CN107643310B - Novel self-cleaning scanning electron microscope handle - Google Patents
Novel self-cleaning scanning electron microscope handle Download PDFInfo
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- CN107643310B CN107643310B CN201710824981.5A CN201710824981A CN107643310B CN 107643310 B CN107643310 B CN 107643310B CN 201710824981 A CN201710824981 A CN 201710824981A CN 107643310 B CN107643310 B CN 107643310B
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- fixedly connected
- scanning electron
- electron microscope
- handle
- cleaning
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Abstract
The invention provides a novel self-cleaning scanning electron microscope handle, and relates to the technical field of scanning electron microscope equipment. This novel self-cleaning scanning electron microscope handle, the on-line screen storage device comprises a base, the top fixedly connected with scanning electron microscope body of base, handle body and fixed slot have down been set gradually from last to one side of scanning electron microscope body, sliding connection has the drawer in the notch of fixed slot, the top fixedly connected with backup pad of scanning electron microscope body, one side of backup pad is from last fixedly connected with diaphragm and the electric putter down in proper order, the first slide rail of bottom fixedly connected with of diaphragm. This novel self-cleaning scanning electron microscope handle through the setting to cleaning device to under electric putter's effect, adopt the structural design of first slide rail, slider, second slide rail, connecting plate, micro motor, lead screw, rod cover, baffle, pressure sensors, spacing ring and ball, reached the effect of adjusting cleaning device, make things convenient for cleaning of cleaning device to the handle body.
Description
Technical Field
The invention relates to the technical field of scanning electron microscope equipment, in particular to a novel self-cleaning scanning electron microscope handle.
Background
Scanning electron microscope is a new type of electronic optical instrument. The method has the characteristics of simple sample preparation, wide adjustable range of magnification factor, high image resolution, large depth of field and the like. For decades, scanning electron microscopes have been widely used in the fields of biology, medicine, metallurgy, and other disciplines, and have promoted the development of various related disciplines. In the scanning electron microscope, not only can various information generated by the interaction of incident electrons and a sample be used for imaging, but also a signal processing method can be used for obtaining a plurality of special display methods of images, and various data can be obtained from the surface appearance of the sample.
When the scanning electron microscope is used, a sample is often taken and placed by opening, a sample chamber of the scanning electron microscope is opened by a handle arranged on the scanning electron microscope, the sample is placed in the sample chamber, and then the sample chamber is closed by the handle to detect the sample.
However, the handle of the scanning electron microscope is susceptible to fine dust in the outside air and inevitable dust on the hand of an operator, and the cleaning is inconvenient, so that the using effect of the scanning electron microscope is affected.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides a novel self-cleaning scanning electron microscope handle, which solves the problem that the scanning electron microscope handle is polluted when a sample is taken and placed.
(II) technical scheme
In order to achieve the purpose, the invention is realized by the following technical scheme:
a novel self-cleaning scanning electron microscope handle comprises a base, wherein the top of the base is fixedly connected with a scanning electron microscope body, one side of the scanning electron microscope body is sequentially provided with a handle body and a fixed groove from top to bottom, a drawer is connected in a notch of the fixed groove in a sliding manner, the top of the scanning electron microscope body is fixedly connected with a supporting plate, one side of the supporting plate is sequentially and fixedly connected with a transverse plate and an electric push rod from top to bottom, the bottom of the transverse plate is fixedly connected with a first slide rail, a slide block is connected in a track of the first slide rail in a sliding manner, one end of the electric push rod is fixedly connected with one side of the slide block, the bottom of the slide block is fixedly connected with a box body, two sides of the inner wall of the box body are fixedly connected with second slide rails, a connecting plate is fixedly connected between the two second, the inner wall bottom of this box is provided with the rod cover, the bottom of this lead screw runs through rod cover and box in proper order and extends to the outside of box and is connected with the top of casing, the bottom fixedly connected with baffle of this second slide rail, the top fixedly connected with pressure sensors of this baffle, the bottom of this lead screw runs through the top of casing and extends to the inside of casing and the top fixed connection of spacing ring, be provided with the ball between the top of this spacing ring and the inner wall top of casing, the bottom fixedly connected with cleaning device of this casing, and cleaning device is located the top of handle body.
The cleaning device comprises a connecting block, a semicircular groove is formed in the bottom of the connecting block, a dust absorption pad is arranged on the inner wall of the semicircular groove, and bristles are fixedly connected to the inner side of the dust absorption pad.
Preferably, one end fixedly connected with stopper of this first slide rail, the right side of this stopper aligns the setting with the right side of diaphragm.
Preferably, the inner wall of the rod sleeve is provided with a screw mark matched with the screw thread of the screw rod.
Preferably, the sponge pad is fixedly connected to the top of the inner wall of the box body and located between the two second sliding rails.
Preferably, the bristles are evenly distributed on the pad.
Preferably, the diameter of the semicircular groove is larger than that of the handle body, and the diameter of the bottom section of the semicircular groove is larger than that of the handle body.
Preferably, the opening of the drawer is aligned with the sweeping device.
(III) advantageous effects
The invention provides a novel self-cleaning scanning electron microscope handle. Has the following beneficial effects:
1. this novel self-cleaning scanning electron microscope handle, when having solved and get and put the sample, scanning electron microscope handle receives the problem of pollution, through the setting to cleaning device, and under electric putter's effect, adopt first slide rail, the slider, the second slide rail, the connecting plate, micro motor, the lead screw, the rod cover, the baffle, pressure sensors, the structural design of spacing ring and ball, reached the effect of adjusting cleaning device, make things convenient for cleaning device to the cleaning of handle body, avoid the handle body to receive the pollution, the result of use of scanning electron microscope has been improved.
2. This novel self-cleaning scanning electron microscope handle through the improvement to cleaning device, under the effect of connecting block, half slot, dust absorption pad and brush hair, has made things convenient for the clearance to the handle body, improves the clean and tidy degree of handle body.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of an embodiment of the present invention;
FIG. 2 is a schematic diagram of the internal structure of the case according to the embodiment of the present invention;
FIG. 3 is an enlarged view of the embodiment A of the present invention;
fig. 4 is a schematic structural diagram of a cleaning device according to an embodiment of the present invention.
In the figure, 1 base, 2 scanning electron microscope body, 3 handle body, 4 fixed slots, 5 drawers, 6 support plates, 7 transverse plates, 8 electric push rods, 9 first slide rails, 10 slide blocks, 11 box bodies, 12 second slide rails, 13 connecting plates, 14 micro motors, 15 lead screws, 16 rod sleeves, 17 baffle plates, 18 pressure sensors, 19 spacing rings, 20 balls, 21 cleaning devices, 211 connecting blocks, 212 semicircular slots, 213 dust absorption pads, 214 bristles, 22 spacing blocks, 23 sponge pads and 24 shells.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the invention provides a novel self-cleaning scanning electron microscope handle, as shown in figures 1-3, which comprises a base 1, wherein the top of the base 1 is fixedly connected with a scanning electron microscope body 2, one side of the scanning electron microscope body 2 is sequentially provided with a handle body 3 and a fixing groove 4 from top to bottom, a drawer 5 is slidably connected in a notch of the fixing groove 4, the drawer 5 is arranged to facilitate the collection of dust, the top of the scanning electron microscope body 2 is fixedly connected with a supporting plate 6, one side of the supporting plate 6 is sequentially and fixedly connected with a transverse plate 7 and an electric push rod 8 from top to bottom, the bottom of the transverse plate 7 is fixedly connected with a first slide rail 9, one end of the first slide rail 9 is fixedly connected with a limiting block 22, the limiting block 22 is arranged to limit the slide block 10 and prevent the slide block 10 from falling off, the right side of the limiting block 22 is aligned with, one end of an electric push rod 8 is fixedly connected with one side of a slide block 10, the bottom of the slide block 10 is fixedly connected with a box body 11, two sides of the inner wall of the box body 11 are fixedly connected with second slide rails 12, a connecting plate 13 is fixedly connected between the two second slide rails 12, a sponge pad 23 is fixedly connected with the top of the inner wall of the box body 11 and positioned between the two second slide rails 12, the sponge pad 23 plays a buffering effect, the bottom of the connecting plate 13 is fixedly connected with a micro motor 14, an output shaft of the micro motor 14 is fixedly connected with a lead screw 15 through a coupler, the bottom of the inner wall of the box body 11 is provided with a rod sleeve 16, the inner wall of the rod sleeve 16 is provided with a screw mark matched with the lead screw 15 in a threaded manner, the bottom end of the lead screw 15 sequentially penetrates through the rod sleeve 16 and the box body 11 and extends to the outer side of the box body 11 to be, the bottom end of the screw rod 15 penetrates through the top of the shell 24 and extends to the inside of the shell 24 to be fixedly connected with the top of the limiting ring 19, a ball 20 is arranged between the top of the limiting ring 19 and the top of the inner wall of the shell 24, a cleaning device 21 is fixedly connected with the bottom of the shell 24, the cleaning device 21 is located above the handle body 3, and the opening of the drawer 5 is aligned with the cleaning device 21.
