CN107167392A - A kind of deposition tube nano wire fatigue limit measurement apparatus and method - Google Patents
A kind of deposition tube nano wire fatigue limit measurement apparatus and method Download PDFInfo
- Publication number
- CN107167392A CN107167392A CN201710317456.4A CN201710317456A CN107167392A CN 107167392 A CN107167392 A CN 107167392A CN 201710317456 A CN201710317456 A CN 201710317456A CN 107167392 A CN107167392 A CN 107167392A
- Authority
- CN
- China
- Prior art keywords
- nano wire
- deposition tube
- wire
- tube nano
- gold electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/32—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
- G01N3/38—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces generated by electromagnetic means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0073—Fatigue
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0278—Thin specimens
- G01N2203/028—One dimensional, e.g. filaments, wires, ropes or cables
Abstract
The present invention relates to a kind of deposition tube nano wire fatigue limit measurement apparatus and method.It is characterized in that：Described deposition tube nano wire is connected with oildag, described oildag is bonded in graphite, described graphite is connected with tungsten seat, described tungsten seat is connected by wire with AC power, described AC power is connected by wire with resistance, described resistance is connected by wire with gold electrode, described gold electrode is connected with the earth, described gold electrode is connected with crossbeam, described crossbeam two ends are connected with baffle plate respectively, and the dead astern of gap is mounted with CCD camera between described deposition tube nano wire and gold electrode.
Description
Technical field
The present invention relates to deposition tube nano wire field and fatigue limit fields of measurement, more particularly to a kind of semiconductor
Piezoelectric nanowire fatigue limit measurement apparatus and method.
Background technology
The present invention relates to a kind of deposition tube nano wire fatigue limit measurement apparatus and method.Current deposition tube is received
Rice noodles are widely applied on nano generator, and the electricity generating principle of nano generator is exactly the pressure by deposition tube nano wire
Mechanical energy is converted into electric energy by electrical characteristics, then by the characteristic of semiconductor of deposition tube nano wire by electrical power storage in nano wire
It is interior to be taken out so as in good time.
Generating efficiency and life-span immediate cause on nano generator are the size for bearing alternate load of nano wire
With the fatigue limit of the upper limit of number of times, i.e. nano wire.And the measuring method now concerning the fatigue limit of nano wire also rarely has report
Road.Gained enlightenment by electron gun principle, make the gold electrode and deposition tube nano wire of electron gun close to each other, in gold electrode two
Side makes electronics to the intensive release of semiconductor nanowires plus baffle plate, and deposition tube nano wire is promoted repeatedly under exchange electro ultrafiltration
Tension and compression.
The content of the invention
The present invention devises a kind of deposition tube nano wire fatigue limit measurement apparatus and method.
The technical scheme of the present invention that solves the problems, such as is：
A kind of deposition tube nano wire fatigue limit measurement apparatus, its composition includes：Deposition tube nano wire, its feature
It is：Described deposition tube nano wire is connected with oildag, and described oildag is bonded in graphite, described graphite with
Tungsten seat connection, described tungsten seat is connected by wire with AC power, and described AC power is connected by wire with resistance, institute
The resistance stated is connected by wire with gold electrode, and described gold electrode is connected with the earth, and described gold electrode is connected with crossbeam, institute
The crossbeam two ends stated are connected with baffle plate respectively, the dead astern placement of gap between described deposition tube nano wire and gold electrode
There is CCD camera, and this method is implemented in vacuum environment.
Beneficial effect：
1. the present invention can control the hunting frequency of semiconductor nanowires by controlling alternating current voltage frequency, and obtain nano wire
Really fixed pendulum dynamic frequency.
2. CCD camera is mounted with nano wire amplitude of fluctuation maximum in the present invention, to record the pendulum of nano wire
Dynamic amplitude.
3. nano wire is connected with tungsten seat by graphite and oildag in the present invention, so can fix different chis in graphite
Very little nano wire.
Brief description of the drawings：
Accompanying drawing 1 is the structural representation of the present invention.
In figure：1- deposition tube nano wires, 2- tungsten seat, 3- graphites, 4- wires, 5- AC powers, 6- resistance, 7-
Greatly, 8- gold electrodes, 9- crossbeams, 10,11- baffle plates, 12-CCD cameras.
Embodiment：
Embodiment 1：
A kind of deposition tube nano wire fatigue limit measurement apparatus, its composition includes：Deposition tube nano wire, its feature
It is：Described deposition tube nano wire 1 is connected with oildag, and described oildag is bonded in graphite 3, described graphite
It is connected with tungsten seat 2, described tungsten seat 2 is connected by wire 4 with AC power 5, and described AC power 5 passes through wire 4 and electricity
Resistance 6 is connected, and described resistance 6 is connected by wire 4 with gold electrode 8, and described gold electrode 8 is connected with the earth 7, described gold electricity
Pole 8 is connected with crossbeam 9, and the described two ends of crossbeam 9 are connected with baffle plate 10,11 respectively, described deposition tube nano wire and gold
Dead astern at inter-electrode gap is mounted with CCD camera 12, and this method is implemented in vacuum environment.
Claims (2)
1. a kind of deposition tube nano wire fatigue limit measurement apparatus, its composition includes：Deposition tube nano wire, its feature
It is：Described deposition tube nano wire is connected with oildag, and described oildag is bonded in graphite, described graphite with
Tungsten seat connection, described tungsten seat is connected by wire with AC power, and described AC power is connected by wire with resistance, institute
The resistance stated is connected by wire with gold electrode, and described gold electrode is connected with the earth, and described gold electrode is connected with crossbeam, institute
The crossbeam two ends stated are connected with baffle plate respectively, the dead astern placement of gap between described deposition tube nano wire and gold electrode
There is CCD camera.
2. a kind of a kind of method of deposition tube nano wire fatigue limit measurement apparatus described in utilization claim 1, it is special
Levying is：Deposition tube nano wire and gold electrode discharge in the presence of alternating voltage, in exchange electro ultrafiltration lower semiconductor piezoelectricity
Nano wire is swung, so that the electric current for flowing through deposition tube nano wire is passed through, and this method is implemented in vacuum ring
In border.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710317456.4A CN107167392A (en) | 2017-05-08 | 2017-05-08 | A kind of deposition tube nano wire fatigue limit measurement apparatus and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710317456.4A CN107167392A (en) | 2017-05-08 | 2017-05-08 | A kind of deposition tube nano wire fatigue limit measurement apparatus and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107167392A true CN107167392A (en) | 2017-09-15 |
Family
ID=59813152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710317456.4A Pending CN107167392A (en) | 2017-05-08 | 2017-05-08 | A kind of deposition tube nano wire fatigue limit measurement apparatus and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107167392A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1588024A (en) * | 2004-07-19 | 2005-03-02 | 中国科学院物理研究所 | Method for measuring single linear nanometerial Young's modulus |
| CN101482473A (en) * | 2009-02-13 | 2009-07-15 | 清华大学 | Method for accurately measuring Young's modulus of nano wire |
| US7719278B2 (en) * | 2005-10-18 | 2010-05-18 | Tursiop Technologies Llc | Method and apparatus for high-gain magnetic resonance imaging |
-
2017
- 2017-05-08 CN CN201710317456.4A patent/CN107167392A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1588024A (en) * | 2004-07-19 | 2005-03-02 | 中国科学院物理研究所 | Method for measuring single linear nanometerial Young's modulus |
| US7719278B2 (en) * | 2005-10-18 | 2010-05-18 | Tursiop Technologies Llc | Method and apparatus for high-gain magnetic resonance imaging |
| CN101482473A (en) * | 2009-02-13 | 2009-07-15 | 清华大学 | Method for accurately measuring Young's modulus of nano wire |
Non-Patent Citations (1)
| Title |
|---|
| LIFEN WANG,ET AL.: "Dynamic nanomechanics of zinc oxide nanowires", 《APPLIED PHYSICS LETTERS》 * |
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| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20170915 |
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| WD01 | Invention patent application deemed withdrawn after publication |