CN107749538B - Interface end test assembly and interface end test device - Google Patents

Interface end test assembly and interface end test device Download PDF

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Publication number
CN107749538B
CN107749538B CN201711105692.6A CN201711105692A CN107749538B CN 107749538 B CN107749538 B CN 107749538B CN 201711105692 A CN201711105692 A CN 201711105692A CN 107749538 B CN107749538 B CN 107749538B
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CN
China
Prior art keywords
probe
guide
interface
interface end
block
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Active
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CN201711105692.6A
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CN107749538A (en
Inventor
吴峰
刘海波
曹庆龙
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Testron Technology Jiangsu Co ltd
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Testron Technology Jiangsu Co ltd
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Priority to CN201711105692.6A priority Critical patent/CN107749538B/en
Publication of CN107749538A publication Critical patent/CN107749538A/en
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Publication of CN107749538B publication Critical patent/CN107749538B/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/629Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
    • H01R13/631Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for engagement only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46Bases; Cases
    • H01R13/502Bases; Cases composed of different pieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes

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  • Measuring Leads Or Probes (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

The invention belongs to the field of computer testing, and discloses an interface end testing assembly and an interface end testing device. The interface end test assembly comprises a probe end, an interface end and a guide module, wherein the probe end is provided with a probe, the interface end is provided with a containing cavity, a supporting block is convexly arranged in the containing cavity, a probe hole matched with the probe is formed in the supporting block, a guide channel arranged on the guide module is used for containing the probe, and the cross section of the guide channel is consistent with the cross section of the supporting block. When the guide module is matched with the accommodating cavity, the supporting block is inserted into the guide channel, the probe is accommodated in the probe hole, communication between the probe and the terminal of the interface end is realized, normal conduction of signals is ensured when the probe end is inserted into the interface end, and the problem of misdetection caused by poor contact between the probe and the terminal of the interface end due to deflection of the probe in the traditional design is avoided.

Description

Interface end test assembly and interface end test device
Technical Field
The present invention relates to the field of computer testing, and in particular, to an interface testing assembly and an interface testing device.
Background
VGA (Video Graphics Array ) is a video transmission standard using analog signals, and correspondingly, the VGA interface end is a special interface end for transmitting data through the VGA standard, and normally the VGA interface end is spliced with a corresponding probe to realize signal conduction.
The current VGA interface end is usually provided with and holds the chamber, holds the protruding supporting shoe that is equipped with in chamber inside, is provided with on the supporting shoe with wait to connect the probe shape and arrange looks adaptation connecting hole, the probe is linked together with the terminal of VGA interface end inside through the connecting hole, realizes switching on of signal. Can realize effectual protection to the probe through setting up the supporting shoe, make VGA interface end and probe at the in-process of pegging graft, the probe can not take place to warp.
The traditional supporting block is made of plastic, if any one of the VGA interface end and the probe deflects in the plugging process, the probe can be inserted into the supporting block, so that the probe cannot be communicated with a terminal inside the VGA interface end, or adjacent probes are contacted, and short circuit of signals occurs.
Disclosure of Invention
The invention aims to provide an interface end testing assembly and an interface end testing device, which are used for solving the problem that a probe end is easy to plug on a supporting block and ensuring normal conduction of signals when the probe end is plugged with the interface end.
The technical scheme adopted by the invention is as follows:
an interface end test assembly comprising:
the probe end is provided with a probe;
the interface end is provided with a containing cavity, a supporting block is convexly arranged in the containing cavity, and a probe hole matched with the probe is formed in the supporting block; and
the guide module is provided with a guide channel, the probe is positioned in the guide channel, the cross section of the guide channel is the same as that of the supporting block, the guide module is matched with the accommodating cavity, the supporting block can be inserted into the guide channel, the probe is accommodated in the probe hole, and the probe is communicated with a terminal at the interface end.
Further, the guide module includes:
a guide block; and
the connecting plate is connected with the guide block and is connected with the probe end.
Further, the guide channel includes:
the first guide channel is arranged on the guide block;
the second guide channel is arranged on the guide block and is communicated with the side part of the first guide channel.
Further, a third guide channel is formed in the connecting plate and is communicated with the second guide channel, and the probe penetrates through the third guide channel and is located in the second guide channel.
Further, the guide module is characterized in that the guide module is made of polyoxymethylene resin.
Further, the method further comprises the following steps:
the displacement module, one of the probe end and the interface end is a first end part, the other is a second end part, the first end part is arranged on the displacement module, the displacement module is connected with a first part to be installed, the second end part is fixed on a second part to be installed, and the displacement module can enable the first end part to move relative to the first part to be installed and enable the first end part to be inserted into the second end part.
Further, the displacement module includes:
a fixed block coupled to the first end piece;
the connecting piece passes through the fixed block, the connecting piece includes:
a guide part;
the thread part is arranged at one end of the guide part and is connected with the first part to be installed;
and
the limiting part is arranged at the other end of the guide part and can be blocked with the fixed block to prevent the fixed block from falling off from the connecting piece; and
and the elastic part is sleeved on the guide part and positioned between the fixed block and the first part to be installed, so that the fixed block and the first part to be installed can move relatively.
Further, a first hole and a second hole which are communicated are formed in the fixed block, the guide part penetrates through the second hole, and the limiting part is accommodated in the first hole; gaps are arranged between the guide part and the wall of the second hole and between the limit part and the wall of the first hole; and two ends of the elastic part are respectively abutted against the first part to be installed and the fixed block.
Further, the elastic component is a spring or a rubber block.
An interface testing device comprising an interface testing assembly according to any one of the preceding claims.
The beneficial effects of the invention are as follows:
the interface end testing assembly comprises a probe end, an interface end and a guiding module, wherein the probe end is provided with a probe, the interface end is provided with a containing cavity, a supporting block is convexly arranged in the containing cavity, a probe hole matched with the probe is formed in the supporting block, a guiding channel is arranged on the guiding module and used for containing the probe, and the cross section of the guiding channel is consistent with that of the supporting block. When the guide module is matched with the accommodating cavity, the supporting block is inserted into the guide channel, the probe is accommodated in the probe hole, communication between the probe and the terminal of the interface end is realized, normal conduction of signals is ensured when the probe end is inserted into the interface end, and the problem of misdetection caused by poor contact between the probe and the terminal of the interface end due to deflection of the probe in the traditional design is avoided.
Drawings
FIG. 1 is a schematic diagram of an assembly structure of an interface end testing assembly provided by the present invention;
FIG. 2 is an exploded view of one orientation of the interface end test assembly provided by the present invention;
FIG. 3 is an exploded view of another orientation of the interface end test assembly provided by the present invention;
FIG. 4 is a schematic view of a guide module according to the present invention;
FIG. 5 is a cross-sectional view taken along the direction A-A of FIG. 1;
FIG. 6 is a schematic view of the structure of the fixing block according to the present invention;
FIG. 7 is a schematic view of a structure of a connector and an elastic member according to the present invention;
fig. 8 is a schematic structural diagram of an interface terminal provided by the present invention.
In the figure:
1. an interface end; 2. a guide module; 3. a probe end; 4. a displacement module; 5. a first part to be mounted; 6. a second component to be mounted;
11. a receiving chamber; 12. a support block; 21. a guide channel; 22. a connecting plate; 23. a guide block; 31. a probe; 41. a fixed block; 42. a connecting piece; 43. an elastic member;
121. a probe hole; 122. a first support block; 123. a second support block; 211. a first guide channel; 212. a second guide channel; 221. a third guide channel; 411. a stepped hole; 421. a limit part; 422. a guide part; 423. a threaded portion; 4111. a first hole; 4112. and a second hole.
Detailed Description
In order to make the technical problems solved, the technical scheme adopted and the technical effects achieved by the invention more clear, the technical scheme of the invention is further described below by a specific embodiment in combination with the attached drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the drawings related to the present invention are shown.
As shown in fig. 1-3, the interface end 1 testing component provided in this embodiment includes a probe end 3, an interface end 1 and a guiding module 2, the probe end 3 is provided with a probe 31, as shown in fig. 8, the interface end 1 is provided with a containing cavity 11, a supporting block 12 is convexly arranged in the containing cavity 11, a probe hole 121 adapted to the probe 31 is formed in the supporting block 12, a guiding channel 21 arranged on the guiding module 2 is used for containing the probe 31, and the cross section of the guiding channel 21 is consistent with the cross section of the supporting block 12. The guide module 2 is matched with the accommodating cavity 11, so that the supporting block 12 is inserted into the guide channel 21, the probe 31 is accommodated in the probe hole 121, communication between the probe 31 and the terminal of the interface end 1 is realized, normal conduction of signals is ensured when the probe end 3 is inserted into the interface end 1, the problem that poor contact between the probe 31 and the terminal of the interface end 1 is caused due to the fact that the probe 31 is pricked and deviated in the traditional design is avoided, and accuracy of a test result is ensured.
In this embodiment, as shown in fig. 4, the guide module 2 is composed of two parts, namely, a guide block 23 and a connection plate 22, the connection plate 22 is connected to the guide block 23, and the connection plate 22 is connected to the probe end 3 by a fastener such as a bolt and is fixed to the probe end 3.
Specifically, the guide passage 21 includes a first guide passage 211, a second guide passage 212, and a third guide passage 221 opened on the guide block 23, wherein the second guide passage 212 communicates with the side of the first guide passage 211. The first guide channel 211 is matched with the supporting block 12 in the interface end 1, the cross section of the second guide channel 212 is in a long strip shape, the supporting block 12 comprises a first supporting block 122 matched with the shape of the first guide channel 211 and a second supporting block 123 matched with the shape of the second guide channel 212, when the guide module 2 is plugged with the interface end 1, the first supporting block 122 is positioned in the first guide channel 211, meanwhile, the second guide channel 212 wrapped with the probe 31 is also plugged with the second supporting block 123, and through the cooperation of the second guide channel 212 and the second supporting block 123, the accurate positioning of the guide module 2 and the interface end 1 during plugging can be realized, and the accurate plugging of the guide module 2 and the interface end 1 is further realized. The connecting plate 22 is provided with a third guide channel 221 which is matched with the shape and the position of the probe 31, and the third guide channel 221 is communicated with the second guide channel 212, so that the function that the probe 31 passes through the third guide channel 221 and is accommodated in the second guide channel 212 is realized.
The test assembly for the interface terminal 1 according to this embodiment further includes a displacement module 4, where one of the probe terminal 3 and the interface terminal 1 is used as a first end component, the other is used as a second end component, the first end component is connected with the displacement module 4, the displacement module 4 is mounted on the first part 5 to be mounted, the second end component is mounted on the second part 6 to be mounted, the displacement module 4 can enable the first end component to move relative to the first part 5 to be mounted, and the first end component and the second end component to be plugged into each other, specifically, in this embodiment, the probe terminal 3 is correspondingly used as the first end component, the interface terminal 1 is used as the second end component, the interface terminal 1 is connected to the second part 6 to be mounted, the probe terminal 3 is connected with the displacement module 4, the displacement module 4 is connected with the first part 5 to be mounted, and the displacement module 4 can enable the probe terminal 3 to move relative to the first part 5 to be mounted, and can enable the probe terminal 3 to be connected with the interface terminal 1.
Specifically, the displacement module 4 shown in fig. 1, 3 and 5 includes a fixed block 41, a connecting member 42 and an elastic member 43. In the present embodiment, the displacement module 4 includes four connectors 42, four elastic members 43, and four fasteners for fixing the guide module 2. Wherein, the connecting piece 42 (may be a contour screw) passes through the fixing block 41, and as shown in fig. 7, the connecting piece includes a threaded portion 423, a guiding portion 422 and a limiting portion 421 which are sequentially connected from bottom to top, the threaded portion 423 is connected with the first component 5 to be installed, the limiting portion 421 is used for preventing the fixing block 41 from falling off from the connecting piece 42, and an elastic component 43 is sleeved on the guiding portion 422 and located between the fixing block 41 and the first component 5 to be installed, so as to realize the relative movement between the fixing block 41 and the first component 5 to be installed. Specifically, as shown in fig. 5, when the interface end 1 abuts against the right side of the guide channel 21, the two elastic components 43 located on the same side of the right side guide module 2 are subjected to pressure, so that the guide module 2 and the probe end 3 incline, the guide module 2 smoothly slides into the accommodating cavity 11 of the interface end 1, so that the supporting block 12 is inserted into the guide channel 21, the accurate abutting joint of the interface end 1 and the probe 31 is realized, the problem of misdetection caused by poor contact between the probe 31 and the terminal of the interface end 1 due to the pricking deviation of the probe 31 is solved, and the problem of test efficiency is improved.
Specifically, in the present embodiment, as shown in fig. 6, four stepped holes 411 are formed in a plane of the fixing block 41 opposite to the first part to be mounted 5, the stepped holes 411 include a first hole 4111 and a second hole 4112, the number of the stepped holes 411 corresponds to the number of the connecting pieces 42, the limiting portions 421 of the connecting pieces 42 are accommodated in the first hole 4111 to prevent the fixing block 41 from falling off from the connecting pieces 42, the guiding portions 422 of the connecting pieces 42 are provided in the second hole 4112, and a gap exists between the guiding portions 422 and the second hole 4112, each connecting piece 42 passes through one corresponding stepped hole 411, and after the connecting piece passes through the fixing block 41 and is connected to the first part to be mounted 5, one end of each elastic piece 43 abuts against the fixing block 41, and the other end abuts against the first part to be mounted 5. The elastic component 43 can realize the function of supporting the fixed block 41 away from the first component 5 to be installed for a certain distance in a natural state, when the interface end 1 fixed on the second component 6 to be installed is stressed, the fixed block 41 is driven to extrude the elastic component 43 at different positions to different degrees, and further, the deflection of the port of the stepped hole 411 of the fixed block 41 relative to the first component 5 to be installed is realized, the deflection can be at least decomposed into a displacement component in the horizontal direction, and further, the support block 12 of the interface end 1 can smoothly slide into the guide channel 21, so that the accurate butt joint with the probe 31 is realized. In addition, a stepped hole 411 may be formed on the fixed block 41, a connecting piece 42 is inserted through the fixed block 41, and an elastic component 43 is placed between the fixed block 41 and the first component 5 to be mounted, and because the extrusion forces of the elastic component 43 received in different directions are different, the port of the stepped hole 411 of the fixed block 41 can be deflected relative to the first component 5 to be mounted, but the effect is not as good as that of setting four elastic components 43, and the number of the elastic components 43, the stepped hole 411 and the connecting component can be one, two or more. Specifically, the elastic member 43 may be selected from a spring or a rubber block, and the spring is most effective.
In this embodiment, the guiding module 2 may be made of polyoxymethylene resin, which has the advantage of good self-lubricity, so that when the interface end 1 is plugged with the guiding module 2, the guiding module 2 can easily slide into the accommodating cavity 11 of the interface end 1, and the supporting block 12 can easily slide into the guiding channel 21, so as to realize plugging between the interface end 1 and the guiding module 2.
In this embodiment, an interface testing device is further provided, where the interface testing device includes the above-mentioned interface testing component, so as to solve the problem that accurate docking between the interface and the probe is difficult to achieve, and a lot of manpower and time are consumed, which is not beneficial to the detection efficiency of the interface.
The above embodiments merely illustrate the basic principle and features of the present invention, and the present invention is not limited to the above embodiments, but may be varied and altered without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (8)

1. An interface end test assembly, comprising:
a probe end (3) provided with a probe (31);
the interface end (1) is provided with a containing cavity (11), a supporting block (12) is convexly arranged in the containing cavity (11), and a probe hole (121) matched with the probe (31) is formed in the supporting block (12); and
the guide module (2) is provided with a guide channel (21), the probe (31) is positioned in the guide channel (21), the cross section of the guide channel (21) is the same as that of the supporting block (12), the guide module (2) is matched with the accommodating cavity (11), the supporting block (12) can be inserted into the guide channel (21), and the probe (31) is accommodated in the probe hole (121), so that the probe (31) is communicated with a terminal of the interface end (1);
the guide module (2) is made of polyoxymethylene resin;
further comprises:
the probe end (3) and one of the interface ends (1) are first end parts, the other one is a second end part, the first end part is arranged on the displacement module (4), the displacement module (4) is connected with a first part (5) to be installed, the second end part is fixed on a second part (6) to be installed, and the displacement module (4) can enable the first end part to move relative to the first part (5) to be installed and enable the first end part to be inserted into the second end part.
2. Interface end test assembly according to claim 1, characterized in that the guiding module (2) comprises:
a guide block (23); and
the connecting plate (22) is connected with the guide block (23), and the connecting plate (22) is connected with the probe end (3).
3. The interface end test assembly according to claim 2, wherein the guide channel (21) comprises:
a first guide channel (211) which is arranged on the guide block (23);
and the second guide channel (212) is arranged on the guide block (23) and is communicated with the side part of the first guide channel (211).
4. A testing module according to claim 3, wherein the connection board (22) is provided with a third guiding channel (221) and is in communication with the second guiding channel (212), and the probe (31) passes through the third guiding channel (221) and is located in the second guiding channel (212).
5. The interface end test assembly according to claim 1, wherein the displacement module (4) comprises:
a fixed block (41) connected to the first end piece;
-a connecting piece (42) passing through the fixed block (41), the connecting piece (42) comprising:
a guide part (422);
a screw part (423) provided at one end of the guide part (422) and connected to the first component (5) to be mounted; and
a limiting part (421) which is arranged at the other end of the guiding part (422) and can be blocked and abutted with the fixed block (41) to prevent the fixed block (41) from falling off from the connecting piece (42); and
the elastic component (43) is sleeved on the guide part (422) and is positioned between the fixed block (41) and the first part to be mounted (5), so that the fixed block (41) and the first part to be mounted (5) can move relatively.
6. The interface end test assembly according to claim 5, wherein the fixing block (41) is provided with a first hole (4111) and a second hole (4112) which are communicated, the guide part (422) passes through the second hole (4112), and the limiting part (421) is accommodated in the first hole (4111); gaps are arranged between the guide part (422) and the wall of the second hole (4112) and between the limit part (421) and the wall of the first hole (4111); both ends of the elastic component (43) are respectively abutted against the first component (5) to be mounted and the fixed block (41).
7. The interface end test assembly of claim 6, wherein the resilient member (43) is a spring or a rubber block.
8. An interface testing device comprising an interface testing assembly according to any one of claims 1 to 7.
CN201711105692.6A 2017-11-10 2017-11-10 Interface end test assembly and interface end test device Active CN107749538B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10239377A (en) * 1997-02-24 1998-09-11 Sumitomo Wiring Syst Ltd Autolock system electric continuity inspection unit
CN104535916A (en) * 2014-11-26 2015-04-22 重庆长野汽车配件有限公司 Circuit board testing tool
CN105527465A (en) * 2014-09-30 2016-04-27 泰科电子(上海)有限公司 Connector testing socket and connector testing device
CN207705497U (en) * 2017-11-10 2018-08-07 江苏特创科技有限公司 A kind of interface end test suite and interface end test device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203337694U (en) * 2013-05-27 2013-12-11 深圳市策维科技有限公司 Test probe

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10239377A (en) * 1997-02-24 1998-09-11 Sumitomo Wiring Syst Ltd Autolock system electric continuity inspection unit
CN105527465A (en) * 2014-09-30 2016-04-27 泰科电子(上海)有限公司 Connector testing socket and connector testing device
CN104535916A (en) * 2014-11-26 2015-04-22 重庆长野汽车配件有限公司 Circuit board testing tool
CN207705497U (en) * 2017-11-10 2018-08-07 江苏特创科技有限公司 A kind of interface end test suite and interface end test device

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