CN107817239A - A kind of LIBS spectral correction methods based on plasma position information - Google Patents

A kind of LIBS spectral correction methods based on plasma position information Download PDF

Info

Publication number
CN107817239A
CN107817239A CN201610819393.8A CN201610819393A CN107817239A CN 107817239 A CN107817239 A CN 107817239A CN 201610819393 A CN201610819393 A CN 201610819393A CN 107817239 A CN107817239 A CN 107817239A
Authority
CN
China
Prior art keywords
mrow
msub
libs
plasma
position information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610819393.8A
Other languages
Chinese (zh)
Other versions
CN107817239B (en
Inventor
孙兰香
张鹏
齐立峰
于海斌
曾鹏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenyang Institute of Automation of CAS
Original Assignee
Shenyang Institute of Automation of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenyang Institute of Automation of CAS filed Critical Shenyang Institute of Automation of CAS
Priority to CN201610819393.8A priority Critical patent/CN107817239B/en
Publication of CN107817239A publication Critical patent/CN107817239A/en
Application granted granted Critical
Publication of CN107817239B publication Critical patent/CN107817239B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

The present invention relates to a kind of LIBS spectrum-stable methods based on plasma position information, concretely comprise the following steps:1) LIBS spectral signals and the corresponding Plasma picture signal under different sample positions are obtained;2) plasma position information is extracted from Plasma picture information;3) relation function of LIBS spectrums region and value with corresponding plasma position is established by approximating method;Relation function of the specific the intensity of spectral line of LIBS spectrum with corresponding plasma position is established by approximating method;4) relation function obtained in using 3) establishes comprehensive correction function;5) the LIBS spectrum of Location-Unknown are corrected using correction function.Characteristic spectral line after being corrected with this method, there is higher stability, more reliable spectral line information is provided for quantitative (qualitative) analysis.

