CN107271887A - A kind of two-in-one smart card tester and test system - Google Patents
A kind of two-in-one smart card tester and test system Download PDFInfo
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- CN107271887A CN107271887A CN201710624300.0A CN201710624300A CN107271887A CN 107271887 A CN107271887 A CN 107271887A CN 201710624300 A CN201710624300 A CN 201710624300A CN 107271887 A CN107271887 A CN 107271887A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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Abstract
The invention discloses a kind of two-in-one smart card tester and test system, two-in-one smart card tester includes being provided with simulation region, plug-in card area and the test section being arranged in plug-in card area on test card body, test card body；The simulation region is used for the connecting pin for simulating the profile, SIM card and SD card of two-in-one Kato；Plug-in card area is used to insert SIM card and/or SD card, and test section is used to draw card signal；The connecting pin of simulation region, the deck pin in plug-in card area are electrically connected with the testing weld pad of test section according to pin type is corresponding.By simulating the profile of existing Kato, signals of both cards are drawn out in external plug-in card area by the connecting pin of simulation SD card and SIM card, so as to facilitate research staff to be tested the signal of this kind of deck and detection of the maintenance of works personnel to deck.
Description
Technical field
The present invention relates to electronic technology field, more particularly to a kind of two-in-one smart card tester and test system.
Background technology
With the Miniaturization Design trend of smart mobile phone, in order to improve PCB（Printed Circuit Board, track
Road plate）The service efficiency of plate, at present integrates two kinds of decks of SIM card and SD card, and existing common puts with two
The Kato of card position is respectively put into 2 SIM cards or a SIM card and a SD card；In the neck of Kato insertion smart mobile phone i.e.
Connection corresponding with the pin pin of two kinds of decks, so as to realize communication and data storage.
But, because the welding pin of now many Two-in-one card holders is inside neck, it is impossible to which directly test is drawn
Pin is, it is necessary to which fly line picks out welding pin and tested on mainboard.Be disposed adjacent due to the deck of SIM card and SD card, pin pin
Adjacent and very little, fly line is than relatively time-consuming, and signal testing is very inconvenient and easily influences each other.Moreover, also same without energy at present
When to this with Kato and the instrument and method that are integrated with the signal of two kinds of decks, are detected and tested.
Therefore, prior art has yet to be improved and developed.
The content of the invention
In view of in place of above-mentioned the deficiencies in the prior art, it is an object of the invention to provide a kind of two-in-one smart card tester
And test system, it is intended to the problem of solving the signal detection inconvenience of existing Two-in-one card holder.
The technical proposal for solving the technical problem of the invention is as follows：
A kind of two-in-one smart card tester, it include being provided with test card body, test card body simulation region, plug-in card area and
It is arranged on the test section in plug-in card area；
The simulation region is used for the connecting pin for simulating the profile, SIM card and SD card of two-in-one Kato；Plug-in card area is used to insert SIM
Card and/or SD card, test section are used to draw card signal；The connecting pin of simulation region, the deck pin in plug-in card area and the survey of test section
Test weld packing is electrically connected according to pin type correspondence.
In described two-in-one smart card tester, on the TOP faces of test card body, analog card is provided with simulation region
The first round profile of SIM card and the second contour line of simulation SD card or SIM card in support.
In described two-in-one smart card tester, the pad of the connecting pin of the SIM card and SD card is arranged on test card
On the BOT faces of body；
It is the pad of each connecting pin of the first SIM card, corresponding with the first round profile on TOP faces and positioned at first round profile
It is interior；The pad of each connecting pin of SD card and the second SIM card, it is corresponding with the second contour line on TOP faces and positioned at second wheel
In profile.
In described two-in-one smart card tester, several testing weld pads, testing weld pad are provided with the test section
Number matched with the deck pin in plug-in card area.
In described two-in-one smart card tester, on the TOP faces of test card body, is provided with the plug-in card area
One SIM card holder, the second SIM card holder and SD card seat.
In described two-in-one smart card tester, VCC pin, RST pin, CLK pin, VPP pin, the I/O pin of the first SIM card holder
Respectively with the pad of the VCC pin of the first SIM card, the pad of RST pin, the pad of CLK pin, the pad of VPP pin, I/O pin pad
One-to-one connection；The pad ground connection of the GND pin of first SIM card, the pad of the REV1 pin of the first SIM card hangs with the pad of REV2 pin
It is empty；GND pin and A_GND the pin ground connection of first SIM card holder.
In described two-in-one smart card tester, the VCC pin of second SIM card holder, RST pin, CLK pin, VPP pin,
I/O pin respectively with the pads of the VCC pin of the second SIM card, the pad of RST pin, the pad of CLK pin, the pad of VPP pin, I/O pin
The one-to-one connection of pad；The pad ground connection of the GND pin of second SIM card, the pad of the REV1 pin of the second SIM card and the weldering of REV2 pin
Disk is hanging；GND pin and A_GND the pin ground connection of second SIM card holder.
In described two-in-one smart card tester, DATA2 pin, CD/DATA3 pin, CMD pin, the VDD of the SD card seat
The pad, the pad of CD/DATA3 pin, CMD of pin, CLK pin, VSS pin, DATA0 pin, DATA1 pin respectively with the DATA2 pin of SD card
The pad of pin, the pad of VDD pin, the pad of CLK pin, the pad of VSS pin, the pad of DATA0 pin, a pair of the pad of DATA1 pin
One connection；SLG1 pin, SLG2 pin, SLG3 pin, SLG4 pin, SLG5 pin, SLG6 pin, SLG7 pin and the COMMON pin of SD card seat connect
Ground；The VSS pin ground connection of SD card seat.
A kind of test system, it includes mobile terminal to be measured, test equipment and described two-in-one smart card tester；
In the simulation region of the two-in-one smart card tester and the neck grafting of mobile terminal, the connecting pin and neck of simulation region
The pin correspondence of deck is electrically connected；SIM card and/or SD card are inserted in plug-in card area；The testing weld pad electricity of test equipment and test section
Connection, picks out corresponding test signal and is tested.
In described test system, when the test equipment is oscillograph, oscilloprobe catches on two-in-one smart card and surveyed
The timing waveform of testing weld pad on examination instrument, SD card and/or SIM card signal leads on oscillograph and shown.
The two-in-one smart card tester and test system provided compared to prior art, the present invention, including test card sheet
Simulation region, plug-in card area and the test section being arranged in plug-in card area are provided with body, test card body；The simulation region is used to simulate
The connecting pin of the profile of two-in-one Kato, SIM card and SD card；Plug-in card area is used to insert SIM card and/or SD card, and test section is used for
Draw card signal；The connecting pin of simulation region, the deck pin in plug-in card area and the testing weld pad of test section are corresponding according to pin type
Electrical connection.By simulating the connecting pin of the profile of existing Kato, simulation SD card and SIM card, the signal of both cards is drawn out to
In external plug-in card area, so as to facilitate, research staff is tested the signal of this kind of deck and maintenance of works personnel are to card
The detection of seat.
Brief description of the drawings
Fig. 1 is the schematic diagram in the TOP faces for the two-in-one smart card tester that the present invention is provided.
The dimensions chart for the two-in-one smart card tester that Fig. 2 present invention is provided.
The pad schematic diagram of connecting pin on the BOT faces for the two-in-one smart card tester that Fig. 3 present invention is provided.
The first SIM card holder that Fig. 4 present invention is provided and the connection circuit figure of the pad of the first SIM card.
The second SIM card holder that Fig. 5 present invention is provided and the connection circuit figure of the pad of the second SIM card.
The connection circuit figure of SD card seat and the pad of SD card that Fig. 6 present invention is provided.
The structured flowchart for the test system that Fig. 7 present invention is provided.
The test equipment that Fig. 8 present invention is provided and the schematic diagram of two-in-one smart card tester.
Embodiment
The present invention provides a kind of two-in-one smart card tester and test system, is related to LTE（Long Term
Evolution, Long Term Evolution）, 3G radio communication products, intelligent terminal, the electronic product with display screen, such as tablet personal computer,
MIFI（Mobile WIFI）Etc. technical field.By simulating the profile of existing Kato, profile and the weldering of simulation SD card and SIM card
Disk, the signal of both cards is drawn out on external SD card seat and SIM card holder, so as to facilitate research staff to this kind of deck
Signal is tested and detection of the maintenance of works personnel to deck.To make the objects, technical solutions and advantages of the present invention more
Clear, clear and definite, the present invention is described in more detail for the embodiment that develops simultaneously referring to the drawings.It should be appreciated that described herein
Specific embodiment only to explain the present invention, is not intended to limit the present invention.
