CN107843812A - A kind of electrical power distribution network fault location method and device - Google Patents

A kind of electrical power distribution network fault location method and device Download PDF

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Publication number
CN107843812A
CN107843812A CN201711066572.XA CN201711066572A CN107843812A CN 107843812 A CN107843812 A CN 107843812A CN 201711066572 A CN201711066572 A CN 201711066572A CN 107843812 A CN107843812 A CN 107843812A
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China
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mrow
msubsup
mtd
mtr
monitoring point
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Inventor
李邦峂
赵凤德
苏宁
吉承龙
王昌洪
王崇鲁
黎源源
王骥
张国辉
李江
李华
林家文
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Qionghai Power Supply Bureau of Hainan Power Grid Co Ltd
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Qionghai Power Supply Bureau of Hainan Power Grid Co Ltd
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Priority to CN201711066572.XA priority Critical patent/CN107843812A/en
Publication of CN107843812A publication Critical patent/CN107843812A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/088—Aspects of digital computing

Abstract

This application discloses a kind of electrical power distribution network fault location method and device, this method includes：According to the possible breakdown sets of lines J of monitoring point Observable circuitLWith the possible breakdown sets of lines J judged based on voltage sag source upstream and downstream orientationV, obtain possible breakdown sets of lines J；According to possible breakdown sets of lines J, the first monitoring point of lowest amplitude in the three-phase voltage amplitude of each monitoring point is extracted to determine the fault type of the first monitoring point；According to possible breakdown sets of lines J and the fault type of the first monitoring point, the fault distance between trouble point undetermined and the first monitoring point and the fault resstance of trouble point undetermined are determined；According to each phase voltage, fault distance and the fault resstance of each monitoring point, fault location model is established；According to fault location model, constraints and particle cluster algorithm, the localization of faults, it is achieved thereby that being accurately positioned to trouble point, trouble shoot efficiency is improved.

Description

A kind of electrical power distribution network fault location method and device
Technical field
The application is related to electric power network technique field, more particularly to a kind of electrical power distribution network fault location method and device.
Background technology
With science and technology develop rapidly and the improvement of people's living standards, reliability of each user to power system power supply Propose higher and higher requirement.And power distribution network improves its power supply reliability to improving as the link being joined directly together with user The reliability of power system power supply is significant.
At present, electrical power distribution network fault location method is generally using temporary caused by the structural parameters of power network, detection means, failure State information, information etc. gathered to complete fault location using communication channel.For example, based on correspondence in the case of different failures not Fault loop impedance together, the impedance method of impedance principle directly proportional to fault distance length；Or based on transmission line of electricity in event The traveling wave method of traveling wave principle during barrier；Or signal injection method of signal code injecting principle, etc. during based on failure.These Electrical power distribution network fault location method has the characteristics of common：Simple failure is carried out using detection means and existing information to determine Position, can not accurately determine abort situation, reduce trouble shoot efficiency.
The content of the invention
The embodiment of the present application provides a kind of electrical power distribution network fault location method and device, for solving in the prior art can not It is accurate to determine abort situation, the problem of reducing trouble shoot efficiency.
The embodiment of the present application uses following technical proposals：
In a first aspect, the embodiment of the present application provides a kind of electrical power distribution network fault location method, including：
According to the possible breakdown sets of lines J of monitoring point Observable circuitLJudge with based on voltage sag source upstream and downstream orientation Possible breakdown sets of lines JV, obtain possible breakdown sets of lines J；
According to the possible breakdown sets of lines J, extract lowest amplitude in the three-phase voltage amplitude of each monitoring point first supervises Measuring point is to determine the fault type of first monitoring point；
According to the possible breakdown sets of lines J and the fault type of first monitoring point, trouble point undetermined and institute are determined State the fault distance between the first monitoring point and the fault resstance of the trouble point undetermined；
According to each phase voltage of each monitoring point, the fault distance and the fault resstance, fault location mould is established Type；
According to fault location model, constraints and the particle cluster algorithm, the localization of faults.
Second aspect, the embodiment of the present application provide a kind of distribution network fault positioning device, including：
Acquisition module, for the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage sag source The possible breakdown sets of lines J that upstream and downstream orientation judgesV, obtain possible breakdown sets of lines J；
Extraction module, for according to the possible breakdown sets of lines J, extracting in the three-phase voltage amplitude of each monitoring point most First monitoring point of low amplitude value is to determine the fault type of first monitoring point；
First determining module, for the fault type according to the possible breakdown sets of lines J and first monitoring point, Determine the fault distance between trouble point undetermined and first monitoring point and the fault resstance of the trouble point undetermined；
Module is established, for each phase voltage according to each monitoring point, the fault distance and the fault resstance, Establish fault location model；
Second determining module, for according to fault location model, constraints and the particle cluster algorithm, determining failure Point.
Above-mentioned at least one technical scheme that the embodiment of the present application uses can reach following beneficial effect：
The embodiment of the present application passes through the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage dip The possible breakdown sets of lines J that source upstream and downstream orientation judgesV, obtain possible breakdown sets of lines J；According to possible breakdown sets of lines J, The first monitoring point of lowest amplitude in the three-phase voltage amplitude of each monitoring point is extracted to determine the fault type of the first monitoring point； According to possible breakdown sets of lines J and the fault type of the first monitoring point, the event between trouble point undetermined and the first monitoring point is determined Barrier distance and the fault resstance of trouble point undetermined；According to each phase voltage, fault distance and the fault resstance of each monitoring point, establish Fault location model；According to fault location model, constraints and particle cluster algorithm, the localization of faults, it is achieved thereby that pair event Being accurately positioned for barrier point, improves trouble shoot efficiency.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding of the present application, forms the part of the application, this Shen Schematic description and description please is used to explain the application, does not form the improper restriction to the application.In the accompanying drawings：
Fig. 1 is the schematic flow sheet for the electrical power distribution network fault location method that the embodiment of the present application provides；
Fig. 2 is that the electrical power distribution network fault location method that the embodiment of the present application provides is one schematic under practical application scene Flow chart；
Fig. 3 is another signal of the electrical power distribution network fault location method of the embodiment of the present application offer under practical application scene Property flow chart；
Fig. 4 is the structural representation for the distribution network fault positioning device that the embodiment of the present application provides；
Fig. 5 is the structural representation for the electronic equipment that the embodiment of the present application provides.
Embodiment
To make the purpose, technical scheme and advantage of the application clearer, below in conjunction with the application specific embodiment and Technical scheme is clearly and completely described corresponding accompanying drawing.Obviously, described embodiment is only the application Part of the embodiment, rather than whole embodiments.Based on the embodiment in the application, those of ordinary skill in the art are not having There is the every other embodiment made and obtained under the premise of creative work, belong to the scope of the application protection.
To solve the problem of can not accurately determining abort situation in the prior art, reducing trouble shoot efficiency, this Shen Please embodiment a kind of electrical power distribution network fault location method is provided, the executive agent of this method, can be, but not limited to mobile phone, flat board electricity Brain, PC (Personal Computer, PC), server etc. can be configured as performing what the embodiment of the present application provided At least one of method.For ease of description, exemplified by hereafter executive agent in this way is server, to the reality of this method The mode of applying is introduced.It is appreciated that it is a kind of exemplary explanation that the executive agent of this method, which is server, should not It is interpreted as the restriction to this method.
Fig. 1 is a kind of schematic flow sheet for electrical power distribution network fault location method that the application provides；As shown in figure 1, the side Method comprises the steps：
Step 101, the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage sag source upstream and downstream The possible breakdown sets of lines J that orientation judgesV, obtain possible breakdown sets of lines J.
In this step, the possible breakdown sets of lines J of monitoring point Observable circuitLDetermination, Ke Yiwei：
Step S11, according to N × 4N network node depression matrix Md, obtain each monitoring point Observable node number sequence JNm, i.e. network node depression matrix MdIn be the node number sequence corresponding to 1 element in m row elements；Wherein,
Wherein, subscript LG is singlephase earth fault, and LL is phase-to phase fault, and LLG is double earthfault, and LLL is three-phase event Barrier；N is the nodes in network；Element M in matrixijFor 0 and 1, the failure that 1 expression node j occurs will cause node i Voltage be less than monitoring device threshold value p, i.e. node j occur failure can by node i arrange monitoring point observe, otherwise for 0.It is minimum compared with threshold value p in A, B, C three-phase voltage when taking unbalanced fault for unbalanced fault LG, LLG and LL, make For judge sag exposed areas matrix element whether the standard for being 1.
Step S12, the circuit being connected further according to node number sequence search with node, circuit number is recorded to be formed Each monitoring point Observable sets of lines JLm。
When voltage dip step S13, occurs, according to the monitoring point numbering M monitored, its Observable circuit is extracted respectively Collection, and common factor is taken, finally give the possible breakdown sets of lines J based on monitoring point Observable circuitL。
In this step, the possible breakdown sets of lines J judged based on voltage sag source upstream and downstream orientationVDetermination, can be with For：
Step S21, each monitoring point in network to be analyzed, extraction is located at the circuit of monitoring point upstream and downstream, And stored, for m-th of monitoring point, it is J to make its upstream line sequenceVup-m, downstream line sequence is JVdown-m；
Step S22, make the voltage dip of m-th monitoring point occur before it is idle be Qm, it is idle when voltage dip occurs For Qfm, it is idle according to monitoring point, voltage sag source is judged positioned at the upstream or downstream of m-th of monitoring point, as shown in Fig. 2 specifically For：
Step S23, to each monitoring point, according to its voltage sag source orientation judged result, extract its corresponding upstream or Downstream line, and common factor is taken to the possibility circuit of each monitoring point, finally obtain and judge to carry according to voltage dip upstream and downstream orientation Take the possible breakdown sets of lines J judged based on voltage sag source upstream and downstream orientationV。
Wherein, the determination methods that the voltage sag source orientation judges include：
For asymmetric fault, can be judged using negative sequence power increment.For negative sequence component power increment, specifically It is defined as follows：
ΔPe(2)=Δ U(2)ΔI(2)cos(θ(2))
In above formula,Fundamental frequency negative phase-sequence respectively in failure process and before failure Voltage, electric current；θ(2)ForIt is ahead ofAngle.Then there is following direction criterion：
If a) Δ Pe(2)＜ 0, then the source of trouble be located at upstream；
If b) Δ Pe(2)＞ 0, then the source of trouble be located at downstream.
And for symmetric fault, then can be according to upstream-downstream relationship of the positive-sequence power increment failure judgement source with respect to monitoring point. It has following direction criterion：
If a) Δ Pe(1)＜ 0, then the source of trouble be located at upstream；
If b) Δ Pe(1)＞ 0, then the source of trouble be located at downstream.
In this step, to the possible breakdown sets of lines J based on monitoring point Observable circuitLWith based on voltage sag source The possible breakdown sets of lines J that upstream and downstream orientation judgesVSeek common ground, you can obtain possible breakdown sets of lines J, be expressed as J=JL∩ JV。
Step 102, according to the possible breakdown sets of lines J, extract lowest amplitude in the three-phase voltage amplitude of each monitoring point The first monitoring point to determine the fault type of first monitoring point.
In this step, first, according to the volume possible breakdown sets of lines J of determination, each monitoring point three-phase voltage amplitude is extracted In minimum the first monitoring point voltage；Then, the average U of the three-phase voltage amplitude of the first monitoring point is asked form, then distinguish By three-phase voltage amplitude and average UmCompare, and increase voltage zero-sequence component information to judge, criterion is as follows：
(1) for LG failures, a wherein phase voltage amplitude should is less than Um, other two-phase voltage amplitudes are higher than Um, simultaneously Three-phase voltage amplitude and UmDifference should be all higher than a certain threshold value pu。
(2) for LLG and LL failures, wherein two-phase voltage amplitude should is less than Um, in addition a phase voltage amplitude be higher than Um, Three-phase voltage amplitude and U simultaneouslymDifference should be all higher than a certain threshold value pu, and should be greater than for LLG failures, its zero-sequence component A certain value pu0, for LL failures, then zero-sequence component should be less than a certain value pu0。
(3) for LLL failures, then three-phase voltage amplitude and UmDifference should be respectively less than a certain threshold value pu.Due to actual system The three-phase voltage amplitude of symmetric fault can not possibly be identical in system, it is therefore desirable to given threshold puTo judge symmetric fault, only Three-phase voltage amplitude is wanted to deviate average UmDegree be respectively less than threshold value pu, you can it is symmetric fault to think it, conversely, then to be non-right Three-phase voltage amplitude during failure, i.e. asymmetric fault is claimed to deviate average UmDegree necessarily than symmetric fault when it is big.
The difference of LLG and LL failures is to whether there is zero-sequence component, due to isolated neutral system be present in real system, LLG failures may also cause the zero-sequence component of monitoring point voltage very small, therefore the threshold value p of zero-sequence componentu0Sometimes may also can What is taken is very small.
That is, threshold value puAnd pu0It is required for being determined according to real system.
Step 103, according to the possible breakdown sets of lines J and the fault type of first monitoring point, determine it is undetermined therefore The fault resstance of fault distance and the trouble point undetermined between barrier point and first monitoring point.
In this step, the fault distance between trouble point undetermined and first monitoring point and the event undetermined are determined Hinder the fault resstance of point, can specifically include：
Step S31, according to the possible breakdown sets of lines J and the fault type of first monitoring point, described the is obtained This three sequence voltage of positive sequence, negative phase-sequence and zero sequence of one monitoring point before breaking down.
Step S32, positive sequence voltage, negative sequence voltage, the residual voltage according to first monitoring point before breaking down And relation function, determine the fault distance between trouble point undetermined and first monitoring point and the event of the trouble point undetermined Hinder resistance.
Wherein, the mathematic(al) representation of the relation function can be：
Wherein, (1), (2), (0) represent positive and negative, zero sequence respectively；I is the numbering of first monitoring point；For institute State positive sequence voltage of first monitoring point before breaking down；For negative phase-sequence of first monitoring point before breaking down Voltage；For residual voltage of first monitoring point before breaking down； Zmi,fFor first monitoring point with it is undetermined Trouble point f mutual impedance；IfFor the fault current of trouble point undetermined, fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negative It is related.
It should be understood that fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negatively correlated, that is to say, that IfValue it is smaller, therefore It is longer to hinder distance P, fault resstance zfIt is bigger.
Step 104, according to each phase voltage of each monitoring point, the fault distance and the fault resstance, establish therefore Hinder location model.
The formula of the fault location model can be expressed as：
Wherein, Um(p,zf) be monitoring point m theoretical voltage；UmFor monitoring point m virtual voltage；Q is the total of monitoring point Quantity.
It should be understood that monitoring point m theoretical voltage, can be that monitoring point m is estimated by empirical equation or empirical data etc. The experience voltage come.
Step 105, according to fault location model, constraints and the particle cluster algorithm, the localization of faults.
The constraints can be：
0≤p≤1,zf≥0
This step is specifically, as shown in figure 3, according to the fault location model, constraints and following particle cluster algorithm Formula：
The localization of faults.
Wherein,For i-th of particle in kth time iteration, particle dimension is 2；Changed for i-th of particle at k times The history optimal value of fault location model is corresponded in generation；For particle colony in k iteration fault location model it is global most The figure of merit；vp,i、vzf,iRepresent the speed of particle；ω is inertia weight, represents that particle keeps the coefficient of original speed；c1For itself Cognition, represents the weight coefficient of Particle tracking oneself history adaptive optimal control degree, usually 2；c2For social recognition, particle is represented The weight coefficient of colony adaptive optimal control degree is tracked, usually 2；X, h is [0,1] equally distributed random number；R is location updating Weight, usually 1；For the minimum value of fault location model in kth time iteration；Determine for failure in kth time iteration The average value of bit model；ωminFor the weight coefficient of minimum, be typically set to 0.95,；ωmaxFor maximum weight coefficient, typically It is set to 0.4.