Description

A kind of LIBS spectral correction methods based on plasma position information
Technical field
The invention belongs to spectrum analysis and material composition constituent analysis field, is specifically that one kind is based on plasma position The LIBS spectral correction methods of confidence breath.
Background technology
LIBS (LIBS) analytical technology, it is a kind of original of plasma using laser excitation as light source Sub- emission spectrographic analysis technology.Material composition qualitative and quantitative analysis based on LIBS technologies, the sample system of complexity is not required to it It is standby, the features such as online multicomponent in situ is quickly analyzed can be achieved, become many industry necks such as metallurgy, the energy, food, chemical industry The hot spot application technology in domain.However, because obtained spectral signal stability is not high, LIBS be more served only for qualitative analysis and Semi-quantitative analysis.Therefore, the stability of LIBS signals is improved, can just it is met the needs of quantitative analysis, so as to applied to real When online in situ detection in.
The preprocessing procedures of the raising stability generally used at present, mainly choose reference line and full spectrum normalizes Method.The former needs the element containing stable content in testing sample, and the element has clearly in the range of Detection wavelength Characteristic spectral line;The latter assumes in the range of the Detection wavelength all spectral intensities and value is perseverance in the case where detection environment is constant Fixed, it is this when detection spectral coverage scope is narrower larger with the fluctuation of matrix element content to assume to lack reasonability.Pass through extraction Plasma characteristics parameter is corrected to spectral signal, is a kind of spectral correction method based on plasma physics feature, But its need detect a wider spectral coverage scope, and need in the range of this comprising a plurality of clearly atom, ion line, and Modeled by the model of fit of complexity.
Most directly reflect mode as luminescence of plasma situation, Plasma picture is always when analyzing plasma The important channel that space division cloth and research plasma are formed.Plasma position information is extracted from Plasma picture, and then Correction is shaken by the inconsistent caused spectral signal of testing sample apparent height, is a kind of feasible means of stable spectra signal.
The content of the invention
For in place of above shortcomings in the prior art, the technical problem to be solved in the present invention is to pass through plasma The plasma position information included in image, founding mathematical models, LIBS spectral signals are corrected, so as to obtain into rower The reliable and stable characteristic spectral line intensity of setting analysis.
The used to achieve the above object technical scheme of the present invention is:A kind of LIBS based on plasma position information Spectral correction method, comprise the following steps:
Step 1:Obtain the LIBS spectral signals under sample different height and corresponding Plasma picture;
Step 2:The light-emitting zone of plasma is determined according to each pixel value in Plasma picture, according to luminous zone The pattern and pixel value in domain determine plasma position;
Step 3:By approximating method, establish in the range of LIBS spectra collections full spectral coverage and with plasma position information Respective function relation;Meanwhile by approximating method, establish the specific characteristic spectral line intensity of LIBS spectrum and plasma position information Respective function relation;
Step 4:The function obtained according to step 3, establish the correction of plasma position information correction LIBS spectral signals Function;
Step 5:The correction function that applying step 4 the obtains LIBS spectrum unknown to height of specimen is corrected.
Step 1 obtains the LIBS spectrum of different height of specimen and corresponding Plasma picture, movement by mobile example Distance is judged by Plasma picture.
The step 2 is specially:Setting pixel threshold first determines heating region, wiping out background noise;Then lead to Cross calculate length-width ratio, in all directions pixel value downward gradient and region image center of gravity, determine plasma position parameter.
It is described by approximating method, establish full spectral coverage and pair with plasma position information in the range of LIBS spectra collections Functional relation is answered, is specially:
Calculate the intensity of spectral line under diverse location in the range of obtained LIBS spectral detection spectral coverages and, pass through ISUM=fSUM (h) corresponding relation of spectral coverage intensity and value and plasma position parameter, wherein f are fittedSUM(h) it is fitting function.
The expression way of the fitting function is as follows:
Wherein sgn () represent sign function, h be represent plasma position information parameter, h012It is to pass through plan Close the offset parameter and location parameter determined.
It is described by approximating method, it is corresponding with plasma position information to establish the specific characteristic spectral line intensity of LIBS spectrum Functional relation, it is specially:
Pass through Iλ=fλ(h) corresponding relation of each characteristic spectral line intensity and plasma position parameter, wherein f are determinedλ(h) For fitting function.
The expression way of the fitting function is as follows:
Wherein sgn () represent sign function, h be represent plasma position information parameter, h012It is to pass through plan Close the offset parameter and location parameter determined.
The expression way of the correction function is as follows:
Wherein, I 'λRepresent the intensity of spectral line after correction, IλIt is original the intensity of spectral line, ISUMIt is original spectral coverage intensity and fλ (h) fitting function for being the specific characteristic spectral line intensity of LIBS spectrum with the respective function relation of plasma position information, fSUM (h) it is full spectral coverage and the fitting function with the respective function relation of plasma position information in the range of LIBS spectra collections, its Middle h is the plasma position parameter by being extracted in Plasma picture, h0For fλ(h) h during maximum is obtained.
