CN107560762A - A kind of PT100 resistance temperature measurements method and system - Google Patents
A kind of PT100 resistance temperature measurements method and system Download PDFInfo
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- CN107560762A CN107560762A CN201710796142.7A CN201710796142A CN107560762A CN 107560762 A CN107560762 A CN 107560762A CN 201710796142 A CN201710796142 A CN 201710796142A CN 107560762 A CN107560762 A CN 107560762A
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Abstract
The present invention provides a kind of PT100 resistance temperature measurements method and system, and the resistance value digital quantity for being sampled to obtain to 100 Ω precision resistances according to sampling A/D chip by MCU chip is tabled look-up, and obtains temperature correction value；The resistance value digital quantity for being sampled to obtain to corresponding PT100 resistance further according to sampling A/D chip is tabled look-up, and obtains each temperature detection value；Then calculate temperature detection value and subtract the difference that temperature correction is worth to, corresponding temperature detection value is updated with difference；And then realize that the thermometric for PT100 resistance is calibrated, and is improved sampling precision, is reduced sampling deviation of the prior art.
Description
Technical field
The present invention relates to electric and electronic technical field, more particularly to a kind of PT100 resistance temperature measurements method and system.
Background technology
Generally, PT100 resistance temperature measurements system is widely used in the high-precision temperature device such as medical treatment, motor, industry, so that its
Application apparatus can carry out the control and protection of correlation according to the temperature value that detection obtains.Fig. 1 is the system in the prior art
Structural representation, including：Sampling A/D chip with 4 road sampling channels, and, the MCU to be communicated with sampling A/D chip
(Microcontroller Unit, micro-control unit) chip；Wherein, MCU chip is communicated by SPI reads sampling A/D chip collection
To warm resistance digital amount and then by looking into resistance v. temperature table obtain corresponding temperature value.
It can be seen from the temperature-resistance characteristic of PT100 resistance, 0 DEG C of temperature theoretical value corresponding to 100 Ω resistance, still
Influenceed by sampling A/D chip technique itself and its external environment condition, when carrying out actual temperature measurement, 100 Ω precision resistances are connected to
On any sampling channel of sampling A/D chip, it is found that the temperature value that detection obtains is not necessarily 0, worst error reaches more than 3 DEG C,
And such sampling deviation will influence the subsequent control and relay protective scheme of its application apparatus.
The content of the invention
The present invention provides a kind of PT100 resistance temperature measurements method and system, inclined to solve to exist in the prior art larger sampling
The problem of poor.
To achieve the above object, the technical scheme that the application provides is as follows：
A kind of PT100 resistance temperature measurements method, applied to the micro-control unit MCU chip in PT100 resistance temperature measurement systems；Institute
Stating PT100 resistance temperature measurement systems also includes：Sampling A/D chip and 100 Ω precision resistances；The PT100 resistance temperature measurements method includes：
The resistance value number for being sampled to obtain to the 100 Ω precision resistances according to any sampling channel of the sampling A/D chip
Word amount is tabled look-up, and obtains temperature correction value；
The resistance value digital quantity for being sampled to obtain to corresponding PT100 resistance according to other sampling channels of the sampling A/D chip
Tabled look-up, obtain each temperature detection value；
Each temperature detection value is calculated respectively subtracts the difference that the temperature correction is worth to, it is corresponding with the renewal of each difference
Temperature detection value.
A kind of PT100 resistance temperature measurements method, applied to the MCU chip in PT100 resistance temperature measurement systems；The PT100 electricity
Resistance temp measuring system also includes：Sampling A/D chip, N number of 100 Ω precision resistances, N number of numerical control analog switch and N number of connection terminal；N is just
Integer, it is the sampling channel quantity of the sampling A/D chip；The PT100 resistance temperature measurements method includes：
The channel selecting in each numerical control analog switch is controlled, makes each sampling channel respectively to corresponding 100 Ω essences
Cipher telegram is hindered and PT100 resistance is sampled；
Tabled look-up respectively according to the resistance value digital quantity that sampling obtains, to obtain relevant temperature corrected value and temperature detection
Value；
Each temperature detection value is calculated respectively subtracts the difference that relevant temperature correction is worth to, it is corresponding with the renewal of each difference
Temperature detection value.