As shown in fig. 4, the cleaning device 21 includes a connection block 211, a semicircular groove 212 is formed at the bottom of the connection block 211, a dust absorption pad 213 is disposed on an inner wall of the semicircular groove 212, bristles 214 are fixedly connected to an inner side of the dust absorption pad 213, the bristles 214 are uniformly distributed on the dust absorption pad 213, a diameter of the semicircular groove 212 is larger than a diameter of the handle body 3, and a diameter of a bottom section of the semicircular groove 212 is larger than the diameter of the handle body 3.
The electrical components presented in the document are all electrically connected with an external master controller and 220V mains, and the master controller can be a conventional known device controlled by a computer or the like.
This novel self-cleaning scanning electron microscope handle uses, controls micro motor 14 earlier and rotates, drives cleaning device 21 and descends, when pressure sensors 18 sense the signal, stops the decline, and cleaning device 21 card is on handle body 3 at this moment, controls electric putter 8 and makes a round trip to stretch out and draw back after that, reaches the purpose of cleaning.
To sum up, this novel self-cleaning scanning electron microscope handle, when having solved and put the sample, scanning electron microscope handle receives the problem of pollution, through the setting to cleaning device 21 to under electric putter 8's effect, adopt first slide rail 9, slider 10, second slide rail 12, connecting plate 13, micro motor 14, lead screw 15, rod cover 16, baffle 17, pressure sensors 18, spacing ring 19 and ball 20's structural design, reached the effect of adjusting cleaning device 21, make things convenient for cleaning device 21 to clean handle body 3, avoid handle body 3 to receive the pollution, improved scanning electron microscope's result of use.
Meanwhile, through the improvement of the cleaning device 21, under the action of the connecting block 211, the semicircular groove 212, the dust absorption pad 213 and the bristles 214, the cleaning of the handle body 3 is facilitated, and the neatness of the handle body 3 is improved.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation. The use of the phrase "comprising one of the elements does not exclude the presence of other like elements in the process, method, article, or apparatus that comprises the element.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (6)
1. The utility model provides a can be from scanning electron microscope of clean handle, includes base (1), its characterized in that: the top of the base (1) is fixedly connected with a scanning electron microscope body (2), one side of the scanning electron microscope body (2) is sequentially provided with a handle body (3) and a fixed groove (4) from top to bottom, a drawer (5) is connected in a notch of the fixed groove (4) in a sliding manner, the top of the scanning electron microscope body (2) is fixedly connected with a supporting plate (6), one side of the supporting plate (6) is sequentially and fixedly connected with a transverse plate (7) and an electric push rod (8) from top to bottom, the bottom of the transverse plate (7) is fixedly connected with a first sliding rail (9), a sliding block (10) is connected in a rail of the first sliding rail (9) in a sliding manner, one end of the electric push rod (8) is fixedly connected with one side of the sliding block (10), the bottom of the sliding block (10) is fixedly connected with a box body (11), and the two, a connecting plate (13) is fixedly connected between the two second sliding rails (12), a micro motor (14) is fixedly connected to the bottom of the connecting plate (13), an output shaft of the micro motor (14) is fixedly connected with a lead screw (15) through a coupler, a rod sleeve (16) is arranged at the bottom of the inner wall of the box body (11), the bottom end of the lead screw (15) sequentially penetrates through the rod sleeve (16) and the box body (11) and extends to the outer side of the box body (11) to be connected with the top of the shell (24), a baffle (17) is fixedly connected to the bottom of the second sliding rail (12), a pressure sensor (18) is fixedly connected to the top of the baffle (17), the bottom end of the lead screw (15) penetrates through the top of the shell (24) and extends to the inside of the shell (24) to be fixedly connected with the top of the limiting ring (19), and balls (20) are arranged between the top of the limiting, the bottom of the shell (24) is fixedly connected with a cleaning device (21), and the cleaning device (21) is positioned above the handle body (3);
the cleaning device (21) comprises a connecting block (211), a semicircular groove (212) is formed in the bottom of the connecting block (211), a dust absorption pad (213) is arranged on the inner wall of the semicircular groove (212), and bristles (214) are fixedly connected to the inner side of the dust absorption pad (213);
one end fixedly connected with stopper (22) of first slide rail (9), the right side of stopper (22) aligns the setting with the right side of diaphragm (7).
2. The scanning electron microscope capable of self-cleaning the handle as claimed in claim 1, characterized in that the inner wall of the rod sleeve (16) is provided with a screw mark matched with the screw thread of the screw rod (15).
3. The scanning electron microscope capable of self-cleaning the handle as claimed in claim 1, wherein a sponge pad (23) is fixedly connected to the top of the inner wall of the box body (11) and between the two second sliding rails (12).
4. Scanning electron microscope of a self-cleanable handle according to claim 1, characterized in that the bristles (214) are evenly distributed on the dust absorption pad (213).
5. The scanning electron microscope capable of self-cleaning a handle according to claim 1, wherein the diameter of the semicircular groove (212) is larger than the diameter of the handle body (3), and the diameter of the bottom section of the semicircular groove (212) is larger than the diameter of the handle body (3).
6. Scanning electron microscope of a self-cleanable handle according to claim 1, characterized in that the opening of the drawer (5) is arranged in line with the cleaning device (21).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710824981.5A CN107643310B (en) | 2017-09-14 | 2017-09-14 | Novel self-cleaning scanning electron microscope handle |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710824981.5A CN107643310B (en) | 2017-09-14 | 2017-09-14 | Novel self-cleaning scanning electron microscope handle |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107643310A CN107643310A (en) | 2018-01-30 |
| CN107643310B true CN107643310B (en) | 2020-07-03 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201710824981.5A Expired - Fee Related CN107643310B (en) | 2017-09-14 | 2017-09-14 | Novel self-cleaning scanning electron microscope handle |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110152363B (en) * | 2019-07-01 | 2024-02-20 | 金川集团股份有限公司 | Filter plate of filter press |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204523683U (en) * | 2015-04-08 | 2015-08-05 | 吉安宇之源光电科技有限公司 | A kind of photovoltaic module solar panels electrostatic precipitator |
| CN205526459U (en) * | 2016-02-25 | 2016-08-31 | 郑忠义 | Express delivery parcel surface cleaning device |
| CN106733805A (en) * | 2017-04-07 | 2017-05-31 | 黄思珍 | A kind of electronics technology exploitation PCB high-effective dust-removing equipment |
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2017
- 2017-09-14 CN CN201710824981.5A patent/CN107643310B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204523683U (en) * | 2015-04-08 | 2015-08-05 | 吉安宇之源光电科技有限公司 | A kind of photovoltaic module solar panels electrostatic precipitator |
| CN205526459U (en) * | 2016-02-25 | 2016-08-31 | 郑忠义 | Express delivery parcel surface cleaning device |
| CN106733805A (en) * | 2017-04-07 | 2017-05-31 | 黄思珍 | A kind of electronics technology exploitation PCB high-effective dust-removing equipment |
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| CN107643310A (en) | 2018-01-30 |
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Granted publication date: 20200703 Termination date: 20210914 |