CN107577570A - The method of testing and device of a kind of application apparatus - Google Patents
The method of testing and device of a kind of application apparatus Download PDFInfo
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- CN107577570A CN107577570A CN201710848292.8A CN201710848292A CN107577570A CN 107577570 A CN107577570 A CN 107577570A CN 201710848292 A CN201710848292 A CN 201710848292A CN 107577570 A CN107577570 A CN 107577570A
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Abstract
The invention discloses a kind of method of testing of application apparatus and device, this method includes：Set the target hardware of application apparatus test；The corollary system of application apparatus is obtained, and corollary system is simplified to obtain only including the drive system layer of the target drives corresponding with target hardware according to target hardware；Target hardware is tested to obtain test result by drive system layer.Because corollary system is to be write to form according to the actual conditions of application apparatus progress specific aim, therefore compatibility between the two is higher.Further, since corollary system is the system of product actual use, therefore tests target hardware the working condition that can reflect target hardware under true environment using the drive system layer as derived from corollary system, and then test result can be relatively reliable.It can be seen that this method improves the testing efficiency of application apparatus and the reliability of test.In addition, the present invention also provides a kind of test device of application apparatus, beneficial effect is as described above.
Description
Technical field
The present invention relates to test manufacture testing field, more particularly to the method for testing and device of a kind of application apparatus.
Background technology
With the arrival of information age, various application apparatus arise at the historic moment, and enrich the life of user and meet use
Various use demands of the family in production work.
Application apparatus includes hardware device and supporting application system, and application apparatus is matched somebody with somebody by being run on hardware device
The application system of set provides the user respective service to realize.Enterprise generally requires before application apparatus is produced in batches
Application device carries out the test manufacture of small lot, and the reliability testing of hardware aspect is carried out to test manufacture product, is set with avoiding applying
The standby design defect in hardware aspect brings loss for batch production in the future.The existing reliability testing for application apparatus
Mode is that the linux system that will be increased income is attached in application apparatus, and carries out phase to linux system for the hardware device of test
The transplanting for the hardware driving answered, reliability testing is carried out to hardware device by the linux system after transplanting, but due to this
Linux system be not be directed to the connection of hardware device specific circuit and it is supporting write, therefore in test process often
The reason for occurring because system is incompatible with hardware device and produce failure situation, and then also needing to analyze failure, is simultaneously solved
Certainly, this reliability for leveraging testing efficiency and test.
As can be seen here, there is provided a kind of method of testing of application apparatus, be to improve the reliability of testing efficiency and test
Those skilled in the art's urgent problem to be solved.
The content of the invention
It is an object of the invention to provide a kind of method of testing of application apparatus and device, the test for improving application apparatus is imitated
Rate and the reliability of test.
In order to solve the above technical problems, the present invention provides a kind of method of testing of application apparatus, including：
Set the target hardware of application apparatus test；
Obtain the corollary system of application apparatus, and according to target hardware corollary system is simplified with obtain only including with
The drive system layer of the corresponding target drives of target hardware；
Target hardware is tested to obtain test result by drive system layer.
Preferably, this method further comprises：
Test result is recorded.
Preferably, this method further comprises：
Result threshold value is set, and judges whether test result meets result threshold value；
If it is not, then carry out the abnormal prompting of test result.
Preferably, application apparatus is specially storage device.
Preferably, target drives specifically include：
SAS drivings, iSCSI drivings, FC drivings, NTB drivings, trawl performance and external drive.
Preferably, corollary system is specially the corollary system based on linux system exploitation.
In addition, the present invention also provides a kind of test device of application apparatus, including：
Hardware setting module, for setting the target hardware of application apparatus test；
System simplifies module, and corollary system is carried out for obtaining the corollary system of application apparatus, and according to target hardware
Simplify to obtain only including the drive system layer of the target drives corresponding with target hardware；
Testing execution module, for being tested target hardware to obtain test result by drive system layer.
Preferably, the device further comprises：
As a result logging modle, for test result to be recorded.
Preferably, the device further comprises：
Judge module, for setting result threshold value, and judge whether test result meets result threshold value, if it is not, then adjusting
Use reminding module；
Reminding module, the prompting abnormal for carrying out test result.
The method of testing of application apparatus provided by the present invention, by using the corollary system application device of application apparatus
Target hardware carry out reliability testing, due to corollary system be according to the actual conditions of application apparatus carry out specific aim write and
Into, therefore the compatibility between corollary system and application apparatus is higher.But because corollary system is that a complexity is complete
System, toggle speed is slow, configuration testing it is complex for operation step, and the production in enormous quantities in improper producing line " in time production,
The pattern of checking in time ", influences efficiency, therefore only retained drive system layer related to target hardware in corollary system
To be simplified to obtain drive system layer to corollary system, the reliability testing to target hardware is carried out by drive system layer,
While guaranteed efficiency, it is incompatible and produce the generation of failure situation to reduce system and target hardware equipment.Further, since match somebody with somebody
Set system is the system of product actual use, therefore target hardware is surveyed using the drive system layer as derived from corollary system
Examination can reflect working condition of the target hardware under true environment, and then test result can be relatively reliable.It can be seen that this method
Improve the testing efficiency of application apparatus and the reliability of test.In addition, the present invention also provides a kind of test of application apparatus
Device, beneficial effect are as described above.
Brief description of the drawings
In order to illustrate the embodiments of the present invention more clearly, the required accompanying drawing used in embodiment will be done simply below
Introduce, it should be apparent that, drawings in the following description are only some embodiments of the present invention, for ordinary skill people
For member, on the premise of not paying creative work, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of flow chart of the method for testing of application apparatus provided in an embodiment of the present invention；
Fig. 2 is the flow chart of the method for testing of another application apparatus provided in an embodiment of the present invention；
Fig. 3 is a kind of test device structure chart of application apparatus provided in an embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.Based on this
Embodiment in invention, for those of ordinary skill in the art under the premise of creative work is not made, what is obtained is every other
Embodiment, belong to the scope of the present invention.
The present invention core be to provide a kind of method of testing of application apparatus, improve application apparatus testing efficiency and
The reliability of test.Another core of the present invention is to provide a kind of test device of application apparatus.
In order that those skilled in the art more fully understand the present invention program, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.
Embodiment one
Fig. 1 is a kind of flow chart of the method for testing of application apparatus provided in an embodiment of the present invention.Fig. 1 is refer to, is applied
The specific steps of the method for testing of equipment include：
Step S10：Set the target hardware of application apparatus test.
Signified target hardware is to need the hardware device of progress reliability testing, the mesh of sets target hardware in this step
Be the hardware objects of clear and definite follow-up test, and then carry out corresponding system simplification for target hardware in subsequent step.
Step S11：The corollary system of application apparatus is obtained, and corollary system is simplified to obtain according to target hardware
Only include the drive system layer of the target drives corresponding with target hardware.
It is understood that in this step obtain application apparatus corollary system, be in order that application apparatus with it is supporting
System is preferably compatible, and the purpose that corollary system is simplified is that the drive system required for test target hardware is used only
Layer.It should be noted that drive system layer is the first floor system that corollary system interacts with hardware, and drive system layer can be only
Vertical operation, and compared to complete corollary system, the overall operation speed of drive system layer faster, therefore the efficiency phase tested
To higher.It is emphasized that the system that the simplification carried out in test to corollary system can be off enabling upper strata only opens
With the drive system layer of bottom, the system that upper strata can also be cropped, it is not specifically limited herein.
Step S12：Target hardware is tested to obtain test result by drive system layer.
It should be noted that target hardware is tested essentially by drive system layer by drive system layer
The hardware driving and target hardware for being directed to target hardware interact, and obtain target hardware caused work at work
Make data, operational data can serve as test result, more specifically can be to specify hardware to drive by those skilled in the art
The interactive operation to target hardware progress feature is moved to obtain the operational data of target hardware.Specified by those skilled in the art
Mode to be tested obtained test result more targeted, therefore preferable mode can be used as, but be not limited only to
This.