Preferably, the channel selecting in each numerical control analog switch of control, makes each sampling channel right respectively
Corresponding 100 Ω precision resistances and PT100 resistance are sampled, including：
The channel selecting in each numerical control analog switch is controlled, makes each sampling channel first accurate to corresponding 100 Ω
Resistance is sampled, then corresponding PT100 resistance is sampled.
Preferably, the resistance value digital quantity obtained according to sampling is tabled look-up respectively, to obtain relevant temperature correction
Value and temperature detection value, including：
Resistance value digital quantity according to being sampled to obtain to corresponding 100 Ω precision resistances is tabled look-up, corresponding to obtain
Temperature correction value；
Resistance value digital quantity according to being sampled to obtain to corresponding PT100 resistance is tabled look-up, to obtain relevant temperature
Detected value.
Preferably, it is described corresponding PT100 resistance is sampled after, in addition to：
Control counter starts timing；
After the corresponding temperature detection value with the renewal of each difference, in addition to：
Judge whether the timing of the counter exceedes preset duration；
If the timing of the counter exceedes the preset duration, return in each numerical control analog switch of control
The step of channel selecting.
A kind of PT100 resistance temperature measurements system, including：Sampling A/D chip, 100 Ω precision resistances and MCU chip；Wherein：
The 100 Ω precision resistances are connected between the both positive and negative polarity of any sampling channel of the sampling A/D chip；
The SPI communication output ends of the sampling A/D chip are connected with the SPI communication inputs of the MCU chip；
The MCU chip is used for：The resistance for being sampled to obtain to the 100 Ω precision resistances according to the sampling A/D chip
Value digital quantity is tabled look-up, and obtains temperature correction value；Corresponding PT100 resistance is entered according to other sampling channels of the sampling A/D chip
The resistance value digital quantity that row sampling obtains is tabled look-up, and obtains each temperature detection value；Each temperature detection value is calculated respectively to subtract
The difference for going the temperature correction to be worth to, corresponding temperature detection value is updated with each difference.
Preferably, the sampling A/D chip is ADS1248IPM, and sampling A/D chip includes 4 sampling channels；
The MCU chip is STM32F103；
The 100 Ω precision resistances are connected between the both positive and negative polarity of first sampling channel of the sampling A/D chip.
A kind of PT100 resistance temperature measurements system, including：Sampling A/D chip, MCU chip, N number of 100 Ω precision resistances, N number of numerical control
Analog switch and N number of connection terminal；N is positive integer, is the sampling channel quantity of the sampling A/D chip；Wherein：
The positive pole of each sampling channel is respectively by corresponding numerical control analog switch, the output end with corresponding connection terminal
One end of positive pole or corresponding 100 Ω precision resistances is connected；
The negative pole of each sampling channel and the negative pole of output end of corresponding connection terminal and corresponding 100 Ω precision resistances
The other end is connected；
The input of each connection terminal is used to connect corresponding PT100 resistance；
The SPI communication output ends of the sampling A/D chip are connected with the SPI communication inputs of the MCU chip；
Output end of the control terminal and Enable Pin of each numerical control analog switch respectively with the MCU chip is connected；
The MCU chip is used for：The channel selecting in each numerical control analog switch is controlled, makes each sampling channel point
It is other that corresponding 100 Ω precision resistances and PT100 resistance are sampled, and the resistance value digital quantity obtained according to sampling is carried out respectively
Table look-up, to obtain relevant temperature corrected value and temperature detection value；Each temperature detection value is calculated respectively subtracts relevant temperature correction
The difference being worth to, corresponding temperature detection value is updated with each difference.
Preferably, the sampling A/D chip is ADS1248IPM, N 4；
The MCU chip is STM32F103VE；
Two numerical control analog switches are integrated into a CD4052B；
Two connection terminals are integrated into a terminal.
