CN107132581B - A kind of double-deck magnetic source localization method based on pose mapping relations database - Google Patents
A kind of double-deck magnetic source localization method based on pose mapping relations database Download PDFInfo
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- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
- G01V3/38—Processing data, e.g. for analysis, for interpretation, for correction
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Abstract
The invention discloses a kind of double-deck magnetic source localization methods based on pose mapping relations database: treating tracking object and carries out magnetic marker；Make that the position of magnetic source and posture is marked to be consistent with the position of object to be tracked and posture, mapping relations are met between location parameter and attitude parameter；Based on mapping relations, discrete point sampling calibration is carried out to the spatial movement of label magnetic source, constructs pose mapping relations database；The accurate location parameter and exact posture parameter for obtaining label magnetic source are calculated by the double-deck reverse temperature intensity algorithm；Obtain the location parameter and attitude parameter of object to be tracked.Wherein by first layer reverse temperature intensity algorithm obtain label magnetic source rough location parameter and preliminary attitude parameter, corresponding mapping attitude parameter is obtained from pose mapping relations database according to rough location parameter, using rough location parameter and corresponding mapping attitude parameter as the initial value of second layer reverse temperature intensity algorithm, solve to mark the accurate location parameter and exact posture parameter of magnetic source.
Description
Technical field
The present invention relates to source localization methods, and in particular to a kind of double-deck magnetic source based on pose mapping relations database is fixed
Position method.
Background technique
Based in magnetic labeling location technology, label magnetic source excites the spatial distribution in magnetic field and position, the appearance of label magnetic source
State parameter meets specific physical model, in particular to magnetic dipole physical model.It is detected and is sensed using magnetic field probe
The distribution of magnetic source excitation space magnetic field is marked on device position, the magnetic dipole physical model of binding marker magnetic source is established and marked
Magnetic source position, the relevant objective function of posture, by the anti-solution method of nonlinear iteration, acquisition makes the smallest label of objective function
The position of magnetic source, attitude parameter realize label source localization, and then obtain the motion information of object to be tracked.
Magnetic labeling location technology due to it is non-contact, without driving source, propagate independent of medium and physical model at
The advantages that ripe, is widely used, such as the endoscope medically for gastrointestinal tract detection in industrial production, biomedicine
Capsule positioning etc..
Since label magnetic source position, posture solution are nonlinear inverse problem solvings, iterative optimization method is mostly used to realize, and
The solving result of iterative algorithm is largely influenced by iteration initial value, and existing research is set about improving label magnetic from software and hardware
The accuracy and speed of source positioning, including increasing the magnetic field probe number for measurement markers magnetic source excitation space magnetic field,
More Distribution of Magnetic Field information are obtained, however, the increase of number of probes is so that entire source localization system cost increase, volume
Increase, detection information sample inconvenient for use and bigger can be brought very to back end signal processing and nonlinear algorithm solution
Big burden；In addition, simplified non-linear inverse resolution model is obtained by matrix and Linear Algebra Operation, however, these methods pair
The interference that noise signal introduces is more sensitive.Therefore, it how on the basis of existing magnetic field probe technology, obtains high-precision
Degree source localization parameter is the emphasis of the magnetic labeling location area research.
Summary of the invention
For above-mentioned defect existing in the prior art, it is an object of that present invention to provide one kind to be based on pose mapping relations number
According to the double-deck magnetic source localization method in library.
The present invention provides a kind of double-deck magnetic source localization methods based on pose mapping relations database, have such spy
Sign, comprising the following steps: step 1 treats tracking object and carries out magnetic marker；Step 2, make mark magnetic source position and posture with
The position of object to be tracked and posture are consistent, and mapping relations are met between location parameter and attitude parameter；Step 3 is based on
Mapping relations carry out discrete point sampling calibration to the spatial movement of label magnetic source, construct pose mapping relations database；Step
Four, the accurate location parameter and exact posture parameter for obtaining label magnetic source are calculated by the double-deck reverse temperature intensity algorithm；Step 5,
The location parameter and attitude parameter of object to be tracked are obtained by telltale mark magnetic source.
In the double-deck magnetic source localization method provided by the invention based on pose mapping relations database, there can also be this
The feature of sample: where the double-deck reverse temperature intensity algorithm includes following two layers of algorithm:
In first layer reverse temperature intensity algorithm, the excitation space of label magnetic source is measured by N number of magnetic field probe
The magnetic flux distribution B in magnetic fieldm,
Bm={ Bm(1),Bm(2),…,Bm(i),…}I=1:N (1)
The strongest magnetic field probe location parameter r of signal will be detected in N number of magnetic field probep0Join with zero attitude
Number M0As the initial value of formula (2) least-squares iteration optimization algorithm,
In formula (2), iterative steps J；BmIt (i) is to measure label on i-th of magnetic field probe present position point
The magnetic flux density of the excited space magnetic field of magnetic source；rp1For the location parameter of label magnetic source obtained by first layer reverse temperature intensity；M1For
The dipole moment of label magnetic source obtained by first layer reverse temperature intensity；rpjFor in iterative process, jth walks the corresponding label magnetic source of iteration
Location parameter；MjFor in iterative process, jth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpj,Mj, i) and it is i-th
On magnetic field probe, jth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpj,Mj), calculate gained
The magnetic flux distribution of the excitation space magnetic field of magnetic source is marked,
Objective function f will be solved1(rp1, M1) obtained rp1As the rough location parameter of label magnetic source, M1As label
The preliminary attitude parameter of magnetic source,
According to rough location parameter rp1Search obtains corresponding location parameter r ' from pose mapping relations databasepAnd
Corresponding mapping attitude parameter M ',
In second layer reverse temperature intensity algorithm, by rough location parameter rp1Formula (3) are used as with mapping attitude parameter M '
The initial value of least-squares iteration optimization algorithm,
In formula (3), iterative steps K；BmIt (i) is to measure label on i-th of magnetic field probe present position point
The magnetic flux density of the excited space magnetic field of magnetic source；rpFor the location parameter of label magnetic source obtained by second layer reverse temperature intensity；M is
The dipole moment of label magnetic source obtained by two layers of reverse temperature intensity；rpkFor in iterative process, kth walks the corresponding label magnetic source of iteration
Location parameter；MkFor in iterative process, kth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpk,Mk, i) and it is i-th of magnetic
On field measurement sensor, kth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpk,Mk), calculate gained mark
Remember the magnetic flux distribution of the excitation space magnetic field of magnetic source,
Objective function f will be solved2(rp, M) and obtained rpAs the accurate location parameter of label magnetic source, M is as label magnetic source
Exact posture parameter.
In the double-deck magnetic source localization method provided by the invention based on pose mapping relations database, there can also be this
The feature of sample: where label magnetic source is modeled by magnetic dipole.
In the double-deck magnetic source localization method provided by the invention based on pose mapping relations database, there can also be this
The feature of sample: where object to be tracked and should object be tracked nearby not the magnetic field source in addition to marking magnetic source or
Ferrimagnet.
The action and effect of invention
The present invention provides a kind of double-deck magnetic source localization methods based on pose mapping relations database, utilize object to be tracked
Position possessed by the kinetic characteristic of body and posture mapping relations, the pose mapping relations data that building label magnetic source is met
Library is designed the double-deck reverse temperature intensity algorithm based on pose mapping relations database and is passed in first layer algorithm using magnetic-field measurement
The strongest sensor position parameter r of output signal in sensor arrayp0With zero attitude parameter M0As initial value, surveyed using sensor
The magnetic flux distribution of amount obtains the rough location parameter r of label magnetic source by first layer algorithmp1With preliminary attitude parameter M1,
Further, search for pose mapping relations database in rough location parameter rp1Corresponding location parameter r 'pAnd it corresponding reflects
Attitude parameter M ' is penetrated, then with rough location parameter rp1Initial value with mapping attitude parameter M ' as second layer algorithm, in conjunction with
The magnetic flux distribution of sensor measurement obtains accurate location parameter r by second layer algorithmpWith exact posture parameter M.This hair
It is bright to realize that high-precision magnetic source position, posture information obtain by reverse temperature intensity algorithm, for the location technology based on label magnetic source
Provide a kind of accuracy method.
Detailed description of the invention
Fig. 1 is the flow chart of the double-deck reverse temperature intensity algorithm in the embodiment of the present invention.
Specific embodiment
It is real below in order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention
Example combination attached drawing is applied to be specifically addressed the double-deck magnetic source localization method the present invention is based on pose mapping relations database.
A kind of double-deck magnetic source localization method based on pose mapping relations database mainly comprises the steps that
Step 1 treats tracking object and carries out magnetic marker.Object to be tracked and its nearby not in addition to marking magnetic source
Magnetic field source or ferrimagnet.
Step 2 makes that the position of magnetic source and posture is marked to be consistent with the position of object to be tracked and posture, position ginseng
Meet mapping relations between several and attitude parameter.
Step 3 models label magnetic source using magnetic dipole.Based on mapping relations, the space of label magnetic source is transported
It is dynamic to carry out discrete point sampling calibration, construct following pose mapping relations database:
1. pose mapping relations database of table
| Mark the location parameter r of magnetic sourcep’ | Mark attitude parameter (magnetic dipole moment) M ' of magnetic source |
| rp’(1) | M’(1) |
| rp’(2) | M’(2) |
| … | … |
| rp’(j) | M’(j) |
| … | … |
Step 4 calculates the accurate location parameter and exact posture for obtaining label magnetic source by the double-deck reverse temperature intensity algorithm
Parameter.
Step 5 obtains the location parameter and attitude parameter of object to be tracked, by telltale mark magnetic source to realize wait chase after
The accurate positionin of track object.
The double-deck reverse temperature intensity algorithm includes following two layers of algorithm:
In first layer reverse temperature intensity algorithm, pass through the magnetic field probe being made of N number of magnetic field probe
Array measures the magnetic flux distribution B that the excitation space magnetic field of magnetic source is marked on the point of present positionm。
Bm={ Bm(1),Bm(2),…,Bm(i),…}I=1:N (1)
The strongest magnetic field probe location parameter r of signal will be detected in N number of magnetic field probep0Join with zero attitude
Number M0Initial value as formula (2) least-squares iteration optimization algorithm.
In formula (2), iterative steps J；BmIt (i) is to measure label on i-th of magnetic field probe present position point
The magnetic flux density r of the excited space magnetic field of magnetic sourcep1For the location parameter of label magnetic source obtained by first layer reverse temperature intensity；M1It is
The dipole moment of label magnetic source obtained by one layer of reverse temperature intensity；rpjFor in iterative process, jth walks the corresponding label magnetic source of iteration
Location parameter；MjFor in iterative process, jth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpj,Mj, i) and it is i-th of magnetic
On field measurement sensor, jth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpj,Mj), calculate gained mark
Remember the magnetic flux distribution of the excitation space magnetic field of magnetic source.
Objective function f will be solved1(rp1, M1) obtained rp1As the rough location parameter of label magnetic source, M1As label
The preliminary attitude parameter of magnetic source.
According to rough location parameter rp1Search obtains immediate location parameter r ' from pose mapping relations databasepWith
And corresponding mapping attitude parameter M '.
In second layer reverse temperature intensity algorithm, by rough location parameter rp1Formula (3) are used as with mapping attitude parameter M '
The initial value of least-squares iteration optimization algorithm.
In formula (3), iterative steps K；BmIt (i) is to measure label on i-th of magnetic field probe present position point
The magnetic flux density of the excited space magnetic field of magnetic source；rpFor the location parameter of label magnetic source obtained by second layer reverse temperature intensity；M is
The dipole moment of label magnetic source obtained by two layers of reverse temperature intensity；rpkFor in iterative process, kth walks the corresponding label magnetic source of iteration
Location parameter；MkFor in iterative process, kth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpk,Mk, i) and it is i-th of magnetic
On field measurement sensor, kth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpk,Mk), calculate gained mark
Remember the magnetic flux distribution of the excitation space magnetic field of magnetic source.
Objective function f will be solved2(rp, M) and obtained rpAs the accurate location parameter of label magnetic source, M is as label magnetic source
Exact posture parameter, that is, object of which movement information to be tracked (location parameter and attitude parameter) is obtained, to realize wait track
The accurate positionin of object.
Fig. 1 is the flow chart of the double-deck reverse temperature intensity algorithm in the embodiment of the present invention.
As shown in Figure 1, the concise process of the double-deck reverse temperature intensity algorithm is as follows:
Step S1: magnetic field probe array measures the magnetic flux that the excitation space magnetic field of magnetic source is marked on the point of present position
Density Distribution Bm, subsequently into step S2.
Step S2: the strongest magnetic field probe location parameter r of signal will be detected in N number of magnetic field probep0With
Zero attitude parameter M0The initial value of first layer reverse temperature intensity algorithm, subsequently into step S3.
Step S3: in conjunction with BmIt solves first layer reverse temperature intensity algorithm and obtains rough location parameter rp1With preliminary attitude parameter
M1, subsequently into step S4.
Step S4: according to rough location parameter rp1Search obtains immediate position ginseng from pose mapping relations database
Number rp' and corresponding mapping attitude parameter M ', subsequently into step S5.
Step S5: by rough location parameter rp1With mapping attitude parameter M ' as the initial of second layer reverse temperature intensity algorithm
Value, subsequently into step S6.
Step S6: in conjunction with BmIt solves second layer reverse temperature intensity algorithm and obtains the accurate location parameter r of label magnetic sourcepAnd standard
True attitude parameter M, then terminates state.
The action and effect of embodiment
A kind of double-deck magnetic source localization method based on pose mapping relations database is present embodiments provided to utilize wait track
Position possessed by the kinetic characteristic of object and posture mapping relations, the pose mapping relations data that building label magnetic source is met
Library is designed the double-deck reverse temperature intensity algorithm based on pose mapping relations database and is passed in first layer algorithm using magnetic-field measurement
The strongest sensor position parameter r of output signal in sensor arrayp0With zero attitude parameter M0As initial value, surveyed using sensor
The magnetic flux distribution of amount obtains the rough location parameter r of label magnetic source by first layer algorithmp1With preliminary attitude parameter M1,
Further, search for pose mapping relations database in rough location parameter rp1Closest location parameter rp' and it is corresponding
Mapping attitude parameter M ', then with rough location parameter rp1Initial value with mapping attitude parameter M ' as second layer algorithm,
In conjunction with the magnetic flux distribution of sensor measurement, accurate location parameter r is obtained by second layer algorithmpWith exact posture parameter M.
The present embodiment realizes that high-precision magnetic source position, posture information obtain by reverse temperature intensity algorithm, for determining based on label magnetic source
Position technology provides a kind of accuracy method.
Above embodiment is preferred case of the invention, the protection scope being not intended to limit the invention.
Claims (3)
1. a kind of double-deck magnetic source localization method based on pose mapping relations database, which comprises the following steps:
Step 1 treats tracking object and carries out magnetic marker；
Step 2 makes that the position of magnetic source and posture is marked to be consistent with the position of the object to be tracked and posture, position ginseng
Meet mapping relations between several and attitude parameter；
Step 3 is based on the mapping relations, carries out discrete point sampling calibration to the spatial movement of the label magnetic source, constructs position
Appearance mapping relations database；
Step 4 calculates the accurate location parameter and exact posture for obtaining the label magnetic source by the double-deck reverse temperature intensity algorithm
Parameter；
Step 5 obtains the location parameter and attitude parameter of the object to be tracked by telltale mark magnetic source；
Wherein, the double-deck reverse temperature intensity algorithm includes following two layers of algorithm:
In first layer reverse temperature intensity algorithm, the excitation space of the label magnetic source is measured by N number of magnetic field probe
The magnetic flux distribution B in magnetic fieldm,
Bm={ Bm(1),Bm(2),…,Bm(i),…}I=1:N (1)
The strongest magnetic field probe location parameter r of signal will be detected in N number of magnetic field probep0With zero attitude parameter M0
As the initial value of formula (2) least-squares iteration optimization algorithm,
In formula (2), iterative steps J；Bm(i) magnetic source institute is marked to measure on i-th of magnetic field probe present position point
Excite the magnetic flux density of space magnetic field；rp1For the location parameter of label magnetic source obtained by first layer reverse temperature intensity；M1For first layer
The dipole moment of label magnetic source obtained by reverse temperature intensity；rpjFor in iterative process, jth walks the position of the corresponding label magnetic source of iteration
Parameter；MjFor in iterative process, jth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpj,Mj, i) and it is that i-th of magnetic field is surveyed
On quantity sensor, jth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpj,Mj), it calculates gained and marks magnetic
The magnetic flux distribution of the excitation space magnetic field in source,
Objective function f will be solved1(rp1, M1) obtained rp1As the rough location parameter of the label magnetic source, M1As the mark
Remember the preliminary attitude parameter of magnetic source,
According to rough location parameter rp1Search obtains corresponding location parameter r ' from the pose mapping relations databasepAnd
Corresponding mapping attitude parameter M ',
In second layer reverse temperature intensity algorithm, by the rough location parameter rp1Formula is used as with the mapping attitude parameter M '
(3) initial value of least-squares iteration optimization algorithm,
In formula (3), iterative steps K；Bm(i) magnetic source institute is marked to measure on i-th of magnetic field probe present position point
Excite the magnetic flux density of space magnetic field；rpFor the location parameter of label magnetic source obtained by second layer reverse temperature intensity；M is that the second layer is inverse
The dipole moment of label magnetic source obtained by problem solving；rpkFor in iterative process, kth walks the position ginseng of the corresponding label magnetic source of iteration
Number；MkFor in iterative process, kth walks the dipole moment of the corresponding label magnetic source of iteration；Bc(rpk,Mk, i) and it is i-th of magnetic-field measurement
On sensor, kth walks iteration, is based on dipole model of magnetic and iteration source localization parameter (rpk,Mk), it calculates gained and marks magnetic source
Excitation space magnetic field magnetic flux distribution,
Objective function f will be solved2(rp, M) and obtained rpAs it is described label magnetic source the accurate location parameter, M be used as described in
Mark the exact posture parameter of magnetic source.
2. the double-deck magnetic source localization method according to claim 1 based on pose mapping relations database, it is characterised in that:
Wherein, the label magnetic source is modeled by magnetic dipole.
3. the double-deck magnetic source localization method according to claim 1 based on pose mapping relations database, it is characterised in that:
Wherein, the magnetic field of the object to be tracked and the object to be tracked not having nearby in addition to the label magnetic source
Source.
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| CN109717871A (en) * | 2018-12-25 | 2019-05-07 | 上海理工大学 | Magnetic labeling location method based on omnidirectional distribution magnetic source |
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