CN107677850A - A kind of method using graphene coated atomic force microscope probe needle point - Google Patents
A kind of method using graphene coated atomic force microscope probe needle point Download PDFInfo
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- CN107677850A CN107677850A CN201711105714.9A CN201711105714A CN107677850A CN 107677850 A CN107677850 A CN 107677850A CN 201711105714 A CN201711105714 A CN 201711105714A CN 107677850 A CN107677850 A CN 107677850A
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- atomic force
- force microscope
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- container
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
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- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Carbon And Carbon Compounds (AREA)
Abstract
The present invention relates to a kind of method using graphene coated atomic force microscope probe needle point, including：1) atomic force microscope probe to be covered is placed in container bottom, injects deionized water into the container；2) by the film floating for being attached with graphene on the deionization water surface, the one of attachment graphene is made facing to container bottom；3) extract deionized water out from the container, the film for being attached with graphene is covered on the needle point of atomic force microscope probe；4) with solvent by the Film Fractionation, then after cleaning probe with deionized water, dry.Probe tip graphene coated made from this method is close, uniform, and graphene thickness is adjustable, probe tip service life length；Large-scale production can be realized, and is advantageous to reduce error.
Description
Technical field
The present invention relates to AFM field, and in particular to a kind of atomic force that can prepare graphene coated on a large scale
The method of tip of scanning microscopy.
Background technology
Chemical composition and its shape of atomic force microscope probe needle point etc. directly have impact on Shape measure quality and with
The repeatability and reliability of upper various mechanics images.Atomic force microscope probe needle point during transport and storage easily by
To some organic and inorganic substances pollutions.Also pole when needle point is exposed to common indoor environment in short time or after detection use
It is vulnerable to the pollution of exogenous impurity.Therefore, the clean of needle point is kept in the preparation of probe and follow-up transport and storing process
Only just seem very significant.
The method of coated graphite alkene on atomic force microscope probe needle point being currently known, such as infusion process, transfer method,
The shortcomings of needle point cladding impurity is excessive, can not prepare on a large scale be present.
The content of the invention
The shortcomings that single atomic force microscope probe needle point is coated is only limitted to for prior art (such as transfer method),
The invention provides a kind of method that can prepare graphene coated atomic force microscope probe needle point on a large scale.
Technical solution of the present invention is as follows：
A kind of method using graphene coated atomic force microscope probe needle point, comprise the following steps：
1) atomic force microscope probe to be covered is placed in container bottom, deionized water is injected into the container, with complete
The probe is submerged entirely to be defined；
2) by the film floating for being attached with graphene on the deionization water surface, the one of attachment graphene is made facing to container bottom
Portion (i.e. towards the probe)；
3) extract deionized water out from the container, the film for being attached with graphene is covered in atomic force microscope probe
Needle point on；
4) with solvent by the Film Fractionation, then after cleaning probe with deionized water, dry.
Further, the container can use sealable glass container.
Further, the film can by PMMA (polymethyl methacrylate), PolyCarbonate (makrolon),
Any of Cellulose acetate (cellulose acetate), Thermal release tape (hot stripping tape) etc. material
Material is made.
Further, single or multiple lift graphene is attached with the membrane, is preferably attached with single-layer graphene.Research
It was found that under this condition, preferably covered effect can be obtained.
Further, step 3) extracts deionized water out using vacuum system, until the step terminates.
When water is taken out it is most when, continue to vacuumize, be extracted into whole process always and terminate.Research is found, under this condition, can be made
The film for being attached with graphene is closely covered on the needle point of atomic force microscope probe.
Further, the step 4) solvent can use acetone, dimethoxym ethane, dichloromethane, chloroform, DMF
One or more in.
Further, the material of the atomic force microscope probe can be the available any materials in this area such as Si, Pt, visit
Needle tip coating can be metal material or the diamonds such as Pt, Pt-Ir, Ti-Pt, Co-Cr, Cr-Pt.It is conventional that Fig. 4 lists some
Atomic force microscope probe.
Present invention additionally comprises graphene coated atomic force microscope probe made from the above method.
Further, the graphene coated on the atomic force microscope probe needle point is single or multiple lift.
Atomic force microscope probe needle point graphene coated made from the inventive method is close, uniform, and graphene thickness can
Adjust, probe tip service life length.
The present invention also provides a kind of device for being used to realize the above method, including：Container, vacuum system and cleaning device,
The container is connected with the vacuum system.
The inventive method does not damage needle point structure, does not influence the use of needle point, retains the good imaging of needle point and measurement work(
Energy.The inventive method is simple to operation, and material therefor is easy to get, and cost is low；It especially can be achieved on extensive, batch to coat, pole
The earth improves production efficiency, and is advantageous to reduce error.
Brief description of the drawings
Fig. 1-Fig. 3 is the inventive method and equipment therefor schematic diagram.
In figure：1st, container；2nd, graphene；3rd, deionized water；4th, atomic force microscope probe needle point；5th, valve；6th, vacuum
System；7th, liquid level；8th, film.
Fig. 4 is some conventional atomic force microscope probes suitable for the present invention.
Embodiment
Following examples are used to illustrate the present invention, but are not limited to the scope of the present invention.It is unreceipted specific in embodiment
Technology or condition person, carried out according to the technology or condition described by document in the art, or according to product description.It is used
Reagent or the unreceipted production firm person of instrument, it is the conventional products that can be commercially available by regular distributor.
Embodiment 1
Exemplified by carrying out graphene coated simultaneously to the needle point of 12 atomic force microscope probes.
As illustrated in fig. 1 and 2, when valve 5 and vacuum system 6 are closed, AFM to be covered is visited
Pin is placed on the bottom of container (such as glassware) 1, injects deionized water into the container；The PMMA for being attached with graphene 2 is thin
Film 8 is swum on the deionization water surface, makes the one of attachment graphene facing to container bottom (i.e. towards the probe).
Valve 5 and vacuum system 6 are opened, deionized water is slowly extracted out from the container side bottom (close to bottom)；Liquid level 7
Slowly reduce therewith.Persistently vacuumize, vacuum does not change；The film for being attached with graphene is set to be covered in atomic force microscopy
On the needle point of mirror probe.
As shown in figure 3, cleaning device 9 (such as dropper) removes PMMA toward dropwise addition acetone 10 on graphene 2 and PMMA films 8
Film.Then the atomic force microscope probe for having coated graphene is cleaned with deionized water, taking-up is dried up with nitrogen, i.e.,
The atomic force microscope probe of 12 graphene coateds can be obtained.
Although above the present invention is described in detail with a general description of the specific embodiments,
On the basis of the present invention, it can be made some modifications or improvements, this will be apparent to those skilled in the art.Cause
This, these modifications or improvements, belong to the scope of protection of present invention without departing from theon the basis of the spirit of the present invention.
Claims (10)
- A kind of 1. method using graphene coated atomic force microscope probe needle point, it is characterised in that comprise the following steps：1) atomic force microscope probe to be covered is placed in container bottom, injects deionized water into the container, to soak completely Do not have the probe to be defined；2) by the film floating for being attached with graphene on the deionization water surface, the one of attachment graphene is made facing to container bottom；3) extract deionized water out from the container, the film for being attached with graphene is covered in the pin of atomic force microscope probe On point；4) with solvent by the Film Fractionation, then dried after cleaning probe with deionized water.
- 2. according to the method for claim 1, it is characterised in that the film by polymethyl methacrylate, makrolon, Any of cellulose acetate, hot stripping tape material is made.
- 3. method according to claim 1 or 2, it is characterised in that be attached with single or multiple lift graphite on the membrane Alkene.
- 4. method according to claim 1 or 2, it is characterised in that the container is sealable glass container.
- 5. according to the method described in claim any one of 1-3, it is characterised in that step 3) extracts deionization out using vacuum system Water, until the step terminates.
- 6. according to the method described in claim any one of 1-3, it is characterised in that the step 4) solvent be acetone, dimethoxym ethane, One or more in dichloromethane, chloroform, N,N-dimethylformamide.
- 7. according to the method described in claim any one of 1-3, it is characterised in that the material of the atomic force microscope probe is Si or Pt, probe tip coating include but is not limited to Pt, Pt-Ir, Ti-Pt, Co-Cr, Cr-Pt or diamond.
- 8. graphene coated atomic force microscope probe made from any one of claim 1-7 methods described.
- 9. atomic force microscope probe according to claim 8, it is characterised in that the stone coated on the needle point of the probe Black alkene is single or multiple lift.
- A kind of 10. device for being used to realize any one of claim 1-7 method, it is characterised in that including：Container, vacuum system And cleaning device, the container are connected with the vacuum system.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711105714.9A CN107677850A (en) | 2017-11-10 | 2017-11-10 | A kind of method using graphene coated atomic force microscope probe needle point |
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| CN201711105714.9A CN107677850A (en) | 2017-11-10 | 2017-11-10 | A kind of method using graphene coated atomic force microscope probe needle point |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108375687A (en) * | 2018-03-09 | 2018-08-07 | 北京协同创新研究院 | A method of the coated graphite alkene on atomic force microscope probe needle point |
| CN108658037A (en) * | 2018-04-27 | 2018-10-16 | 国家纳米科学中心 | A kind of graphene functionalized nanometer pinpoint and preparation method thereof |
| CN108845161A (en) * | 2018-03-21 | 2018-11-20 | 清华大学 | The preparation method of atomic force microscope probe, atomic force microscope and probe |
| CN109765407A (en) * | 2019-01-10 | 2019-05-17 | 西安交通大学 | A kind of big L/D ratio probe preparation method based on monodimension nanometer material |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108375687A (en) * | 2018-03-09 | 2018-08-07 | 北京协同创新研究院 | A method of the coated graphite alkene on atomic force microscope probe needle point |
| CN108845161A (en) * | 2018-03-21 | 2018-11-20 | 清华大学 | The preparation method of atomic force microscope probe, atomic force microscope and probe |
| CN108658037A (en) * | 2018-04-27 | 2018-10-16 | 国家纳米科学中心 | A kind of graphene functionalized nanometer pinpoint and preparation method thereof |
| CN109765407A (en) * | 2019-01-10 | 2019-05-17 | 西安交通大学 | A kind of big L/D ratio probe preparation method based on monodimension nanometer material |
| CN109765407B (en) * | 2019-01-10 | 2020-03-17 | 西安交通大学 | Preparation method of large length-diameter ratio probe based on one-dimensional nano material |
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