CN107528323B - Optimal configuration method of dynamic reactive power compensation device - Google Patents
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Abstract
The invention discloses an optimal configuration method of a dynamic reactive power compensation device, which comprises the steps of determining a transient voltage instability hidden danger area; selecting a fault set, and simultaneously preliminarily determining candidate access points of the dynamic reactive power compensation device; acquiring the transient response condition of each voltage grade bus in the transient voltage instability hidden danger area; counting the capacity demand range of each candidate access point of the dynamic reactive power compensation device; determining a final optimal dynamic reactive power compensation device access node; recording the voltage sag amplitude and the duration of each node in the transient voltage instability hidden danger area; and calculating the return on investment of each candidate capacity and selecting the final economic optimal dynamic reactive power compensation device capacity. The method of the invention considers the return on investment of the dynamic reactive power compensation device and the result of stable influence on the power grid, thereby exerting the function of the dynamic reactive power compensation device to the maximum extent, realizing smaller calculation amount on the premise of ensuring the result accuracy, and having scientific and reasonable method and obvious effect.
Description
Technical Field
The invention particularly relates to an optimal configuration method of a dynamic reactive power compensation device.
Background
With the development of national economic technology and the improvement of living standard of people, electric energy becomes essential secondary energy in daily production and life of people, and brings endless convenience to production and life of people.
Considering the inverse distribution of energy structure and load in China, along with the implementation and deepening of the west-east power transmission strategy, a power system has already stepped into a large power grid, ultrahigh-voltage and long-distance transmission era, and five receiving-end power grids of east China, northeast China, Yue Min Qiong and Jingjin Jilu are formed on the national level. The voltage stability problem is increasingly highlighted by the continuous increase of the proportion of external power supplies of large receiving-end power grids, the rapid increase of load levels and the increasing complication of load characteristics. Dynamic reactive power compensation devices represented by static synchronous compensators (STATCOM) are increasingly widely applied to power grids by virtue of the advantages of faster response speed and better performance compared with the traditional reactive power compensation devices. But considering the higher configuration cost, how to optimize the dynamic reactive power compensation configuration scheme to fully play the role of the dynamic reactive power compensation device has great practical significance.
The existing reactive power compensation optimization method based on static voltage stability analysis does not consider the optimal efficacy of the dynamic reactive power compensation device in the fault dynamic process; transient voltage stability analysis optimization schemes based on Impedance Module Margin Index (IMMI), Track Sensitivity Index (TSI) and the like generally have the problem of overlarge calculated amount, and most of the schemes do not consider the huge loss of sensitive load caused by voltage sag with continuously increased occurrence probability in the modern power grid; the existing probability statistical model considering the voltage sag risk also has the problem of large calculation amount, and the influence of different load models in different running states of a power grid on the transient voltage stability analysis result is not considered, so that the final result is incomplete.
Disclosure of Invention
The invention aims to provide an optimal configuration method of a dynamic reactive power compensation device, which can exert the function of the dynamic reactive power compensation device to the maximum extent, is scientific and reasonable and has obvious effect.
The optimal configuration method of the dynamic reactive power compensation device provided by the invention comprises the following steps:
s1, determining a transient voltage instability hidden danger area in a research area according to a power grid structure of the research area and an installed reactive power compensation device;
s2, carrying out simulation analysis on the line load in the transient voltage instability hidden danger area determined in the step S1, outputting a line list with the line load exceeding a rated value by 80.0%, selecting heavy current line faults from the obtained line list to form a fault set, and simultaneously preliminarily determining candidate access points of the dynamic reactive power compensation device in the hidden danger area according to the setting principle of the dynamic reactive power compensation device;
s3, testing the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under all fault conditions in the fault set determined in the step S2 according to the corresponding load proportion models of the induction motors in the research areas under different running states;
s4, according to the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under the fault condition obtained in the step S3, when the candidate access points of the dynamic reactive power compensation device determined in the step S2 are respectively provided with the dynamic reactive power compensation device, a trial and error method is adopted to obtain reactive power compensation capacity required to be arranged under different load models and different fault conditions, and meanwhile, the capacity requirement range of the candidate access points of each dynamic reactive power compensation device is counted;
s5, selecting an access node with the minimum reactive compensation capacity demand range according to the capacity demand range of each candidate access point of the dynamic reactive compensation device obtained in the step S4, and determining the access node as the access node of the final dynamic reactive compensation device;
s6, according to the access node determined in the step S5, selecting a plurality of groups of capacities common in industrial production from the capacity demand range as candidate capacities, and simultaneously recording the voltage sag amplitude and the duration of each node in the transient voltage instability hidden danger area under the condition of each candidate capacity and all faults in a fault set;
and S7, calculating the investment return rate of each candidate capacity according to the voltage sag amplitude value and the duration obtained in the step S6, and selecting the capacity with the highest investment return rate as the final capacity of the dynamic reactive power compensation device.
Step S1, determining a transient voltage instability hidden danger area in the research area, specifically, analyzing a voltage distribution condition in a maximum operation mode in summer and a maximum operation mode in winter and an active power and reactive power transmission condition in each internal region based on a power grid structure of the research area and an installed reactive power compensation device, and thus determining a power grid receiving end of a low voltage area and a large reactive gap as the transient voltage instability hidden danger area.
Step S4, obtaining the reactive compensation capacity by using a trial and error method, specifically performing trial and error on the reactive compensation capacity by using the following rules: the reactive compensation capacity must ensure that after all faults in a fault set occur, the voltage of the bus with the slowest voltage recovery in all buses of 500kV, 220kV, 110kV and 35kV in a transient voltage instability hidden danger area can be raised back to 0.75p.u. within 1s after the faults occur.
Step S7, calculating the return on investment for each candidate capacity, specifically, calculating the return on investment ROI by using the following formula:
wherein ROI is the return on investment, R0Annual voltage sag loss cost, R, before installation of dynamic reactive power compensation devicesSThe annual voltage sag loss cost after the reactive power compensation device is installed is shown, and the investment cost for installing the reactive power compensation device is shown as I.
The annual voltage sag loss cost is obtained by replacing the actual sag cost with the sum of annual sag costs of all buses under the fault concentrated accidents (the fault concentrated accidents are all key accidents).
The annual voltage sag loss cost is calculated by adopting the following formula:
wherein R is annual voltage sag loss cost, N is annual voltage sag times, N is total number of fault types, and P isiThe ratio of the number of voltage sags caused by the i-th fault to the number of annual sags, EiThe voltage sag loss cost under the i-th fault is obtained.
The investment cost for installing the reactive power compensation device is obtained by adopting the following calculation formula:
I＝ρ(γ×f+×q)
wherein I is the investment cost for installing the reactive compensation device; rho is the return on investment; gamma is a mark for judging whether the dynamic reactive power compensation device is installed, and is 1 when installed and 0 when not installed; f is equipment installation cost; unit price of equipment device; and q is the capacity for installing the dynamic reactive power compensation device.
The loss cost E of voltage sag under the i-th faultiSpecifically, the following formula is adopted for calculation:
wherein m is the total number of all 500kV, 220kV, 110kV and 35kV buses in a research area, EijTo investigate the loss cost of voltage sag at the jth bus in the area, and EijIs calculated by the formula
K is the maximum economic loss value of a single voltage sag, sigma2Is a sensitivity coefficient (the value is 0.3 according to the actual condition), QijThe severity of the voltage sag at the jth bus under the ith type of fault.
Severity of the voltage sag QijThe method specifically comprises the following steps:
1) drawing a coordinate graph by taking the time T as an abscissa and the voltage U as an ordinate; with U being equal to Umax(maximum value of device voltage tolerance amplitude), U ═ Umin(minimum value of device voltage tolerance amplitude), T ═ Tmax(maximum value of device voltage withstand duration) and T ═ Tmin(minimum value of device voltage withstand duration) four straight lines are drawn, dividing the first quadrant of the graph into three regions:
normal zone: the abscissa T is less than or equal to TminOr the ordinate U is greater than or equal to UmaxThe area of (a);
a fault area: the ordinate U is less than or equal to UminAnd the abscissa T is greater than or equal to TmaxThe area of (a);
fuzzy areas: removing the remaining areas of the normal area and the defective area;
the voltage endurance duration is defined as the time required from the occurrence of a fault to the time when the voltage rises back to 0.9p.u., and the voltage sag amplitude is defined as the average value of the effective values of the voltage within the voltage sag duration.
2) The severity of the voltage sag, Q, was calculated as followsij：
Definition of UijIs the voltage sag amplitude, T, at the jth bus under the ith faultijFor the voltage withstand duration at the jth bus under a class i fault,
if U isij、TijFalls within the normal region of the graph, then Qij＝0；
If U isij、TijFalls within the fault region of the graph, then Qij＝1；
If U isij、TijFall into the fuzzy area of the coordinate graph, then
The U ismaxIs 0.9 p.u.; u shapeminThe value of (a) is 0.6 p.u.; t ismaxIs 600 ms; t isminIs 20 ms.