The embodiment of the present application passes through the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage dip The possible breakdown sets of lines J that source upstream and downstream orientation judgesV, obtain possible breakdown sets of lines J；According to possible breakdown sets of lines J, The first monitoring point of lowest amplitude in the three-phase voltage amplitude of each monitoring point is extracted to determine the fault type of the first monitoring point； According to possible breakdown sets of lines J and the fault type of the first monitoring point, the event between trouble point undetermined and the first monitoring point is determined Barrier distance and the fault resstance of trouble point undetermined；According to each phase voltage, fault distance and the fault resstance of each monitoring point, establish Fault location model；According to fault location model, constraints and particle cluster algorithm, the localization of faults, it is achieved thereby that pair event Being accurately positioned for barrier point, improves trouble shoot efficiency.
To solve the problem of can not accurately determining abort situation in the prior art, reducing trouble shoot efficiency, it is based on With above-mentioned electrical power distribution network fault location method identical inventive concept, the embodiment of the present application also provides a kind of distribution network failure positioning Device, as shown in figure 4, including：
Acquisition module 401, for the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage dip The possible breakdown sets of lines J that source upstream and downstream orientation judgesV, obtain possible breakdown sets of lines J；
Extraction module 402, for according to the possible breakdown sets of lines J, in the three-phase voltage amplitude for extracting each monitoring point First monitoring point of lowest amplitude is to determine the fault type of first monitoring point；
First determining module 403, for the failure classes according to the possible breakdown sets of lines J and first monitoring point Type, determine the fault distance between trouble point undetermined and first monitoring point and the fault resstance of the trouble point undetermined；
Module 404 is established, for each phase voltage according to each monitoring point, the fault distance and failure electricity Resistance, establishes fault location model；
Second determining module 405, for according to fault location model, constraints and the particle cluster algorithm, it is determined that therefore Barrier point.
First determining module 403 includes：
Acquiring unit, for the fault type according to the possible breakdown sets of lines J and first monitoring point, obtain This three sequence voltage of positive sequence, negative phase-sequence and zero sequence of first monitoring point before breaking down；
First determining unit, for positive sequence voltage, the negative phase-sequence electricity according to first monitoring point before breaking down Pressure, residual voltage and relation function, determine fault distance between trouble point undetermined and first monitoring point and described undetermined The fault resstance of trouble point.
The mathematic(al) representation of the relation function is：
Wherein, (1), (2), (0) represent positive and negative, zero sequence respectively；I is the numbering of first monitoring point；For institute State positive sequence voltage of first monitoring point before breaking down；For negative phase-sequence of first monitoring point before breaking down Voltage；For residual voltage of first monitoring point before breaking down； Zmi,fFor first monitoring point with it is undetermined Trouble point f mutual impedance；IfFor the fault current of trouble point undetermined, fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negative It is related.
It should be understood that fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negatively correlated, that is to say, that IfValue it is smaller, therefore It is longer to hinder distance P, fault resstance zfIt is bigger.
The formula of the fault location model can be expressed as：
Wherein, Um(p,zf) be monitoring point m theoretical voltage；UmFor monitoring point m virtual voltage；Q is the total of monitoring point Quantity；
The constraints is：
0≤p≤1,zf≥0 (3)
Second determining module 405 includes：
Second determining unit, for according to fault location model, constraints and the equation below：
The localization of faults；
Wherein, particle cluster algorithm can use formula (4), (5), (6) to represent,For i-th in kth time iteration Son, particle dimension are 2；The history optimal value of fault location model is corresponded in k iteration for i-th of particle；For particle The global optimum of colony's fault location model in k iteration； vp,i、vzf,iRepresent the speed of particle；ω is inertia weight, Represent that particle keeps the coefficient of original speed；c1Recognized for itself, represent the weight of Particle tracking oneself history adaptive optimal control degree Coefficient, usually 2；c2For social recognition, the weight coefficient of Particle tracking colony adaptive optimal control degree is represented, usually 2；X, h is [0,1] equally distributed random number；R is the weight of location updating, usually 1；For fault location mould in kth time iteration The minimum value of type；For the average value of fault location model in kth time iteration；ωminFor the weight coefficient of minimum, typically set For 0.95,；ωmaxFor the weight coefficient of maximum, 0.4 is typically set to.
The embodiment of the present application passes through the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage dip The possible breakdown sets of lines J that source upstream and downstream orientation judgesV, obtain possible breakdown sets of lines J；According to possible breakdown sets of lines J, The first monitoring point of lowest amplitude in the three-phase voltage amplitude of each monitoring point is extracted to determine the fault type of the first monitoring point； According to possible breakdown sets of lines J and the fault type of the first monitoring point, the event between trouble point undetermined and the first monitoring point is determined Barrier distance and the fault resstance of trouble point undetermined；According to each phase voltage, fault distance and the fault resstance of each monitoring point, establish Fault location model；According to fault location model, constraints and particle cluster algorithm, the localization of faults, it is achieved thereby that pair event Being accurately positioned for barrier point, improves trouble shoot efficiency.
Fig. 5 shows the structural representation for a kind of electronic equipment for being the embodiment of the present application offer.Fig. 5 is refer to, hard Part aspect, the electronic equipment include processor, alternatively also include internal bus, network interface, memory.Wherein, memory Internal memory, such as high-speed random access memory (Random-Access Memory, RAM) may be included, it is also possible to also including non- Volatile memory (non-volatile memory), for example, at least 1 magnetic disk storage etc..Certainly, the electronic equipment is also The hardware required for other business may be included.
Processor, network interface and memory can be connected with each other by internal bus, and the internal bus can be ISA (Industry Standard Architecture, industry standard architecture) bus, PCI (Peripheral Component Interconnect, Peripheral Component Interconnect standard) bus or EISA (Extended Industry Standard Architecture, EISA) bus etc..The bus can be divided into address bus, data/address bus, control Bus etc..For ease of representing, only represented in Fig. 5 with a four-headed arrow, it is not intended that an only bus or a type Bus.
Memory, for depositing program.Specifically, program can include program code, and described program code includes calculating Machine operational order.Memory can include internal memory and nonvolatile memory, and provide instruction and data to processor.
Processor read from nonvolatile memory corresponding to computer program into internal memory then run, in logic Network covering property characterization apparatus is formed in aspect.Processor, the program that memory is deposited is performed, and specifically for performing Operate below：
According to the possible breakdown sets of lines J of monitoring point Observable circuitLJudge with based on voltage sag source upstream and downstream orientation Possible breakdown sets of lines JV, obtain possible breakdown sets of lines J；
According to the possible breakdown sets of lines J, extract lowest amplitude in the three-phase voltage amplitude of each monitoring point first supervises Measuring point is to determine the fault type of first monitoring point；
According to the possible breakdown sets of lines J and the fault type of first monitoring point, trouble point undetermined and institute are determined State the fault distance between the first monitoring point and the fault resstance of the trouble point undetermined；
According to each phase voltage of each monitoring point, the fault distance and the fault resstance, fault location mould is established Type；
According to fault location model, constraints and the particle cluster algorithm, the localization of faults.
The method that distribution network fault positioning device disclosed in the above-mentioned embodiment illustrated in fig. 5 such as the application performs can be applied Realized in processor, or by processor.Processor is probably a kind of IC chip, has the disposal ability of signal. In implementation process, each step of the above method can pass through the integrated logic circuit or software shape of the hardware in processor The instruction of formula is completed.Above-mentioned processor can be general processor, including central processing unit (Central Processing Unit, CPU), network processing unit (Network Processor, NP) etc.；It can also be digital signal processor (Digital Signal Processor, DSP), application specific integrated circuit (Application Specific Integrated Circuit, ASIC), field programmable gate array (Field-Programmable Gate Array, FPGA) or other programmable patrol Collect device, discrete gate or transistor logic, discrete hardware components.It can realize or perform in the embodiment of the present application Disclosed each method, step and logic diagram.General processor can be microprocessor or the processor can also be appointed What conventional processor etc..The step of method with reference to disclosed in the embodiment of the present application, can be embodied directly at hardware decoding Reason device performs completion, or performs completion with the hardware in decoding processor and software module combination.Software module can be located at Random access memory, flash memory, read-only storage, programmable read only memory or electrically erasable programmable memory, register etc. In the ripe storage medium in this area.The storage medium is located at memory, and processor reads the information in memory, with reference to it Hardware completes the step of above method.
The embodiment of the present application also proposed a kind of computer-readable recording medium, the computer-readable recording medium storage One or more programs, one or more programs include instruction, and the instruction is when the electronic equipment for being included multiple application programs During execution, the electronic equipment can be made to perform the method that distribution network fault positioning device performs in embodiment illustrated in fig. 5, and have Body is used to perform：
According to the possible breakdown sets of lines J of monitoring point Observable circuitLJudge with based on voltage sag source upstream and downstream orientation Possible breakdown sets of lines JV, obtain possible breakdown sets of lines J；
According to the possible breakdown sets of lines J, extract lowest amplitude in the three-phase voltage amplitude of each monitoring point first supervises Measuring point is to determine the fault type of first monitoring point；
According to the possible breakdown sets of lines J and the fault type of first monitoring point, trouble point undetermined and institute are determined State the fault distance between the first monitoring point and the fault resstance of the trouble point undetermined；
According to each phase voltage of each monitoring point, the fault distance and the fault resstance, fault location mould is established Type；
According to fault location model, constraints and the particle cluster algorithm, the localization of faults.
It should be understood by those skilled in the art that, embodiments herein can be provided as method, system or computer journey Sequence product.Therefore, in terms of the application can use complete hardware embodiment, complete software embodiment or combine software and hardware The form of embodiment.Moreover, the application can use the calculating for wherein including computer usable program code in one or more The computer program that machine usable storage medium is implemented on (including but is not limited to magnetic disk storage, CD-ROM, optical memory etc.) The form of product.
The application is the flow chart of the method with reference to the embodiment of the present application, equipment (system) and computer program product And/or block diagram describes.It should be understood that can be by every first-class in computer program instructions implementation process figure and/or block diagram Journey and/or the flow in square frame and flow chart and/or block diagram and/or the combination of square frame.These computer journeys can be provided Sequence instruction to all-purpose computer, special-purpose computer, Embedded Processor or other programmable data processing devices processor with Produce a machine so that use is produced by the instruction of computer or the computing device of other programmable data processing devices In the function that realization is specified in one flow of flow chart or multiple flows and/or one square frame of block diagram or multiple square frames Device.
These computer program instructions, which may be alternatively stored in, can guide computer or other programmable data processing devices with spy Determine in the computer-readable memory that mode works so that the instruction being stored in the computer-readable memory, which produces, to be included The manufacture of command device, the command device are realized in one flow of flow chart or multiple flows and/or one square frame of block diagram Or the function of being specified in multiple square frames.
These computer program instructions can be also loaded into computer or other programmable data processing devices so that Series of operation steps is performed on computer or other programmable devices to produce computer implemented processing, so as to calculate The instruction performed on machine or other programmable devices is provided for realizing in one flow of flow chart or multiple flows and/or side The step of function of being specified in one square frame of block diagram or multiple square frames.
In a typical configuration, computing device include one or more processors (CPU), input/output interface, Network interface and internal memory.
Internal memory may include computer-readable medium in volatile memory, random access memory (RAM) and/ Or the form such as Nonvolatile memory, such as read-only storage (ROM) or flash memory (flash RAM).Internal memory is computer-readable medium Example.
Computer-readable medium includes permanent and non-permanent, removable and non-removable media can be by any side Method or technology realize that information stores.Information can be computer-readable instruction, data structure, the module of program or other numbers According to.The example of the storage medium of computer includes, but are not limited to phase transition internal memory (PRAM), static RAM (SRAM), dynamic random access memory (DRAM), other kinds of random access memory (RAM), read-only storage (ROM), Electrically Erasable Read Only Memory (EEPROM), fast flash memory bank or other memory techniques, read-only optical disc are read-only Memory (CD-ROM), digital versatile disc (DVD) or other optical storages, magnetic cassette tape, the storage of tape magnetic rigid disk Or other magnetic storage apparatus or any other non-transmission medium, the information that can be accessed by a computing device available for storage.Press Defined according to herein, computer-readable medium does not include temporary computer readable media (transitory media), such as modulates Data-signal and carrier wave.
It should also be noted that, term " comprising ", "comprising" or its any other variant are intended to nonexcludability Comprising so that process, method, commodity or equipment including a series of elements not only include those key elements, but also wrapping Include the other element being not expressly set out, or also include for this process, method, commodity or equipment intrinsic want Element.In the absence of more restrictions, the key element limited by sentence "including a ...", it is not excluded that including key element Process, method, other identical element also be present in commodity or equipment.
Embodiments herein is these are only, is not limited to the application.Come for those skilled in the art Say, the application there can be various modifications and variations.All any modifications made within spirit herein and principle, it is equal Replace, improve etc., it should be included within the scope of claims hereof.

Claims (10)

  1. A kind of 1. electrical power distribution network fault location method, it is characterised in that including：
    According to the possible breakdown sets of lines J of monitoring point Observable circuitLWith the possibility judged based on voltage sag source upstream and downstream orientation Faulty line collection JV, obtain possible breakdown sets of lines J；
    According to the possible breakdown sets of lines J, the first monitoring point of lowest amplitude in the three-phase voltage amplitude of each monitoring point is extracted To determine the fault type of first monitoring point；
    According to the possible breakdown sets of lines J and the fault type of first monitoring point, trouble point undetermined and described the are determined The fault resstance of fault distance and the trouble point undetermined between one monitoring point；
    According to each phase voltage of each monitoring point, the fault distance and the fault resstance, fault location model is established；
    According to fault location model, constraints and the particle cluster algorithm, the localization of faults.
  2. 2. according to the method for claim 1, it is characterised in that according to the possible breakdown sets of lines J and first prison The fault type of measuring point, determine fault distance between trouble point undetermined and first monitoring point and the trouble point undetermined Fault resstance, specifically include：
    According to the possible breakdown sets of lines J and the fault type of first monitoring point, obtain first monitoring point and sending out Positive sequence, negative phase-sequence and zero sequence this three sequence voltage before raw failure；
    According to positive sequence voltage, negative sequence voltage, residual voltage and relation function of first monitoring point before breaking down, really Fixed fault distance between trouble point undetermined and first monitoring point and the fault resstance of the trouble point undetermined.
  3. 3. according to the method for claim 2, it is characterised in that the mathematic(al) representation of the relation function is：
    <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>|</mo> <mn>0</mn> <mo>|</mo> </mrow> </msubsup> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> </mtable> </mfenced>
    Wherein, (1), (2), (0) represent positive and negative, zero sequence respectively；I is the numbering of first monitoring point；For described first Positive sequence voltage of the monitoring point before breaking down；For negative sequence voltage of first monitoring point before breaking down；For residual voltage of first monitoring point before breaking down；Zmi,fFor first monitoring point and trouble point f undetermined Mutual impedance；IfFor the fault current of trouble point undetermined, fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negatively correlated.
  4. 4. according to the method for claim 3, it is characterised in that
    The formula of the fault location model is：
    <mrow> <mi>min</mi> <mi> </mi> <mi>J</mi> <mrow> <mo>(</mo> <mi>p</mi> <mo>,</mo> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>)</mo> </mrow> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>m</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>q</mi> </munderover> <mo>|</mo> <msub> <mi>U</mi> <mi>m</mi> </msub> <mo>-</mo> <msub> <mi>U</mi> <mi>m</mi> </msub> <mrow> <mo>(</mo> <mi>p</mi> <mo>,</mo> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>)</mo> </mrow> <mo>|</mo> </mrow>
    Wherein, Um(p,zf) be monitoring point m theoretical voltage；UmFor monitoring point m virtual voltage；Q is the total quantity of monitoring point；
    The constraints is：
    0≤p≤1,zf≥0
  5. 5. according to the method for claim 4, it is characterised in that according to fault location model, constraints and the particle Group's algorithm, the localization of faults, including：
    According to the fault location model, the constraints and equation below：
    <mrow> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>=</mo> <mi>&amp;omega;</mi> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>,</mo> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>+</mo> <msub> <mi>c</mi> <mn>1</mn> </msub> <mi>&amp;xi;</mi> <mrow> <mo>(</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>-</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>)</mo> </mrow> <mo>+</mo> <msub> <mi>c</mi> <mn>2</mn> </msub> <mi>&amp;eta;</mi> <mrow> <mo>(</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>g</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>g</mi> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>-</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>)</mo> </mrow> <mo>,</mo> </mrow>
    <mrow> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>=</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>+</mo> <mi>r</mi> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>z</mi> <mi>f</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>,</mo> </mrow>
    <mrow> <mi>&amp;omega;</mi> <mo>=</mo> <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <msub> <mi>&amp;omega;</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> </msub> <mo>+</mo> <mrow> <mo>(</mo> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>-</mo> <msubsup> <mi>J</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> <mi>k</mi> </msubsup> <mo>)</mo> </mrow> <mo>/</mo> <mrow> <mo>(</mo> <msubsup> <mi>J</mi> <mrow> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> <mi>k</mi> </msubsup> <mo>-</mo> <msubsup> <mi>J</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> <mi>k</mi> </msubsup> <mo>)</mo> </mrow> <mo>,</mo> </mrow> </mtd> <mtd> <mrow> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>&amp;le;</mo> <msub> <mi>J</mi> <mrow> <mi>i</mi> <mo>,</mo> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> </msub> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>&amp;omega;</mi> <mrow> <mi>m</mi> <mi>a</mi> <mi>x</mi> </mrow> </msub> <mo>,</mo> </mrow> </mtd> <mtd> <mrow> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>&gt;</mo> <msub> <mi>J</mi> <mrow> <mi>i</mi> <mo>,</mo> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> </msub> </mrow> </mtd> </mtr> </mtable> </mfenced> <mo>,</mo> </mrow>
    The localization of faults；
    Wherein,For i-th of particle in kth time iteration；Fault location is corresponded in k iteration for i-th of particle The history optimal value of model；For the global optimum of particle colony fault location model in k iteration；vp,i、vzf,iRepresent The speed of particle；ω is inertia weight, represents that particle keeps the coefficient of original speed；c1Represent that Particle tracking oneself history is optimal The weight coefficient of fitness；c2For social recognition, the weight coefficient of expression Particle tracking colony adaptive optimal control degree；X, h is [0,1] Equally distributed random number；R is the weight of location updating；For the minimum value of fault location model in kth time iteration； For the average value of fault location model in kth time iteration；ωminFor the weight coefficient of minimum；ωmaxFor the weight coefficient of maximum.
  6. A kind of 6. distribution network fault positioning device, it is characterised in that including：
    Acquisition module, for the possible breakdown sets of lines J according to monitoring point Observable circuitLWith based on voltage sag source upstream and downstream The possible breakdown sets of lines J that orientation judgesV, obtain possible breakdown sets of lines J；
    Extraction module, for according to the possible breakdown sets of lines J, extracting lowest amplitude in the three-phase voltage amplitude of each monitoring point The first monitoring point to determine the fault type of first monitoring point；
    First determining module, for the fault type according to the possible breakdown sets of lines J and first monitoring point, it is determined that treating Determine the fault distance between trouble point and first monitoring point and the fault resstance of the trouble point undetermined；
    Module is established, for each phase voltage according to each monitoring point, the fault distance and the fault resstance, establishes event Hinder location model；
    Second determining module, for according to fault location model, constraints and the particle cluster algorithm, the localization of faults.
  7. 7. device according to claim 6, it is characterised in that first determining module includes：
    Acquiring unit, for the fault type according to the possible breakdown sets of lines J and first monitoring point, obtain described the This three sequence voltage of positive sequence, negative phase-sequence and zero sequence of one monitoring point before breaking down；
    First determining unit, for according to positive sequence voltage of first monitoring point before breaking down, negative sequence voltage, zero sequence Voltage and relation function, determine fault distance between trouble point undetermined and first monitoring point and the trouble point undetermined Fault resstance.
  8. 8. device according to claim 7, it is characterised in that the mathematic(al) representation of the relation function is：
    <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>|</mo> <mn>0</mn> <mo>|</mo> </mrow> </msubsup> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msubsup> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mi>m</mi> <mi>i</mi> </mrow> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> <mo>=</mo> <mo>-</mo> <msubsup> <mi>Z</mi> <mrow> <mi>m</mi> <mi>i</mi> <mo>,</mo> <mi>f</mi> </mrow> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> <msubsup> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mi>f</mi> <mrow> <mo>(</mo> <mn>0</mn> <mo>)</mo> </mrow> </msubsup> </mrow> </mtd> </mtr> </mtable> </mfenced>
    Wherein, (1), (2), (0) represent positive and negative, zero sequence respectively；I is the numbering of first monitoring point；For described first Positive sequence voltage of the monitoring point before breaking down；For negative sequence voltage of first monitoring point before breaking down；For residual voltage of first monitoring point before breaking down；Zmi,fFor first monitoring point and trouble point f undetermined Mutual impedance；IfFor the fault current of trouble point undetermined, fault distance P and IfNegative correlation, fault resstance zfWith IfIt is negatively correlated.