PT100 resistance temperature measurements method provided by the invention, by MCU chip according to any sampling channel pair of sampling A/D chip
The resistance value digital quantity that 100 Ω precision resistances are sampled to obtain is tabled look-up, and obtains temperature correction value；Further according to sampling A/D chip
The resistance value digital quantity that other sampling channels are sampled to obtain to corresponding PT100 resistance is tabled look-up, and obtains each temperature inspection
Measured value；Then each temperature detection value is calculated respectively subtracts the difference that temperature correction is worth to, it is corresponding with the renewal of each difference
Temperature detection value；And then realize that the thermometric for PT100 resistance is calibrated, and is improved sampling precision, is reduced of the prior art
Sampling deviation.
Brief description of the drawings
Technical scheme in order to illustrate the embodiments of the present invention more clearly or in prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, the accompanying drawing in description is only this below
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the structural representation for the PT100 resistance temperature measurement systems that prior art provides；
Fig. 2 is a kind of structural representation of PT100 resistance temperature measurements system provided in an embodiment of the present invention；
Fig. 3 is the flow chart of PT100 resistance temperature measurements method provided in an embodiment of the present invention；
Fig. 4 is PT100 temperature-resistances characteristic schematic diagram provided in an embodiment of the present invention；
Fig. 5 is the structural representation for another PT100 resistance temperature measurements system that another embodiment of the present invention provides；
Fig. 6 is the flow chart for another PT100 resistance temperature measurements method that another embodiment of the present invention provides；
Fig. 7 is the flow chart for another PT100 resistance temperature measurements method that another embodiment of the present invention provides.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present application, the technical scheme in the embodiment of the present application is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only some embodiments of the present application, rather than whole embodiments.It is based on
Embodiment in the application, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of the application protection.
The present invention provides a kind of PT100 resistance temperature measurements method, to solve the problems, such as to have sampling deviation in the prior art.
The PT100 resistance temperature measurement methods, applied to the MCU chip in PT100 resistance temperature measurement systems；As shown in Fig. 2 should
PT100 resistance temperature measurement systems also include：Sampling A/D chip and 100 Ω precision resistances R；The PT100 resistance temperature measurement methods, referring to Fig. 3,
Including：
S101, the resistance value numeral for being sampled to obtain to 100 Ω precision resistances according to any sampling channel of sampling A/D chip
Amount is tabled look-up, and obtains temperature correction value；
S102, the resistance value numeral for being sampled to obtain to corresponding PT100 resistance according to other sampling channels of sampling A/D chip
Amount is tabled look-up, and obtains each temperature detection value；
S103, each temperature detection value is calculated respectively subtract the difference that temperature correction is worth to, with each difference more cenotype
The temperature detection value answered.
Illustrated by taking the systems of PT100 resistance temperature measurements shown in Fig. 2 as an example, sampling A/D chip there are 4 sampling channels, is respectively
PT100 1, PT100 2, PT100 3 and PT100 4；Wherein, 100 Ω in parallel is accurate between PT100 1 (+) and PT100 1 (-)
Resistance R.The resistance value digital quantity of sampling A/D chip sampling uploads to upper MCU chip by SPI communications；First sampling channel
It is DATA1 that PT100 1, which samples the temperature value obtained after obtained resistance value digital quantity is tabled look-up, as the PT100 resistance temperature measurements system
The temperature correction value of system；Other sampling channels PT100 2, PT100 3 and PT100 4 sample obtained resistance value digital quantity and tabled look-up
The temperature value obtained afterwards is respectively DATA2, DATA3 and DATA4, three temperature detections as the PT100 resistance temperature measurement systems
Value；After DATA1 is obtained, the temperature detection value obtained by passage PT100 2, PT100 3 and PT100 4 is updated to respectively
DATA2-DATA1, DATA3-DATA1, DATA3-DATA1, so PT100 1 is arrived in the 100 Ω temperature value compensation sampled
In other sampling channels.
Specifically, MCU chip is tabled look-up according to resistance value digital quantity, the process of relevant temperature value is obtained, may refer to
PT100 temperature-resistance characteristic schematic diagrames shown in Fig. 4, wherein Y-axis are temperature values, and X-axis is resistance value, and (Xi, Yi) is to need to look into
The coordinate value of inquiry, Xi are obtained by the sampling of sampling A/D chip, (X1, the Y1) and (X2, Y2) point for positioning to obtain by dichotomy algorithm
It is not two coordinates adjacent with (Xi, Yi).
