CN107240086B - A kind of fabric defects detection method based on integral nomography - Google Patents
A kind of fabric defects detection method based on integral nomography Download PDFInfo
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- CN107240086B CN107240086B CN201610180226.3A CN201610180226A CN107240086B CN 107240086 B CN107240086 B CN 107240086B CN 201610180226 A CN201610180226 A CN 201610180226A CN 107240086 B CN107240086 B CN 107240086B
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- 239000004744 fabric Substances 0.000 title claims abstract description 47
- 238000001514 detection method Methods 0.000 title claims abstract description 42
- 230000007547 defect Effects 0.000 title claims abstract description 36
- 238000009826 distribution Methods 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 claims abstract description 39
- 238000004422 calculation algorithm Methods 0.000 claims description 26
- 230000006870 function Effects 0.000 claims description 20
- 238000010586 diagram Methods 0.000 claims description 14
- 238000012549 training Methods 0.000 claims description 8
- 230000002950 deficient Effects 0.000 claims description 6
- 238000000605 extraction Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 4
- 239000000284 extract Substances 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 4
- 238000002813 epsilometer test Methods 0.000 claims description 3
- 230000010354 integration Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 3
- 230000011218 segmentation Effects 0.000 abstract description 3
- 239000004753 textile Substances 0.000 abstract description 2
- 230000003044 adaptive effect Effects 0.000 abstract 1
- 230000004069 differentiation Effects 0.000 abstract 1
- 238000011897 real-time detection Methods 0.000 abstract 1
- 230000008859 change Effects 0.000 description 5
- 230000001133 acceleration Effects 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000009776 industrial production Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
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- 238000011160 research Methods 0.000 description 1
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- 239000013598 vector Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30124—Fabrics; Textile; Paper
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- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201610180226.3A CN107240086B (en) | 2016-03-25 | 2016-03-25 | A kind of fabric defects detection method based on integral nomography |
Applications Claiming Priority (1)
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CN201610180226.3A CN107240086B (en) | 2016-03-25 | 2016-03-25 | A kind of fabric defects detection method based on integral nomography |
Publications (2)
Publication Number | Publication Date |
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CN107240086A CN107240086A (en) | 2017-10-10 |
CN107240086B true CN107240086B (en) | 2019-05-14 |
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Family Applications (1)
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CN201610180226.3A Active CN107240086B (en) | 2016-03-25 | 2016-03-25 | A kind of fabric defects detection method based on integral nomography |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108090894B (en) * | 2017-11-24 | 2020-09-08 | 浙江理工大学 | Fabric defect detection method based on distance matching function and perceptual hash algorithm |
CN109583306B (en) * | 2018-10-31 | 2021-10-08 | 杭州电子科技大学 | Bobbin residual yarn detection method based on machine vision |
CN109934287A (en) * | 2019-03-12 | 2019-06-25 | 上海宝尊电子商务有限公司 | A kind of clothing texture method for identifying and classifying based on LBP and GLCM |
TWI783200B (en) * | 2019-12-30 | 2022-11-11 | 緯創資通股份有限公司 | Method and device for determining whether object has defect |
CN114226262A (en) * | 2020-09-09 | 2022-03-25 | 宜谷京科技实业有限公司 | Flaw detection method, flaw classification method and flaw detection system |
CN112308854B (en) * | 2020-11-26 | 2023-12-26 | 武汉工程大学 | Automatic detection method and system for chip surface flaws and electronic equipment |
-
2016
- 2016-03-25 CN CN201610180226.3A patent/CN107240086B/en active Active
Non-Patent Citations (5)
Title |
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A fast regularity measure for surface defect detection;Du-Ming Tsai 等;《Machine Vision and Applications》;20120104;全文 * |
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection;Du-Ming Tsai 等;《IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS》;20120228;第8卷(第1期);全文 * |
图像处理在仪表识别和布匹瑕疵检测中的应用;张北航;《中国优秀硕士学位论文全文数据库 信息科技辑》;20090115;全文 * |
瑕疵点检测算法研究及应用;王文杰;《中国优秀硕士学位论文全文数据库 信息科技辑》;20110715;全文 * |
钢珠瑕疵检测算法的研究;俞哲 等;《仪器仪表学报》;20091031;第30卷(第10期);全文 * |
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Effective date of registration: 20201030 Address after: 226019 No.205, building 6, Nantong University, No.9, Siyuan Road, Nantong City, Jiangsu Province Patentee after: Center for technology transfer, Nantong University Address before: 226019 Jiangsu city of Nantong province sik Road No. 9 Patentee before: NANTONG University |
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EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20171010 Assignee: Nantong Shunteng Textile Co.,Ltd. Assignor: Center for technology transfer, Nantong University Contract record no.: X2021980016785 Denomination of invention: A fabric defect detection method based on integral graph algorithm Granted publication date: 20190514 License type: Common License Record date: 20211229 |
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Address after: 226001 No.9, Siyuan Road, Chongchuan District, Nantong City, Jiangsu Province Patentee after: Nantong University Technology Transfer Center Co.,Ltd. Address before: 226019 No.205, building 6, Nantong University, No.9, Siyuan Road, Nantong City, Jiangsu Province Patentee before: Center for technology transfer, Nantong University |
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Application publication date: 20171010 Assignee: Yizhong (Nantong) Network Technology Co.,Ltd. Assignor: Nantong University Technology Transfer Center Co.,Ltd. Contract record no.: X2023980053327 Denomination of invention: A Fabric Defect Detection Method Based on Integral Graph Algorithm Granted publication date: 20190514 License type: Common License Record date: 20231221 |