Detailed description of the preferred embodiments
The present invention will be described in detail below with reference to the following embodiments in order to better understand the present invention, but the following embodiments do not limit the scope of the present invention. It should be noted that the drawings provided in the following embodiments are only for illustrating the basic concept of the present invention, and the drawings only show the components related to the present invention rather than the number, shape and size of the components in actual implementation, the shape, number and proportion of the components in actual implementation can be changed freely, and the layout of the components can be more complicated.
It is to be understood that the terms "upper", "lower", "front", "rear", "inner", "outer", "left", "right", and the like, are used for indicating orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing embodiments of the present invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
Fig. 1 is a schematic diagram of the optical action of a half-wave plate on linearly polarized light. The half-wave plate is processed by a birefringent crystal with a certain thickness, and can cause incident polarized light, and the ordinary light and the extraordinary light components of the incident polarized light to generate half-wavelength optical path difference or 180-degree phase retardation. In addition, a half-wave plate may be used to rotate the polarization direction of linearly polarized light. When the included angle between the polarization direction of the linearly polarized light beam which is incident perpendicular to the main section of the half-wave plate and the optical axis of the half-wave plate is alpha, the polarization direction of the emergent linearly polarized light beam rotates by an angle of 2 alpha relative to the polarization direction of an incident light beam. As shown in fig. 1, the light beam emitted from the light source has a polarization state similar to that of natural light, and has a symmetrical and uniform distribution. The
natural light 1 is transmitted along the z-axis direction, when the
natural light 1 is transmitted to the polarizer 2, since the polarization direction of the polarizer 2 is the y-direction, only the linearly polarized light beam 3 polarized along the y-axis direction can pass through the polarizer 2 smoothly and continue to be transmitted along the z-axis direction, and the light beams in other polarization directions are shielded and absorbed by the polarizer 2. When the polarized light beam 3 is incident on the half-
wave plate 4, the angle between the polarization direction of the linearly polarized light beam 3 and the
optical axis 41 of the half-
wave plate 4 is
The polarization direction of the outgoing polarized
light beam 5 relative to the incoming linearly polarized light beam 3 appears
The rotation of (2).
Fig. 2 is a schematic top view and fig. 3 is a schematic cross-sectional view of a rotatable frame according to an embodiment of the present invention. As shown in the figure, the rotary frame 6 is composed of an outer ring 61, a rotary body 62 and an inner ring 63 with a groove; wherein the groove of the inner ring 63 is used to embed and fix the light effect object 64 to be rotated. The outer ring 61 and the inner ring 63 are connected through a rotating body 62 to realize a linkage function. In one embodiment, the rotating body 62 is formed by threads engaged up and down, the inner ring 63 and the outer ring 61 are fixed on the inner side and the outer side of the rotating body 62 by gluing, welding or other feasible methods, and the outer ring 61 is rotated to cause the upper threads of the rotating body 62 to generate torsion to force the lower threads to rotate in the opposite direction, so that the rotation of the inner ring 63 is indirectly realized, and finally the purpose of accurately changing the rotation angle of the light action object 64 is achieved. It is emphasized that in order to meet the requirement of high precision adjustable rotation of the optically active object 64, the upper and lower intermeshing threads of the rotator 62 should be evenly and equidistantly distributed.
In an alternative embodiment of the invention, the light influencing object 64 may be a half-wave plate, and may also be a polarizer or analyzer.
Fig. 4 is a schematic diagram of a laser projection apparatus with adjustable zero-order diffraction according to an embodiment of the present invention. The laser projection apparatus in this embodiment includes a substrate 10, a light source 11, a collimating unit 12, a diffractive optical element 13, and a tunable zeroth-order suppression unit 100.
The light source 11 is fixed on one side of the substrate 10 facing the collimating unit 12 and emits a light beam to the collimating unit 12; the collimating unit 12 is configured to converge the light beam emitted from the light source 11 and project a parallel light beam toward the diffractive optical element 13; the diffractive optical element 13 is used for receiving and expanding the parallel light beams projected by the collimation unit 12 and projecting patterned light beams to the adjustable zero-order suppression unit 100; the patterned beam comprises a zero order diffracted beam 14 and a higher order diffracted beam 18; tunable zero-order suppression unit: receiving the patterned light beam, accurately attenuating or shielding the zero-order diffraction light beam in the patterned light beam, and projecting the high-order diffraction light beam in the patterned light beam and the attenuated or shielded zero-order diffraction light beam outwards. It is emphasized that expanding refers to expanding a single beam into multiple beams, which may also be referred to as splitting. The patterned beam formed by expanding the parallel beam may be a two-dimensional shape pattern, a two-dimensional spot pattern, or the like.
The tunable zero-order suppression unit 100 is composed of a polarizer 15, a half-wave plate device 16, and an analyzer 17, and is configured to flexibly shield and attenuate the intensity of the zero-order diffracted beam 14 and transmit the high-order diffracted beam 18 other than the zero-order diffracted beam 14.
The polarizer 15 comprises a linear polarizer 151 and a non-optical transparent part 152, wherein the linear polarizer 151 is embedded in the transparent part 152 in a sticking way, and the specific position and size are determined by the actual spot position and size of the zero-order diffraction light beam 14.
The half-wave plate device 16 is composed of a rotary mirror bracket 161 and a half-wave plate 162; at the position of the half-wave plate 162, the azimuth angle of the optical axis of the half-wave plate 162 can be accurately changed by rotating the rotary mirror holder 161;
the analyzer 17 is constructed substantially similarly to the polarizer 15, and includes a linear polarizer 171, a non-optically active transparent portion 172.
In one embodiment of the present invention, the transmission directions of the polarizer 15 and the analyzer 17 are parallel to each other, i.e. the transmission directions of the linear polarizer 151 and the linear polarizer 171 are the same, and the cross-sectional area is not smaller than the spot cross-sectional area of the zero-order diffracted beam 14, preferably, the cross-sectional areas of the linear polarizer 151 and the linear polarizer 171 are equal to the spot cross-sectional area of the zero-order diffracted beam 14.
The high-order diffracted beam 18 enters the tunable zero-order suppression unit 100 from the transparent portion 152 region of the polarizer 15, and since the high-order diffracted beam 18 is natural light, the high-order diffracted beam 18 can pass through the half-wave plate 162 without loss, and exits the tunable zero-order suppression unit 100 from the transparent portion 172 region of the analyzer 17, and is finally projected on the high-order diffracted beam projection region 191 of the target plane 19.
The zero-order diffracted light beam 14 is emitted into the adjustable zero-order suppression unit 100 from the area of the linear polarizer 151 of the polarizer 15, and the zero-order diffracted light beam 14 is emitted to the half-wave plate device 16 as the second zero-order diffracted light beam 141 after being polarized by the linear polarizer 151; then, after the second zero-order diffracted light beam 141 is subjected to optical rotation action by the half-wave plate 162, the polarization direction of the second zero-order diffracted light beam 141 can be deflected to a certain degree, and the third zero-order diffracted light beam 142 is emitted to the analyzer 17; since the transmission direction of the linearly polarizing plate 171 is the same as that of the linearly polarizing plate 151, a part of the energy of the third zero-order diffracted light beam 142 is absorbed by the linearly polarizing plate 171, and finally exits the tunable zero-order suppression unit 100 as the fourth zero-order diffracted light beam 143, and is projected on the zero-order diffracted light beam projection area 192 of the target plane 19.
Based on the optical rotation effect of the half-wave plate 162 and the extinction mechanisms of the polarizer 15 and the analyzer 17, the rotating mirror holder 161 is rotated to change the included angle α between the optical axis of the half-wave plate 162 and the polarization direction of the second zero-order diffracted light beam 141, so that the polarization direction of the third zero-order diffracted light beam 142 can be accurately deflected, and the light intensity of the zero-order diffracted light beam 14 can be accurately attenuated or regulated.
For ease of understanding, in particular, the light intensity of the zero-order diffracted light beam 14 is assumed to be I0The second zero-order diffracted beam 141 is attenuated to 0.5I after being polarized by the polarizing plate 1510Since the angle between the optical axis of the half waveplate 164 and the polarization direction of the second zero-order diffracted light beam 141 is α, the angle between the polarization direction of the third zero-order diffracted light beam 142 and the linear polarizer 151 and the linear polarizer 171 is 2 α, and the light intensity of the fourth zero-order diffracted light beam 143 projected onto the target plane 192 is 0.5I in combination with malus law0*(cos2α)2That is, the intensity of the fourth zero-order diffracted beam 143 is determined by the included angle α, and the value of the included angle α is adjusted to be in the range of 0 to 45 °. This has the advantage that the zero order diffracted beam 14 can be accurately attenuated by adjusting the azimuth angle of the optical axis of the half-wave plate device 16 according to the light intensity of the higher order diffracted beam 18, thereby ensuring a uniform distribution of the patterned laser beam projected to the target space.
In an alternative embodiment of the invention, the light source 11 may be an edge-emitting laser and its array or a vertical cavity surface-emitting laser and its array; the light source 11 is an infrared laser beam with the wavelength of 850nm and 950nm or a laser beam with other wave bands; the polarizer 15 may be constituted by only the linear polarizing plate 151 and fixed to the light outgoing side of the diffractive optical element 13 by means of embedding, bonding, or other feasible means; the analyzer 17 may be constituted only by the linearly polarizing plate 171, andand is fixed on the light-emitting side of the half-wave plate device 16 by embedding, pasting or other feasible ways. In this case, the cross-sectional areas of the polarizer 15 and the analyzer 17 should be not smaller than the spot area of the zero-order diffracted beam 14. Note that the fourth zero-order diffracted light beam 143 projected on the target plane 192 has an optical intensity I of 0.5I0*(cosα)2Wherein the value of the included angle alpha is adjusted within the range of 0-90 degrees.
In a further alternative embodiment of the invention, the polarizer 15 is at an angle β to the direction of transmission of the analyzer 17, i.e. the linear polarizer 171 is at an angle β to the linear polarizer 151. Wherein the value range of beta is 0-90 degrees. It should be noted that the fourth zero-order diffracted light beam 143 projected on the target plane 192 has an optical intensity I of 0.5I0*(cos(β-2α))2Or I is 0.5I0*(cos(2α-β))2I.e. the light intensity of the fourth zero order diffracted beam 143 is determined by both angles alpha and beta.
FIG. 5 is a schematic diagram of a zero-order diffraction tunable laser projection apparatus according to another embodiment of the present invention. The laser projection apparatus in this embodiment is substantially the same as the laser projection apparatus in the embodiment of fig. 4, except that the further adjustable zero-level suppression unit 101 of the laser projection apparatus includes: a polarizer 15 and a rotatable analyzer 20.
The polarizer 15 is similar to the structure of the embodiment of FIG. 4, and will not be described again.
The rotatable analyzer 20 comprises a linear polarizer 201, a non-optically active transparent portion 202, and a rotatable frame 203; the linear polarizer 201 is fixed in the transparent portion 202 by embedding, adhering or other feasible ways, and the specific position and size are determined by the position and size of the light spot of the zero-order diffracted light beam 14; the transparent part 202 is fixed in a recessed groove inside the rotating frame 203 in an embedded manner, and the transmission direction of the linearly polarizing plate 201 can be accurately changed by rotating the rotating frame 203.
In one embodiment of the present invention, the centers of the linearly polarizing plate 151 and the linearly polarizing plate 201 and the center of the zero-order diffracted light beam 14 are disposed on the same horizontal line, and the cross-sectional areas of the linearly polarizing plate 151 and the linearly polarizing plate 201 are not smaller than the spot cross-sectional area of the zero-order diffracted light beam 14, preferably, the cross-sectional areas of the linearly polarizing plate 151 and the linearly polarizing plate 201 are equal to the spot cross-sectional area of the zero-order diffracted light beam 14.
The high-order diffracted light beam 18 passes through the tunable zero-order suppression unit 101 from the polarizer 15 and the transparent portions 152 and 202 of the rotatable analyzer 20 and directly enters the target space, and is finally projected on the high-order diffracted light beam projection region 191 of the target plane 19.
The zero-order diffracted light beam 14 is emitted into the adjustable zero-order suppression unit 101 from the area of the linear polarizer 151 of the polarizer 15, and the zero-order diffracted light beam 14 is emitted to the area of the linear polarizer 201 of the rotatable analyzer 20 as a second zero-order diffracted light beam 141 after being polarized by the linear polarizer 151; after the second zero-order diffracted light beam 141 is acted on by the polarizing plate 201, it exits the tunable zero-order suppression unit 101 as the third zero-order diffracted light beam 142 and is projected on the zero-order diffracted light beam projection area of the target plane 19. Based on the extinction mechanism of the linear polarizer, the rotating frame 203 is rotated to change the transmission direction of the linear polarizer 201, so that the included angle alpha between the linear polarizer 201 and the linear polarizer 151 in the transmission direction is changed, and the purpose of accurately attenuating the light intensity of the zero-order diffracted light beam 14 is achieved.
For ease of understanding, in particular, the light intensity of the zero-order diffracted light beam 14 is assumed to be I0The second zero-order diffracted beam 141 is attenuated to 0.5I after being polarized by the polarizing plate 1510Because the linear polarizer 201 and the linear polarizer 151 form an angle α with respect to the transmission direction, the second zero-order diffracted light beam 141 is attenuated and absorbed by the linear polarizer 161, and then emitted to the target space as the third zero-order diffracted light beam 144, and the light intensity of the third zero-order diffracted light beam 144 projected to the region of the target plane 192 is 0.5I, in combination with malus law0*(cosα)2That is, the intensity of the third zero-order diffracted beam 144 is determined by the included angle α, and the value of the included angle α is adjusted to be in the range of 0 to 90 °. This has the advantage that the zero order diffracted beam 14 can be accurately attenuated by adjusting the transmission direction of the rotatable analyzer 20 according to the light intensity of the high order diffracted beam 18, thereby ensuring a uniform distribution of the patterned laser beam projected in the target space.
In an alternative embodiment of the invention, the linearly polarizing plate 151 polarizes the zero order diffracted beam 14 at any angle; the polarizer 15 may be constituted by only the linear polarizing plate 151 and fixed to the light outgoing side of the diffractive optical element 13 by means of embedding, bonding, or other feasible means; the adjustable analyzer may be comprised of only the linear polarizer 201 and the rotating frame 203.
In yet another alternative embodiment of the invention, the tunable zero-order suppression unit 101 comprises a polarizer and an analyzer, wherein the polarizer and/or analyzer can be rotated. Specifically, the tunable zero-order suppression unit 101 may be a combination of a rotatable polarizer and an analyzer, a combination of a polarizer and a rotatable analyzer, or a combination of a rotatable polarizer and a rotatable analyzer.
The laser projection device with adjustable zero-order diffraction can be integrated in a depth camera system, and based on the laser projection device with adjustable intensity of zero-order diffraction light beams, the laser speckle patterns projected by the projection device of the depth camera have the characteristic of more uniform brightness distribution, namely the speckle images acquired by the picture capture device of the depth camera system have higher accuracy, so that the performance of the depth camera is integrally improved, and the intensity of the laser patterns can be adjusted by the depth camera according to the safety regulation of human eyes.
Different from the prior art, the diffraction optical element of the traditional laser projection device has the problem of zero-order diffraction. The laser projection device designed by the invention can accurately attenuate the zero-order diffracted light beam according to the actual situation while ensuring the integrity of the laser speckle pattern by adding the adjustable zero-order inhibition unit, thereby further improving the overall quality of the laser speckle pattern.
On the basis of the present invention, it is desirable to adopt other optical elements in the prior art to reduce the intensity of zero-order diffraction in a laser projection device by attenuation or shielding.
In the laser projection apparatus with adjustable zero-order diffraction, none of the hardware installation methods described above should be regarded as limitations of the present invention, and the required hardware only needs to satisfy the sequential installation described in the present invention, and the specific installation manner may be the installation manner achievable in the prior art.
The tunable zero-order suppression unit of the present invention can also be applied to other devices for attenuating the intensity of zero-order diffraction, and the specific application thereof based on the idea of the present invention shall fall within the protection scope of the present invention.
In addition, the invention also provides a manufacturing method of the zero-order diffraction adjustable laser projection device, which comprises the steps of providing a substrate and a light source, and fixing the light source on the substrate; providing a collimating unit and a diffractive optical element, fixing the collimating unit between the light source and the diffractive optical element, and collimating or focusing the light beam emitted by the light source; the diffractive optical element is used for receiving and expanding the light beam and projecting a patterned light beam to a target space; and providing an adjustable zero-order suppression unit, wherein the adjustable zero-order suppression unit comprises a polarizer, an analyzer or a half-wave plate device, and is arranged on one side of the light beam emitted by the diffractive optical element and used for shielding or attenuating the zero-order diffracted light beam in the patterned light beam.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several equivalent substitutions or obvious modifications can be made without departing from the spirit of the invention, and all the properties or uses are considered to be within the scope of the invention.