CN107219229B - Panel dust filtering method and device - Google Patents
Panel dust filtering method and device Download PDFInfo
- Publication number
- CN107219229B CN107219229B CN201710343204.9A CN201710343204A CN107219229B CN 107219229 B CN107219229 B CN 107219229B CN 201710343204 A CN201710343204 A CN 201710343204A CN 107219229 B CN107219229 B CN 107219229B
- Authority
- CN
- China
- Prior art keywords
- panel
- defect
- dust
- detected
- historical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
- G01N2021/8864—Mapping zones of defects
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The invention discloses a panel dust filtering method and a panel dust filtering device. Detecting the panel defects, acquiring position data and characteristic data of the panel defects, and obtaining historical defect information of the panel; performing filtering operation on dust on the upper surface of the current detection panel; judging whether the defects detected by the current detection panel are dust on the lower surface or not according to historical defect information of the panel, and filtering the dust; and updating the defect judgment data of the current detection panel to the panel historical defect information. Compared with the prior art, the false detection caused by dust on the lower surface of the panel is greatly reduced, and the performance of the AOI detection system is improved.
Description
Technical Field
The invention relates to the field of image defects, in particular to a panel dust filtering method and device.
Background
In the process of performing defect detection of the LCD panel of AOI, a very important step is dust filtration. Wherein the dust contains dust on the upper surface and dust on the lower surface of the LCD panel as shown in fig. 1. Because of the presence of these dusts, imaging of the panel has an abnormality at the dust position. The anomaly is very similar to a real defect, and if the anomaly is not filtered, a large amount of dust areas are detected as defects, so that a large amount of false detection is generated, and the performance of the whole AOI system is affected. Therefore, dust filtration is necessary when performing defect detection of the LCD panel.
Since the dust includes dust on the upper surface and dust on the lower surface, in a general scheme, two images are taken separately.
First, a bottom surface dust image is photographed, and since the position of the light transmission difference is generally the position of the bottom surface, a dark spot (spot) is detected in the bottom surface dust filter image, and the dark spot (spot) is the back dust. And secondly, shooting an upper surface filtering image, and uniformly illuminating dust on the upper surface due to the fact that the upper and lower side lights and the left and right side lights are turned on. Therefore, the position of the surface dust can be obtained by detecting the bright spot (spot) in the upper surface filtering image.
Aiming at the black matrix liquid crystal screen, because the black matrix liquid crystal screen is completely light-tight, the panel can be turned over to convert the dust on the lower surface into the dust on the upper surface for filtering.
The prior art has the following problems:
1. at present, most LCD screens are in a black matrix mode, and the whole LCD panel is light-tight, so that whether dust on the lower surface exists or not can not be distinguished. However, the bottom surface dust has a certain influence on the image formation of the region on other detection screens (Red, Green, Blue, L0, L48, L127, L255, and the like).
Interpretation of terms:
the liquid crystal screen with the black bottom is characterized in that when voltage is not applied to the liquid crystal screen, the liquid crystal screen is opaque and presents a black picture; when a voltage is applied, the liquid crystal transmits light, and a white picture is displayed.
Red, green and blue are called three primary colors, which are adopted by LCD light emitting display, the red, green and blue adjustment ranges are 0-255 respectively, which is also called RGB color mode, all three colors are 0, namely black, all three colors are 255, namely white, and the single colors red, green and blue are 255, namely: red (Red255), Green (Green255), Blue (Blue255), setting different values for RGB respectively, can make up for a wide range of colors, L48: in 48 gray scale pictures, the RGB values are all 48, and RGB (48,48,48) pictures are obtained.
2. The mode that adopts the upset panel can solve most lower surface dust problem, but partial lower surface is attached to toughened glass surface, perhaps attaches to inside the lamp house, even the upset also can not be shot. The turnover of the panel at the same time can cause the abnormal complexity of the whole mechanism, and the cost of the equipment is greatly increased.
Disclosure of Invention
The invention aims to provide a method and a device for filtering dust in a black matrix liquid crystal display mode. The method comprises the steps of tracking the position and the characteristics of the defect detected by each panel, acquiring historical track information of each defect, and updating the historical track information of the defect in real time. And filtering the dust of the current panel according to the historical track information of the defects, and correcting the result of the panel subjected to historical misjudgment, so that the misdetection caused by the dust is effectively reduced.
In one aspect, the present invention provides a panel dust filtering method, including the steps of:
step S1, detecting the panel defects, obtaining the position data and the characteristic data of the panel defects, and obtaining the historical defect information of the panel;
step S2, filtering the dust on the upper surface of the current detection panel; judging whether the defects detected by the current detection panel are dust on the lower surface or not according to historical defect information of the panel, and filtering the dust;
in step S3, the defect judgment data of the currently detected panel is updated to the panel history defect information.
Further, in step S2, according to the historical defect information of the panel, determining whether the defect detected by the currently detected panel is the bottom surface dust includes:
step S21, judging whether the detected defect is a dark spot or a dark spot, if so, entering S22, and if not, judging that the defect is non-dust;
step S22, counting the number of the detected defects in the current panel detection picture, if the number is equal to 3 or more than 3, entering S23, otherwise, judging the defect is non-dust;
step S23, judging whether the detected defects have defects with similar positions and the same pictures in the historical defect information, if so, entering S24, otherwise, judging the defects are non-dust;
step S24, judging whether the difference characteristic values of the detected defect and the defect with the same position and the same picture in the historical defect information in the aspects of contrast, area and shape are all smaller than a threshold value, if so, entering step S25, otherwise, judging that the defect is non-dust;
step S25, mark the defect as a lower surface dust.
Further, after step S3, the method further includes: the method for correcting the historical defect information of the panel comprises the following specific steps:
and using the defect data of the N + M panels as panel history defect information, judging the defect of the nth panel, and correcting the defect data of the nth panel in the panel history defect information, wherein N > is 1, 1< (N) > is N, and M > 1.
In another aspect, the present invention provides a panel dust filtering apparatus, the apparatus comprising:
the panel historical defect information acquisition unit is used for detecting the defects of the panel, acquiring position data and characteristic data of the panel defects and obtaining panel historical defect information;
the dust filtering unit is used for filtering dust on the upper surface of the current detection panel; judging whether the defects detected by the current detection panel are dust on the lower surface or not according to historical defect information of the panel, and filtering the dust;
and the panel historical defect information updating unit is used for updating the defect judgment data of the currently detected panel to the panel historical defect information.
Further, the dust filtering unit includes:
a dust determination unit for:
judging whether the detected defect is a dark spot or a dark spot;
counting the number of the detected defects in the current panel detection picture, wherein the number of the detected defects in the current panel detection picture is 3 or more than 3;
judging whether the detected defects have defects with similar positions and the same pictures in historical defect information;
judging whether the difference characteristic values of the detected defect and the defect with the same picture at the similar position in the historical defect information are all smaller than a threshold value or not;
the defect is marked as lower surface dust.
Further, the apparatus further comprises: a panel history defect information correcting unit for: and using the defect data of the N + M panels as panel history defect information, judging the defect of the nth panel, and correcting the defect data of the nth panel in the panel history defect information, wherein N > is 1, 1< (N) > is N, and M > 1.
Compared with the prior art, the invention has the following advantages:
(1) the hardware structure is not required to be modified, and the additional cost is not increased;
(2) the practicability is strong, and the whole detection time is not increased;
(3) both can filter the dust of current panel, also can carry out the correction of result to the panel of historical misjudgment, the reduction of very big degree the false retrieval that panel lower surface dust brought has improved AOI detecting system's performance.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic view of top and bottom surface dust and defects in a panel;
FIG. 2 is a schematic diagram showing the comparison of the imaging effect of dust and real defects in an image;
FIG. 3 is a schematic view of the panel dust filtering method of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
FIG. 1 is a schematic view of top and bottom surface dust and defects in a panel;
FIG. 2 is a schematic diagram showing the comparison of the imaging effect of dust and real defects in an image;
FIG. 3 is a schematic view of the panel dust filtering method of the present invention. The method comprises the following steps:
step S1, detecting the panel defects, obtaining the position data and the characteristic data of the panel defects, and obtaining the historical defect information of the panel;
step S2, filtering the dust on the upper surface of the current detection panel; judging whether the defects detected by the current detection panel are dust on the lower surface or not according to historical defect information of the panel, and filtering the dust;
in step S3, the defect judgment data of the currently detected panel is updated to the panel history defect information.
Further, in step S2, according to the historical defect information of the panel, determining whether the defect detected by the currently detected panel is the bottom surface dust includes:
step S21, judging whether the detected defect is a dark spot or a dark spot, if so, entering S22, and if not, judging that the defect is non-dust;
step S22, counting the number of the detected defects in the current panel detection picture, if the number is equal to 3 or more than 3, entering S23, otherwise, judging the defect is non-dust;
step S23, judging whether the detected defects have defects with similar positions and the same pictures in the historical defect information, if so, entering S24, otherwise, judging the defects are non-dust;
step S24, judging whether the difference characteristic values of the detected defect and the defect with the same position and the same picture in the historical defect information in the aspects of contrast, area and shape are all smaller than a threshold value, if so, entering step S25, otherwise, judging that the defect is non-dust;
step S25, mark the defect as a lower surface dust.
Further, after step S3, the method further includes: the method for correcting the historical defect information of the panel comprises the following specific steps:
and using the defect data of the N + M panels as panel history defect information, judging the defect of the nth panel, and correcting the defect data of the nth panel in the panel history defect information, wherein N > is 1, 1< (N) > is N, and M > 1.
The specific embodiment is as follows:
the panel dust filtering method comprises the following steps:
step 1: and detecting the defects of all the pictures to be detected on the panel N entering the assembly line. The detected frames include, but are not limited to, R255, G255, B255, L0, L48, L127, L255, and the like. The detected pictures are increased or decreased according to the requirements.
The terms R255, G255, B255, L0, L48, L127, L255 are explained as follows:
red (R), green (G) and blue (B) are three primary colors, the adjusting ranges are 0-255 respectively, and different values are set for RGB respectively so as to match different pictures.
R255: monochrome red, with a red value of 255, RGB (255,0,0) picture;
g255: monochrome green, and the value of green is 255, RGB (0,255,0) picture;
b255: monochrome blue, and the value of blue is 255, RGB (0, 255) picture;
l0: black, RGB values are all 0;
l48: 48 gray scale pictures, wherein the RGB values are all 48, and the RGB (48,48,48) pictures are obtained; l127, L255 are similar to L48, L127 is RGB (127,127,127) picture; l255 is an RGB (255 ) picture.
The detection screens are divided into R255, G255, B255, L0, L48, L127, L255, and the like.
Step 2, filtering dust on the upper surface of the detected defect; judging whether dust exists in a current panel N according to historical defect information, and filtering, wherein N > is 1;
the detailed step of judging whether each defect detected on the lower surface of the current detection panel is dust or not according to historical defect information of the panel is as follows:
step 21, judging whether the detected defect is a dark spot or a dark spot, if so, entering S22, and if not, judging that the defect is non-dust;
step 22, counting the number of the pictures in which the detected defects appear in the current panel detection picture, and whether the number of the pictures is equal to 3 or greater than 3, that is, counting the number of the pictures in which each defect detected by the current panel appears in the current panel detection picture, and whether the number of the pictures is equal to 3 or greater than 3, more specifically, means: when the panel is normally detected to be defective, the detected pictures are pictures such as R255, G255, B255, L0, L48, L127, L255 and the like, the number of each detected defect appearing in the detected pictures is counted, whether the detected defects are dust or not is further judged according to the number, whether the detected defects are equal to or more than 3 or not is judged, if yes, S23 is carried out, otherwise, the detected defects are judged to be non-dust;
step 23, judging whether the detected defects have defects with similar positions and the same pictures in the historical defect information, if so, entering S24, otherwise, judging that the defects are non-dust;
step 24, judging whether the difference characteristic values of the detected defect and the defect with the same position and the same picture in the historical defect information in the aspects of contrast, area and shape are all smaller than a threshold value, if so, entering step 25, otherwise, judging that the defect is non-dust;
step 25, marking the defect as lower surface dust.
And step 3: and updating and saving historical defect information.
In another aspect, the present invention provides a panel dust filtering apparatus, the apparatus comprising:
the panel historical defect information acquisition unit is used for detecting the defects of the panel, acquiring position data and characteristic data of the panel defects and obtaining panel historical defect information;
the dust filtering unit is used for filtering dust on the upper surface of the current detection panel; judging whether the defects detected by the current detection panel are dust on the lower surface or not according to historical defect information of the panel, and filtering the dust;
and the panel historical defect information updating unit is used for updating the defect judgment data of the currently detected panel to the panel historical defect information.
Further, the dust filtering unit includes:
a dust determination unit for:
judging whether the detected defect is a dark spot or a dark spot;
counting the number of the detected defects in the current panel detection picture, wherein the number of the detected defects in the current panel detection picture is 3 or more than 3;
judging whether the detected defects have defects with similar positions and the same pictures in historical defect information;
judging whether the difference characteristic values of the detected defect and the defect with the same picture at the similar position in the historical defect information are all smaller than a threshold value or not;
the defect is marked as lower surface dust.
Further, the apparatus further comprises: a panel history defect information correcting unit for: and using the defect data of the N + M panels as panel history defect information, judging the defect of the nth panel, and correcting the defect data of the nth panel in the panel history defect information, wherein N > is 1, 1< (N) > is N, and M > 1.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (6)
1. A panel dust filtering method, comprising the steps of:
step S1, detecting the defects of the N + M panels, acquiring position data and characteristic data of the panel defects to obtain historical defect information of the panel, wherein N > is 1, M >1, and the panel is in a black-bottom liquid crystal screen mode;
step S2, filtering the dust on the upper surface of the current nth detection panel; judging whether the defect detected by the current nth detection panel is dust on the lower surface or not according to historical defect information of the panel, and filtering the dust, wherein 1< ═ N < ═ N;
in step S3, the defect judgment data of the currently detected panel is updated to the panel history defect information.
2. The method for filtering panel dust according to claim 1, wherein in step S2, the determining whether the defect detected by the currently detected panel is the lower surface dust according to the panel history defect information specifically includes:
step S21, judging whether the detected defect is a dark spot or a dark spot, if so, entering S22, and if not, judging that the defect is non-dust;
step S22, counting the number of the detected defects in the current panel detection picture, if the number is equal to 3 or more than 3, entering S23, otherwise, judging the defect is non-dust;
step S23, judging whether the detected defects have defects with similar positions and the same pictures in the historical defect information, if so, entering S24, otherwise, judging the defects are non-dust;
step S24, judging whether the difference characteristic values of the detected defect and the defect with the same position and the same picture in the historical defect information in the aspects of contrast, area and shape are all smaller than a threshold value, if so, entering step S25, otherwise, judging that the defect is non-dust;
step S25, mark the defect as a lower surface dust.
3. The panel dust filtering method of claim 1, wherein after the step S3, the method further comprises: the method for correcting the historical defect information of the panel comprises the following specific steps:
and judging the defect of the nth panel by using the defect data of the N + M panels as panel historical defect information, and correcting the defect data of the nth panel in the panel historical defect information.
4. A panel dust filter apparatus, comprising:
the panel historical defect information acquisition unit is used for carrying out defect detection on the N + M panels, acquiring position data and characteristic data of panel defects and obtaining panel historical defect information, wherein the panel is in a black-bottom liquid crystal display mode;
the dust filtering unit is used for filtering dust on the upper surface of the current nth detection panel; judging whether the defect detected by the current nth detection panel is dust on the lower surface or not according to historical defect information of the panel, and filtering the dust, wherein 1< ═ N < ═ N;
and the panel historical defect information updating unit is used for updating the defect judgment data of the currently detected panel to the panel historical defect information.
5. The panel dust filtering apparatus of claim 4, wherein the dust filtering unit comprises:
a dust determination unit for:
judging whether the detected defect is a dark spot or a dark spot;
counting the number of the detected defects in the current panel detection picture, wherein the number of the detected defects in the current panel detection picture is 3 or more than 3;
judging whether the detected defects have defects with similar positions and the same pictures in historical defect information;
judging whether the difference characteristic values of the detected defect and the defect with the same picture at the similar position in the historical defect information are all smaller than a threshold value or not;
the defect is marked as lower surface dust.
6. The panel dust filter apparatus of claim 4, further comprising: a panel history defect information correcting unit for: and judging the defect of the nth panel by using the defect data of the N + M panels as panel historical defect information, and correcting the defect data of the nth panel in the panel historical defect information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710343204.9A CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710343204.9A CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107219229A CN107219229A (en) | 2017-09-29 |
| CN107219229B true CN107219229B (en) | 2020-07-03 |
Family
ID=59945071
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710343204.9A Active CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107219229B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108109136A (en) * | 2017-12-12 | 2018-06-01 | 武汉精测电子集团股份有限公司 | Surface dirt fast filtering method and device in a kind of panel detection |
| CN108414535B (en) * | 2018-01-25 | 2021-03-16 | 武汉精测电子集团股份有限公司 | Method for judging white point Mura defect and Cell foreign body halo open defect of LCD |
| CN109900723A (en) * | 2019-04-26 | 2019-06-18 | 李配灯 | Glass surface defects detection method and device |
| CN110108713A (en) * | 2019-04-26 | 2019-08-09 | 武汉精立电子技术有限公司 | A kind of Superficial Foreign Body defect fast filtering method and system |
| CN110880171A (en) * | 2019-10-30 | 2020-03-13 | 联想(北京)有限公司 | Detection method of display device and electronic equipment |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105806850A (en) * | 2016-03-10 | 2016-07-27 | 惠州高视科技有限公司 | LCD (Liquid Crystal Display) glass defect detection device and LCD (Liquid Crystal Display) glass defect detection method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07190942A (en) * | 1993-12-24 | 1995-07-28 | Nec Corp | Equipment for inspecting dust particle on mirror surface |
| JP5112748B2 (en) * | 2007-05-30 | 2013-01-09 | 株式会社日本マイクロニクス | Liquid crystal panel inspection method and apparatus |
| CN104359917A (en) * | 2014-11-18 | 2015-02-18 | 北京凌云光技术有限责任公司 | Method and device for detecting internal dust of liquid crystal screen |
| CN106556607B (en) * | 2015-09-30 | 2019-10-08 | 苍南县三维电子塑胶有限公司 | Identify the device and method of panel surface dust |
-
2017
- 2017-05-16 CN CN201710343204.9A patent/CN107219229B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105806850A (en) * | 2016-03-10 | 2016-07-27 | 惠州高视科技有限公司 | LCD (Liquid Crystal Display) glass defect detection device and LCD (Liquid Crystal Display) glass defect detection method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107219229A (en) | 2017-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107219229B (en) | Panel dust filtering method and device | |
| CN109752394B (en) | High-precision detection method and system for defects of display screen | |
| CN102279189B (en) | Defect detecting device, defect restoring device and defect detecting method | |
| CN109471276B (en) | Method and device for detecting color cast defect of liquid crystal display | |
| CN104749184A (en) | Automatic optical detection method and automatic optical detection system | |
| US9805458B2 (en) | Method and system for detecting defective pixels and screen imperfections of a mobile device | |
| US20070263101A1 (en) | Flicker frequency detection method and related device | |
| JP2005331929A5 (en) | ||
| CN111127810A (en) | Automatic alarming method and system for open fire of machine room | |
| JP2014164221A (en) | Defect detection method for display panel and defect detection device for display panel | |
| KR102142654B1 (en) | Picture quality testing apparatus and method of display device | |
| JP2009229197A (en) | Linear defect detecting method and device | |
| CN112666178B (en) | Outdoor LED large-screen dead pixel online monitoring method | |
| CN116721039B (en) | Image preprocessing method applied to automatic optical defect detection | |
| CN111179795B (en) | Display panel detection method and device | |
| CN107545556B (en) | Signal lamp image processing method and system | |
| CN108965749A (en) | Defect pixel detection and means for correcting and method based on texture recognition | |
| CN108663371B (en) | Method and system for detecting dust and foreign matters on display panel | |
| CN113554583A (en) | Detection method and detection system for display panel | |
| JP3695120B2 (en) | Defect inspection method | |
| CN111474748A (en) | Machine vision inspection method and system for large-size L CD display module | |
| CN108414535B (en) | Method for judging white point Mura defect and Cell foreign body halo open defect of LCD | |
| CN114693656B (en) | Detection method for display defects of LED display screen, camera and calibration method for optical filter | |
| CN111238777A (en) | Display screen lighting defect detection method based on deep learning | |
| JP2020160510A (en) | Signal light display determination device, signal light display determination method and program |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant before: Wuhan Jingce Electronic Technology Co., Ltd. |
|
| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |