CN107647866A - A kind of electrical impedance imaging method based on deflected secondary air - Google Patents
A kind of electrical impedance imaging method based on deflected secondary air Download PDFInfo
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- CN107647866A CN107647866A CN201710854425.2A CN201710854425A CN107647866A CN 107647866 A CN107647866 A CN 107647866A CN 201710854425 A CN201710854425 A CN 201710854425A CN 107647866 A CN107647866 A CN 107647866A
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/05—Detecting, measuring or recording for diagnosis by means of electric currents or magnetic fields; Measuring using microwaves or radio waves
- A61B5/053—Measuring electrical impedance or conductance of a portion of the body
- A61B5/0536—Impedance imaging, e.g. by tomography
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/72—Signal processing specially adapted for physiological signals or for diagnostic purposes
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2576/00—Medical imaging apparatus involving image processing or analysis
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Abstract
The invention discloses a kind of electrical impedance imaging method based on deflected secondary air to use electrical impedance imaging method, respectively current excitation is carried out under unloaded and placement imageable target both of which, the boundary voltage measured under collection both of which, pass through the boundary voltage transformation matrices and sensitive matrix information tried to achieve, target area distribution of impedance change is calculated using deflected secondary air, so as to realize that electrical impedance images are rebuild.The method of the present invention have modified the result of Image Reconstruction, improve the image quality of electrical impedance imaging.
Description
Technical field
The present invention relates to a kind of electrical impedance imaging method based on deflected secondary air, belongs to Review of Electrical Impedance Tomography neck
Domain.
Background technology
Electrical impedance imaging (Electrical Impedance Tomography, EIT) technology is a kind of new function imaging
Technology.Review of Electrical Impedance Tomography is harmless without using nucleic or ray, can turn into and long-term, continuous prison is carried out to patient
The medical attendance equipment protected without discomfort is caused to damage or brought to patient.In addition its equipment cost is cheap, does not require special
Working environment etc., thus be a kind of not damaged medical imaging technology and image monitoring technology preferable, that there is wide application prospect.
Study hotspot is rapidly become in 20 end of the centurys.
How to realize the Fast Convergent of the high accuracy of system, high-resolution and algorithm is the subject matter of current EIT technologies.
Research to electrical impedance restructing algorithm is shown：The Newton-Raphson approach of amendment has that reconstructed error is small, convergence is good and to initial value
The advantages of less demanding, its shortcoming are that the single step iteration time is grown, and memory space requires very big, enter reality so as to limit it
Impedance image reconstructs；Equipotential line method is most fast a kind of impedance restructing algorithm at present, but due to its push in theory it is not tight
Lattice acquired results have larger error.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of electrical impedance imaging method based on deflected secondary air,
This method can be effectively imaged to disturbance target.
The present invention uses following technical scheme to solve above-mentioned technical problem：
The present invention provides a kind of electrical impedance imaging method based on deflected secondary air, comprises the following steps that：
Step 1, current excitation is carried out under unloaded and drop target both of which respectively, and is gathered respectively under both of which
The boundary voltage of measurement, obtain the boundary voltage transformation matrices caused by the impedance variations of target area；
Step 2, it is theoretical according to sensitiveness theorem, finite element fission is carried out to imaging region, obtains finite element fission unit
Corresponding sensitive matrix；
Step 3, the sensitive matrix that the boundary voltage transformation matrices and step 2 obtained according to step 1 obtain obtains target area
Domain distribution of impedance transformation matrices；
Step 4, by the target area distribution of impedance transformation matrices under different frequency, electrical impedance imaging image is reconstructed.
As the present invention further prioritization scheme, boundary voltage transformation matrices V=S Δ γ, wherein, Δ γ is target
Region distribution of impedance transformation matrices, S are sensitive matrix.
As the further prioritization scheme of the present invention, target area impedance is obtained by deflected secondary air in step 3
Changes in distribution matrix.
As the further prioritization scheme of the present invention, become obtaining target area distribution of impedance by deflected secondary air
Before changing matrix, it is also necessary to which the sensitive matrix that the boundary voltage transformation matrices and step 2 obtained respectively to step 1 obtain carries out normalizing
Change is handled.
As the further prioritization scheme of the present invention, the plsr.m functions carried in step 3 by MATLAB are solved.
The present invention compared with prior art, has following technique effect using above technical scheme：The present invention based on inclined
The electrical impedance imaging method of least square method uses electrical impedance imaging method, respectively in unloaded and placement two kinds of moulds of imageable target
Carry out current excitation under formula, gather the boundary voltage measured under both of which, by the boundary voltage transformation matrices tried to achieve and
Sensitive matrix information, target area distribution of impedance change is calculated using deflected secondary air, so as to realize electrical impedance images
Rebuild.The method of the present invention have modified the result of Image Reconstruction, improve the image quality of electrical impedance imaging.
Brief description of the drawings
Fig. 1 is flow chart of the method for the present invention.
Embodiment
Embodiments of the present invention are described below in detail, the example of the embodiment is shown in the drawings.Below by
The embodiment being described with reference to the drawings is exemplary, is only used for explaining the present invention, and is not construed as limiting the claims.
Those skilled in the art of the present technique are it is understood that unless otherwise defined, all terms used herein (including skill
Art term and scientific terminology) with the general understanding identical meaning with the those of ordinary skill in art of the present invention.Also
It should be understood that those terms defined in such as general dictionary should be understood that with the context of prior art
The consistent meaning of meaning, and unless defined as here, will not be explained with the implication of idealization or overly formal.
Technical scheme is described in further detail below in conjunction with the accompanying drawings：
The invention discloses a kind of electrical impedance imaging method based on deflected secondary air, as shown in figure 1, specific steps
It is as follows：
Step 1, current excitation is carried out under unloaded and drop target both of which respectively, and is gathered respectively under both of which
The boundary voltage of measurement, obtain the boundary voltage transformation matrices V caused by the impedance variations of target area；
Step 2, it is theoretical according to sensitiveness theorem, finite element fission is carried out to imaging region, obtains finite element fission unit
Corresponding sensitive matrix S；
Step 3, the sensitive matrix S that the boundary voltage transformation matrices V and step 2 obtained according to step 1 is obtained, by partially most
Small least square method obtains target area distribution of impedance transformation matrices Δ γ；
Step 4, by the target area distribution of impedance transformation matrices under different frequency, electrical impedance imaging image is reconstructed.
Wherein, boundary voltage transformation matrices V=S Δs γ.
Wherein, when solving target area distribution of impedance transformation matrices Δ γ using deflected secondary air, it is also necessary to first
First border voltage change matrix V and sensitive matrix S are normalized, MATLAB is may then pass through and carries plsr.m letters
Number carries out solving target area distribution of impedance transformation matrices.
It is described above, it is only the embodiment in the present invention, but protection scope of the present invention is not limited thereto, and is appointed
What be familiar with the people of the technology disclosed herein technical scope in, it will be appreciated that the conversion or replacement expected, should all cover
Within the scope of the present invention, therefore, protection scope of the present invention should be defined by the protection domain of claims.
Claims (5)
1. a kind of electrical impedance imaging method based on deflected secondary air, it is characterised in that comprise the following steps that：
Step 1, current excitation is carried out under unloaded and drop target both of which respectively, and gathers measured under both of which respectively
Boundary voltage, obtain the boundary voltage transformation matrices caused by the impedance variations of target area；
Step 2, it is theoretical according to sensitiveness theorem, finite element fission is carried out to imaging region, it is corresponding to obtain finite element fission unit
Sensitive matrix；
Step 3, the sensitive matrix that the boundary voltage transformation matrices and step 2 obtained according to step 1 obtain obtains target area resistance
Anti- changes in distribution matrix；
Step 4, by the target area distribution of impedance transformation matrices under different frequency, electrical impedance imaging image is reconstructed.
A kind of 2. electrical impedance imaging method based on deflected secondary air according to claim 1, it is characterised in that side
Boundary's voltage change matrix V=S Δ γ, wherein, Δ γ is target area distribution of impedance transformation matrices, and S is sensitive matrix.
A kind of 3. electrical impedance imaging method based on deflected secondary air according to claim 1, it is characterised in that step
Target area distribution of impedance transformation matrices are obtained by deflected secondary air in rapid 3.
4. according to claim 3 in a kind of described electrical impedance imaging method based on deflected secondary air, it is characterised in that
Before target area distribution of impedance transformation matrices are obtained by deflected secondary air, it is also necessary to the side obtained respectively to step 1
The sensitive matrix that boundary's voltage change matrix and step 2 obtain is normalized.
A kind of 5. electrical impedance imaging method based on deflected secondary air according to claim 4, it is characterised in that step
The plsr.m functions carried in rapid 3 by MATLAB are solved.
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| CN201710854425.2A CN107647866A (en) | 2017-09-20 | 2017-09-20 | A kind of electrical impedance imaging method based on deflected secondary air |
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| CN201710854425.2A CN107647866A (en) | 2017-09-20 | 2017-09-20 | A kind of electrical impedance imaging method based on deflected secondary air |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109493395A (en) * | 2018-10-31 | 2019-03-19 | 天津大学 | Open electrical impedance tomography image rebuilding method based on conformal transformation |
| CN112200912A (en) * | 2020-09-22 | 2021-01-08 | 深圳市丰盛生物科技有限公司 | Brain imaging system and method based on electrical impedance imaging and electroencephalogram signals |
| CN114758031A (en) * | 2022-06-15 | 2022-07-15 | 之江实验室 | Method and device for reconstructing capacitive coupling electrical impedance tomography image |
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| CN101564294A (en) * | 2009-06-01 | 2009-10-28 | 中国人民解放军第四军医大学 | Method for structural information fused electrical impedance tomography |
| US20120157866A1 (en) * | 2010-12-20 | 2012-06-21 | Alexander Seth Ross | System and method for determining physiological parameters based on electrical impedance measurements |
| CN102961137A (en) * | 2012-11-29 | 2013-03-13 | 中国人民解放军第四军医大学 | Electric impedance tomography method of brain based on layered reconstruction |
| US20130096425A1 (en) * | 2011-10-14 | 2013-04-18 | General Electric Company | System and method for data reconstruction in soft-field tomography |
| CN105232044A (en) * | 2015-09-11 | 2016-01-13 | 中国人民解放军第四军医大学 | Spectroscopic imaging method for multi-frequency electrical impedance tomography |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101564294A (en) * | 2009-06-01 | 2009-10-28 | 中国人民解放军第四军医大学 | Method for structural information fused electrical impedance tomography |
| US20120157866A1 (en) * | 2010-12-20 | 2012-06-21 | Alexander Seth Ross | System and method for determining physiological parameters based on electrical impedance measurements |
| US20130096425A1 (en) * | 2011-10-14 | 2013-04-18 | General Electric Company | System and method for data reconstruction in soft-field tomography |
| CN102961137A (en) * | 2012-11-29 | 2013-03-13 | 中国人民解放军第四军医大学 | Electric impedance tomography method of brain based on layered reconstruction |
| CN105232044A (en) * | 2015-09-11 | 2016-01-13 | 中国人民解放军第四军医大学 | Spectroscopic imaging method for multi-frequency electrical impedance tomography |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109493395A (en) * | 2018-10-31 | 2019-03-19 | 天津大学 | Open electrical impedance tomography image rebuilding method based on conformal transformation |
| CN112200912A (en) * | 2020-09-22 | 2021-01-08 | 深圳市丰盛生物科技有限公司 | Brain imaging system and method based on electrical impedance imaging and electroencephalogram signals |
| CN112200912B (en) * | 2020-09-22 | 2021-08-31 | 深圳市丰盛生物科技有限公司 | Brain imaging system and method based on electrical impedance imaging and electroencephalogram signals |
| CN114758031A (en) * | 2022-06-15 | 2022-07-15 | 之江实验室 | Method and device for reconstructing capacitive coupling electrical impedance tomography image |
| CN114758031B (en) * | 2022-06-15 | 2022-10-21 | 之江实验室 | Method and device for reconstructing capacitive coupling electrical impedance tomography image |
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