Set PT100 temperature-resistances characteristic equation as：Y=kX+b, wherein, k and b are calculated as follows：
So value according to Xi, k and b, you can temperature value Yi is calculated.
The PT100 resistance temperature measurement methods that the present embodiment provides, the thermometric for PT100 resistance is realized by said process
Calibration, improves sampling precision, reduces sampling deviation of the prior art, so that the systematic difference equipment can be more smart
Accurate control and protection that correlation is carried out according to temperature detection value.
What deserves to be explained is for scheme of the prior art without external calibration circuit, if it is placed on respectively same
4 PT100 resistance of test environment are coupled with 4 sampling channels of sampling A/D chip, are contrasted by instrument, its 4 temperature
Detected value can also have larger deviation；It is even if logical by other 3 samplings after carrying out sampling calibration by above-described embodiment
The temperature detection value that road obtains can also have certain deviation.Therefore, another embodiment of the present invention additionally provides another
PT100 resistance temperature measurement methods, the MCU chip being also applied in PT100 resistance temperature measurement systems；Its PT100 resistance temperature measurement system, ginseng
See Fig. 5, in addition to：Sampling A/D chip, N number of 100 Ω precision resistances (R1, R2, R3 and R4 in such as Fig. 5), N number of numerical control analog switch
And N number of connection terminal；N is positive integer, is the sampling channel quantity of sampling A/D chip；The PT100 resistance temperature measurement methods, referring to Fig. 6,
Including：
Channel selecting in S301, each numerical control analog switch of control, make each sampling channel respectively to corresponding 100 Ω essences
Cipher telegram is hindered and PT100 resistance is sampled；
S302, the resistance value digital quantity obtained according to sampling are tabled look-up respectively, to obtain relevant temperature corrected value and temperature
Spend detected value；
S303, each temperature detection value is calculated respectively subtract the difference that is worth to of relevant temperature correction, with each difference more
New corresponding temperature detection value.
Preferably, step S301, including：
The channel selecting in each numerical control analog switch is controlled, makes each sampling channel first to corresponding 100 Ω precision resistances
Sampled, then corresponding PT100 resistance is sampled.
Preferably, step S302, including：
Resistance value digital quantity according to being sampled to obtain to corresponding 100 Ω precision resistances is tabled look-up, corresponding to obtain
Temperature correction value；
Resistance value digital quantity according to being sampled to obtain to corresponding PT100 resistance is tabled look-up, to obtain relevant temperature
Detected value.
Preferably, after being sampled to corresponding PT100 resistance, in addition to：
Control counter starts timing；
After corresponding temperature detection value is updated with each difference, in addition to：
Judge whether the timing of counter exceedes preset duration；
If the timing of counter exceedes preset duration, return to step S301.
By the clocking capability, MCU chip can be made to realize every 1 minute sampling is once corrected, so be repeatedly
It can realize that dynamic calibration compensates in different environments, further reduce because the sampling that external environmental factor change is brought misses
Difference.
That is, referring to Fig. 7, the PT100 resistance temperature measurement methods specifically include：
Channel selecting in S401, each numerical control analog switch of control, make each sampling channel to the accurate electricity of corresponding 100 Ω
Resistance is sampled；
The resistance value digital quantity that S402, basis are sampled to obtain to corresponding 100 Ω precision resistances is tabled look-up, to obtain
Relevant temperature corrected value；
Channel selecting in S403, each numerical control analog switch of control, makes each sampling channel enter corresponding PT100 resistance
Row sampling；Meanwhile control counter starts timing；
The resistance value digital quantity that S404, basis are sampled to obtain to corresponding PT100 resistance is tabled look-up, corresponding to obtain
Temperature detection value；
S405, each temperature detection value is calculated respectively subtract the difference that is worth to of relevant temperature correction, with each difference more
New corresponding temperature detection value；
S406, judge whether the timing of counter exceedes preset duration；
If the timing of counter exceedes preset duration, return to step S401.If the timing of counter not less than it is default when
Grow, then return to step S404.
Fig. 5 is shown by taking N=4 as an example, is illustrated by taking Fig. 5 as an example, sampling A/D chip ADS1248IPM, N 4；MCU
Chip is STM32F103VE；Two numerical control analog switches are integrated into a CD4052B；Two connection terminals are integrated into an end
Son.Sampling A/D chip has 4 sampling channels, respectively PT100 1, PT100 2, PT100 3 and PT100 4.CD4052B is one
The channel number word of difference 4 controls analog switch, by controlling two binary control terminals A, B to gate output channel and Enable Pin
INH enables output.Control terminal A, B and Enable Pin INH are controlled by the output end of MCU chip.Due to its each energy
Two paths of signals is exported, therefore ADS1248IPW sampling A/D chip needs to use 2 CD4052B to be gated.Can from Fig. 5
Find out, the PT100 1 (+) of terminal and 100 Ω precision resistances R1 one end be coupled with CD4052B input port XIN2 and
XIN1, the passage X1 of gating is connected on ADS1248IPW PT100 1 (+).The accurate electricity of the PT100 1 (-) and 100 Ω of terminal
The resistance R1 other end is directly connected to ADS1248IPW PT100 1 (-).The PT100 2 (+) of terminal and 100 Ω precision resistances R2
One end be coupled with CD4052B input port YIN2 and YIN1, the passage Y1 of gating is connected to ADS1248IPW PT100 2
In (+).The PT100 2 (-) of terminal and 100 Ω precision resistances the R2 other end are directly connected to ADS1248IPW PT100 2
(-).Also analogize for passage 3 and passage 4, no longer repeat one by one herein.
Illustrated by taking the CD4052B of top half in Fig. 5 as an example, its control terminal A, B and Enable Pin INH signal are with connecing
The relation of circulation passage is as shown in table 1：
CD4052B control terminals A, B of table 1 and Enable Pin INH signal and the relation for connecting passage
| INH1 | B1 | A1 | Connect passage |
| 0 | 0 | 0 | XIN1, YIN1 |
| 0 | 0 | 1 | XIN2, YIN2 |
| 1 | x | x | None |
In specific practical application, the initial configuration of MCU chip specifically includes：System clock configuration, GPIO
(General Purpose Input Output, universal input/output) configuration, USART (Universal Synchronous/
Asynchronous Receiver/Transmitter, universal synchronous/asynchronous serial reception/transmitter) configuration, interrupt configuration,
Sampling A/D chip initialization, periodic sampling pattern and delay, and return period sampling configuration after delay.Completed just to MCU chip
After beginningization, 100 Ω precision resistances of gating export to obtain temperature correction value Delta1, Delta2, Delta3 and Delta4.Then
Gate actual PT100 to export to obtain sampled value, temperature detection value is subtracted after corresponding Delta values have obtained final calibration
Temperature detection value, reduce sampling error so that the systematic difference equipment can more accurately according to temperature detection value come
Carry out related control and protection.
Another embodiment of the present invention additionally provides a kind of PT100 resistance temperature measurements system, referring to Fig. 2, including：Sampling A/D chip,
100 Ω precision resistances R and MCU chip；Wherein：
100 Ω precision resistances R are connected between the both positive and negative polarity of any sampling channel of sampling A/D chip；
The SPI communication output ends of sampling A/D chip are connected with the SPI communication inputs of MCU chip；
MCU chip is used for：The 100 Ω precision resistances R resistance value digital quantities for being sampled to obtain are entered according to sampling A/D chip
Row is tabled look-up, and obtains temperature correction value；The electricity for being sampled to obtain to corresponding PT100 resistance according to other sampling channels of sampling A/D chip
Resistance digital quantity is tabled look-up, and obtains each temperature detection value；Calculating each temperature detection value respectively and subtracting temperature correction is worth
The difference arrived, corresponding temperature detection value is updated with each difference.
