再经成像镜头实时显微成像至图像传感器;The main controller controls to turn on the ultraviolet Raman laser, and the ultraviolet laser beam emitted by it passes through the ultraviolet interference filter, the low-power ultraviolet microscope objective lens, the dichroic mirror in turn, and then is illuminated by the long working distance high-power ultraviolet microscope objective lens and focused to the measurement The reticle forms a real-time focal spot; the reflected light from the measurement reticle passes through the long working distance high-power ultraviolet microscope objective lens along the main optical axis in the reverse direction, is reflected by the dichroic mirror, and then is reflected by the proportional beam splitter, and is focused by the tube lens. Then real-time microscopic imaging to the image sensor through the imaging lens;
主控制器接收图像传感器输出的显微数字图像,并作实时图像处理;采用边缘提取算法获取实时焦斑外圆轮廓,从而确定实时焦斑的成像区域,计算成像区域内所有像素的平均灰度值G;The main controller receives the microscopic digital image output by the image sensor and performs real-time image processing; the edge extraction algorithm is used to obtain the outer circle outline of the real-time focal spot, so as to determine the imaging area of the real-time focal spot, and calculate the average gray level of all pixels in the imaging area. value G;
主控制器发出指令给主电机驱动器,带动主直线电动平台向下运动一个步长;主控制器接收图像传感器输出的显微数字图像,确定实时焦斑的成像区域,计算成像区域内所有像素的平均灰度值G,并比较G值是增大还是减小了:如果G值增大,说明向下运动是接近焦点的方向;如果G值减小,说明向上运动是接近焦点的方向;The main controller sends an instruction to the main motor driver to drive the main linear electric platform to move down by one step; the main controller receives the microscopic digital image output by the image sensor, determines the imaging area of the real-time focal spot, and calculates the imaging area of all pixels in the imaging area. Average the gray value G, and compare whether the G value increases or decreases: if the G value increases, it means that the downward movement is in the direction of approaching the focus; if the G value decreases, it means that the upward movement is in the direction of approaching the focus;
主控制器发出指令给主电机驱动器,带动主直线电动平台向接近焦点的方向运动,同时实时计算实时焦斑的成像区域内所有像素的平均灰度值G,直至G值达到最大值,此时为紧聚焦状态,主控制器发出指令给主电机驱动器,停止运动;The main controller sends an instruction to the main motor driver to drive the main linear electric platform to move in the direction close to the focus, and at the same time calculate the average gray value G of all pixels in the imaging area of the real-time focal spot until the G value reaches the maximum value. In the tight focusing state, the main controller sends an instruction to the main motor driver to stop the movement;
在紧聚焦状态下,主控制器对图像传感器输出的显微数字图像采用边缘提取算法获取测量分划板的刻线的直线位置,以及实时焦斑外圆轮廓,然后计算相邻刻线间隔的像素个数以及实时焦斑外圆轮廓直径的像素个数,从而根据刻线的间距计算得到实时焦斑的直径;In the tight focus state, the main controller uses the edge extraction algorithm to obtain the straight line position of the reticle of the measurement reticle and the real-time outer circle outline of the focal spot, and then calculates the distance between the adjacent reticle. The number of pixels and the number of pixels of the diameter of the outer circle of the real-time focal spot, so as to calculate the diameter of the real-time focal spot according to the spacing of the reticle;
如果实时焦斑的直径大于预期焦斑的直径,则主控制器发出指令给次级电机驱动器,带动次级直线电动平台向上运动,增加低倍紫外显微物镜与长工作距离高倍紫外显微物镜的距离,此时穿过长工作距离高倍紫外显微物镜的激光能量减弱,但实时焦斑减小,直至实时焦斑的直径与预期焦斑的直径相等,主控制器发出指令给次级电机驱动器,停止次级直线电动平台的运动;If the diameter of the real-time focal spot is larger than that of the expected focal spot, the main controller sends an instruction to the secondary motor driver to drive the secondary linear motor platform to move upward, adding a low-power UV microscope objective lens and a long working distance high-power UV microscope objective lens At this time, the laser energy passing through the long working distance high-power ultraviolet microscope objective lens is weakened, but the real-time focal spot is reduced until the diameter of the real-time focal spot is equal to the diameter of the expected focal spot, and the main controller sends an instruction to the secondary motor. The driver stops the movement of the secondary linear electric platform;
类似地,如果实时焦斑的直径小于预期焦斑的直径,则主控制器发出指令给次级电机驱动器,带动次级直线电动平台向下运动,减小低倍紫外显微物镜与长工作距离高倍紫外显微物镜的距离,此时穿过长工作距离高倍紫外显微物镜的激光能量增大,实时焦斑增大,直至实时焦斑的直径与预期焦斑的直径相等,主控制器发出指令给次级电机驱动器,停止次级直线电动平台的运动;Similarly, if the diameter of the real-time focal spot is smaller than the diameter of the expected focal spot, the main controller sends an instruction to the secondary motor driver to drive the secondary linear motor stage to move down, reducing the low-power UV microscope objective and the long working distance. The distance of the high-power ultraviolet microscope objective lens, at this time, the laser energy passing through the long working distance high-power ultraviolet microscope objective lens increases, and the real-time focal spot increases until the diameter of the real-time focal spot is equal to the diameter of the expected focal spot, and the main controller sends out Instruct the secondary motor driver to stop the movement of the secondary linear electric platform;
(2)探测对象单点紧聚焦(2) Single-point tight focusing of the detection object
移去测量分划板,将自适应拉曼荧光成像联用系统移入实际测试区域,此时探测对象位于光学头部的下方,距长工作距离高倍紫外显微物镜的距离远大于其焦距;Remove the measuring reticle, and move the adaptive Raman fluorescence imaging combined system into the actual test area. At this time, the detection object is located under the optical head, and the distance from the long working distance high-power ultraviolet microscope objective lens is much greater than its focal length;
主控制器控制开启紫外拉曼激光器,其发出的紫外激光束依次经过紫外干涉滤光片、低倍紫外显微物镜、双色镜,然后经长工作距离高倍紫外显微物镜散焦至探测对象的表面,反射光沿反向沿主光轴穿过长工作距离高倍紫外显微物镜,经双色镜反射,再经比例分光片反射,经管透镜聚焦,再经成像镜头实时显微成像至图像传感器;主控制器接收图像传感器输出的显微数字图像,并作快速傅立叶变换,提取其高频分量H;The main controller controls to turn on the ultraviolet Raman laser, and the ultraviolet laser beam emitted by it passes through the ultraviolet interference filter, the low-power ultraviolet microscope objective lens and the dichroic mirror in turn, and then defocuses to the detection object through the long working distance high-power ultraviolet microscope objective lens. On the surface, the reflected light passes through the long working distance high-power ultraviolet microscope objective lens along the main optical axis in the reverse direction, is reflected by the dichroic mirror, then reflected by the proportional beam splitter, focused by the tube lens, and then imaged by the imaging lens to the image sensor in real time; The main controller receives the microscopic digital image output by the image sensor, and performs fast Fourier transform to extract its high-frequency component H;
主控制器发出指令给三维电机驱动器,带动三维精密电动平台上的光学头部沿Z轴向下运动,此时,探测对象与长工作距离高倍紫外显微物镜的距离减小,运动过程中,主控制器不断实时对图像传感器输出的显微数字图像进行快速傅立叶变换,并不断提取其高频分量H,直至H达到最大值,此时激光将紧聚焦至探测对象表面上的一点,实时焦斑大小等于预期焦斑大小,此时处于紧聚焦状态;The main controller sends an instruction to the 3D motor driver to drive the optical head on the 3D precision electric platform to move down along the Z axis. At this time, the distance between the detection object and the long working distance high-power ultraviolet microscope objective lens decreases. The main controller continuously performs fast Fourier transform on the microscopic digital image output by the image sensor in real time, and continuously extracts its high-frequency component H until H reaches the maximum value. The spot size is equal to the expected focal spot size, and it is in a tight focus state;
(3)拉曼荧光及成像信息获取(3) Raman fluorescence and imaging information acquisition
在此紧聚焦状态下,主控制器记录三维精密电动平台的三维位移量,将其设定为初始三维坐标(x1,y1,z1);主控制器接收图像传感器输出的显微数字图像,采用边缘提取算法获取实时焦斑外圆轮廓,从而确定实时焦斑的成像区域,计算成像区域内所有像素的平均灰度值g1;探测对象表面实时焦斑位置的拉曼及荧光后向散射沿主光轴穿过长工作距离高倍紫外显微物镜,经双色镜反射,透过比例分光片后,经紫外瑞利滤光片将紫外拉曼激光器波长的瑞利散射滤除后,再经显微物镜聚焦至光纤的入射端面,然后进入光谱仪,光谱仪将光谱信号输出至主控制器进行分析;主控制器首先提取该光谱信号的n条离散拉曼谱线λ1,λ2,λ3,...,λn,记录其谱线强度Ι11,Ι12,Ι13,...,Ι1n;然后将连续荧光谱线分成等光谱间隔的m段;并记录每段的荧光谱平均强度J11,J12,J13,...,J1m;In this tight focusing state, the main controller records the three-dimensional displacement of the three-dimensional precision motorized stage and sets it as the initial three-dimensional coordinates (x 1 , y 1 , z 1 ); the main controller receives the microscopic digital output from the image sensor image, using edge extraction algorithm to obtain the outer circle contour of real-time focal spot, so as to determine the imaging area of real-time focal spot, and calculate the average gray value g 1 of all pixels in the imaging area; The upward scattering passes through the long working distance high-power ultraviolet microscope objective along the main optical axis, is reflected by the dichroic mirror, and after passing through the proportional beam splitter, the Rayleigh scattering at the wavelength of the ultraviolet Raman laser is filtered out by the ultraviolet Rayleigh filter. Then it is focused to the incident end face of the optical fiber through the microscope objective lens, and then enters the spectrometer. The spectrometer outputs the spectral signal to the main controller for analysis; the main controller first extracts n discrete Raman spectral lines λ 1 , λ 2 of the spectral signal, λ 3 , . _ _ Fluorescence spectrum mean intensity J 11 , J 12 , J 13 , ..., J 1m ;
(4)拉曼荧光成像扫描微区分析(4) Micro-area analysis of Raman fluorescence imaging scanning
主控制器确定微区分析XY方向的扫描点数A、B,以及扫描步长C、D;主控制器发出指令给三维电机驱动器,带动三维精密电动平台上的光学头部作XY平面的S形扫描,对XY平面上的每个点,再沿Z轴上下运动,执行步骤(2)的单点紧聚焦;The main controller determines the number of scanning points A and B in the XY direction of the micro-area analysis, and the scanning step lengths C and D; the main controller sends an instruction to the 3D motor driver to drive the optical head on the 3D precision electric platform to make an S shape on the XY plane Scan, for each point on the XY plane, move up and down along the Z axis, and perform the single-point tight focusing of step (2);
对每个扫描点i(i大于等于2,直至i等于A×B),在该点的紧聚焦状态下,主控制器记录三维精密电动平台的三维位移量,确定其三维坐标(xi,yi,zi);主控制器接收图像传感器输出的显微数字图像,采用边缘提取算法获取实时焦斑外圆轮廓,从而确定实时焦斑的成像区域,计算成像区域内所有像素的平均灰度值gi;主控制器记录n条离散拉曼谱线λ1,λ2,λ3,...,λn的谱线强度Ιi1,Ιi2,Ιi3,...,Ιin;并记录m段荧光谱每段的荧光谱平均强度Ji1,Ji2,Ji3,...,Jim;For each scanning point i (i is greater than or equal to 2, until i is equal to A×B), in the tight focusing state of this point, the main controller records the three-dimensional displacement of the three-dimensional precision electric platform, and determines its three-dimensional coordinates (x i , y i , z i ); the main controller receives the microscopic digital image output by the image sensor, adopts the edge extraction algorithm to obtain the real-time focal spot outer circle contour, thereby determines the real-time focal spot imaging area, and calculates the average gray value of all pixels in the imaging area. Degree value g i ; the main controller records the spectral line intensities Ι i1 , Ι i2 , Ι i3 ,..., Ι in of n discrete Raman spectral lines λ 1 , λ 2 , λ 3 ,..., λ n ; And record the average intensity of fluorescence spectrum J i1 , J i2 , J i3 ,...,J im of each segment of the m-segment fluorescence spectrum;
主控制器首先综合A×B个扫描点的三维坐标,绘制扫描区域探测对象表面的三维几何形貌;然后,综合各个扫描点的g1,g2,...,gi,...,可得到探测测对象表面的三维几何形貌的灰度图像;接着,综合各个扫描点的I11,I21,...,Ii1,...,得到探测对象表面的波长为λ1的拉曼图像,类似地,综合各个扫描点的I12,I22,...,Ii2,...,得到探测对象表面的波长为λ2的拉曼图像,...,直至得到探测对象表面的波长为λn的拉曼图像;最后,综合各个扫描点的J11,J21,...,Ji1,...,得到探测对象表面的第一个谱段的荧光图像,类似地,综合各个扫描点的J12,J22,...,Ji2,...,得到探测对象表面的第二个谱段的荧光图像,...,直至得到探测对象表面的第m个谱段的荧光图像;The main controller first integrates the three-dimensional coordinates of the A×B scanning points, and draws the three-dimensional geometry of the surface of the detection object in the scanning area; then, integrates the g 1 , g 2 ,..., gi ,... , the grayscale image of the three-dimensional geometry of the surface of the detection object can be obtained; then, by synthesizing the I 11 , I 21 ,...,I i1 ,... of each scanning point, the wavelength of the surface of the detection object is λ 1 Similarly, I 12 , I 22 ,...,I i2 ,... of each scanning point are integrated to obtain a Raman image with a wavelength of λ 2 on the surface of the detection object,..., until the The Raman image with wavelength λ n of the surface of the detection object is obtained; finally, J 11 , J 21 ,...,J i1 ,... of each scanning point are integrated to obtain the fluorescence image of the first spectral band of the surface of the detection object , similarly, combine J 12 , J 22 ,...,J i2 ,... of each scanning point to obtain the fluorescence image of the second spectral band on the surface of the detection object,..., until the surface of the detection object is obtained The fluorescence image of the mth spectral band;
(5)LIBS扫描微区分析及信息融合(5) LIBS scanning micro-area analysis and information fusion
主控制器发出指令给切入控制器,将LIBS切入全反镜切入进主光轴;主控制器发出指令设定光谱仪的曝光时间;主控制器发出指令给数字脉冲延迟控制器,设定LIBS激光器的工作频率,以及LIBS激光器与光谱仪两者之间开启的延时;The main controller sends an instruction to the cut-in controller to cut the LIBS into the total mirror into the main optical axis; the main controller sends an instruction to set the exposure time of the spectrometer; the main controller sends an instruction to the digital pulse delay controller to set the LIBS laser The operating frequency of the LIBS laser and the turn-on delay between the LIBS laser and the spectrometer;
主控制器发出指令给三维电机驱动器,带动三维精密电动平台上的光学头部按记录的A×B个扫描点的三维坐标,作与步骤(4)相反的扫描,即逆向S形扫描,反向完成扫描点数A×B;The main controller sends an instruction to the 3D motor driver to drive the optical head on the 3D precision electric platform to scan in the opposite direction to step (4) according to the recorded 3D coordinates of the A×B scanning points, that is, reverse S-shaped scanning, and reverse scanning. To complete the scan points A × B;
对每一个扫描点,进行单点为时1秒的LIBS探测,主控制器接收光谱仪的输出LIBS光谱信息,根据谱线位置和强度关系,定性及定量分析该点的元素组成及含量,直至完成整个A×B点的微区LIBS分析;For each scanning point, carry out LIBS detection for a single point for 1 second, the main controller receives the output LIBS spectral information of the spectrometer, and analyzes the element composition and content of the point qualitatively and quantitatively according to the relationship between the spectral line position and intensity, until the completion Micro-LIBS analysis of the entire A×B point;
与步骤(4)信息融合,完成微区激光光谱及成像分析,即共获取微区的三维形貌分布,及三维形貌分布上A×B个扫描点的宽谱图像、n个波长的紫外激光拉曼图像、m个谱段的紫外激光诱导荧光高光谱图像、元素分布图像。Fusion with step (4) information to complete the micro-area laser spectrum and imaging analysis, that is, to obtain the three-dimensional topography distribution of the micro-area, the broad-spectrum image of A×B scanning points on the three-dimensional topography distribution, and the ultraviolet light of n wavelengths. Laser Raman images, UV laser-induced fluorescence hyperspectral images of m spectral bands, and element distribution images.
本发明的有益效果是,提供了一种自适应激光光谱及成像探测方法,可在微区分析时自适应地调整聚焦光斑的直径;将电子目镜的区域平均灰度作为扫描成像点强度,同时满足自聚焦和宽谱扫描成像的要求;可同时实现三维空间LIBS元素分析、主动激光拉曼分子分析、高光谱荧光、可见宽谱扫描成像,提供多种信息以进行微区精细探测。The beneficial effect of the present invention is to provide an adaptive laser spectrum and imaging detection method, which can adaptively adjust the diameter of the focusing spot during micro-area analysis; It meets the requirements of self-focusing and wide-spectrum scanning imaging; it can simultaneously realize three-dimensional space LIBS elemental analysis, active laser Raman molecular analysis, hyperspectral fluorescence, and visible wide-spectrum scanning imaging, providing a variety of information for fine detection of micro-area.
附图说明Description of drawings
图1为本发明系统结构示意图,图中:1——三维电机驱动器;2——光学头部;3——紫外拉曼激光器;4——主光轴;5——紫外干涉滤光片;6——次级电机驱动器;7——主控制器;8——低倍紫外显微物镜;9——次级直线电动平台;10——成像光轴;11——电子目镜;12——光谱仪;13——光纤;14——显微物镜;15——接收光轴;16——紫外瑞利滤光片;17——比例分光片;18——实时焦斑;19——预期焦斑;20——刻线;21——主电机驱动器;22——主直线电动平台;23——探测对象;24——测量分划板;25——长工作距离高倍紫外显微物镜;26——入瞳;27——双色镜;28——锥形激光束;29——三维精密电动平台;30——柱形近准直激光束;31——图像传感器;32——成像镜头;33——管透镜;34——LIBS切入全反镜;35——LIBS激光束;36——切入控制器;37——LIBS光轴;38——LIBS激光器;39——数字脉冲延迟控制器。1 is a schematic diagram of the system structure of the present invention, in the figure: 1—three-dimensional motor driver; 2—optical head; 3—ultraviolet Raman laser; 4—main optical axis; 5—ultraviolet interference filter; 6—secondary motor driver; 7—main controller; 8—low power ultraviolet microscope objective lens; 9—secondary linear motorized stage; 10—imaging optical axis; 11—electronic eyepiece; 12— Spectrometer; 13—fiber; 14—microscopic objective lens; 15—receiving optical axis; 16—ultraviolet Rayleigh filter; 17—proportional beam splitter; 18—real-time focal spot; 19—expected focus Spot; 20—scribed line; 21—main motor driver; 22—main linear motorized stage; 23—detection object; 24—measurement reticle; 25—long working distance high power ultraviolet microscope objective lens; 26 - entrance pupil; 27 - dichroic mirror; 28 - cone laser beam; 29 - three-dimensional precision motorized platform; 30 - cylindrical near-collimated laser beam; 31 - image sensor; 32 - imaging lens; 33 - tube lens; 34 - LIBS cut-in total mirror; 35 - LIBS laser beam; 36 - cut-in controller; 37 - LIBS optical axis; 38 - LIBS laser; 39 - digital pulse delay controller .
注:LIBS,laser-induced spectroscopy,激光诱导击穿光谱。Note: LIBS, laser-induced spectroscopy, laser-induced breakdown spectroscopy.
具体实施方式Detailed ways
本发明具体实施方式如图1所示。The specific embodiment of the present invention is shown in FIG. 1 .
本发明提出的自适应激光光谱及成像探测方法是在自适应激光光谱及成像探测系统上实现的,该系统由主控制器7、光谱仪12、光纤13、三维电机驱动器1、三维精密电动平台29、数字脉冲延迟控制器39与光学头部2组成;The adaptive laser spectrum and imaging detection method proposed by the present invention is implemented on an adaptive laser spectrum and imaging detection system, which consists of a
其中光学头部2由LIBS激光器38、LIBS切入全反镜34、切入控制器36、紫外拉曼激光器3、紫外干涉滤光片5、次级电机驱动器6、次级直线电动平台9、低倍紫外显微物镜8、双色镜27、长工作距离高倍紫外显微物镜25、主电机驱动器21、主直线电动平台22、紫外瑞利滤光片16、比例分光片17、显微物镜14、管透镜33和电子目镜11组成;电子目镜11内有成像镜头32和图像传感器31;The
LIBS激光器38(本实施例为355nm、重频1-10Hz可调、脉宽6ns、脉冲能量20mJ的半导体泵浦固体激光器)其沿LIBS光轴37发出的脉冲LIBS激光束35与紫外拉曼激光器3(本实施例为360nm、50mW的连续激光器)沿主光轴4发出的连续激光具有相同的初始光束直径和相同的极小发散角;当处于非LIBS工作模式时,切入控制器36将LIBS切入全反镜34切出主光轴4;当处于LIBS工作模式时,切入控制器36将LIBS切入全反镜34切入进主光轴4,此时,LIBS激光器38与紫外拉曼激光器3的输出口到LIBS切入全反镜34的距离相等,LIBS激光器38沿LIBS光轴37发出的脉冲LIBS激光束35经LIBS切入全反镜34全反后,进入主光轴4传输,形成柱形近准直激光束30穿过低倍紫外显微物镜8,形成锥形激光束28穿过双色镜27(本实施例为355-360nm高透、220-350及364nm-900nm高反)后,经长工作距离高倍紫外显微物镜25(本实施例采用无穷远复合平场消像差紫外100X显微物镜,超长工作距离为11mm)聚焦至探测目标,LIBS回波信号反向沿主光轴4穿过长工作距离高倍紫外显微物镜25,双色镜27反射后沿接收光轴15行进,到达比例分光片17(本实施例为9比1比例分光片,即透9反1)后分成正交的两路:一路经反射沿成像光轴10行进,在LIBS模式下这路信号不用;另一路透过比例分光片17后,经紫外瑞利滤光片16(本实施例为波长355-360nm的带阻瑞利滤光片)将LIBS激光器38波长的瑞利散射滤除后,再经显微物镜14聚焦至光纤13的入射端面,然后进入光谱仪12(本实施例光谱仪分为两个通道,第一通道为220-350nm,光学分辨率0.1nm,有效像元1000点;第二通道的探测光谱范围为360-750nm,光学分辨率0.1nm,有效像元数2000点;LIBS模式二个通道都用,拉曼及荧光探测只用第二个通道)进行分析;数字脉冲延迟控制器39有两个控制端,分别接LIBS激光器38与光谱仪12的外部触发端口;数字脉冲延迟控制器39用来设定LIBS激光器38的工作频率以及LIBS激光器38与光谱仪12两者之间开启的延时;The pulsed
紫外拉曼激光器3沿主光轴4发出的激光束穿过紫外干涉滤光片5(紫外干涉滤光片5为紫外窄带滤光片,本实施例为360nm,带宽为1nm的带通滤光片),可滤除紫外拉曼激光器3发出的紫外激光的分频谐波干扰,使得其激发的拉曼信号信噪比更高,形成的柱形近准直激光束30,穿过低倍紫外显微物镜8,形成锥形激光束28;锥形激光束28穿过双色镜27后,到达长工作距离高倍紫外显微物镜25的入瞳26,在入瞳26的位置处,锥形激光束28的直径将大于入瞳26的直径,由于锥形激光束28的锥角为定值,因此低倍紫外显微物镜8与长工作距离高倍紫外显微物镜25的距离越远,锥形激光束28的直径比入瞳26的直径大得越多,穿过长工作距离高倍紫外显微物镜25的激光能量越弱,但聚焦光斑越小;因此可通过调节低倍紫外显微物镜8与长工作距离高倍紫外显微物镜25的距离,在穿过长工作距离高倍紫外显微物镜25的激光能量与聚焦光斑大小中做出取舍,即大能量大光斑,小能量小光斑;回波信号反向沿主光轴4穿过长工作距离高倍紫外显微物镜25,双色镜27反射后沿接收光轴15行进,到达比例分光片17(本实施例为9比1比例分光片,即透9反1)后分成正交的两路:一路经反射沿成像光轴10行进,经管透镜33聚焦至电子目镜11内的成像镜头32的一倍至二倍焦距之间,经成像镜头32成放大的实像至图像传感器31(本实施例采用黑白面阵传感器,其响应波段为350至800纳米);另一路透过比例分光片17后,经紫外瑞利滤光片16将紫外拉曼激光器3波长的瑞利散射滤除后,再经显微物镜14聚焦至光纤13的入射端面,然后进入光谱仪12进行分析;低倍紫外显微物镜8安装在次级直线电动平台9上,可在次级电机驱动器6的带动下沿主光轴4作一维精密平动;长工作距离高倍紫外显微物镜25安装在主直线电动平台22上,可在主电机驱动器21的带动下沿主光轴4作一维精密平动;次级直线电动平台9的平动主要用来改变低倍紫外显微物镜8与长工作距离高倍紫外显微物镜25的距离;主直线电动平台22的平动主要用来使长工作距离高倍紫外显微物镜25精确聚焦;LIBS光轴37、主光轴4、成像光轴10、接收光轴15四者共面;主光轴4与成像光轴10平行,且与LIBS光轴37、接收光轴15垂直;The laser beam emitted by the
光学头部2安装在三维精密电动平台29上,三维精密电动平台29可在三维电机驱动器1的驱动下作亚微米级的三维精密运动;The
主控制器7可对切入控制器36、数字脉冲延迟控制器39、三维电机驱动器1、主电机驱动器21、次级电机驱动器6、紫外拉曼激光器3、图像传感器31、光谱仪12发控制指令;主控制器7还设置光谱仪12的曝光时间,且可接收图像传感器31的输出数字图像以及光谱仪12的输出光谱信息;The
本发明提出的自适应激光光谱及成像探测方法包括以下步骤:The adaptive laser spectrum and imaging detection method proposed by the present invention includes the following steps:
(1)预期焦斑自适应聚焦标定(1) Adaptive focus calibration of expected focal spot
深空物质原位探测中,对不同的探测对象23需要不同尺度的拉曼聚焦点,即预期焦斑19,例如对分布较均匀的矿物质,可以采用略大尺寸的预期焦斑19;而对于变化较多的矿物质,可采用极小尺寸的预期焦斑19,以实现极精细微区分析;In the in-situ detection of deep space matter, different scales of Raman focal points are required for different detection objects 23, that is, the expected focal spot 19. For example, for minerals with a relatively uniform distribution, a slightly larger size of the expected focal spot 19 can be used; For more variable minerals, a very small expected focal spot19 can be used to enable very fine microanalysis;
首先,对于根据测试区域的探测对象23基本性质,设定预期焦斑19的直径(本实施例,针对橄榄石矿物,设定预期焦斑19的直径为1.7微米);将测量分划板24放置在长工作距离高倍紫外显微物镜25下方的测试区域;测量分划板24上有均匀刻线20(本实施例使用的测量分划板的刻线间距为10微米);First, for the basic properties of the
主控制器7控制开启紫外拉曼激光器3,其发出的紫外激光束依次经过紫外干涉滤光片5、低倍紫外显微物镜8、双色镜27,然后经长工作距离高倍紫外显微物镜25照亮并聚焦至测量分划板24,形成实时焦斑18;测量分划板24的反射光沿反向沿主光轴4穿过长工作距离高倍紫外显微物镜25,经双色镜27反射,再经比例分光片17反射,经管透镜33聚焦,再经成像镜头32实时显微成像至图像传感器31;The
主控制器7接收图像传感器31输出的显微数字图像,并作实时图像处理;采用边缘提取算法获取实时焦斑18外圆轮廓,从而确定实时焦斑18的成像区域,计算成像区域内所有像素的平均灰度值G;The
主控制器7发出指令给主电机驱动器21,带动主直线电动平台22向下运动一个步长;主控制器7接收图像传感器31输出的显微数字图像,确定实时焦斑18的成像区域,计算成像区域内所有像素的平均灰度值G,并比较G值是增大还是减小了:如果G值增大,说明向下运动是接近焦点的方向;如果G值减小,说明向上运动是接近焦点的方向;The
主控制器7发出指令给主电机驱动器21,带动主直线电动平台22向接近焦点的方向运动,同时实时计算实时焦斑18的成像区域内所有像素的平均灰度值G,直至G值达到最大值,此时为紧聚焦状态,主控制器7发出指令给主电机驱动器21,停止运动;The
在紧聚焦状态下,主控制器7对图像传感器31输出的显微数字图像采用边缘提取算法获取测量分划板24的刻线20的直线位置,以及实时焦斑18外圆轮廓,然后计算相邻刻线20间隔的像素个数以及实时焦斑18外圆轮廓直径的像素个数,从而根据刻线20的间距计算得到实时焦斑18的直径;In the tight focus state, the
如果实时焦斑18的直径大于预期焦斑19的直径,则主控制器7发出指令给次级电机驱动器6,带动次级直线电动平台9向上运动,增加低倍紫外显微物镜8与长工作距离高倍紫外显微物镜25的距离,此时穿过长工作距离高倍紫外显微物镜25的激光能量减弱,但实时焦斑18减小,直至实时焦斑18的直径与预期焦斑19的直径相等,主控制器7发出指令给次级电机驱动器6,停止次级直线电动平台9的运动;If the diameter of the real-time
类似地,如果实时焦斑18的直径小于预期焦斑19的直径,则主控制器7发出指令给次级电机驱动器6,带动次级直线电动平台9向下运动,减小低倍紫外显微物镜8与长工作距离高倍紫外显微物镜25的距离,此时穿过长工作距离高倍紫外显微物镜25的激光能量增大,实时焦斑18增大,直至实时焦斑18的直径与预期焦斑19的直径相等,主控制器7发出指令给次级电机驱动器6,停止次级直线电动平台9的运动;Similarly, if the diameter of the real-time
(2)探测对象单点紧聚焦(2) Single-point tight focusing of the detection object
移去测量分划板24,将自适应拉曼荧光成像联用系统移入实际测试区域,此时探测对象23位于光学头部2的下方,距长工作距离高倍紫外显微物镜25的距离远大于其焦距;Remove the measuring
主控制器7控制开启紫外拉曼激光器3,其发出的紫外激光束依次经过紫外干涉滤光片5、低倍紫外显微物镜8、双色镜27,然后经长工作距离高倍紫外显微物镜25散焦至探测对象23的表面,反射光沿反向沿主光轴4穿过长工作距离高倍紫外显微物镜25,经双色镜27反射,再经比例分光片17反射,经管透镜33聚焦,再经成像镜头32实时显微成像至图像传感器31;主控制器7接收图像传感器31输出的显微数字图像,并作快速傅立叶变换,提取其高频分量H;The
主控制器7发出指令给三维电机驱动器1,带动三维精密电动平台29上的光学头部2沿Z轴向下运动,此时,探测对象23与长工作距离高倍紫外显微物镜25的距离减小,运动过程中,主控制器7不断实时对图像传感器31输出的显微数字图像进行快速傅立叶变换,并不断提取其高频分量H,直至H达到最大值,此时激光将紧聚焦至探测对象23表面上的一点,实时焦斑18大小等于预期焦斑19大小,此时处于紧聚焦状态;The
(3)拉曼荧光及成像信息获取(3) Raman fluorescence and imaging information acquisition
在此紧聚焦状态下,主控制器7记录三维精密电动平台29的三维位移量,将其设定为初始三维坐标(x1,y1,z1);主控制器7接收图像传感器31输出的显微数字图像,采用边缘提取算法获取实时焦斑18外圆轮廓,从而确定实时焦斑18的成像区域,计算成像区域内所有像素的平均灰度值g1;探测对象23表面实时焦斑18位置的拉曼及荧光后向散射沿主光轴4穿过长工作距离高倍紫外显微物镜25,经双色镜27反射,透过比例分光片17后,经紫外瑞利滤光片16将紫外拉曼激光器3波长的瑞利散射滤除后,再经显微物镜14聚焦至光纤13的入射端面,然后进入光谱仪12,光谱仪12将光谱信号输出至主控制器7进行分析;主控制器7首先提取该光谱信号的n条(本实施例n=3)离散拉曼谱线λ1,λ2,λ3,...,λn,记录其谱线强度Ι11,Ι12,Ι13,...,Ι1n;然后将连续荧光谱线分成等光谱间隔的m段(本实施例m=300);并记录每段的荧光谱平均强度J11,J12,J13,...,J1m;In this tight focusing state, the
(4)拉曼荧光成像扫描微区分析(4) Micro-area analysis of Raman fluorescence imaging scanning
主控制器7确定微区分析XY方向的扫描点数A、B,以及扫描步长C、D;主控制器7发出指令给三维电机驱动器1,带动三维精密电动平台29上的光学头部2作XY平面的S形扫描(即沿X轴按扫描步长C扫至A个点后,Y轴正移一个步长D,再沿X轴反向扫A个点,然后Y轴正移一个步长D,再沿X轴正向扫A个点,再Y轴正移一个步长D,再沿X轴反向扫A个点,...,直至完成预定的扫描区域大小,共扫描点数为A乘以B,即A×B),对XY平面上的每个点,再沿Z轴上下运动,执行步骤(2)的单点紧聚焦;The
对每个扫描点i(i大于等于2,直至i等于A×B),在该点的紧聚焦状态下,主控制器7记录三维精密电动平台29的三维位移量,确定其三维坐标(xi,yi,zi);主控制器7接收图像传感器31输出的显微数字图像,采用边缘提取算法获取实时焦斑18外圆轮廓,从而确定实时焦斑18的成像区域,计算成像区域内所有像素的平均灰度值gi;主控制器7记录n条离散拉曼谱线λ1,λ2,λ3,...,λn的谱线强度Ιi1,Ιi2,Ιi3,...,Ιin;并记录m段荧光谱每段的荧光谱平均强度Ji1,Ji2,Ji3,...,Jim;For each scanning point i (i is greater than or equal to 2, until i is equal to A×B), in the tight focusing state of this point, the
主控制器7首先综合A×B个扫描点的三维坐标,绘制扫描区域探测对象23表面的三维几何形貌;然后,综合各个扫描点的g1,g2,...,gi,...,可得到探测测对象23表面的三维几何形貌的灰度图像(本实施例为响应波段为350至800纳米的宽谱图像);接着,综合各个扫描点的I11,I21,...,Ii1,...,得到探测对象23表面的波长为λ1的拉曼图像,类似地,综合各个扫描点的I12,I22,...,Ii2,...,得到探测对象23表面的波长为λ2的拉曼图像,...,直至得到探测对象23表面的波长为λn的拉曼图像;最后,综合各个扫描点的J11,J21,...,Ji1,...,得到探测对象23表面的第一个谱段的荧光图像,类似地,综合各个扫描点的J12,J22,...,Ji2,...,得到探测对象23表面的第二个谱段的荧光图像,...,直至得到探测对象23表面的第m个谱段的荧光图像;The
(5)LIBS扫描微区分析及信息融合(5) LIBS scanning micro-area analysis and information fusion
主控制器7发出指令给切入控制器36,将LIBS切入全反镜34切入进主光轴4;主控制器7发出指令设定光谱仪12的曝光时间(本实施例为1毫秒);主控制器7发出指令给数字脉冲延迟控制器39,设定LIBS激光器38的工作频率(本实施例为3赫兹),以及LIBS激光器38与光谱仪12两者之间开启的延时(本实施例为10微秒);The
主控制器7发出指令给三维电机驱动器1,带动三维精密电动平台29上的光学头部2按记录的A×B个扫描点的三维坐标,作与步骤(4)相反的扫描,即逆向S形扫描,反向完成扫描点数A×B;The
对每一个扫描点,进行单点为时1秒的LIBS探测,主控制器7接收光谱仪12的输出LIBS光谱信息(本实施例对1秒中获得的3幅LIBS光谱进行平均,然后作分析),根据谱线位置和强度关系,定性及定量分析该点的元素组成及含量,直至完成整个A×B点的微区LIBS分析;For each scanning point, LIBS detection is performed for a single point for 1 second, and the
与步骤(4)信息融合,完成微区激光光谱及成像分析,即共获取微区的三维形貌分布,及三维形貌分布上A×B个扫描点的宽谱图像、n个波长的紫外激光拉曼图像、m个谱段的紫外激光诱导荧光高光谱图像、元素分布图像。Fusion with step (4) information to complete the micro-area laser spectrum and imaging analysis, that is, to obtain the three-dimensional topography distribution of the micro-area, the broad-spectrum image of A×B scanning points on the three-dimensional topography distribution, and the ultraviolet light of n wavelengths. Laser Raman images, UV laser-induced fluorescence hyperspectral images of m spectral bands, and element distribution images.
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