  9. 9. device according to claim 8, it is characterised in that
    The formula of the fault location model is：
    <mrow> <mi>min</mi> <mi> </mi> <mi>J</mi> <mrow> <mo>(</mo> <mi>p</mi> <mo>,</mo> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>)</mo> </mrow> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>m</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>q</mi> </munderover> <mo>|</mo> <msub> <mi>U</mi> <mi>m</mi> </msub> <mo>-</mo> <msub> <mi>U</mi> <mi>m</mi> </msub> <mrow> <mo>(</mo> <mi>p</mi> <mo>,</mo> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>)</mo> </mrow> <mo>|</mo> </mrow>
    Wherein, Um(p,zf) be monitoring point m theoretical voltage；UmFor monitoring point m virtual voltage；Q is the total quantity of monitoring point；
    The constraints is：
    0≤p≤1,zf≥0
  10. 10. device according to claim 9, it is characterised in that second determining module includes：
    Second determining unit, for according to fault location model, constraints and the formula：
    <mrow> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>=</mo> <mi>&amp;omega;</mi> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <msub> <mi>z</mi> <mi>f</mi> </msub> <mo>,</mo> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>+</mo> <msub> <mi>c</mi> <mn>1</mn> </msub> <mi>&amp;xi;</mi> <mrow> <mo>(</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>-</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>)</mo> </mrow> <mo>+</mo> <msub> <mi>c</mi> <mn>2</mn> </msub> <mi>&amp;eta;</mi> <mrow> <mo>(</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>g</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>J</mi> <mi>g</mi> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>-</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>)</mo> </mrow> </mrow>
    <mrow> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>=</mo> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>p</mi> <mi>i</mi> <mi>k</mi> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>z</mi> <mrow> <mi>f</mi> <mi>i</mi> </mrow> <mi>k</mi> </msubsup> </mtd> </mtr> </mtable> </mfenced> <mo>+</mo> <mi>r</mi> <mfenced open = "[" close = "]"> <mtable> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>p</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> <mtr> <mtd> <msubsup> <mi>v</mi> <mrow> <mi>z</mi> <mi>f</mi> <mo>,</mo> <mi>i</mi> </mrow> <mrow> <mi>k</mi> <mo>+</mo> <mn>1</mn> </mrow> </msubsup> </mtd> </mtr> </mtable> </mfenced> </mrow>
    <mrow> <mi>&amp;omega;</mi> <mo>=</mo> <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <msub> <mi>&amp;omega;</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> </msub> <mo>+</mo> <mrow> <mo>(</mo> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>-</mo> <msubsup> <mi>J</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> <mi>k</mi> </msubsup> <mo>)</mo> </mrow> <mo>/</mo> <mrow> <mo>(</mo> <msubsup> <mi>J</mi> <mrow> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> <mi>k</mi> </msubsup> <mo>-</mo> <msubsup> <mi>J</mi> <mrow> <mi>m</mi> <mi>i</mi> <mi>n</mi> </mrow> <mi>k</mi> </msubsup> <mo>)</mo> </mrow> <mo>,</mo> </mrow> </mtd> <mtd> <mrow> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>&amp;le;</mo> <msub> <mi>J</mi> <mrow> <mi>i</mi> <mo>,</mo> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> </msub> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>&amp;omega;</mi> <mrow> <mi>m</mi> <mi>a</mi> <mi>x</mi> </mrow> </msub> <mo>,</mo> </mrow> </mtd> <mtd> <mrow> <msubsup> <mi>J</mi> <mi>i</mi> <mi>k</mi> </msubsup> <mo>&gt;</mo> <msub> <mi>J</mi> <mrow> <mi>i</mi> <mo>,</mo> <mi>a</mi> <mi>v</mi> <mi>g</mi> </mrow> </msub> </mrow> </mtd> </mtr> </mtable> </mfenced> </mrow>
    The localization of faults；
    Wherein,For i-th of particle in kth time iteration；Fault location mould is corresponded in k iteration for i-th of particle The history optimal value of type；For the global optimum of particle colony fault location model in k iteration；vp,i、vzf,iRepresent grain The speed of son；ω represents that particle keeps the coefficient of original speed；c1Represent the weight of Particle tracking oneself history adaptive optimal control degree Coefficient；c2Represent the weight coefficient of Particle tracking colony adaptive optimal control degree；X, h is [0,1] equally distributed random number；R is position Put the weight of renewal；For the minimum value of fault location model in kth time iteration；For fault location mould in kth time iteration The average value of type；ωminFor the weight coefficient of minimum；ωmaxFor the weight coefficient of maximum.
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CN109541399A (en) * 2018-12-14 2019-03-29 海南电网有限责任公司琼海供电局 A kind of electrical power distribution network fault location method and device
CN109581116A (en) * 2018-12-14 2019-04-05 海南电网有限责任公司琼海供电局 A kind of method and apparatus detecting distribution network failure
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CN113132125A (en) * 2019-12-30 2021-07-16 中国移动通信集团四川有限公司 Fault reason positioning method and device, electronic equipment and storage medium
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