The present invention has advantages below and beneficial effect:
1. method proposed by the present invention, it is not required to detect wide spectrum to obtain spectroscopic data calculating plasma characteristic parameter, It is not required to shake to suppress spectrum by changing sample position, plasma position is extracted from the Plasma picture of synchronous acquisition Information, and directly correct spectral signal using mathematical modeling.
2. method proposed by the present invention, while characteristic spectral line is considered in itself with selected spectral coverage region entirety with sample position The fluctuation of change, built mathematical modeling is set to have taken into account full spectrum while by plasma position information correction spectral signal The advantages of method for normalizing.
3. model needed for method proposed by the present invention, it is not required to by testing strict limit as the positional information of independent variable System, can be extracted, the experimental implementation complexity for modeling is low from Plasma picture.
Brief description of the drawings
Fig. 1 is the inventive method implementation process figure;
Fig. 2 is the LIBS spectrum of specific region under different sample positions;
Fig. 3 is the Plasma picture under different sample positions;
Fig. 4 is the characteristic spectral line intensity level of five kinds of elements of Si, Fe, Cu, Mn and Mg in aluminum alloy sample with plasma position Put the matched curve of change;
Fig. 5 is that the characteristic spectral line after being corrected using the inventive method is directly marked with the characteristic spectral line after full spectrum normalization Fixed experimental result.
Embodiment
Below in conjunction with the accompanying drawings and example the present invention is described in further detail.
The present invention causes Laser Focusing depth different with spectrometer test position for testing sample position difference, and then produces The problem of third contact of a total solar or lunar eclipse spectrum shake, by Plasma picture, plasma position information is obtained, founding mathematical models are to different samples The spectroscopic data obtained under position is standardized, to realize the correction of spectroscopic data.
As shown in figure 1, method by LIBS experiment porch obtains spectroscopic data and Plasma picture after starting, from plasma Positional information is extracted in body image information, with reference to the intensity of individual features spectral line and spectral coverage, establishes model of fit, and by obtaining Fitting function spectrum to be analyzed is corrected.It is as follows to implement step:
Step 1:Obtain the LIBS spectral signals under sample different height (canonical correlation region LIBS spectrum are as shown in Figure 2) With corresponding Plasma picture signal (classicalpiston image is as shown in Figure 3), wherein different height of specimen pass through regulation Example platform is realized.
Step 2:Luminescence of plasma region is determined according to each pixel value in Plasma picture, according to light-emitting zone Pattern and pixel value determine plasma position.Setting pixel threshold first determines heating region, wiping out background noise;So Afterwards by calculate length-width ratio, in all directions pixel value downward gradient and region image center of gravity, determine that plasma position is joined Number.
Step 3:By approximating method, establish in the range of LIBS spectra collections full spectral coverage and with plasma position information Respective function relation.Calculate the intensity of spectral line under diverse location in the range of obtained LIBS spectral detection spectral coverages and, pass through ISUM= F (h) fits the corresponding relation of spectral coverage intensity and value and plasma position parameter.Wherein,
Sgn () represent sign function, h be represent plasma position information parameter, h012It is to be determined by being fitted Offset parameter and location parameter.
Step 4:For different characteristic spectral lines, by the fitting function of step 3, pass through Iλ=f (h) determines each characteristic spectral line The corresponding relation of intensity and plasma position parameter;
Step 5:The fitting function determined with reference to step 3, step 4, passes through plasma position information correction LIBS spectrum The collective model of signal.Specific correction function form is as follows:
Wherein, I 'λRepresent the intensity of spectral line after correction, IλIt is original the intensity of spectral line, ISUMIt is original spectral coverage intensity and fλ (h) be step 4 determine fitting function, fSUM(h) be step 3 determine fitting function, wherein h is by Plasma picture The plasma position parameter of extraction, h0For fλ(h) h during maximum is obtained.
Step 6:The model that applying step 5 the obtains LIBS spectrum unknown to height of specimen is analyzed and corrected.
The correction spectral line that method obtains, demarcation analysis is can be directly used for, can also be passed through as the input of complicated peg model Multivariable technique further improves quantitative (qualitative) analysis ability of LIBS.
It is corresponding to five kinds of elements of Si, Fe, Cu, Mn and Mg in 5 pieces of aluminum alloy samples that calibration model is established as stated above 5 characteristic spectral lines under the shake of 1mm sample positions the spectrum that gathers corrected, and entered using the intensity of spectral line after correction Direct demarcation is gone.Obtained matched curve is as shown in figure 4, specific fitting parameter value such as following table:
Using the result that the intensity of spectral line after correction is demarcated to concentration of element with being demarcated using full spectrum normalized intensity Result it is as shown in Figure 5.Wherein blue line corresponds to full spectral normalization method, and red line represents method proposed by the present invention.It is determined that it is Number (R2), relative standard deviation (RSD), the performance indications such as root-mean-square error (RMSE) all illustrate that this method can reach than full spectrum The contrast of the more preferable spectral line calibration result of method for normalizing, more specifically index see the table below:

