CN106980060B - Testing system and method for thickness sensor - Google Patents
Testing system and method for thickness sensor Download PDFInfo
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- CN106980060B CN106980060B CN201710252382.0A CN201710252382A CN106980060B CN 106980060 B CN106980060 B CN 106980060B CN 201710252382 A CN201710252382 A CN 201710252382A CN 106980060 B CN106980060 B CN 106980060B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
Abstract
The invention discloses a testing system and a testing method for a thickness sensor. The system comprises an action unit, a thickness sensor, a detection unit and a control unit, wherein the action unit is used for changing the test environment of the thickness sensor to be tested, and the test environment corresponds to an index to be tested; the data acquisition driving circuit is used for acquiring test data corresponding to the index to be tested from the thickness sensor to be tested; and the controller is respectively connected with the action unit and the data acquisition driving circuit and is used for sending an instruction for driving the action unit to change the test environment of the thickness sensor to be tested and acquiring and processing test data which is acquired by the data acquisition driving circuit from the thickness sensor to be tested and corresponds to the index to be tested. According to the invention, various test indexes of the thickness sensor to be tested are tested by changing the test environment of the thickness sensor to be tested, so that manual operation is reduced, the test operation complexity is reduced, and the production efficiency is improved.
Description
Technical Field
The embodiment of the invention relates to the technical field of electronic testing, in particular to a testing system and a testing method for a thickness sensor.
Background
Before the thickness sensor leaves a factory, the quality of a finished product of the thickness sensor needs to be detected, the detection comprises the test of various performance indexes of the thickness sensor, the performance indexes mainly comprise parameters such as static indexes and dynamic indexes, and the like, wherein the static indexes comprise sensitivity, consistency, stability and static errors; the dynamic index includes a dynamic error.
In the prior art, different testing tools are usually used for testing each performance index respectively, and more manual operations are needed. Therefore, when the performance indexes are tested, different testing tools are used for testing efficiency, and misoperation is easily caused due to excessive manual operation.
Disclosure of Invention
The invention provides a testing system and a testing method for a thickness sensor, which aim to reduce the complexity of testing operation and improve the production efficiency.
In a first aspect, an embodiment of the present invention provides a test system for a thickness sensor, the system including:
the action unit is used for changing the test environment of the thickness sensor to be tested, and the test environment corresponds to the index to be tested;
the data acquisition driving circuit is used for acquiring test data corresponding to the index to be tested from the thickness sensor to be tested;
and the controller is respectively connected with the action unit and the data acquisition driving circuit and is used for sending an instruction for driving the action unit to change the test environment of the thickness sensor to be tested and acquiring and processing test data which is acquired by the data acquisition driving circuit from the thickness sensor to be tested and corresponds to the index to be tested.
Preferably, the controller is specifically configured to send an instruction for driving the action unit to enable the thickness sensor to be tested to be in a static test environment or a dynamic test environment; the action unit is specifically used for enabling the thickness sensor to be tested to be in the static test environment according to the instruction of the static test environment, and enabling the thickness sensor to be tested to be in the dynamic test environment according to the instruction of the dynamic test environment.
Preferably, the action unit comprises a supporting platform displacement moving unit, a thickness driving shaft control unit and a clamp, the clamp is used for clamping the thickness sensor to be detected, and the supporting platform displacement moving unit and the thickness driving shaft control unit are respectively connected with the controller.
Preferably, the test environment comprises a static test environment and a dynamic test environment, and the support platform displacement moving unit drives the support platform to move in place to enable the thickness sensor to be tested to be in the static test environment; the supporting platform displacement moving unit drives the supporting platform to move in place, and the thickness driving shaft control unit drives the driving shaft to rotate according to the specified rotating speed, so that the thickness sensor to be tested is in a dynamic testing environment.
Preferably, the supporting platform displacement mobile unit includes first motor, thickness initiative axle control unit includes the second motor, the first motor with the control end of second motor is connected respectively the output of controller, supporting platform is connected to the output of first motor, and first motor drives supporting platform and removes, the driving shaft is connected to the output of second motor, and second motor drive driving shaft is rotatory.
Preferably, the data acquisition driving circuit is specifically configured to acquire static test data corresponding to a static test index from the thickness sensor to be tested if the thickness sensor to be tested is in a static test environment; and if the thickness sensor to be tested is in a dynamic test environment, acquiring dynamic test data corresponding to the dynamic test index from the thickness sensor to be tested.
