CN107525587B - Multi-scanning optical system - Google Patents

Multi-scanning optical system Download PDF

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Publication number
CN107525587B
CN107525587B CN201710472320.0A CN201710472320A CN107525587B CN 107525587 B CN107525587 B CN 107525587B CN 201710472320 A CN201710472320 A CN 201710472320A CN 107525587 B CN107525587 B CN 107525587B
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China
Prior art keywords
composite light
excitation source
optical
tentacles
detector
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Expired - Fee Related
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CN201710472320.0A
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CN107525587A (en
Inventor
普里亚达桑·迪维亚达桑·潘特
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Metal Energy Analysis Pte Ltd
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Metal Energy Analysis Pte Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0232Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/32Investigating bands of a spectrum in sequence by a single detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/443Emission spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103Atomic absorption analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • G01J2003/045Sequential slits; Multiple slits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • G01J2003/061Mechanisms, e.g. sine bar
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • G01J2003/064Use of other elements for scan, e.g. mirror, fixed grating
    • G01J2003/065Use of fibre scan for spectral scan
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • G01J2003/066Microprocessor control of functions, e.g. slit, scan, bandwidth during scan
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J2003/1265Generating the spectrum; Monochromators the wavelengths being separated in time, e.g. through optical fibre array
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • G01J2003/282Modified CCD or like
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/08Optical fibres; light guides
    • G01N2201/0826Fibre array at source, distributing

Abstract

The present disclosure relates to the field of optical systems. Contemplated multi-scan optical systems are compact and stable. The system includes an excitation source, a hydra cable, a wavelength selector, an optical element, and a detector. The excitation source is configured to emit the composite light. The hydra cable has a head and a plurality of tentacles and is configured to receive the composite light via the second lens. The plurality of tentacles are configured to transmit the composite light to a wavelength selector comprising a plurality of optical slits (s1-s8) and a plurality of shutters. The wavelength selector is configured to selectively collect and filter, by the plurality of shutters, the composite light guided by the first lens and the plurality of tentacles. The detector is configured to detect a plurality of spectral line scans reflected by the optical element for spectral analysis.

Description

Multi-scanning optical system
Technical Field
The present disclosure relates to the field of optical systems.
Background
In general, an optical system used in an atomic emission spectrometer includes an excitation source, a plurality of lenses, a wavelength selector, and a plurality of detectors. Typically, the wavelength selector is a single slot configuration. The use of a single slit based wavelength selector reduces the stability of conventional optical systems. Further, the wavelength selector is configured to direct the composite light to the plurality of detectors. Each of the plurality of detectors is tuned to capture diffracted composite light of a particular wavelength. Typically, these detectors are charge coupled devices. However, the use of multiple charge coupled devices increases the cost of the optical system.
Accordingly, there is a need for a multiple scanning optical system that alleviates the above-mentioned disadvantages of the conventional optical system.
Disclosure of Invention
Some objects of the present disclosure are described below, which are met by at least one embodiment below:
it is an object of the present disclosure to ameliorate one or more of the problems of the prior art, or at least to provide a useful alternative.
It is an object of the present disclosure to provide a multi-scanning optical system that facilitates coverage of different wavelength ranges by using a single detector in multiple scans separated by a period of time.
It is another object of the present disclosure to provide a multi-scan optical system that requires fewer detectors to facilitate increased wavelength range coverage for a given resolution.
It is another object of the present disclosure to provide a multi-scan optical system that helps to improve the effective resolution compared to a conventional single-scan CCD system.
It is another object of the present disclosure to provide a multi-scanning optical system that provides a compact and stable optical structure.
It is another object of the present disclosure to provide a multi-scanning optical system that is cost-effective.
Other objects and advantages of the present disclosure will become more apparent from the following description, which is not intended to limit the scope of the present disclosure.
The present invention contemplates a multi-scan optical system. The multi-scan optical system includes an excitation source, a hydra cable, a wavelength selector, an optical element, and a detector. The excitation source is configured to emit the composite light. The hydra cable is disposed downstream of the excitation source. The hydra cable has a head portion and a plurality of tentacles disposed at a plurality of end portions of the hydra cable, respectively. The head is configured to collect, via the second lens, the composite light emitted by the excitation source. The plurality of tentacles are configured to split the composite light collected by the head and are further configured to transmit a plurality of bundles of the composite light. The wavelength selector includes a plurality of optical slits (s1 to s 8).
The wavelength selector is configured to selectively collect and filter the composite light guided by the first lens and a plurality of beams of composite light transmitted by the plurality of tentacles. The wavelength selector is further configured to direct a plurality of spectral line scans having different wavelengths and corresponding to each of the plurality of optical slits. In one embodiment, the wavelength selector includes a plurality of shutters configured to sequentially select at least one optical slit (s1-s 8). The plurality of shutters is operated pneumatically or electrically.
The detector is configured to detect a plurality of spectral line scans reflected by the optical element for spectral analysis. In one embodiment, the optical element is a holographic concave diffractive reflective grating. In another embodiment, the detector is a charge coupled device.
In one embodiment, the first and second lenses are configured to direct the composite light received from the excitation source to a first slit (s1) of the plurality of slits (s1-s8), and the hydra cable, respectively.
In one embodiment, the excitation source is selected from the group consisting of inductively coupled plasma, direct current plasma, and microwave induced plasma.
In another embodiment, the first lens and the second lens are each a spark light collecting lens.
In another embodiment, each of the plurality of line scans is associated with a respective angle of incidence. In another embodiment, the wavelength of the multiple line scans is in the range of 170nm to 380 nm.
Drawings
The multi-scan optical system of the present disclosure will now be described with the aid of the accompanying drawings, in which:
FIG. 1 shows a schematic diagram of a multi-scan optical system according to an embodiment of the present disclosure.
Description of reference numerals:
100-system; 101-an optical element; 102-a detector;
103-wavelength selector; 104-an excitation source; 105 a-a first lens;
105 b-a second lens; 106-Hydra cable; 108-tentacle.
Detailed Description
In general, an optical system used in an atomic emission spectrometer includes an excitation source, a plurality of lenses, a wavelength selector, and a plurality of detectors. Typically, the wavelength selector is a single slot configuration. The use of a single slit based wavelength selector reduces the stability of conventional optical systems. Further, the wavelength selector is configured to direct the composite light to the plurality of detectors. Each of the plurality of detectors is tuned to capture diffracted composite light of a particular wavelength. Typically, these detectors are charge coupled devices. However, the use of multiple charge coupled devices increases the cost of the optical system.
The system of the present disclosure is now described with reference to fig. 1. Fig. 1 shows a schematic diagram of a multi-scan optical system 100 according to an embodiment of the present disclosure.
The present invention contemplates a multi-scan optical system 100. Multi-scan optical system 100 includes excitation source 104, hydra cable 106, wavelength selector 103, optical element 101, and detector 102. The excitation source 104 is configured to emit composite light. hydra cable 106 is disposed downstream of excitation source 104. The hydra cable 106 has a head (not shown) and a plurality of tentacles 108, the plurality of tentacles 108 being disposed on a plurality of ends of the hydra cable 106, respectively. The head is configured to collect the composite light emitted by the excitation source 104 via the second lens 105 b. The plurality of tentacles 108 are configured to split the composite light collected by the head of the hydra cable 106, which is also configured to transmit multiple beams of the composite light to the wavelength selector.
The wavelength selector 103 includes a plurality of optical slits (s1 to s 8). The wavelength selector 103 is configured to selectively collect and filter the composite light guided by the first lens 105a and the plurality of beams of composite light transmitted by the plurality of tentacles 108. The wavelength selector 103 is further configured to direct a plurality of line scans having different wavelengths and corresponding to each of a plurality of optical slits (s1-s 8). In one embodiment, the wavelength selector 103 includes a plurality of shutters (not shown in the figure) configured to sequentially select at least one optical slit (s1 to s 8). The plurality of shutters is operated pneumatically or electrically. In one embodiment, each of the plurality of line scans is associated with a respective angle of incidence.
In one embodiment, the excitation source 104 is a plasma spark source. Typically, plasma spark sources use inductively coupled plasma to generate excited atoms and excited ions that emit electromagnetic radiation having wavelengths characteristic of the particular element being analyzed. In one embodiment, the excitation source 104 is selected from the group consisting of inductively coupled plasma, direct current plasma, and microwave induced plasma.
In another embodiment, the optical element 101 is a holographic concave diffractive reflective grating.
In another embodiment, the first lens 105a and the second lens 105b are spark light collecting lenses. The first lens 105a is adapted to collect the composite light from the excitation source 104. Further, the first lens 105a is configured to guide the collected composite light to the first slit (s 1).
The second lens 105b is adapted to collect the composite light from the excitation source 104. Further, the second lens 105b is configured to direct the collected composite light to the hydra cable 106.
In one embodiment, the at least one slit (s 2-s 8) is selected from the group consisting of a second slit (s2), a third slit (s3), a fourth slit (s4), a fifth slit (s5), a sixth slit (s6), a seventh slit (s7), and an eighth slit (s 8). In one embodiment, the hydra cable 106 is a single stepped fiber (single) with a head on one side/tail and multiple tentacles on the other side. This design uses the same detector in multiple scans separated by periods of time, enabling multiple angles of incidence (two or more) to be used per detector to ensure different angles of incidence and thus coverage of different wavelength ranges.
The detector 102 is configured to detect a plurality of spectral line scans reflected by the optical element 101 for spectral analysis. In one embodiment, the detector 102 is a Charge Coupled Device (CCD).
In accordance with an embodiment of the present disclosure, system 100 provides eight scans, where each scan is associated with a respective angle of incidence to provide wavelength selection. Although eight scans are used to describe the present disclosure, the system 100 of the present disclosure may be used in any number of scans that are subject to at least two scans. In one embodiment, the wavelength of the multiple line scans is in the range of 170nm to 380 nm.
In one embodiment, in the first scan (switch), the composite light from the excitation source 104 is incident on the first slit (s 1). The first slit (s1) is adapted to scan through a first line of composite light. The first line scan is directed to the optical element 101. The optical element 101 is configured to diffract the first spectral line scan to the detector 102. The detector 102 is configured to capture and detect a first spectral line scan. Typically, the wavelength of the diffracted first line scan is in the range 170nm to 200 nm.
In another embodiment, in the second scan (switching), the composite light from the excitation source 104 is incident on the second slit (s 2). The second slit (s2) is adapted to scan through a second line of composite light. The second line scan is directed to the optical element 101. The optical element 101 is configured to diffract the second line scan to the detector 102. The detector 102 may be configured to capture and detect a second spectral line scan. Typically, the wavelength of the diffracted second line scan is in the range of 201nm to 230 nm.
In another embodiment, in a third scan (switch), the composite light from the excitation source 104 is incident on a third slit (s 3). A third slit (s3) is adapted to scan through a third line of composite light. The third line scan is directed to the optical element 101. The optical element 101 is configured to diffract the third line scan to the detector 102. The detector 102 is configured to capture and detect a third spectral line scan. Typically, the wavelength of the diffracted third line scan is in the range 231nm to 260 nm.
In yet another embodiment, in the fourth scan (switch), the composite light from the excitation source 104 is incident on the fourth slit (s 4). A fourth slit (s4) is adapted for scanning through a fourth line of composite light. The fourth line scan is directed to the optical element 101. The optical element 101 is configured to diffract the fourth line scan to the detector 102. The detector 102 is configured to capture and detect a fourth spectral line scan. Typically, the wavelength of the diffracted fourth line scan is in the range 261nm to 290 nm.
In one embodiment, in the fifth scan (switch), the composite light from the excitation source 104 is incident on the fifth slit (s 5). A fifth slit (s5) is adapted for fifth line scanning through the composite light. The fifth line scan is directed to the optical element 101. The optical element 101 is configured to diffract the fifth spectral line scan to the detector 102. The detector 102 is configured to capture and detect a fifth spectral line scan. Typically, the wavelength of the diffracted fifth line scan is in the range 291nm to 320 nm.
In another embodiment, in the sixth scan (switch), the composite light from excitation source 104 is incident on the sixth slit (s 6). The sixth slit (s6) is adapted for sixth line scanning through the composite light. The sixth line scan is directed to the optical element 101. The optical element 101 is configured to diffract the sixth line scan to the detector 102. The detector 102 is configured to capture and detect a sixth spectral line scan. Typically, the wavelength of the diffracted sixth line scan is in the range 321nm to 350 nm.
In another embodiment, in the seventh scan (switch), the composite light from excitation source 104 is incident on the seventh slit (s 7). The seventh slit (s7) is adapted for seventh linescan through the composite light. The seventh line scan is directed to the optical element 101. The optical element 101 is configured to diffract the seventh spectral line scan to the detector 102. The detector 102 is configured to capture and detect a seventh spectral line scan. Typically, the wavelength of the diffracted seventh line scan is in the range 351nm to 380 nm.
In another embodiment, in the eighth scan (switch), the composite light from excitation source 104 is incident on the eighth slit (s 8). An eighth slit (s8) is adapted for scanning through an eighth line of composite light. The eighth line scan is directed to the optical element 101. The optical element 101 is configured to diffract the eighth line scan to the detector 102. The detector 102 is configured to capture and detect an eighth spectral line scan. Typically, the wavelength of the diffracted eighth line scan is in the range 351nm to 380 nm.
By controlling the operation of each of the plurality of shutters, the composite light passes through each of the plurality of slits (s1 to s8) in order. In one embodiment, the plurality of shutters are pneumatically/electrically operated in each scan. Further, the operation of the plurality of shutters may be sequentially controlled to select different respective wavelength scans. In one embodiment, the plurality of shutters is configured to control the plurality of tentacles 108 of the hydra cable 106 by keeping one of the plurality of tentacles 108 active and closing all other tentacles at any point in time. Multiple scans of the spectrum are made by switching the composite light from one slit (S2 to S8) to another entrance window/slit using multiple shutters. This ensures that only a single tentacle of the fiber optic cable 106 is "active" at any given point in time because all other tentacles are blocked by the corresponding shutters.
The optical system of the present disclosure is designed to cover a longer wavelength range by virtue of the multiple tentacles 108 of the hydra cable 106 and with multiple scans/switches using multiple slits (s1-s8) to analyze more of the desired spectral lines. Wavelength selector 103 is located downstream of first lens 105a and plurality of tentacles 108 of hydra cable 106.
In one embodiment, the system 100 of the present disclosure is used in any manner of optical emission spectroscopy.
Technical progress and economic significance
The present disclosure described above has several technical advantages, including, but not limited to, enabling a multi-scan optical system:
cost-effective;
make the optical system more compact;
provide better stability;
increase resolution; and
increase wavelength without affecting resolution.
The present disclosure has been described with reference to the accompanying examples, which do not limit the scope and ambit of the disclosure. This description is provided by way of example and example only.
The embodiments herein and the various features and advantageous details thereof are explained with reference to the non-limiting embodiments in the following description. Descriptions of well-known components and processing techniques are omitted so as to not unnecessarily obscure the embodiments herein. The examples used herein are intended merely to facilitate an understanding of ways in which the embodiments herein may be practiced and to further enable those of skill in the art to practice the embodiments herein. Accordingly, these examples should not be construed as limiting the scope of the embodiments herein.
The foregoing description of the specific embodiments reveals the general nature of the embodiments herein sufficiently that others can, by applying current knowledge, readily modify and/or adapt for various applications such embodiments without departing from the generic concept, and, therefore, such adaptations and modifications should and are intended to be comprehended within the meaning and range of equivalents of the disclosed embodiments. It is to be understood that the phraseology or terminology employed herein is for the purpose of description and not of limitation. Thus, while the embodiments herein have been described in terms of preferred embodiments, those skilled in the art will recognize that the embodiments herein can be practiced with modification within the spirit and scope of the embodiments described herein.
Throughout this specification the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element, integer or step, or group of elements, integers or steps, but not the exclusion of any other element, integer or step, or group of elements, integers or steps.
The use of the expression "at least" or "at least one" denotes the use of one or more elements or components or quantities, since in embodiments of the present disclosure the use may be to obtain one or more desired objects or results.
Any discussion of documents, acts, materials, devices, articles or the like which has been included in the present specification is solely for the purpose of providing a description of the present disclosure. It is not to be taken as an admission that any or all of these matters form part of the prior art base or were common general knowledge in the field relevant to the disclosure as it existed anywhere before the priority date of this application.
The numerical values of the various physical parameters, dimensions or quantities mentioned are only approximate values and it is assumed that values higher/lower than the numerical values assigned to these parameters, dimensions or quantities fall within the scope of the present disclosure unless a specific statement is made in the specification that they differ therefrom.
While considerable emphasis has been placed herein on the components and parts of the preferred embodiments, it will be appreciated that many embodiments can be made and that many changes can be made in the preferred embodiments without departing from the principles of the disclosure. These and other variations in the preferred and other embodiments of the present disclosure will be apparent to those skilled in the art from the disclosure herein, whereby it is to be distinctly understood that the foregoing descriptive matter is to be interpreted merely as illustrative of the disclosure and not as a limitation.

Claims (10)

1. A multi-scan optical system comprising:
an excitation source configured to emit composite light;
a hydra cable disposed downstream of the excitation source, the hydra cable having a head and a plurality of tentacles respectively disposed on a plurality of ends of the hydra cable, wherein:
the head is configured to collect, via a second lens, the composite light emitted by the excitation source; and is
The plurality of tentacles are configured to split the composite light collected by the head and are further configured to transmit a plurality of bundles of composite light;
a wavelength selector having a plurality of optical slits (s1-s8), the wavelength selector being configured to selectively collect and filter the composite light guided by the first lens and the plurality of composite lights transmitted by the plurality of tentacles, and further configured to guide a plurality of spectral line scans having different wavelengths and corresponding to each of the plurality of optical slits (s1-s 8); and
a detector configured to detect the plurality of spectral line scans reflected by the optical element for spectral analysis.
2. The system of claim 1, wherein the wavelength selector comprises a plurality of shutters configured to sequentially select at least one optical slit (s1-s 8).
3. The system of claim 2, wherein the plurality of shutters are pneumatically or electrically operated.
4. The system of claim 1, wherein the first and second lenses are configured to direct the composite light received from the excitation source to a first slit (s1) of the plurality of slits (s1-s8), and the hydra cable, respectively.
5. The system of claim 1, wherein the excitation source is selected from the group consisting of inductively coupled plasma, direct current plasma, and microwave induced plasma.
6. The system of claim 1, wherein the optical element is a holographic concave diffractive reflective grating.
7. The system of claim 1, wherein the first and second lenses are each spark light collecting lenses.
8. The system of claim 1, wherein each of the plurality of spectral line scans is associated with a respective angle of incidence.
9. The system of claim 1, wherein the detector is a charge coupled device.
10. The system of claim 1, wherein the plurality of spectral line scans have a wavelength in a range of 170nm to 380 nm.
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CN102803929A (en) * 2010-03-09 2012-11-28 Isis创新有限公司 Multi-spectral scanning system

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CN102803929A (en) * 2010-03-09 2012-11-28 Isis创新有限公司 Multi-spectral scanning system

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CN107525587A (en) 2017-12-29

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