Claims (8)

1. a kind of LIBS spectral correction methods based on plasma position information, it is characterised in that comprise the following steps:
Step 1:Obtain the LIBS spectral signals under sample different height and corresponding Plasma picture;
Step 2:The light-emitting zone of plasma is determined according to each pixel value in Plasma picture, according to light-emitting zone Pattern and pixel value determine plasma position;
Step 3:By approximating method, full spectral coverage and corresponding with plasma position information is established in the range of LIBS spectra collections Functional relation;Meanwhile by approximating method, establish pair of the specific characteristic spectral line intensity of LIBS spectrum and plasma position information Answer functional relation;
Step 4:The function obtained according to step 3, establish the correction function of plasma position information correction LIBS spectral signals;
Step 5:The correction function that applying step 4 the obtains LIBS spectrum unknown to height of specimen is corrected.
2. a kind of LIBS spectral correction methods based on plasma position information according to claim 1, its feature exist In step 1 obtains the LIBS spectrum of different height of specimen and corresponding Plasma picture, displacement by mobile example Judged by Plasma picture.
3. a kind of LIBS spectral correction methods based on plasma position information according to claim 1, its feature exist In the step 2 is specially:Setting pixel threshold first determines heating region, wiping out background noise;Then calculating is passed through The center of gravity of image, determines plasma position parameter in length-width ratio, all directions pixel value downward gradient and region.
4. a kind of LIBS spectral correction methods based on plasma position information according to claim 1, its feature exist In, it is described by approximating method, establish full spectral coverage and the corresponding letter with plasma position information in the range of LIBS spectra collections Number relation, it is specially:
Calculate the intensity of spectral line under diverse location in the range of obtained LIBS spectral detection spectral coverages and, pass through ISUM=fSUM(h) intend Close out the corresponding relation of spectral coverage intensity and value and plasma position parameter, wherein fSUM(h) it is fitting function.
5. a kind of LIBS spectral correction methods based on plasma position information according to claim 4, its feature exist In the expression way of the fitting function is as follows:
<mrow> <msub> <mi>f</mi> <mrow> <mi>S</mi> <mi>U</mi> <mi>M</mi> </mrow> </msub> <mrow> <mo>(</mo> <mi>h</mi> <mo>)</mo> </mrow> <mo>=</mo> <mfrac> <mn>1</mn> <mn>2</mn> </mfrac> <mrow> <mo>(</mo> <mi>sgn</mi> <mo>(</mo> <mrow> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> </mrow> <mo>)</mo> <mo>+</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>&amp;times;</mo> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mfrac> <msup> <mrow> <mo>(</mo> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>)</mo> </mrow> <mn>2</mn> </msup> <mrow> <mn>2</mn> <msubsup> <mi>&amp;sigma;</mi> <mn>1</mn> <mn>2</mn> </msubsup> </mrow> </mfrac> </mrow> </msup> <mo>+</mo> <mfrac> <mn>1</mn> <mn>2</mn> </mfrac> <mrow> <mo>(</mo> <mi>sgn</mi> <mo>(</mo> <mrow> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>-</mo> <mi>h</mi> </mrow> <mo>)</mo> <mo>+</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>&amp;times;</mo> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mfrac> <msup> <mrow> <mo>(</mo> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>)</mo> </mrow> <mn>2</mn> </msup> <mrow> <mn>2</mn> <msubsup> <mi>&amp;sigma;</mi> <mn>2</mn> <mn>2</mn> </msubsup> </mrow> </mfrac> </mrow> </msup> </mrow>
Wherein sgn () represent sign function, h be represent plasma position information parameter, h012It is true by being fitted Fixed offset parameter and location parameter.
6. a kind of LIBS spectral correction methods based on plasma position information according to claim 1, its feature exist In, it is described by approximating method, establish the respective function of the specific characteristic spectral line intensity of LIBS spectrum and plasma position information Relation, it is specially:
Pass through Iλ=fλ(h) corresponding relation of each characteristic spectral line intensity and plasma position parameter, wherein f are determinedλ(h) it is plan Close function.
7. a kind of LIBS spectral correction methods based on plasma position information according to claim 6, its feature exist In the expression way of the fitting function is as follows:
<mrow> <msub> <mi>f</mi> <mi>&amp;lambda;</mi> </msub> <mrow> <mo>(</mo> <mi>h</mi> <mo>)</mo> </mrow> <mo>=</mo> <mfrac> <mn>1</mn> <mn>2</mn> </mfrac> <mrow> <mo>(</mo> <mi>s</mi> <mi>g</mi> <mi>n</mi> <mo>(</mo> <mrow> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> </mrow> <mo>)</mo> <mo>+</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>&amp;times;</mo> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mfrac> <msup> <mrow> <mo>(</mo> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>)</mo> </mrow> <mn>2</mn> </msup> <mrow> <mn>2</mn> <msubsup> <mi>&amp;sigma;</mi> <mn>1</mn> <mn>2</mn> </msubsup> </mrow> </mfrac> </mrow> </msup> <mo>+</mo> <mfrac> <mn>1</mn> <mn>2</mn> </mfrac> <mrow> <mo>(</mo> <mi>s</mi> <mi>g</mi> <mi>n</mi> <mo>(</mo> <mrow> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>-</mo> <mi>h</mi> </mrow> <mo>)</mo> <mo>+</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>&amp;times;</mo> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mfrac> <msup> <mrow> <mo>(</mo> <mi>h</mi> <mo>-</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>)</mo> </mrow> <mn>2</mn> </msup> <mrow> <mn>2</mn> <msubsup> <mi>&amp;sigma;</mi> <mn>2</mn> <mn>2</mn> </msubsup> </mrow> </mfrac> </mrow> </msup> </mrow>
Wherein sgn () represent sign function, h be represent plasma position information parameter, h012It is true by being fitted Fixed offset parameter and location parameter.
8. a kind of LIBS spectral correction methods based on plasma position information according to claim 1, its feature exist In the expression way of the correction function is as follows:
<mrow> <msubsup> <mi>I</mi> <mi>&amp;lambda;</mi> <mo>&amp;prime;</mo> </msubsup> <mo>=</mo> <mfrac> <mrow> <msub> <mi>I</mi> <mi>&amp;lambda;</mi> </msub> <mo>&amp;CenterDot;</mo> <msub> <mi>f</mi> <mrow> <mi>S</mi> <mi>U</mi> <mi>M</mi> </mrow> </msub> <mrow> <mo>(</mo> <mi>h</mi> <mo>)</mo> </mrow> </mrow> <mrow> <msub> <mi>I</mi> <mrow> <mi>S</mi> <mi>U</mi> <mi>M</mi> </mrow> </msub> <mo>&amp;CenterDot;</mo> <msub> <mi>f</mi> <mrow> <mi>S</mi> <mi>U</mi> <mi>M</mi> </mrow> </msub> <mrow> <mo>(</mo> <msub> <mi>h</mi> <mn>0</mn> </msub> <mo>)</mo> </mrow> <mo>&amp;CenterDot;</mo> <msub> <mi>f</mi> <mi>&amp;lambda;</mi> </msub> <mrow> <mo>(</mo> <mi>h</mi> <mo>)</mo> </mrow> </mrow> </mfrac> </mrow>
Wherein, I 'λRepresent the intensity of spectral line after correction, IλIt is original the intensity of spectral line, ISUMIt is original spectral coverage intensity and fλ(h) it is The fitting function of the specific characteristic spectral line intensity of LIBS spectrum and the respective function relation of plasma position information, fSUM(h) it is Full spectral coverage and the fitting function with the respective function relation of plasma position information, wherein h are in the range of LIBS spectra collections By the plasma position parameter extracted in Plasma picture, h0For fλ(h) h during maximum is obtained.
CN201610819393.8A 2016-09-13 2016-09-13 A kind of LIBS spectral correction method based on plasma position information Active CN107817239B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610819393.8A CN107817239B (en) 2016-09-13 2016-09-13 A kind of LIBS spectral correction method based on plasma position information

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610819393.8A CN107817239B (en) 2016-09-13 2016-09-13 A kind of LIBS spectral correction method based on plasma position information

Publications (2)

Publication Number Publication Date
CN107817239A true CN107817239A (en) 2018-03-20
CN107817239B CN107817239B (en) 2019-06-18

Family

ID=61601370

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610819393.8A Active CN107817239B (en) 2016-09-13 2016-09-13 A kind of LIBS spectral correction method based on plasma position information

Country Status (1)

Country Link
CN (1) CN107817239B (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110751048A (en) * 2019-09-20 2020-02-04 华中科技大学 Laser probe classification method and device based on image characteristic automatic spectral line selection
CN111272735A (en) * 2020-03-26 2020-06-12 中国科学院空天信息创新研究院 Detection method of laser-induced breakdown spectroscopy
CN111289496A (en) * 2020-03-26 2020-06-16 中国科学院空天信息创新研究院 Detection method and device for long-distance zoom laser-induced breakdown spectroscopy
CN112611744A (en) * 2020-12-11 2021-04-06 中国海洋大学 Underwater LIBS spectrum correction method based on sound wave signals
CN113624746A (en) * 2021-08-05 2021-11-09 合肥金星机电科技发展有限公司 LIBS spectrum drift online correction method and system
CN113624745A (en) * 2021-07-01 2021-11-09 清华大学 Method for improving long-term stability of laser-induced breakdown spectroscopy based on light spots
CN114894781A (en) * 2022-05-25 2022-08-12 中国海洋大学 Underwater LIBS spectrum standardization generalization method and system based on external signal
WO2023221282A1 (en) * 2022-05-18 2023-11-23 合肥金星智控科技股份有限公司 Model correction method, spectroscopy device, computer device, and storage medium

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030234928A1 (en) * 2002-06-24 2003-12-25 Lucas John M. Method and apparatus for molten material analysis by laser induced breakdown spectroscopy
CN101089612A (en) * 2007-07-06 2007-12-19 中国科学院上海技术物理研究所 Laser induction atomic emission spectrum investigating system and method of time resolution
CN101750401A (en) * 2008-12-12 2010-06-23 中国科学院沈阳自动化研究所 Method for automatically correcting laser induced plasma emission spectrum continuous background interference
CN102313731A (en) * 2010-07-09 2012-01-11 中国科学院沈阳自动化研究所 Method for detecting content of component in unknown object on line
CN103983619A (en) * 2014-05-16 2014-08-13 四川大学 Spatial resolution laser-induced breakdown spectroscopy analysis system and spatial resolution laser-induced breakdown spectroscopy analysis method
CN104345049A (en) * 2013-08-09 2015-02-11 中国科学院沈阳自动化研究所 Threshold correction method applied to wavelet threshold noise reduction of laser-induced breakdown spectroscopy
WO2015077867A1 (en) * 2013-11-26 2015-06-04 National Research Council Of Canada Method and apparatus for fast quantitative analysis of a material by laser induced breakdown spectroscopy (libs)
CN104730042A (en) * 2015-03-10 2015-06-24 西北大学 Method for improving free calibration analysis precision by combining genetic algorithm with laser induced breakdown spectroscopy
US20150346103A1 (en) * 2014-05-29 2015-12-03 Bwt Property, Inc. Laser Induced Breakdown Spectroscopy (LIBS) Apparatus and Method for Performing Spectral Imaging of a Sample Surface
US20160069745A1 (en) * 2014-09-05 2016-03-10 Bwt Property, Inc. Laser Induced Breakdown Spectroscopy (LIBS) Apparatus Based on High Repetition Rate Pulsed Laser

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030234928A1 (en) * 2002-06-24 2003-12-25 Lucas John M. Method and apparatus for molten material analysis by laser induced breakdown spectroscopy
CN101089612A (en) * 2007-07-06 2007-12-19 中国科学院上海技术物理研究所 Laser induction atomic emission spectrum investigating system and method of time resolution
CN101750401A (en) * 2008-12-12 2010-06-23 中国科学院沈阳自动化研究所 Method for automatically correcting laser induced plasma emission spectrum continuous background interference
CN102313731A (en) * 2010-07-09 2012-01-11 中国科学院沈阳自动化研究所 Method for detecting content of component in unknown object on line
CN104345049A (en) * 2013-08-09 2015-02-11 中国科学院沈阳自动化研究所 Threshold correction method applied to wavelet threshold noise reduction of laser-induced breakdown spectroscopy
WO2015077867A1 (en) * 2013-11-26 2015-06-04 National Research Council Of Canada Method and apparatus for fast quantitative analysis of a material by laser induced breakdown spectroscopy (libs)
CN103983619A (en) * 2014-05-16 2014-08-13 四川大学 Spatial resolution laser-induced breakdown spectroscopy analysis system and spatial resolution laser-induced breakdown spectroscopy analysis method
US20150346103A1 (en) * 2014-05-29 2015-12-03 Bwt Property, Inc. Laser Induced Breakdown Spectroscopy (LIBS) Apparatus and Method for Performing Spectral Imaging of a Sample Surface
US20160069745A1 (en) * 2014-09-05 2016-03-10 Bwt Property, Inc. Laser Induced Breakdown Spectroscopy (LIBS) Apparatus Based on High Repetition Rate Pulsed Laser
CN104730042A (en) * 2015-03-10 2015-06-24 西北大学 Method for improving free calibration analysis precision by combining genetic algorithm with laser induced breakdown spectroscopy

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
J.A. AGUILERA.ETAL: "Study of matrix effects in laser induced breakdown spectroscopy on metallic samples using plasma characterization by emission spectroscopy", 《SPECTROCHIMICA ACTA PART B》 *
LANXIANG SUN.ETAL: "Correction of self-absorption effect in calibration-free laser-induced breakdown spectroscopy by an internal reference method", 《TALANTA》 *
ZHI-BO NI.ETAL: "Study on quantitative analysis of slag based on spectral normalization of laser-induced plasma image", 《RESEARCH ARTICLE》 *
孙兰香等: "通过二次回归正交设计对激光诱导击穿光谱实验参数优化建模", 《光学学报》 *

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110751048A (en) * 2019-09-20 2020-02-04 华中科技大学 Laser probe classification method and device based on image characteristic automatic spectral line selection
CN110751048B (en) * 2019-09-20 2022-06-14 华中科技大学 Laser probe classification method and device based on image characteristic automatic spectral line selection
CN111272735A (en) * 2020-03-26 2020-06-12 中国科学院空天信息创新研究院 Detection method of laser-induced breakdown spectroscopy
CN111289496A (en) * 2020-03-26 2020-06-16 中国科学院空天信息创新研究院 Detection method and device for long-distance zoom laser-induced breakdown spectroscopy
CN111272735B (en) * 2020-03-26 2023-06-30 中国科学院空天信息创新研究院 Detection method of laser-induced breakdown spectroscopy
CN111289496B (en) * 2020-03-26 2023-05-19 中国科学院空天信息创新研究院 Detection method and device for long-distance zoom laser-induced breakdown spectroscopy
CN112611744B (en) * 2020-12-11 2021-12-10 中国海洋大学 Underwater LIBS spectrum correction method based on sound wave signals
CN112611744A (en) * 2020-12-11 2021-04-06 中国海洋大学 Underwater LIBS spectrum correction method based on sound wave signals
CN113624745A (en) * 2021-07-01 2021-11-09 清华大学 Method for improving long-term stability of laser-induced breakdown spectroscopy based on light spots
CN113624746B (en) * 2021-08-05 2022-09-30 合肥金星智控科技股份有限公司 LIBS spectral drift online correction method and system
CN113624746A (en) * 2021-08-05 2021-11-09 合肥金星机电科技发展有限公司 LIBS spectrum drift online correction method and system
WO2023221282A1 (en) * 2022-05-18 2023-11-23 合肥金星智控科技股份有限公司 Model correction method, spectroscopy device, computer device, and storage medium
CN114894781A (en) * 2022-05-25 2022-08-12 中国海洋大学 Underwater LIBS spectrum standardization generalization method and system based on external signal

