CN107862224B - Test equipment and test method for IC card reader-writer - Google Patents
Test equipment and test method for IC card reader-writer Download PDFInfo
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- CN107862224B CN107862224B CN201610843792.8A CN201610843792A CN107862224B CN 107862224 B CN107862224 B CN 107862224B CN 201610843792 A CN201610843792 A CN 201610843792A CN 107862224 B CN107862224 B CN 107862224B
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- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
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Abstract
A test device and method for IC card reader/writer utilizes channel chip to simulate IC card to obtain reader/writer instruction, and control system provides response data required in the course of simulating reading/writing to test the processing method of reader/writer under different conditions. The invention avoids a large amount of preliminary preparation work, can modify the scheme of response data to simulate different situations in real time, records the instruction and the response data in real time, forms a test log for the user to inquire, ensures that the problem source can be searched after the problem occurs, reduces the workload of the user because the service data is provided by the real IC card, does not need the user to compile all the response data, and can detect the error of the communication protocol stack because the test uses the communication interface of normal transaction.
Description
Technical Field
The invention relates to a test device and a test method for an IC card reader-writer.
Background
An IC Card (Integrated Circuit Card), also called Smart Card (Smart Card), Smart Card (Intelligent Card), Microcircuit Card (Microcircuit Card) or microchip Card, etc. Communication protocols between the IC card and the reader/writer may be classified into a contact type (such as ISO 7616) and a non-contact type (such as ISO 14443 and ISO 15693), and the like, but each communication protocol generally performs data interaction in a question-and-answer manner. In the data interaction process, the IC card is used as a passive side to receive the instruction of the reader-writer, the operation is carried out according to the logic of the built-in card, and finally the response data is used as a response to be returned to the reader-writer. The reader-writer has different built-in service logics according to different application scenes. The reader-writer sends a series of instructions to the card according to the business logic flow, and if the card is completely executed successfully, the card can be regarded as successful security authentication or successful transaction. IC cards are commonly used for security authentication, electronic wallets, etc. because of their inherent advantages of information security, portability, relatively perfect standardization, etc.
The IC card is usually not separated from the support of an IC card reader-writer, such as an entrance guard card reader for security authentication, an IC card reader-writer for electronic wallet, and the like. The application scenarios of the IC card and the IC card reader-writer determine that the reader-writer needs to be strictly tested so as to ensure the safety of the IC card reader-writer.
The IC card reader/writer needs to be tested whether the IC card reader/writer can obtain a correct result in a correct flow, and whether the IC card reader/writer can deal with an error response caused by handling various unexpected or deliberate attacks. However, it is impossible to test whether the reader/writer can correctly process the error flow only by using a general IC card, and therefore a specific tool or a special method is required to test the reader/writer.
The most common test methods currently used are two:
the first test method is to prepare a special test card for each error flow, and to return specific error data intentionally in a designated flow, and to use the card to test whether a reader/writer performs correct processing on a certain error flow. The test method needs to prepare one test card for each scene, each test card needs different card logics, the early preparation workload is very large, and simultaneously, the test problem and the test result corresponding to each card need to be recorded. And because it is difficult to obtain a communication log, once the test fails, it is difficult to locate the problem.
The other testing method is that the PC is connected with an additional communication interface provided by the reader-writer, and the PC can read the command sent by the reader-writer and return response data. Since the response data is completely generated by the PC, the response data can be arbitrarily modified for testing. This test method not only needs to write correct or wrong response data completely by itself, but also needs to know the communication protocol stack of the interface. Moreover, this method requires the use of confidential authorization data during testing, which is often difficult to obtain. In addition, because the interface is not a data communication interface used in normal transaction, a communication protocol error possibly existing in the transaction cannot be discovered through the test method.
Disclosure of Invention
The invention provides a test device and a test method of an IC card reader-writer, which avoid a large amount of preliminary preparation work, can modify response data in real time to simulate schemes of different scenes, record instructions and response data in real time to form a test log for a user to inquire, ensure that a problem source can be searched after a problem occurs, reduce the workload of the user because service data is provided by a real IC card, do not need the user to compile all response data, test a communication interface for normal transaction, and detect errors of a communication protocol stack.
In order to achieve the above object, the present invention provides a test apparatus for an IC card reader/writer, comprising:
the channel chip simulates the data interaction between the IC card and the IC card reader-writer to be tested; the channel chip can simulate a contact type IC card and can also simulate a non-contact type IC card;
the control system is electrically connected with the channel chip and provides data required in the simulation test process for the channel chip;
the control system comprises: the main control chip of the electric connection channel chip and the host computer of the electric connection main control chip, the host computer provides the response data of the simulation IC card and can revise the response data according to the user's demand, the response data of the control channel chip of the main control chip.
The invention also provides a test method of the IC card reader-writer, which comprises the following steps:
before the test starts, the upper computer sets response data aiming at a specific reader-writer instruction according to the requirement of a user;
when the test is started, the channel chip is connected with the IC card reader-writer to be tested through the communication interface and receives the instruction of the IC card reader-writer to be tested;
the channel chip sends the instruction of the IC card reader-writer to be tested to the main control chip;
the master control chip sends the reader-writer instruction to an upper computer;
the upper computer calculates response data and sends the response data to the main control chip;
the main control chip sends the response data to the channel chip;
the channel chip sends the response data to the IC card reader-writer to be tested;
the test process after the test is started is circularly carried out until the user terminates the test.
The step of calculating the response data by the upper computer comprises the following steps:
the upper computer calculates response data aiming at the received reader-writer instruction;
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip.
The method for setting the response data aiming at the specific reader-writer instruction by the upper computer according to the user requirement before the test is started comprises the following steps: the user interacts with the upper computer, sets response data to a specific reader-writer instruction, or modifies the response data to obtain correct response data, or sets no response to the specific reader-writer instruction;
in the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
In the test process, the upper computer records the reader-writer instruction and the corresponding response data in real time to form a test log.
The invention also provides a test device of the IC card reader-writer, comprising:
the channel chip simulates the data interaction between the IC card and the IC card reader-writer to be tested; the channel chip can simulate a contact type IC card and can also simulate a non-contact type IC card;
the control system is electrically connected with the channel chip and provides data required in the simulation test process for the channel chip;
the control system comprises: the IC card is used for providing response data simulating the IC card, the card reader chip is used for reading the response data in the IC card and providing the response data to the main control chip, the upper computer can modify the response data, and the main control chip controls the response data of the channel chip.
The invention also provides a test method of the IC card reader-writer, which comprises the following steps:
before the test starts, the upper computer sets response data aiming at a specific reader-writer instruction according to the requirement of a user;
when the test is started, the channel chip is connected with the IC card reader-writer to be tested through the communication interface, the command of the IC card reader-writer to be tested is received, and the card reader chip is connected with the IC card through the communication interface;
the channel chip sends a reader-writer instruction of the IC card to be tested to the main control chip;
the main control chip sends the reader-writer instruction to the card reader chip and obtains response data from the IC card through the card reader chip;
the master control chip sends the reader-writer instruction and the response data to the upper computer;
the upper computer calculates response data and sends the response data to the main control chip;
the main control chip sends the response data to the channel chip;
the channel chip sends the response data to the IC card reader-writer to be tested;
the test process after the test is started is circularly carried out until the user terminates the test.
The step of calculating the response data by the upper computer comprises the following steps:
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip.
The method for setting the response data aiming at the specific reader-writer instruction by the upper computer according to the user requirement before the test is started comprises the following steps: the user interacts with the upper computer, sets response data to a specific reader-writer instruction, or modifies the response data to obtain correct response data, or sets no response to the specific reader-writer instruction;
in the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
In the test process, the upper computer records the reader-writer instruction and the corresponding response data in real time to form a test log.
The invention avoids a large amount of preliminary preparation work, can modify the scheme of response data to simulate different situations in real time, records the instruction and the response data in real time, forms a test log for the user to inquire, ensures that the problem source can be searched after the problem occurs, reduces the workload of the user because the service data is provided by the real IC card, does not need the user to compile all the response data, and can detect the error of the communication protocol stack because the test uses the communication interface of normal transaction.
Drawings
Fig. 1 is a schematic structural diagram of an embodiment of a test device for an IC card reader/writer according to the present invention.
Fig. 2 is a schematic structural diagram of another embodiment of the test equipment for an IC card reader-writer according to the present invention.
Detailed Description
The preferred embodiment of the present invention will be described in detail below with reference to fig. 1 to 2.
The invention provides a test device of IC card reader-writer, comprising:
the channel chip 1 simulates the data interaction between the IC card and the reader-writer of the IC card to be tested; the channel chip can simulate a contact type IC card and can also simulate a non-contact type IC card;
and the control system 2 is electrically connected with the channel chip 1 and provides data required in the simulation test process for the channel chip 1.
As shown in fig. 1, in an embodiment of the present invention, the control system 2 includes: the main control chip 201 is electrically connected with the channel chip 1, the upper computer 202 is electrically connected with the main control chip 201, the upper computer 202 provides response data of the analog IC card and can modify the response data, and the main control chip 201 controls the response data of the channel chip 1.
In this embodiment, a method for testing an IC card reader/writer is further provided, which includes the following steps:
step S0, before the test starts, the upper computer sets response data aiming at the instruction of the specific reader-writer according to the requirement of a user;
step S1, starting the test, connecting the channel chip with the IC card reader-writer to be tested through the communication interface, and receiving the instruction of the IC card reader-writer to be tested;
step S2, the channel chip sends the instruction of the IC card reader to be tested to the main control chip;
step S3, the main control chip sends the reader-writer instruction to an upper computer;
step S4, the upper computer calculates response data, sends the response data to the main control chip, and records the reader-writer instruction and the response data;
the upper computer calculates response data aiming at the received reader-writer instruction;
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip;
step S5, the main control chip sends the response data to the channel chip;
step S6, the channel chip sends the response data to the IC card reader-writer to be tested;
steps S2-S6 are repeated until the user terminates the test.
The method for setting the response data aiming at the specific reader-writer instruction by the upper computer according to the user requirement before the test is started comprises the following steps: and (3) interacting with the upper computer by a user, setting response data to a specific reader-writer instruction by the user, or modifying the response data to obtain correct response data by the user, or setting the response data not to the specific reader-writer instruction by the user.
In the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
In another embodiment of the present invention, as shown in fig. 2, the control system 2 comprises: the main control chip 201 is electrically connected with the channel chip 1, the upper computer 202 is electrically connected with the main control chip 201, the card reader chip 203 is electrically connected with the main control chip 201, the IC card 204 is electrically connected with the card reader chip 203, the IC card 204 provides response data of a simulated IC card, the card reader chip 203 reads the response data in the IC card and provides the response data to the main control chip 201, the upper computer 202 can modify the response data, and the main control chip 201 controls the response data of the channel chip 1.
In this embodiment, a method for testing an IC card reader/writer is further provided, which includes the following steps:
step S0, before the test starts, the upper computer sets response data aiming at the instruction of the specific reader-writer according to the requirement of a user;
step S1, starting the test, connecting the card reader chip with the IC card through the communication interface, connecting the channel chip with the IC card reader-writer to be tested through the communication interface, and receiving the instruction of the IC card reader-writer to be tested;
step S2, the channel chip sends the instruction of the IC card reader to be tested to the main control chip;
step S3, the main control chip sends the reader-writer instruction to the card reader chip and obtains response data from the IC card through the card reader chip;
step S4, the main control chip sends the reader-writer instruction and the response data to the upper computer;
step S5, the upper computer calculates response data, sends the response data to the main control chip, and records the reader-writer instruction and the response data;
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip;
step S6, the channel chip sends the response data to the IC card reader-writer to be tested;
steps S2-S6 are repeated until the user terminates the test.