Preferably, the system further includes an output unit, the output unit is connected to the controller, the controller is further configured to generate a performance test report according to a processing result of the test data and send an output instruction for outputting the performance test report, and the output unit outputs the performance test report according to the output instruction.
In a second aspect, an embodiment of the present invention further provides a testing method for a thickness sensor, which is performed by using the system of the first aspect, and the method includes:
the controller sends an instruction for driving the action unit to change the test environment of the thickness sensor to be tested, wherein the test environment corresponds to the index to be tested;
the controller acquires and processes test data corresponding to the to-be-tested indexes acquired by the data acquisition driving unit from the to-be-tested thickness sensor.
Preferably, the sending, by the controller, the instruction for driving the action unit to change the test environment of the thickness sensor to be tested specifically includes: sending an instruction for driving the action unit to enable the thickness sensor to be tested to be in a static test environment or a dynamic test environment; the indexes to be tested comprise static indexes and dynamic indexes.
Preferably, the method further comprises: and the controller generates a performance test report according to the processing result of the test data and sends an output instruction for outputting the performance test report.
The test system provided by the invention comprises an action unit, a detection unit and a control unit, wherein the action unit is used for changing the test environment of the thickness sensor to be tested, and the test environment corresponds to the index to be tested; the data acquisition driving circuit is used for acquiring test data corresponding to the index to be tested from the thickness sensor to be tested; and the controller is respectively connected with the action unit and the data acquisition driving circuit and is used for sending an instruction for driving the action unit to change the test environment of the thickness sensor to be tested and acquiring and processing test data which is acquired by the data acquisition driving circuit from the thickness sensor to be tested and corresponds to the index to be tested. According to the invention, the testing environment of the thickness sensor to be tested is changed through the testing system, so that all testing indexes of the thickness sensor to be tested are fully automatically tested, manual operation is reduced, the complexity of testing operation is reduced, and the production efficiency is improved.
Drawings
FIG. 1 is a schematic structural diagram of a testing system for a thickness sensor according to a first embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a testing system for a thickness sensor according to a second embodiment of the present invention;
FIG. 3 is a flow chart of a testing method for a thickness sensor according to a third embodiment of the present invention;
fig. 4 is a flowchart of a testing method for a thickness sensor according to a fourth embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a schematic structural diagram of a testing system for a thickness sensor according to an embodiment of the present invention, and as shown in fig. 1, the system includes a controller 1, an action unit 2, and a data acquisition driving circuit 3, where the controller 1 is connected to the action unit 2 and the data acquisition driving circuit 3, respectively.
And the action unit 2 is used for changing the test environment of the thickness sensor to be tested, and the test environment corresponds to the index to be tested. The indexes to be tested at least comprise static indexes and dynamic indexes, wherein the static indexes comprise sensitivity, consistency, stability and static errors; the dynamic index includes a dynamic error.
And the data acquisition driving circuit 3 is used for acquiring test data corresponding to the index to be tested from the thickness sensor to be tested. Specifically, the acquisition driving circuit 3 adopts a programmable logic device to design test functions corresponding to different performance indexes, receives an instruction sent by the controller 1 to acquire test data of a certain test index, starts the corresponding test function, and acquires the test data corresponding to the index to be tested from the thickness sensor to be tested.
And the controller 1 is used for sending an instruction for driving the action unit 2 to change the test environment of the thickness sensor to be tested, and acquiring and processing test data corresponding to the index to be tested, which is acquired from the thickness sensor to be tested by the data acquisition driving circuit 3.
Specifically, the connection mode between the controller 1 and the action unit 2 and the data acquisition driving circuit 3 may be a direct connection mode, such as a cable or a network cable, or an indirect connection mode, such as a wireless network, and when a wireless network connection mode is adopted, a signal receiver and a signal transmitter need to be configured accordingly, which is a common technique for those skilled in the art and is not described herein again, and the specific configuration of the present invention is not limited.
Further, the controller 1 is specifically configured to send an instruction for driving the action unit 2 to enable the thickness sensor to be tested to be in a static test environment or a dynamic test environment; the action unit 2 is specifically configured to enable the thickness sensor to be tested to be in a static test environment according to the instruction of the static test environment, and enable the thickness sensor to be tested to be in a dynamic test environment according to the instruction of the dynamic test environment.