Also Published As

Publication number Publication date
CN107817239B (en) 2019-06-18

Similar Documents

Publication Publication Date Title
CN107817239A (en) A kind of LIBS spectral correction methods based on plasma position information
Wang et al. Multicolor light curves of Type Ia supernovae on the color-magnitude diagram: A novel step toward more precise distance and extinction estimates
CN104897607B (en) Portable near infrared spectrum food modeling and quick detection integral method and system
Wang et al. The Grism Lens-amplified Survey from Space (GLASS). X. Sub-kiloparsec resolution gas-phase metallicity maps at cosmic noon behind the hubble frontier fields cluster MACS1149. 6+ 2223
El Haddad et al. Application of a series of artificial neural networks to on-site quantitative analysis of lead into real soil samples by laser induced breakdown spectroscopy
Lemaux et al. The Origin of [O II] in Post-starburst and Red-sequence Galaxies in High-redshift Clusters
CN104677875B (en) A kind of three-dimensional fluorescence spectrum combines the method that parallel factor differentiates different brands Chinese liquor
CN110174359B (en) Aviation hyperspectral image soil heavy metal concentration assessment method based on Gaussian process regression
CN104634745B (en) spectral reconstruction method
Motto-Ros et al. Critical aspects of data analysis for quantification in laser-induced breakdown spectroscopy
Yenisoy-Karakaş Estimation of uncertainties of the method to determine the concentrations of Cd, Cu, Fe, Pb, Sn and Zn in tomato paste samples analysed by high resolution ICP-MS
Dominguez et al. Application of digital images to determine color in honey samples from Argentina
US10309831B2 (en) Dynamic calibration method for echelle spectrometer in laser-induced breakdown spectroscopy
CN108956583A (en) Characteristic spectral line automatic selecting method for laser induced breakdown spectroscopy analysis
CN106841083A (en) Sesame oil quality detecting method based on near-infrared spectrum technique
CN109001218A (en) Apple surface defect quick nondestructive recognition methods based on high light spectrum image-forming technology
WO2004092703A3 (en) Process and apparatus for segregation and testing by spectral analysis of solid deposits derived from liquid mixtures
CN104730042A (en) Method for improving free calibration analysis precision by combining genetic algorithm with laser induced breakdown spectroscopy
De Godoy et al. Quantitative analysis by comprehensive two-dimensional gas chromatography using interval Multi-way Partial Least Squares calibration
Bogdal et al. Recognition of gasoline in fire debris using machine learning: Part II, application of a neural network
CN103105369A (en) Quantitative liquid analysis method by spectrum baseline correction
Wu et al. Geographical origin traceability and authenticity detection of Chinese red wines based on excitation-emission matrix fluorescence spectroscopy and chemometric methods
KR20200025687A (en) System and method for measuring environmental pollutants or disease tracers using smart device
CN108827909A (en) Soil rapid classification method based on visible and near infrared spectrum and multiple targets fusion
CN106198433B (en) Infrared spectroscopy method for qualitative analysis based on LM-GA algorithm

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant