CN107182275B - A kind of reliability improved method of space electronic equipment under change working environment - Google Patents
A kind of reliability improved method of space electronic equipment under change working environmentInfo
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- CN107182275B CN107182275B CN201110014964.8A CN201110014964A CN107182275B CN 107182275 B CN107182275 B CN 107182275B CN 201110014964 A CN201110014964 A CN 201110014964A CN 107182275 B CN107182275 B CN 107182275B
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- 230000011218 segmentation Effects 0.000 claims 1
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Abstract
A kind of reliability improved method of the present invention for space electronic equipment under change working environment, belong to technical field of electronic products, the problem of solving space electronic equipment reliability prediction result be inaccurate under cyclically-varying operating ambient temperature, environment temperature is carried out etc. into step first to split, calculate the reliability of the corresponding period at a temperature of each step respectively again, then a cycle and the reliability of whole end of lifetime are calculated, improved Reliability Index calculation formula is finally provided.
Description
Technical field
The present invention relates to a kind of reliability improved method of space electronic equipment under change working environment, especially for space electricity
The cyclically-varying feature of sub- equipment operating ambient temperature, belongs to technical field of electronic products.
Background technology
Reliability prediction is the work in order to estimate reliability of the product under given condition of work and carry out.It is according to composition system
Element, the reliability of part and subsystem carry out the reliability of hypothetical system.This be one by locally to it is overall, ascending,
Process from down to up, is a kind of process of synthesis.Its main purpose has：(1) by intended result and the reliability index of requirement
Compare, whether the reliability index proposed in review of design charter reaches.(2) in definition stage, reliability is passed through
, it is expected that the relativity of result carries out project plan comparison on the estimation, choose the best alternatives.(3) in the design phase, by, it is expected that
It was found that weak link and potential risk in design, are improved.(4) it is reliability growth test, qualification test and expense core
Research in terms of calculation provides foundation.(5) laid the foundation by estimated to Reliability Distribution.From the purpose of above reliability prediction
It can be seen that seeming most important there is provided the accurate reliability prediction result of product.For electronic product, reliability prediction is led to
It is often the reliability for calculating product.
As electronic product, space electronic equipment carries out reliability prediction using Stress Analysis Method, and the stress value during its work should
It could be calculated when constant according to Reliability Index formula, actual conditions are more to be：Electric stress value during the work of space electronic equipment
It is constant, Environmental stress value is in change, and with the cyclically-varying of spacecraft attitude, orbital position, space electronic equipment is subjected to
Environmental stress be also presented periodic change, the working environment to produce material impact to the in-orbit reliability of space electronic equipment especially
The cyclically-varying of temperature is distinguishing feature.When space electronic equipment carries out reliability prediction using Stress Analysis Method, current state
The passing method of inside and outside space industry is：Electric stress takes its actual value due to constant, and operating ambient temperature takes it due to change
Maximum, also takes its maximum by operating ambient temperature and is considered as constant temperature.Obviously, the reliability prediction result so obtained is not
Accurately, it is very conservative, or even do not reach the purpose of reliability prediction, especially when the excursion of operating ambient temperature is very big, adopt
It is even more apparent with the defect of this method.Accordingly, it would be desirable to seek more science method for predicting reliability and base this be more defined
True reliability prediction result.
The content of the invention
The invention aims to solve space electronic equipment under cyclically-varying operating ambient temperature, reliability prediction result is not
Accurate the problem of, the defect for existing method proposes a kind of reliability improvement side of space electronic equipment under change working environment
Method.
The purpose of the present invention is achieved through the following technical solutions.
A kind of reliability improved method of space electronic equipment under change working environment, the step point such as carries out by environment temperature first
Cut, then calculate the reliability of the corresponding period at a temperature of each step respectively, then calculate a cycle and whole end of lifetime
Reliability, finally provide improved Reliability Index calculation formula.
Wherein change operating ambient temperature is split according to steps such as T=5 DEG C of progress of Δ.
The operating ambient temperature of space electronic equipment is wherein divided into 3 classes：It is constant type, triangle wave mode, combined, wherein
Corresponding period at a temperature of the reliability R of space electronic equipment under constant type operating ambient temperature, i.e., each step
Formula of reliability is：
Wherein λOIt is correspondence constant operation environment temperature TOWork tentative idea, t is the working time；
The reliability R of space electronic equipment under triangle wave mode operating ambient temperature, i.e. the formula of reliability of a cycle is：
Wherein triangle wave mode operating ambient temperature was represented within a repetition period, and operating ambient temperature edge ramps TUAfterwards,
Drop to T along straight line againL, or operating ambient temperature drops to T along straight lineLAfterwards, and along ramping TU, wherein TU、TLPoint
It is not upper limit operation environment temperature, lower limit operating ambient temperature, tcIt is the time that operating ambient temperature changes a cycle；λi
It is correspondence operating ambient temperature Ti=TL+ n Δs T work tentative idea, n is step number, n=1,2 ..., (TU-TL）/ΔT；
Δ T is step temperature, takes T=5 DEG C of Δ；As n=1, T1=TL+5℃；As n=2, T2=TL+10℃；…；As n=(TU-TL）/
During Δ T, Tn=TU；T is the working time；
The reliability R of space electronic equipment under combined operating ambient temperature, i.e. the formula of reliability of end of lifetime is：
Wherein combined operating ambient temperature represents that within a repetition period operating ambient temperature is by constant type operating ambient temperature
With triangle wave mode operating ambient temperature composition, wherein TU、TLIt is upper limit operation environment temperature, lower limit operating ambient temperature respectively,
t0For the time of constant operation environment temperature in a cycle, tcTo change the time of operating ambient temperature in a cycle；(t0+tc)
Change the time of a cycle for operating ambient temperature；λOIt is correspondence constant operation environment temperature TLWork tentative idea, λiIt is
Correspondence operating ambient temperature Ti=TL+ n Δs T work tentative idea, n is step number, n=1,2 ..., (TU-TL)/ΔT；ΔT
It is step temperature, takes T=5 DEG C of Δ；As n=1, TI=TL+5℃；As n=2, T2=TL+10℃；…；As n=(TU-TL）/
During Δ T, Tn=TU；T is the working time；
Above-mentioned TO、TU、TLIt is 5 DEG C of integral multiple.
Beneficial effects of the present invention：
1) the step dividing method such as use calculates the reliability of space electronic equipment under change operating ambient temperature, due to step temperature
Small, step number is more, and the reliability result because obtained from is more accurate than existing algorithm；
2) the reliability result obtained due to innovatory algorithm is more accurate, thus can more reach many purposes of reliability prediction；
3) innovatory algorithm for it is accurate estimated and judge space electronic equipment and space electronic equipment account for the spacecraft of very big proportion
Reliability of rail end of lifetime etc. provides an important channel, can substitute existing algorithm and be promoted in space industry；
4) innovatory algorithm can be promoted the use of in the reliability prediction work of the electronic equipment at a temperature of more generally changing environment.
Brief description of the drawings
Fig. 1 (a) is the constant type operating ambient temperature figure of space electronic equipment；
Fig. 1 (b) is space electronic equipment triangle wave mode operating ambient temperature figure；
Fig. 1 (c) is the combined operating ambient temperature figure of space electronic equipment；
Embodiment
With reference to embodiment, the present invention will be further described.
Contrast equation (1), formula (2), formula (3) are as can be seen that as t in formula (3)cWhen=0, then formula (3)
It is changed into formula (1)；As t in formula (3)0When=0, then formula (3) is changed into formula (2)；It can thus be appreciated that formula (1), public affairs
Formula (2) is the special case of formula (3), and formula (3) has more covering property, thus is said by taking the application of formula (3) as an example
It is bright.
DC-DC (DC-to-dc) converter is a kind of electronic equipment that geostationary orbit telecommunication satellite is supplied in distribution subsystem,
Its in-orbit period continuously works, shown in operating ambient temperature curve such as Fig. 1 (c), wherein t0=4380h, tc=4380h, t=131400h,
TU=70 DEG C, TL=0 DEG C, the reliability calculating of its end of lifetime is concretely comprised the following steps：
1) change operating ambient temperature is split according to steps such as T=5 DEG C of progress of Δ, step number n=(TU-TL)/Δ T=(70-0) DEG C
/ 5 DEG C=14；
2) reliability calculating is carried out using Stress Analysis Method, obtains step number (n)-operating ambient temperature of DC-DC converter
(Ti)-work tentative idea (λi) corresponding relation between numerical value, it is shown in Table 1；
Step number-operating ambient temperature-operational failure rate score of the DC-DC converter of table 1
The explanation of table 1：
Note 1：N0 represents not split, and is now constant operation environment temperature.
Note 2：GJB/Z 299C-2006, MIL-HDBK-217F are GJB/Z 299C-2006 respectively, and reliability of electronic equipment is estimated in volume [S] Beijing：Army of General Armament Department
Mark an edition distribution department, 2006 and MIL-HDBK-217F, Reliability Prediction of Electronic Equipment [S] .Department of Defense,
WashingtonD.C., USA, 1991.
Note 3：Fit (Fitow) represents the concept of crash rate, and it is meant that 1Fit=1 × 10-9/ h, i.e., 103Individual device work 106H, wherein there is 1 failure.
3) data substituted into table 1, then
4) above given data is substituted into formula (3), obtains the reliability of DC-DC converter end of lifetime：
In summary, presently preferred embodiments of the present invention is these are only, is not intended to limit the scope of the present invention.It is all
Within the spirit and principles in the present invention, any modification, equivalent substitution and improvements made etc. should be included in the protection of the present invention
Within the scope of.
Claims (1)
1. a kind of reliability improved method of space electronic equipment under change working environment, it is characterised in that：First by environment temperature
Degree such as carries out at the step segmentation, then calculates the reliability of the corresponding period at a temperature of each step respectively, then calculates a cycle
With the reliability of whole end of lifetime, improved Reliability Index calculation formula is finally provided, wherein by the work of space electronic equipment
It is divided into 3 classes as environment temperature：It is constant type, triangle wave mode, combined；Space electronic under wherein constant type operating ambient temperature
The formula of reliability of corresponding period at a temperature of the reliability R of equipment, i.e., each step is：
<mrow>
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<mo>-</mo>
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<mo>(</mo>
<mn>1</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein λ0It is correspondence constant operation environment temperature T0Work tentative idea, t is the working time；
The reliability R of space electronic equipment under triangle wave mode operating ambient temperature, i.e. the formula of reliability of a cycle is：
<mrow>
<mi>R</mi>
<mo>=</mo>
<msup>
<mi>e</mi>
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Wherein triangle wave mode operating ambient temperature was represented within a repetition period, and operating ambient temperature edge ramps TUAfterwards,
Drop to T along straight line againL, or operating ambient temperature drops to T along straight lineLAfterwards, and along ramping TU, wherein TU、T1Point
It is not upper limit operation environment temperature, lower limit operating ambient temperature, tcIt is the time that operating ambient temperature changes a cycle；λi
It is correspondence operating ambient temperature Ti=TL+ i Δs T work tentative idea, i is step number, i=1,2 ..., n；N=(TU-TL)/
ΔT；Δ T is step temperature, takes T=5 DEG C of Δ；As i=1, T1=TL+5℃；As i=2, T2=TL+10℃；…；As i=n=(TU
-TLDuring)/Δ T, Tn=TL；
The reliability R of space electronic equipment under combined operating ambient temperature, i.e. the formula of reliability of end of lifetime is：
<mrow>
<mi>R</mi>
<mo>=</mo>
<msup>
<mi>e</mi>
<mrow>
<mo>-</mo>
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<mo>(</mo>
<mn>3</mn>
<mo>)</mo>
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Wherein combined operating ambient temperature represents that within a repetition period operating ambient temperature is by constant type operating ambient temperature
With triangle wave mode operating ambient temperature composition, wherein TU、TLIt is upper limit operation environment temperature, lower limit operating ambient temperature respectively,
t0For the time of constant operation environment temperature in a cycle, tcTo change the time of operating ambient temperature in a cycle；(t0+tc)
Change the time of a cycle for operating ambient temperature；λoIt is that the constant fourth of correspondence makees environment temperature T0Work tentative idea, λiIt is
Correspondence operating ambient temperature Ti=TL+ i Δs T work tentative idea, i is step number, i=1,2 ..., n；N=(TU-TL)/ΔT；
Δ T is step temperature, takes T=5 DEG C of Δ；As i=1, T1=TL+5℃；As i=2, T2=TL+10℃；…；As i=n=(TU-TL)/
During Δ T, Tn=TL；Above-mentioned T0、TU、TLIt is 5 DEG C of integral multiple.
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107182275B true CN107182275B (en) | 2014-08-13 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581125A (en) * | 2018-12-25 | 2019-04-05 | 北京金风科创风电设备有限公司 | Method and device for detecting service life of power module of wind power converter and storage medium |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581125A (en) * | 2018-12-25 | 2019-04-05 | 北京金风科创风电设备有限公司 | Method and device for detecting service life of power module of wind power converter and storage medium |
| CN109581125B (en) * | 2018-12-25 | 2021-01-22 | 北京金风科创风电设备有限公司 | Method and device for detecting service life of power module of wind power converter and storage medium |
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