The method for setting the response data aiming at the specific reader-writer instruction by the upper computer according to the user requirement before the test is started comprises the following steps: the user interacts with the upper computer, sets response data to a specific reader-writer instruction, or modifies the response data to obtain correct response data, or sets no response to the specific reader-writer instruction;
in the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
The invention uses the channel chip to simulate an IC card to obtain the instruction of the reader-writer, and the control system provides the response data required in the process of simulating reading and writing, so that a user can simulate various problems encountered by the reader-writer in actual use by controlling the appointed response data to test the processing method of the reader-writer under different conditions. The invention avoids a large amount of preliminary preparation work, can modify the scheme of response data to simulate different situations in real time, records the instruction and the response data in real time, forms a test log for the user to inquire, ensures that the problem source can be searched after the problem occurs, reduces the workload of the user because the service data is provided by the real IC card, does not need the user to compile all the response data, and can detect the error of the communication protocol stack because the test uses the communication interface of normal transaction.
While the present invention has been described in detail with reference to the preferred embodiments, it should be understood that the above description should not be taken as limiting the invention. Various modifications and alterations to this invention will become apparent to those skilled in the art upon reading the foregoing description. Accordingly, the scope of the invention should be determined from the following claims.
Claims (10)
1. A test apparatus for an IC card reader/writer, comprising:
the channel chip (1) simulates the data interaction between the IC card and the IC card reader-writer to be tested; the channel chip can simulate a contact type IC card and can also simulate a non-contact type IC card;
the control system (2) is electrically connected with the channel chip (1) and provides data required in the simulation test process for the channel chip (1);
the control system (2) comprises: the main control chip (201) of electric connection passageway chip (1) and upper computer (202) of electric connection main control chip (201), upper computer (202) provide the response data of simulation IC-card and can revise the response data according to user's demand, and main control chip (201) control passageway chip's (1) response data.
2. A method of testing the test equipment of an IC card reader/writer according to claim 1, comprising the steps of:
before the test starts, the upper computer sets response data aiming at a specific reader-writer instruction according to the requirement of a user;
when the test is started, the channel chip is connected with the IC card reader-writer to be tested through the communication interface and receives the instruction of the IC card reader-writer to be tested;
the channel chip sends the instruction of the IC card reader-writer to be tested to the main control chip;
the master control chip sends the reader-writer instruction to an upper computer;
the upper computer calculates response data and sends the response data to the main control chip;
the main control chip sends the response data to the channel chip;
the channel chip sends the response data to the IC card reader-writer to be tested;
the test process after the test is started is circularly carried out until the user terminates the test.
3. The method for testing a device under test of an IC card reader/writer according to claim 2, wherein the step of calculating the response data by the upper computer comprises:
the upper computer calculates response data aiming at the received reader-writer instruction;
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip.
4. The method for testing the test equipment of the IC card reader/writer according to claim 3, wherein the method for setting the response data to the specific reader/writer instruction by the upper computer before the test is started according to the user's request comprises: the user interacts with the upper computer, sets response data to a specific reader-writer instruction, or modifies the response data to obtain correct response data, or sets no response to the specific reader-writer instruction;
in the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
5. The method for testing the test equipment of the IC card reader/writer according to claim 4, wherein in the test process, the upper computer records the reader/writer instruction and the corresponding response data in real time to form a test log.
6. A test apparatus for an IC card reader/writer, comprising:
the channel chip (1) simulates the data interaction between the IC card and the IC card reader-writer to be tested; the channel chip can simulate a contact type IC card and can also simulate a non-contact type IC card;
the control system (2) is electrically connected with the channel chip (1) and provides data required in the simulation test process for the channel chip (1);
the control system (2) comprises: the electronic card reader comprises a main control chip (201) electrically connected with a channel chip (1), an upper computer (202) electrically connected with the main control chip (201), a card reader chip (203) electrically connected with the main control chip (201), and an IC card (204) electrically connected with the card reader chip (203), wherein the IC card (204) provides response data simulating the IC card, the card reader chip (203) reads the response data in the IC card and provides the response data to the main control chip (201), the upper computer (202) can modify the response data, and the main control chip (201) controls the response data of the channel chip (1).
7. A method of testing the test equipment of an IC card reader/writer according to claim 6, comprising the steps of:
before the test starts, the upper computer sets response data aiming at a specific reader-writer instruction according to the requirement of a user;
when the test is started, the channel chip is connected with the IC card reader-writer to be tested through the communication interface, the command of the IC card reader-writer to be tested is received, and the card reader chip is connected with the IC card through the communication interface;
the channel chip sends a reader-writer instruction of the IC card to be tested to the main control chip;
the main control chip sends the reader-writer instruction to the card reader chip and obtains response data from the IC card through the card reader chip;
the master control chip sends the reader-writer instruction and the response data to the upper computer;
the upper computer calculates response data and sends the response data to the main control chip;
the main control chip sends the response data to the channel chip;
the channel chip sends the response data to the IC card reader-writer to be tested;
the test process after the test is started is circularly carried out until the user terminates the test.
8. The method for testing a device under test of an IC card reader/writer according to claim 7, wherein the step of calculating the response data by the upper computer includes:
the upper computer judges whether the received reader-writer instruction is a specific reader-writer instruction set by the upper computer before the test is started, if so, the upper computer sets response data aiming at the specific reader-writer instruction according to the requirement of a user and sends the response data to the main control chip, and if not, the upper computer calculates the response data aiming at the received reader-writer instruction and directly sends the response data to the main control chip.
9. The method for testing the test equipment of the IC card reader/writer according to claim 8, wherein the method for setting the response data to the specific reader/writer instruction by the upper computer before the test is started according to the user's request comprises: the user interacts with the upper computer, sets response data to a specific reader-writer instruction, or modifies the response data to obtain correct response data, or sets no response to the specific reader-writer instruction;
in the step of calculating the response data by the upper computer, the method for setting the response data for the specific reader-writer instruction by the upper computer according to the user requirement includes: the upper computer sets response data to the specific reader-writer instruction, or the upper computer modifies the response data to obtain correct response data, or the upper computer sets no response to the specific reader-writer instruction.
10. The method for testing the test equipment of the IC card reader/writer according to claim 9, wherein in the test process, the upper computer records the reader/writer instruction and the corresponding response data in real time to form a test log.
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| CN1668932A (en) * | 2002-07-19 | 2005-09-14 | 汤姆森特许公司 | Method and test adapter for testing an appliance having a smart card reader |
| CN101236595A (en) * | 2007-01-29 | 2008-08-06 | 国际商业机器公司 | Radio frequency identification reader and its test method |
| CN201251610Y (en) * | 2008-09-08 | 2009-06-03 | 北京飞天诚信科技有限公司 | Device for detecting electrical characteristics of contact IC card reader-writer |
| CN101923504A (en) * | 2009-06-16 | 2010-12-22 | 鸿富锦精密工业（深圳）有限公司 | Card reader testing tool and card reader testing method |
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| JP2003242452A (en) * | 2002-02-19 | 2003-08-29 | Sankyo Seiki Mfg Co Ltd | Self-diagnosis method for ic card reader |
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|---|---|---|---|---|
| CN1668932A (en) * | 2002-07-19 | 2005-09-14 | 汤姆森特许公司 | Method and test adapter for testing an appliance having a smart card reader |
| CN101236595A (en) * | 2007-01-29 | 2008-08-06 | 国际商业机器公司 | Radio frequency identification reader and its test method |
| CN201251610Y (en) * | 2008-09-08 | 2009-06-03 | 北京飞天诚信科技有限公司 | Device for detecting electrical characteristics of contact IC card reader-writer |
| CN101923504A (en) * | 2009-06-16 | 2010-12-22 | 鸿富锦精密工业（深圳）有限公司 | Card reader testing tool and card reader testing method |
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