CN107550500A - The method of testing and system of high ferro dispatcher's response inhabitation ability - Google Patents
The method of testing and system of high ferro dispatcher's response inhabitation ability Download PDFInfo
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Abstract
The present invention provides a kind of method of testing and system of high ferro dispatcher response inhabitation ability, and methods described includes：Test question is shown by display module, the entitled Go/Nogo tests of test；Eeg data when high ferro dispatcher answers to the test question is gathered by brain wave acquisition module；The test question is recorded by the logging modle correspondingly to answer result；If the test entitled Go test, the test question is recorded by the logging modle and correspondingly answered duration；The test result of the high ferro dispatcher response inhabitation ability is determined based on duration of being answered corresponding to each Go tests in eeg data, result of answering and whole test questions corresponding to each test question in whole test questions.Using the embodiment of the present invention, high ferro dispatcher's response inhabitation ability can objectively, be comprehensively assessed, and quantization displaying can be carried out to the ability of high ferro dispatcher's response inhabitation, reference frame is provided for the choice of high ferro dispatcher, feedback on performance.
Description
Technical field
The present invention relates to the evaluation technology field of response inhabitation ability, more particularly to a kind of high ferro dispatcher response inhabitation energy
The method of testing and system of power.
Background technology
Generally, high ferro dispatcher needs to monitor the video of the train operation in screen, when in face of emergency situations,
High ferro dispatcher needs to make the reaction and judgement done/do not done, and interrupts or delay lines can all have an immense impact on to traffic safety.Cause
The ability of the response inhabitation of this high ferro dispatcher turns into one of important ability evaluation project.How high ferro dispatcher reaction is assessed
Rejection ability, quantization displaying is carried out to the ability of high ferro dispatcher's response inhabitation, turns into current urgent problem.
The content of the invention
In view of this, the present invention provides a kind of method of testing and system of high ferro dispatcher response inhabitation ability, to solve
The problem of high ferro dispatcher's response inhabitation ability can not being assessed and quantifying displaying.
To achieve the above object, it is as follows to provide technical scheme by the present invention：
According to the first aspect of the invention, it is proposed that a kind of method of testing of high ferro dispatcher response inhabitation ability, it is described
Method includes：
Test question is shown by display module, the entitled Go/Nogo tests of test；
Eeg data when high ferro dispatcher answers to the test question is gathered by brain wave acquisition module；
The test question is recorded by the logging modle correspondingly to answer result；
If the test entitled Go test, the test question is recorded by the logging modle and correspondingly answered duration；
Based on each in eeg data, result of answering and whole test questions corresponding to each test question in whole test questions
Duration of being answered corresponding to individual Go tests determines the test result of the high ferro dispatcher response inhabitation ability.
According to the second aspect of the invention, it is proposed that a kind of test system of high ferro dispatcher response inhabitation ability, including：
First display module, for being shown by display module to test question, the entitled Go/Nogo of test is surveyed
Examination；
Brain electric data collecting module, when being answered for gathering high ferro dispatcher by brain wave acquisition module to the test question
Eeg data；
As a result logging modle, correspondingly answered result for recording the test question by the logging modle；
Duration logging modle, if for the entitled Go tests of the test, the test is recorded by the logging modle
The corresponding duration of answering of topic；
Test result determining module, for based on eeg data corresponding to each test question in whole test questions, answer
As a result duration of being answered corresponding to each Go tests and in whole test questions determines the high ferro dispatcher response inhabitation ability
Test result.
From above technical scheme, terminal device is shown by display module to test question, passes through brain wave acquisition
Eeg data of module collection high ferro dispatcher when being answered to test question, test question is recorded by logging modle and correspondingly answered knot
Fruit, if testing entitled Go test, test question is recorded by logging modle and correspondingly answered duration, terminal device is based on all testing
When being answered in topic in eeg data, result of answering and whole test questions corresponding to each test question corresponding to each Go tests
The long test result for determining high ferro dispatcher's response inhabitation ability, realize and objectively, comprehensively assess high ferro dispatcher reaction
Rejection ability, and quantization displaying can be carried out to the ability of high ferro dispatcher's response inhabitation, it is choice, the achievement of high ferro dispatcher
Examination provides reference frame.
