CN107132471A - A kind of method and apparatus for debugging microwave device - Google Patents
A kind of method and apparatus for debugging microwave device Download PDFInfo
- Publication number
- CN107132471A CN107132471A CN201710414164.2A CN201710414164A CN107132471A CN 107132471 A CN107132471 A CN 107132471A CN 201710414164 A CN201710414164 A CN 201710414164A CN 107132471 A CN107132471 A CN 107132471A
- Authority
- CN
- China
- Prior art keywords
- debugged
- debugging
- pass band
- microwave device
- sample point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P11/00—Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
Abstract
The embodiment of the present invention proposes a kind of method and apparatus for debugging microwave device, and wherein this method includes:Determine the performance curve of microwave device to be debugged and the pass band areas of performance curve;The moving direction of resonance point in performance curve is chosen to be debugged close to the debud mode corresponding to pass band areas, so that resonance point is completely in pass band areas;The value for choosing each sample point in pass band areas is debugged more than the debud mode corresponding to the more next many trend of quantity of correspondence standard value, until the value of each sample point is both greater than correspondence standard value to complete the debugging to microwave device to be debugged in pass band areas.A kind of method for automating debugging is realized with this, the efficiency of debugging is improved.
Description
Technical field
The present invention relates to debugging field, more particularly to a kind of method and apparatus for debugging microwave device.
Background technology
Now with the development of microwave communication techniques, the demand of the microwave device such as duplexer, wave filter, combiner and
Usage amount is also increasing.
And many microwave devices are all directly to use at this stage, two need realization to be debugged, but current
Debugging process is manually carried out, and so causes to waste time and energy, inefficiency, and largely improves human cost.
In view of this, save now and treat a kind of efficient mode to debug microwave device, to reduce human cost.
The content of the invention
With this, the present invention proposes a kind of method and apparatus for debugging microwave device, the efficiency to improve debugging.
Specifically, the present invention proposes embodiment in detail below:
The embodiment of the present invention proposes a kind of method for debugging microwave device, including:
Determine the performance curve of microwave device to be debugged and the pass band areas of performance curve;
The moving direction of resonance point in performance curve is chosen to be debugged close to the debud mode corresponding to pass band areas,
So that resonance point is completely in pass band areas;
The value of each sample point in pass band areas is chosen more than the tune corresponding to the more next many trend of quantity of correspondence standard value
Examination mode is debugged, until the value of each sample point is both greater than correspondence standard value to complete to microwave device to be debugged in pass band areas
The debugging of part.
It is described " to determine the performance curve and performance curve of microwave device to be debugged in a specific embodiment
Pass band areas " includes:
Debugging microwave device is treated by network analysis instrument to be tested, it is bent with the performance for obtaining microwave device to be debugged
Line;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences
Different standard performance curves;
The pass band areas of performance curve is determined based on acquired standard performance curve.
In a specific embodiment, described " moving direction for choosing resonance point in performance curve is close to passband area
Debud mode corresponding to domain is debugged, so that resonance point is completely in pass band areas " include:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point debugs it with this before this time debugging
The difference of the numerical value of each sample point afterwards;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in
In pass band areas.
In a specific embodiment, described " value for choosing each sample point in pass band areas is more than correspondence standard value
Debud mode corresponding to the more next many trend of quantity is debugged, until the value of each sample point is both greater than correspondence in pass band areas
Standard value is to complete the debugging to microwave device to be debugged " include:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the mark obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in quasi- performance curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, until all sample points are corresponding
All it is the 3rd mark to complete the debugging to microwave device to be debugged.
In a specific embodiment, the debugging of microwave device to be debugged is carried out based on tuning plug, this method
Also include:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tune during pass band areas
The regulated quantity of humorous bar;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the microwave device to be debugged
Resonance point is completely in pass band areas in performance curve.
The embodiment of the present invention also proposed a kind of equipment for debugging microwave device, including:
Determining module, for determining the performance curve of microwave device to be debugged and the pass band areas of performance curve;
First debugging module, the moving direction for choosing resonance point in performance curve is close to corresponding to pass band areas
Debud mode is debugged, so that resonance point is completely in pass band areas;
Second debugging module, the value for choosing each sample point in pass band areas is more next more more than the quantity of correspondence standard value
Trend corresponding to debud mode debugged, until pass band areas in each sample point value be both greater than correspondence standard value with complete
The debugging of paired microwave device to be debugged.
