CN107270820A - A kind of large thin-walled component wall thickness on-position measure system and method - Google Patents
A kind of large thin-walled component wall thickness on-position measure system and method Download PDFInfo
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- CN107270820A CN107270820A CN201710411139.9A CN201710411139A CN107270820A CN 107270820 A CN107270820 A CN 107270820A CN 201710411139 A CN201710411139 A CN 201710411139A CN 107270820 A CN107270820 A CN 107270820A
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- walled component
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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Abstract
The present invention announces a kind of large thin-walled component wall thickness on-position measure system and method, and the system includes：Digit Control Machine Tool, profiling attachment, gauge head support, binocular structural light measurement equipment, industrial computer and high-speed communication unit；Methods described is based on binocular structural light measurement technology, according to the demand detected in place to the overall three-dimensional appearance of component and Thickness Distribution in thin-wall member machining process, point cloud information is obtained based on structure light Technology of Precision Measurement, by selecting measurement datum, the method for progressively making difference afterwards obtains the wall thickness of correspondence position, the CAD model of cloud data that finally multiple location is measured and component carry out model compare with data split, realize that large thin-walled component detects each accurate wall thickness data in position of acquisition in place.The present invention realizes the accurate measurement to large thin-walled component under noncontact condition, not only can provide topographic data for crudy evaluation, can be used for instructing machining process.
Description
Technical field
The present invention relates to a kind of optical measuring system in place of large thin-walled component wall thickness and method, particularly one kind will be double
The on-position measure system and method for the large thin-walled component wall thickness of sight grid projection measurement and integration of numerical control equipment, belong to mechanic
Journey and optical engineering technical field.
Background technology
In the national economy priority industry such as automobile, Aeronautics and Astronautics and shipbuilding field, there is substantial amounts of large thin-wall
Component, such as carrier rocket propellant tank, space station nacelle, large aircraft wing cover, propeller blades and automobile
Master model cubing etc..As the important component of each system, the machining accuracy of large thin-walled component, which is directly connected to, is
The overall mechanical properties of system, development process of its processing efficiency also with product is closely bound up.Such as body of a motor car master cast cubing
The forming quality of forming quality influence assembly precision, aircraft skin and ship bent plate influences notable to its hydrodynamic performance, fire
The forming quality of arrow fuel tank wallboard and melon valve then eventually influences the security of rocket flight.These large thin-walled components
, it is necessary to obtain the accurate geometry description of part in time in process, Processing Strategies are adjusted, so as to ensure crudy.
Conventional method uses contact type measurement, such as three coordinate measuring machine, and this mode can obtain more accurate face
Type data, but have the disadvantage that measuring speed is slow, and because its contact type measurement principle can change its pattern because of measurand stress, therefore
It is not suitable for thin-wall construction measurement.In addition, this measuring apparatus also is difficult to be designed as the working method of on-position measure.In reality
In thin-wall construction measurement, there is ultrasonic wave measuring method etc. using hand-held, measurement process needs auxiliary material, and measure
, there is the incomplete data loss problem of data set in the lazy weight of point, it is impossible to automatical and efficient high-precision measurement in place, significantly
Reduce production efficiency and machining accuracy.
In recent years, with the development of machine vision and computer technology, the noncontact using optical measurement as representative is occurred in that
Formula is measured.Wherein：
Close-range photogrammetry is widely used in large scale surface type measurement, and it has good portability, on-position measure and point batch
Needed before the advantage of measurement, but measurement in the substantial amounts of identification point of measurand surface mount, and the degree of accuracy is general；
Handheld three-dimensional laser scanner scans are quick, lightweight, efficiency high, cost are low, in large scale surface type measurement
It is widely used, but its measurement accuracy is relatively low, generally requires in measurand surface mount identification point, and to measurand surface
Reflective requires high；
Laser Radar Scanning measurement function is strong, and good portability, measurement efficiency is high, and measurement range is big, but its measurement accuracy
It is affected by environment it is obvious that the degree of accuracy it is difficult to ensure that；
Optical grating projection is measured because can once obtain the three dimensional point cloud in face domain, is more applied to large-scale
Thin-walled is measured, and is measured using optical grating projection, is formed processing on numerical control equipment and is replaced integrated on-position measure technology in order with measurement,
Process inter process keep part station it is constant in the case of, its crudy is detected and feedback control skill
Art is compared with offline inspection, and detection in place avoids the processes such as part carrying, repeated clamping, it is ensured that process is concentrated and benchmark
Overlap, greatly improve detection efficiency and accuracy.
