CN107045074A - A kind of needle tip of scanning tunnel microscope preparation facilities and preparation method thereof - Google Patents

A kind of needle tip of scanning tunnel microscope preparation facilities and preparation method thereof Download PDF

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Publication number
CN107045074A
CN107045074A CN201710370403.9A CN201710370403A CN107045074A CN 107045074 A CN107045074 A CN 107045074A CN 201710370403 A CN201710370403 A CN 201710370403A CN 107045074 A CN107045074 A CN 107045074A
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China
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probe column
corroded
solution
driving part
filamentary silver
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CN201710370403.9A
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CN107045074B (en
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张敬涵
孙文博
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Tsinghua University
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Tsinghua University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16Probes, their manufacture, or their related instrumentation, e.g. holders

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The present invention relates to PSTM field, more particularly to a kind of needle tip of scanning tunnel microscope preparation facilities and preparation method thereof.Including probe column, solution tank, solution tower and the driving part of travel distance can be determined, the driving part is connected with the probe column, the solution tank is arranged on below the probe column, filamentary silver one end to be corroded is fixedly installed on the probe column, the filamentary silver other end to be corroded, which can be released, to be plugged in the solution tower, the probe column is internally provided with fixed value resistance, and the fixed value resistance is connected with filamentary silver to be corroded, and the fixed value resistance has been arranged in parallel micro-control plate.Driving part drives probe column to be moved to solution tower, when the voltage of micro-control plate detection fixed value resistance is not equal to 0, driving part stops advancing, probe column does reciprocal telescopic, filamentary silver to be corroded is corroded, and when the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum amount of voltage that, solution tower and probe column are stopped, driving part is retracted, and corrosion terminates.

Description

A kind of needle tip of scanning tunnel microscope preparation facilities and preparation method thereof
Technical field
The present invention relates to PSTM field, more particularly to a kind of needle tip of scanning tunnel microscope preparation facilities and Its preparation method.
Background technology
At present, according to document " Automated electrochemical etching and polishing of " corrosion of electrochemistry liquid-film method prepares STM and visited for silver scanning tunneling microscope tips " and document The record of pin and its scanning application ", while manually monitoring, also needs artificial constantly operation, it is manual that needle point contacts needs with liquid film Adjusting knob moves microscope carrier;During reciprocating motion, each translation distance and in the horizontal direction make a concerted effort by In manually operated, there is very big error, the shape to needle point has a significant impact.Corrosion needs carefully to repair liquid with dropper before starting Thickness is thin;If solution film ruptures in corrosion process, need dropper again to solution is added dropwise on solution ring, due to artificial operation, So the position of dropwise addition solution, angle, quality all have different possibility every time, this adds many in whole corrosion process Uncontrollable factor.If solution ring is not added solution in time, then metallic wire tip may because it is exposed in an atmosphere and It is contaminated, influence is produced on ensuing corrosion.In addition, whole device does not reuse residual solution, but use absorbent cotton Absorb, can so cause unnecessary waste.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of needle tip of scanning tunnel microscope preparation facilities, solve artificial The problem of operation and monitoring influence tips quality, inefficiency and corrosion process solution waste serious.
The technical scheme that the present invention solves above-mentioned technical problem is as follows:A kind of needle tip of scanning tunnel microscope preparation facilities, Including probe column, solution tank, solution tower and the driving part of travel distance can be determined, the driving part connects with the probe column Connect, the solution tank is arranged on below the probe column, and filamentary silver one end to be corroded is fixedly installed on the probe column, described to treat The corrosion filamentary silver other end, which can be released, to be plugged in the solution tower, and the probe column is internally provided with fixed value resistance, the definite value Resistance is connected with filamentary silver to be corroded, and the fixed value resistance has been arranged in parallel micro-control plate.
Further, the driving part includes screw mandrel stepper motor, turntable and rotary mounting seat, the screw mandrel stepping electricity Machine is fixedly installed on the turntable, and the turntable bottom is rotatable to be plugged on the rotary mounting seat, the rotation Motor start switch is provided with mounting seat, the turntable side can release formula with the motor start switch and offset, described Micrometer caliper is provided with screw mandrel stepper motor.
Further, the probe column includes releasing drive disk assembly, piezoelectric ceramics and needle point connection member, the releasing transmission Part is connected by rotor with the probe column, and the needle point connection member passes through the piezoelectric ceramics and the releasing driving section Part is connected.
Further, the releasing drive disk assembly includes bearing and connector, and the bearing is set on the outside of the rotor, institute State and be fixedly connected on the inside of bearing with the rotor, the connector is set on the outside of the bearing, the connector inner side and institute Fixed clamping on the outside of bearing is stated, the piezoelectric ceramics is fixedly connected with the connector.
Further, the needle point connection member includes hold assembly and hold assembly fixture, and the hold assembly is fixed Part side is fixedly connected with the piezoelectric ceramics, and the hold assembly fixture opposite side detachably connects with the hold assembly Connect, the filamentary silver to be corroded is folded on the inside of the hold assembly.
Further, the solution tower includes pedestal, peristaltic pump, conduit and annular platinoiridita ring, and the solution Taka is located at institute State on pedestal, the annular platinoiridita ring is arranged on the outside of the top of the pedestal, the peristaltic pump and is provided with catheter channel, described Conduit is arranged in the catheter channel, and the tube at one end is connected with the solution tank, and the conduit other end is arranged on institute State at annular platinoiridita ring position.
The present invention provides a kind of needle tip of scanning tunnel microscope preparation facilities, including probe column, solution tank, solution tower and can The driving part of travel distance is determined, the driving part is connected with the probe column, and the solution tank is arranged on the probe Below tower, filamentary silver one end to be corroded is fixedly installed on the probe column, and the filamentary silver other end to be corroded, which can be released, to be plugged in In the solution tower, the probe column is internally provided with fixed value resistance, and the fixed value resistance is connected with filamentary silver to be corroded, described fixed Value resistor coupled in parallel is provided with micro-control plate.So, driving part drives probe column to be moved to solution tower, inserts molten in filamentary silver to be corroded During one slight depth of liquid, loop conducting, loop current, which has, compares significantly transition, if current jump is steeper , then the fixed value resistance both end voltage connected with filamentary silver to be corroded can then be changed significantly, then can just pass through definite value Resistance both end voltage change come judge filamentary silver insert solution critical condition, micro-control plate detection fixed value resistance voltage be not equal to When 0, driving part stops advancing, and probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded, micro-control plate detection fixed value resistance When voltage is less than or equal to minimum amount of voltage that, solution tower and probe column are stopped, and driving part is retracted into original position, corrosion knot Beam.This have the advantage that in terms of existing technologies:Without manually operating and monitoring, tips quality obtains effective guarantee, work Make efficiency high and the repeatable utilization of corrosion process solution, it is to avoid waste, it is cost-effective.
The present invention also provides a kind of method that needle tip of scanning tunnel microscope preparation facilities prepares needle point, including following step Suddenly:
S1:Will filamentary silver insertion probe column one end be corroded;
S2:Driving part drives probe column to be moved to solution tower;
S3:Whether the voltage of micro-control plate detection fixed value resistance is equal to 0, and voltage is equal to 0, repeat step 2;
S4:Driving part stops advancing, and probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded;
S5:Whether the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum amount of voltage that, and voltage is more than minimum amount of voltage that, Repeat step 4;
S6:Solution tower and probe column are stopped, and driving part is retracted into original position, and corrosion terminates.
So, driving part drives probe column to be moved to solution tower, and one slight depth of solution is inserted in filamentary silver to be corroded When, loop conducting, loop current, which has, compares significantly transition, if current jump is steeper, then with waiting to corrode The fixed value resistance both end voltage of filamentary silver series connection can then be changed significantly, then just can be by the change of fixed value resistance both end voltage Change to judge that filamentary silver inserts the critical condition of solution, when the voltage of micro-control plate detection fixed value resistance is not equal to 0, driving part stops Advance, probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded, the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum During magnitude of voltage, solution tower and probe column are stopped, and driving part is retracted into original position, and corrosion terminates.
Brief description of the drawings
Fig. 1 is a kind of overall structure diagram of needle tip of scanning tunnel microscope preparation facilities of the invention;
Fig. 2 is a kind of partial structural diagram of needle tip of scanning tunnel microscope preparation facilities of the invention;
Fig. 3 is a kind of partial structurtes exploded perspective view of needle tip of scanning tunnel microscope preparation facilities of the invention;
Fig. 4 is the schematic flow sheet that a kind of needle tip of scanning tunnel microscope preparation facilities of the invention prepares needle point.
In accompanying drawing, the list of parts representated by each label is as follows:
1st, screw mandrel stepper motor, 2, turntable, 3, rotary mounting seat, 4, connector, 5, bearing, 6, piezoelectric ceramics, 7, folder Hold segment mounts, 8, hold assembly, 9, pedestal, 10, peristaltic pump, 11, annular platinoiridita ring, 12, solution tank, 13, base.
Embodiment
The principle and feature of the present invention are described below in conjunction with accompanying drawing, the given examples are served only to explain the present invention, and It is non-to be used to limit the scope of the present invention.
As Figure 1-Figure 4, the present invention provides a kind of needle tip of scanning tunnel microscope preparation facilities, including probe column, molten Liquid bath 12, solution tower and the driving part of travel distance can be determined, the driving part is connected with the probe column, the solution Groove 12 is arranged on below the probe column, and filamentary silver one end to be corroded is fixedly installed on the probe column, the filamentary silver to be corroded The other end, which can be released, to be plugged in the solution tower, and the probe column is internally provided with fixed value resistance, and the fixed value resistance is with treating Corrode filamentary silver connection, the fixed value resistance has been arranged in parallel micro-control plate.So, driving part drives probe column to be moved to solution tower Dynamic, when filamentary silver insertion one slight depth of solution is corroded, loop is turned on, and loop current, which has, compares significantly transition, such as Fruit current jump is steeper, then the fixed value resistance both end voltage connected with filamentary silver to be corroded then has obvious change Change, then can just judge that filamentary silver inserts the critical condition of solution, the inspection of micro-control plate by the change of fixed value resistance both end voltage When the voltage of measured value resistance is not equal to 0, driving part stops advancing, and probe column does reciprocal telescopic, and filamentary silver to be corroded carries out rotten Erosion, when the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum amount of voltage that, solution tower and probe column are stopped, drive division Part is retracted into original position, and corrosion terminates.
The needle tip of scanning tunnel microscope preparation facilities of the present invention, as Figure 1-Figure 4, in previously described technical scheme On the basis of can also be:The driving part includes screw mandrel stepper motor 1, turntable 2 and rotary mounting seat 3, the screw mandrel Stepper motor 1 is fixedly installed on the turntable 2, and the bottom of turntable 2 is rotatable to be plugged in the rotary mounting seat 3 On, motor start switch is provided with the rotary mounting seat 3, the side of turntable 2 can be solved with the motor start switch Except formula offsets, micrometer caliper is provided with the screw mandrel stepper motor 1.So, turned to another direction in rotation can be real for turntable 2 The existing angle change of screw mandrel stepper motor 1, conveniently installs and dismantles filamentary silver to be corroded, when 2 cycle of turntable, the side of turntable 2 Offseted with the motor start switch, realize that power supply is connected, screw mandrel stepper motor 1 drives filamentary silver to be corroded to advance, in screw mandrel step Micrometer caliper is provided with stepper motor 1, the travel distance of screw mandrel stepper motor 1 can be measured, the parameter measured according to these, It may determine that filamentary silver to be corroded inserts the critical point of solution.Further preferred technical scheme is:The probe column includes releasing Drive disk assembly, piezoelectric ceramics 6 and needle point connection member, the releasing drive disk assembly are connected by rotor with the probe column, institute Needle point connection member is stated to be connected with the releasing drive disk assembly by the piezoelectric ceramics 6.So, filamentary silver to be corroded is fixedly mounted It is strong equivalent to polarization is enhanced when piezoelectric ceramics 6 is added with spontaneous polarization identical external electric field in needle point connection member Degree.The increase of polarization intensity makes piezoelectric ceramics 6 be extended along polarised direction;Conversely, if plus reversed electric field, the edge of piezoelectric ceramics 6 Polarised direction shortens, it is possible to achieve the reciprocating motion of filamentary silver to be corroded, and releases drive disk assembly and piezoelectric ceramics 6 and needle point are connected Relay part will not follow the rotation of rotation two of screw mandrel stepper motor 1, and then realize that screw mandrel stepper motor 1 drives releasing driving section Part, piezoelectric ceramics 6 and needle point connection member are moved forward.Further preferred technical scheme is:The releasing drive disk assembly bag Bearing 5 and connector 4 are included, the bearing 5 is set on the outside of the rotor, the inner side of bearing 5 is fixedly connected with the rotor, The connector 4 is set in the outside of bearing 5, the inner side of connector 4 and the fixed clamping in the outside of bearing 5, the pressure Electroceramics 6 is fixedly connected with the connector 4.So, when rotor is rotated, the inner side concomitant rotation of bearing 5, outer ring keeps quiet Only.
The needle tip of scanning tunnel microscope preparation facilities of the present invention, as Figure 1-Figure 4, in previously described technical scheme On the basis of can also be:The needle point connection member includes hold assembly 8 and hold assembly fixture 7, the hold assembly The side of fixture 7 is fixedly connected with the piezoelectric ceramics 6, and the opposite side of hold assembly fixture 7 can with the hold assembly 8 Dismounting connection, the filamentary silver to be corroded is folded in the inner side of hold assembly 8.So, the opposite side of hold assembly fixture 7 and folder Hold part 8 to be detachably connected, filamentary silver to be corroded is folded in the inner side of hold assembly 8, realizes the quick for installation of filamentary silver to be corroded It is convenient, substantially increase operating efficiency.
The needle tip of scanning tunnel microscope preparation facilities of the present invention, as Figure 1-Figure 4, in previously described technical scheme On the basis of can also be:The solution tower includes pedestal 9, peristaltic pump 10, conduit and annular platinoiridita ring 11, the solution Taka It is located on the pedestal 9, the annular platinoiridita ring 11 is arranged on the top of the pedestal 9, the outside of peristaltic pump 10 is provided with Catheter channel, the conduit is arranged in the catheter channel, and the tube at one end is connected with the solution tank 12, the conduit The other end is arranged at the annular position of platinoiridita ring 11.So, during work, peristaltic pump 10 inhales the solution in solution tank 12 To at annular platinoiridita silk position, by filamentary silver one end corrode and the solution film that is formed at the annular platinoiridita thread position can be solved Except formula grafting, and then realize the electrolytic etching for treating corrosion filamentary silver.
The needle tip of scanning tunnel microscope preparation facilities of the present invention, as Figure 1-Figure 4, in previously described technical scheme On the basis of can also be:Also include base 13, the solution tank 12 is arranged on the middle part of base 13 top, the drive division Part and the solution tower are arranged on the both sides of solution tank 12.So, solution tank 12, solution tower and driving part are fixedly installed On base 13 so that the fixation between all parts is more consolidated, and can adjust driving part and molten by base 13 The installation site of liquid tower so that driving part and solution tower are precisely aligned, it is ensured that corrosion quality.
As Figure 1-Figure 4, the present invention also provides the side that a kind of needle tip of scanning tunnel microscope preparation facilities prepares needle point Method, comprises the following steps:
S1:Will filamentary silver insertion probe column one end be corroded;
S2:Driving part drives probe column to be moved to solution tower;
S3:Whether the voltage of micro-control plate detection fixed value resistance is equal to 0, and voltage is equal to 0, repeat step 2;
S4:Driving part stops advancing, and probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded;
S5:Whether the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum amount of voltage that, and voltage is more than minimum amount of voltage that, Repeat step 4;
S6:Solution tower and probe column are stopped, and driving part is retracted into original position, and corrosion terminates.
So, driving part drives probe column to be moved to solution tower, and one slight depth of solution is inserted in filamentary silver to be corroded When, loop conducting, loop current, which has, compares significantly transition, if current jump is steeper, then with waiting to corrode The fixed value resistance both end voltage of filamentary silver series connection can then be changed significantly, then just can be by the change of fixed value resistance both end voltage Change to judge that filamentary silver inserts the critical condition of solution, when the voltage of micro-control plate detection fixed value resistance is not equal to 0, driving part stops Advance, probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded, the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum During magnitude of voltage, solution tower and probe column are stopped, and driving part is retracted into original position, and corrosion terminates.
The foregoing is only presently preferred embodiments of the present invention, be not intended to limit the invention, it is all the present invention spirit and Within principle, any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.

Claims (8)

1. a kind of needle tip of scanning tunnel microscope preparation facilities, it is characterised in that:Including probe column, solution tank (12), solution tower With can determine the driving part of travel distance, the driving part is connected with the probe column, and the solution tank (12) is arranged on Below the probe column, filamentary silver one end to be corroded is fixedly installed on the probe column, and the filamentary silver other end to be corroded can be solved Except being plugged in the solution tower, the probe column is internally provided with fixed value resistance, and the fixed value resistance connects with filamentary silver to be corroded Connect, the fixed value resistance has been arranged in parallel micro-control plate.
2. needle tip of scanning tunnel microscope preparation facilities according to claim 1, it is characterised in that:The driving part bag Screw mandrel stepper motor (1), turntable (2) and rotary mounting seat (3) are included, the screw mandrel stepper motor (1) is fixedly installed on described On turntable (2), turntable (2) bottom is rotatable to be plugged on the rotary mounting seat (3), the rotary mounting seat (3) motor start switch is provided with, the turntable (2) can release formula with the motor start switch sideways and offset, described Screw mandrel stepper motor is provided with micrometer caliper on (1).
3. needle tip of scanning tunnel microscope preparation facilities according to claim 1, it is characterised in that:The probe column includes Drive disk assembly, piezoelectric ceramics (6) and needle point connection member are released, the releasing drive disk assembly is connected by rotor and the probe column Connect, the needle point connection member is connected by the piezoelectric ceramics (6) with the releasing drive disk assembly.
4. needle tip of scanning tunnel microscope preparation facilities according to claim 3, it is characterised in that:The releasing driving section Part includes bearing (5) and connector (4), and the bearing (5) is set on the outside of the rotor, bearing (5) inner side with it is described Rotor is fixedly connected, and the connector (4) is set on the outside of the bearing (5), with the bearing on the inside of the connector (4) (5) the fixed clamping in outside, the piezoelectric ceramics (6) is fixedly connected with the connector (4).
5. needle tip of scanning tunnel microscope preparation facilities according to claim 3, it is characterised in that:The needle point connecting portion Part includes hold assembly (8) and hold assembly fixture (7), hold assembly fixture (7) side and the piezoelectric ceramics (6) it is fixedly connected, hold assembly fixture (7) opposite side is detachably connected with the hold assembly (8), described to wait to corrode Filamentary silver is folded on the inside of the hold assembly (8).
6. needle tip of scanning tunnel microscope preparation facilities according to claim 1, it is characterised in that:The solution tower includes Pedestal (9), peristaltic pump (10), conduit and annular platinoiridita ring (11), the solution Taka are located on the pedestal (9), the ring Shape platinoiridita ring (11) is arranged on the outside of the top of the pedestal (9), the peristaltic pump (10) and is provided with catheter channel, the conduit It is arranged in the catheter channel, the tube at one end is connected with the solution tank (12), the conduit other end is arranged on institute State at annular platinoiridita ring (11) position.
7. the needle tip of scanning tunnel microscope preparation facilities according to claim 1-6 any one, it is characterised in that:Also wrap Base (13) is included, the solution tank (12) is arranged on top, the driving part and the solution tower in the middle part of the base (13) It is arranged on the solution tank (12) both sides.
8. the method that the needle tip of scanning tunnel microscope preparation facilities described in a kind of utilization claim 1-7 prepares needle point, it is special Levy and be:Comprise the following steps:
S1:Will filamentary silver insertion probe column one end be corroded;
S2:Driving part drives probe column to be moved to solution tower;
S3:Whether the voltage of micro-control plate detection fixed value resistance is equal to 0, and voltage is equal to 0, repeat step 2;
S4:Driving part stops advancing, and probe column does reciprocal telescopic, and filamentary silver to be corroded is corroded;
S5:Whether the voltage of micro-control plate detection fixed value resistance is less than or equal to minimum amount of voltage that, and voltage is more than minimum amount of voltage that, repeats Step 4;
S6:Solution tower and probe column are stopped, and driving part is retracted into original position, and corrosion terminates.
CN201710370403.9A 2017-05-23 2017-05-23 A kind of needle tip of scanning tunnel microscope preparation facilities and preparation method thereof Active CN107045074B (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108709907A (en) * 2018-08-21 2018-10-26 武汉科技大学 A kind of rapid automatized realization is to split the method that connection measures unimolecule conductance
CN109706515A (en) * 2019-01-11 2019-05-03 中国电子科技集团公司第三十八研究所 A kind of preparation facilities and preparation method of the tungsten wire needle point of controllable draw ratio
CN109849499A (en) * 2019-01-31 2019-06-07 中国科学院西安光学精密机械研究所 The micromotion mechanism of servo motor driving web plate in a kind of high accuracy prints machine

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102586854A (en) * 2012-02-24 2012-07-18 西安交通大学 High-efficiency automatic tungsten needle manufacturing device and method
CN103252541A (en) * 2013-05-06 2013-08-21 南京航空航天大学 Device and method for manufacturing large-length-diameter-ratio nanoscale shafts
CN103837708A (en) * 2012-11-27 2014-06-04 厦门大学 Horizontal detecting device, levelling device and levelling method of workpiece in electrochemical system
CN204028107U (en) * 2014-07-10 2014-12-17 华中科技大学 A kind of preparation facilities of controlled big L/D ratio nano-probe
CN104345178A (en) * 2013-07-24 2015-02-11 国家纳米科学中心 Preparation method of metal probe
KR20160116238A (en) * 2015-03-27 2016-10-07 단국대학교 산학협력단 Micro Probe Tip Structure and Method of manufacturing the same
CN106501555A (en) * 2016-12-01 2017-03-15 西安交通大学 A kind of preparation facilitiess of ultralow roughness tungsten tipped probe and method
CN206756873U (en) * 2017-05-23 2017-12-15 清华大学 A kind of needle tip of scanning tunnel microscope preparation facilities

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102586854A (en) * 2012-02-24 2012-07-18 西安交通大学 High-efficiency automatic tungsten needle manufacturing device and method
CN103837708A (en) * 2012-11-27 2014-06-04 厦门大学 Horizontal detecting device, levelling device and levelling method of workpiece in electrochemical system
CN103252541A (en) * 2013-05-06 2013-08-21 南京航空航天大学 Device and method for manufacturing large-length-diameter-ratio nanoscale shafts
CN104345178A (en) * 2013-07-24 2015-02-11 国家纳米科学中心 Preparation method of metal probe
CN204028107U (en) * 2014-07-10 2014-12-17 华中科技大学 A kind of preparation facilities of controlled big L/D ratio nano-probe
KR20160116238A (en) * 2015-03-27 2016-10-07 단국대학교 산학협력단 Micro Probe Tip Structure and Method of manufacturing the same
CN106501555A (en) * 2016-12-01 2017-03-15 西安交通大学 A kind of preparation facilitiess of ultralow roughness tungsten tipped probe and method
CN206756873U (en) * 2017-05-23 2017-12-15 清华大学 A kind of needle tip of scanning tunnel microscope preparation facilities

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
STEPHEN S. SASAKI 等: ""Note: Automated electrochemical etching and polishing of silver scanning tunneling microscope tips"", 《REVIEW OF SCIENTIFIC INSTRUMENTS》 *
丁万 等: ""电化学液膜法腐蚀制备STM 探针及其扫描应用"", 《贵州科学》 *
潘金福 等: ""STM探针电化学腐蚀装置的设计及实验研究"", 《现代机械》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108709907A (en) * 2018-08-21 2018-10-26 武汉科技大学 A kind of rapid automatized realization is to split the method that connection measures unimolecule conductance
CN109706515A (en) * 2019-01-11 2019-05-03 中国电子科技集团公司第三十八研究所 A kind of preparation facilities and preparation method of the tungsten wire needle point of controllable draw ratio
CN109849499A (en) * 2019-01-31 2019-06-07 中国科学院西安光学精密机械研究所 The micromotion mechanism of servo motor driving web plate in a kind of high accuracy prints machine

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