In a specific embodiment, the determining module is used for:
Debugging microwave device is treated by network analysis instrument to be tested, it is bent with the performance for obtaining microwave device to be debugged
Line;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences
Different standard performance curves;
The pass band areas of performance curve is determined based on acquired standard performance curve.
In a specific embodiment, first debugging module is used for:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point debugs it with this before this time debugging
The difference of the numerical value of each sample point afterwards;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in
In pass band areas.
In a specific embodiment, second debugging module is used for:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the mark obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in quasi- performance curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, until all sample points are corresponding
All it is the 3rd mark to complete the debugging to microwave device to be debugged.
In a specific embodiment, the debugging of microwave device to be debugged is carried out based on tuning plug, the equipment
Also include:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tune during pass band areas
The regulated quantity of humorous bar;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the microwave device to be debugged
Resonance point is completely in pass band areas in performance curve.
With this, the embodiment of the present invention proposes a kind of method and apparatus for debugging microwave device, and wherein this method includes:Really
The performance curve of fixed microwave device to be debugged and the pass band areas of performance curve;Choose the mobile side of resonance point in performance curve
Debugged to approach the debud mode corresponding to pass band areas, so that resonance point is completely in pass band areas;Choose logical
The debud mode that the value of each sample point is more than corresponding to the more next many trend of quantity of correspondence standard value in region is debugged,
Until the value of each sample point is both greater than correspondence standard value to complete the debugging to microwave device to be debugged in pass band areas.With this reality
Show a kind of method for automating debugging, improve the efficiency of debugging.
Brief description of the drawings
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be attached to what is used required in embodiment
Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, therefore is not construed as pair
The restriction of scope, for those of ordinary skill in the art, on the premise of not paying creative work, can also be according to this
A little accompanying drawings obtain other related accompanying drawings.
Fig. 1 is a kind of schematic flow sheet of the method for debugging microwave device that the embodiment of the present invention is proposed;
Fig. 2 is a kind of structural representation of the system for debugging microwave device that the embodiment of the present invention is proposed;
Fig. 3 is a kind of schematic diagram for performance curve for treating microwave device that the embodiment of the present invention is proposed;
Fig. 4 is a kind of schematic diagram for performance curve for treating microwave device that the embodiment of the present invention is proposed;
Fig. 5 is a kind of schematic diagram for standard performance curve for treating microwave device that the embodiment of the present invention is proposed;
The variation tendency schematic diagram of performance curve when Fig. 6 is a kind of debugging microwave device of proposition of the embodiment of the present invention;
Fig. 7 is a kind of structural representation of the equipment for debugging microwave device that the embodiment of the present invention is proposed.
Embodiment
Hereinafter, the various embodiments of the disclosure will be described more fully.The disclosure can have various embodiments, and
It can adjust and change wherein.It should be understood, however, that:It is limited to spy disclosed herein in the absence of by the various embodiments of the disclosure
Determine the intention of embodiment, but the disclosure should be interpreted as covering in the spirit and scope for the various embodiments for falling into the disclosure
All adjustment, equivalent and/or alternative.
Hereinafter, the term " comprising " that can be used in the various embodiments of the disclosure or " may include " indicate disclosed
Function, operation or the presence of element, and do not limit the increase of one or more functions, operation or element.In addition, such as existing
Used in the various embodiments of the disclosure, term " comprising ", " having " and its cognate are meant only to represent special characteristic, number
Word, step, operation, element, the combination of component or foregoing item, and be understood not to exclude first one or more other
Feature, numeral, step, operation, element, the presence of the combination of component or foregoing item or increase one or more features, numeral,
Step, operation, element, the possibility of the combination of component or foregoing item.
In the various embodiments of the disclosure, statement "or" or " in A or/and B at least one " include what is listed file names with
Any combinations of word or all combinations." A or B " or " in A or/and B at least one " may include A, may include for example, statement
B may include A and B both.
The statement (" first ", " second " etc.) used in the various embodiments of the disclosure can be modified to be implemented various
Various element in example, but corresponding element can not be limited.For example, presented above be not intended to limit the suitable of the element
Sequence and/or importance.The purpose presented above for being only used for differentiating an element and other elements.For example, the first user fills
Put and indicate different user device with second user device, although the two is all user's set.For example, not departing from each of the disclosure
In the case of the scope for planting embodiment, the first element is referred to alternatively as the second element, similarly, and the second element is also referred to as first
Element.
It should be noted that:, can be by the first composition member if an element ' attach ' to another element by description
Part is directly connected to the second element, and " connection " the 3rd can be constituted between the first element and the second element
Element.On the contrary, when an element " being directly connected to " is arrived into another element, it will be appreciated that be in the first element
And second the 3rd element is not present between element.
The term " user " used in the various embodiments of the disclosure, which may indicate that, to be used the people of electronic installation or uses electricity
The device (for example, artificial intelligence electronic installation) of sub-device.
The term used in the various embodiments of the disclosure is only used for describing the purpose of specific embodiment and not anticipated
In the various embodiments of the limitation disclosure.As used herein, singulative is intended to also include plural form, unless context is clear
Chu it is indicated otherwise.Unless otherwise defined, all terms (including the technical term and scientific terminology) tool being otherwise used herein
There is the implication identical implication that the various embodiment one skilled in the art with the disclosure are generally understood that.The term
(term such as limited in the dictionary typically used) is to be interpreted as having and the situational meaning in correlative technology field
Identical implication and it will be not construed as with Utopian implication or excessively formal implication, unless in the various of the disclosure
It is clearly defined in embodiment.
Embodiment 1
The embodiment of the present invention proposes a kind of method for debugging microwave device, as shown in figure 1, this method includes following step
Suddenly:
The pass band areas of step 101, the performance curve for determining microwave device to be debugged and performance curve;
The moving direction of resonance point is close to the debud mode corresponding to pass band areas in step 102, selection performance curve
Debugged, so that resonance point is completely in pass band areas;
Step 103, quantity more next many trend institute of the value more than correspondence standard value for choosing each sample point in pass band areas
Corresponding debud mode is debugged, until the value of each sample point is both greater than correspondence standard value to complete to treat tune in pass band areas
Try the debugging of microwave device.
Specifically, the method in this programme is related to a set of specific debugging system, structure such as Fig. 2 institutes of the debugging system
Show, including:Commissioning device, Network Analyzer, PC (Personal Computer, personal computer) ends;Wherein, it is to be debugged micro-
Wave device is connected with commissioning device and Network Analyzer respectively;Commissioning device is connected with PC ends;Network Analyzer and PC ends
Connection;
Wherein, specifically, Network Analyzer is used to test microwave device to be debugged, microwave device to be debugged is got
The performance microwave curve of part;Commissioning device is used to debug microwave device to be debugged, particular by microwave to be debugged
Screw rod on device is debugged to realize;And PC ends are for the performance microwave accessed by the Network Analyzer to being connected
Curve is analyzed and data processing and storage, and commissioning device is controlled based on analysis result, realizes to be debugged
The automation debugging of microwave device.
In a specific embodiment, in step 101, it is described " determine microwave device to be debugged performance curve and
The pass band areas of performance curve ", including:
Debugging microwave device is treated by network analysis instrument to be tested, it is bent with the performance for obtaining microwave device to be debugged
Line;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences
Different standard performance curves;
The pass band areas of performance curve is determined based on acquired standard performance curve.
Here, being illustrated with a specific embodiment, such as, for microwave device A to be debugged, it is for difference
The need for (for example used in different application scenarios), can be to that should have a different standard performance curves, and different standard
Pass band areas in energy curve is different, is illustrated with a specific example, such as one device corresponds to
It is 880MHz to 910MHz in 1 time its pass band areas of application scenarios between 850MHz to 950MHz;And under application scenarios 2, its
Pass band areas may be then 890MHz to 900MHz, as other scenes, then respective to that should have respective pass band areas, herein
No longer carry out superfluous chat.
In a specific embodiment, step 102, namely it is described " choose performance curve in resonance point moving direction
Debugged to approach the debud mode corresponding to pass band areas, so that resonance point is completely in pass band areas " include:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point debugs it with this before this time debugging
The difference of the numerical value of each sample point afterwards;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in
In pass band areas.
Electric property of the usual new clothes with the microwave device to be debugged (being, for example, cavity microwave device) completed is not
Meet standard requirement, it is necessary to machine or artificially go debugging, debugging arrive required standard when could turn into qualified finished product,
It is that mixed and disorderly, as shown in Figure 3 performance is bent that the image of the electric property of a usual newly assembled microwave device to be debugged, which is shown,
Line is, it is necessary to its electric property be debugged to required standard, as shown in Figure 5 (namely correspondence standard performance curve).
Specific regulative mode is substantially first to regulate passband substantially, then finely tunes various indexs to complete overall debugging
Process.
The process is specially:Prestore a standard performance curve (as shown in Figure 5) at computer PC ends, tests filtering to be debugged
The performance curve of device, because the different corresponding frequency ranges of microwave device to be debugged is also differed.
By taking cavity body filter as an example, when being debugged to a cavity body filter, in the ghz area of its correspondence debugging
Progress takes a little, and for example cavity body filter corresponds between 850MHz to 950MHz, and its pass band areas is 880MHz to 910MHz,
In specific operating process, to carrying out taking a little between 850MHz to 950MHz, taking point every 1MHz, (different wave filters can have
Difference takes dot frequency, and 0.5MHz or 1.5MHz etc. can be divided by specific device), then just there are 100 points, cavity body filter
In debugging process, different resonance points can be adjusted by several tuning screws, during screw rod is debugged, corresponding property
Resonance point on energy curve can be moved left and right, and now PC ends operation to be performed is, the performance before and after record debugging screw rod
System, which can be analyzed, after curve, the sample point that compares learns that resonance point is to turn left or toward moving right, now can also obtain accordingly
Know the resonance point being moved it is corresponding be which tuning screw, now can be by controlling these tuning screws to move resonance point
Move in passband, namely the performance curve after adjustment is as shown in Figure 4.
It is further details of to illustrate how to improve i.e. toward standard compliant by electric property in multilevel iudge debugging process
Direction change meets standard, in such as Fig. 6 shown in (a) and (b), and example first records each point of (a) in Fig. 6 to take 12 points
After data, adjusting screw rod, electric property is changed, and change is turned in Fig. 6 (b), now re-records each point data of (b) in Fig. 6,
By comparing numerical values recited, as the example shows, Fig. 6 (a) 3,4,5 point values are bigger than Fig. 6 (b), 8,9,10 points than Fig. 6 (b)
It is small, other point difference sizes less, value 1 when can set the formula to be when each point compares, otherwise as 0, that is, after changing
Numerical value subtract change before numerical value subtract certain XdB numerical value again, here X can be any number, according to specific cavity
Fixed, after screw rod change, the position of resonance point there occurs certain change, except 3,4,5 and 8,9,10 points of changes occurred
Larger outer, the change of other points is smaller, there is certain fluctuation up and down, and now X effect is to exclude these small fluctuations, by public affairs
Formula can obtain data 000000011100, and by formula, you can data 001110000000 are obtained, can intuitively be compared by two groups of data
Compared with the moving direction for drawing resonance point, i.e., all resonance points can be adjusted in this way in passband, final adjustable
General passband position, i.e., as shown in Figure 4.
In a specific embodiment, step 103, namely described " choose the value of each sample point in pass band areas to be more than
Debud mode corresponding to the more next many trend of quantity of correspondence standard value is debugged, until each sample point in pass band areas
Value is both greater than correspondence standard value to complete the debugging to microwave device to be debugged " include:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the mark obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in quasi- performance curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, until all sample points are corresponding
All it is the 3rd mark to complete the debugging to microwave device to be debugged.
It is the substantially passband of tunable filter through the above way, specific Insertion Loss is debugged automatically in this further instruction
It is worth, inhibition point, echo etc. desired value in detail, it is interval that its passband position of example 30M as in the previous wave filter need to only monitor its
And nearby have 30 to 40 points altogether, when whole resonance points are brought in passband, debugging now is fine setting scope, by comparing
Passband data now are more than the qualified data of a corresponding standard, you can obtain a data 1, example such as Fig. 4 and Fig. 5 ratios
Compared with, when the value that all points in region are obtained all is 1, that is, when obtaining numerical value " 1111111 ", that is, meet standard,
Now also will by come determine regulation direction, be by compare screw rod regulation after electric property change quality, being can
With by 1 with 0 numeral it is how many judge whether to develop toward good direction, the automatic of wave filter can be completed by such a mode
Fine adjustment function.The shape of the final performance curve debugged is similar with the shape in Fig. 5, specifically to be each in pass band areas
The value of sample point, and the standard value that is more than is better, preferably all greater than and pass band areas and the song of the junction in other regions
Line is more steep better.
Further in trim process, the priority of the point compared in passband can also be set, be not only in comparison point
It is how much standard compliant, the priority size of also some points.For example i.e. when comparing, after 1 glyph standardization, and 2,3 points be not inconsistent
Standardization, now also belongs to the priority ratio of the category improved, i.e., 12,3 all high;In the case, it is believed that 1 point of corresponding quantity meeting
More than 2 points with 3 points data and, namely 1 point of weight ratio is higher.
In a specific embodiment, the debugging of microwave device to be debugged is carried out based on tuning plug, this method
Also include:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tune during pass band areas
The regulated quantity of humorous bar;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the microwave device to be debugged
Resonance point is completely in pass band areas in performance curve.
The automatic Memory and learning functionality of automatic debugging system are further illustrated, when in one resonance point to passband of debugging
When, PC ends can record the regulated quantity of each tuning plug, moreover it is possible to which record corresponds to different situations in the fine setting stage, often afterwards
The tuning amount of individual adjusting screw rod, records the corresponding electric property change of tuning amount and its tuning amount of each tuning plug, due to same
Money filter cavity can not possibly each of it is identical, therefore can be taken by recording multi-group data eventually through the record at PC ends excellent
Average after change, i.e., the average of the regulated quantity of each screw rod can significantly reduce regulating time, increase effect by the step
Rate.For the wave filter optimized, each relative screw rod depth of initial every cavity keeps identical, you can by adjusting before
The data of excessive platform cavity and record optimization are tried, the general depth of every screw rod can be directly calculated, you can quickly enter screw rod
The electric property of cavity is reached the stage that passband has substantially risen, the stage is quickly tried by coarse adjustment, be directly entered fine setting examination rank
Section, saves the plenty of time.
Embodiment 2
The embodiment of the invention also discloses a kind of equipment for debugging microwave device, as shown in fig. 7, comprises:
Determining module 201, for determining the performance curve of microwave device to be debugged and the pass band areas of performance curve;
First debugging module 202, the moving direction for choosing resonance point in performance curve is right for close to pass band areas
The debud mode answered is debugged, so that resonance point is completely in pass band areas;
Second debugging module 203, the quantity that correspondence standard value is more than for choosing the value of each sample point in pass band areas is got over
Carry out the debud mode corresponding to many trend to be debugged, until the value of each sample point is both greater than correspondence standard value in pass band areas
To complete the debugging to microwave device to be debugged.
In a specific embodiment, the determining module 201 is used for:
Debugging microwave device is treated by network analysis instrument to be tested, it is bent with the performance for obtaining microwave device to be debugged
Line;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences
Different standard performance curves;
The pass band areas of performance curve is determined based on acquired standard performance curve.
In a specific embodiment, first debugging module 202 is used for:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point debugs it with this before this time debugging
The difference of the numerical value of each sample point afterwards;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in
In pass band areas.
In a specific embodiment, second debugging module 203 is used for:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the mark obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in quasi- performance curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, until all sample points are corresponding
All it is the 3rd mark to complete the debugging to microwave device to be debugged.
In a specific embodiment, the debugging of microwave device to be debugged is carried out based on tuning plug, the equipment
Also include:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tune during pass band areas
The regulated quantity of humorous bar;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the microwave device to be debugged
Resonance point is completely in pass band areas in performance curve.
The embodiment of the present invention proposes a kind of method and apparatus for debugging microwave device, and wherein this method includes:It is determined that treating
Debug the performance curve of microwave device and the pass band areas of performance curve;The moving direction of resonance point is in selection performance curve
Debugged close to the debud mode corresponding to pass band areas, so that resonance point is completely in pass band areas;Choose passband area
The debud mode that the value of each sample point is more than corresponding to the more next many trend of quantity of correspondence standard value in domain is debugged, until
The value of each sample point is both greater than correspondence standard value to complete the debugging to microwave device to be debugged in pass band areas.Realized with this
A kind of method for automating debugging, improves the efficiency of debugging.
It will be appreciated by those skilled in the art that accompanying drawing is a schematic diagram for being preferable to carry out scene, module in accompanying drawing or
Flow is not necessarily implemented necessary to the present invention.
It will be appreciated by those skilled in the art that the module in device in implement scene can be described according to implement scene into
Row is distributed in the device of implement scene, can also carry out one or more dresses that respective change is disposed other than this implement scene
In putting.The module of above-mentioned implement scene can be merged into a module, can also be further split into multiple submodule.
The invention described above sequence number is for illustration only, and the quality of implement scene is not represented.
Disclosed above is only several specific implementation scenes of the present invention, and still, the present invention is not limited to this, Ren Heben
What the technical staff in field can think change should all fall into protection scope of the present invention.
Claims (10)
1. a kind of method for debugging microwave device, it is characterised in that including:
Determine the performance curve of microwave device to be debugged and the pass band areas of performance curve;
The moving direction of resonance point in performance curve is chosen to be debugged close to the debud mode corresponding to pass band areas, so that
Resonance point is completely in pass band areas;
The value of each sample point in pass band areas is chosen more than the debugging side corresponding to the more next many trend of quantity of correspondence standard value
Formula is debugged, until the value of each sample point is both greater than correspondence standard value to complete to microwave device to be debugged in pass band areas
Debugging.
2. the method as described in claim 1, it is characterised in that it is described " determine microwave device to be debugged performance curve and
The pass band areas of performance curve " includes:
Debugging microwave device is treated by network analysis instrument to be tested, to obtain the performance curve of microwave device to be debugged;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences is different
Standard performance curve;
The pass band areas of performance curve is determined based on acquired standard performance curve.
3. the method as described in claim 1, it is characterised in that described " moving direction of resonance point is in selection performance curve
Debugged close to the debud mode corresponding to pass band areas, so that resonance point is completely in pass band areas " include:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that before this time debugging each sample point with it is each after this debugging
The difference of the numerical value of sample point;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in passband
In region.
4. method as claimed in claim 1 or 2, it is characterised in that described " value for choosing each sample point in pass band areas is more than
Debud mode corresponding to the more next many trend of quantity of correspondence standard value is debugged, until each sample point in pass band areas
Value is both greater than correspondence standard value to complete the debugging to microwave device to be debugged " include:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the standard obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in energy curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, be all until all sample points are corresponding
3rd identifies to complete the debugging to microwave device to be debugged.
5. the method as described in claim 1, it is characterised in that the debugging of microwave device to be debugged is carried out based on tuning plug
, this method also includes:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tuning plug during pass band areas
Regulated quantity;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the performance of the microwave device to be debugged
Resonance point is completely in pass band areas in curve.
6. a kind of equipment for debugging microwave device, it is characterised in that including:
Determining module, for determining the performance curve of microwave device to be debugged and the pass band areas of performance curve;
First debugging module, the moving direction for choosing resonance point in performance curve is close to the debugging corresponding to pass band areas
Mode is debugged, so that resonance point is completely in pass band areas;
Second debugging module, the quantity that correspondence standard value is more than for choosing the value of each sample point in pass band areas more next many becomes
Debud mode corresponding to gesture is debugged, until the value of each sample point is both greater than correspondence standard value to complete pair in pass band areas
The debugging of microwave device to be debugged.
7. equipment as claimed in claim 6, it is characterised in that the determining module is used for:
Debugging microwave device is treated by network analysis instrument to be tested, to obtain the performance curve of microwave device to be debugged;
Information determines the standard performance curve of correspondence microwave device to be debugged according to demand;Wherein different demand information correspondences is different
Standard performance curve;
The pass band areas of performance curve is determined based on acquired standard performance curve.
8. equipment as claimed in claim 6, it is characterised in that first debugging module is used for:
Choose ghz area to be debugged in performance curve take a little, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that before this time debugging each sample point with it is each after this debugging
The difference of the numerical value of sample point;
For each sample point, if the difference is more than preset value, first is carried out to the sample point and is identified;
If the difference is not more than preset value, second is carried out to the sample point and is identified;
The moving direction of resonance point is determined according to the moving direction of the first of each sample point the mark and the second mark;
Moving direction is chosen to be debugged close to the debud mode corresponding to pass band areas, until resonance point is completely in passband
In region.
9. equipment as claimed in claims 6 or 7, it is characterised in that second debugging module is used for:
Carry out taking a little for pass band areas, obtain multiple sample points;
For debugging each time to microwave device to be debugged, it is determined that each sample point and the standard obtained in advance after this time debugging
The difference of the numerical value of each sample point of identical in energy curve;
For each sample point, if the difference is more than preset value, the 3rd is carried out to the sample point and is identified;
If the difference is not more than preset value, the 4th is carried out to the sample point and is identified;
Gradually become many debud modes by the quantity of the mark of selection the 3rd to be debugged, be all until all sample points are corresponding
3rd identifies to complete the debugging to microwave device to be debugged.
10. equipment as claimed in claim 6, it is characterised in that the debugging of microwave device to be debugged is entered based on tuning plug
Capable, the equipment also includes:
Record resonance point in the performance curve of multiple microwave devices to be debugged and be completely in corresponding each tuning plug during pass band areas
Regulated quantity;
The regulation average of each tuning plug is determined based on the regulated quantity recorded;
Next microwave device to be debugged is adjusted based on the regulation average, to cause the performance of the microwave device to be debugged
Resonance point is completely in pass band areas in curve.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710414164.2A CN107132471B (en) | 2017-06-05 | 2017-06-05 | Method and equipment for debugging microwave device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710414164.2A CN107132471B (en) | 2017-06-05 | 2017-06-05 | Method and equipment for debugging microwave device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107132471A true CN107132471A (en) | 2017-09-05 |
CN107132471B CN107132471B (en) | 2020-02-28 |
Family
ID=59733737
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710414164.2A Active CN107132471B (en) | 2017-06-05 | 2017-06-05 | Method and equipment for debugging microwave device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107132471B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110911797A (en) * | 2019-11-27 | 2020-03-24 | 武汉心浩智能科技有限公司 | Automatic debugging equipment for dielectric filter |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5809037A (en) * | 1996-04-12 | 1998-09-15 | Arm Limited | Integrated circuit testing |
CN101470163A (en) * | 2007-12-27 | 2009-07-01 | 奥雷通光通讯设备(上海)有限公司 | Debugging method for filter |
CN102164012A (en) * | 2011-04-01 | 2011-08-24 | 江苏苏美达机电有限公司 | Automatic debugging system for radio-frequency signal products |
US20130103995A1 (en) * | 2007-05-07 | 2013-04-25 | Texas Instruments Incorporated | Blocking the effects of scan chain testing upon a change in scan chain topology |
