CN107036880A - Track traffic electronics veneer acceleration service life test method - Google Patents
Track traffic electronics veneer acceleration service life test method Download PDFInfo
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- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a kind of track traffic electronics veneer acceleration service life test method, step is：S01, first by life experiment obtain electronics veneer it is different acceleration degeneration stress conditions under lifetime data；S02, lifetime data and Degradation path according to electronics veneer under different acceleration degeneration stress, obtain life-span acceleration model；S03, foundation life-span acceleration model, the service life average of assessment electronics veneer under normal operation circumstances.The track traffic electronics veneer acceleration service life test method of the present invention has the advantages that easy to operate, fast and reliable.
Description
Technical field
The invention mainly relates to technical field of rail traffic, a kind of track traffic electronics veneer accelerated life test side is refered in particular to
Method.
Background technology
Track traffic electronics veneer accelerated life test is on the basis of failure mechanism is constant, by finding life of product
Relation between stress, i.e. acceleration model, go to extrapolate or assess normal using life characteristics of the product under high accelerated stress
The experimental technique and method of life characteristics under stress level.The track traffic electronics veneer accelerated life test design considerations electricity
The reliability intensifying analysis result of sub- veneer.It is determined that vibration, temperature, the working limit scope of humidity and synthesis, are limited herein
Design stress section is combined, and is carried out accelerated life test to electronics veneer, is set up many stress accelerated agings of electronics veneer or move back
Change life test model, reliability and life level of the analysis electronics veneer under normal stress.Current track electronic traffic list
Plate life test is a kind of conventional on-site data statistics, and the time cycle undergone is very long, and poor in timeliness, efficiency it is low with
And it is expensive.
The content of the invention
The technical problem to be solved in the present invention is that：The technical problem existed for prior art, the present invention provides one
Kind easy to operate, fast and effectively track traffic electronics veneer acceleration service life test method.
In order to solve the above technical problems, technical scheme proposed by the present invention is：
A kind of track traffic electronics veneer acceleration service life test method, step is：
S01, first by life experiment obtain electronics veneer it is different acceleration degeneration stress conditions under lifetime data；
S02, lifetime data and Degradation path according to electronics veneer under different acceleration degeneration stress, obtain life-span acceleration mould
Type；
S03, foundation life-span acceleration model, the service life average of assessment electronics veneer under normal operation circumstances.
Preferably, in step S02, the Degradation path equation of electronics veneer is under difference acceleration degeneration stressWhereinFor degradation path model parameter, the degradation path model isWherein q=1,2,3,4, i=1,2,3,4,5,6,7；For model parameter；
On the basis of degradation path model, using least square method, estimation output voltage is each under all acceleration degeneration stress levels
The degradation path model parameter of individual electronics veneer sample
Preferably, in step S02, the life-span acceleration model is
Wherein t is test period, and T is high temperature stress, and RH is humidity modification, and V is vibration stress, and m is shape constant, α0、α1、α2、α3For
General knowledge parameter.
Preferably, in step S03, be first depending on life-span acceleration model, assess vibrate V in normal work, it is temperature T, wet
Spend under RH, the logarithm life estimation that reliability is R isWherein R is reliable
Degree；Then the life-span average of electronics veneer under normal operation circumstances, under different confidence level and reliability is obtained.
Preferably, in step S01, the different of life test accelerate degeneration stress to include one in vibration, temperature, humidity
Plant or be combined.
Preferably, in step S01, the sample size of life test determines that method is as follows：In electronics veneer life test,
Sample size n and reliability R and confidence level γ relations under each acceleration degeneration stress are：
Preferably, to the parameter alpha in life-span acceleration model0、α1、α2、α3And form parameter m is estimated using overall maximum likelihood
Meter obtains estimates of parametersAnd covariance matrix Σ.
Preferably, overall maximum likelihood function is：
In formula, tijTo accelerate degeneration stress level SiJth under (i=1,2,3,4) (j=1,2 ..., qi..., 7) block electricity
The life value of sub- veneer, to parameter alpha0,α1,α2,α3, m covariance matrix Σ is as follows：
Compared with prior art, the advantage of the invention is that：
The track traffic electronics veneer acceleration service life test method of the present invention, electronics veneer is obtained not by life experiment
With accelerate degeneration stress condition under lifetime data, and according to it is different acceleration degeneration stress under electronics veneer lifetime data and move back
Change track, obtain life-span acceleration model, then according to life-span acceleration model, the use of assessment electronics veneer under normal operation circumstances
Life-span average；It is easy to operate, it quickly can effectively evaluate the life-span of track traffic electronics veneer.
Brief description of the drawings
Fig. 1 is flow chart of the method for the present invention.
Fig. 2 is each test profile map accelerated under degeneration stress condition in invention.
Fig. 3 is the electronics veneer life-span Weir distribution check plot in the present invention.
Embodiment
Below in conjunction with Figure of description and specific embodiment, the invention will be further described.
As shown in Figure 1 to Figure 3, the track traffic electronics veneer acceleration service life test method of the present embodiment, step is：
S01, first by life experiment obtain electronics veneer it is different acceleration degeneration stress conditions under lifetime data；
S02, lifetime data and Degradation path according to electronics veneer under different acceleration degeneration stress, obtain life-span acceleration mould
Type；
S03, foundation life-span acceleration model, the service life average of assessment electronics veneer under normal operation circumstances.
The track traffic electronics veneer acceleration service life test method of the present invention, electronics veneer is obtained not by life experiment
With accelerate degeneration stress condition under lifetime data, and according to it is different acceleration degeneration stress under electronics veneer lifetime data and move back
Change track, obtain life-span acceleration model, then according to life-span acceleration model, the use of assessment electronics veneer under normal operation circumstances
Life-span average；It is easy to operate, it quickly can effectively evaluate the life-span of track traffic electronics veneer.Wherein electronics veneer is track
Circuit board used in field of traffic (such as power panel or communication board).
In the present embodiment, electronics veneer life experiment (accelerated aging or experiment of degenerating) uses orthogonal experiment design method,
Accelerated aging or degradation experiment Project design are carried out using orthogonal test designs table, Orthogonal Experiment and Design is a kind of for multifactor
Stress level combination under the design method of experiment, each factor of equilibrium collocation, efficiently describes result of the test, and and degradation model
Modeling and identification have good inheritance.
Combined stress (vibration+temperature+humidity) accelerated aging or degradation experiment are determined according to Reliability Enhancement Testing result
In the selection of each stress peak be：(vertical) 2grms, 95 DEG C of high temperature, humidity 85%RH are vibrated, is added using many stress constant stress
Fast life-span or degradation experiment scheme, can shorten test period, the service life of effective analog equipment；In other embodiments
Can also be using combinations such as EMC, surge, impulse train and electrostatic；Accelerated aging or the combination of degradation experiment stress level and examination
The distribution for testing sample size is shown in Table 1.
Table 1：Electronics veneer accelerated aging or the combination of degradation experiment stress level and the distribution of test sample amount
| Numbering | Vibrate V (grms) | Temperature T (DEG C) | Humidity RH (%) | Test sample amount |
| 1(S1) | 1 | 80 | 65 | 7 |
| 2(S2) | 1 | 95 | 85 | 7 |
| 3(S3) | 2 | 80 | 85 | 7 |
| 4(S4) | 2 | 95 | 65 | 7 |
Test sample amount determines that method is as follows：
In electronics veneer accelerated aging or degradation experiment, under each proof stress level participate in the experiment sample size n with it is reliable
R and confidence level γ relations are spent as shown in (7) formula：
At the same time, in experimentation, the failure quantity f for sample of participating in the experiment and participate in the experiment sample size n, reliability R and confidence
γ relations are spent as shown in (8) formula：
It is the smallest sample of correspondence Different Reliability and confidence level in the case of 1 that table 2, which gives zero failure and failure number,
Amount.
Table 2：Smallest sample amount in the case of failure number f=0,1 under each proof stress level
According to the acceptable minimum reliability 0.85 of engineering, the level of confidence level 0.7, each stress water is selected in the present embodiment
Smallest sample amount under flat is 7；By deducing the sample size n and reliability R and confidence level γ that participates in the experiment under proof stress level
Relation, using minimum sample size, assesses use longevity of the track traffic electronics veneer under certain reliability R and confidence level γ
Life.
In addition, life test cut-off condition is：
(1) degraded data reaches threshold value, and test sample reaches more than half of input sample size, that is, reach 4 or 4 with
On；
(2) accumulate online test period and reach 400h~10000h, if degree of degeneration is (such as not enough farther out from failure threshold
Failure threshold 1/4), can take the circumstances into consideration extension test period.
Synthesis obtains electronics veneer accelerated aging or degradation experiment section as shown in Fig. 2 and building this according to testing program
The on-line intelligence test system of electronics veneer；Constant high temperature stress level in other life test can be +30 DEG C~1000
Arbitrary temp value is taken between DEG C, that is, the step test temperature spot of section is not be fixed as high temperature limit 80 DEG C, 90 DEG C
This 2 points, can take arbitrary temp value between+30 DEG C~1000 DEG C；Determine vibration stress vibration level can 0gr.m.s~
Arbitrary temp value is taken between 1000gr.m.s, that is, the step test vibration level of section is not to be fixed as 1.0gr.m.s,
This 2 points of 2gr.m.s, can take any vibration level between 0gr.m.s~1000gr.m.s；Constant humidity stress level hundred
Point than can between 0%~100% any number, that is, each step test humidity point of section is not to be fixed as humidity
This 2 points of 65%, the 85% of the limit, can between 0%~100% any number；The heating rate of process of the test and cooling
Speed can take arbitrary temp speed between 3 DEG C/min~200 DEG C/min；The online test period of accumulation of life test can be
Random time value is taken between 10h~10000h.
In the present embodiment, according to performance degradation geometric locus, appropriate degradation path model is selected, Degradation path is carried out and builds
Mould.The linear model that degradation path model may can be changed into for linear model or after certain conversion；May also be as non-
The polynomial equation of linear model, such as time.
Under q-th of stress level, the degradation path model of i-th of test sample can be expressed as：
Wherein q=1,2,3,4, i=1,2,3,4,5,6,7；It is model parameter.
On the basis of the degradation path model of selection, using least square method, estimation output voltage is in all stress levels
Under all samples degradation path model parameterObtain the degeneration of each sample under different stress levels
Equation of locus：
Failure criterion in test event, extrapolation is obtained under each stress level, degeneration the life value tij, i of each sample
=1,2,3,4, j=1,2,3,4,5,6,7.
Then, according under each stress level, each sample degeneration life value recognize acceleration model.
Due to accelerating degeneration stress to be vibration, temperature and humidity, broad sense Eyring acceleration models are used in the present embodiment, such as
Under：
In formula, t is test period, and T is high temperature stress (K), and RH is humidity modification (%), and V is vibration stress (grms), A,
B, C, D are unknown equation constant.
The principle of 4 equations, 4 groups of accelerated stress levels of this items selection are needed according to 4 unknown equation constant identifications
Test (life test), as shown in table 1, each parameter identification method is as follows：
The right and left in formula (3) is taken the logarithm, it is as a result as follows：
If lnA=α0, B=α1, C=α2,-D=α3, to parameter alpha in acceleration model0、α1、α2、α3Using overall maximum likelihood
Estimation obtains estimates of parameters
Arranging Maximum-likelihood estimation is：
In formula, i=1,2 ..., p is accelerated stress horizontal Si, and Si is S1, S2, S3, S4 in table 1, j=1, and 2 ..., q is
I-th of sample under each stress level.
Order：
Then obtain parameter alpha0,α1,α2,α3Maximum likelihood estimation
In the present embodiment, the accelerated life test of electronics veneer carries out the longevity according to four stress level S1/S2/S3/S4 of table 1
To the number of experiment after the completion of life experiment, the sample size foundation table 2 of life test, section foundation Fig. 2 of life test, life test
According to being combed, being analyzed, by mathematical formulae (1)~(6) of acceleration model, test data is substituted into, assesses and calculates electronics veneer
Actual life.
Life appraisal is now carried out by taking electronics veneer A as an example, is obtained first by experiment under each acceleration degeneration stress condition
Lifetime data be shown in Table 3.
Table 3：Lifetime data of the electronics veneer A under different stress
S1 condition lifetime data tables：
S2 condition lifetime data tables：
S3 condition lifetime data tables：
S4 condition lifetime data tables：
According to formula (2), to electronics veneer A, according to life experimental data in table 3, the longevity is determined by the test of fitness of fot
The Optimal Distribution of life is Weibull distribution (as shown in Figure 2), and obtaining life-span acceleration model is：
To parameter alpha in acceleration model0、α1、α2、α3And form parameter m obtains parameter Estimation using overall Maximum-likelihood estimation
ValueAnd covariance matrix Σ, it is shown in Table 4.
Overall maximum likelihood function is：
In formula, tijFor the horizontal S of accelerated stressiJth under (i=1,2,3,4) (j=1,2 ..., qi..., 7) block electronics list
Plate A life value, to parameter alpha0,α1,α2,α3, m covariance matrix Σ is as follows：
Table 4：The MLE estimations of life-span acceleration model parameter and covariance matrix
Extrapolate acceleration model parameter according to electronics veneer A acceleration model, assess vibrate V in normal work, it is temperature T, wet
Spend under RH, the logarithm life estimation that reliability is R is：
The use of dutycycle is 2/3 (daily work about 16 hours) under different operating environment, obtains confidence level γ=0.7, can
By the electronics veneer A under degree R=0.8 under difficult environmental conditions, service life average is as shown in table 5.
Table 5：The electronics veneer A life-span assessed based on fault data
| Sequence number | Condition of work | Average (year) |
| 1 | 0.5grms+55 DEG C of+65%RH | 11.56 |
It the above is only the preferred embodiment of the present invention, protection scope of the present invention is not limited merely to above-described embodiment,
All technical schemes belonged under thinking of the present invention belong to protection scope of the present invention.It should be pointed out that for the art
For those of ordinary skill, some improvements and modifications without departing from the principles of the present invention should be regarded as the protection of the present invention
Scope.
Claims (8)
1. a kind of track traffic electronics veneer acceleration service life test method, it is characterised in that step is：
S01, first by life experiment obtain electronics veneer it is different acceleration degeneration stress conditions under lifetime data；
S02, lifetime data and Degradation path according to electronics veneer under different acceleration degeneration stress, obtain life-span acceleration model；
S03, foundation life-span acceleration model, the service life average of assessment electronics veneer under normal operation circumstances.
2. track traffic electronics veneer acceleration service life test method according to claim 1, it is characterised in that in step
In S02, the Degradation path equation of electronics veneer is under difference acceleration degeneration stressWhereinFor degradation path model parameter, the degradation path model isWherein q=
1,2,3,4, i=1,2,3,4,5,6,7；For model parameter；On the basis of degradation path model, minimum is used
Square law, the degradation path model ginseng of each electronics veneer sample of the estimation output voltage under all acceleration degeneration stress levels
Number
3. track traffic electronics veneer acceleration service life test method according to claim 1 or 2, it is characterised in that in step
In rapid S02, the life-span acceleration model isWherein t is test period, and T is
High temperature stress, RH is humidity modification, and V is vibration stress, and m is shape constant, α0、α1、α2、α3For general knowledge parameter.
4. track traffic electronics veneer acceleration service life test method according to claim 3, it is characterised in that in step
In S03, life-span acceleration model is first depending on, assesses and is vibrated in normal work under V, temperature T, humidity RH, reliability is R logarithm
Life estimation isWherein R is reliability；Then electronics veneer is obtained just
Life-span average under normal working environment, under different confidence levels and reliability.
5. track traffic electronics veneer acceleration service life test method according to claim 1 or 2, it is characterised in that in step
In rapid S01, the different of life test accelerate degeneration stress to include the one or any combination in vibration, temperature, humidity.
6. track traffic electronics veneer acceleration service life test method according to claim 1 or 2, it is characterised in that in step
In rapid S01, the sample size of life test determines that method is as follows：In electronics veneer life test, each accelerates under degeneration stress
Sample size n and reliability R and confidence level γ relations be：
7. track traffic electronics veneer acceleration service life test method according to claim 3, it is characterised in that to the life-span plus
Parameter alpha in fast model0、α1、α2、α3And form parameter m obtains estimates of parameters using overall Maximum-likelihood estimationAnd covariance matrix Σ.
8. track traffic electronics veneer acceleration service life test method according to claim 7, it is characterised in that overall very big
Likelihood function is：
In formula, tijTo accelerate degeneration stress level SiJth under (i=1,2,3,4) (j=1,2 ..., qi..., 7) block electronics list
The life value of plate, to parameter alpha0,α1,α2,α3, m covariance matrix Σ is as follows：
2
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| CN107944211A (en) * | 2017-11-21 | 2018-04-20 | 湖北文理学院 | Service life acceleration model creation method, device and lifetime estimation method |
| CN110736595A (en) * | 2018-07-18 | 2020-01-31 | 中车株洲电力机车研究所有限公司 | Method for evaluating service life of electronic equipment in rail transit cabin |
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| CN113092281A (en) * | 2021-03-29 | 2021-07-09 | 上海南洋-藤仓电缆有限公司 | Flat elevator traveling cable service life accelerated evaluation test method |
| CN112595953B (en) * | 2020-11-25 | 2024-05-28 | 西安太乙电子有限公司 | Detection and evaluation method suitable for accelerated storage life test of air-seal circuit |
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| CN112595953B (en) * | 2020-11-25 | 2024-05-28 | 西安太乙电子有限公司 | Detection and evaluation method suitable for accelerated storage life test of air-seal circuit |
| CN113092281A (en) * | 2021-03-29 | 2021-07-09 | 上海南洋-藤仓电缆有限公司 | Flat elevator traveling cable service life accelerated evaluation test method |
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Application publication date: 20170811 |
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