The content of the invention
To overcome the deficiencies in the prior art, the present invention provides a kind of by the measurement of binocular optical grating projection, measure planning, numerical control machine
The large thin-walled component wall thickness optical measuring system in place and method of the Integration ofTechnologies such as bed.
According to what is detected in place to the overall three-dimensional appearance of thin-wall member and Thickness Distribution in thin-wall member machining process
Demand, point cloud information is obtained based on structure light Technology of Precision Measurement, and the method for progressively making difference by selecting measurement datum is obtained
The wall thickness of correspondence position, finally by the CAD model of the cloud data measured of multiple location and thin-wall member carry out model compare and
Data split, realizes that large thin-walled component detects each accurate wall thickness data in position of acquisition in place, so as to realize global data
Split, obtains the complete wall thickness characteristic of measured object, and then instructs the milling process of thin-wall member to process, while also may be used
To complete the quality evaluation to large thin-walled component.
The present invention is achieved through the following technical solutions：
There is provided a kind of large thin-walled component wall thickness on-position measure system, the system bag according to an aspect of the present invention
Include：Digit Control Machine Tool, profiling attachment, gauge head support, binocular structural light measurement equipment, industrial computer and high-speed communication unit；
Turntable is provided with the Digit Control Machine Tool, the Digit Control Machine Tool controls the turntable to rotate, and returns to described turn
The corner information that platform is rotated；
The profiling attachment is used to complete the clamping of large thin-walled component and provides measurement datum；
The gauge head support is used to realize that binocular structural light measurement equipment is put in industry spot stabilization；
The binocular structural light measurement equipment includes a digital projector, two CCD industrial cameras and pedestal, wherein：
The pedestal is used to fix the CCD industrial cameras and the digital projector, and the digital projector completes the figure of structure light
As projection, the CCD industrial cameras complete IMAQ, so as to complete binocular structural light measurement data acquisition；
The CCD industrial cameras and the digital projector pass through the high-speed communication unit and the industrial computer
Connection, the industrial computer is connected by the high-speed communication unit with the CNC Machine Tools Communication；
The industrial computer controls the digital projector projection and CCD industry by the high-speed communication unit
Camera gathers image data acquisition, and controls the Digit Control Machine Tool rotation turntable complete by the high-speed communication unit
Into the collection of diverse location measurement data, the industrial computer integrates all data and extracts large thin-walled component wall thickness information,
And Digit Control Machine Tool is fed back to, whole system is constituted an entirety.
Preferably, during measurement, large thin-walled component is fixed on the profiling attachment, and the profiling attachment is fixed on described
On the turntable of Digit Control Machine Tool, and then the turntable is set to drive large thin-walled component to rotate, the binocular structural light measurement is set
It is standby to be fixed on the gauge head support, and the gauge head support is located at the Digit Control Machine Tool opposite so that the turntable exists
Between the Digit Control Machine Tool processing component and the gauge head support.
There is provided a kind of large thin-walled component wall thickness based on above-mentioned measuring system is in place according to another aspect of the present invention
Measuring method, the described method comprises the following steps：
1) measurement initialization
Before measuring system start-up operation, two CCD industrial cameras for completing binocular structural light measurement equipment are demarcated and first
The determination of beginning measurement position；
2) measure planning
According to the shape and size of large thin-walled component, the turntable precision and binocular structural light measurement of combining with digital control lathe are set
Measurement strategies are carried out preliminary planning, it is ensured that measurement data integrality and measurement efficiency by standby visual field size information；
3) reference measurement face is selected
The wall thickness feature of large thin-walled component is obtained by way of measuring indirectly, indirect survey is realized using reference measurement face
Amount；
4) according to result in 2), a series of measurement point positions in space is obtained, obtained measurement point position is changed into numerical control machine
The corner information of the turntable of bed, single step angular turn is carried out using the turntable of Digit Control Machine Tool, is carried out in selected measurement point single
Pacing amount；
5) by rotating the bottom surface cloud data and rotate a turnover that a revolving platform measurement datum is large thin-walled component
Platform measures university's thin-wall member surface cloud data, completes what is measured twice using initial position, measurement label, characteristic point information
Measuring surface is alignd, and the wall thickness of correspondence position is carried out resolving completion feature extraction, and the error of processing noise completes error and mended
Repay；
6) multiposition measuring data split
The label of a cloud is measured at each measurement point position according to obtained in measurement process, the turntable of Digit Control Machine Tool
Corner information and initial position value, with reference to the CAD model information of university's thin-wall member, the point that will be obtained at each measurement point position
Cloud positional information is uniformly transformed under NC Machine Tools Coordinate system, realizes point cloud registration and integration, so as to obtain the complete of large thin-walled component
Cloud data, and be finally compared with CAD model, obtain the wall thickness and actual requirement of each location point after this process finishing
Wall thickness deviation.
Preferably, in 1)：
According to the internal relations of binocular structural light measurement equipment, to mark of the CCD industrial cameras using known form and parameter
Fixed board, by carrying out orthogonal direction two-dimensional phase coding to digital projector light line, synchronous demarcation reference point of extracting is in CCD industry
Camera and digital projector imaging plane corresponding points, realize the Accurate Calibration of CCD industrial cameras in binocular structural light measurement equipment；
Initial marking is set as initial measurement locations, it is determined that the initial coordinate system origin of whole actual tested large thin-walled component.
Preferably, in 1), the inside and outside parameter model of the CCD industrial cameras is shown below：
C=(κ, sx,sy,cx,cy,α,β,γ,tx,ty,tz)
Wherein：Parameter κ is radial distortion level, sx,syIt is illustrated respectively in the scaling factor in x and y directions, cx,cyRepresent
The center of radial distortion, α, beta, gamma is angle variables, tx,ty,tzFor translation variable；X, y, z is location variable.
Preferably, it is described that preliminary planning is carried out to measurement strategies in 2), it is so that the measuring surface domain of two neighboring point position
With certain registration, it is to avoid space occur and lose crucial measurement feature, while overlapping region can not be excessive so that influence
Measuring speed, it is ensured that measurement data integrality and measurement efficiency.
Preferably, in 3), wall thickness is asked for by way of choosing reference plane and making the difference, it is true first to carry out one-shot measurement to reference plane
Determine measuring basis, large thin-walled component is clamped, by carrying out wall thickness measuring indirectly to large thin-walled component upper surface.
Preferably, in 4), the position that every step needs measurement object is put into the visual field of measuring system, binocular structure is utilized
Light carries out single step measurement.
It is furthermore preferred that Industrial Computer Control digital projector projects the three frequency width pictures of three step phase shift 9 to large thin-wall structure
Part surface；Simultaneously；The CCD industrial cameras of left and right two gather the grating picture after large thin-walled component surface modulation, utilize 9 width
Picture carries out multifrequency heterodyne phase decoding, and then completes the Point matching of the binocular camera of left and right CCD industrial cameras, utilizes binocular vision
Difference measurements principle obtains disparity map, and the progress large thin-walled component region point cloud three-dimensional reconstruction, obtains the point of measured zone accordingly
Cloud data.
Preferably, in 5)：Using the turntable of Digit Control Machine Tool a rotation measuring reference plane is completed since original position (i.e.
The bottom surface of large thin-walled component), to obtain cloud data, the measurement of reference plane is only carried out once, and large thin-wall structure is clamped afterwards
Part, makes Turbogrid plates close proximity to cam surface, to reduce because of measurement error caused by the two space；Recycle and once survey afterwards
Obtain Turbogrid plates surface cloud data；Compare the cloud data of pattern and Turbogrid plates, so as to obtain the accurate wall thickness letter in each position
Breath.
Preferably, in 6), after this measurement is completed, referred to using the wall thickness information of large thin-walled component current location
Lead processing, Milling Process once after the completion of, carry out one-time surface three-dimensional point cloud measurement, then be compared with reference plane and obtain final
Deviation, finally realize the online optical measurement of large thin-walled component wall thickness.
Compared with prior art, the present invention has following beneficial effect：
1) regional area cloud data is obtained using the measurement of binocular optical grating projection, can once obtains the number in face domain
According to substantially increasing the integrality that measurement efficiency also ensure that data compared to ultrasonic measurement；
2) without in large thin-walled component surface addition subsidiary reagent such as couplant etc., simplifying measuring process, more
Suitable for on-position measure；
3) using the measurement of binocular optical grating projection, the mode made the difference from reference plane is measured enter under the same coordinate system twice
OK, and the feedback of positional information for passing through Digit Control Machine Tool and adjusting for measure planning, can be with reference to known CAD model data
Ensure that data high-precision can realize complete split, improve the precision that large thin-walled component integrally puts cloud；
4) using the mode made the difference with reference plane, selected initial position only needs to clamped one time and can be carried out multiple survey
Amount, simplifies system hardware composition, while also simplify measurement procedure, improves adaptability and robustness.
Brief description of the drawings
By reading the detailed description made with reference to the following drawings to non-limiting example, further feature of the invention,
Objects and advantages will become more apparent upon：
Fig. 1 is the FB(flow block) of the measuring method of one embodiment of the present invention；
Fig. 2 is the structural representation of the measuring system of one embodiment of the present invention；
In figure：Digit Control Machine Tool 1, turntable 2, profiling attachment 3, gauge head support 4, binocular structural light measurement equipment 5；
Fig. 3 is the structural representation of the binocular structural light measurement equipment of one embodiment of the present invention,
In figure：Digital projector 6, CCD industrial cameras 7, aluminium alloy pedestal 8；
Fig. 4 is the measuring principle figure of one embodiment of the present invention.
Embodiment
With reference to specific embodiment, the present invention is described in detail.Following examples will be helpful to the technology of this area
Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that to the ordinary skill of this area
For personnel, without departing from the inventive concept of the premise, various modifications and improvements can be made.These belong to the present invention
Protection domain.
As shown in Fig. 2 a kind of be used for thin-wall member wall thickness on-position measure system, the system includes：Digit Control Machine Tool 1, turntable
2nd, profiling attachment 3, gauge head support 4, binocular structural light measurement equipment 5, industrial computer and high-speed communication unit, wherein：
The binocular structural light measurement equipment 5 includes digital projector 6, two CCD industrial cameras 7, and aluminium is closed
Auri 8 (as shown in Figure 3) of seat, aluminium alloy pedestal 8 is used for fixing CCD industrial cameras 7 and digital projector 6, and digital projector 6 is used
In the coded image projection for completing structure light, two CCD industrial cameras 7 are used to complete IMAQ, the sum of CCD industrial cameras 7
Word projecting apparatus 6 is attached by high-speed communication unit and industrial computer, and industrial computer is further through high-speed communication list
Member is communicatively coupled with Digit Control Machine Tool 1, and high-speed communication unit is used to complete data interaction, and industrial computer completes data processing
And control；Digit Control Machine Tool 1 is used for controlling turntable 2 to rotate and returning to the corner information of numerical control machine turntable, and profiling attachment 3 is used for
Complete the clamping of large thin-walled component and measurement datum is provided, gauge head support 4 is used for realizing that gauge head is stable in industry spot
Put；
The industrial computer is adopted by controlling the projection of digital projector 6 and CCD industrial cameras 7 to gather image completion data
Collection, control Digit Control Machine Tool 1 rotating table 2 completes the collection of diverse location measurement data, and industrial computer is integrated all data and carried
Large thin-walled component wall thickness information is taken, and feeds back to Digit Control Machine Tool 1.
