CN107015032B - Dielectric material alternating temperature testing arrangement is used in laboratory - Google Patents
Dielectric material alternating temperature testing arrangement is used in laboratory Download PDFInfo
- Publication number
- CN107015032B CN107015032B CN201710369294.9A CN201710369294A CN107015032B CN 107015032 B CN107015032 B CN 107015032B CN 201710369294 A CN201710369294 A CN 201710369294A CN 107015032 B CN107015032 B CN 107015032B
- Authority
- CN
- China
- Prior art keywords
- clamping piece
- hollow connecting
- connecting rod
- beaker
- lower clamping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a dielectric material temperature-changing testing device for a laboratory, wherein a beaker is arranged on a working platform of a magnetic stirrer, a rotor, a thermocouple and a sample clamp are arranged in the beaker, the thermocouple is connected with the magnetic stirrer through a circuit, a hanging plate of the sample clamp is hung at the opening of the beaker, springs for connecting an upper clamping piece and a lower clamping piece are symmetrically arranged between the upper clamping piece and the lower clamping piece on the opposite outer side of a hollow connecting rod, the lower surface of the upper clamping piece and the upper surface of the lower clamping piece on the opposite inner side of the hollow connecting rod are symmetrically provided with insulating layers, the surfaces of the insulating layers are covered with conducting layers, and conducting wires of the conducting layers extend out of the end part of the hollow connecting rod and are connected with a ferroelectric comprehensive tester.
Description
Technical Field
The invention belongs to the technical field of experimental equipment, and particularly relates to a dielectric material temperature change testing device for a laboratory.
Background
When a laboratory tests the dielectric and ferroelectric properties of a dielectric material in different temperature ranges, particularly in the process of testing the ferroelectric size of the dielectric material at 20-200 ℃, on one hand, no proper clamp can be used for fixing a sample in the existing temperature-changing test system, and on the other hand, no design for stirring and heating silicone oil is adopted in the existing temperature-changing test system, so that the oil temperature is locally too high and uneven in the temperature-increasing process, the temperature detected by a thermocouple is not necessarily the accurate temperature actually reached by the sample, and the problem of inaccurate temperature in the test process is caused.
Disclosure of Invention
The invention aims to provide the dielectric material temperature-changing testing device for the laboratory, which has the advantages of reasonable structure and low cost, and can conveniently and accurately test the performance of ferroelectric, dielectric, impedance or resistance and the like of the dielectric material at different temperatures.
In order to achieve the above object, the technical scheme of the invention is as follows: the utility model provides a dielectric material alternating temperature testing arrangement is used in laboratory which characterized in that includes: magnetic stirrers, ferroelectric comprehensive testing appearance, beaker and sample anchor clamps, the beaker sets up on magnetic stirrers's work platform, be provided with rotor, thermocouple and sample anchor clamps in the beaker, the thermocouple is connected with magnetic stirrers through the circuit, sample anchor clamps include by lower clamping piece, last clamping piece and the link plate of parallel arrangement in proper order from bottom to top, the link plate is hung and is located beaker cup mouth department, the link plate upper surface is fixed with the hollow connecting rod that the symmetry set up, hollow connecting rod one end passes the through-hole that sets up on link plate, the last clamping piece in proper order and the lower clamping piece and extends the lower surface of clamping piece down, the end fixing of the hollow connecting rod that extends clamping piece is provided with the fender lid, the symmetry is provided with the spring that is used for connecting upper and lower clamping piece between the last clamping piece in the relative outside of hollow connecting rod and the lower clamping piece, the upper surface symmetry of the relative inboard last clamping piece lower surface of hollow connecting rod and lower clamping piece of hollow connecting rod is provided with the insulating layer, the insulating layer surface covers has the conducting layer, the conducting layer comprises current conducting plate and wire, wire one end of wire is connected with the current conducting plate is connected with the comprehensive testing appearance that the wire, and the other end of the hollow connecting rod that passes the inside of hollow connecting rod that extends the hollow connecting rod of hollow connecting rod that extends the link plate upper surface respectively and extend the iron.
Preferably, the thickness of the upper conductive layer is the shortest free length of the spring.
Preferably, the hollow connecting rod is provided with adjusting threads, the hanging plate and the upper clamping plate are provided with threaded holes matched with the adjusting threads, and the hollow connecting rods on the two sides of the upper surface and the lower surface of the upper clamping plate and the two sides of the upper surface and the lower surface of the hanging plate are respectively provided with adjusting nuts.
Preferably, a BNC connector is arranged at the end part of the lead extending out of the hollow connecting rod, and the BNC connector is connected with the ferroelectric comprehensive tester through a line.
Preferably, the insulating layer is made of high-temperature-resistant glass or ceramic sheets, and the upper clamping piece and the lower clamping piece are made of stainless steel materials.
Preferably, the lead is composed of a copper strip, a gold strip or a platinum strip, and the outer surface of the lead extending out of the hollow connecting rod is covered with an insulating protective sleeve.
The invention has reasonable structure and low cost, fixes the test sample by the sample clamp, and can conveniently and accurately test the performance of the dielectric material in the aspects of ferroelectricity, dielectric, impedance or resistance and the like at different temperatures by the stirring heating of the magnetic stirrer and the analysis of the test sample by the ferroelectric comprehensive tester.
Drawings
Figure 1 is a schematic view of the structure of the present invention,
fig. 2 is a schematic view of the structure of the sample holder.
Description of the drawings: 1. magnetic stirrers, 2, a ferroelectric comprehensive tester, 3, a beaker, 4, a rotor, 5, a lower clamping piece, 6, an upper clamping piece, 7, a hanging plate, 8, a hollow connecting rod, 9, a blocking cover, 10, a spring, 11, an insulating layer, 12, a conducting layer, 13, a lead, 14, an adjusting nut, 15, a BNC joint, 16 and a thermocouple.
Detailed Description
The technical scheme of the invention is described in detail by combining the attached drawings, the dielectric material temperature change testing device for the laboratory comprises a magnetic stirrer 1, a ferroelectric comprehensive tester 2, a beaker 3 and a sample clamp, wherein the beaker is arranged on a working platform of the magnetic stirrer, a rotor 4, a thermocouple 16 and the sample clamp are arranged in the beaker, the thermocouple is connected with the magnetic stirrer through a circuit, the sample clamp comprises a lower clamping piece 5, an upper clamping piece 6 and a hanging plate 7 which are sequentially arranged in parallel from bottom to top, the hanging plate is hung at the position of a beaker cup, hollow connecting rods 8 which are symmetrically arranged are fixed on the upper surface of the hanging plate, one end of each hollow connecting rod sequentially penetrates through a through hole formed in the hanging plate and the upper clamping piece and a through hole formed in the lower clamping piece and extends out of the lower surface of the lower clamping piece, a baffle cover 9 is fixedly arranged at the end part of the hollow connecting rod, springs 10 for connecting the upper and lower conducting plates are symmetrically arranged between the upper clamping piece and the lower clamping piece on the opposite outer sides of the hollow connecting rod, insulating layer and a conducting layer 12 are symmetrically arranged on the lower surface of the upper clamping piece and the upper conducting plate on the opposite inner sides of the hollow connecting rod, one end part of the hollow connecting rod, and one end part of the hollow connecting rod are respectively connected with the ferroelectric comprehensive tester, and the hollow connecting rod.
The thickness of the upper conducting layer is the shortest free length of the spring, so that a sample to be tested can be fixed between the upper clamping piece and the lower clamping piece no matter the thickness of the upper conducting layer is thick or thin; the improved test fixture is characterized in that adjusting threads are arranged on the hollow connecting rod, threaded holes matched with the adjusting threads are formed in the hanging plate and the upper clamping plate, adjusting nuts 14 are respectively arranged on the upper surface and the lower surface of the upper clamping plate and the hollow connecting rod on the upper surface and the lower surface of the hanging plate, the hanging plate can move up and down on the hollow connecting rod through adjustment of the adjusting nuts, the position of the whole sample fixture in a beaker is adjusted, the upper clamping plate can move up and down on the hollow rod through adjustment of the adjusting nuts, the distance between the upper clamping plate and the lower clamping plate is adjusted, test samples with different thicknesses can be conveniently clamped, a BNC connector 15 is arranged at the end of a lead extending out of the hollow connecting rod, the BNC connector is connected with a ferroelectric comprehensive tester through a circuit, the insulating layer is composed of high-temperature-resistant glass or ceramic plates, the upper clamping plate and the lower clamping plate are made of stainless steel materials, the rotor is prevented from being attracted with the rotor, the lead is composed of copper lath, gold lath or platinum lath, the outer surface of the lead extending out of the hollow connecting rod is covered with an insulating protective sleeve, and potential safety hazards possibly existing during high-pressure test are avoided.
The working principle of the invention is as follows: when testing the sample, the beaker is placed on the workbench of the ferroelectric comprehensive tester, the rotor is placed in the beaker, the test sample is arranged between the conducting layers on the upper clamping piece and the lower clamping piece, and the spring is in a stretching state,
the test sample can be clamped, and simultaneously can be heated to deform in the high-temperature test process, and the test sample can have a deformation space due to the stretching of the spring, so that the sample to be tested is prevented from being cracked; in order to conveniently clamp test samples with different thicknesses, the thickness of the upper conducting layer can be the shortest free length of the spring, or the upper conducting layer can be moved up and down on the hollow rod by arranging an adjusting thread on the hollow connecting rod, a threaded hole matched with the adjusting thread is arranged on the upper clamping plate, adjusting nuts are arranged on the hollow connecting rod on the two sides of the upper surface and the lower surface of the upper clamping plate, the upper clamping plate is adjusted by adjusting the adjusting nuts, the distance between the upper clamping plate and the lower clamping plate is adjusted, after the test samples are clamped, the end part of a lead extending out of the hollow connecting rod is connected with a ferroelectric comprehensive tester by arranging a BNC connector, the two leads are arranged in the hollow connecting rod, the winding intersection of the two leads is avoided, the sample clamp is placed in a beaker, a hanging plate is hung at the opening of the beaker, silicone oil is injected into the beaker, the temperature of the required heated silicone oil and the rotating speed of the regulating rotor are arranged by a magnetic stirrer, the test samples are heated by heating the silicone oil, and the ferroelectric comprehensive tester is used for testing the ferroelectric properties and parameters of the test samples; in the stirring process of the rotor at the bottom of the beaker, in order to avoid the phenomenon that the rotor is contacted with the clamp to cause local heating or heated silicon oil to splash, a threaded hole which is in threaded fit with the hollow connecting rod can be arranged on the hanging plate, adjusting nuts are respectively arranged on the hollow connecting rods on the two sides of the upper surface and the lower surface of the hanging plate, when the sample clamp is placed into the beaker, the hanging plate is adjusted by the adjusting nuts to move up and down on the hollow connecting rod, the position of the whole sample clamp in the beaker is adjusted, and the sample clamp is prevented from contacting with the rotor.
While there have been shown and described what are at present considered to be the principles of the invention, its essential features and advantages, it will be understood by those skilled in the art that various changes and modifications may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (1)
1. The utility model provides a dielectric material alternating temperature testing arrangement is used in laboratory which characterized in that includes: the magnetic stirrer comprises a magnetic stirrer, a ferroelectric comprehensive tester, a beaker and a sample clamp, wherein the beaker is arranged on a working platform of the magnetic stirrer, a rotor, a thermocouple and the sample clamp are arranged in the beaker, the thermocouple is connected with the magnetic stirrer through a circuit, the sample clamp comprises a lower clamping piece, an upper clamping piece and a hanging plate which are sequentially arranged in parallel from bottom to top, the hanging plate is hung at the position of a cup opening of the beaker, hollow connecting rods which are symmetrically arranged are fixed on the upper surface of the hanging plate, one end of each hollow connecting rod sequentially penetrates through holes arranged on the hanging plate and the upper clamping piece and through holes arranged on the lower clamping piece and extends out of the lower surface of the lower clamping piece, a baffle cover is fixedly arranged at the end part of each hollow connecting rod extending out of the lower clamping piece, springs used for connecting the upper clamping piece and the lower clamping piece are symmetrically arranged between the upper clamping piece and the lower clamping piece on the outer side of the hollow connecting rod, insulating layers are symmetrically arranged on the lower surface of the upper clamping piece and the upper surface of the lower clamping piece on the inner side of the hollow connecting rod, the insulating layers are covered with conducting plates and conducting layers are connected with the sample clamp arranged on one side of the comprehensive tester; the thickness of the upper conductive layer is the shortest free length of the spring; the hollow connecting rod is provided with adjusting threads, the hanging plate and the upper clamping plate are provided with threaded holes matched with the adjusting threads, and the hollow connecting rods on the two sides of the upper surface and the lower surface of the upper clamping plate and the two sides of the upper surface and the lower surface of the hanging plate are respectively provided with adjusting nuts; the end part of the lead extending out of the hollow connecting rod is provided with a BNC joint, and the BNC joint is connected with the ferroelectric comprehensive tester through a circuit; the insulating layer is made of high-temperature-resistant glass or ceramic chips, and the upper clamping piece and the lower clamping piece are made of stainless steel materials; the lead consists of a copper lath, a gold lath or a platinum lath, and the outer surface of the lead extending out of the hollow connecting rod is covered with an insulating protective sleeve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710369294.9A CN107015032B (en) | 2017-05-23 | 2017-05-23 | Dielectric material alternating temperature testing arrangement is used in laboratory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710369294.9A CN107015032B (en) | 2017-05-23 | 2017-05-23 | Dielectric material alternating temperature testing arrangement is used in laboratory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107015032A CN107015032A (en) | 2017-08-04 |
| CN107015032B true CN107015032B (en) | 2023-02-24 |
Family
ID=59450779
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710369294.9A Active CN107015032B (en) | 2017-05-23 | 2017-05-23 | Dielectric material alternating temperature testing arrangement is used in laboratory |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107015032B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110296932A (en) * | 2019-07-25 | 2019-10-01 | 佛山科学技术学院 | A kind of electro-chemical test sample and preparation method thereof |
| CN111596154B (en) * | 2020-05-18 | 2023-01-03 | 哈尔滨工业大学 | Auxiliary clamp for testing temperature-changing electrical property of small sample |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB578569A (en) * | 1943-05-21 | 1946-07-03 | British Thomson Houston Co Ltd | Improvements in and relating to thermocouple apparatus for identifying metals |
| EP0405587A1 (en) * | 1989-06-29 | 1991-01-02 | TA Instruments, Inc. | Planar interdigitated dielectric sensor |
| CN103645135A (en) * | 2013-10-31 | 2014-03-19 | 清华大学 | Device and method for adjusting and controlling temperature field of ellipsometer |
| CN104181341A (en) * | 2014-08-29 | 2014-12-03 | 中国科学技术大学 | Multi-functional sample rod for electromagnetism testing and photoelectricity testing |
-
2017
- 2017-05-23 CN CN201710369294.9A patent/CN107015032B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB578569A (en) * | 1943-05-21 | 1946-07-03 | British Thomson Houston Co Ltd | Improvements in and relating to thermocouple apparatus for identifying metals |
| EP0405587A1 (en) * | 1989-06-29 | 1991-01-02 | TA Instruments, Inc. | Planar interdigitated dielectric sensor |
| CN103645135A (en) * | 2013-10-31 | 2014-03-19 | 清华大学 | Device and method for adjusting and controlling temperature field of ellipsometer |
| CN104181341A (en) * | 2014-08-29 | 2014-12-03 | 中国科学技术大学 | Multi-functional sample rod for electromagnetism testing and photoelectricity testing |
Non-Patent Citations (1)
| Title |
|---|
| 一套基于六面顶高压装置的静水压高频介电测试系统;陆中等;《高压物理学报》;20080305(第01期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107015032A (en) | 2017-08-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107015032B (en) | Dielectric material alternating temperature testing arrangement is used in laboratory | |
| US20170160336A1 (en) | High-Temperature Test Fixture | |
| CN108918976B (en) | Multichannel high-temperature dielectric temperature spectrum testing device | |
| CN203011879U (en) | Measuring device for measuring ionic conductivity of solid electrolytes | |
| CN104614399A (en) | Transient hot-wire theory temperature measuring probe for thermophysical property of liquid | |
| CN206504944U (en) | Wound type steel cord stretching clamp | |
| CN203688747U (en) | Circuit board bearing test mechanism of electronic circuit board multi-contact test tool | |
| CN106403618A (en) | Electric heating furnace and temperature control system thereof | |
| CN206990631U (en) | A kind of use for laboratory dielectric material temperature changing test device | |
| CN206132673U (en) | A sample platform for going on high warm electrical parameter measuring | |
| CN206038730U (en) | Be used for novel sample platform of thermoelectric parameter testing of film | |
| WO2014067249A1 (en) | Soaking pressure resistance test method and system for bimetal-element waterproof thermostat | |
| CN103018137A (en) | Apparatus and method used for determining thermal contact resistance in hot stamping process | |
| CN202815091U (en) | Conductor direct-current resistance testing device | |
| DE102010013410A1 (en) | Device for detection of fluid surface for positioning pipette needle below fluid surface in analysis machine, has thermal element attached at cone point of probe such that coolness of fluid is measured, during immersion of probe | |
| CN104166049B (en) | A kind of soil resistivity test device of insulating materials | |
| CN204346974U (en) | A kind of pulse eddy current probe | |
| CN110346615B (en) | Low-temperature alternating/direct current electrical property testing device | |
| CN113447524A (en) | Portable semiconductor material thermal conductivity detection device and use method | |
| CN219434234U (en) | Fixing device for temperature thermocouple probe of steel thermal tester | |
| CN210775155U (en) | Oil particle counter | |
| CN203502446U (en) | Electrical performance gravity probe used for materials and devices | |
| RU2681859C2 (en) | Device for microthermocouples manufacturing | |
| CN105319221A (en) | Conducting wire pressing connection quality detection method and conducting wire pressing connection quality detection apparatus | |
| CN209968447U (en) | Novel water bath device for heating in food experiment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |