CN107515089A - A kind of temperature stress efficiently excites the reliability development test method of failure - Google Patents
A kind of temperature stress efficiently excites the reliability development test method of failure Download PDFInfo
- Publication number
- CN107515089A CN107515089A CN201710618162.5A CN201710618162A CN107515089A CN 107515089 A CN107515089 A CN 107515089A CN 201710618162 A CN201710618162 A CN 201710618162A CN 107515089 A CN107515089 A CN 107515089A
- Authority
- CN
- China
- Prior art keywords
- temperature
- stress
- failure
- testpieces
- test method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/08—Shock-testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/002—Thermal testing
Abstract
The invention discloses a kind of reliability development test method that temperature stress efficiently excites failure, belong to aviation reliability engineering technique field.Methods described includes choosing testing stand according to testpieces feature first；Secondly, testpieces temperature parameter and vibration parameters are obtained；Carry out low temperature step stress test, high temperature step stress test and fast temperature change experiment respectively afterwards, to the high temperature of product, low temperature and temperature change characteristic progress failure excites and resistance to temperature extremes is known the real situation, in the case where not changing the precondition of product bug mechanism, solves the engineering roadblock of short time raising product reliability level.
Description
Technical field
The invention belongs to aviation reliability engineering technique field, and in particular to what a kind of temperature stress efficiently excited failure can
By property development test method.
Background technology
Reliability test work is an important process project during military secret is developed, normally only before airborne equipment identification,
According to GJB899A-2009《Reliability determination and acceptance test》Specified in method examined, with electronic equipment day increasingly
Fast developing steps, also more and more higher, the index of many products already exceed thousands of hours, adopted the reliability level of electronic product
Directly examined with traditional reliability compliance test, either the test period, or experiment funds are all difficult to meet Project R＆D
Requirement.In order to effectively solve the contradiction between modern electronic equipment reliability and complexity, improve reliability test efficiency, most
The reduction electronic equipment Life Cycle Cost of big degree, it is great property to carry out reliability development test in the development stage of product
Valency than test method.
In traditional Reliability Engineering, life-span of electronic equipment is considered as that " unlimited " (is far longer than equipment
Service phase), while think that the failure of electronic equipment is random " accidental " generation, can not chase after and trace sth. to its source and stress relation.Closely
Nian Lai, with the development of reliability engineering, the reliability theory based on faulty physical has been received by Reliability Engineers, everybody
Think " accidental " failure be due in product there is caused by potential design and craft defect, over time can must
So occur, carry out reliability development test initial stage in product development, be the experiment side of the optimal reliability level for improving product
Formula.
In traditional reliability test method, the requirement to failure is generally, and is out of order in experiment, should be stopped first
Experiment, after carrying out accident analysis, zero, carry on experiment, i.e., the test method that a failure one is zeroed, this test method
The test period will greatly be increased, reduce test efficiency.
The content of the invention
In order to solve the above problems, overcome prior art to carry out reliability test cycle length for airborne equipment, excite event
The shortcomings that barrier efficiency is low, and a failure one is zeroed, a kind of searching design deficiency of product is proposed, with Curve guide impeller, raising product is consolidated
There is the reliability development test method of reliability level.
Temperature stress of the present invention efficiently excites the reliability development test method of failure, including：
Step 1: testing stand is chosen according to testpieces feature；
Step 2: obtain testpieces temperature parameter and vibration parameters；
Step 3: low temperature step stress test is carried out, when temperature is down to -80 DEG C in a stepping manner, in each temperature section
Carry out electric stress loading；
Step 4: high temperature step stress test is carried out, when temperature rises to 110 DEG C in a stepping manner, in each temperature section
Carry out electric stress loading；
Step 5: carrying out fast temperature change experiment, carrying out electricity within the cycle that continuous high temperature and consecutive low temperature are formed should
Power loads.
Preferably, in the step 1, selected according to the volume of airborne equipment, weight, installation direction and environment extreme value
Suitable testing stand is taken, the testing stand includes impact type vibration mechine and electromagnetic vibration test platform.
Preferably, in the step 2, the temperature parameter includes the focus situation and heat distribution liter inside testpieces
Tender feeling condition, the vibration parameters include the resonance point and stress accumulation point of testpieces.
It is preferably, described that Step 3: in step 4 and step 5, the electric stress loading, which includes being powered three times, to be started,
And after last time is powered, electric stress loading is kept, for carrying out functional test, the duration of the holding is not less than 30min,
The temperature variability is not less than 30 DEG C/min.
Preferably, in the step 3, when the temperature is down to -80 DEG C in a stepping manner, including use 10 DEG C for
Step-length is cooled to -55 DEG C, and uses 5 DEG C to be cooled to -80 DEG C from -55 DEG C for step-length；In the step 4, the temperature is with step
When the mode entered rises to 110 DEG C, including use 10 DEG C to be cooled to 70 DEG C for step-length, and use 5 DEG C to be heated up for step-length from 70 DEG C
To 110 DEG C.
Preferably, in the step 5, continuous high temperature is included at -5 DEG C of the testpieces hot operation limit, continues 30min,
Consecutive low temperature is included at+5 DEG C of the testpieces low-temperature working limit, continues 30min.
Preferably, in step 2, further comprise being directed to thermally sensitive testpieces, using micro environment control, institute
Stating micro environment control is included by the way that ventilation tracheae is fixed into testpieces detected part.
Preferably, step 3 is into step 5, when testpieces finds failure or during to working limit, and now tests temperature
When degree does not reach test objective also, including the method for temperature protection is taken to protect the weak spot of discovery, to ensure rear
Continue product in further harsher stress and remain to normal work.
Novelty of the invention proposes a kind of reliability development test side for repeatedly exciting failure, primary fault to be zeroed
Method, to the high temperature of product, low temperature and temperature change characteristic progress failure excites and resistance to temperature extremes is known the real situation, and is not changing product bug machine
Under the precondition of reason, solves the engineering roadblock of short time raising product reliability level.
Brief description of the drawings
Fig. 1 is the low of a preferred embodiment of the reliability development test method that temperature stress of the present invention efficiently excites failure
The stress of warm step stress test applies schematic diagram.
Fig. 2 is that the stress of the high temperature step stress test of embodiment illustrated in fig. 1 of the present invention applies schematic diagram.
Fig. 3 is that the stress for carrying out fast temperature change experiment of embodiment illustrated in fig. 1 of the present invention applies schematic diagram.
Embodiment
To make the purpose, technical scheme and advantage that the present invention is implemented clearer, below in conjunction with the embodiment of the present invention
Accompanying drawing, the technical scheme in the embodiment of the present invention is further described in more detail.In the accompanying drawings, identical from beginning to end or class
As label represent same or similar element or the element with same or like function.Described embodiment is the present invention
Part of the embodiment, rather than whole embodiments.The embodiments described below with reference to the accompanying drawings are exemplary, it is intended to uses
It is of the invention in explaining, and be not considered as limiting the invention.Based on the embodiment in the present invention, ordinary skill people
The every other embodiment that member is obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.Under
Embodiments of the invention are described in detail with reference to accompanying drawing for face.
In the description of the invention, it is to be understood that term " " center ", " longitudinal direction ", " transverse direction ", "front", "rear",
The orientation or position relationship of the instruction such as "left", "right", " vertical ", " level ", " top ", " bottom " " interior ", " outer " is based on accompanying drawing institutes
The orientation or position relationship shown, it is for only for ease of the description present invention and simplifies description, rather than instruction or the dress for implying meaning
Put or element there must be specific orientation, with specific azimuth configuration and operation, therefore it is not intended that the present invention is protected
The limitation of scope.
The present invention proposes a kind of reliability development test method that temperature stress efficiently excites failure, mainly includes：
Step 1: testing stand is chosen according to testpieces feature；
Step 2: obtain testpieces temperature parameter and vibration parameters；
Step 3: low temperature step stress test is carried out, when temperature is down to -80 DEG C in a stepping manner, in each temperature section
Carry out electric stress loading；
Step 4: high temperature step stress test is carried out, when temperature rises to 110 DEG C in a stepping manner, in each temperature section
Carry out electric stress loading；
Step 5: carrying out fast temperature change experiment, carrying out electricity within the cycle that continuous high temperature and consecutive low temperature are formed should
Power loads.
In the present embodiment, in the step 1, according to the volume of airborne equipment, weight, installation direction and environment extreme value come
Suitable testing stand is chosen, the domestic testing stand currently used for reliability development test is mainly impact type vibration mechine (three
Axle six degree of freedom) and two kinds of electromagnetic vibration test platform (routine test platform), the major parameter of two kinds of testing stands is as follows.
| Impact type vibration mechine | Electromagnetic vibration test platform | |
| Temperature | -100℃-200℃ | -70℃-180℃ |
| Temperature becomes | 50 DEG C/more than s | 15 DEG C/below s |
| Vibration force | 100g | 30g |
| Vibration frequency | 0-10000Hz | 5-2000Hz |
| Volume | It is small | It is adjustable |
In the present embodiment, in the step 2, the temperature investigation of reply tested products, heat distribution point is carried out to tested products
Analysis, understand focus situation and heat distribution ramp case inside tested products, be temperature sensor in reliability development test
Arrangement provides reference；Will also be to tested products Vibration Survey, in terms of carrying out the vibratory response of low vibration magnitude to tested products
Investigation, the preliminary resonance point and stress accumulation point for understanding tested products, is carried for the arrangement of reliability development test vibrating sensor
For reference.
In the present embodiment, described Step 3: in step 4 and step 5, the electric stress loading, which includes being powered three times, opens
It is dynamic, and after last time is powered, electric stress loading is kept, for carrying out functional test, the duration of the holding is not less than
30min, the temperature variability are not less than 30 DEG C/min.
Fig. 1 is that the stress of low temperature step stress test applies schematic diagram.Before temperature is down to more safe temperature, examination
Test step-length may be selected it is larger；After more safe temperature, experiment step-length is optional smaller, in favor of being exactly found temperature
Weak spot.It is step-length with -5 DEG C for example, after temperature reaches -55 DEG C, and with -10 DEG C is being before step-length.
Temperature sensor is arranged on the low temperature focus inside tested products (multiple spot as far as possible, to determine the temperature of product
Spend stable state).Low temperature cut-off condition should select the product low temperature damage limit or subscribe test objective, airborne equipment selection -80
DEG C to fix one's aim in advance.
Fig. 2 is that the stress of high temperature step stress test applies schematic diagram.
Before temperature rises to more safe temperature, experiment step-length may be selected larger；More than more safe temperature it
Afterwards, it is optional smaller to test step-length, in favor of being exactly found temperature weak spot.For example, after temperature reaches 70 DEG C, with 5 DEG C
For step-length, and before with 10 DEG C for step-length.
Temperature sensor is arranged on the high temperature focus inside tested products (multiple spot as far as possible, to determine the temperature of product
Spend stable state).High temperature cut-off condition should select the product high temperature limit or subscribe test objective, and airborne equipment suggestion is selected
110 DEG C are to fix one's aim in advance.
Fig. 3 is to carry out the stress application schematic diagram that fast temperature change is tested, and in the step 5, continuous high temperature includes examination
Test at -5 DEG C of the part hot operation limit, continue 30min, consecutive low temperature is included at+5 DEG C of the testpieces low-temperature working limit, continues
30min.Using normal temperature as fast temperature, the beginning of change circulation, rate temperature change are not less than 30 DEG C/min, and temperature range is
+ 5 DEG C of the low-temperature working limit~-5 DEG C of the hot operation limit (such as：The tested products low-temperature working limit is -60 DEG C, hot operation
The limit is 100 DEG C, if without particular/special requirement, fast temperature change trial temperature range is -55 DEG C~95 DEG C).
In order to strengthen humid test effect, ensureing the temperature of airborne equipment each several part can transmit as early as possible, and the present embodiment needs
Hollow out cabinet is made to carry out temperature classes experiment, the design of hollow out cabinet should meet the installation of product original cabinet and intensity is set
Meter requires.
In the present embodiment step 2, further comprise being directed to thermally sensitive testpieces, it is described using micro environment control
Micro environment control includes passing through is fixed to testpieces detected part by ventilation tracheae, for ensureing the temperature of airborne equipment each several part
Can accurately it control.
In the present embodiment, step 3 is into step 5, when testpieces finds failure or during to working limit, and now tests
When temperature does not reach test objective also, including the method for temperature protection is taken to protect the weak spot of discovery, to ensure
Subsequently further product remains to normal work in harsher stress.
There is microenvironment temperature control safeguard measure, it is possible in a certain temperature step because working machine occurs for some device
During failure in case, using safeguard measure so that continue to next step stress, miscellaneous part is excited.Deng sharp
When hair stress reaches test objective, Analysis on Mechanism, failure zero are carried out together to the failure of multiple devices, so as to greatly improve
Test efficiency.
Novelty of the invention proposes a kind of reliability development test side for repeatedly exciting failure, primary fault to be zeroed
Method, using measures such as hollow out cabinet, microenvironment temperature protections, characteristic progress failure is become to the high temperature of product, low temperature and temperature and excited
And resistance to temperature extremes is known the real situation, in the case where not changing the precondition of product bug mechanism, solves short time raising product reliability
Horizontal engineering roadblock.
It is last it is to be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations.To the greatest extent
The present invention is described in detail with reference to the foregoing embodiments for pipe, it will be understood by those within the art that：It is still
Technical scheme described in foregoing embodiments can be modified, or which part technical characteristic is equally replaced
Change；And these modifications or replacement, the essence of appropriate technical solution is departed from the essence of various embodiments of the present invention technical scheme
God and scope.
Claims (8)
1. a kind of temperature stress efficiently excites the reliability development test method of failure, it is characterised in that including:
Step 1: testing stand is chosen according to testpieces feature；
Step 2: obtain testpieces temperature parameter and vibration parameters；
Step 3: carrying out low temperature step stress test, when temperature is down to -80 DEG C in a stepping manner, carried out in each temperature section
Electric stress loads；
Step 4: carrying out high temperature step stress test, when temperature rises to 110 DEG C in a stepping manner, carried out in each temperature section
Electric stress loads；
Step 5: carrying out fast temperature change experiment, carrying out electric stress within the cycle that continuous high temperature and consecutive low temperature are formed adds
Carry.
2. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that institute
State in step 1, suitable testing stand is chosen according to the volume of airborne equipment, weight, installation direction and environment extreme value, it is described
Testing stand includes impact type vibration mechine and electromagnetic vibration test platform.
3. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that institute
State in step 2, the temperature parameter includes the focus situation and heat distribution ramp case inside testpieces, the vibration parameters
Resonance point and stress accumulation point including testpieces.
4. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that institute
To state Step 3: in step 4 and step 5, the electric stress loading, which includes being powered three times, to be started, and after last time is powered,
Electric stress loading is kept, for carrying out functional test, the duration of the holding is not less than 30min, and the temperature variability is not less than
Less than 30 DEG C/min.
5. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that institute
State in step 3, when the temperature is down to -80 DEG C in a stepping manner, including use 10 DEG C to be cooled to -55 DEG C for step-length, and
5 DEG C are used to be cooled to -80 DEG C from -55 DEG C for step-length；In the step 4, when the temperature rises to 110 DEG C in a stepping manner,
Including using 10 DEG C to be cooled to 70 DEG C for step-length, and 5 DEG C are used to be warming up to 110 DEG C from 70 DEG C for step-length.
6. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that institute
State in step 5, continuous high temperature is included at -5 DEG C of the testpieces hot operation limit, continues 30min, and consecutive low temperature includes testpieces
At+5 DEG C of the low-temperature working limit, continue 30min.
7. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that step
In rapid two, further comprise being directed to thermally sensitive testpieces, using micro environment control, the micro environment control includes passing through
Ventilation tracheae is fixed to testpieces detected part.
8. temperature stress as claimed in claim 1 efficiently excites the reliability development test method of failure, it is characterised in that step
Rapid three into step 5, and when testpieces finds failure or during to working limit, and now test temperature does not reach test objective also
When, including take the method for temperature protection to protect the weak spot of discovery, with ensure it is subsequently further harsher should
Product remains to normal work in power.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710618162.5A CN107515089A (en) | 2017-07-26 | 2017-07-26 | A kind of temperature stress efficiently excites the reliability development test method of failure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710618162.5A CN107515089A (en) | 2017-07-26 | 2017-07-26 | A kind of temperature stress efficiently excites the reliability development test method of failure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107515089A true CN107515089A (en) | 2017-12-26 |
Family
ID=60722784
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710618162.5A Pending CN107515089A (en) | 2017-07-26 | 2017-07-26 | A kind of temperature stress efficiently excites the reliability development test method of failure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107515089A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110412497A (en) * | 2019-06-11 | 2019-11-05 | 国网重庆市电力公司电力科学研究院 | A kind of intelligent electric energy meter weak links of reliability localization method and device |
| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1492492A (en) * | 2003-09-24 | 2004-04-28 | 北京工业大学 | Quick evaluation method for microelectronic device reliability |
| CN102495307A (en) * | 2011-11-28 | 2012-06-13 | 四川长虹电器股份有限公司 | Flat panel television reliability test method |
| CN103018027A (en) * | 2012-12-07 | 2013-04-03 | 西安航空制动科技有限公司 | Method for exciting faults of airplane brake valve |
| CN103852672A (en) * | 2014-03-31 | 2014-06-11 | 中国航天科工运载技术研究院北京分院 | Environmental stress screening method of electronic device by using stepping stress |
| CN104459408A (en) * | 2014-12-11 | 2015-03-25 | 中国电子科技集团公司第二十研究所 | Method for verifying product reliability through temperature-stress-increased accelerated lift test |
| CN105572498A (en) * | 2015-12-11 | 2016-05-11 | 中国航空工业集团公司西安飞机设计研究所 | Reliability acceleration test method of electronic products |
-
2017
- 2017-07-26 CN CN201710618162.5A patent/CN107515089A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1492492A (en) * | 2003-09-24 | 2004-04-28 | 北京工业大学 | Quick evaluation method for microelectronic device reliability |
| CN102495307A (en) * | 2011-11-28 | 2012-06-13 | 四川长虹电器股份有限公司 | Flat panel television reliability test method |
| CN103018027A (en) * | 2012-12-07 | 2013-04-03 | 西安航空制动科技有限公司 | Method for exciting faults of airplane brake valve |
| CN103852672A (en) * | 2014-03-31 | 2014-06-11 | 中国航天科工运载技术研究院北京分院 | Environmental stress screening method of electronic device by using stepping stress |
| CN104459408A (en) * | 2014-12-11 | 2015-03-25 | 中国电子科技集团公司第二十研究所 | Method for verifying product reliability through temperature-stress-increased accelerated lift test |
| CN105572498A (en) * | 2015-12-11 | 2016-05-11 | 中国航空工业集团公司西安飞机设计研究所 | Reliability acceleration test method of electronic products |
Non-Patent Citations (1)
| Title |
|---|
| 冯帅 等: "可靠性强化试验及其在某型机载吊舱关键模块的应用", 《火力与指挥控制》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110412497A (en) * | 2019-06-11 | 2019-11-05 | 国网重庆市电力公司电力科学研究院 | A kind of intelligent electric energy meter weak links of reliability localization method and device |
| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114442593B (en) * | 2022-01-21 | 2023-05-12 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105416609B (en) | A kind of multi- scenarios method pilot system and test method | |
| CN107064665B (en) | Electronic product combined stress strenuous test method | |
| CN101131417B (en) | Battery monitoring system | |
| CN104813182B (en) | The steady state detection of abnormal charge event in the cell device being connected in series | |
| CN108146260B (en) | The test method that vehicle feedback braking electric current influences lithium ion battery service life | |
| CN103326076B (en) | A kind of electrokinetic cell recycling method | |
| CN103512716B (en) | A kind of method of antiskid braking control box highly accelerated stress screen | |
| CN105203965A (en) | Energy storage battery detection method | |
| CN107515089A (en) | A kind of temperature stress efficiently excites the reliability development test method of failure | |
| CN104615517A (en) | Method for detecting server products through using HALT | |
| CN105738829A (en) | Method for identifying equivalent circuit model parameters of power lithium battery | |
| CN104813183B (en) | The Transient detection of abnormal charge event in the cell device being connected in series | |
| CN104883112A (en) | Asynchronous motor parameter offline identification method | |
| CN106501297A (en) | A kind of NMR measuring system for the detection of composite insulator degree of aging | |
| CN110412497A (en) | A kind of intelligent electric energy meter weak links of reliability localization method and device | |
| US20230022649A1 (en) | Method, apparatus and program product for predicting multiaxial fatigue life | |
| CN104849073B (en) | The experimental rig and test method of ride-control durability | |
| Roedig et al. | Simulation of transient heat loads on high heat flux materials and components | |
| CN203275628U (en) | High voltage battery pack external characteristic simulator | |
| CN103728487B (en) | Method for metering real radio frequency detonating energy of electric initiating explosive device | |
| CN110146214A (en) | Battery modules copper bar bolt best torque measuring method and device | |
| CN109188304A (en) | A kind of power battery pack system SOC method for testing precision | |
| CN108918106A (en) | A kind of method for testing fatigue of the pneumatic equipment bladess loaded stage by stage | |
| CN107465206A (en) | A kind of anti-isolated island recognition methods of wind power plant based on harmonic impedance matrix and its system | |
| CN111475930A (en) | Fan switching test system and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20171226 |
|
| RJ01 | Rejection of invention patent application after publication |