Preferably, sampling A/D chip ADS1248IPM, sampling A/D chip include 4 sampling channels；
MCU chip is STM32F103；
100 Ω precision resistances are connected between the both positive and negative polarity of first sampling channel of sampling A/D chip.
Remaining operation principle is same as the previously described embodiments, no longer repeats one by one herein.
Another embodiment of the present invention additionally provides another PT100 resistance temperature measurement system, referring to Fig. 5, including：Sample core
Piece, MCU chip, N number of 100 Ω precision resistances (R1, R2, R3 and R4 in such as Fig. 5), N number of numerical control analog switch and N number of connection end
Son；N is positive integer, is the sampling channel quantity of sampling A/D chip；Wherein：
The positive pole of each sampling channel is respectively by corresponding numerical control analog switch, the output head anode with corresponding connection terminal
Or one end of corresponding 100 Ω precision resistances is connected；
The negative pole of output end of the negative pole of each sampling channel and corresponding connection terminal and corresponding 100 Ω precision resistances it is another
End is connected；
The input of each connection terminal is used to connect corresponding PT100 resistance；
The SPI communication output ends of sampling A/D chip are connected with the SPI communication inputs of MCU chip；
The control terminal and Enable Pin of each numerical control analog switch are connected with the output end of MCU chip respectively；
MCU chip is used for：The channel selecting in each numerical control analog switch is controlled, makes each sampling channel respectively to corresponding
100 Ω precision resistances and PT100 resistance are sampled, and the resistance value digital quantity obtained according to sampling is tabled look-up respectively, with
Obtain relevant temperature corrected value and temperature detection value；Each temperature detection value is calculated respectively subtracts what relevant temperature correction was worth to
Difference, corresponding temperature detection value is updated with each difference.
Preferably, sampling A/D chip ADS1248IPM, N 4；
MCU chip is STM32F103VE；
Two numerical control analog switches are integrated into a CD4052B；
Two connection terminals are integrated into a terminal.
Concrete operating principle is same as the previously described embodiments, no longer repeats one by one herein.
Each embodiment is described by the way of progressive in the present invention, and what each embodiment stressed is and other realities
Apply the difference of example, between each embodiment identical similar portion mutually referring to.For device disclosed in embodiment
Speech, because it is corresponded to the method disclosed in Example, so description is fairly simple, related part is referring to method part illustration
.
The above described is only a preferred embodiment of the present invention, any formal limitation not is made to the present invention.Though
So the present invention is disclosed above with preferred embodiment, but is not limited to the present invention.It is any to be familiar with those skilled in the art
Member, without departing from the scope of the technical proposal of the invention, all using the methods and technical content of the disclosure above to the present invention
Technical scheme makes many possible changes and modifications, or is revised as the equivalent embodiment of equivalent variations.Therefore, it is every without departing from
The content of technical solution of the present invention, the technical spirit according to the present invention is to any simple modification made for any of the above embodiments, equivalent
Change and modification, still fall within technical solution of the present invention protection in the range of.
Claims (9)
- A kind of 1. PT100 resistance temperature measurements method, it is characterised in that applied to the micro-control unit in PT100 resistance temperature measurement systems MCU chip；The PT100 resistance temperature measurements system also includes：Sampling A/D chip and 100 Ω precision resistances；The PT100 resistance temperature measurements Method includes：The resistance value digital quantity for being sampled to obtain to the 100 Ω precision resistances according to any sampling channel of the sampling A/D chip Tabled look-up, obtain temperature correction value；Carried out according to the resistance value digital quantity that other sampling channels of the sampling A/D chip are sampled to obtain to corresponding PT100 resistance Table look-up, obtain each temperature detection value；Each temperature detection value is calculated respectively and subtracts the difference that the temperature correction is worth to, and corresponding temperature is updated with each difference Spend detected value.
- A kind of 2. PT100 resistance temperature measurements method, it is characterised in that applied to the MCU chip in PT100 resistance temperature measurement systems；Institute Stating PT100 resistance temperature measurement systems also includes：Sampling A/D chip, N number of 100 Ω precision resistances, N number of numerical control analog switch and N number of connection Terminal；N is positive integer, is the sampling channel quantity of the sampling A/D chip；The PT100 resistance temperature measurements method includes：The channel selecting in each numerical control analog switch is controlled, makes each sampling channel respectively to the accurate electricity of corresponding 100 Ω Resistance and PT100 resistance are sampled；Tabled look-up respectively according to the resistance value digital quantity that sampling obtains, to obtain relevant temperature corrected value and temperature detection value；Each temperature detection value is calculated respectively and subtracts the difference that relevant temperature correction is worth to, and corresponding temperature is updated with each difference Spend detected value.
- 3. PT100 resistance temperature measurements method according to claim 2, it is characterised in that each numerical control simulation of control is opened Channel selecting inside the Pass, each sampling channel is set to be sampled respectively to corresponding 100 Ω precision resistances and PT100 resistance, Including：The channel selecting in each numerical control analog switch is controlled, makes each sampling channel first to corresponding 100 Ω precision resistances Sampled, then corresponding PT100 resistance is sampled.
- 4. the PT100 resistance temperature measurement methods according to Claims 2 or 3, it is characterised in that the electricity obtained according to sampling Resistance digital quantity is tabled look-up respectively, to obtain relevant temperature corrected value and temperature detection value, including：Resistance value digital quantity according to being sampled to obtain to corresponding 100 Ω precision resistances is tabled look-up, to obtain relevant temperature Corrected value；Resistance value digital quantity according to being sampled to obtain to corresponding PT100 resistance is tabled look-up, to obtain relevant temperature detection Value.
- 5. PT100 resistance temperature measurements method according to claim 3, it is characterised in that enter described to corresponding PT100 resistance After row sampling, in addition to：Control counter starts timing；After the corresponding temperature detection value with the renewal of each difference, in addition to：Judge whether the timing of the counter exceedes preset duration；If the timing of the counter exceedes the preset duration, the passage in each numerical control analog switch of control is returned The step of selection.
- A kind of 6. PT100 resistance temperature measurements system, it is characterised in that including：Sampling A/D chip, 100 Ω precision resistances and MCU chip； Wherein：The 100 Ω precision resistances are connected between the both positive and negative polarity of any sampling channel of the sampling A/D chip；The SPI communication output ends of the sampling A/D chip are connected with the SPI communication inputs of the MCU chip；The MCU chip is used for：The resistance value number for being sampled to obtain to the 100 Ω precision resistances according to the sampling A/D chip Word amount is tabled look-up, and obtains temperature correction value；Corresponding PT100 resistance is adopted according to other sampling channels of the sampling A/D chip The resistance value digital quantity that sample obtains is tabled look-up, and obtains each temperature detection value；Each temperature detection value is calculated respectively subtracts institute The difference that temperature correction is worth to is stated, corresponding temperature detection value is updated with each difference.
- 7. PT100 resistance temperature measurements system according to claim 6, it is characterised in that the sampling A/D chip is ADS1248IPM, sampling A/D chip include 4 sampling channels；The MCU chip is STM32F103；The 100 Ω precision resistances are connected between the both positive and negative polarity of first sampling channel of the sampling A/D chip.
- A kind of 8. PT100 resistance temperature measurements system, it is characterised in that including：The accurate electricity of sampling A/D chip, MCU chip, N number of 100 Ω Resistance, N number of numerical control analog switch and N number of connection terminal；N is positive integer, is the sampling channel quantity of the sampling A/D chip；Wherein：The positive pole of each sampling channel is respectively by corresponding numerical control analog switch, the output head anode with corresponding connection terminal Or one end of corresponding 100 Ω precision resistances is connected；The negative pole of each sampling channel and the negative pole of output end of corresponding connection terminal and corresponding 100 Ω precision resistances it is another End is connected；The input of each connection terminal is used to connect corresponding PT100 resistance；The SPI communication output ends of the sampling A/D chip are connected with the SPI communication inputs of the MCU chip；Output end of the control terminal and Enable Pin of each numerical control analog switch respectively with the MCU chip is connected；The MCU chip is used for：The channel selecting in each numerical control analog switch is controlled, makes each sampling channel right respectively Corresponding 100 Ω precision resistances and PT100 resistance are sampled, and the resistance value digital quantity obtained according to sampling is looked into respectively Table, to obtain relevant temperature corrected value and temperature detection value；Each temperature detection value is calculated respectively subtracts relevant temperature corrected value Obtained difference, corresponding temperature detection value is updated with each difference.
- 9. PT100 resistance temperature measurements system according to claim 8, it is characterised in that the sampling A/D chip is ADS1248IPM, N 4；The MCU chip is STM32F103VE；Two numerical control analog switches are integrated into a CD4052B；Two connection terminals are integrated into a terminal.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109341890A (en) * | 2018-10-22 | 2019-02-15 | 安徽鸿创新能源动力有限公司 | A kind of BMS temperature acquisition system and measurement method based on NTC temperature sensor |
| CN110907055A (en) * | 2019-12-14 | 2020-03-24 | 中车大连电力牵引研发中心有限公司 | Simple method for testing PT100 temperature signal by TCU |
| CN112649105A (en) * | 2020-12-26 | 2021-04-13 | 青岛鼎信通讯股份有限公司 | PT100 temperature calibration and measurement method |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005321239A (en) * | 2004-05-07 | 2005-11-17 | Yokogawa Electric Corp | Temperature transmitter |
| CN2929679Y (en) * | 2006-06-23 | 2007-08-01 | 中国石油天然气集团公司 | Temperature measurer |
| CN203323910U (en) * | 2013-07-08 | 2013-12-04 | 甘肃农业大学 | High-precision temperature signal measuring circuit |
| CN104535217A (en) * | 2014-12-30 | 2015-04-22 | 郑州光力科技股份有限公司 | Multi-channel temperature measurement circuit |
| CN106092363A (en) * | 2016-07-27 | 2016-11-09 | 北京交通大学 | A kind of temperature sensor circuit based on Pt100 and temp measuring method thereof |
| CN205843835U (en) * | 2016-07-20 | 2016-12-28 | 中山大学 | Apply the platinum resistance digital thermometer of dynamic constant-current source |
| CN205843836U (en) * | 2016-07-27 | 2016-12-28 | 江南大学 | The platinum resistance temperature measuring circuit that a kind of constant-current source drives |
-
2017
- 2017-09-06 CN CN201710796142.7A patent/CN107560762A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005321239A (en) * | 2004-05-07 | 2005-11-17 | Yokogawa Electric Corp | Temperature transmitter |
| CN2929679Y (en) * | 2006-06-23 | 2007-08-01 | 中国石油天然气集团公司 | Temperature measurer |
| CN203323910U (en) * | 2013-07-08 | 2013-12-04 | 甘肃农业大学 | High-precision temperature signal measuring circuit |
| CN104535217A (en) * | 2014-12-30 | 2015-04-22 | 郑州光力科技股份有限公司 | Multi-channel temperature measurement circuit |
| CN205843835U (en) * | 2016-07-20 | 2016-12-28 | 中山大学 | Apply the platinum resistance digital thermometer of dynamic constant-current source |
| CN106092363A (en) * | 2016-07-27 | 2016-11-09 | 北京交通大学 | A kind of temperature sensor circuit based on Pt100 and temp measuring method thereof |
| CN205843836U (en) * | 2016-07-27 | 2016-12-28 | 江南大学 | The platinum resistance temperature measuring circuit that a kind of constant-current source drives |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109341890A (en) * | 2018-10-22 | 2019-02-15 | 安徽鸿创新能源动力有限公司 | A kind of BMS temperature acquisition system and measurement method based on NTC temperature sensor |
| CN109341890B (en) * | 2018-10-22 | 2021-05-14 | 安徽鸿创新能源动力有限公司 | BMS temperature acquisition system and measurement method based on NTC temperature sensor |
| CN110907055A (en) * | 2019-12-14 | 2020-03-24 | 中车大连电力牵引研发中心有限公司 | Simple method for testing PT100 temperature signal by TCU |
| CN112649105A (en) * | 2020-12-26 | 2021-04-13 | 青岛鼎信通讯股份有限公司 | PT100 temperature calibration and measurement method |
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