As shown in figure 1, a kind of be used for thin-wall member wall thickness on-position measure method, methods described comprises the steps：
1) measurement initialization
Before measuring system is started working, the demarcation of CCD industrial cameras and the initial measurement of binocular structural light measurement equipment are completed
The determination of position.
According to the internal relations of binocular structural light measurement equipment, to mark of the CCD industrial cameras using known form and parameter
Fixed board, by carrying out orthogonal direction two-dimensional phase coding to digital projector light line, synchronous demarcation reference point of extracting is in CCD industry
Camera and digital projector imaging plane corresponding points, realize the Accurate Calibration of binocular structural light measurement equipment；Set initial marking
For initial measurement locations, the initial coordinate system origin of large thin-walled component is determined.
The inside and outside parameter model of the CCD industrial cameras is shown below：
C=(κ, sx,sy,cx,cy,α,β,γ,tx,ty,tz)
Wherein：κ is radial distortion level, sx,syIt is illustrated respectively in the scaling factor in x directions and y directions, cx,cyRepresent
The center of radial distortion, α, beta, gamma is angle variables, tx,ty,tzFor translation variable, x, y, z is location variable.
2) measurement path planning：
According to the shape and size of large thin-walled component, the turntable precision and binocular structural light measurement of combining with digital control lathe are set
Measurement strategies are carried out preliminary planning by standby visual field size information, main to determine the corner size that single step is rotated, per pacing amount pair
The grid object label answered so that the measuring surface domain of two neighboring point position has certain registration, it is to avoid space loss occur
Key measurement feature, while overlapping region can not it is excessive so that influence measuring speed so that ensure measurement data integrality and
Measurement efficiency.
3) reference measurement face is selected
Because the purpose of whole measuring system is the wall thickness of measurement large thin-walled component, the penetration capacity of optical measurement is poor,
Since it is desired that obtaining wall thickness feature by way of measuring indirectly, wall thickness is asked for by way of choosing reference plane and making the difference；Institute
Stating reference plane has two kinds of selection modes：The first is to choose face on the basis of cam surface, because pattern is close with thin-walled inner surface
Laminating, it can be understood as pattern is the three-dimensional position of thin-walled inner surface；Second is face on the basis of thin-walled upper surface；In order to protect
The stability of a system is demonstrate,proved, face on the basis of cam surface is selected herein；First reference plane is carried out after one-shot measurement, benchmark is determined, afterwards
Clamp large thin-walled component.
4) according to result in 2), a series of measurement point positions in space is obtained, obtained measurement point position is changed into numerical control machine
The corner information of bed turntable, carries out single step angular turn using the turntable of Digit Control Machine Tool, every step is needed to the position of measurement object
It is put into the visual field of measuring system, single step measurement is carried out using binocular structure light；Thrown by Industrial Computer Control digital projector
The three frequency width pictures of three step phase shift 9 preset are penetrated to large thin-walled component surface, meanwhile, the two CCD industrial cameras in control left and right
Gather the grating picture after large thin-walled component surface modulation；Principle is unpacked according to multifrequency phase shift heterodyne, to the knot obtained
Structure pumped FIR laser picture carries out phase decoding, obtains wrapped phase figure and full field phase figure, and polar curve correction is carried out according to basis matrix,
Then binocular ranging is carried out, disparity map is calculated according to matching result, accordingly the progress large thin-walled component region point cloud Three-dimensional Gravity
Build, so as to obtain the cloud data of measured zone.
5) a rotation measuring reference plane is completed since original position using the turntable of Digit Control Machine Tool, point cloud number is obtained
According to, the measurement of reference plane is only carried out once, and large thin-walled component recycling is clamped afterwards and once measures thin-walled surface cloud data,
Because initial position is identical, the angle that Digit Control Machine Tool is rotated each time is all determined in measure planning in advance, according to survey
Characteristic point information in amount label and image completes to measure the matching of corresponding point cloud chart picture twice, by the coordinate system of image twice
After being adjusted, because turntable pattern is semicircular, so needing axially make the difference when wall thickness calculating is carried out, lead to
Coordinate transform is crossed, afterwards the wall thickness of correspondence position is carried out resolving completion feature extraction, noise etc. is handled by mistake using filtering mode
Difference completes error compensation；Finally give the accurate wall thickness information in each position.
6) multiposition measuring data split
The label and initial position value of a cloud are measured at each measurement point position according to obtained in 5), with reference to large-scale thin
The CAD model information of wall member, is uniformly transformed into Digit Control Machine Tool by the three-dimensional point cloud information obtained at each measurement point position and sits
Under mark system, point cloud registration and integration is realized, so as to obtain the complete point cloud data of large thin-walled component；Finally it is compared with CAD model,
The deviation of the wall thickness of the wall thickness of each location point and actual requirement after this process finishing is obtained, Digit Control Machine Tool is finally fed back to whole
Thickness Distribution, the wall thickness of each grid and the deviation spatial distribution of individual large thin-wall structure, wall thickness and deviation average, wall thickness and partially
The characteristic informations such as poor extreme value.
And complete this measurement after, instructed using these characteristic informations processing, Milling Process once after the completion of, enter
Row one-time surface three-dimensional point cloud is measured, then is compared with reference plane and is obtained final deviation, finally realizes large thin-walled component
The online optical measurement of wall thickness.
Further, specific data split process is the turntable corner letter of the Digit Control Machine Tool fed back by Digit Control Machine Tool
What breath, initial position were carried out.Assuming that the coordinate system of optical measuring system is xc,yc,zc, and the turntable origin of Digit Control Machine Tool is set up
NC Machine Tools Coordinate system be xw,yw,zw, the transition matrix of two coordinate systems is the point P in T, CCD industrial camera coordinate systemsc=
(xc,yc,zc)T, the point P in NC Machine Tools Coordinate systemw=(xw,yw,zw)T, then have：
Wherein：T is transition matrix, be combined into by rotation and translation matrix have six parameters determine i.e. (α ', β ', γ ',
t′x,t′y,t′z), it is the anglec of rotation around three axles and the displacement along three axles respectively.
The current rotational angle displacement of known Digit Control Machine Tool is θ, then the point P ' unified under original coordinate systemw=(x 'w,y′w,
x′w)T, matrix R is：
Finally the cloud that has under NC Machine Tools Coordinate system is：
All point clouds can be transformed under turntable coordinate system, be completed under the same coordinate system by above-mentioned changes in coordinates
Image registration, and image sequence is merged into the complete seamless stitching image of a width according to the correlation between image；For
The lap of two images is handled using a kind of by the way of corresponding point position is average, is protected equivalent to a kind of mode of filtering
Demonstrate,prove the interference that is complete and suppressing noise of data.
Measuring principle figure is illustrated in figure 4, the face that actual large thin-walled component is primarily upon in measurement process has：Pattern
Surface, green surface after fixture face, processing, wherein：Surface and green surface are the upper surfaces of thin-wall member after processing, not
The difference in finished surface and profiling attachment face is that the difference on surface and profiling attachment face after initial measurement, processing is remaining wall angle value,
The difference of initial measurement and remaining wall angle value is exactly machined depth, by measuring the D coordinates value in each face, is obtained indirectly
Obtain each thickness information.
Present invention measurement carries out demarcation to measuring system before starting and ensures measurement accuracy, while passing through analysis measurement object
Feature and demand measure planning, it is ensured that data integrity and measurement efficiency.
The present invention realizes the accurate measurement to large thin-walled component under noncontact condition, can not only be commented for crudy
Valency provides topographic data, can be used for instructing machining process.
The specific embodiment of the present invention is described above.It is to be appreciated that the invention is not limited in above-mentioned
Particular implementation, those skilled in the art can make various deformations or amendments within the scope of the claims, this not shadow
Ring the substantive content of the present invention.
Claims (10)
1. a kind of large thin-walled component wall thickness on-position measure system, it is characterised in that the system includes：Digit Control Machine Tool (1), lean on
Die clamper (3), gauge head support (4), binocular structural light measurement equipment (5), industrial computer and high-speed communication unit；
Turntable (2) is provided with the Digit Control Machine Tool (1), the Digit Control Machine Tool (1) controls the turntable (2) to rotate, and returns
Return the corner information that the turntable (2) rotates；
The profiling attachment (3) is used to complete the clamping of large thin-walled component and provides measurement datum；
The gauge head support (4) is used to realize that binocular structural light measurement equipment (5) is put in industry spot stabilization；
The binocular structural light measurement equipment (5) includes a digital projector (6), two CCD industrial cameras (7) and pedestal
(8), wherein：The pedestal (8) is used to fix the CCD industrial cameras (7) and the digital projector (6), and the numeral is thrown
Shadow instrument (6) is used for the image projection for completing structure light, and the CCD industrial cameras (7) are used to complete IMAQ, so as to complete double
Mesh structural light measurement data acquisition；
The CCD industrial cameras (7) and the digital projector (6) are calculated by the high-speed communication unit with the industry
Machine is connected, and the industrial computer is communicated to connect by the high-speed communication unit and the Digit Control Machine Tool (1)；
The industrial computer controls digital projector (6) projection and CCD industry by the high-speed communication unit
Camera (7) gathers image data acquisition, and controls Digit Control Machine Tool (1) rotation described by the high-speed communication unit
Turntable (2) completes the collection of diverse location measurement data, and the industrial computer integrates all data and extracts large thin-walled component
Wall thickness information, and Digit Control Machine Tool (1) is fed back to, whole system is constituted an entirety.
2. large thin-walled component wall thickness on-position measure system according to claim 1, it is characterised in that large-scale during measurement
Thin-wall member is fixed on the profiling attachment (3), and the profiling attachment (3) is fixed on the turntable (2) of the Digit Control Machine Tool (1)
On, and then making the turntable (2) large thin-walled component can be driven to rotate, the binocular structural light measurement equipment (5) is fixed on
On the gauge head support (4), and the gauge head support (4) is located at the Digit Control Machine Tool (1) opposite so that the turntable
(2) between the Digit Control Machine Tool (1) processing component and the gauge head support (4).
3. a kind of large thin-walled component wall thickness on-position measure method of system described in use claim 1 or 2, it is characterised in that
Methods described comprises the following steps：
1) measurement initialization
Before measuring system start-up operation, the demarcation of two CCD industrial cameras and initial survey of binocular structural light measurement equipment are completed
Measure the determination of position；
2) measure planning
According to the shape and size of large thin-walled component, the turntable precision of combining with digital control lathe and binocular structural light measurement equipment
Measurement strategies are carried out preliminary planning, it is ensured that measurement data integrality and measurement efficiency by visual field size information；
3) reference measurement face is selected
The wall thickness feature of large thin-walled component is obtained by way of measuring indirectly, indirect measurement is realized using reference measurement face；
4) according to result in 2), a series of measurement point positions in space is obtained, obtained measurement point position is changed into Digit Control Machine Tool
The corner information of turntable, carries out single step angular turn using the turntable of Digit Control Machine Tool, single step survey is carried out in selected measurement point
Amount；
5) by rotating the bottom surface cloud data and rotate revolving platform survey that a revolving platform measurement datum is large thin-walled component
Large thin-walled component surface cloud data is obtained, the measurement for completing to measure twice using initial position, measurement label, characteristic point information
In face of neat, and the wall thickness of correspondence position resolve complete feature extraction, the error of processing noise completes error compensation；
6) multiposition measuring data split
The label of a cloud, the corner of the turntable of Digit Control Machine Tool are measured at each measurement point position according to obtained in measurement process
Information and initial position value, with reference to the CAD model information of large thin-walled component, by the point cloud position obtained at each measurement point position
Put information unification to be transformed under NC Machine Tools Coordinate system, realize point cloud registration and integration, so as to obtain the complete point cloud of large thin-walled component
Data, and be finally compared with CAD model, obtain the wall of the wall thickness of each location point and actual requirement after this process finishing
Thick deviation.
4. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 1)
In：
According to the internal relations of binocular structural light measurement equipment, to scaling board of the CCD industrial cameras using known form and parameter,
By carrying out orthogonal direction two-dimensional phase coding to digital projector light line, synchronous demarcation reference point of extracting is in CCD industrial cameras
With digital projector imaging plane corresponding points, the Accurate Calibration of CCD industrial cameras in binocular structural light measurement equipment is realized；Setting
Initial marking is initial measurement locations, it is determined that the initial coordinate system origin of whole actual tested large thin-walled component.
5. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 1)
In, the CCD industrial cameras, its inside and outside parameter model is shown below：
C=(κ, sx,sy,cx,cy,α,β,γ,tx,ty,tz)
Wherein：Parameter κ is radial distortion level, sx,syIt is illustrated respectively in the scaling factor in x and y directions, cx,cyRepresent radially
The center of distortion, α, beta, gamma is angle variables, tx,ty,tzFor translation variable；X, y, z is location variable.
6. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 2)
In, described to carry out preliminary planning to measurement strategies, being so that the measuring surface domain of two neighboring point position has certain registration,
Avoid the occurrence of space and lose crucial measurement feature, while overlapping region can not be excessive so that influence measuring speed, it is ensured that measurement
Data integrity and measurement efficiency.
7. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 3)
In, wall thickness is asked for by way of choosing reference plane and making the difference, one-shot measurement is first carried out to reference plane determines measuring basis, and clamping is big
Type thin-wall member, by carrying out wall thickness measuring indirectly to large thin-walled component upper surface.
8. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 4)
In, the position that every step needs measurement object is put into the visual field of measuring system, single step measurement, work are carried out using binocular structure light
Industry computer control digital projector projects the three frequency width pictures of three step phase shift 9 to large thin-walled component surface；Meanwhile, two CCD
Industrial camera gathers the grating picture after large thin-walled component surface modulation, and multifrequency heterodyne phase solution is carried out using 9 width pictures
Code, and then the Point matching of the binocular camera of two CCD industrial cameras is completed, disparity map is obtained using binocular parallax measuring principle,
The progress large thin-walled component region point cloud three-dimensional reconstruction, obtains the cloud data of measured zone accordingly.
9. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 5)
In, the bottom that a rotation measuring reference plane is large thin-walled component is completed since original position using the turntable of Digit Control Machine Tool
Face, to obtain cloud data, the measurement of reference plane is only carried out once, and large thin-walled component is clamped afterwards, Turbogrid plates is tried one's best and leans on
Nearly cam surface, to reduce because of measurement error caused by the two space；The surface point for once measuring Turbogrid plates is recycled afterwards
Cloud data；Compare the cloud data of pattern and Turbogrid plates, so as to obtain the accurate wall thickness information in each position.
10. a kind of large thin-walled component wall thickness on-position measure method according to claim 3, it is characterised in that step 6)
In, after this measurement is completed, processing is instructed using the wall thickness information of large thin-walled component current location, Milling Process is once
After the completion of, one-time surface three-dimensional point cloud measurement is carried out, then be compared with reference plane and obtain final deviation, finally realize large-scale
The online optical measurement of thin-wall member wall thickness.
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