CN105067921A (en) * | 2015-08-04 | 2015-11-18 | 武汉凡谷电子技术股份有限公司 | Filter automatic debugging system based on double three-axis motion mechanical arm |
CN205863352U (en) * | 2016-06-28 | 2017-01-04 | 深圳市威富通讯技术有限公司 | Adjustable microwave filter appearance flies |
CN205944374U (en) * | 2016-07-18 | 2017-02-08 | 深圳市威通科技有限公司 | Automatic debug system of duplexer |
CN106505975A (en) * | 2016-10-17 | 2017-03-15 | 中国电子科技集团公司第五十四研究所 | A kind of automatic calibrating frequency algorithm of electrically tunable filter |
US20170074932A1 (en) * | 2014-05-29 | 2017-03-16 | Universiteit Gent | Integrated circuit verification using parameterized configuration |
-
2017
- 2017-06-05 CN CN201710414164.2A patent/CN107132471B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5809037A (en) * | 1996-04-12 | 1998-09-15 | Arm Limited | Integrated circuit testing |
US20130103995A1 (en) * | 2007-05-07 | 2013-04-25 | Texas Instruments Incorporated | Blocking the effects of scan chain testing upon a change in scan chain topology |
CN101470163A (en) * | 2007-12-27 | 2009-07-01 | 奥雷通光通讯设备(上海)有限公司 | Debugging method for filter |
CN102164012A (en) * | 2011-04-01 | 2011-08-24 | 江苏苏美达机电有限公司 | Automatic debugging system for radio-frequency signal products |
US20170074932A1 (en) * | 2014-05-29 | 2017-03-16 | Universiteit Gent | Integrated circuit verification using parameterized configuration |
CN105067921A (en) * | 2015-08-04 | 2015-11-18 | 武汉凡谷电子技术股份有限公司 | Filter automatic debugging system based on double three-axis motion mechanical arm |
CN205863352U (en) * | 2016-06-28 | 2017-01-04 | 深圳市威富通讯技术有限公司 | Adjustable microwave filter appearance flies |
CN205944374U (en) * | 2016-07-18 | 2017-02-08 | 深圳市威通科技有限公司 | Automatic debug system of duplexer |
CN106505975A (en) * | 2016-10-17 | 2017-03-15 | 中国电子科技集团公司第五十四研究所 | A kind of automatic calibrating frequency algorithm of electrically tunable filter |
Non-Patent Citations (1)
Title |
---|
张永亮 等: "一种改进的微波滤波器调试方法", 《强激光与粒子束》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110911797A (en) * | 2019-11-27 | 2020-03-24 | 武汉心浩智能科技有限公司 | Automatic debugging equipment for dielectric filter |
CN110911797B (en) * | 2019-11-27 | 2021-07-06 | 武汉心浩智能科技有限公司 | Automatic debugging equipment for dielectric filter |
Also Published As
Publication number | Publication date |
---|---|
CN107132471B (en) | 2020-02-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE102013110222B4 (en) | Apparatus and method for quadrature clock signal generation | |
DE202012013740U1 (en) | Power supply circuit of a power amplifier and terminal | |
DE60215450T2 (en) | Method and device for controlling the dynamic range of a receiver | |
DE60316517T2 (en) | Method and device for recording interference signals | |
CN108092626A (en) | A kind of broadband Larger Dynamic down conversion module | |
CN107132471A (en) | A kind of method and apparatus for debugging microwave device | |
CN105990632A (en) | Three-pass band filter | |
DE60035941T2 (en) | Monitoring of bleed coefficients in a decision feedback equalizer | |
DE112016001070T5 (en) | Radio Frequency System Hybrid Power Amplifier Systems And Methods | |
CN103715990B (en) | A kind of down conversion system in multichannel broadband | |
CN109490737B (en) | Universal method and device for frequency expansion multi-parameter automatic test of microwave semiconductor device | |
DE60102913T2 (en) | Method and device for measuring a signal spectrum | |
DE102004051384A1 (en) | Method, device and article of manufacture for producing symmetrical high-frequency circuits | |
DE202013102235U1 (en) | Network Signal Coupling and EMI Protection Circuit | |
CN106707771A (en) | Test method and system for intelligent appliance | |
DE10153764A1 (en) | TV-adjustment system | |
CN107769802A (en) | A kind of disposable phase controlling intelligent regulator method of radio-frequency module based on wave filter | |
CN207782758U (en) | A kind of broadband Larger Dynamic down conversion module | |
CN103227763A (en) | Variable inter symbol interference generator | |
CN106899360A (en) | The method and its terminal of antenna match debugging | |
CN107276687B (en) | A kind of common-mode noise removing method and device | |
CN106130674A (en) | A kind of repeater band intercarrier leak suppressing method of testing and device | |
CN104202095B (en) | A kind of method and apparatus reducing base station bottom noise | |
CN108907453B (en) | Laser processing analysis device and method with self-learning function | |
CN106990302A (en) | A kind of wave filter debugging system and adjustment method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |