CN107525537A - A kind of battery control box high temperature aging test device and combining structure - Google Patents

Abstract

The present invention relates to the field of test devices, and provides a battery control box high-temperature aging test device and a combined structure, wherein the test device includes a frame and a plurality of laminates for placing the tested pieces, and the multiple laminates are respectively connected to the side walls of the frame Connected and arranged in the frame at intervals in sequence; the bottom surface of the laminate is installed with a test piece for testing whether the tested piece meets the requirements for use, and the test piece and the tested piece are electrically connected through a circuit. The invention is used for high-temperature aging test on the battery control box, and can test a large number of battery control boxes at one time, facilitates the disassembly and assembly of the test piece and the tested piece, saves space, and improves the air circulation so that the tested piece is heated uniform.

Description

A battery control box high temperature aging test device and its combined structure

technical field

The invention relates to the field of test devices, in particular to a high-temperature aging test device for a battery control box and a combined structure.

Background technique

As the core component of a pure electric vehicle, the safety of the battery system will directly affect the vehicle performance and driving safety of the electric vehicle. In order to ensure the safe power supply of the battery system, the main control BMS system and the slave control BMU system must have strong stability and anti-aging capabilities; in order to prevent the control system from malfunctioning, causing danger, causing heavy losses, and even threatening the safety of drivers and passengers. Personal safety. Therefore, before the master control box and the slave control box are used, aging experiments are generally carried out on them. If the control box is placed on a trolley for detection in a limited space, on the one hand, the efficiency is low, and it takes up more time and resources; on the other hand, the ventilation is not good, and the heated air cannot evenly heat each control box. , making the test results inaccurate. A structure that is simple in structure, convenient in implementation and does not affect test results is required.

At present, the commonly used high-temperature aging test is to place a large number of test pieces and tested pieces on the desktop for checking whether the test piece satisfies the use requirements, and the tested piece is a battery control box. The test efficiency is low, the workload is heavy, and the ventilation is not good, so the master control BMU or slave control BMS is heated unevenly, resulting in inaccurate test results.

Contents of the invention

The first technical problem to be solved by the present invention is to provide a high-temperature aging test device for battery control boxes, which can test a large number of battery control boxes at one time, facilitate the disassembly and assembly of test pieces and tested pieces, save space, and improve air quality. Circulation so that the tested piece is heated evenly.

The technical solution of the present invention to solve the above-mentioned technical problems is as follows: a high-temperature aging test device for a battery control box, including a frame and a plurality of laminates for placing the test piece, and the plurality of laminates are respectively connected to the side walls of the frame connected and sequentially arranged in the frame at intervals; the bottom surface of the laminate is equipped with a test piece for testing whether the tested piece meets the requirements for use, and the test piece and the tested piece are electrically connected through a circuit.

The beneficial effects of the present invention are: by placing the tested piece on the laminate and installing the test piece on the bottom surface of the laminate, the rapid high-temperature aging test of the tested piece can be realized by replacing the tested piece during the test, In this way, a large number of tested parts can be tested at one time, the test space is saved, the ventilation effect is improved, the tested parts are heated evenly, and the test efficiency is improved while saving manpower and material resources.

On the basis of the above technical solutions, the present invention can also be improved as follows.

Further, in the high-temperature aging test device for a battery control box, the laminate is arranged horizontally, and two baffles are formed on its upper surface, and the two baffles and the laminate are used to place the Groove of the test piece.

The beneficial effect of adopting the above further solution is that a groove is formed on the laminate, and the tested piece is placed in the groove so as to facilitate the fixing of the tested piece.

Further, in the high-temperature aging test device for a battery control box, the laminate is connected to the test piece by bolts.

The beneficial effect of adopting the above further solution is to facilitate the disassembly and assembly of the test piece, save space and facilitate the test of the test piece.

Further, in the high-temperature aging test device for a battery control box, the peripheral edge of the laminate is extended to form a plug-in board, and a plug-in groove is formed on the side wall of the frame, and the plug-in board is adapted to plug in Connected to the socket body.

The beneficial effect of adopting the above further solution is to facilitate the disassembly and assembly of the laminates.

Further, in the high-temperature aging test device for a battery control box, the frame is a cubic structure surrounded by several beams, several columns and several connecting beams, the laminates are located in the cubic structure, and the surrounding edges Connect vertically to the column.

The beneficial effect of adopting the above further solution is that the frame composition structure is simple and stable.

Further, in the high-temperature aging test device for a battery control box, there are four beams, uprights, and connecting beams, and every two beams and two uprights are connected end to end to form a square frame, the four beams and the four uprights form two parallel square frames, and the two square frames are detachably connected by the connecting beams.

The beneficial effect of adopting the above further solution is that the ventilation effect can be improved through the structural arrangement of the beam and the column.

Further, the high-temperature aging test device for a battery control box further includes a support beam, the support beam includes a support rod and a plurality of support plates connected to the support rod, and a plurality of the support plates extend along the The rods are arranged in the lengthwise direction, the two ends of the support rods are installed on the frame respectively, and the upper surface of the support plate is in conflict with the bottom surface of the corresponding laminate.

The beneficial effect of adopting the above further solution is that the support beam can support the laminate.

A battery control box high temperature aging test device combination structure according to the second aspect of the present invention, including a plurality of test devices and a plurality of fixed beams according to the first aspect of the present invention, and the plurality of test devices include several first test devices device and several second test devices arranged in parallel at intervals, two adjacent second test devices are connected by the fixed beam; a first test device is arranged between every two adjacent second test devices , the first testing device is detachably connected to the fixing beam between two adjacent second testing devices.

The beneficial effects of the present invention are: the battery control box high-temperature aging test device according to the present invention has the advantages of saving test space, improving test efficiency and making the tested parts heated evenly, so by setting the battery control box high-temperature aging test device, it can be used once. Test a large number of test pieces and save test space and improve test efficiency.

On the basis of the above technical solutions, the present invention can also be improved as follows.

Further, in the combined structure of the battery control box high-temperature aging test device, two second test devices are used, and they are arranged in parallel with each other on both sides of the first test device, and the two second test devices The upper end of the upper end is connected through the fixed beam, and the first test device is located under the fixed beam and is detachably connected with the fixed beam.

The beneficial effect of adopting the above further solution is that by arranging the second testing device on both sides of the first testing device, the placement of the test piece and the tested piece can be increased under the premise of saving space.

Further, in the combined structure of the battery control box high temperature aging test device, a first slot is formed on the fixed beam, a second slot is formed on the upper side of the frame of the first test device, and the first slot is formed on the upper side of the frame of the first test device. A card slot and the second card slot are arranged correspondingly, and the first card slot and the second card slot are detachably connected by inserting blocks inserted therein.

The beneficial effect of adopting the above-mentioned further solution is that the disassembly and assembly of the high-temperature aging test device of the battery control box located under the fixed beam is facilitated through the arrangement of the insert block and the slot.

Description of drawings

Fig. 1 is the three-dimensional structure schematic diagram of testing device of the present invention;

Fig. 2 is a partially enlarged schematic diagram of part A in Fig. 1 of the present invention;

Fig. 3 is the structure schematic diagram that the present invention arranges the test piece and the test piece respectively on the layer board and the bottom;

Fig. 4 is a schematic top view of the laminate of the present invention;

Fig. 5 is a schematic diagram of the three-dimensional structure of the support beam of the present invention;

Fig. 6 is a schematic diagram of the combined structure of the testing device of the present invention;

FIG. 7 is a partially enlarged schematic diagram of part B in FIG. 6 of the present invention.

In the accompanying drawings, the list of parts represented by each label is as follows:

10. Test piece, 20. Test piece, 1. Frame, 2. Laminate, 3. Supporting beam, 11. Inserting groove body, 12. Beam, 13. Upright column, 14. Connecting beam, 15. Second card Groove, 21, plug plate, 22, front baffle, 23, rear baffle, 24, nut, 31, support rod, 32, support plate, 100, test device, 200, fixed beam, 201, first card slot , 300, insert block.

detailed description

The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

It should first be explained here that "inward" is a direction toward the center of the accommodation space, and "outward" is a direction away from the center of the accommodation space.

Referring to FIG. 1 to FIG. 5 , the present invention provides a high-temperature aging test device for a battery control box, which includes a frame 1 and a plurality of laminates 2 for placing a test piece 10 . A plurality of laminates 2 are respectively connected to the side walls of the frame 1 and arranged in the frame 1 at intervals in sequence. A test piece 20 for testing whether the tested piece 10 satisfies the use requirements is installed on the bottom surface of the laminate 2 . The test piece 20 is electrically connected to the tested piece 10 through a line.

Specifically, as shown in FIG. 1 , the frame 1 is surrounded by side walls to form an inner accommodation space, and the laminate 2 is located in the accommodation space. The laminates 2 can be arranged in the frame 1 at equal intervals from top to bottom, of course, other arrangements can also be used. The left and right ends of the laminate 2 and the side walls of the frame 1 can be fixedly connected or detachably connected. The tested object 10 is a battery control box, and may also be other containers for placing battery control components. The test piece 20 and the bottom surface of the laminate 2 can be installed in a detachable manner.

During the test, the entire battery control box high-temperature aging test device is located in a high-temperature space. The test piece 20 and the tested piece 10 are respectively located on the upper surface and the bottom surface of the laminate 2, and are electrically connected through the line and perform data transmission. The test piece 20 obtains the test result from the data transmitted by the tested piece 10, thereby knowing Whether the tested piece 10 meets the requirements for use.

Through the implementation of the present invention, the test piece 10 is placed on the laminate 2, and the test piece 20 is installed on the bottom surface of the laminate. Since the tested piece 10 is directly placed on the upper surface of the laminate 2, the rapid high-temperature aging test of the tested piece 10 can be realized by directly replacing the tested piece 10 during the test, so that a large number of tested pieces can be tested at one time. 10 to conduct the test, save the test space, improve the ventilation effect, make the tested piece 10 evenly heated, and improve the test efficiency while saving manpower and material resources.

In one embodiment, the laminate 2 is arranged horizontally, and two baffles are formed on its upper surface, and the two baffles and the laminate 2 form a groove for placing the tested object 10 .

Specifically, as shown in FIG. 2 and FIG. 3 , the test piece 10 is placed in the groove to facilitate the fixing of the test piece 10 so that the test piece 10 will not slip off the laminate 2 .

A front baffle 22 and a rear baffle 23 may be vertically arranged on the front and rear end sidewalls of the laminate 2 relative to the laminate 2 . The front baffle 22, the rear baffle 23 and the laminate 2 can be integrally formed. The lower end of the rear baffle 23 is connected to the laminate 2 , and the upper end of the rear baffle 23 is bent forward to form a horizontal plate, so that the rear baffle 23 forms an inverted "L"-shaped structure. Furthermore, the upper surfaces of the front baffle 22 , the rear baffle 23 and the laminate 2 are surrounded to form grooves for placing the test piece 10 .

In one embodiment, the laminate 2 and the test piece 20 are connected by bolts.

Specifically, as shown in FIG. 2 , FIG. 3 and FIG. 4 , nuts 24 can be riveted on the bottom surface of the laminate 2 , so that the test piece 20 can be screwed to the nut 24 by bolts or screws, and then connected to the bottom surface of the laminate 2 . Of course, when the laminate 2 has a certain thickness, threaded holes can be formed on the bottom surface of the laminate 2, and the test piece 20 can be directly threaded with the laminate 2 through bolts or screws.

In one embodiment, the peripheral edge of the laminate 2 is extended to form the socket board 21 . A socket body 11 is formed on the side wall of the frame 1 . The socket board 21 is fitted and plugged into the socket body 11 .

Specifically, as shown in FIG. 2 , FIG. 3 and FIG. 4 , the edge of the left and right ends of the laminate 2 extends downward to form a socket board 21 . In order to better fix the laminate 2 on the frame 1, the plug board 21 is arranged in an "L" shape, including mutually perpendicular bent portions and horizontal portions. On the front side wall and the rear side wall of the frame 1 , respectively protruding outwards are formed with insertion slots 11 . The bent part of the plug board 21 is plugged into the slot body on the front side wall of the frame 1 , and the horizontal part of the plug board 21 is plugged into the plug slot body on the rear side wall of the frame 1 . The socket body 11 can be configured as a cubic structure with a built-in space, wherein the cubic structure has an upper opening and a side opening, and the upper opening and the side opening communicate with the built-in space. The socket board 21 is inserted into the socket body 11 through the upper opening and the side opening. Thereby, the installation of the laminate 2 is facilitated. During installation, it is only necessary to insert the plug-in board 21 of the laminate 2 into the plug-in slot body 11 of the frame 1 from top to bottom, and install it sequentially along the frame 1 from bottom to top.

In one embodiment, the frame 1 is a cubic structure surrounded by a plurality of beams 12 , a plurality of columns 13 and a plurality of connecting beams 14 . The laminate 2 is located in the cube structure, and its peripheral edge is vertically connected with the column 13 .

Specifically, as shown in FIG. 1 , the beam 12 , the column 13 and the connecting pair 14 are arranged perpendicular to each other to form three mutually perpendicular sides of a cube structure. The beam 12 can be arranged horizontally, and the column 13 can be arranged vertically. The edges of the left and right ends of the laminate 2 are vertically connected with the column 13, so that the laminate 2 is arranged horizontally, which facilitates the placement of the test piece 10.

In one embodiment, there are four beams 12 , upright columns 13 and connecting beams 14 . Every two beams 12 and every two uprights 13 are connected end to end to form a square frame. Four beams 12 and four columns 13 form two parallel square frames. The connecting beams 14 are detachably connected between the two square frames.

Specifically, as shown in FIG. 1 , the two beams 12 are respectively an upper beam and a lower beam arranged horizontally and in parallel. The two uprights are respectively a left upright and a right upright which are arranged vertically and in parallel. The two ends of the upper beam are respectively connected with the upper end bolts of the left column and the right column, and the two ends of the lower beam are respectively connected with the lower end bolts of the left column and the right column, thereby forming a square frame. The two square frames are respectively the front square frame and the rear square frame arranged in parallel, and the upper and lower ends of the front square frame and the rear square frame are respectively connected by connecting beams, so as to facilitate ventilation and make the tested object 10 evenly heated .

In one embodiment, a supporting beam 3 is also included. The support beam 3 includes a support rod 31 and a plurality of support plates 32 connected to the support rod 31 . A plurality of support plates 32 are arranged along the length direction of the support rod 31 . Both ends of the support rod 31 are installed on the frame 1 respectively. The upper surface of the support plate 32 is in contact with the bottom surface of the corresponding laminate 2 .

Specifically, as shown in FIG. 1 and FIG. 5 , the upper and lower ends of the support rod 31 are bolted to the upper and lower side walls of the frame 1 respectively. The support plate 32 is used to support the laminate 2 , thereby increasing the firmness of the laminate 2 in the frame 1 . There are multiple test pieces 20 , and the multiple test pieces 20 are installed on the bottom surface of the laminate 2 along the left and right length direction of the laminate 2 at a certain distance from each other. The support plate 32 is located in the gap between two adjacent test pieces 20 and is in contact with the bottom surface of the laminate 2 .

An embodiment of the second aspect of the present invention is a combination structure of a battery control box high-temperature aging test device, including a plurality of test devices 100 and a plurality of fixed beams 200 according to the first aspect of the present invention. The multiple testing devices 100 include several first testing devices 101 and several second testing devices 102 arranged in parallel and at intervals. Two adjacent second testing devices 102 are connected by a fixed beam 200 . One first testing device 101 is arranged between every two adjacent second testing devices 102 . The first testing device 101 is detachably connected to the fixed beam 200 between two adjacent second testing devices 102 .

Specifically, more than two numbers may be used for multiple numbers, and more than one number may be used for several numbers. The fixing beam 200 can be located at any position in the up-down, front-back directions of the two adjacent second testing devices 102 , so as to facilitate the fixing of the two adjacent second testing devices 102 . The first testing device 101 may be located under the fixing beam 200 to facilitate the fixing of the first testing device 101 .

In one embodiment, two second testing devices 102 are used, and they are arranged parallel to each other on both sides of the first testing device 101 . The upper ends of the two second testing devices 102 are connected by a fixed beam 200 . The first testing device 101 is located below the fixed beam 200 and is detachably connected to the fixed beam 200 .

Specifically, as shown in FIG. 6 , three testing devices 100 and two fixed beams 200 are used. One first testing device 101 is used, and two second testing devices 102 are arranged in parallel, and are respectively located on the left and right sides of the first testing device 101 . The two fixed beams 200 are respectively a front fixed beam and a rear fixed beam. The upper ends of the two second test devices 102 are respectively connected to the front fixed beam and the rear fixed beam. Of course, the front fixed beam and the rear fixed beam can be located at any position in the front-back direction between the two second test devices 102 . The first testing device 101 is located under the rear fixed beam and is detachably connected to the rear fixed beam. Of course, the number of first testing devices 101 can also be increased, for example, two first testing devices 101 are used, so that two first testing devices 101 can be arranged at any position in the front-back direction between two second testing devices 102 . Due to the similar composition and structure, the number of 100 other test devices is not listed here. The combined structure of the test device can increase the number of places to be tested 10 and test pieces 20 , save the placement space and be evenly heated.

In one embodiment, a first locking slot 201 is formed on the fixed beam 200 . A second card slot 15 is formed on the upper side of the frame 1 of the first testing device 101 . The first card slot 201 and the second card slot 15 are arranged correspondingly. The first card slot 201 and the second card slot 15 are detachably connected by an insert block 300 inserted therein.

Specifically, as shown in FIG. 7 , the first card slot 201 and the second card slot 15 may adopt a "U"-shaped structure, and the insert block 300 may adopt an inverted "L"-shaped structure. The insert block 300 includes a horizontal part and a vertical part perpendicular to each other, wherein the vertical part is inserted into the first card slot 201 and the second card slot 15, and the horizontal part is located on the upper end surface of the first card slot 201 and protrudes outside the second card slot. The upper end surface of a card slot 201 can limit the insert block 300 to the first card slot 201 and the second card slot 15 . The detachable connection between the first test device 101 and the fixed beam 200 is realized by plugging and unplugging the plug block 300 .

In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Back", "Left", "Right", "Vertical", "Horizontal", "Top", "Bottom", "Inner", "Outer", "Clockwise", "Counterclockwise", "Axial", The orientation or positional relationship indicated by "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device or element Must be in a particular orientation, be constructed in a particular orientation, and operate in a particular orientation, and therefore should not be construed as limiting the invention.

In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless specifically defined otherwise.

In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it may be mechanically connected or electrically connected; it may be directly connected or indirectly connected through an intermediary, and it may be the internal communication of two components or the interaction relationship between two components, unless otherwise specified limit. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.

In the present invention, unless otherwise clearly specified and limited, the first feature may be in direct contact with the first feature or the first and second feature may be in direct contact with the second feature through an intermediary. touch. Moreover, "above", "above" and "above" the first feature on the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. "Below", "beneath" and "beneath" the first feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is less horizontally than the second feature.

In the description of this specification, descriptions with reference to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the described specific features, structures, materials or characteristics may be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art can combine and combine different embodiments or examples and features of different embodiments or examples described in this specification without conflicting with each other.

Although the embodiments of the present invention have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present invention, those skilled in the art can make the above-mentioned The embodiments are subject to changes, modifications, substitutions and variations.

Claims (10)

1. A high-temperature aging test device for a battery control box, characterized in that it comprises a frame (1) and a plurality of laminates (2) for placing a test piece (10), A plurality of the laminates (2) are respectively connected to the side walls of the frame (1) and are sequentially arranged in the frame (1) at intervals; The bottom surface of the laminate (2) is equipped with a test piece (20) for testing whether the tested piece (10) meets the requirements for use, and the test piece (20) and the tested piece (10) are electrically connected through the circuit. connect. 2. A battery control box high-temperature aging test device according to claim 1, characterized in that, the laminate (2) is arranged horizontally, and two baffles are formed on its upper surface, and the two baffles and The laminate (2) forms a groove for placing the tested piece (10). 3. A battery control box high-temperature aging test device according to claim 1 or 2, characterized in that the laminate (2) is connected to the test piece (20) by bolts. 4. A battery control box high-temperature aging test device according to claim 1 or 2, characterized in that, the peripheral edge of the laminate (2) extends to form a plug-in board (21), and the frame (1) A socket body (11) is formed on the side wall of the socket, and the socket board (21) is adapted to be plugged into the socket body (11). 5. A battery control box high-temperature aging test device according to claim 1 or 2, characterized in that the frame (1) is composed of several beams (12), several columns (13) and several connecting beams (14) In the enclosed cubic structure, the laminate (2) is located in the cubic structure, and its peripheral edge is vertically connected with the column (13). 6. A high-temperature aging test device for a battery control box according to claim 5, characterized in that, there are four beams (12), uprights (13) and connecting beams (14), each two Root described crossbeam (12) and every two described upright posts (13) form a square frame through end-to-end connection, four described crossbeams (12) and four described upright posts (13) form two parallel square frames , the two square frames are detachably connected through the connecting beam (14). 7. A battery control box high-temperature aging test device according to claim 1 or 2, characterized in that it also includes a support beam (3), and the support beam (3) includes a support rod (31) and is connected to the A plurality of support plates (32) on the support rod (31), a plurality of said support plates (32) are arranged along the length direction of the support rod (31), and the two ends of the support rod (31) are respectively installed on On the frame (1), the upper surface of the support plate (32) is in conflict with the bottom surface of the corresponding laminate (2). 8. A combined structure of a battery control box high temperature aging test device, characterized in that it comprises a plurality of test devices (100) and a plurality of fixed beams (200) according to any one of claims 1 to 7, and a plurality of the The testing device (100) comprises several first testing devices (101) and some second testing devices (102) arranged in parallel at intervals, and two adjacent second testing devices (102) pass through the fixed beam ( 200) connection; a first test device (101) is arranged between every two adjacent second test devices (102), and the first test device (101) and the adjacent two second test devices The fixed beams (200) between (102) are detachably connected. 9. A battery control box high-temperature aging test device combination structure according to claim 8, characterized in that, two second test devices (102) are used, and are respectively arranged in parallel with each other on the first test device ( 101), the upper ends of the two second test devices (102) are connected by the fixed beam (200), and the first test device (101) is located below the fixed beam (200) and connected to the fixed beam (200). The fixed beam (200) is detachably connected. 10. A combined structure of a battery control box high temperature aging test device according to claim 8, characterized in that a first clamping slot (201) is formed on the fixed beam (200), and the first test device (101 ) is formed with a second card slot (15) on the upper side of the frame (1), the first card slot (201) and the second card slot (15) are arranged correspondingly, and the first card slot (201 ) and the second card slot (15) are detachably connected through an insert block (300) inserted therein.