Referring to Fig. 1, the two-in-one smart card tester that the present invention is provided includes setting on test card body, test card body
It is equipped with simulation region 10, plug-in card area 20 and the test section 30 being arranged in plug-in card area；The simulation region 10 is used to simulate two-in-one card
The connecting pin of the profile of support, SIM card and SD card, plug-in card area 20 is used for outside insertion SIM card and/or SD card, and test section 30 is used for
Draw card signal.The testing weld pad of the connecting pin of simulation region 10, the deck pin in plug-in card area 20 and test section 30 is according to pin class
Type correspondence is electrically connected.For example, three supply pins of simulation region 10, plug-in card area 20 and test section 30 are electrically connected to each other, three areas
Data pin is electrically connected to each other.
In specific test, insertion needs the card tested in plug-in card area 20（SIM card or SD card can be inserted separately into, or together
When insert two SIM cards, or insert a SIM card and a SD card simultaneously, be not restricted herein）.Because simulation region 10 is simulated
The connecting pin of SIM card and SD card, when simulation region 10 to be inserted to the neck of tablet personal computer or mobile phone, connecting pin and deck in neck
Pin correspondence electrically connect.The testing weld pad in outside test equipment connecting test area 30, you can pick out corresponding test signal
Tested.By the profile and connecting pin of simulating two-in-one Kato, it would be desirable to which the signal of test leads to external test section
30, the time of the fly line on cell phone mainboard is reduced, neck test is greatly facilitated, moreover it is possible to while to Kato and being integrated with
The signal of two kinds of decks is detected and tested.
Also referring to Fig. 2, the profile of two-in-one Kato is simulated in the simulation region 10, that is, represents the outer of whole simulation region 10
Contouring is identical with existing two-in-one Kato, and the simulation of profile includes the thickness, connecting pin, form factor to two-in-one Kato
Simulation.By taking the profile diagram in the TOP faces of test card body as an example, the thickness H of simulation region 10 is 0.7mm, and width W1 is 14.7mm,
Length L1 is 30.15mm；The width W2 in plug-in card area is 18.2mm, and length L2 is 51.75mm.So simulation region 10 could insert hand
Connected with the corresponding pin of deck in the neck of machine and correctly, and plug-in card area facilitates user's plug-in card.
The present embodiment can also be in the TOP faces of test card body（The face of inserted component）On, simulation is provided with simulation region 10 existing
There are the first round profile 11 of SIM card on Kato and the second contour line 12 of simulation SD card or SIM card.Wherein SIM card is Nano
SIM card, SD card is Mirco SD cards.The connecting pin of SIM card and SD card can be so facilitated to be correspondingly arranged.
Also referring to Fig. 3, the connecting pin of the SIM card and SD card is arranged on the BOT faces of test card body（Solder side）
On.The right is the pad of the first SIM card S1 each connecting pin, and position corresponding with the first round profile 11 on TOP faces in Fig. 2
In in first round profile 11.The left side is the pad of SD card D1 and the second SIM card S2 each connecting pin, with second on TOP faces
Contour line 12 is corresponding and in the second contour line 12.So as to simulate existing Kato and card pin completely, to ensure simulation region
Can correctly it be connected with neck during insertion.Wherein, pad C1 ~ pad C8 is each connecting pin of SIM card, and definition relation is：Pad
C1 is VCC pin, and pad C2 is RST pin, and pad C3 is CLK pin, and pad C4 is Reserved pin, and pad C5 is GND pin, pad C6
For VPP pin, pad C7 is I/O pin, and pad C8 is Reserved pin.1 ~ pad of pad 8 is the title of each connecting pin of SD card,
Definition relation is：Pad 1 is DATA2 pin, and pad 2 is DATA3 pin, and pad 3 is CMD pin, and pad 4 is VDD pin, and pad 5 is
CLK, pad 6 is VSS pin, and pad 7 is DATA0 pin, and pad 8 is DATA1 pin.
Please continue to refer to Fig. 1, several testing weld pads 31 are provided with the test section 30, each testing weld pad 31 is represented
A kind of signal.These testing weld pads 31 can connect oscillograph or universal meter by bonding wire mode, to facilitate the shape of observation signal
State.The connecting pin of the number of testing weld pad 31 and simulation region 10, the deck pin in plug-in card area 20 are corresponding.Testing weld pad in Fig. 1
31 number is merely illustrative, its number is not defined.
Also referring to Fig. 1, Fig. 4, Fig. 5 and Fig. 6.On the TOP faces of test card body, it is provided with the plug-in card area 20
First SIM card holder 21, the second SIM card holder 22 and a SD card seat 23；SIM card holder is used to insert SIM card, and SD card seat 23 is used to insert
Enter SD card.In the external corresponding card of deck insertion, then in the neck of the mainboard of simulation region insertion mobile phone or tablet personal computer, mainboard
On signal will be transferred to test section.So facilitate user's removable card, user can select what is needed according to demand again
Signal is tested.Because the clock frequency of SD card and SIM card is higher, in order to ensure the integrality of signal, it is necessary in design
The layout of cabling and device is noted during pcb board, and notices that the order between connecting pin, deck pin, testing weld pad three is
No correct correspondence.Physical circuit is as follows.
As shown in figure 4, the first SIM card holder 21（Model KP10S-SF-PEJ_800）Each pin and BOT faces on first
The pad of SIM card S1 each connecting pin is connected, and is specially：VCC pin, RST pin, CLK pin, the VPP of first SIM card holder 21
Pin, I/O pin respectively with pad C3, VPP pin of pad C2, CLK pin of pad C1, RST pin of the first SIM card S1 VCC pin
The one-to-one connections of pad C7 of pad C6, I/O pin.The pad C5 ground connection of first SIM card S1 GND pin, the first SIM card S1's
The pad C4 of the pad C8 and REV2 pin of REV1 pin is hanging.GND pin and A_GND the pin ground connection of first SIM card holder 21.
Wherein, SIM_VCC, SIM_RST, SIM_CLK, SIM_IO_A, SIM_VPP_A represent the first SIM card holder 21 respectively
The signal of corresponding pin transmission between the first SIM card S1.In the specific implementation, each pin and the first SIM card of the first SIM card holder 21
Between the pad of S1 each pin, the resistance for one 0 Ω that can also connect respectively.The VCC pin of first SIM card holder 21 can also pass through an electricity
Hold ground connection, to be filtered to power supply signal.
As shown in figure 5, the second SIM card holder 22（Model KP10S-SF-PEJ_800）Each pin and BOT faces on second
The pad of SIM card S2 each connecting pin is connected, and is specially：VCC pin, RST pin, CLK pin, the VPP of second SIM card holder 22
Pin, I/O pin respectively with pad C3, VPP pin of pad C2, CLK pin of pad C1, RST pin of the second SIM card S2 VCC pin
The one-to-one connections of pad C7 of pad C6, I/O pin.The pad C5 ground connection of second SIM card S2 GND pin, the second SIM card S2's
The pad C4 of the pad C8 and REV2 pin of REV1 pin is hanging.GND pin and A_GND the pin ground connection of second SIM card holder 22.
Wherein, SIM_VCC_B, SIM_RST_ B, SIM_CLK_ B, SIM_IO_ B, SIM_VPP_ B represent second respectively
The signal of corresponding pin transmission between SIM card holder 22 and the second SIM card S2.In the specific implementation, each pin of the second SIM card holder 22 with
Between the pad of second SIM card S2 each pin, the resistance for one 0 Ω that can also connect respectively.The VCC pin of second SIM card holder 22 are also
Can be by a capacity earth, to be filtered to power supply signal.
As shown in fig. 6, SD card seat 23（Model SCHA4B0414）With the pad of SD card D1 each connecting pin on BOT faces
It is connected, is specially：The DATA2 pin of SD card seat 23, CD/DATA3 pin, CMD pin, VDD pin, CLK pin, VSS pin, DATA0 pin,
DATA1 pin pad 1 respectively with SD card D1 DATA2 pin, the pad 2 of CD/DATA3 pin, the pad 3 of CMD pin, the weldering of VDD pin
The pad 5 of disk C3, CLK pin, the pad 6 of VSS pin, the pad 7 of DATA0 pin, the one-to-one connection of pad 8 of DATA1 pin.SD card seat
23 SLG1 pin, SLG2 pin, SLG3 pin, SLG4 pin, SLG5 pin, SLG6 pin, SLG7 pin and COMMON pin ground connection.SD card seat 23
VSS pin are grounded.
Wherein, SD_DATA2, SD_DATA3, SD_CMD, SD_VDD, SD_VSS, SD_DATA0, SD_DATA1 are represented respectively
The signal of corresponding pin transmission between 23 and SD card D1 of SD card seat.In the specific implementation, each pin and the SD card D1's of SD card seat 23 is each
Between the pad of pin, the resistance for one 0 Ω that can also connect respectively.The CLK pin of SD card seat 23 can also by a capacity earth, with
Clock signal is filtered.
Based on above-mentioned two-in-one smart card tester, the present invention also provides a kind of test of two-in-one smart card tester
System, referring to Fig. 7, the test system includes needing the mobile terminal 2 tested, test equipment 3 and as described above two to close
One smart card tester 1；The simulation region of two-in-one smart card tester and the neck grafting of mobile terminal, the connecting pin of simulation region
Electrical connection corresponding with the pin of deck in neck；SIM card and/or SD card are inserted in plug-in card area；Test equipment and the survey of test section
Test weld disk is electrically connected, and is picked out corresponding test signal and is tested.
When test equipment is oscillograph, as shown in figure 8, directly catching on two-in-one smart card tester with oscilloprobe
On testing weld pad, the signal of SD card/SIM card on mobile terminal is drawn out on external deck, you can check and survey letter
Number timing waveform so that two-in-one neck on fast positioning of mobile terminal whether failure welding.
When test equipment is universal meter（Model：Fluke 15B+）When, buzzing gear is arrived into universal meter regulation.Positive contact
Decoupling capacitance in parallel on the testing weld pad of RST signal on test section, cathode contact Mobile terminal main board on RST signal line.Such as
Fruit universal meter pipes, then it is conducting to illustrate circuit, and two two-in-one smart card tester detection mobile terminal inner card cage welding are just
Normal（If belonging to neck shell fragment problem can come out from the appearance）；Conversely, then explanation welding is problematic.
In summary, the present invention is used as signal extraction instrument by two-in-one smart card tester, by mobile terminal deck
The interior signal for needing to test is led on external test section, can reduce the time of the fly line on Mobile terminal main board.Can also be square
Just each signal quickly tested in SD card or SIM card, lifts the speed of test signal, the step of saving bonding wire.Allow engineering
Tester is quick, accurate, reliable, be conveniently accomplished test assignment；Enable engineering developme personnel and ordi-nary maintenance personnel more
The relevant issues of convenient, quick analyzing and positioning neck, SIM card and/or SD card, improve the efficiency solved with problem analysis.
It should be appreciated that the application of the present invention is not limited to above-mentioned citing, for those of ordinary skills, can
To be improved or converted according to the above description, all these modifications and variations should all belong to the guarantor of appended claims of the present invention
Protect scope.
Claims (10)
1. a kind of two-in-one smart card tester, it is characterised in that including test card body, simulation is provided with test card body
Area, plug-in card area and the test section being arranged in plug-in card area；
The simulation region is used for the connecting pin for simulating the profile, SIM card and SD card of two-in-one Kato；Plug-in card area is used to insert SIM
Card and/or SD card, test section are used to draw card signal；The connecting pin of simulation region, the deck pin in plug-in card area and the survey of test section
Test weld packing is electrically connected according to pin type correspondence.
2. two-in-one smart card tester according to claim 1, it is characterised in that on the TOP faces of test card body,
The first round profile of SIM card and the second contour line of simulation SD card or SIM card on simulation Kato are provided with simulation region.
3. two-in-one smart card tester according to claim 2, it is characterised in that the connection of the SIM card and SD card
The pad of pin is arranged on the BOT faces of test card body；
It is the pad of each connecting pin of the first SIM card, corresponding with the first round profile on TOP faces and positioned at first round profile
It is interior；The pad of each connecting pin of SD card and the second SIM card, it is corresponding with the second contour line on TOP faces and positioned at second wheel
In profile.
4. two-in-one smart card tester according to claim 1, it is characterised in that be provided with the test section some
Individual testing weld pad, the number of testing weld pad is matched with the deck pin in plug-in card area.
5. two-in-one smart card tester according to claim 3, it is characterised in that on the TOP faces of test card body,
The first SIM card holder, the second SIM card holder and SD card seat are provided with the plug-in card area.
6. two-in-one smart card tester according to claim 5, it is characterised in that VCC pin, the RST of the first SIM card holder
Pin, CLK pin, VPP pin, I/O pin respectively with the pad of the VCC pin of the first SIM card, the pad of RST pin, the pad of CLK pin, VPP
The pad of pin, the one-to-one connection of the pad of I/O pin；The pad ground connection of the GND pin of first SIM card, the REV1 pin of the first SIM card
The pad of pad and REV2 pin is hanging；GND pin and A_GND the pin ground connection of first SIM card holder.
7. two-in-one smart card tester according to claim 5, it is characterised in that the VCC of second SIM card holder
The weldering of pin, RST pin, CLK pin, VPP pin, I/O pin respectively with the pad, the pad of RST pin, CLK pin of the VCC pin of the second SIM card
Disk, the pad of VPP pin, the one-to-one connection of pad of I/O pin；The pad ground connection of the GND pin of second SIM card, the second SIM card
The pad of the pad of REV1 pin and REV2 pin is hanging；GND pin and A_GND the pin ground connection of second SIM card holder.
8. two-in-one smart card tester according to claim 5, it is characterised in that the DATA2 pin of the SD card seat,
CD/DATA3 pin, CMD pin, VDD pin, CLK pin, VSS pin, DATA0 pin, DATA1 pin pad respectively with the DATA2 pin of SD card,
The pad of CD/DATA3 pin, the pad of CMD pin, the pad of VDD pin, the pad of CLK pin, the pad of VSS pin, the weldering of DATA0 pin
The one-to-one connection of pad of disk, DATA1 pin；SD card seat SLG1 pin, SLG2 pin, SLG3 pin, SLG4 pin, SLG5 pin, SLG6 pin,
SLG7 pin and COMMON pin ground connection；The VSS pin ground connection of SD card seat.
9. a kind of test system, it is characterised in that including mobile terminal to be measured, test equipment and as claim 1-8 is any
Two-in-one smart card tester described in；
In the simulation region of the two-in-one smart card tester and the neck grafting of mobile terminal, the connecting pin and neck of simulation region
The pin correspondence of deck is electrically connected；SIM card and/or SD card are inserted in plug-in card area；The testing weld pad electricity of test equipment and test section
Connection, picks out corresponding test signal and is tested.
10. test system according to claim 9, it is characterised in that when the test equipment is oscillograph, oscillograph is visited
Head catches on testing weld pad on two-in-one smart card tester, and the timing waveform of SD card and/or SIM card signal leads to oscillograph
Upper display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710624300.0A CN107271887A (en) | 2017-07-27 | 2017-07-27 | A kind of two-in-one smart card tester and test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710624300.0A CN107271887A (en) | 2017-07-27 | 2017-07-27 | A kind of two-in-one smart card tester and test system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108226696A (en) * | 2018-01-25 | 2018-06-29 | 深圳市恒晨电器有限公司 | A kind of chip deck tester |
| CN108647277A (en) * | 2018-05-03 | 2018-10-12 | 山东师范大学 | A kind of mobile campus comprehensive service platform and its working method |
| CN111650537A (en) * | 2020-06-17 | 2020-09-11 | 东莞华贝电子科技有限公司 | Auxiliary detection circuit, device, main board and terminal equipment |
| CN112382876A (en) * | 2020-10-21 | 2021-02-19 | Oppo广东移动通信有限公司 | Card holder, electronic equipment and card holder detection method |
| CN112769998A (en) * | 2020-12-28 | 2021-05-07 | 东莞华贝电子科技有限公司 | Plug-in electronic card adapter plate and test tool |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101697599A (en) * | 2009-10-16 | 2010-04-21 | 惠州Tcl移动通信有限公司 | Multimedia data card as well as device and method for testing handset multimedia data cards |
| CN205643569U (en) * | 2016-05-19 | 2016-10-12 | 惠州Tcl移动通信有限公司 | Device of test cell -phone card signal |
| CN106412152A (en) * | 2016-06-08 | 2017-02-15 | Tcl移动通信科技（宁波）有限公司 | SIM card detection method based on mobile terminal and mobile terminal |
| CN106918776A (en) * | 2017-05-10 | 2017-07-04 | 深圳市亿联智能有限公司 | A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals |
-
2017
- 2017-07-27 CN CN201710624300.0A patent/CN107271887A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101697599A (en) * | 2009-10-16 | 2010-04-21 | 惠州Tcl移动通信有限公司 | Multimedia data card as well as device and method for testing handset multimedia data cards |
| US20120032698A1 (en) * | 2009-10-16 | 2012-02-09 | Huizhou Tcl Mobile Communication Co., Ltd. | Test Device and Test Method for Multimedia Data Card and Mobile-Phone Multimedia Data Card |
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Application publication date: 20171020 |