CN107152971B - A method of improving linear array infrared exoelectron enlarged drawing level detail resolution ratio - Google Patents
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- CN107152971B CN107152971B CN201710304316.3A CN201710304316A CN107152971B CN 107152971 B CN107152971 B CN 107152971B CN 201710304316 A CN201710304316 A CN 201710304316A CN 107152971 B CN107152971 B CN 107152971B
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention discloses a kind of methods for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, method includes the following steps: S1, acquisition infrared image, electronics is carried out to it to amplify to obtain enlarged drawing, the horizontal effective viewing field of optical system, and then the respective scanned range of calculating optical scanning pendulum len are determined according to enlarged drawing；The scanning speed of optical scanner pendulum mirror is calculated in conjunction with the corresponding scanning field frequency of infrared image in S2, the scanning range that mirror is put according to optical scanner；S3, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, carry out parity field mixed sweep according to column period control optical scanner pendulum mirror, and the image that scanning obtains is synthesized under time delay integration image-forming mechanism.The present invention improves linear array infrared exoelectron enlarged drawing level detail resolution ratio, and picture frame frequency is constant, and the visual effect of image has been effectively ensured.
Description
Technical field
The present invention relates to infrared imaging and technical field of image processing more particularly to a kind of raising linear array infrared exoelectron to amplify
The method of image level detail resolution.
Background technique
Infrared imagery technique is novel high-tech all highly useful to the arms and services at present, has extremely strong anti-interference energy
Power, and various radiation will not be generated in operation, good concealment and survival ability is strong.Due to its specific advantage, it is infrared at
As technology will play very huge effect in military combat.
Currently due to infrared focal plane array manufacture craft and quantum efficiency the problems such as, high density, small pixel size it is red
The production of outer focal plane device still has certain difficulty, and expensive, therefore is directed to linear array infrared detector scanning imagery,
It proposes a kind of electronics amplification method, effectively improves the detail resolution of image.
The method that tradition improves linear array infrared image level detail resolution ratio is to improve optical scanner pendulum mirror in the horizontal direction
Scanning speed, the method by increasing sampled point within the unit time improves image resolution ratio, but the method does not consider line
Array infrared detector can blur-free imaging and export image frame frequency problem.
For example: current 288 × 4 linear array infrared detector scanning imagery, output picture frame frequency are 50Hz.For 288
For × 4 Long Wave Infrared Probes, using the operating mode of TDI (time delay integration).288 × 4 Long Wave Infrared Probe level sides
4 upward pixels just have a TDI stage, and the output of each photovoltaic cell is sent to their corresponding TDI stages respectively；For
For 288 × 4 Long Wave Infrared Probes, TDI is equivalent to 10 grades of registers, has three-level register respectively to first three pixel
It corresponds, the last one pixel has level-one register to correspond.This requires external synchronization signal and scanning speeds
Just spatial position must can be made to be aligned completely with the column frequency stringent synchronization of detector.Pixel domain location matches and pixel are arranged
Sequence technology is the key that can linear array infrared sensor at clear image.If improving scanning speed ν, column frequency cannot be strictly same
Step, will lead to linear array infrared detector image blur；Scanning speed improves, then column cycle TColumnReduce, so as to cause output image
Frame frequency increase.Currently used TDI mode, the frequency that 288 × 4 linear array infrared detector scanning imageries export image are
50Hz is that the standard analog video of infrared image exports.Under existing image-forming mechanism and technical conditions, export the frame frequency of image without
Method improves and is unsatisfactory for standard analog video output improving and requires.
Summary of the invention
The technical problem to be solved in the present invention is that can not have been improved and i.e. for the frame frequency for exporting image in the prior art
Make to improve and be also unsatisfactory for the defect that standard analog video output requires, it is horizontal to provide a kind of raising linear array infrared exoelectron enlarged drawing
The method of detail resolution.
The technical solution adopted by the present invention to solve the technical problems is:
The present invention provides a kind of method for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, including mutually interconnects
Optical system, optical scanner pendulum mirror and linear array infrared detector, the infra-red radiation of determinand connect is projected by optical system
Optical scanner is put on mirror, and optical scanner puts mirror and carries out reciprocating swing according to certain frequency, by the full filed continuous decomposition of determinand
Scanning, is incident upon on linear array infrared detector, method includes the following steps:
S1, infrared image is obtained, electronics is carried out to it and amplifies to obtain enlarged drawing, optical system is determined according to enlarged drawing
Horizontal effective viewing field, and then the respective scanned range of calculating optical scanning pendulum len；
S2, optics is calculated in conjunction with the corresponding scanning field frequency of infrared image according to the scanning range that mirror is put in optical scanner
The scanning speed of scanning pendulum len；
S3, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, according to the control of column period
Optical scanner pendulum mirror processed carries out parity field mixed sweep, and the image that scanning obtains is closed under time delay integration image-forming mechanism
At, obtain level detail resolution ratio improve after image.
Further, the amplification factor for carrying out electronics amplification to infrared image in step S1 of the invention is 2 times.
Further, in step S1 of the invention optical scanner pendulum scarnning mirror range calculation method are as follows:
The pixel of infrared image is a × b, and the corresponding horizontal effective viewing field of infrared image is FOV, and infrared image is corresponding to be swept
Retouching range is a；
It is directly proportional to horizontal effective viewing field according to horizontal pixel, and horizontal effective viewing field is directly proportional to scanning range, obtains:
The horizontal effective viewing field of enlarged drawing is FOV/2, and the corresponding scanning range of enlarged drawing is a/2.
Further, in step S2 of the invention optical scanner pendulum mirror scanning speed calculation method are as follows:
The pixel of infrared image is a × b, and scanning range a, scanning field frequency is F?, the scanning speed of optical scanner pendulum mirror
Are as follows: v0=a*F?；
The scanning range of enlarged drawing is a/2, keeps the scanning speed of optical scanner pendulum mirror constant, it may be assumed that v1=v0=(a/
2)*2F?, the scanning field frequency of enlarged drawing is 2F at this time?。
Further, the column period is calculated in step S3 of the invention, carries out Odd and even field scan and image synthetic method are as follows:
S31, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, calculation formula are as follows:
Wherein, s is the horizontal centre spacing of linear array infrared detector neighboring photosensitive member, and n is that linear array infrared detector is horizontal
It is moved to the required integration period number of another neighboring photosensitive member from a photosensitive member when direction is scanned, f is the coke of optical system
Away from TColumnFor the scan columns period of linear array infrared detector；
S32, odd even two field picture is scanned in the same time and is synthesized.
Further, odd even two field picture is scanned in step S32 of the invention and carries out synthetic method are as follows:
Odd field image sampling image data, interval time T since the 1st pixelColumnThe picture number of the 2nd pixel of post-sampling
According to；Even field picture sampling image data, interval time T since the 1.5th pixelColumnThe picture number of the 2.5th pixel of post-sampling
According to obtaining sampled point after synthesizing two field picture and increase twice composograph.
The beneficial effect comprise that: raising linear array infrared exoelectron enlarged drawing level detail resolution ratio of the invention
Method, the characteristics of according to linear array infrared detector scanning imagery, in the case where the scanning speed of optical scanner pendulum mirror is constant,
By parity field mixed sweep and image synthetic method, linear array infrared exoelectron enlarged drawing level detail resolution ratio is improved；
The scanning speed of optical scanner pendulum mirror is constant during realizing the amplification of linear array infrared exoelectron, improves linear array infrared imaging system
The stability of system；While promoting linear array infrared exoelectron enlarged drawing level detail resolution ratio, picture frame frequency is constant, is effectively ensured
The visual effect of image.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is linear array infrared detector operation principle schematic diagram；
Fig. 2 is the linear array infrared image pixel schematic diagram of the embodiment of the present invention；
Fig. 3 is the linear array infrared detector photosensitive elements schematic diagram of the embodiment of the present invention；
Fig. 4 is linear array infrared detector parity field mixed sweep and the image synthesis schematic diagram of the embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that described herein, specific examples are only used to explain the present invention, not
For limiting the present invention.
As shown in Figure 1, linear array infrared detector image forming job principle are as follows: the infra-red radiation of scenery is projected by optical system
Onto optical scanner pendulum mirror.When optical scanner puts mirror by the driving of scan module axis and reciprocating swing according to certain rules, by scape
The full filed continuous decomposition of object scans, and by being imaged on the photosurface of detector, makes the instantaneous field of view that infrared detector is small
The visual field big with imaging system matches, and completes one-dimensional optical mechaical scanning.The electric signal of linear array infrared detector output passes through AD
The output infrared images such as conversion, synthesis sequence, Nonuniformity Correction, gain control, Video Composition.
As shown in Fig. 2, the method for the raising linear array infrared exoelectron enlarged drawing level detail resolution ratio of the embodiment of the present invention,
Including optical system interconnected, optical scanner pendulum mirror and linear array infrared detector, the infra-red radiation of determinand passes through optics
In system projects to optical scanner pendulum mirror, optical scanner puts mirror and carries out reciprocating swing according to certain frequency, by the full view of determinand
Field continuous decomposition scanning, is incident upon on linear array infrared detector, method includes the following steps:
S1, infrared image is obtained by optical system, electronics is carried out to it and amplifies to obtain enlarged drawing, according to enlarged drawing
Determine the horizontal effective viewing field of optical system, and then the respective scanned range of calculating optical scanning pendulum len；
S2, optics is calculated in conjunction with the corresponding scanning field frequency of infrared image according to the scanning range that mirror is put in optical scanner
The scanning speed of scanning pendulum len；
S3, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, according to the control of column period
Optical scanner pendulum mirror processed carries out parity field mixed sweep, and the image that scanning obtains is closed under time delay integration image-forming mechanism
At, obtain level detail resolution ratio improve after image.
In one particular embodiment of the present invention, the amplification factor for carrying out electronics amplification to infrared image is 2 times.This
When, the calculation method of optical scanner pendulum scarnning mirror range in step S1 are as follows:
The pixel of infrared image is a × b, and the corresponding horizontal effective viewing field of infrared image is FOV, and infrared image is corresponding to be swept
Retouching range is a；
It is directly proportional to horizontal effective viewing field according to horizontal pixel, and horizontal effective viewing field is directly proportional to scanning range, obtains:
The horizontal effective viewing field of enlarged drawing is FOV/2, and the corresponding scanning range of enlarged drawing is a/2.
The calculation method of the scanning speed of optical scanner pendulum mirror in step S2 are as follows:
The pixel of infrared image is a × b, and scanning range a, scanning field frequency is F?, the scanning speed of optical scanner pendulum mirror
Are as follows: v0=a*F?；
The scanning range of enlarged drawing is a/2, keeps the scanning speed of optical scanner pendulum mirror constant, it may be assumed that v1=v0=(a/
2)*2F?, the scanning field frequency of enlarged drawing is 2F at this time?。
The column period is calculated in step S3, carries out Odd and even field scan and image synthetic method are as follows:
S31, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, calculation formula are as follows:
Wherein, as shown in figure 3, s is the horizontal centre spacing of linear array infrared detector neighboring photosensitive member, n is that linear array is infrared
It is moved to the required integration period number of another neighboring photosensitive member from a photosensitive member when detector horizontal direction scans, f is light
The focal length of system, TColumnFor the scan columns period of linear array infrared detector；
S32, odd even two field picture is scanned in the same time and is synthesized.
Odd even two field picture is scanned in step S32 and carries out synthetic method are as follows:
Odd field image sampling image data, interval time T since the 1st pixelColumnThe picture number of the 2nd pixel of post-sampling
According to；Even field picture sampling image data, interval time T since the 1.5th pixelColumnThe picture number of the 2.5th pixel of post-sampling
According to obtaining sampled point after synthesizing two field picture and increase twice composograph.
In another specific embodiment of the invention, linear array infrared exoelectron enlarged drawing level detail resolution ratio is improved
Method mainly includes following steps:
(1) the horizontal effective viewing field of optical system is determined according to zoomed image, to calculate optical scanner pendulum mirror
Respective scanned range；
(2) scanning range that mirror is put according to optical scanner calculates sweeping for optical scanner pendulum mirror in conjunction with image scanning field frequency
Retouch speed；
(3) in the column period that linear array infrared detector is obtained by the scanning speed of optical scanner pendulum mirror, replaced using parity field
The method of composograph, guarantee linear array infrared detector remain to blur-free imaging under TDI image-forming mechanism and pass through electricity again after scanning
Son amplification improves image level detail resolution.
The calculation method of optical scanner pendulum scarnning mirror range in step (1) are as follows:
If linear array infrared image pixel is a × b, the horizontal effective viewing field of optical system is that mirror is put in corresponding optical scanner
Scanning range is a；Then when taking electronics to amplify (2 ×) linear array infrared image, the horizontal effective viewing field of optical system is, right
The scanning range for answering optical scanner pendulum mirror is a/2, as shown in Figure 2.
The calculation method of the scanning speed of optical scanner pendulum mirror in step (2) are as follows:
If image scanning field frequency is F?, when acquisition pixel infrared image original for a × b, the scanning of mirror is put in optical scanner
Speed is v0=a*F?；When amplifying (2 ×) to linear array infrared image electronics, the scanning range that mirror is put in optical scanner is a/2, if
Keep the constant i.e. v of scanning speed of optical scanner pendulum mirror1=v0=(a/2) * 2F?(formula 1), then image scanning field frequency is at this time
2F?。
In the calculating of column period, parity field mixed sweep and image synthetic method of step (3) middle line array infrared detector
Are as follows:
(3.1) scanning speed of the scanning speed of linear array infrared detector, i.e. optical scanner pendulum mirror:
Wherein s is the horizontal centre spacing of linear array infrared detector neighboring photosensitive member, and n is linear array infrared detector level side
It is moved to the required integration period number of another neighboring photosensitive member from a photosensitive member to when scanning, f is the focal length of optical system,
TColumnFor the scan columns period of linear array infrared detector.When acquiring the original infrared image that pixel is a × b, linear array infrared acquisition
The scan columns period of device is TColumn 0；When amplifying (2 ×) to linear array infrared image electronics, linear array at this time can be obtained by formula (1), formula (2)
The scan columns cycle T of infrared detectorColumn 1=TColumn 0。
(3.2) mixed sweep of linear array infrared detector parity field and image synthetic method are as follows: when to the infrared figure of linear array
When as electronics amplification (2 ×), F when image scanning field frequency is by original image?Become 2F?, i.e., can scan in the same time
Two field picture carries out synthesis processing, to improve the level detail resolution ratio of image.As shown in figure 4, the first field picture is from the 1st picture
Element starts sampling image data, interval time TColumnThe image data of the 2nd pixel of post-sampling；Second field picture is from the 1.5th picture
Element starts sampling image data, interval time TColumnThe image data of the 2.5th pixel of post-sampling.It can be seen after two field picture is synthesized
The sampled point of composograph increases one times compared with the sampled point of original image out.
Image resolution ratioWherein n is the number of sampling points of image, A is instantaneous field of view angle.
The level detail resolution ratio of original imageWhereinA=a/2.
The level detail resolution ratio of composographWherein first field picture is adopted
Sampling point numberThe number of sampling points of second field pictureA=a/2.
By can be calculated above electronics amplification image compared with original image, level detail resolution ratio improves 2 times, i.e.,
FResolution ratio 1=2*FResolution ratio 0。
It should be understood that for those of ordinary skills, it can be modified or changed according to the above description,
And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.
Claims (6)
1. a kind of method for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, which is characterized in that including mutually interconnecting
Optical system, optical scanner pendulum mirror and linear array infrared detector, the infra-red radiation of determinand connect is projected by optical system
Optical scanner is put on mirror, and optical scanner puts mirror and carries out reciprocating swing according to certain frequency, by the full filed continuous decomposition of determinand
Scanning, is incident upon on linear array infrared detector, method includes the following steps:
S1, infrared image is obtained, electronics is carried out to it and amplifies to obtain enlarged drawing, the water of optical system is determined according to enlarged drawing
Flat effective viewing field, and then the respective scanned range of calculating optical scanning pendulum len；
S2, optical scanner is calculated in conjunction with the corresponding scanning field frequency of infrared image according to the scanning range that mirror is put in optical scanner
Put the scanning speed of mirror；
S3, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, control light according to the column period
It learns scanning pendulum len and carries out parity field mixed sweep, and the image that scanning obtains is synthesized under time delay integration image-forming mechanism,
Obtain the image after level detail resolution ratio improves.
2. the method according to claim 1 for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, feature
It is, the amplification factor for carrying out electronics amplification to infrared image in step S1 is 2 times.
3. the method according to claim 2 for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, feature
It is, the calculation method of optical scanner pendulum scarnning mirror range in step S1 are as follows:
The pixel of infrared image is a × b, and the corresponding horizontal effective viewing field of infrared image is FOV, the corresponding scanning model of infrared image
It encloses for a；
It is directly proportional to horizontal effective viewing field according to horizontal pixel, and horizontal effective viewing field is directly proportional to scanning range, obtains:
The horizontal effective viewing field of enlarged drawing is FOV/2, and the corresponding scanning range of enlarged drawing is a/2.
4. the method according to claim 3 for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, feature
It is, the calculation method of the scanning speed of optical scanner pendulum mirror in step S2 are as follows:
The pixel of infrared image is a × b, and scanning range a, scanning field frequency is F?, the scanning speed of optical scanner pendulum mirror are as follows: v0
=a*F?；
The scanning range of enlarged drawing is a/2, keeps the scanning speed of optical scanner pendulum mirror constant, it may be assumed that
v1=v0=(a/2) * 2F?, the scanning field frequency of enlarged drawing is 2F at this time?。
5. the method according to claim 4 for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, feature
It is, the column period is calculated in step S3, carries out parity field mixed sweep and image synthetic method are as follows:
S31, the scanning speed that mirror is put according to optical scanner calculate the column period of linear array infrared detector, calculation formula are as follows:
Wherein, s is the horizontal centre spacing of linear array infrared detector neighboring photosensitive member, and n is linear array infrared detector horizontal direction
It is moved to the required integration period number of another neighboring photosensitive member from a photosensitive member when scanning, f is the focal length of optical system, TColumn
For the scan columns period of linear array infrared detector；
S32, odd even two field picture is scanned in the same time and is synthesized.
6. the method according to claim 5 for improving linear array infrared exoelectron enlarged drawing level detail resolution ratio, feature
It is, odd even two field picture is scanned in step S32 and carries out synthetic method are as follows:
Odd field image sampling image data, interval time T since the 1st pixelColumnThe image data of the 2nd pixel of post-sampling；
Even field picture sampling image data, interval time T since the 1.5th pixelColumnThe image data of the 2.5th pixel of post-sampling,
Sampled point is obtained after two field picture is synthesized increases twice composograph.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01124728A (en) * | 1987-11-09 | 1989-05-17 | Fujitsu Ltd | Infrared image pickup device |
| JP2008128892A (en) * | 2006-11-22 | 2008-06-05 | Mitsubishi Electric Corp | Infrared imaging device |
| CN104052938A (en) * | 2013-03-15 | 2014-09-17 | 红外线综合系统有限公司 | Apparatus and method for multispectral imaging with three-dimensional overlaying |
| CN104159007A (en) * | 2014-07-04 | 2014-11-19 | 中国空间技术研究院 | Point target searching detection device based on multi-linear time lag extension sampling |
| CN106408553A (en) * | 2015-07-29 | 2017-02-15 | 北京空间飞行器总体设计部 | Target response analysis method for oblique angle scanning infrared array detector |
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2017
- 2017-05-03 CN CN201710304316.3A patent/CN107152971B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01124728A (en) * | 1987-11-09 | 1989-05-17 | Fujitsu Ltd | Infrared image pickup device |
| JP2008128892A (en) * | 2006-11-22 | 2008-06-05 | Mitsubishi Electric Corp | Infrared imaging device |
| CN104052938A (en) * | 2013-03-15 | 2014-09-17 | 红外线综合系统有限公司 | Apparatus and method for multispectral imaging with three-dimensional overlaying |
| CN104159007A (en) * | 2014-07-04 | 2014-11-19 | 中国空间技术研究院 | Point target searching detection device based on multi-linear time lag extension sampling |
| CN106408553A (en) * | 2015-07-29 | 2017-02-15 | 北京空间飞行器总体设计部 | Target response analysis method for oblique angle scanning infrared array detector |
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