CN107086050A - A kind of pump body structure and electronic installation for many time-program(me) memories - Google Patents

A kind of pump body structure and electronic installation for many time-program(me) memories Download PDF

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Publication number
CN107086050A
CN107086050A CN201610087267.8A CN201610087267A CN107086050A CN 107086050 A CN107086050 A CN 107086050A CN 201610087267 A CN201610087267 A CN 201610087267A CN 107086050 A CN107086050 A CN 107086050A
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CN
China
Prior art keywords
pump
clock
body structure
pump body
resistance
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Pending
Application number
CN201610087267.8A
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Chinese (zh)
Inventor
權彞振
倪昊
赵子鉴
程昱
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Manufacturing International Shanghai Corp
Semiconductor Manufacturing International Beijing Corp
Original Assignee
Semiconductor Manufacturing International Shanghai Corp
Semiconductor Manufacturing International Beijing Corp
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Priority to CN201610087267.8A priority Critical patent/CN107086050A/en
Publication of CN107086050A publication Critical patent/CN107086050A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/12Programming voltage switching circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits

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Abstract

The present invention provides a kind of pump body structure and electronic installation for many time-program(me) memories.The pump body structure includes:Voltage detection unit, is configurable for the multiple different voltages of detection;Pump clock selecting unit, is configurable for the voltage detected based on the voltage detector, using resistance selection come controlling pump output clock frequency;And pump clock generating unit, the pump clock output frequency based on pump clock selecting unit output is configurable for generate pump clock.The pump body structure for many time-program(me) memories of the present invention can generate different pump clocks for very wide voltage range, so as to reduce power consumption.

Description

A kind of pump body structure and electronic installation for many time-program(me) memories
Technical field
The present invention relates to semiconductor applications, in particular it relates to which one kind is deposited for many time-program(me)s The pump body structure and electronic installation of reservoir.
Background technology
MTP (multiple-time-programmable) memory is current emerging non-volatile memory Device.In addition to the programmed and erased to memory cell, it is also to being read correctly for data of memory cell Whole memory key operation.With the increase of application demand, low supply voltage low-power consumption has become The design and developing direction of nonvolatile storage.Because the various parasitic capacitances on bit line are not with work Make the reduction of voltage and the decline of operating current and reduced.
For MTP (many time-program(me)s) memory application for wide-range power, it is necessary to consider pin To the pump drivability of the power supply of all scopes.For low VCC scopes, it is necessary to meet the pump rule of program Model and remove some performances, and for high VCC situation, it is necessary to minimize power consumption and Leakage Current.
Accordingly, it is desirable to provide a kind of pump body structure, to solve issue noted above at least in part.
The content of the invention
In view of the shortcomings of the prior art, the pump body structure for many time-program(me) memories of the invention is directed to Very wide voltage range can generate different pump clocks, so as to reduce power consumption.The present invention is by detecting electricity Source, and change pump clock to minimize the pump interval for same pump performance according to the power supply detected (pump gap)。
Embodiments of the invention provide a kind of pump body structure for many time-program(me) memories, the pump housing Structure includes:Voltage detection unit, is configurable for the multiple different voltages of detection;Pump clock selecting Unit, is configurable for the voltage detected based on the voltage detector, utilizes resistance selection Carry out controlling pump output clock frequency;And pump clock generating unit, when being configurable for being based on the pump The pump clock output frequency of clock selecting unit output generates pump clock.
Exemplarily, the pump clock output frequency and the impedance of the resistance are inversely proportional.
Exemplarily, the pump clock selecting unit includes the first resistor and first switch being connected in parallel, One end of wherein described first resistor is connected with the source electrode of the first switch, the first resistor it is another One end is connected with the drain electrode of the first switch.
Exemplarily, the pump clock selecting unit also includes second resistance and the second switch being connected in parallel, One end of wherein described second resistance is connected with the source electrode of the second switch, the second resistance it is another One end is connected with the drain electrode of the second switch.
Another embodiment of the present invention provides a kind of method for pump body structure, and methods described includes:Inspection Survey multiple different temperature;And based on the temperature detected, biased using multiple different references Carry out controlling pump output biasing.
Another embodiment of the present invention provides a kind of electronic installation, including described is deposited for many time-program(me)s The pump body structure of reservoir.
The pump body structure for many time-program(me) memories of the present invention is directed to very wide voltage range can be with The different pump clock of generation, so as to reduce power consumption.
Brief description of the drawings
By the way that the embodiment of the present invention is described in more detail with reference to accompanying drawing, it is of the invention above-mentioned and Other purposes, feature and advantage will be apparent.Accompanying drawing is used for providing to the embodiment of the present invention Further understand, and constitute a part for specification, be used to explain this together with the embodiment of the present invention Invention, is not construed as limiting the invention.In the accompanying drawings, identical reference number typically represents phase With part or step.
Fig. 1 is the schematic block diagram of usual pump body structure of the prior art;
Fig. 2 is the schematic block diagram of the pump body structure for many time-program(me) memories according to the present invention;
Fig. 3 shows for the pump body structure for many time-program(me) memories according to embodiments of the invention Meaning property block diagram;
Fig. 4 is the clock selecting block schematic circuit according to embodiments of the invention;
Fig. 5 is the imitative of the pump body structure for many time-program(me) memories according to embodiments of the invention The schematic diagram of true result;
Fig. 6 is the schematic diagram of the electronic installation according to embodiments of the invention;And
Fig. 7 is the schematic diagram of the another electronic installation according to embodiments of the invention.
Embodiment
Become apparent in order that obtaining the object, technical solutions and advantages of the present invention, below with reference to accompanying drawings in detail Thin description is according to example embodiment of the invention.Obviously, described embodiment is only the one of the present invention Section Example, rather than whole embodiments of the invention, it should be appreciated that the present invention is not by described herein The limitation of example embodiment.Based on the embodiment of the present invention described in the present invention, those skilled in the art exist All other embodiment obtained by not paying in the case of creative work should all fall into the guarantor of the present invention Within the scope of shield.
It should be understood that be referred to as when element or layer " ... on ", " with ... it is adjacent ", " being connected to " or " coupling Close " other elements or layer when, its can directly on other elements or layer, it is adjacent thereto, connection Or other elements or layer are coupled to, or there may be element or layer between two parties.On the contrary, when element is claimed For " on directly existing ... ", " with ... direct neighbor ", " being directly connected to " or " being directly coupled to " other members When part or layer, then in the absence of element or layer between two parties.Although it should be understood that term first, the can be used 2nd, the third various elements of description, part, area, floor and/or part, these elements, part, area, Layer and/or part should not be limited by these terms.These terms be used merely to distinguish element, part, Area, floor or part and another element, part, area, floor or part.Therefore, the present invention is not being departed from Under teaching, the first element discussed below, part, area, floor or part be represented by the second element, Part, area, floor or part.
Spatial relationship term for example " ... under ", " ... below ", " below ", " ... under ", " ... on ", " above " etc., it can for convenience describe and be used so as in description figure herein A shown element or feature and other elements or the relation of feature.It should be understood that except shown in figure Orientation beyond, spatial relationship term be intended to also including the use of the different orientation with the device in operation.Example Such as, if device upset in accompanying drawing, then, it is described as " below other elements " or " its it Under " or " under it " element or feature will be oriented to other elements or feature " on ".Therefore, example Property term " ... below " and " ... under " may include it is upper and lower two orientation.Device can additionally take Correspondingly explained to (being rotated by 90 ° or other orientations) and spatial description language as used herein.
The purpose of term as used herein is only that description specific embodiment and not as the limit of the present invention System.Herein in use, " one " of singulative, " one " and " described/should " be also intended to include plural number Form, unless context is expressly noted that other mode.It is also to be understood that term " composition " and/or " comprising ", When in this specification in use, determining the feature, integer, step, operation, element and/or part Presence, but be not excluded for one or more other features, integer, step, operation, element, part And/or the presence or addition of group.Herein in use, term "and/or" includes any of related Listed Items And all combinations.
In order to thoroughly understand the present invention, detailed step and detailed knot will be proposed in following description Structure, to explain technical scheme.Presently preferred embodiments of the present invention is described in detail as follows, but In addition to these detailed descriptions, the present invention can also have other embodiment.
First, pump body structure usual in the prior art is introduced.
Fig. 1 is the schematic block diagram of usual pump body structure of the prior art.
As shown in figure 1, usual pump body structure includes multiple modular pumps, pump clock, and pump control mechanism. It is biased using the pump of the clock of fixed frequency and generation with 4 phases.In 10% excursion Source condition, under the conditions of high VCC, by fixed pump clock, very big power consumption is not had.
Pump body structure shown in Fig. 1 utilizes +/- the 10% of power supply, therefore by identical pump clock, can be with Do not vary widely.But, for a wide range of application, VCC needs to cover from 1.8V to 3.6V Scope.Under the power bracket, pump drivability may be very different.It means that at least for Low VCC conditions design pump, and for high VCC situations, pump output is very strong, and can to regulation Device sets target level to produce burden, therefore the biasing of peak value pump and current drain occurs.This main original Because being, under low power supply and high source condition, identical pump clock has been used.
The present invention's provides a kind of pump body structure for many time-program(me) memories.The pump body structure is utilized Voltage detecting and different clocks, available for wide range of power supply, and with low-power consumption.
Below, reference picture 2 come specifically describe the present invention a kind of pump housing for many time-program(me) memories Structure.
Fig. 2 is the schematic block diagram of the pump body structure for many time-program(me) memories according to the present invention. As shown in Fig. 2 the pump body structure of the embodiment of the present invention includes:
Voltage detection unit, is configurable for the multiple different voltages of detection;
Pump clock selecting unit, is configurable for the voltage detected based on the voltage detector, Using resistance selection come controlling pump output clock frequency;And
Pump clock generating unit, is configurable for the pump exported based on the pump clock selecting unit Output clock frequency generates pump clock.
, can between low VCC2 and high VCC2 for wide pump voltage (1.8V~3.6V) scope With corresponding different pump drivability and current loss.Voltage detection unit in the present embodiment is realized For many detections, it means that VCC2 levels can detect different clock frequencies, for example, low VCC2 feelings Under shape, using faster frequency, and medium VCC2, then using intermediate frequency, and high VCC2 situations Under, the slower frequency of use.These operations be as detected by VCC2 bias detections, and can be from Dynamic change frequency.
Voltage detection unit in the present embodiment can be usual voltage detection unit, unlike, institute What is carried out is the detection of multivoltage level.Detection level in the present embodiment can with the more than three stage, and And can control more clock frequencies.Final pump output is more stablized than the pump output in conventional method.
VCC detection circuits use usual method, and it generates the signal of many steps.These signals enter Enter the clock frequency block in pump clock generating unit, wherein generating the clock cycle, and utilize resistance selection. Corresponding clock resistance option is selected by different detection level signals.Voltage detecting is automatically generated , and these signals automatically control clock cycle resistance selection.
Exemplarily, the pump clock output frequency and the impedance of the resistance are inversely proportional.For example, higher Impedance produce slower clock, and lower impedance produces faster clock.
Pump clock generating unit in the present embodiment can be usual clock generating unit.In the present embodiment Resistance selection mean there are different controlled clock frequencies.Mainly, the VCC2 of wide scope, by not With voltage detecting and corresponding clock frequency realize different controlled pump output level.
In the present embodiment, by voltage detecting and flexible clock control, there is provided for wide scope The low power dissipation design of voltage application.For minimum Power Supplies Condition and highest Power Supplies Condition, pump can be optimized Drivability and power consumption.In addition, in the present embodiment, for different source bias, using different Clock.Power detection can generate different signals and automatically control pump housing selection.
Embodiment one
Fig. 3 shows for the pump body structure for many time-program(me) memories according to embodiments of the invention Meaning property block diagram.
As shown in figure 3, the pump body structure for many time-program(me) memories in the present invention includes multiple lists First pump, pump clock, VCC2 detections, clock selecting, pump bias regulator, and the generation of pump clock. Compared with usual pump body structure, which are added VCC2 detections and clock selecting, it is used for according to difference Voltage generates different clock frequencies.That is, for low VCC and high VCC scopes, change different Pump clock.Power consumption and the lower peak point current of acquisition can be reduced by so doing.Detecting different VCC water After flat, by aforesaid operations, clock and VCC can be minimized.Unlike this, usual pump housing knot Structure, for a wide range of application (VCC needs to cover the scope from 1.8V to 3.6V), passes through phase Same pump clock, pump drivability may be very different.It means that coming at least for low VCC conditions Pump is designed, and for high VCC situations, pump output is very strong, and target level can be set to adjuster Burden is produced, therefore the biasing of peak value pump and current drain occurs.
VCC detection circuits use usual method, and it generates many step (VD33, VD30, VD26 Deng) signal.The clock frequency block that these signals enter in pump clock generating unit, wherein generating clock Cycle, and utilize resistance selection.Corresponding clock resistance is selected by different detection level signals Option.What voltage detecting was automatically generated, and these signals automatically control clock cycle resistance selection.
Because for low VCC, to high VCC scopes, pump drivability is different, therefore in high VCC In situation, use slower clock cycle and lower pump drivability, so as to obtain lower power consumption. In low VCC situations, it is possible to increase clock simultaneously uses higher drivability.The pump drivability of minimum It is low VCC situations, and high VCC conditions need to consider low-power consumption and lower output peak bias.It is main Strategic point, the varying level marked off for wide VCC scopes and the unlike signal detected, using not The same clock cycle.Unlike this, usual pump configuration illustrate only a kind of clock for all power supplys, Thus for high Power Supplies Condition, pump drivability is excessive.
In the present embodiment, by voltage detecting and flexible clock control, there is provided for wide scope The low power dissipation design of voltage application.For minimum Power Supplies Condition and highest Power Supplies Condition, pump can be optimized Drivability and power consumption.In addition, in the present embodiment, for different source bias, using different Clock.Power detection can generate different signals and automatically control pump housing selection.
The main concept of the present embodiment is to be directed to wide range of power supply application, in order to provide low-power consumption, is made With the pump housing led come controlling pump, and this control is to detect to realize by VCC.Usual VCC Detection can generate many VCC levels and the different clock cycle applied.Therefore, high VCC situations Under, using low frequency, and under low VCC situations, use high-frequency.Therefore, for the total of all scopes Power consumption is not varied widely.It can reduce the peak point current under the conditions of high VCC.
Embodiments of the invention are under high Power Supplies Condition, with lower loss, and low peak pump is biased, with And the electric current of activity.Meanwhile, for different Power Supplies Conditions, with the similar pump rate of climb.Power supply Detection and flexible clock control cause the detection level for having many for wide range of power supply, for institute The power level detected, produces different pump clocks, and defined and changed by most slow and minimum level Pump cycle is all the time become.
Fig. 4 is the schematic circuit of the clock selecting block according to embodiments of the invention.
As shown in figure 4, clock selecting block includes the circuit in usual clock generation unit point and the present embodiment Selected section.Using voltage detection signal (VD26~VD33), according to different signals change frequency and Pump drivability.By using PMOS, resistance option value causes the different clock cycle.
VCC detection circuits use usual method, and it generates many step (VD33, VD30, VD26 Deng) signal.The clock frequency block that these signals enter in pump clock generating unit, wherein generating clock Cycle, and utilize resistance selection.Corresponding clock resistance is selected by different detection level signals Option.What voltage detecting was automatically generated, and these signals automatically control clock cycle resistance selection.
In the present embodiment, main operating point is to enter " PBIAS " (source bias) knee level, Under the knee level, clock frequency (for example, CLK1 and CLK2 shown in Fig. 4) can be changed. Certainly, the circuit may also include more resistance and switch, to control more clock frequencies.
VD23, VD26, VD30 and VD36 signal are the voltage detecting output for each source bias Signal.The default value of these signals is " L ", it means that be not loaded into any resistance R1, R2, R3, R4.If detecting VD26, VD26 is changed into " L ", and this causes R2 resistance to be added into PBIAS Pattern, so that cause the increase of PBIAS levels, thus CLK1 and CLK2 are slower than acquiescence.This meaning Taste, which higher VD detected values, will cause slower clock, and so as to reduce the drivability of pump.
Exemplarily, the pump clock selecting unit includes the first resistor being connected in parallel (such as institute in Fig. 4 Show R1) and first switch, wherein one end of the first resistor is connected with the source electrode of the first switch, The other end of the first resistor is connected with the drain electrode of the first switch.
Exemplarily, the pump clock selecting unit also includes the second resistance being connected in parallel (in such as Fig. 4 Shown R2) and second switch, wherein one end of the second resistance is connected with the source electrode of the second switch Connect, the other end of the second resistance is connected with the drain electrode of the second switch.
Exemplarily, the pump clock selecting unit also includes the 3rd resistor being connected in parallel (in such as Fig. 4 Shown R3) and the 3rd switch, wherein one end of the 3rd resistor is connected with the source electrode of the described 3rd switch Connect, the other end of the 3rd resistor is connected with the drain electrode of the described 3rd switch.
Exemplarily, the pump clock selecting unit also includes the 4th resistance being connected in parallel (in such as Fig. 4 Shown R4) and the 4th switch, wherein one end of the 4th resistance is connected with the source electrode of the described 4th switch Connect, the other end of the 4th resistance is connected with the drain electrode of the described 4th switch.Herein, voltage detecting Level can be more than four-stage.That is, the pump clock selecting unit in the present embodiment can include more Resistance and switch are to tackle broader voltage range.
Embodiments of the invention are under high Power Supplies Condition, with lower loss, and low peak pump is biased, with And the electric current of activity.Meanwhile, for different Power Supplies Conditions, with the similar pump rate of climb.Power supply Detection and flexible clock control cause the detection level for having many for wide range of power supply, for institute The power level detected, produces different pump clocks, and defined and changed by most slow and minimum level Pump cycle is all the time become.
Fig. 5 is the imitative of the pump body structure for many time-program(me) memories according to embodiments of the invention The schematic diagram of true result.As shown in figure 5, the pump rate of climb is close to low VCC conditions, therefore in height Under the conditions of VCC, current loss is smaller than usual situation.During the first pump is biased, setting level is higher than Peak value and stablize afterwards, because under the conditions of high VCC, pump drivability is very high.Fig. 4 show by The different clocks cycle (5~20MHz) that VCC detection signals are generated.Also, pump sets the time similar In situation slower low VCC rather than faster.
Embodiment two
Yet another embodiment of the present invention provides a kind of electronic installation, and the electronic installation includes embodiment one The described pump body structure for many time-program(me) memories.
Fig. 6 is the schematic diagram of the electronic installation according to embodiments of the invention.Fig. 7 is according to the present invention's The schematic diagram of the another electronic installation of embodiment.
As shown in Figure 6 to 7, the electronic installation of the present embodiment can be tablet personal computer (in such as Fig. 6 Shown device 600) and mobile phone (device 700 as shown in Figure 7).In addition, the electricity of the present embodiment Sub-device also includes but is not limited to, notebook computer, net book, game machine, television set, VCD, DVD, Any electronic product such as navigator, camera, video camera, recording pen, MP3, MP4, PSP is set It is standby, or any intermediate products including the semiconductor devices.
The electronic installation of the embodiment of the present invention, the above-mentioned pump body structure due to having used, thus equally have Above-mentioned advantage.
Although describing example embodiment by reference to accompanying drawing here, it should be understood that above-mentioned example embodiment is only It is exemplary, and is not intended to limit the scope of the invention to this.Those of ordinary skill in the art can To make various changes and modifications wherein, it is made without departing from the scope of the present invention and spirit.It is all these to change Become and modification is intended to be included within the scope of the present invention required by appended claims.

Claims (5)

1. a kind of pump body structure for many time-program(me) memories, it is characterised in that the pump housing knot Structure includes:
Voltage detection unit, is configurable for the multiple different voltages of detection;
Pump clock selecting unit, is configurable for the voltage detected based on the voltage detector, Using resistance selection come controlling pump output clock frequency;And
Pump clock generating unit, is configurable for the pump exported based on the pump clock selecting unit Output clock frequency generates pump clock.
2. pump body structure according to claim 1, it is characterised in that the pump clock output frequency Impedance with the resistance is inversely proportional.
3. pump body structure according to claim 1 or 2, it is characterised in that the pump clock selecting Unit includes the first resistor and first switch that are connected in parallel, wherein one end of the first resistor with it is described The source electrode of first switch is connected, and the other end of the first resistor is connected with the drain electrode of the first switch Connect.
4. pump body structure according to claim 3, it is characterised in that the pump clock selecting unit Also include the second resistance that is connected in parallel and second switch, wherein one end of the second resistance and described the The source electrode of two switches is connected, and the other end of the second resistance is connected with the drain electrode of the second switch.
5. it is used for many time-program(me) memories a kind of electronic installation, including described in one of claim 1-4 Pump body structure.
CN201610087267.8A 2016-02-16 2016-02-16 A kind of pump body structure and electronic installation for many time-program(me) memories Pending CN107086050A (en)

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Application Number Priority Date Filing Date Title
CN201610087267.8A CN107086050A (en) 2016-02-16 2016-02-16 A kind of pump body structure and electronic installation for many time-program(me) memories

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US20100171545A1 (en) * 2005-09-29 2010-07-08 Kim Jae-Il High voltage generator and word line driving high voltage generator of memory device
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CN102183983A (en) * 2011-03-03 2011-09-14 山东华芯半导体有限公司 Method for implementing charge pump keeping constant output current, and charge pump thereof
US20120155168A1 (en) * 2010-12-20 2012-06-21 Samsung Electronics Co., Ltd. Negative voltage generator, decoder, nonvolatile memory device and memory system using negative voltage
CN103578549A (en) * 2012-07-23 2014-02-12 飞思卡尔半导体公司 Configurable multistage charge pump using a supply detect scheme

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62262118A (en) * 1986-05-08 1987-11-14 Nec Corp One chip microcomputer
US20100171545A1 (en) * 2005-09-29 2010-07-08 Kim Jae-Il High voltage generator and word line driving high voltage generator of memory device
CN101098104A (en) * 2006-06-27 2008-01-02 中兴通讯股份有限公司 Device for optimizing charge pump of integrated circuit and method therefor
KR100881540B1 (en) * 2007-11-12 2009-02-05 주식회사 하이닉스반도체 Oscillator circuit for semiconductor memory device
CN101667774A (en) * 2008-09-02 2010-03-10 北京芯技佳易微电子科技有限公司 Closed-loop control charge pump circuit
US20100301830A1 (en) * 2009-05-29 2010-12-02 In Soo Wang Semiconductor device including voltage generator
US20120155168A1 (en) * 2010-12-20 2012-06-21 Samsung Electronics Co., Ltd. Negative voltage generator, decoder, nonvolatile memory device and memory system using negative voltage
CN102543186A (en) * 2010-12-20 2012-07-04 三星电子株式会社 Negative voltage generator, decoder, nonvolatile memory device and memory system
CN102183983A (en) * 2011-03-03 2011-09-14 山东华芯半导体有限公司 Method for implementing charge pump keeping constant output current, and charge pump thereof
CN103578549A (en) * 2012-07-23 2014-02-12 飞思卡尔半导体公司 Configurable multistage charge pump using a supply detect scheme

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