CN107402362B - Flicker testing method and device - Google Patents

Flicker testing method and device Download PDF

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CN107402362B
CN107402362B CN201610341748.7A CN201610341748A CN107402362B CN 107402362 B CN107402362 B CN 107402362B CN 201610341748 A CN201610341748 A CN 201610341748A CN 107402362 B CN107402362 B CN 107402362B
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flicker
input voltage
predetermined time
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CN107402362A (en
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侯勇
陈力
李受明
熊杰锋
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Siemens AG
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract

The invention provides a flicker testing method and a flicker testing device, which comprise the following steps: using the root mean square value of the first n-cycle
Figure DDA0000996066840000011
Normalizing the input voltage A for a predetermined time and outputting the normalized input voltage
Figure DDA0000996066840000012
Recovering the fluctuations of the input voltage by squaring the normalized input voltage to simulate the behavior of an incandescent lamp; filtering out the voltage fluctuation amount of the frequency which can be received by human eyes by a first low-pass filter to simulate the behavior of the human eyes, and weighting the filtered voltage fluctuation amount by a visual perception weighting filter to highlight the frequency which is most sensitive to the human eyes; squaring the output, inputting it to a second low-pass filter, and outputting instantaneous flicker visibility
Figure DDA0000996066840000013
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure DDA0000996066840000014
The invention ensures that the relative fluctuation quantity is not changed in the test, the calculation quantity is not large, and the accurate instantaneous flicker visual sensitivity and the maximum value of the instantaneous flicker visual sensitivity in the preset time can be finally output.

Description

Flicker testing method and device
Technical Field
The invention relates to the field of smart power grids, in particular to a flicker testing method and device.
Background
Voltage fluctuations and flicker are a series of voltage random variations or periodic variations of the voltage envelope and the resulting illumination flicker. Voltage fluctuations and flicker are an important technical indicator of the power quality of an electrical power system.
Wherein, the voltage flicker is the visual response of human eyes which is unstable in light illumination caused by voltage fluctuation. The voltage flicker reflects the influence of the light flicker caused by the voltage fluctuation on the human visual perception. Voltage flicker is a result of voltage fluctuations, which are not electromagnetic phenomena. In order to reflect the instantaneous flicker sensation level of a human, the instantaneous flicker sensation level is described by the change of the instantaneous value of the flicker intensity along with time, namely the instantaneous flicker visual sensitivity, which is the result of the comprehensive action of the frequency, the waveform, the size and the like of voltage fluctuation, and the curve of the change along with time is the basis for evaluating and measuring flicker. When the instantaneous flicker visual sensitivity is larger than 1, the condition that more people in the experimental observer have obvious feeling on the flicker of the light is defined as the corresponding flicker impermissible level.
The IEC recommended flicker meter block diagram includes a module for inputting an adaptive self-test signal, namely normalizing the input voltage.
The half-wave effective value of the first normalization method is output through a first-order low-pass filter with a time constant of 27.3s, the signal is updated once every half cycle, and the output signal is used for normalizing the sampling point of the half cycle.
The second normalization method adopts the sliding of 1 minute voltage effective value to carry out normalization, updates every half cycle, and uses the output signal to carry out normalization on the sampling point of the half cycle.
The two methods can realize the normalization of signals, but because the output value of the half-cycle wave is not constant, the relative fluctuation amount of the effective value of the voltage is changed when the normalization processing is carried out on the input voltage signal.
Disclosure of Invention
The flicker testing method of the first aspect of the invention comprises the following steps: step S1, using the root mean square value of the first n-cycle
Figure GDA0002190843440000021
Normalizing the input voltage A for a predetermined time and outputting the normalized input voltage
Figure GDA0002190843440000022
Step S2, restoring the fluctuation of the input voltage by squaring the normalized input voltage to simulate the behavior of the incandescent lamp; step S3, filtering out the voltage fluctuation quantity of the frequency that the human eye can receive by passing the voltage fluctuation through a first low-pass filter to simulate the human eye behavior, and filtering out the voltage by passing the voltage through a visual perception weighting filterThe amount of fluctuation is weighted to highlight the frequencies to which the human eye is most sensitive; step S4, square the output of step S3, input the second low-pass filter, and output the instantaneous flicker visibility
Figure GDA0002190843440000023
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure GDA0002190843440000024
The invention ensures that the relative fluctuation quantity is not changed in the test, the calculation quantity is not large, and the accurate instantaneous flicker visual sensitivity and the maximum value of the instantaneous flicker visual sensitivity in the preset time can be finally output.
Further, the flicker testing method further comprises the following steps: and S5, counting all Pinst within a preset time to obtain a short flicker statistic value Pst.
Further, in step S1, the normalized input voltage output is:
Figure GDA0002190843440000025
wherein A is the input voltage, VrefVsc is the internal reference value, g is the scaling factorm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
Further, the rectangular square wave
Figure GDA0002190843440000026
Wherein the content of the first and second substances,
Figure GDA0002190843440000027
is the peak-to-peak amplitude, fmIs the frequency.
Further, the output of step S2 is:
Figure GDA0002190843440000028
wherein, VrefVsc is a scaling factor for the internal reference value.
Further, the input of step S3 is:
Figure GDA0002190843440000029
further, the test method further comprises the following steps of correcting the maximum value of the instantaneous flicker visibility, wherein the corrected maximum value of the instantaneous flicker visibility is as follows:
Figure GDA00021908434400000210
wherein the content of the first and second substances,
Figure GDA00021908434400000211
is the root mean square value within a predetermined time.
Further, the testing method further comprises the following steps of correcting the short flicker statistic value, wherein the corrected short flicker statistic value is as follows:
Figure GDA0002190843440000031
wherein the content of the first and second substances,
Figure GDA0002190843440000032
is the root mean square value within a predetermined time.
Further, the first n-cycle is a first ten-cycle.
Further, the predetermined time is ten minutes.
The second aspect of the present invention also provides a flicker testing apparatus, comprising: normalization means for taking the root mean square value of the first n-cycle
Figure GDA0002190843440000033
Normalizing the input voltage A for a predetermined time and outputting the normalized input voltage
Figure GDA0002190843440000034
First simulation means for restoring fluctuation of the input voltage by squaring the input voltage after normalization to simulate incandescent lightThe behavior of the lamp; the second simulation device is used for filtering out the voltage fluctuation quantity of the frequency which can be received by human eyes by passing the voltage fluctuation through the first low-pass filter so as to simulate the behavior of the human eyes, and weighting the filtered out voltage fluctuation quantity through the visual perception weighting filter so as to highlight the frequency which is most sensitive to the human eyes; an output device for squaring the output of the second analog device, inputting the squared output to a second low-pass filter, and outputting instantaneous flicker visibility
Figure GDA0002190843440000035
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure GDA0002190843440000036
The invention ensures that the relative fluctuation quantity is not changed in the test, the calculation quantity is not large, and the accurate instantaneous flicker visual sensitivity and the maximum value of the instantaneous flicker visual sensitivity in the preset time can be finally output.
Further, the flicker testing method further comprises the following steps: and the counting device is used for counting all Pinst within a preset time to obtain a short flicker statistic value Pst.
Further, the normalized input voltage output by the normalization device is:
Figure GDA0002190843440000037
wherein A is the input voltage, VrefVsc is the internal reference value, g is the scaling factorm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
Further, the rectangular square wave
Figure GDA0002190843440000038
Wherein the content of the first and second substances,
Figure GDA0002190843440000039
is the peak-to-peak amplitude, fmIs the frequency.
Further, the output of the first analog device is:
Figure GDA00021908434400000310
wherein, VrefVsc is a scaling factor for the internal reference value.
Further, the inputs of the second simulation apparatus 130 are:
Figure GDA0002190843440000041
further, the testing method further comprises a correcting device 160 for correcting the maximum instantaneous flicker visibility, where the corrected maximum instantaneous flicker visibility is:
Figure GDA0002190843440000042
wherein the content of the first and second substances,
Figure GDA0002190843440000043
is the root mean square value within a predetermined time.
Further, the testing method further includes a correcting device 160 for correcting the short flicker statistic, where the corrected short flicker statistic is:
Figure GDA0002190843440000044
wherein the content of the first and second substances,
Figure GDA0002190843440000045
is the root mean square value within a predetermined time.
Further, the first n-cycle is a first ten-cycle.
Further, the predetermined time is ten minutes.
Drawings
FIG. 1 is a flow chart of the steps of a flicker testing method according to an embodiment of the present invention;
FIG. 2 is a waveform schematic diagram of a rectangular square wave for modulation according to a flicker testing method of an embodiment of the invention;
FIG. 3 is a schematic diagram of a flicker testing apparatus according to an embodiment of the present invention.
Detailed Description
The following describes a specific embodiment of the present invention with reference to the drawings.
The flicker test mechanism provided by the invention firstly adopts a self-defined root mean square value to normalize the input voltage, then simulates the behavior of an incandescent lamp by restoring the fluctuation of the voltage, then selects the frequency which can be accepted by human eyes and highlights the most sensitive frequency by using a low-pass filter and a visibility weighting filter respectively, then inputs another low-pass filter and outputs the instantaneous flicker visibility and the maximum value of the instantaneous flicker visibility within a preset time, and finally obtains a short flicker statistic value. In addition, the invention further comprises the following steps of instantaneous flicker visibility maximum value and short flicker statistic correction.
Wherein, preferably, the root mean square value of the first 10 cycles is adopted by the invention
Figure GDA0002190843440000058
To normalize the input voltage a over ten minutes. It should be understood by those skilled in the art that the present invention can also select any other rms value of n cycles to normalize the input voltage for a predetermined time, and all such rms values are within the scope of the present invention. For convenience of explanation, the present invention will be described by taking 10 cycles and ten minutes as examples.
Fig. 1 is a flowchart illustrating steps of a flicker testing method according to an embodiment of the present invention, and as shown in fig. 1, the flicker testing method provided by the present invention includes the following steps.
First, step S1 is executed to adopt the RMS value of the first 10 cycles
Figure GDA0002190843440000051
Normalizing the input voltage A within ten minutes and outputting the normalized input voltage
Figure GDA0002190843440000052
Figure GDA0002190843440000053
Wherein A is the input voltage, VrefVsc is the internal reference value, g is the scaling factorm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
In this step, a voltage adaptation circuit (voltage adaptation circuit) is used to measure the input voltage of the power supply frequency to an internal standard level (internal reference level). The normalization step is to reduce the influence of the input voltage A on the output of the step as much as possible, so that the output changes only by g as much as possiblem(t) is determined. Specifically, the purpose of step S1 is to make the flicker measurement independent of the input voltage level and by reducing the input voltage level to an internal reference value VrefTo retain the relative amount of fluctuation.
The waveform shown in FIG. 2 has an ordinate gm(T) with time T, T on the abscissamRepresenting the time of one cycle. Rectangular square wave
Figure GDA0002190843440000054
Wherein the content of the first and second substances,
Figure GDA0002190843440000055
is the peak-to-peak amplitude, fmIs the frequency.
Then, step S2 is performed to recover the fluctuation of the input voltage by squaring the normalized input voltage to simulate the behavior of the incandescent lamp. Wherein the output of step S2 is:
Figure GDA0002190843440000056
wherein, VrefAs an internal reference value, Vsc is a scaling factor,
Figure GDA0002190843440000057
for peak-to-peak amplitude, A is the behavior of the simulated human eye, and the filtered voltage is passed through a perceptibility weighting filterThe amount of fluctuation is weighted to highlight the frequencies to which the human eye is most sensitive. The two filters are used for eliminating the direct current component and strongly weakening the frequency component to be more than 2f0. The input of step S3 is:
Figure GDA0002190843440000061
specifically, human eyes feel different to fluctuation of different frequencies, the frequency which can be felt and responded by the human eyes is 0.05-35 hz, the human eyes are most sensitive to 8.8hz, and even if the fluctuation amplitude is the same, the human eyes are particularly uncomfortable to 8.8. Therefore, in step S3, the voltage fluctuation is filtered out by passing through the first low pass filter to simulate the behavior of the human eye, and then further passed through the visual perception weighting filter, the frequency 8.8hz is set as the maximum value of 1, and the perception of the human eye is not set to 1 to highlight the frequency most sensitive to the human eye.
Then, step S4 is executed to square the output of step S3, input the squared output into the second low-pass filter, and output the instantaneous flicker visibility
Figure GDA0002190843440000062
And instantaneous flicker visual acuity maximum over ten minutes
Figure GDA0002190843440000063
Specifically, step S4 simulates a non-linear human eye-to-human brain response, and then calculates the proportion of the perceptual-storage effect to the human brain.
Finally, step S5 is executed to count all pinsts in a predetermined time to obtain the short flicker statistic Pst.
Further, the RMS value of the first 10 cycles is customized in step S1 according to the present invention
Figure GDA0002190843440000064
The input voltage a is normalized for ten minutes, and thus the instantaneous flicker visibility output at step S4 or step S5
Figure GDA0002190843440000065
And instantaneous flicker visual acuity maximum over ten minutes
Figure GDA0002190843440000066
All are modulated values, and the final step requires correction to output the most accurate value. Therefore, the testing method further includes step S6 of correcting the maximum instantaneous flicker visibility, where the corrected maximum instantaneous flicker visibility is:
Figure GDA0002190843440000067
wherein the content of the first and second substances,
Figure GDA0002190843440000068
is the root mean square value within a predetermined time.
Further, the testing method further includes step S7, correcting the short flicker statistic, where the corrected short flicker statistic is:
Figure GDA0002190843440000071
wherein the content of the first and second substances,
Figure GDA0002190843440000072
is the root mean square value within a predetermined time.
The second aspect of the present invention also provides a flicker testing apparatus, as shown in fig. 3, the flicker testing apparatus 100 includes a normalization apparatus 110, a first simulation apparatus 120, a second simulation apparatus 130, an output apparatus 140, a statistic apparatus 150, and a modification apparatus 160. Wherein the normalizing means 110 is configured to execute step S1, the first simulating means 120 is configured to execute step S2, the second simulating means 130 is configured to execute step S3, the output means 140 is configured to execute step S4, the statistical means 150 is configured to execute step S5, and the correcting means 160 is configured to execute steps S6 and S7.
The flicker testing device provided by the invention is supported by mature hardware or a combination of software and hardware in the prior art, and is not described again for the sake of simplicity.
The prior art typically uses a timely root mean square value for normalization, so that the output of the normalization step is not only from the input voltage a but also from a rectangular square wave gm(t) is determined. The invention normalizes the input voltage within ten minutes by using the customized root mean square value of the first 10 cycles, and the normalization step reduces the influence of the input voltage A on the output of the step as much as possible, so that the output of the step only changes by g as much as possiblem(t) is determined. However, the instantaneous flicker perceptibility thus obtained
Figure GDA0002190843440000075
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure GDA0002190843440000076
And therefore the present invention is particularly provided with a correction step or means for performing correction so as to output an accurate instantaneous flicker visibility Pinst and an instantaneous flicker visibility maximum value Pinst _ max for a predetermined time. The invention ensures that the relative fluctuation quantity is not changed in the test, the calculation quantity is not large, and the accurate instantaneous flicker visual sensitivity and the maximum value of the instantaneous flicker visual sensitivity in the preset time can be finally output.
While the present invention has been described in detail with reference to the preferred embodiments, it should be understood that the above description should not be taken as limiting the invention. Various modifications and alterations to this invention will become apparent to those skilled in the art upon reading the foregoing description. Accordingly, the scope of the invention should be determined from the following claims. Furthermore, any reference signs in the claims shall not be construed as limiting the claim concerned; the word "comprising" does not exclude the presence of other devices or steps than those listed in a claim or the specification; the terms "first," "second," and the like are used merely to denote names, and do not denote any particular order.

Claims (18)

1. The flicker testing method is characterized by comprising the following steps:
step S1, adopting the first nRoot mean square value of cycle
Figure FDA00024132458700000110
Normalizing the input voltage A for a predetermined time and outputting the normalized input voltage
Figure FDA00024132458700000111
Step S2, restoring the fluctuation of the input voltage by squaring the normalized input voltage to simulate the behavior of the incandescent lamp;
step S3, filtering out the voltage fluctuation quantity of the frequency which can be received by human eyes by the voltage fluctuation through a first low-pass filter to simulate the behavior of the human eyes, and weighting the filtered voltage fluctuation quantity through a visual sensation weighting filter to highlight the frequency which is most sensitive to the human eyes;
step S4, square the output of step S3, input the second low-pass filter, and output the instantaneous flicker visibility
Figure FDA0002413245870000011
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure FDA0002413245870000012
The testing method further comprises the following steps of correcting the maximum value of the instantaneous flicker visibility, wherein the corrected maximum value of the instantaneous flicker visibility is as follows:
Figure FDA0002413245870000013
wherein the content of the first and second substances,
Figure FDA0002413245870000014
is the root mean square value within a predetermined time.
2. The flicker testing method according to claim 1, further comprising the steps of:
s5, all of the time in the preset time
Figure FDA0002413245870000015
Making statistics to obtain short flicker statistics value
Figure FDA0002413245870000016
3. The flicker testing method according to claim 1, wherein in step S1, the normalized input voltage outputted is:
Figure FDA0002413245870000017
wherein A is the input voltage, VrefVsc is the internal reference value, g is the scaling factorm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
4. The flicker testing method of claim 3, wherein said rectangular square wave
Figure FDA0002413245870000018
Wherein the content of the first and second substances,
Figure FDA0002413245870000019
is the peak-to-peak amplitude, fmIs the frequency.
5. The flicker testing method according to claim 1, wherein the output of step S2 is:
Figure FDA0002413245870000021
wherein, VrefIs an internal reference value, Vsc is a scaling factor, A is the input voltage, gm(t) is a rectangular square wave for modulation，ω0Is the angular frequency of the fundamental wave,
Figure FDA0002413245870000022
peak-to-peak amplitude.
6. The flicker testing method according to claim 1, wherein the input of the step S3 is:
Figure FDA0002413245870000023
wherein, VrefIs an internal reference value, Vsc is a scaling factor, A is the input voltage, gm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
7. The flicker testing method according to claim 2, further comprising the step of modifying the short flicker statistic, wherein the modified short flicker statistic Pst is:
Figure FDA0002413245870000024
wherein the content of the first and second substances,
Figure FDA0002413245870000025
is the root mean square value within a predetermined time.
8. The flicker testing method of claim 1, wherein the first n-cycle is a first ten-cycle.
9. The flicker testing method of claim 1, wherein the predetermined time is ten minutes.
10. Flicker testing device, its characterized in that, it includes:
normalization means (110), said normalization means (110) being arranged to use the first n-cycleRoot mean square value
Figure FDA0002413245870000026
Normalizing the input voltage A for a predetermined time and outputting the normalized input voltage
Figure FDA0002413245870000027
First simulation means (120), said first simulation means (120) being adapted to recover fluctuations in the input voltage by squaring the normalized input voltage to simulate the behavior of an incandescent lamp;
a second analog device (130), the second analog device (130) is used for filtering out the voltage fluctuation quantity of the frequency which can be received by the human eye through the first low-pass filter to simulate the behavior of the human eye, and weighting the filtered out voltage fluctuation quantity through the visual sensation weighting filter to highlight the frequency which is most sensitive to the human eye;
an output device (140), wherein the output device (140) is used for squaring the output of the second analog device (130), inputting the squared output into a second low-pass filter and outputting the instantaneous flicker visibility
Figure FDA00024132458700000310
And instantaneous flicker visual acuity maximum value in a predetermined time
Figure FDA0002413245870000031
The testing device further comprises a correcting device (160), wherein the correcting device (160) is used for correcting the maximum instantaneous flicker visibility, and the corrected maximum instantaneous flicker visibility is as follows:
Figure FDA0002413245870000032
wherein the content of the first and second substances,
Figure FDA0002413245870000033
is the root mean square value within a predetermined time.
11. The flicker testing device of claim 10, further comprising:
statistical means (150) for counting all of the predetermined time
Figure FDA0002413245870000034
Making statistics to obtain short flicker statistics value
Figure FDA0002413245870000035
12. The flicker testing device according to claim 10, wherein the normalized input voltage output by the normalization means (110) is:
Figure FDA0002413245870000036
wherein A is the input voltage, VrefVsc is the internal reference value, g is the scaling factorm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
13. The flicker testing device of claim 12, wherein the rectangular square wave is
Figure FDA0002413245870000037
Wherein the content of the first and second substances,
Figure FDA0002413245870000038
is the peak-to-peak amplitude, fmIs the frequency.
14. The flicker testing apparatus according to claim 10, wherein the output of the first analog means (120) is:
Figure FDA0002413245870000039
wherein, VrefIs an internal reference value, Vsc is a scaling factor, A is the input voltage, gm(t) is a rectangular square wave for modulation, ω0Is the angular frequency of the fundamental wave,
Figure FDA0002413245870000041
peak-to-peak amplitude.
15. The flicker testing device according to claim 10, wherein the input of the second analog means (130) is:
Figure FDA0002413245870000042
wherein, VrefIs an internal reference value, Vsc is a scaling factor, A is the input voltage, gm(t) is a rectangular square wave for modulation, ω0Is the fundamental angular frequency.
16. Flicker testing device according to claim 11, wherein the correcting means (160) are further configured to correct the short flicker statistic, the corrected short flicker statistic Pst being:
Figure FDA0002413245870000043
wherein the content of the first and second substances,
Figure FDA0002413245870000044
is the root mean square value within a predetermined time.
17. The flicker testing device of claim 10, wherein the first n-cycle is a first ten-cycle.
18. The flicker testing device of claim 10, wherein the predetermined time is ten minutes.
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CN101106273A (en) * 2007-06-04 2008-01-16 天津大学 Integrated power quality adjustment control method and device
CN104569675A (en) * 2014-12-30 2015-04-29 上海贝岭股份有限公司 Flickering detecting circuit and detecting method in electric energy measuring chip

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101106273A (en) * 2007-06-04 2008-01-16 天津大学 Integrated power quality adjustment control method and device
CN104569675A (en) * 2014-12-30 2015-04-29 上海贝岭股份有限公司 Flickering detecting circuit and detecting method in electric energy measuring chip

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