The optimal configuration method of the dynamic reactive power compensation device can exert the function of the dynamic reactive power compensation device to the maximum extent, and is scientific, reasonable and remarkable in effect; the influence of different load proportion models corresponding to different operation modes on the transient voltage stability analysis result, huge loss caused by voltage sag with continuously increased occurrence probability in a modern power grid to sensitive loads and the importance of investment return rate under the high-cost background of the dynamic reactive power compensation device are considered, meanwhile, small calculated amount on the premise of ensuring result accuracy is achieved, and the dynamic reactive power compensation device has practicability and superiority from the theoretical and engineering aspects.
Drawings
FIG. 1 is a flow chart of the method of the present invention.
FIG. 2 is a state region diagram illustrating the severity of voltage sag in the method of the present invention.
Detailed Description
FIG. 1 shows a flow chart of the method of the present invention: the optimal configuration method of the dynamic reactive power compensation device provided by the invention comprises the following steps:
s1, determining a transient voltage instability hidden danger area in a research area according to a power grid structure of the research area and an installed reactive power compensation device; the method specifically comprises the steps of analyzing the voltage distribution condition in the summer maximum operation mode and the winter maximum operation mode and the active power and reactive power transmission condition in each internal region based on a power grid structure of a research area and an installed reactive power compensation device, and accordingly determining the power grid receiving end of a low-voltage area and a large reactive power gap as a transient voltage instability hidden danger area.
S2, carrying out simulation analysis on the line loads related to the transient voltage instability hidden danger area determined in the step S1, outputting a line list with the line loads exceeding a rated value by 80.0%, selecting heavy load flow line faults in the line list to form a fault set, and simultaneously primarily determining a candidate access point of the dynamic reactive power compensation device in the hidden danger area according to the setting principle of the dynamic reactive power compensation device;
s3, testing the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under all fault conditions in the fault set determined in the step S2 according to the corresponding load proportion models of the induction motors in the research areas under different running states;
s4, according to the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under the fault condition obtained in the step S3, when the candidate access points of the dynamic reactive power compensation device determined in the step S2 are respectively provided with the dynamic reactive power compensation device, a trial and error method is adopted to obtain reactive power compensation capacity required to be arranged under different load models and different fault conditions, and meanwhile, the capacity requirement range of the candidate access points of each dynamic reactive power compensation device is counted;
when the device is tried, the reactive compensation capacity must ensure that after all faults are concentrated and all faults occur, the voltage of the bus with the slowest recovery in all buses of 500kV, 220kV, 110kV and 35kV in the transient voltage instability hidden danger area can be raised back to 0.75p.u. within 1s after the faults occur.
S5, according to the capacity demand range of each candidate access point of the dynamic reactive power compensation device obtained in the step S4, determining the access node with the minimum reactive power compensation capacity demand range as the access node with the optimal installation effect, and determining the access node as the final dynamic reactive power compensation device;
s6, according to the access node determined in the step S5, selecting a plurality of groups of capacities common in industrial production from the capacity demand range as candidate capacities, and simultaneously recording the voltage sag amplitude and the duration of each node in the transient voltage instability hidden danger area under the condition of each candidate capacity and all faults in a fault set;
s7, calculating the investment return rate of each candidate capacity according to the voltage sag amplitude value and the duration obtained in the step S6, and selecting the capacity with the highest investment return rate as the final capacity of the dynamic reactive power compensation device;
the return on investment is specifically calculated by adopting the following formula:
ROI in the formulaTo return on investment, R0Annual voltage sag loss cost, R, before installation of dynamic reactive power compensation devicesSThe annual voltage sag loss cost after the reactive power compensation device is installed is shown, and I is the investment cost for installing the reactive power compensation device; the annual voltage sag loss cost is obtained by replacing the actual sag cost with the sum of annual sag costs of each bus in the case of a fault-concentrated accident (the fault-concentrated accidents are all key accidents), and can be specifically calculated by adopting the following formula:
wherein R is annual voltage sag loss cost, N is annual voltage sag times, N is total number of fault types, and P isiThe ratio of the number of voltage sags caused by the i-th fault to the number of annual sags, EiThe voltage sag loss cost under the i-th type fault;
the investment cost for installing the reactive power compensation device is calculated by adopting the following formula:
I＝ρ(γ×f+×q)
wherein I is the investment cost for installing the reactive compensation device; rho is the return on investment; gamma is a mark for judging whether the dynamic reactive power compensation device is installed, and is 1 when installed and 0 when not installed; f is equipment installation cost; unit price of equipment device; q is the capacity for installing the dynamic reactive power compensation device;
loss cost of voltage sag under i-th fault EiSpecifically, the following formula is adopted for calculation:
wherein m is the total number of all 500kV, 220kV, 110kV and 35kV buses in a research area, EijTo investigate the loss cost of voltage sag at the jth bus in the area, and EijIs calculated by the formula
K is the maximum economy of a single voltage sagLoss value, σ2Is a sensitivity coefficient (the value is 0.3 according to the actual condition), QijThe severity of the voltage sag at the jth bus under the ith type of fault.
