CN107234518B - A kind of processing unit (plant) of optically focused microscope group - Google Patents
A kind of processing unit (plant) of optically focused microscope group Download PDFInfo
- Publication number
- CN107234518B CN107234518B CN201610183559.1A CN201610183559A CN107234518B CN 107234518 B CN107234518 B CN 107234518B CN 201610183559 A CN201610183559 A CN 201610183559A CN 107234518 B CN107234518 B CN 107234518B
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- Prior art keywords
- optically focused
- microscope group
- focused microscope
- fragment
- plant
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B13/00—Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Abstract
The invention discloses a kind of processing methods of optically focused microscope group, comprising the following steps: 1) simulation calculates the curvilinear path of the section of required optically focused microscope group；2) required optically focused microscope group is preset and is divided at least two several fragments, and record the curvilinear path of each fragment position；3) corresponding grinding apparatus and polishing apparatus are processed according to the curvilinear path of each fragment position；4) single fragment is ground using grinding apparatus and polishing apparatus, several fragments processed；5) several fragments processed are combined, obtains required optically focused microscope group.The present invention carries out fragment by simulating entire optically focused microscope group, is first processed to each fragment, and last recombinant obtains required optically focused microscope group, and the processing is simple, high-efficient, at low cost.The invention also discloses a kind of processing unit (plant)s of optically focused microscope group.
Description
Technical field
The present invention relates to condensers, more particularly, to the processing method and device of a kind of optically focused microscope group.
Background technique
In the prior art, most of condenser is to fabricate to obtain using full wafer.It is required when being processed using full wafer
Instrument cost it is very high, need to cause the processing cost of large area condenser very high, and the area of condenser is limited at instrument
In size, free design cannot achieve.
In the prior art without finding solution in response to this problem.Therefore, the condenser for needing one kind new in a hurry
Processing unit (plant) can reduce the processing cost of condenser, so as to reduce concentrating photovoltaic power generation power cost, while can not also be by
Instrument size limitation, flexible design condenser size.
Summary of the invention
The first purpose of this invention is to provide a kind of processing method of optically focused microscope group.
Second object of the present invention is to provide a kind of processing unit (plant) of optically focused microscope group.
To realize that above-mentioned first purpose, the present invention use the following contents:
A kind of processing method of optically focused microscope group, comprising the following steps:
1) simulation calculates the curvilinear path of the section of required optically focused microscope group；
2) required optically focused microscope group is preset and is divided into more than two several fragments, and record each fragment position
Curvilinear path；
3) corresponding grinding apparatus and polishing apparatus are processed according to the curvilinear path of each fragment position；
4) single fragment is ground using grinding apparatus and polishing apparatus, several fragments processed；
5) several fragments processed are combined, obtains required optically focused microscope group.
The present invention carries out fragment by simulating entire optically focused microscope group, is first processed to each fragment, last recombinant
Required optically focused microscope group is obtained, the processing is simple, and it is high-efficient, it is at low cost.
It further, is the required large area optically focused microscope group of simulation in the step 1), the center line with optically focused microscope group is
The center of circle, horizontal rotation obtain curvilinear path data.
Further, the optically focused microscope group is Fresnel condenser.
The grinding apparatus can be the work that can be used to carry out sheet glass curved surface grinding of arbitrary shape, structure
Tool, including but not limited to grinding stick, Grinding wheel, grinding bar, grinding strip etc..Further, the surface tool of the grinding apparatus
There is diamond dust.The specification of diamond dust can be according to needing to select.Diamond dust is electroplated onto the surface of grinding apparatus.
The polishing apparatus can be the tool that can be used to polish sheet glass of arbitrary shape, structure, including but
It is not limited to polishing rod, polishing wheel, polished rod, sand belt etc..Further, the polishing apparatus includes wool wheel and polishing
Liquid, the polishing fluid are diamond dust.Diamond dust contacts sheet glass in the presence of wool wheel repeatedly and is polished.
The partition machining method of optically focused microscope group of the invention is applicable to the processing of the optically focused microscope group of various areas, especially suitable
Processing for large area optically focused microscope group.It is appreciated that herein, due to being the method using partition machining, optically focused microscope group
No matter much area is how small, can be used, and does not have to specific limit.
To realize that above-mentioned second purpose, the present invention use the following contents:
A kind of processing unit (plant) of optically focused microscope group, the processing unit (plant) include:
Curvilinear path analogue unit, for simulating the curvilinear path for the section for calculating required optically focused microscope group, and by institute
The optically focused microscope group needed is default to be divided into more than two fragments, while recording the curvilinear path of each fragment position；
At least one grinding apparatus, for being ground to each fragment；The surface of the grinding apparatus is according to curve
The curvilinear path of each fragment position of trace simulation unit record processes to obtain at least one polishing apparatus, is used to warp
Each fragment after grinding is polished；The polishing apparatus is each fragment place according to curvilinear path analogue unit record
The curvilinear path of position processes to obtain: and
Assembled unit, for polished each fragment is in place by each fragment institute of curvilinear path analogue unit record
Assembly is set, optically focused microscope group is obtained；
Further, the processing unit (plant) further include: offset control unit, for controlling grinding apparatus and polishing apparatus
Horizontal front and rear, left and right position and rotation angle, and ensure the curvilinear path of each fragment in required optically focused microscope group
Heart line rotates horizontally；
Further, the offset control unit includes: horizontal rotary mechanism, horizontal direction back-and-forth motion mechanism and water
Square move left and right mechanism.Preferably, the horizontal rotary mechanism is reversely hung Yong turntable；The horizontal direction is moved forward and backward
Mechanism is the first movement platform that can be moved forward and backward in the horizontal direction；The horizontal direction left/right movement device is can be in the horizontal direction
The second mobile station moved left and right.
Further, the offset control unit uses machining control clock control.When processing each fragment, processing control
Logic processed be using multiple grinding apparatus, multiple polishing apparatus simultaneously to glass slice implement rough grinding, accurate grinding,
The processing such as rough polishing, precise polished is to improve processing efficiency.
Further, the optically focused microscope group is Fei Nieer condenser.
Further, the processing unit (plant) further include: sheet glass placement unit, for placing fragment.Preferably, the glass
Glass piece placement unit is pallet.
The grinding apparatus can be the work that can be used to carry out glass slice curved surface grinding of arbitrary shape, structure
Tool, including but not limited to grinding stick, Grinding wheel, grinding cup, grinding strip etc..Further, the surface tool of the grinding apparatus
There is diamond dust.The specification of diamond dust can be according to needing to select.Diamond dust is electroplated onto the surface of grinding apparatus.
The polishing apparatus can be the tool that can be used to polish glass slice of arbitrary shape, structure, including
But be not limited to polishing rod, polishing wheel, polished rod, sand belt etc..Further, the polishing apparatus includes wool wheel and polishing
Liquid, the polishing fluid are diamond dust.Diamond dust contacts sheet glass in the presence of wool wheel repeatedly and is polished.
Herein, the orientation or positional relationship of the instructions such as term "front", "rear" " left side " " right side ", "vertical", "horizontal" is base
In orientation or positional relationship shown in the drawings, it is merely for convenience of description of the present invention and simplification of the description, rather than indication or suggestion
Signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as to this
The limitation of invention.
The invention has the following advantages that
1, present invention firstly provides the curvilinear path using condenser, thousands of fragments are first processed, recombinant is one later
The optically focused microscope group of a large area, at low cost and optically focused microscope group size are unrestricted.
2, processing unit (plant) structure of the invention is simple, easy to use.
3, the present invention processes optically focused microscope group obtained and can be used in condensation photovoltaic facility, light after optically focused microscope group optically focused,
It reaches photovoltaic battery panel and carries out photovoltaic reaction.
Detailed description of the invention
Specific embodiments of the present invention will be described in further detail with reference to the accompanying drawing.
Fig. 1 is the structural schematic diagram for the light microscopic group that present invention processing obtains.
Fig. 2 is the members structural schematic diagram of processing unit (plant) of the invention.
Fig. 3 is the members structure back side schematic diagram of processing unit (plant) of the invention.
Fig. 4 is that processing unit (plant) of the invention removes the structural representation after the second fixed plate and grinding tool and polishing tool
Figure.
Fig. 5 is the structural schematic diagram of the second fixed plate and grinding tool and polishing tool.
Fig. 6 is the structural schematic diagram for the grinding apparatus that the present invention uses.
In figure, each appended drawing reference are as follows:
1- fragment, 2- curvilinear path, 3- pallet, 4-, which is moved forward and backward, to be closed, and 5- moves left and right platform, 6- turntable, 7-
Grinding apparatus, 71- ontology, 72- curve part, 73- bearing portion, 74- rotate axle portion, and 8- polishes apparatus, and 9- first is fixed
Plate, 10- tool securing mechanism, 11 second fixed plates.
Specific embodiment
In order to illustrate more clearly of the present invention, below with reference to preferred embodiment, the present invention is described further.Ability
Field technique personnel should be appreciated that following specifically described content is illustrative and be not restrictive, this should not be limited with this
The protection scope of invention.
Embodiment
A method of processing large area Fresnel condenser, comprising the following steps:
1) simulation calculates the fragment curvilinear path of required large area Fresnel optically focused microscope group.It is usually big needed for simulation
Area optically focused microscope group, using the center line of optically focused microscope group as the center of circle, horizontal rotation obtains curvilinear path data.
2) required large area Fei Nieer condenser is preset and is divided into several more than two fragments, and record each point
The curve rail of piece position.Fig. 1 shows the fragment 1 and curvilinear path 2 of large area optically focused microscope group needed for simulation.
3) corresponding grinding apparatus and polishing apparatus are processed according to the curvilinear path of each fragment position；
4) single fragment is ground using grinding apparatus and polishing apparatus, several fragments processed；
5) several fragments processed are combined, obtains required large area optically focused microscope group.
Method of the invention can be realized in the processing unit (plant) for being arbitrarily able to achieve above step.The present invention provides a kind of excellent
The processing unit (plant) of choosing.
It as shown in figures 2-6, is the structural schematic diagram of the device in processing unit (plant) of the invention, used when processing fragment.
The device used when the processing fragment includes: pallet 3, is moved forward and backward platform 4, moves left and right platform 5, is turntable 6, several
If being ground apparatus 7, dry-fine apparatus 8, the first fixed plate 9, tool securing mechanism 10 and the second fixed plate 11；
Move left and right setting pallet 3 on the pedestal of platform 5；Pallet 3 is used to place slide fragment and fix in process
Sheet glass fragment；
It is moved forward and backward platform 4 and is used to control pallet 3, grinding apparatus 7 and the polishing forward and backward movement in the horizontal direction of apparatus 8: left and right
Mobile station 5 is used to control the left and right movement in the horizontal direction of pallet 3；It is fixed it is appreciated that being also possible to pallet 3, is ground apparatus 7
Move left and right with polishing 8 level of apparatus: the first fixed plate 9 is used to move left and right platform 5 and is connected with platform 4 is moved forward and backward；
Turntable 6 is used to control grinding apparatus 7 and polishing apparatus 8 rotates in vertical direction, and is reversely hung Yong turntable: second
Fixed plate 11 is used to be ground apparatus 7, polishing apparatus 8 is connected with turntable 6: tool securing mechanism 10 is used for fixed grinding
Tool 7 or polishing apparatus 8.
As shown in fig. 6, grinding apparatus 7 includes ontology 71, curve part 72, bearing portion 73, rotates axle portion 74, ontology 71
Both ends are equipped with bearing portion 73, and the front end of side bearing portion 73, which is equipped with, rotates axle portion 74, according to the curve rail of each fragment on ontology 71
Mark is provided with curve part 72.
The curve part 72 for being ground the surface of apparatus 7 is to process to obtain according to the curvilinear path of each fragment position；It throws
Light apparatus 8 is to process to obtain according to the curvilinear path of each fragment position.
It is fixed in use, the glass slice for being in some position is put into pallet 3, passes through control and be moved forward and backward platform 4, a left side
Platform 5, the movement of turntable 6 or rotation are moved right to make grinding apparatus 7 and polishing apparatus 8 are ground, be thrown to the glass slice
Light repeats the step, and several fragments processed combine several fragments processed, and it is poly- to obtain required large area
Light microscopic group.
Condenser produced by the present invention can be used in condensation photovoltaic facility, and light reaches photovoltaic electric after condenser optically focused
Pond plate carries out photovoltaic reaction.
Obviously, the above embodiment of the present invention be only to clearly illustrate example of the present invention, and not be pair
The restriction of embodiments of the present invention may be used also on the basis of the above description for those of ordinary skill in the art
To make other variations or changes in different ways, all embodiments can not be exhaustive here, it is all to belong to this hair
The obvious changes or variations that bright technical solution is extended out are still in the scope of protection of the present invention.
Claims (5)
1. a kind of processing unit (plant) of optically focused microscope group, which is characterized in that the processing unit (plant) includes:
Curvilinear path analogue unit, for simulating the curvilinear path for the section for calculating required optically focused microscope group, and will be required
Optically focused microscope group is default to be divided into more than two fragments, while recording the curvilinear path of each fragment position；
At least one grinding apparatus, for being ground to each fragment；The surface of the grinding apparatus is according to curvilinear path
The curvilinear path of each fragment position of analogue unit record processes to obtain；
Zhi Shao ー polishing apparatus, for polishing to through each fragment after grinding: the polishing apparatus is according to curve
The curvilinear path of each fragment position of trace simulation unit record processes to obtain；And
Assembled unit, for spelling polished each fragment by each fragment position of curvilinear path analogue unit record
Dress, obtains optically focused microscope group.
2. a kind of processing unit (plant) of optically focused microscope group according to claim 1, which is characterized in that the processing unit (plant) also wraps
It includes: offset control unit, for controlling grinding apparatus and polishing horizontal front and rear, left and right position and the rotation angle of apparatus,
And ensure that the curvilinear path of each fragment is rotated horizontally with the center line of required optically focused microscope group.
3. a kind of processing unit (plant) of optically focused microscope group according to claim 2, which is characterized in that the offset control unit
It include: horizontal rotary mechanism, horizontal direction back-and-forth motion mechanism and horizontal direction left/right movement device.
4. a kind of processing unit (plant) of optically focused microscope group according to claim 1, which is characterized in that the optically focused microscope group is luxuriant and rich with fragrance alunite
That condenser.
5. a kind of processing unit (plant) of optically focused microscope group according to claim 1, which is characterized in that the processing unit (plant) also wraps
It includes: sheet glass placement unit, for placing fragment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610183559.1A CN107234518B (en) | 2016-03-29 | 2016-03-29 | A kind of processing unit (plant) of optically focused microscope group |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610183559.1A CN107234518B (en) | 2016-03-29 | 2016-03-29 | A kind of processing unit (plant) of optically focused microscope group |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107234518A CN107234518A (en) | 2017-10-10 |
| CN107234518B true CN107234518B (en) | 2019-04-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610183559.1A Active CN107234518B (en) | 2016-03-29 | 2016-03-29 | A kind of processing unit (plant) of optically focused microscope group |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3789672B2 (en) * | 1999-02-19 | 2006-06-28 | 独立行政法人科学技術振興機構 | Grinding method |
| CN202177711U (en) * | 2011-08-04 | 2012-03-28 | 廖贤杰 | Fresnel Lens assembly and mould for manufacturing Fresnel Lens |
| CN102508324A (en) * | 2011-12-30 | 2012-06-20 | 北京工业大学 | Method and device for processing low-cost large Fresnel lens array |
| CN103149609A (en) * | 2013-03-13 | 2013-06-12 | 毛建华 | Processing method for ultra-large-caliber Fresnel lens |
| CN203232196U (en) * | 2013-04-19 | 2013-10-09 | 日芯光伏科技有限公司 | Large caliber non imaging Fresnel reflection condenser |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4658667B2 (en) * | 2005-04-19 | 2011-03-23 | 富士フイルム株式会社 | Manufacturing method of annular optical element and manufacturing method of mold for annular optical element |
-
2016
- 2016-03-29 CN CN201610183559.1A patent/CN107234518B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3789672B2 (en) * | 1999-02-19 | 2006-06-28 | 独立行政法人科学技術振興機構 | Grinding method |
| CN202177711U (en) * | 2011-08-04 | 2012-03-28 | 廖贤杰 | Fresnel Lens assembly and mould for manufacturing Fresnel Lens |
| CN102508324A (en) * | 2011-12-30 | 2012-06-20 | 北京工业大学 | Method and device for processing low-cost large Fresnel lens array |
| CN103149609A (en) * | 2013-03-13 | 2013-06-12 | 毛建华 | Processing method for ultra-large-caliber Fresnel lens |
| CN203232196U (en) * | 2013-04-19 | 2013-10-09 | 日芯光伏科技有限公司 | Large caliber non imaging Fresnel reflection condenser |
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| Publication number | Publication date |
|---|---|
| CN107234518A (en) | 2017-10-10 |
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Effective date of registration: 20210106 Address after: 211600 No. 47, Jianshe Road, Jinhu County, Jiangsu, Huaian Patentee after: Jinhu comprehensive inspection and Testing Center Address before: Room 22-702, lakeside Tiancheng, no.669, Zhongyuan Road, Suzhou Industrial Park, 215000, Jiangsu Province Patentee before: SUZHOU LYUDOUDOU SOFTWARE TECHNOLOGY Co.,Ltd. |
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