CN107525991B - Open-phase protector open-phase threshold setting method, device, medium and computer equipment - Google Patents
Open-phase protector open-phase threshold setting method, device, medium and computer equipment Download PDFInfo
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- CN107525991B CN107525991B CN201710903148.XA CN201710903148A CN107525991B CN 107525991 B CN107525991 B CN 107525991B CN 201710903148 A CN201710903148 A CN 201710903148A CN 107525991 B CN107525991 B CN 107525991B
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Abstract
The invention relates to a method, a device, a medium and computer equipment for setting an open-phase threshold of an open-phase protector, wherein the method comprises the following steps: collecting voltage values output by an old probe in an open-phase test of an exciter to obtain each test voltage value; acquiring voltage values of the new probe at each acquisition moment to obtain simulated voltage values according to each test voltage value, output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths and output voltage values corresponding to the new probe under a plurality of preset magnetic field strengths; generating simulated voltage waveforms by adopting the simulated voltage values of the new probe at all the acquisition moments; obtaining a phase failure threshold corresponding to a phase failure protector provided with a new probe according to the simulation voltage waveform; therefore, after the phase failure protector is provided with a new probe, a new phase failure threshold value can be obtained without carrying out the phase failure test again, the complex operation required by repeating the phase failure test can be omitted, the time for resetting the phase failure threshold value is greatly shortened, and the setting efficiency is high.
Description
Technical Field
The invention relates to the technical field of electrical protection, in particular to a method, a device, a medium and computer equipment for setting an open-phase threshold of an open-phase protector.
Background
The rotor winding of the exciter is typically connected to a rotating diode through a current strap, which rectifies the ac current to dc current. Generally, an exciter corresponds to multiple phases, for example, 39 phases, a plurality of rotating diodes are connected to each phase, and if a diode of a certain phase fails, the phase is disconnected, which is called phase failure.
In order to ensure the normal operation of the exciter, a phase-loss protector is usually required to detect whether phase loss caused by the fault of the rotating diode occurs during the operation of the exciter. Wherein, the working process of the open-phase protector is generally as follows: the method comprises the steps of carrying out a phase failure test on an exciter in advance to determine a phase failure threshold of a phase failure protector with a probe installed, in the actual operation process, adopting the probe to sense the magnetic field intensity generated by a passing current link and output voltage, and then identifying whether phase failure exists according to the voltage output by the probe and the phase failure threshold, for example, if the sensed voltage is smaller than the phase failure threshold, the phase failure occurs.
The output voltage of the probe and the magnetic field intensity sensed by the probe have a strict one-to-one correspondence relationship, each probe has own output characteristic, the output characteristics of different probes are generally different, namely the output voltage can be different when the same magnetic field intensity is sensed. Therefore, after the phase-failure protector is replaced by the probe, the phase-failure thresholds corresponding to the phase-failure protector may be different, and the setting needs to be performed again. The phase failure threshold value after the installation of a new probe cannot be inferred only according to the phase failure threshold value of an old probe when different probes have different output characteristics; in the traditional method, the phase failure test is carried out again after the probe is replaced, and the phase failure threshold value of the phase failure protector after the probe is replaced is obtained. However, the phase failure test usually requires that a current link is actually disconnected on the exciter to simulate the open circuit, and then the open circuit protector is used for monitoring, in the process, the exciter needs to perform one more impact and stop operation, and the worker needs to perform one more disassembly and assembly, the whole process consumes about 15 hours, and the defects of long time consumption and low efficiency exist.
Disclosure of Invention
Therefore, it is necessary to provide a method, an apparatus, a medium, and a computer device for setting an open-phase threshold of an open-phase protector, which reduce time consumption and improve efficiency, in order to solve the problems of long time consumption and low efficiency of the conventional method for setting an open-phase threshold.
A method for setting an open-phase threshold of an open-phase protector comprises the following steps:
collecting voltage values of all collection moments output by an old probe installed on the open-phase protector in an open-phase test of the exciter to obtain test voltage values;
acquiring voltage values of the new probe at each acquisition moment to obtain simulated voltage values according to each test voltage value, the prestored output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths and the prestored output voltage values corresponding to the new probe replaced and installed by the open-phase protector under the plurality of preset magnetic field strengths;
generating simulated voltage waveforms by adopting the simulated voltage values of the new probe at all the acquisition moments;
and obtaining the phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulated voltage waveform.
An open-phase protector open-phase threshold setting device, comprising:
the test voltage value acquisition module is used for acquiring voltage values of all acquisition moments output by an old probe installed on the open-phase protector in the open-phase test of the exciter to obtain test voltage values;
the simulation voltage value acquisition module is used for acquiring voltage values of the new probe at each acquisition moment to obtain simulation voltage values according to each test voltage value, the prestored output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths and the prestored output voltage values corresponding to the new probe replaced and installed by the open-phase protector under a plurality of preset magnetic field strengths;
the voltage waveform simulation module is used for generating simulation voltage waveforms by adopting the simulation voltage values of the new probe at all the acquisition moments;
and the phase failure threshold acquisition module is used for acquiring a phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulation voltage waveform.
According to the method and the device for setting the open-phase threshold of the open-phase protector, each test voltage value is obtained by collecting the voltage value output by the old probe in the open-phase test of the exciter, then the voltage value of the new probe at each collection time is pushed out according to each test voltage value, the output voltage value corresponding to the old probe under a plurality of preset magnetic field strengths and the output voltage value corresponding to the new probe under a plurality of preset magnetic field strengths to obtain a simulated voltage value, finally the simulated voltage value of the new probe at each collection time is adopted to generate a simulated voltage waveform, and the open-phase threshold corresponding to the open-phase protector provided with the new probe is obtained according to the simulated voltage waveform; therefore, after the phase failure protector is provided with the new probe, the phase failure test does not need to be carried out again, the new phase failure threshold value can be obtained only by off-line analysis according to the voltage value output by the old probe in the phase failure test and the output characteristics of the old probe and the new probe, the complex operation required by repeated phase failure tests can be omitted, the time for resetting the phase failure threshold value is greatly shortened, and the setting efficiency is high.
A medium storing a computer program, the stored computer program being executed by a processor, the steps of the open-phase protector open-phase threshold setting method described above.
A computer device comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, wherein the processor executes the computer program to realize the steps of the open-phase protector open-phase threshold setting method.
The medium and the computer equipment realize the steps of the open-phase protector open-phase threshold setting method, can greatly shorten the time for resetting the open-phase threshold in the same way, and have high setting efficiency.
Drawings
FIG. 1 is a flow chart of a method for setting an open-phase threshold of an open-phase protector in an embodiment;
fig. 2 is a schematic structural view of the probe.
FIG. 3 is a flow chart of a method for setting an open-phase threshold of an open-phase protector in another embodiment;
FIG. 4 is a graph showing a relationship between a probe and different output voltage values at different magnetic field strengths;
FIG. 5 is a schematic diagram of voltage waveforms in one embodiment;
FIG. 6 is a schematic structural diagram of the phase loss protector;
FIG. 7 is a block diagram of an open-phase protector open-phase threshold setting device in an embodiment.
Detailed Description
Referring to fig. 1, an open-phase protector open-phase threshold setting method in an embodiment includes steps S110 to S170.
S110: and acquiring voltage values of the old probe installed on the open-phase protector at each acquisition moment output in the open-phase test of the exciter to obtain a test voltage value.
The probe installed on the open-phase protector can be replaced, and the old probe refers to the probe installed on the open-phase protector before the probe is replaced. In the phase-failure test of the exciter, the old probe senses the magnetic field intensity of the current connecting piece connected with the rotating diode and outputs a voltage value. Referring to fig. 2, the probe includes a hall element, an operational amplifier, and a switching module, which are connected in sequence, and includes a voltage stabilizer connected to the hall element, the operational amplifier, and the switching module; the probe is provided with a total of three terminals: vs (+) and group (-) are connected to the power supply +15VDC and Ground, respectively, and output (o) outputs a voltage value corresponding to the induced magnetic field strength.
The old probe may specifically output a voltage waveform corresponding to a plurality of continuous voltage values, or may output a single voltage value. If the old probe outputs a voltage waveform, step S110 may include: collecting voltage waveforms output by an old probe installed on the open-phase protector in an open-phase test of the exciter, and extracting voltage values at all times in the voltage waveforms to obtain test voltage values. Specifically, the voltage values at the respective acquisition times may be acquired by connecting an old probe installed in the phase loss protector, directly receiving the waveform or the single data output by the old probe, or acquiring the voltage values output by the old probe at the respective acquisition times from other devices after receiving the waveform or the single data output by the old probe by other devices.
S130: and acquiring the voltage value of the new probe at each acquisition moment to obtain a simulation voltage value according to each test voltage value, the output voltage value corresponding to the prestored old probe under a plurality of preset magnetic field strengths and the output voltage value corresponding to the prestored new probe replaced and installed by the open-phase protector under a plurality of preset magnetic field strengths.
The output voltage values of the old probe and the new probe corresponding to a plurality of preset magnetic field strengths can be stored in the form of a corresponding relation table, or a relation curve between the preset magnetic field strengths and the corresponding output voltage values can be stored.
There is a corresponding relationship between the output voltage of the probe and the magnetic field strength sensed by the probe, which is called as the output characteristic of the probe. The new probe refers to a new probe installed after the probe is replaced by the open-phase protector; the output characteristics of the old probe and the new probe may not be the same. The corresponding relation between the preset magnetic field strength and the output voltage value is recorded by pre-storing the corresponding output voltage values of the old probe and the new probe under a plurality of preset magnetic field strengths, and if the preset magnetic field strength/output voltage values corresponding to the old probe and the new probe are obtained, the corresponding output voltage value/preset magnetic field strength value can be obtained according to the pre-stored corresponding relation. The value of each preset magnetic field strength may be set according to actual needs, for example, each magnetic field strength in a magnetic field strength range corresponding to a magnetic field that may be generated by a current link of the exciter may be set as the preset magnetic field strength.
S150: and generating simulated voltage waveforms by adopting the simulated voltage values of the new probe at all the acquisition moments.
And acquiring the simulation voltage values at a plurality of acquisition moments, namely generating waveforms according to a time sequence to obtain simulation voltage waveforms. The simulation voltage value is derived according to the test voltage value actually output by the old probe and the output characteristics of the old probe and the new probe, and is not actually output by the new probe; the simulated voltage waveform generated according to the plurality of simulated voltage values is a waveform generated by simulating the voltage output by the new probe in the same open-phase test.
S170: and obtaining the phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulated voltage waveform.
After the simulated voltage waveform is obtained, a new open-phase threshold corresponding to the open-phase protector after a new probe is installed can be obtained according to the simulated voltage waveform.
According to the open-phase protector open-phase threshold setting method, each test voltage value is obtained by collecting the voltage value output by the old probe in the open-phase test of the exciter, then the voltage value of the new probe at each collection time is pushed out according to each test voltage value, the output voltage value corresponding to the old probe under a plurality of preset magnetic field strengths and the output voltage value corresponding to the new probe under a plurality of preset magnetic field strengths to obtain a simulated voltage value, finally, the simulated voltage value of the new probe at each collection time is adopted to generate a simulated voltage waveform, and the open-phase threshold corresponding to the open-phase protector provided with the new probe is obtained according to the simulated voltage waveform; therefore, after the phase failure protector is provided with the new probe, the phase failure test does not need to be carried out again, the new phase failure threshold value can be obtained only by off-line analysis according to the voltage value output by the old probe in the phase failure test and the output characteristics of the old probe and the new probe, the complex operation required by repeated phase failure tests can be omitted, the time for resetting the phase failure threshold value is greatly shortened, and the setting efficiency is high.
In an embodiment, referring to fig. 3, before step S130, step S101 and step S103 are further included.
S101: and sequentially generating a plurality of magnetic fields corresponding to the preset magnetic field intensity within a preset range by adopting the constant magnetic field generator.
The preset range may be specifically set according to actual needs, for example, a magnetic field strength range corresponding to a magnetic field that may be generated by the exciter current connection piece is used as the preset range.
S103: and respectively acquiring output voltage values of the old probe and the new probe under each preset magnetic field intensity and correspondingly storing the output voltage values.
And respectively placing the old probe and the new probe in the magnetic field generated by the constant magnetic field generator, and acquiring output voltage values corresponding to different preset magnetic field strengths to obtain the corresponding relation between the magnetic field strength and the output voltage value corresponding to the old probe and the new probe.
By performing steps S101 and S103, the output characteristics of the old probe and the new probe are measured and stored before step S130, which facilitates direct use in step S130.
Specifically, in this embodiment, the preset range is-400 gauss-400gauss, a constant magnetic field generator is used to generate a magnetic field of-400 gauss-400gauss, the magnetic field strength gradually increases from the minimum value to the maximum value, and the output voltage values of the old probe and the new probe are respectively recorded during the process to obtain the relationship curves between the magnetic field strength and the output voltage value of the old probe and the new probe. For example, referring to fig. 4, a probe is shown for different output voltage values under different magnetic field strengths, wherein the horizontal axis represents the magnetic field strength in gauss, the vertical axis represents the voltage in volts, S1 represents the theoretical relationship, and S2 represents the actual measured relationship.
In the present embodiment, step S101 and step S103 are specifically executed before step S110. It is understood that in other embodiments, step S101 and step S103 may be performed after step S110 and before step S130.
In one embodiment, step S103 includes: and respectively acquiring output voltage values of the old probe and the new probe under each preset magnetic field intensity and correspondingly storing the output voltage values under the preset actual working environment temperature of the probe.
The actual working environment temperature of the probe can be specifically set according to actual experience, for example, the operating temperature of the exciter can be determined to be 30 ℃ according to the actual experience, the environment temperature of the probe during working is basically consistent with the operating temperature of the exciter, the actual working environment temperature of the probe is set to be 30 ℃, and the output voltage values of the old probe and the new probe under each preset magnetic field strength are collected and correspondingly stored at the temperature of 30 ℃.
The error in the output characteristic of the probe is temperature dependent. The output voltage values of the old probe and the new probe under different preset magnetic field strengths are acquired at the actual working environment temperature of the probe, so that the accuracy of the acquired output characteristics of the old probe and the new probe can be improved, and the accuracy of the finally set phase failure threshold can be improved.
In an embodiment, with continued reference to fig. 3, step S130 includes step S131 and step S133.
S131: and comparing the test voltage values, sequentially searching output voltage values consistent with the test voltage values from the output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths, and extracting the preset magnetic field strengths corresponding to the searched output voltage values.
The same voltage value output by the same probe indicates that the magnetic field intensity corresponding to the magnetic field in which the probe is positioned is the same. The test voltage value is a voltage value correspondingly output by the old probe in the phase failure test, so that the output characteristic of the old probe is adopted for analysis, and the preset magnetic field strength corresponding to the output voltage value consistent with the test voltage value is equal to the preset magnetic field strength corresponding to the corresponding test voltage value. Therefore, each extracted preset magnetic field intensity can correspond to the magnetic field intensity sensed by the old probe in the phase failure test in sequence.
S133: and sequentially searching the extracted output voltage values corresponding to the preset magnetic field strengths from the output voltage values corresponding to the new probe under the plurality of preset magnetic field strengths to obtain the simulated voltage values of the new probe at each acquisition moment.
And simulating the condition that the new probe is placed in the same open-phase test, wherein the magnetic field intensity induced by the new probe is the same as that induced by the old probe and corresponds to each extracted preset magnetic field intensity. Therefore, the simulated voltage value obtained by analyzing the preset magnetic field strength extracted in step S131 and the output characteristic of the new probe is the voltage value simulating the output of the new probe in the same open-phase test.
The simulation voltage values of the new probe at each acquisition moment in the same open-phase test are deduced in an off-line simulation mode by searching the test voltage values and the output voltage values of the old probe and the new probe under different preset magnetic field strengths, so that the operation is simple and the accuracy is high.
In an embodiment, after step S150, step (a1) and step (a2) are further included. Specifically, step (a1) and step (a2) may be performed before step S170; it is also possible to perform step (a1) and step (a2) after step S170.
Step (a 1): and when the exciter is rushed to the voltage equal to the operating voltage in the phase failure test, acquiring the voltage value output by the new probe and generating an actual voltage waveform.
The operation voltage refers to the voltage reached by the operation of the exciter in the phase failure test, and correspondingly, the test voltage value is the voltage value output by the old probe under the operation voltage. The open-phase protector after installing the new probe is used for monitoring the open phase of the exciter, and the new probe induces the magnetic field generated by the passing current connecting piece and outputs a voltage value. By collecting the voltage value output by the new probe when the exciter operates to the voltage with the same operating voltage, the operating condition of the voltage value output by the new probe is the same as that of the phase failure test.
Step (a 2): and carrying out accuracy verification on the simulated voltage waveform according to the actual voltage waveform.
The actual voltage waveform is the waveform generated by collecting the phase-failure protector in the actual exciter operation after a new probe is installed on the phase-failure protector. By comparing the simulated voltage waveform obtained under the same operation condition with the actual voltage waveform, the accuracy of the simulated voltage waveform can be verified, so that the accuracy of the set open-phase threshold value is verified.
Specifically, in the step (a2), the accuracy of the simulated voltage waveform may be determined by comparing the simulated voltage waveform with the actual voltage waveform, for example, if the simulated voltage waveform and the actual voltage waveform are consistent except for the missing wave, the simulated voltage waveform may be determined to be correct. Otherwise, judging that the simulation voltage waveform is incorrect.
Specifically, the operating voltage in the open-phase test may be a rated voltage of the exciter. The phase failure test is carried out when the exciter operates at a rated voltage, and the voltage value output by the new probe correspondingly is collected, so that the operation condition is convenient to set.
Specifically, after the step (a2), if the simulated voltage waveform is not correct, the process returns to the step S110. Thus, the accuracy of the set open-phase threshold can be improved by repeating the operation to obtain the open-phase threshold again.
With continued reference to FIG. 3, in one embodiment, the simulated voltage waveform includes a plurality of consecutive waves, and the phase-failure threshold includes a phase-failure threshold, a two-phase-failure threshold, and a three-phase-failure threshold. The open one-phase threshold is used for judging the occurrence of the open of one phase, the open two-phase threshold is used for judging the occurrence of the open of two phases, and the open three-phase threshold is used for judging the occurrence of the open of more than three phases. Correspondingly, step S170 includes steps S173, S173 and S175.
S171: and obtaining the critical voltage value of the lower end of the simulation voltage waveform from no missing wave to missing one wave to obtain the phase-off threshold value.
The simulation voltage waveform is divided into an upper end and a lower end according to the wave crest and the wave trough of the wave, wherein the end where the wave trough is located is the lower end. The different moments of the wave respectively correspond to the simulation voltage values, and the smaller the corresponding simulation voltage value is, the lower the wave is; the lowest simulated voltage values of the various waves in the simulated voltage waveform may not be the same, i.e., the lower end in the simulated voltage waveform is not level. If the actual voltage value is larger than the simulation voltage value corresponding to the lowest trough position of the lower end in the simulation voltage waveform, wave missing begins to occur; therefore, the simulation voltage value corresponding to the lowest position of the lower end of the simulation voltage waveform is searched, namely the critical voltage value from no missing wave to missing one wave, and the phase-off threshold value can be obtained.
S173: and obtaining the critical voltage value of the lower end of the simulation voltage waveform from missing two waves to missing more than three waves to obtain the three-phase-cutoff threshold value.
If the actual voltage value is larger than the simulation voltage value corresponding to the position of the third wave trough from the lower end to the top or a plurality of positions of the same wave trough after the second position in the simulation voltage waveform, more than three wave losses occur; therefore, the three-phase cutoff threshold value can be obtained by searching the simulation voltage values corresponding to the third wave trough position or a plurality of same wave trough positions after the second wave trough position from the lower end of the simulation voltage waveform, namely the critical voltage values from two waves to more than three waves.
Specifically, in steps S171 and S173, the simulation voltage waveform may be directly subjected to image analysis to obtain the phase-off threshold and the phase-off threshold, or the simulation voltage waveform may be output to the phase-off protector, a potentiometer in the phase-off protector is adjusted to make the phase-off protector determine that the phase-off and the phase-off are open, and at this time, the voltage corresponding to the adjustment of the potentiometer is collected, so that the phase-off threshold and the phase-off threshold can be obtained respectively.
S175: and calculating the average value of the phase-off threshold and the phase-off threshold to obtain the phase-off threshold.
The phase-failure threshold acquisition in steps S171 to S175 is set based on the principle that the voltage value at the phase-failure is the lowest, the voltage values at the two phase-failure phases are substantially equal, and the voltage value is still much lower than the lowest value of the other normally-on phases. By taking the average of the disconnected one-phase threshold and the disconnected three-phase threshold as the disconnected two-phase threshold, the disconnected two phases can be reliably judged to be disconnected, and other phases without disconnection can be accurately judged to be connected, so that the accuracy is high.
For better illustration, the voltage waveforms in the specific embodiment are used as an example, and referring to fig. 5, the upper portion is the original voltage waveform, and the lower portion is the adjusted voltage waveform. The middle three transverse lines are a horizontal line where a voltage value corresponding to a disconnected phase threshold value is located, a horizontal line where a voltage value corresponding to a disconnected two-phase threshold value is located, and a horizontal line where a voltage value corresponding to a disconnected three-phase threshold value is located from bottom to top in sequence.
It is understood that the device executing the open-phase protector open-phase threshold setting method may also obtain the open-phase threshold in other manners, for example, in another embodiment, step S170 includes: and sending the simulated voltage waveform to the open-phase protector so that the open-phase protector can obtain the open-phase threshold corresponding to the open-phase protector provided with the new probe according to the simulated voltage waveform.
The open-phase protector can obtain and store an open-phase threshold according to voltage waveform analysis, so that whether open-phase occurs or not is analyzed according to the open-phase threshold in the subsequent working process. Referring to fig. 6, which is a schematic structural diagram of the open-phase protector, each exciter is equipped with 3 probes (Sensors in the figure), the probes convert the sensed magnetic field strength into a voltage value, send the voltage value to a waveform modulation module (Shaping in the figure), the waveform modulated by the waveform modulation module reaches a counting Processing module (Processing in the figure), calculate whether 39 phases of the exciter are completely conducted, and finally send the waveform to a Monitoring module (Monitoring in the figure) to output a signal through a logic port (signaling in the figure). The simulation voltage waveform is sent to the open-phase protector, and the open-phase threshold is obtained through the open-phase protector, so that the method is simple and rapid.
Referring to fig. 7, the open-phase protector open-phase threshold setting apparatus in an embodiment includes a test voltage value obtaining module 110, a simulation voltage value obtaining module 130, a voltage waveform simulation module 150, and an open-phase threshold obtaining module 170.
The test voltage value obtaining module 110 is configured to collect voltage values of the old probe installed in the open-phase protector at each collection time output in the open-phase test of the exciter, so as to obtain a test voltage value.
The simulation voltage value obtaining module 130 is configured to obtain voltage values of the new probe at each acquisition time to obtain simulation voltage values according to each test voltage value, output voltage values of the pre-stored old probe corresponding to the plurality of preset magnetic field strengths, and output voltage values of the pre-stored new probe replaced and installed by the open-phase protector corresponding to the plurality of preset magnetic field strengths.
The voltage waveform simulation module 150 is configured to generate a simulated voltage waveform using the simulated voltage values of the new probe at each acquisition time.
The phase failure threshold acquisition module 170 is configured to obtain a phase failure threshold corresponding to the phase failure protector with the new probe installed according to the simulated voltage waveform.
The phase failure threshold setting device of the phase failure protector acquires voltage values output by an old probe in a phase failure test of an exciter through a test voltage value acquisition module 110 to obtain each test voltage value, then a simulation voltage value acquisition module 130 deduces the voltage value of a new probe at each acquisition moment according to each test voltage value, the output voltage value corresponding to the old probe under a plurality of preset magnetic field strengths and the output voltage value corresponding to the new probe under a plurality of preset magnetic field strengths to obtain a simulation voltage value, a voltage waveform simulation module 150 generates a simulation voltage waveform by adopting the simulation voltage value of the new probe at each acquisition moment, and a phase failure threshold acquisition module 170 obtains the phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulation voltage waveform; therefore, after the phase failure protector is provided with the new probe, the phase failure test does not need to be carried out again, the new phase failure threshold value can be obtained only by off-line analysis according to the voltage value output by the old probe in the phase failure test and the output characteristics of the old probe and the new probe, the complex operation required by repeated phase failure tests can be omitted, the time for resetting the phase failure threshold value is greatly shortened, and the setting efficiency is high.
In an embodiment, the open-phase threshold setting device of the open-phase protector further includes a pre-test module (not shown) configured to generate magnetic fields corresponding to a plurality of preset magnetic field strengths within a preset range in sequence by using the constant magnetic field generator before the simulation voltage value obtaining module 130, and respectively collect and correspondingly store output voltage values of the old probe and the new probe at each preset magnetic field strength. The output characteristics of the old probe and the new probe are measured and stored before the simulated voltage value acquisition module 130, so that the simulated voltage value acquisition module 130 can be directly used conveniently.
In an embodiment, the pre-test module is specifically configured to collect and correspondingly store output voltage values of the old probe and the new probe at each preset magnetic field strength at a preset environment temperature at which the probes actually work. The output voltage values of the old probe and the new probe under different preset magnetic field strengths are acquired at the actual working environment temperature of the probe, so that the accuracy of the acquired output characteristics of the old probe and the new probe can be improved, and the accuracy of the finally set phase failure threshold can be improved.
In an embodiment, the simulated voltage value obtaining module 130 is configured to: comparing each test voltage value, sequentially searching output voltage values consistent with each test voltage value from output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths, and extracting the preset magnetic field strength corresponding to each searched output voltage value; and sequentially searching the extracted output voltage values corresponding to the preset magnetic field strengths from the output voltage values corresponding to the new probe under the plurality of preset magnetic field strengths to obtain the simulated voltage values of the new probe at each acquisition moment.
The simulation voltage values of the new probe at each acquisition moment in the same open-phase test are deduced in an off-line simulation mode by searching the test voltage values and the output voltage values of the old probe and the new probe under different preset magnetic field strengths, so that the operation is simple and the accuracy is high.
In an embodiment, the open-phase protector open-phase threshold setting device further includes a checking module (not shown) configured to, after the voltage waveform simulation module 150, acquire a voltage value output by the new probe and generate an actual voltage waveform when the exciter is switched to a voltage equal to an operating voltage in the open-phase test, and perform accuracy checking on the simulated voltage waveform according to the actual voltage waveform. Specifically, the checking module may be executed before the phase failure threshold obtaining module 170, or may be executed after step S170.
By comparing the simulated voltage waveform obtained under the same operation condition with the actual voltage waveform, the accuracy of the simulated voltage waveform can be verified, so that the accuracy of the set open-phase threshold value is verified.
Specifically, when the verification module verifies that the simulated voltage waveform is incorrect, the verification module may control the test voltage value obtaining module 110 to execute a corresponding function. Thus, the accuracy of the set open-phase threshold can be improved by repeating the operation to obtain the open-phase threshold again.
In one embodiment, the simulated voltage waveform includes a plurality of consecutive waves, and the phase-failure thresholds include a phase-failure threshold, and a phase-failure threshold. The phase failure threshold acquisition module 170 is configured to: obtaining the critical voltage value of the lower end of the simulation voltage waveform from no missing wave to missing one wave to obtain a phase-off threshold value; obtaining the critical voltage value of the lower end of the simulation voltage waveform from two missing waves to more than three missing waves to obtain a three-phase-cutoff threshold value; and calculating the average value of the phase-off threshold and the phase-off threshold to obtain the phase-off threshold.
The open-phase threshold obtaining module 170 sets and obtains the open-phase threshold by using the principle that the voltage value at the open-phase is the lowest, the voltage values at the two open-phase are substantially equal, and the voltage value is still much lower than the lowest value of other normally-conducted phases. By taking the average of the disconnected one-phase threshold and the disconnected three-phase threshold as the disconnected two-phase threshold, the disconnected two phases can be reliably judged to be disconnected, and other phases without disconnection can be accurately judged to be connected, so that the accuracy is high.
It can be understood that the phase failure threshold obtaining module 170 may also obtain the phase failure threshold in other manners, for example, in another embodiment, the phase failure threshold obtaining module 170 is configured to send the simulated voltage waveform to the phase failure protector, so that the phase failure protector obtains the phase failure threshold corresponding to the phase failure protector with the new probe installed according to the simulated voltage waveform. The simulation voltage waveform is sent to the open-phase protector, and the open-phase threshold is obtained through the open-phase protector, so that the method is simple and rapid.
A medium storing a computer program which, when executed by a processor, implements the steps of the open-phase protector open-phase threshold setting method described above. In particular, the medium may be a readable storage medium.
A computer device comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, and the steps of the open-phase protector open-phase threshold setting method are realized when the processor executes the computer program.
The medium and the computer equipment realize the steps of the open-phase protector open-phase threshold setting method, can greatly shorten the time for resetting the open-phase threshold in the same way, and have high setting efficiency.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for setting an open-phase threshold of an open-phase protector is characterized by comprising the following steps:
collecting voltage values of all collection moments output by an old probe installed on the open-phase protector in an open-phase test of the exciter to obtain test voltage values;
acquiring voltage values of the new probe at each acquisition moment to obtain simulated voltage values according to each test voltage value, the prestored output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths and the prestored output voltage values corresponding to the new probe replaced and installed by the open-phase protector under the plurality of preset magnetic field strengths;
generating simulated voltage waveforms by adopting the simulated voltage values of the new probe at all the acquisition moments;
and obtaining the phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulated voltage waveform.
2. The method for setting the open-phase threshold of the open-phase protector according to claim 1, wherein the step of obtaining the voltage value of the new probe at each acquisition time to obtain a simulated voltage value according to each test voltage value, the pre-stored output voltage value corresponding to the old probe under a plurality of preset magnetic field strengths, and the pre-stored output voltage value corresponding to the new probe replaced and installed in the open-phase protector under a plurality of preset magnetic field strengths comprises the steps of:
comparing each test voltage value, sequentially searching output voltage values consistent with each test voltage value from the output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths, and extracting the preset magnetic field strength corresponding to each searched output voltage value;
and sequentially searching the extracted output voltage values corresponding to the preset magnetic field strengths from the output voltage values corresponding to the new probe under the preset magnetic field strengths to obtain the simulated voltage values of the new probe at each acquisition moment.
3. The method for setting the open-phase threshold of the open-phase protector according to claim 1, wherein before obtaining the voltage value of the new probe at each acquisition time to obtain the simulated voltage value according to each test voltage value, the pre-stored output voltage value corresponding to the old probe under a plurality of preset magnetic field strengths, and the pre-stored output voltage value corresponding to the new probe replaced and installed in the open-phase protector under a plurality of preset magnetic field strengths, the method further comprises:
sequentially generating a plurality of magnetic fields corresponding to preset magnetic field intensity in a preset range by adopting a constant magnetic field generator;
and respectively collecting output voltage values of the old probe and the new probe under each preset magnetic field intensity and correspondingly storing the output voltage values.
4. The method for setting the open-phase threshold of the open-phase protector according to claim 3, wherein the step of respectively acquiring and correspondingly storing the output voltage values of the old probe and the new probe under each preset magnetic field strength comprises the following steps:
and under the preset environment temperature of actual work of the probe, respectively acquiring output voltage values of the old probe and the new probe under each preset magnetic field intensity and correspondingly storing the output voltage values.
5. The method for setting the open-phase protector open-phase threshold according to claim 1, wherein the obtaining of the open-phase threshold corresponding to the open-phase protector provided with the new probe according to the simulated voltage waveform comprises:
and sending the simulated voltage waveform to the open-phase protector so that the open-phase protector obtains an open-phase threshold corresponding to the open-phase protector provided with the new probe according to the simulated voltage waveform.
6. The open-phase protector open-phase threshold setting method according to claim 1, characterized in that the simulated voltage waveform includes a plurality of continuous waves, and the open-phase threshold includes an open-phase threshold, an open-two-phase threshold, and an open-three-phase threshold; the obtaining of the phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulated voltage waveform comprises:
obtaining the critical voltage value of the lower end of the simulation voltage waveform from no missing wave to missing one wave to obtain the phase-off threshold value; the lower end is the end where the wave trough of the simulated voltage waveform is located;
obtaining the critical voltage value of the lower end of the simulation voltage waveform from two missing waves to more than three missing waves to obtain the three-phase break threshold value;
and calculating the average value of the one-phase-failure threshold value and the three-phase-failure threshold value to obtain the two-phase-failure threshold value.
7. The open-phase protector open-phase threshold setting method according to any one of claims 1 to 6, wherein after generating the simulated voltage waveform using the simulated voltage values of the new probe at each acquisition time, the method further comprises:
when the exciter is rushed to a voltage equal to the operating voltage in the phase failure test, acquiring a voltage value output by the new probe and generating an actual voltage waveform;
and carrying out accuracy verification on the simulation voltage waveform according to the actual voltage waveform.
8. An open-phase protector open-phase threshold setting device is characterized by comprising:
the test voltage value acquisition module is used for acquiring voltage values of all acquisition moments output by an old probe installed on the open-phase protector in the open-phase test of the exciter to obtain test voltage values;
the simulation voltage value acquisition module is used for acquiring voltage values of the new probe at each acquisition moment to obtain simulation voltage values according to each test voltage value, the prestored output voltage values corresponding to the old probe under a plurality of preset magnetic field strengths and the prestored output voltage values corresponding to the new probe replaced and installed by the open-phase protector under a plurality of preset magnetic field strengths;
the voltage waveform simulation module is used for generating simulation voltage waveforms by adopting the simulation voltage values of the new probe at all the acquisition moments;
and the phase failure threshold acquisition module is used for acquiring a phase failure threshold corresponding to the phase failure protector provided with the new probe according to the simulation voltage waveform.
9. A medium, in which a computer program is stored, characterized in that the stored computer program realizes the steps of the method according to any of claims 1-7 when executed by a processor.
10. A computer arrangement comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method according to any of claims 1-7 are implemented when the computer program is executed by the processor.
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