Severity of voltage sag QijThe method specifically comprises the following steps:
1) drawing a coordinate graph by taking the time T as an abscissa and the voltage U as an ordinate; with U being equal to Umax(maximum value of device voltage tolerance amplitude), U ═ Umin(minimum value of device voltage tolerance amplitude), T ═ Tmax(maximum value of device voltage withstand duration) and T ═ Tmin(minimum value of device voltage withstand duration) four straight lines are drawn, dividing the first quadrant of the graph into three regions:
normal zone: the abscissa T is less than or equal to TminOr the ordinate U is greater than or equal to UmaxThe area of (a);
a fault area: the ordinate U is less than or equal to UminAnd the abscissa T is greater than or equal to TmaxThe area of (a);
fuzzy areas: removing the remaining areas of the normal area and the defective area;
the voltage endurance duration is defined as the time required from the occurrence of a fault to the time when the voltage rises back to 0.9p.u., and the voltage sag amplitude is defined as the average value of the effective values of the voltage within the voltage sag duration.
2) The severity of the voltage sag, Q, was calculated as followsij：
Definition of UijIs the voltage sag amplitude, T, at the jth bus under the ith faultijFor the voltage withstand duration at the jth bus under a class i fault,
if U isij、TijFalls within the normal region of the graph, then Qij＝0；
If U isij、TijFalls within the fault region of the graph, then Qij＝1；
If U isij、TijFall into the fuzzy area of the coordinate graph, then
U in the specific implementationmaxIs 0.9 p.u.; u shapeminThe value of (a) is 0.6 p.u.; t ismaxIs 600 ms; t isminIs 20 ms.
Claims (10)
1. An optimal configuration method of a dynamic reactive power compensation device comprises the following steps:
s1, determining a transient voltage instability hidden danger area in a research area according to a power grid structure of the research area and an installed reactive power compensation device;
s2, carrying out simulation analysis on the line loads related to the transient voltage instability hidden danger area determined in the step S1, outputting a line list with the line loads exceeding a rated value by 80.0%, selecting heavy current line faults from the obtained line list to form a fault set, and simultaneously primarily determining candidate access points of the dynamic reactive power compensation device in the hidden danger area according to the setting principle of the dynamic reactive power compensation device;
s3, testing the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under all fault conditions in the fault set determined in the step S2 according to the corresponding load proportion models of the induction motors in the research areas under different running states;
s4, according to the transient response conditions of the buses of each voltage class in the transient voltage instability hidden danger area under the fault condition obtained in the step S3, when the candidate access points of the dynamic reactive power compensation device determined in the step S2 are respectively provided with the dynamic reactive power compensation device, a trial and error method is adopted to obtain reactive power compensation capacity required to be arranged under different load models and different fault conditions, and meanwhile, the capacity requirement range of the candidate access points of each dynamic reactive power compensation device is counted;
s5, according to the capacity demand range of each candidate access point of the dynamic reactive power compensation device obtained in the step S4, selecting the access node with the minimum reactive power compensation capacity demand range and determining the access node as the access node of the final dynamic reactive power compensation device;
s6, selecting a plurality of groups of candidate capacities from the capacity demand range according to the access node determined in the step S5, and simultaneously recording the voltage sag amplitude and the duration of each node in the transient voltage instability hidden danger area under the condition of each candidate capacity and all faults in the fault set;
and S7, calculating the investment return rate of each candidate capacity according to the voltage sag amplitude value and the duration obtained in the step S6, and selecting the capacity with the highest investment return rate as the final capacity of the dynamic reactive power compensation device.
2. The method according to claim 1, wherein the step S1 is to determine a potential transient voltage instability area in the research area, and specifically, based on the grid structure of the research area and the installed reactive power compensation devices, analyze the voltage distribution and the transmission of active power and reactive power between internal areas in the maximum operation mode in summer and the maximum operation mode in winter, so as to determine the grid receiving end of a low voltage area and a large reactive gap as the potential transient voltage instability area.
3. The method for optimally configuring a dynamic reactive power compensation device according to claim 2, wherein the reactive power compensation capacity is obtained by a trial and error method in step S4, specifically, the following rules are adopted for trial and error of the reactive power compensation capacity: the reactive compensation capacity must ensure that after all faults in a fault set occur, the voltage of the bus with the slowest voltage recovery in all buses of 500kV, 220kV, 110kV and 35kV in a transient voltage instability hidden danger area can be raised back to 0.75p.u. within 1s after the faults occur.
4. The method according to claim 3, wherein the step S7 is to calculate the return on investment for each candidate capacity, specifically, the return on investment ROI is calculated by using the following formula:
wherein ROI is the return on investment, R0Annual voltage sag loss cost, R, before installation of dynamic reactive power compensation devicesSThe annual voltage sag loss cost after the reactive power compensation device is installed is shown, and the investment cost for installing the reactive power compensation device is shown as I.
5. The method according to claim 4, wherein the annual voltage sag loss cost is obtained by replacing an actual sag cost with a sum of annual sag costs of each bus in the event of a fault concentration.
6. The optimal configuration method of a dynamic reactive power compensation device according to claim 5, wherein the annual voltage sag loss cost is calculated by using the following formula:
wherein R is annual voltage sag loss cost, N is annual voltage sag times, N is total number of fault types, and P isiThe ratio of the number of voltage sags caused by the i-th fault to the number of annual sags, EiThe voltage sag loss cost under the i-th fault is obtained.
7. The method according to claim 6, wherein the investment cost for installing the reactive power compensator is calculated by the following equation:
I＝ρ(γ×f+×q)
wherein I is the investment cost for installing the reactive compensation device; rho is the return on investment; gamma is a mark for judging whether the dynamic reactive power compensation device is installed, and is 1 when installed and 0 when not installed; f is equipment installation cost; unit price of equipment device; and q is the capacity for installing the dynamic reactive power compensation device.
8. The method according to claim 7, wherein the i-th fault is a faultLoss of voltage sag EiSpecifically, the following formula is adopted for calculation:
wherein m is the total number of all 500kV, 220kV, 110kV and 35kV buses in a research area, EijTo investigate the loss cost of voltage sag at the jth bus in the area, and EijIs calculated by the formula
K is the maximum economic loss value of a single voltage sag, sigma2As a coefficient of sensitivity, QijThe severity of the voltage sag at the jth bus in the case of a class i fault.
9. The method according to claim 8, wherein the severity of the voltage sag Q is determined by a method of optimizing the configuration of the dynamic var compensator apparatusijThe method specifically comprises the following steps:
1) drawing a coordinate graph by taking the time T as an abscissa and the voltage U as an ordinate; with U being equal to Umax、u＝Umin、t＝TmaxAnd T ═ TminFour straight lines are drawn, dividing the first quadrant of the graph into three regions:
normal zone: the abscissa T is less than or equal to TminOr the ordinate U is greater than or equal to UmaxThe area of (a);
a fault area: the ordinate U is less than or equal to UminAnd the abscissa T is greater than or equal to TmaxThe area of (a);
fuzzy areas: removing the remaining areas of the normal area and the defective area;
the voltage endurance duration is defined as the time required from the occurrence of a fault to the time when the voltage rises back to 0.9p.u., and the voltage sag amplitude is defined as the average value of the voltage effective values in the voltage sag duration; the U ismaxDefined as the maximum value of the voltage withstand amplitude of the device, UminDefined as the voltage withstand of the deviceMinimum value of amplitude, TmaxDefined as the maximum value of the voltage withstand duration of the device, TminDefined as the minimum value of the device voltage withstand duration;
2) the severity of the voltage sag, Q, was calculated as followsij：
Definition of UijIs the voltage sag amplitude, T, at the jth bus under the ith faultijFor the voltage withstand duration at the jth bus under a class i fault,
if U isij、TijFalls within the normal region of the graph, then Qij＝0；
If U isij、TijFalls within the fault region of the graph, then Qij＝1；
If U isij、TijFall into the fuzzy area of the coordinate graph, then
10. The method according to claim 9, wherein the U is a number of unitsmaxIs 0.9 p.u.; u shapeminThe value of (a) is 0.6 p.u.; t ismaxIs 600 ms; t isminIs 20 ms.
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