CN107271040B - The two-way interference pattern of time-modulation type Fourier transform spectrometer, cooperates with application method - Google Patents
The two-way interference pattern of time-modulation type Fourier transform spectrometer, cooperates with application method Download PDFInfo
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- CN107271040B CN107271040B CN201710353389.1A CN201710353389A CN107271040B CN 107271040 B CN107271040 B CN 107271040B CN 201710353389 A CN201710353389 A CN 201710353389A CN 107271040 B CN107271040 B CN 107271040B
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Abstract
The invention discloses a kind of two-way interference patterns of time-modulation type Fourier transform spectrometer, to cooperate with application method comprising: step 1 will reversely interfere graphic sequence to carry out backward;Step 2 carries out cubic spline interpolation to the interference graphic sequence after positive interference graphic sequence and reversed interference pattern backward;Step 3 distinguishes the maximum absolute value value corresponding position of two groups of sequences after search value interposition, and according to the difference of two groups of sequence maximum absolute value value corresponding positions, the reversed interference pattern after backward, interpolation is shifted;Step 4, will by first three steps, treated that reversed interference pattern is sampled and intercepts, and intercepting process is carried out to original positive interference pattern.The method of the present invention is reasonable, it is simple to implement, and the collaboration that can be efficiently applied to the two-way interference pattern of time-modulation type Fourier transform spectrometer, uses.
Description
Technical field
The present invention relates to a kind of two-way interference patterns to cooperate with application method, becomes more particularly to a kind of time-modulation type Fourier
Change the two-way interference pattern collaboration application method of spectrometer.
Background technique
Time-modulation type Fourier transform spectrometer, is a kind of common spectrometer, has high throughput, high s/n ratio, wide range
The advantages that section, important application is all had in fields such as industrial detection, elemental analysis.Time-modulation type Fourier trasform spectroscopy
Instrument is that incident light is interfered and modulated using the form after Michelson's interferometer or its change, utilizes detector realization amount
Change output, by carrying out spectrum transform to the interference pattern directly exported, required spectroscopic data is calculated.In the past of interferometer
It can produce two kinds of interference patterns of forward and reverse in multiple operational process, by zero optical path difference biasing, sample direction and sampling location
It influencing, is had differences between two-way interference pattern each other, conventional method is usually independently handled two-way interference pattern, and from data
From the point of view of validity and consistency, need to handle two-way interference pattern collaboration.
The difficult point of two-way interference pattern collaboration processing is according to actual samples process, to time modulation type Fourier transformation light
The two-way interference pattern of spectrometer combines modeling, determines the difference of forward and reverse interference pattern and difference is gradually disappeared by processing method
It removes, so that two-way interference pattern be allow to unify to use.For the two-way interference pattern association of time-modulation type Fourier transform spectrometer,
With using, there has been no ready-made methods can handle it at present.
Summary of the invention
Technical problem to be solved by the invention is to provide a kind of the two-way dry of time-modulation type Fourier transform spectrometer,
Figure collaboration application method is related to, the two-way interference pattern collaboration for being able to solve time-modulation type Fourier transform spectrometer, uses presence
Difference.
The present invention is to solve above-mentioned technical problem by following technical proposals: a kind of time-modulation type Fourier transformation
The two-way interference pattern of spectrometer cooperates with application method comprising:
Step 1 will reversely interfere graphic sequence to carry out backward;
Step 2 carries out cubic spline to the interference graphic sequence after positive interference graphic sequence and reversed interference pattern backward and inserts
Value;
Step 3 distinguishes the maximum absolute value value corresponding position of two groups of sequences after search value interposition, and exhausted according to two groups of sequences
To the difference of value maximum value corresponding position, the reversed interference pattern after backward, interpolation is shifted;
Step 4, will by first three steps, treated that reversed interference pattern is sampled and intercepts, and to original positive dry
It relates to figure and carries out intercepting process.
Preferably, interpolation multiple is not less than 4 when the step 2 interpolation.
Preferably, the sequential sampling position after the reversed fringe-pattern analysis of the step 4 and interval holding and original forward direction
Model of Interferogram Sampling position and interval are consistent.
The positive effect of the present invention is that: the present invention will be by will reversely interfere graphic sequence to carry out backward, when eliminating
Between modulation type Fourier transform spectrometer, two-way Model of Interferogram Sampling direction influence;Pass through interpolation and displacement while eliminating double
To the differentia influence of interference pattern zero optical path difference biasing and sampling location difference;Two-way interference pattern is realized by sampling and intercepting
Final unified and collaboration uses.The method of the present invention is reasonable, it is simple to implement, and can be realized time-modulation type Fourier transform spectrometer,
The coordination of two-way interference pattern use, application prospect is extensive.
Detailed description of the invention
Fig. 1 is the two-way interference pattern generating process schematic diagram of time-modulation type Fourier transform spectrometer,.
Fig. 2 is flow chart of the invention, and wherein function ceil () expression rounds up.
Fig. 3 (a) is the effect picture of the original positive interference graphic sequence of the present invention, and Fig. 3 (b) is the original reversed interference pattern of the present invention
The effect picture of sequence, Fig. 3 (c) are the effect picture of sequence after the reversed fringe-pattern analysis of the present invention.
Specific embodiment
Present pre-ferred embodiments are provided with reference to the accompanying drawing, in order to explain the technical scheme of the invention in detail.
Theory analysis basis of the invention is described as follows: for time-modulation type Fourier transform spectrometer, being interfered
Instrument is once in reciprocal operational process, and two-way (forward and reverse) interference pattern is successively the time difference very little close to acquisition, so
The instrument state of spectrometer itself, which can consider, not to be changed, and the zero optical path difference location point of two-way interference pattern should correspond to same position.
The practical influence biased due to the corresponding sample direction of two-way interference pattern, sampling location, zero optical path difference, leads to two-way interference pattern all
Zero optical path difference position can not necessarily be adopted and zero optical path difference position has dislocation on interference pattern, as shown in Figure 1.
The present invention is the two-way interference pattern collaboration application method of time-modulation type Fourier transform spectrometer, comprising:
Step 1 will reversely interfere graphic sequence to carry out backward;
Step 2 carries out cubic spline to the interference graphic sequence after positive interference graphic sequence and reversed interference pattern backward and inserts
Value;
Step 3 distinguishes the maximum absolute value value corresponding position of two groups of sequences after search value interposition, and exhausted according to two groups of sequences
To the difference of value maximum value corresponding position, the reversed interference pattern after backward, interpolation is shifted;
Step 4, will by first three steps, treated that reversed interference pattern is sampled and intercepts, and to original positive dry
It relates to figure and carries out intercepting process.
Interpolation multiple is not less than 4 so that it is convenient to operate when the step 2 interpolation.
Sequential sampling position and interval holding and original positive interference pattern after the reversed fringe-pattern analysis of the step 4
Sampling location and interval are consistent, in this way raising accuracy.
The method of the present invention flow chart is as shown in Fig. 2, a width caused by primary reciprocal cycle of operation with interferometer is positive
Interference one width of graphic sequence reversely interferes graphic sequence to be handled as one group.Original positive interference graphic sequence is denoted as F [n], n=0,
1,2,…,N-1.It is denoted as G [n] with it with the original reversed interference graphic sequence generated in the period, n=0,1,2 ..., N-1.
It will reversely interfere graphic sequence G [n] to carry out backward, and obtain backward treated sequence B [n], n=0,1,2 ..., N-
1.Sequence B [n] is consistent with F [n] sample direction.
Graphic sequence F [n] and B [n] will be interfered to carry out M times of interpolation (taking M >=4) respectively, interpolation method is inserted using cubic spline
Value, the sequence f [n] after obtaining interpolation, n=0,1,2 ..., M (N-1) and b [n], n=0,1,2 ..., M (N-1).
If P1,P2Respectively correspond the maximum absolute value value position of two groups of sequences after interpolation, i.e., such as following formula (1):
For time-modulation type Fourier transform spectrometer, the target emanation of different spectral coverage is all interfered folded in zero optical path difference
Add, so zero equation of light position usually corresponds to interference pattern maximum absolute value value position.By the way that sequence b [n] is moved to right (P1-P2) point, or
Move to left (P2-P1) point, two groups of sequences after interpolation can be pressed optical path difference aligned in position, the sequence after alignment is
b[n-(P1-P2)], n=(P1-P2),(P1-P2)+1,…,(P1-P2)+M(N-1)
To sequence b [n- (P1-P2)] be sampled, sample position and interval ensure and original positive Model of Interferogram Sampling position
And interval is consistent, while respectively to b [n- (P1-P2)] and F [n] intercepted so that coordinating the two-way interferogram length one that uses
It causes.The final forward direction that obtains interferes graphic sequence F [n], n=T, T+1, T+2 ..., U-2, U-1, U, the sequence after reversed fringe-pattern analysis
Arrange b [n- (P1-P2)], n=MT, M (T+1), M (T+2) ..., M (T-1), M (T-1), MT.Wherein, starting point T and terminal U is respectively
Such as following formula (2):
Wherein, S=ceil ((P1-P2)/M)
Function max indicates that the two takes large values, and function min indicates that the two gets the small value, and function ceil expression rounds up.
Example: Fig. 3 (a), Fig. 3 (b), Fig. 3 (c) are effect picture of the invention.The total sampling number N=of original interferogram
19456, interpolation multiple M=10, the maximum absolute value value position searched for is respectively P1=96427, P2=99880, when truncation
Beginning and end be respectively T=0, U=19800.When target emanation does not occur it can be seen from comparison in figure before and after the processing
When variation, sequence and positive interference graphic sequence after reversed fringe-pattern analysis have good consistency, this also demonstrates this hair
The validity of bright method.
Particular embodiments described above, the technical issues of to solution of the invention, technical scheme and beneficial effects carry out
It is further described, it should be understood that the above is only a specific embodiment of the present invention, is not limited to
The present invention, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should be included in this
Within the protection scope of invention.
Claims (3)
1. a kind of two-way interference pattern of time-modulation type Fourier transform spectrometer, cooperates with application method, which is characterized in that it is wrapped
It includes:
Step 1 will reversely interfere graphic sequence to carry out backward;
Step 2 carries out cubic spline interpolation to the interference graphic sequence after positive interference graphic sequence and reversed interference pattern backward;
Step 3 distinguishes the maximum absolute value value corresponding position of two groups of sequences after search value interposition, and according to two groups of sequence absolute values
The difference of maximum value corresponding position shifts the reversed interference pattern after backward, interpolation;
Step 4, will pass through Step 1: Step 2: step 3 treated that reversed interference pattern is sampled and intercepts, and to original
Begin positive interference pattern progress intercepting process.
2. the two-way interference pattern of time-modulation type Fourier transform spectrometer, as described in claim 1 cooperates with application method,
It is characterized in that, interpolation multiple is not less than 4 when the step 2 interpolation.
3. the two-way interference pattern of time-modulation type Fourier transform spectrometer, as described in claim 1 cooperates with application method,
It is characterized in that, the sequential sampling position after the reversed fringe-pattern analysis of the step 4 and interval holding and original positive interference pattern
Sampling location and interval are consistent.
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JPH06331440A (en) * | 1993-05-18 | 1994-12-02 | Nippon Bunkou Gijutsu Kenkyusho:Kk | Deconvolution method of spectrum data |
US8014965B2 (en) * | 2007-02-21 | 2011-09-06 | ABB Bomen | Spectral estimation of spectrometers time-sampled signals using fast implementation of the reverse non-uniform discrete fourier transform |
CN105551023A (en) * | 2015-12-07 | 2016-05-04 | 北京印刷学院 | Data processing method of near-field stepping scanning imaging spectrometer |
CN105719231A (en) * | 2016-01-19 | 2016-06-29 | 南京理工大学 | Interference data rapid Fourier transform method based on GPU calculation |
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US8836948B2 (en) * | 2009-01-29 | 2014-09-16 | The Regents Of The University Of California | High resolution structured illumination microscopy |
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JPH06331440A (en) * | 1993-05-18 | 1994-12-02 | Nippon Bunkou Gijutsu Kenkyusho:Kk | Deconvolution method of spectrum data |
US8014965B2 (en) * | 2007-02-21 | 2011-09-06 | ABB Bomen | Spectral estimation of spectrometers time-sampled signals using fast implementation of the reverse non-uniform discrete fourier transform |
CN105551023A (en) * | 2015-12-07 | 2016-05-04 | 北京印刷学院 | Data processing method of near-field stepping scanning imaging spectrometer |
CN105719231A (en) * | 2016-01-19 | 2016-06-29 | 南京理工大学 | Interference data rapid Fourier transform method based on GPU calculation |
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