The method of testing of application apparatus provided by the present invention, by using the corollary system application device of application apparatus
Target hardware carry out reliability testing, due to corollary system be according to the actual conditions of application apparatus carry out specific aim write and
Into, therefore the compatibility between corollary system and application apparatus is higher.But because corollary system is that a complexity is complete
System, toggle speed is slow, configuration testing it is complex for operation step, and the production in enormous quantities in improper producing line " in time production,
The pattern of checking in time ", influences efficiency, therefore only retained drive system layer related to target hardware in corollary system
To be simplified to obtain drive system layer to corollary system, the reliability testing to target hardware is carried out by drive system layer,
While guaranteed efficiency, it is incompatible and produce the generation of failure situation to reduce system and target hardware equipment.Further, since match somebody with somebody
Set system is the system of product actual use, therefore target hardware is surveyed using the drive system layer as derived from corollary system
Examination can reflect working condition of the target hardware under true environment, and then test result can be relatively reliable.It can be seen that this method
Improve the testing efficiency of application apparatus and the reliability of test.
Embodiment two
Fig. 2 is the flow chart of the method for testing of another application apparatus provided in an embodiment of the present invention.Step S10- in Fig. 2
S12 is identical with Fig. 1, will not be repeated here.
As shown in Fig. 2 as a preferred embodiment, this method further comprises：
Step S20：Test result is recorded.
It is understood that the purpose that test result is recorded is, those skilled in the art can be according to being remembered
The result of record understands test case, and the problems of hardware can be analyzed according to test case, therefore is right after testing
Favourable help is provided in the improvement and optimization of hardware.
As shown in Fig. 2 as a preferred embodiment, this method further comprises：
Step S21：Result threshold value is set, and judges whether test result meets result threshold value；
If it is not, then perform step S22.
Step S22：Carry out the abnormal prompting of test result.
It should be noted that when problem be present in hardware design existing defects or quality of hardware, tested obtained by survey
Test result may have larger error with normal outcome, in order that those skilled in the art are had found existing for hardware in the very first time
Problem is, it is necessary to judge test result, and to determine that the result whether there is problem, and the standard judged is art technology
Result threshold value set by personnel, as a result threshold value characterizes the normal range (NR) of test result, therefore works as and define survey by result threshold value
When test result exceeds normal range (NR), corresponding abnormal prompt will be carried out, and then those skilled in the art can be carried out according to prompting
The problem of follow-up, is handled.
In addition, as a preferred embodiment, application apparatus is specially storage device.
Because big data processing is current main trend, and the carrier of big data is distributed storage cluster, in the cluster
Existing main node is storage devices node, and the reliability of storage device directly concerns the safety of data, therefore for storage
The hardware testing of equipment is even more important.
In addition, as a preferred embodiment, target drives specifically include：
SAS drivings, iSCSI drivings, FC drivings, NTB drivings, trawl performance and external drive.
It is understood that SAS drivings, iSCSI drive, FC drives, NTB drives, trawl performance is solid in application apparatus
Driving required for some hardware, therefore the category into test can be included.
In addition, as a preferred embodiment, corollary system is specially the breed system based on linux system exploitation
System.
It should be noted that increased income due to linux system and stablized relatively, therefore the autgmentability height of linux system is simultaneously
And reliable operation, and then the corollary system availability based on linux system exploitation is higher.
Embodiment three
Hereinbefore it is described in detail for a kind of embodiment of the method for testing of application apparatus, the present invention also carries
For a kind of test device of application apparatus, because the embodiment of device part and the embodiment of method part are mutually corresponding, therefore
The embodiment of device part refers to the description of the embodiment of method part, wouldn't repeat here.
Fig. 3 is a kind of test device structure chart of application apparatus provided in an embodiment of the present invention.It is as shown in figure 3, of the invention
A kind of test device for application apparatus that embodiment provides, including：
Hardware setting module 10, for setting the target hardware of application apparatus test.
System simplifies module 11, and corollary system is entered for obtaining the corollary system of application apparatus, and according to target hardware
Row simplifies to obtain only including the drive system layer of the target drives corresponding with target hardware.
Testing execution module 12, for being tested target hardware to obtain test result by drive system layer.
The test device of application apparatus provided by the present invention, by using the corollary system application device of application apparatus
Target hardware carry out reliability testing, due to corollary system be according to the actual conditions of application apparatus carry out specific aim write and
Into, therefore the compatibility between corollary system and application apparatus is higher.But because corollary system is that a complexity is complete
System, toggle speed is slow, configuration testing it is complex for operation step, and the production in enormous quantities in improper producing line " in time production,
The pattern of checking in time ", influences efficiency, therefore only retained drive system layer related to target hardware in corollary system
To be simplified to obtain drive system layer to corollary system, the reliability testing to target hardware is carried out by drive system layer,
While guaranteed efficiency, it is incompatible and produce the generation of failure situation to reduce system and target hardware equipment.Further, since match somebody with somebody
Set system is the system of product actual use, therefore target hardware is surveyed using the drive system layer as derived from corollary system
Examination can reflect working condition of the target hardware under true environment, and then test result can be relatively reliable.It can be seen that the present apparatus
Improve the testing efficiency of application apparatus and the reliability of test.
On the basis of embodiment three, as a preferred embodiment, the device further comprises：
As a result logging modle, for test result to be recorded.
On the basis of embodiment three, as a preferred embodiment, the device further comprises：
Judge module, for setting result threshold value, and judge whether test result meets result threshold value, if it is not, then adjusting
Use reminding module；
Reminding module, the prompting abnormal for carrying out test result.
The method of testing and device of a kind of application apparatus provided by the present invention are described in detail above.Specification
In each embodiment described by the way of progressive, what each embodiment stressed be it is different from other embodiment it
Place, between each embodiment identical similar portion mutually referring to.For device disclosed in embodiment, due to itself and reality
Apply that method disclosed in example is corresponding, so description is fairly simple, related part is referring to method part illustration.It should refer to
Go out, for those skilled in the art, under the premise without departing from the principles of the invention, can also be to the present invention
Some improvement and modification are carried out, these are improved and modification is also fallen into the protection domain of the claims in the present invention.
It should also be noted that, in this manual, such as first and second or the like relational terms be used merely to by
One entity or operation make a distinction with another entity or operation, and not necessarily require or imply these entities or operation
Between any this actual relation or order be present.Moreover, term " comprising ", "comprising" or its any other variant meaning
Covering including for nonexcludability, so that process, method, article or equipment including a series of elements not only include that
A little key elements, but also the other element including being not expressly set out, or also include for this process, method, article or
The intrinsic key element of equipment.In the absence of more restrictions, the key element limited by sentence "including a ...", is not arranged
Except other identical element in the process including the key element, method, article or equipment being also present.
Claims (9)
- A kind of 1. method of testing of application apparatus, it is characterised in that including：Set the target hardware of application apparatus test；The corollary system of the application apparatus is obtained, and the corollary system is simplified to obtain according to the target hardware Only include the drive system layer of the target drives corresponding with the target hardware；The target hardware is tested to obtain test result by the drive system layer.
- 2. according to the method for claim 1, it is characterised in that this method further comprises：The test result is recorded.
- 3. according to the method for claim 1, it is characterised in that this method further comprises：Result threshold value is set, and judges whether the test result meets the result threshold value；If it is not, then carry out the abnormal prompting of the test result.
- 4. according to the method for claim 1, it is characterised in that the application apparatus is specially storage device.
- 5. according to the method for claim 1, it is characterised in that the target drives specifically include：SAS drivings, iSCSI drivings, FC drivings, NTB drivings, trawl performance and external drive.
- 6. according to the method described in claim 1-5 any one, it is characterised in that the corollary system is specially to be based on The corollary system of linux system exploitation.
- A kind of 7. test device of application apparatus, it is characterised in that including：Hardware setting module, for setting the target hardware of application apparatus test；System simplifies module, for obtaining the corollary system of the application apparatus, and according to the target hardware to described supporting System is simplified to obtain only including the drive system layer of the target drives corresponding with the target hardware；Testing execution module, for being tested the target hardware to obtain test result by the drive system layer.
- 8. device according to claim 7, it is characterised in that the device further comprises：As a result logging modle, for the test result to be recorded.
- 9. device according to claim 7, it is characterised in that the device further comprises：Judge module, for setting result threshold value, and judge whether the test result meets the result threshold value, if not, Then call reminding module；The reminding module, the prompting abnormal for carrying out the test result.
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| CN101073016A (en) * | 2004-12-09 | 2007-11-14 | 株式会社爱德万测试 | Method and system for performing installation and configuration management of tester instrument modules |
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Application publication date: 20180112 |