Brief description of the drawings
It is incorporated into specification and the accompanying drawing of a part for constitution instruction shows embodiments of the invention, and with
Description is used for the principle for explaining the present invention together.In the drawings, similar reference is used to represent similar key element.Under
Accompanying drawing in the description of face is some embodiments of the present invention, rather than whole embodiments.Come for those of ordinary skill in the art
Say, on the premise of not paying creative work, other accompanying drawings can be obtained according to these accompanying drawings.
Fig. 1 schematically illustrates a kind of flow chart of the method for testing of high ferro dispatcher response inhabitation ability；
Fig. 2 schematically illustrates a kind of structured flowchart of the test system of high ferro dispatcher response inhabitation ability.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
Part of the embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art
The every other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.Need
Illustrate, in the case where not conflicting, the feature in embodiment and embodiment in the application can be mutually combined.
Fig. 1 schematically illustrates a kind of flow chart of the method for testing of high ferro dispatcher response inhabitation ability, such as Fig. 1 institutes
Show, a kind of method of testing of high ferro dispatcher response inhabitation ability, comprise the following steps：
Step 101：Test question is shown by display module, tests entitled Go/Nogo tests.
Step 102：Eeg data when high ferro dispatcher answers to test question is gathered by brain wave acquisition module.
Step 103：Test question is recorded by logging modle correspondingly to answer result.
Step 104：If testing entitled Go test, test question is recorded by logging modle and correspondingly answered duration.
Step 105：Based on eeg data, result of answering and all tests corresponding to each test question in whole test questions
Duration of being answered in topic corresponding to each Go tests determines the test result of high ferro dispatcher's response inhabitation ability.
In a step 101, in one embodiment, the present invention can be applied in computer, smart mobile phone, tablet personal computer, intelligence
On the terminal devices such as energy wrist-watch, display module can be the displaying interface of terminal device.Test question can be that Go/Nogo is tested,
Specifically, test is, for example,：When show in interface occur Go test corresponding to green when, high ferro dispatcher needs to press button；
When show in interface occur Nogo test corresponding to red when, high ferro dispatcher need not press button.Red point and green point are random
Occur, it can be 500ms interval occur, and total length of testing speech can be 12 minutes.It will be appreciated by persons skilled in the art that
Above-mentioned test question is merely illustrative, and does not form limitation of the present invention.
In a step 102, in one embodiment, brain wave acquisition module can be that external brain electricity cap of terminal device etc. can be with
With gathering eeg data device.Specifically, the correlation that the content of the sampling process of brain wave acquisition module refers to prior art is retouched
State, therefore not to repeat here.
In step 103, in one embodiment, terminal device records test question by logging modle and correspondingly answered result.
When showing that high ferro dispatcher presses button and then represents correct when occurring at green in interface, button indication " failing to report " is not pressed；Work as exhibition
Show in interface that high ferro dispatcher presses button and then represents " to report by mistake " when occurring at red, it is correct not press button indication.
At step 104, in one embodiment, occur the situation of green point corresponding to Go tests for displaying interface, answer
The start time point of duration is that test question starts the time point of displaying at displaying interface, and the termination time point for duration of answering is terminal
Equipment receives time point when high ferro dispatcher presses button.
In step 105, in one embodiment, based on eeg data corresponding to each test question in whole test questions,
Duration of being answered in result of answering and whole test questions corresponding to each Go tests determines high ferro dispatcher's response inhabitation ability
Test result.
Specifically, the step 105 can include：
Based on result of being answered corresponding to each test question in whole test questions, it is determined that Go tests are corresponding in whole test questions
Rate of failing to report and whole test questions in Nogo test corresponding to rate of false alarm；
Based on duration of being answered corresponding to each Go tests in whole test questions, it is determined that duration of averagely answering；
Based on eeg data corresponding to each test question in whole test questions, it is determined that Go tests are corresponding in whole test questions
The first event related potential (Event Related Potential, abbreviation ERP) waveform, NoGo is tested in whole test questions
3rd ERP waveforms corresponding to NoGo tests in corresponding 2nd ERP waveforms and whole test questions；
Determine that the first ERP waveforms correspond to the first wave amplitude and the first latency values of P3 compositions；
Determine that the 2nd ERP waveforms correspond to the second wave amplitude and the second latency values of N2 compositions；
Determine that the 3rd ERP waveforms correspond to the 3rd wave amplitude and the 3rd latency values of P3 compositions；
Based on rate of false alarm, rate of failing to report, duration of averagely answering, the first wave amplitude, the first latency values, the second wave amplitude,
Two latency values, the 3rd wave amplitude and the 3rd latency values determine test result.
Wherein, it is with reference to the test question in step 101, rate of failing to report：Green corresponding to Go tests to point out now, terminal device is not
Receive the push-botton operation instruction of high ferro dispatcher；Rate of false alarm is：It is red corresponding to NoGo tests to point out current, terminal device reception
Push-botton operation to high ferro dispatcher instructs.Mean time when a length of high ferro dispatcher answers to Go tests when averagely answering
Long, NoGo tests need not record duration of answering.The first ERP waveforms, the 2nd ERP waveforms and the 3rd are determined for terminal device
The process of ERP waveforms, by taking the determination process of the first ERP waveforms as an example：Terminal device is to corresponding to Go tests in whole test questions
Eeg data, carry out interference and handle.Interference processing is gone to include removing eye electrical interference and remove high-frequency information interference etc., for example,
The eye electrical interference in eeg data can be removed by the software installed on terminal device, by setting 30Hz LPFs to remove
High-frequency information disturbs.After interference processing is removed to eeg data, each Go is tested on displaying interface and shown by terminal device
At the time of as 0 point of benchmark, the data waveform in analysis extraction preset duration 800ms (- 200ms to 600ms), with test question exhibition
200ms carries out baseline correction before showing, being considered as artefact to data of the wave amplitude in duration 800ms more than ± 100 μ v removes, artefact be by
High ferro dispatcher rubs one's eyes, larger invalid eeg data caused by body swing.Finally, by being superimposed all tests
Waveform corresponding to each Go tests, determines the first ERP waveforms in topic.It will be appreciated by persons skilled in the art that above-mentioned
Determination process is exemplary illustration corresponding to one ERP waveforms, can not form limitation of the present invention.Similar, terminal device
By being superimposed in whole test questions waveform corresponding to each NoGo tests, the 2nd ERP waveforms and the 3rd ERP waveforms are determined, is had
Body process is similar with the determination process of the first ERP waveforms, and therefore not to repeat here.Determine that P3 compositions are corresponding in the first ERP waveforms
The first wave amplitude x1With the first latency values x2, determine N2 compositions corresponding second wave amplitude x in the 2nd ERP waveforms3With
Two latency values x4, determine P3 compositions corresponding 3rd wave amplitude x in the 3rd ERP waveforms5With the 3rd latency values x6。
Specifically, based on rate of false alarm, rate of failing to report, duration of averagely answering, the first wave amplitude, the first latency values, the second ripple
Amplitude, the second latency values, the 3rd wave amplitude and the 3rd latency values determine that test result includes：
Based on rate of false alarm, rate of failing to report, duration of averagely answering, the first wave amplitude, the first latency values, the second wave amplitude,
Two latency values, the 3rd wave amplitude and the 3rd latency values determine result cluster；
Result cluster is classified based on default grader, determines test result.
Wherein, using rate of false alarm as x7, rate of failing to report x8, a length of x when averagely answering9Exemplified by, according to the first wave amplitude x1,
One latency values x2, the second wave amplitude x3, the second latency values x4, the 3rd wave amplitude x5With the 3rd latency values x6, rate of false alarm x7,
Rate of failing to report x8, averagely answer duration x9Significance level in the test of high ferro dispatcher's response inhabitation ability, it is determined that and first wave
Amplitude x1, the first latency values x2, the second wave amplitude x3, the second latency values x4, the 3rd wave amplitude x5With the 3rd latency values x6、
Rate of false alarm x7, rate of failing to report x8, averagely answer duration x9First default weight w corresponding to respectively1, the second default weight w2, it is the 3rd pre-
If weight w3, the 4th default weight w4, the 5th default weight w5, the 6th default weight w6, the 7th default weight w7, the 8th default power
Weight w8, the 9th default weight w9.Pass through formulaDetermine result cluster.Wherein h ω, b are
As a result cluster, f are transfer function, and xi includes the first wave amplitude x1, the first latency values x2, the second wave amplitude x3, the second latency values
x4, the 3rd wave amplitude x5With the 3rd latency values x6, rate of false alarm x7, rate of failing to report x8, averagely answer duration x9；It is pre- that ω i include first
If weight w1, the second default weight w2, the 3rd default weight w3, the 4th default weight w4, the 5th default weight w5, the 6th default power
Weight w6, the 7th default weight w7, b is the threshold value of hidden layer.
Default grader includes the graders such as Logistic graders, softmax graders.Using default grader as
Exemplified by Softmax graders, terminal device is classified result cluster by Softmax graders, obtains classification results y (i)
∈{1,2,3,4}.Pass through default corresponding relation：
As y (i)=1, test result is 90~100 points；
As y (i)=2, test result is 80~90 points；
As y (i)=3, test result is 70~80 points；
As y (i)=4, test result is 60~70 points.
Final test result can be obtained based on classification results.
In the embodiment of the present invention, terminal device is shown by display module to test question, passes through brain wave acquisition module
Eeg data when collection high ferro dispatcher answers to test question, high ferro dispatcher is recorded by logging modle test question is answered
When result of answering, if testing entitled Go test, test question is recorded by logging modle and correspondingly answered duration, terminal device base
Each Go tests pair in eeg data, result of answering and whole test questions corresponding to each test question in whole test questions
The duration of answering answered determines the test result of high ferro dispatcher's response inhabitation ability, realize objectively, comprehensively assess high ferro
Dispatcher's response inhabitation ability, and quantization displaying can be carried out to the ability of high ferro dispatcher's response inhabitation, it is high ferro dispatcher
Choice, feedback on performance provide reference frame.
Further it is proposed that the method for testing of high ferro dispatcher's response inhabitation ability also include：
Time point when record is shown by display module to test question；
If the time difference between current point in time and time point is equal to preset duration and does not receive result of answering, pass through exhibition
Show that module is shown to next test question.
Wherein, preset duration is the duration of test question switching.Specifically, pass through exhibition with reference to step 101, such as terminal device
It is 00 to show time point when module is shown to test question:00, if current point in time and 00:Time difference between 00 is equal to pre-
If duration 500ms, then terminal device is shown by display module to next test question., can be with by changing preset duration
Adjust integrated testability topic complexity so that user according to their needs, the complexity of flexible modulation test question.
Fig. 2 schematically illustrates a kind of structured flowchart of the test system of high ferro dispatcher response inhabitation ability, and it is
System corresponding to the method for testing illustrated embodiment of above-mentioned each high ferro dispatcher response inhabitation ability, above-mentioned each high ferro dispatcher are anti-
The explanation of the method for testing illustrated embodiment of rejection ability is answered to be applied to the present embodiment.As shown in Fig. 2 the test system bag
Include：
First display module 21, for being shown by display module to test question, the entitled Go/Nogo of test is surveyed
Examination；
Brain electric data collecting module 22, the test question is answered for gathering high ferro dispatcher by brain wave acquisition module
When eeg data；
As a result logging modle 23, correspondingly answered result for recording the test question by the logging modle；
Duration logging modle 24, if for the entitled Go tests of the test, the survey is recorded by the logging modle
Examination question is correspondingly answered duration；
Test result determining module 25, for based on eeg data, work corresponding to each test question in whole test questions
Answer duration of being answered in result and whole test questions corresponding to each Go tests and determine the high ferro dispatcher response inhabitation ability
Test result.
Preferably, test result determining module includes：
First determination sub-module (not shown), for based on being answered corresponding to each test question in whole test questions
As a result, determine in whole test questions in rate of failing to report corresponding to Go tests and whole test questions corresponding to Nogo tests by mistake
Report rate；
Second determination sub-module (not shown), for based in whole test questions each Go test corresponding to answer
Duration, it is determined that duration of averagely answering；
3rd determination sub-module (not shown), for based on brain electricity corresponding to each test question in whole test questions
Data, determine that NoGo tests are corresponding in the first ERP waveforms, whole test questions corresponding to Go tests in whole test questions
The 2nd ERP waveforms and whole test questions in NoGo test corresponding to the 3rd ERP waveforms；
4th determination sub-module (not shown), for determining that the first ERP waveforms correspond to the first wave of P3 compositions
Amplitude and the first latency values；
5th determination sub-module (not shown), for determining that the 2nd ERP waveforms correspond to the second ripple of N2 compositions
Amplitude and the second latency values；
6th determination sub-module, dived for determining that the 3rd ERP waveforms correspond to the 3rd wave amplitude of P3 compositions and the 3rd
Lie prostrate time value；
7th determination sub-module (not shown), for based on the rate of false alarm, the rate of failing to report, described averagely answer
Duration, first wave amplitude, first latency values, second wave amplitude, second latency values, the described 3rd
Wave amplitude and the 3rd latency values determine test result.
Preferably, the 7th determination sub-module includes：
As a result cluster determining unit (not shown), for based on the rate of false alarm, the rate of failing to report, described averagely answer
Duration, first wave amplitude, first latency values, second wave amplitude, second latency values, the described 3rd
Wave amplitude and the 3rd latency values determine result cluster；
Test result determining unit (not shown), for being classified based on default grader to the result cluster,
Determine test result.
Preferably, test system can also include：
Time point logging modle 26, for recording time when being shown by the display module to the test question
Point；
Second display module 27, if for the time difference between current point in time and the time point be equal to preset duration and
Result of answering is not received, then next test question is shown by the display module.
The course of work of the test system of high ferro dispatcher response inhabitation ability proposed by the present invention is summarized as follows：Terminal is set
It is standby that test question is shown by display module, gathered by brain wave acquisition module when high ferro dispatcher answers to test question
Eeg data, test question is recorded by logging modle and correspondingly answered result, if testing entitled Go tests, remembered by logging modle
Record test question is correspondingly answered duration, and terminal device is based in whole test questions eeg data corresponding to each test question, answered
As a result duration of being answered corresponding to each Go tests and in whole test questions determines the test of high ferro dispatcher's response inhabitation ability
As a result.
The embodiment of the present invention, realize objectively, comprehensively assess high ferro dispatcher's response inhabitation ability, and can be to height
The ability of iron dispatcher's response inhabitation carries out quantization displaying, and reference frame is provided for the choice of high ferro dispatcher, feedback on performance.
Descriptions above can combine implementation individually or in a variety of ways, and these variants all exist
Within protection scope of the present invention.
Finally it should be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations.Although
The present invention is described in detail with reference to the foregoing embodiments, it will be understood by those within the art that：It still may be used
To be modified to the technical scheme described in foregoing embodiments, or equivalent substitution is carried out to which part technical characteristic；
And these modification or replace, do not make appropriate technical solution essence depart from various embodiments of the present invention technical scheme spirit and
Scope.
Claims (8)
1. a kind of method of testing of high ferro dispatcher response inhabitation ability, it is characterised in that methods described includes：
Test question is shown by display module, the entitled Go/Nogo tests of test；
Eeg data when high ferro dispatcher answers to the test question is gathered by brain wave acquisition module；
The test question is recorded by the logging modle correspondingly to answer result；
If the test entitled Go test, the test question is recorded by the logging modle and correspondingly answered duration；
Based on each Go in eeg data, result of answering and whole test questions corresponding to each test question in whole test questions
Duration of being answered corresponding to test determines the test result of the high ferro dispatcher response inhabitation ability.
2. according to the method for claim 1, it is characterised in that described corresponding based on each test question in whole test questions
Eeg data, duration of being answered corresponding to each Go tests in result of answering and whole test questions determine the high ferro dispatcher
The test result of response inhabitation ability, including：
Based on result of being answered corresponding to each test question in whole test questions, determine that Go tests are corresponding in whole test questions
Rate of failing to report and whole test questions in Nogo test corresponding to rate of false alarm；
Based on duration of being answered corresponding to each Go tests in whole test questions, it is determined that duration of averagely answering；
Based on eeg data corresponding to each test question in whole test questions, determine that Go tests are corresponding in whole test questions
The first ERP waveforms, NoGo in the 2nd ERP waveforms corresponding to NoGo tests and whole test questions in whole test questions
3rd ERP waveforms corresponding to test；
Determine that the first ERP waveforms correspond to the first wave amplitude and the first latency values of P3 compositions；
Determine that the 2nd ERP waveforms correspond to the second wave amplitude and the second latency values of N2 compositions；
Determine that the 3rd ERP waveforms correspond to the 3rd wave amplitude and the 3rd latency values of P3 compositions；
Based on the rate of false alarm, the rate of failing to report, the duration of averagely answering, first wave amplitude, first incubation period
Value, second wave amplitude, second latency values, the 3rd wave amplitude and the 3rd latency values determine test knot
Fruit.
3. according to the method for claim 2, it is characterised in that it is described based on the rate of false alarm, it is the rate of failing to report, described flat
Answer duration, first wave amplitude, first latency values, second wave amplitude, second latency values, institute
State the 3rd wave amplitude and the 3rd latency values determine test result, including：
Based on the rate of false alarm, the rate of failing to report, the duration of averagely answering, first wave amplitude, first incubation period
Value, second wave amplitude, second latency values, the 3rd wave amplitude and the 3rd latency values determine result
Cluster；
The result cluster is classified based on default grader, determines test result.
4. according to the method for claim 1, it is characterised in that methods described also includes：
Time point when record is shown by the display module to the test question；
If the time difference between current point in time and the time point is equal to preset duration and does not receive result of answering, pass through institute
Display module is stated to be shown next test question.
5. a kind of test system of high ferro dispatcher response inhabitation ability, it is characterised in that the system includes：
First display module, for being shown by display module to test question, the entitled Go/Nogo tests of test；
Brain electric data collecting module, for gathering brain when high ferro dispatcher answers to the test question by brain wave acquisition module
Electric data；
As a result logging modle, correspondingly answered result for recording the test question by the logging modle；
Duration logging modle, if for the entitled Go tests of the test, the test question pair is recorded by the logging modle
Should be answered duration；
Test result determining module, for based on eeg data, result of answering corresponding to each test question in whole test questions
And duration of being answered in whole test questions corresponding to each Go tests determines the test of the high ferro dispatcher response inhabitation ability
As a result.
6. system according to claim 5, it is characterised in that the test result determining module includes：
First determination sub-module, for based on result of being answered corresponding to each test question in whole test questions, determining described complete
Rate of false alarm corresponding to Nogo tests in rate of failing to report and whole test questions corresponding to Go tests in portion's test question；
Second determination sub-module, for based on being answered duration corresponding to each Go tests in whole test questions, it is determined that average make
Answer duration；
3rd determination sub-module, for based on eeg data corresponding to each test question in whole test questions, determining described complete
In portion's test question corresponding to Go tests in the first ERP waveforms, whole test questions the 2nd ERP waveforms corresponding to NoGo tests and
3rd ERP waveforms corresponding to NoGo tests in whole test questions；
4th determination sub-module, for determining that the first ERP waveforms correspond to the first wave amplitude and the first incubation period of P3 compositions
Value；
5th determination sub-module, for determining that the 2nd ERP waveforms correspond to the second wave amplitude and the second incubation period of N2 compositions
Value；
6th determination sub-module, for determining that the 3rd ERP waveforms correspond to the 3rd wave amplitude and the 3rd incubation period of P3 compositions
Value；
7th determination sub-module, for based on the rate of false alarm, the rate of failing to report, the duration of averagely answering, the first wave
Amplitude, first latency values, second wave amplitude, second latency values, the 3rd wave amplitude and described
Three latency values determine test result.
7. system according to claim 6, it is characterised in that the 7th determination sub-module includes：
As a result cluster determining unit, for based on the rate of false alarm, the rate of failing to report, the duration of averagely answering, the first wave
Amplitude, first latency values, second wave amplitude, second latency values, the 3rd wave amplitude and described
Three latency values determine result cluster；
Test result determining unit, for classifying based on default grader to the result cluster, determine test result.
8. system according to claim 5, it is characterised in that the system also includes：
Time point logging modle, for recording time point when being shown by the display module to the test question；
Second display module, if being equal to preset duration for the time difference between current point in time and the time point and not receiving
Answer result, then next test question is shown by the display module.
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| CN201710765358.7A CN107550500B (en) | 2017-08-30 | 2017-08-30 | Method and system for testing response inhibition capability of high-speed rail dispatcher |
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| CN201710765358.7A CN107550500B (en) | 2017-08-30 | 2017-08-30 | Method and system for testing response inhibition capability of high-speed rail dispatcher |
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| CN115444374B (en) * | 2022-11-11 | 2023-01-17 | 北京航空航天大学 | Evaluation method for reaction inhibition capability under simulated plateau environment |
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| CN107550500B (en) | 2020-06-12 |
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