Further, action unit 2 includes supporting platform displacement mobile unit, thickness driving shaft control unit and anchor clamps, anchor clamps are used for the centre gripping thickness sensor that awaits measuring, supporting platform displacement mobile unit and thickness driving shaft control unit connect respectively the controller. Specifically, the clamp may be a detachable clamp.
Furthermore, the test environment comprises a static test environment and a dynamic test environment, and the support platform displacement moving unit drives the support platform to move in place to enable the thickness sensor to be tested to be in the static test environment; the supporting platform displacement moving unit drives the supporting platform to move in place, and the thickness driving shaft control unit drives the driving shaft to rotate according to the specified rotating speed, so that the thickness sensor to be tested is in a dynamic testing environment. For example, when the supporting platform moves in place and the driving shaft rotates at a specified rotating speed, a person skilled in the art can know that the working environment of the thickness sensor is simulated at the moment, such as a currency detection environment, the thickness sensor to be tested is in a dynamic test environment for testing dynamic indexes, and the specified rotating speed can be set according to actually required currency detection speed and precision, such as 1.2 m/s or 1.5 m/s, and the specified rotating speed is not specifically limited by the invention.
When the thickness sensor to be tested is determined to be in a static test environment or a dynamic test environment, the controller 1 sends an acquisition instruction for acquiring test data corresponding to an index to be tested from the thickness sensor to be tested to the acquisition driving circuit 3, the acquisition driving circuit 3 receives the acquisition instruction, acquires the test data corresponding to the index to be tested from the thickness sensor to be tested, and acquires the static test data corresponding to the static test index from the thickness sensor to be tested if the thickness sensor to be tested is in the static test environment; and if the thickness sensor to be tested is in a dynamic test environment, acquiring dynamic test data corresponding to the dynamic test index from the thickness sensor to be tested. And sends the test data to the controller 1, and the controller 1 acquires and processes the test data.
Specifically, the supporting platform displacement mobile unit includes first motor, thickness initiative axle control unit includes the second motor, first motor with the control end of second motor is connected respectively the output of controller, supporting platform is connected to the output of first motor, and first motor drives supporting platform and removes, the driving shaft is connected to the output of second motor, and second motor drive driving shaft is rotatory. Specifically, when the controller 1 sends out an instruction for enabling the thickness sensor to be tested to be in a static test environment, the instruction of the static test environment comprises a displacement instruction of the supporting platform, and the first motor drives the supporting platform to move in place according to the displacement instruction, so that the thickness sensor to be tested is in the static test environment; when the controller 1 sends out an instruction for enabling the thickness sensor to be tested to be in a dynamic test environment, the instruction for the dynamic test environment comprises a supporting platform displacement instruction and a driving shaft rotation instruction, the first motor drives the supporting platform to move in place according to the displacement instruction, and the second motor controls the driving shaft to rotate according to a specified rotating speed according to the driving shaft rotation instruction, so that the thickness sensor to be tested is in the dynamic test environment.
According to the invention, the testing environment of the thickness sensor to be tested is changed through the testing system, so that all testing indexes of the thickness sensor to be tested are fully automatically tested, manual operation is reduced, the complexity of testing operation is reduced, and the production efficiency is improved.
Example two
The second embodiment is a further improvement of the above embodiment, and is different from the above embodiment only in that an output unit is added. The second embodiment is the same as the previous embodiment and is not repeated herein, as shown in fig. 2, the system further includes an output unit 4, the output unit 4 is connected to the controller 1, the controller 1 is further configured to generate a performance test report according to a processing result of the test data and send an output instruction for outputting the performance test report, and the output unit 4 outputs the performance test report according to the output instruction.
Specifically, the output unit 4 may be a printing device or a display.
On the basis of the technical scheme, the system can further comprise a storage module, the storage module is connected with the controller 1, the controller 1 is further used for sending a storage instruction for storing the test data, the processing result of the test data and the performance test report, and the storage module stores the test data, the processing result of the test data and the performance test report according to the storage instruction; or the storage module automatically stores the test data, the processing result of the test data and the performance test report.
EXAMPLE III
Fig. 3 is a flowchart of a testing method for a thickness sensor according to a third embodiment of the present invention, where the method is applicable to testing performance indexes of a thickness sensor to be tested, and the method can be executed by the testing system for a thickness sensor according to the foregoing embodiments. As shown in fig. 3, the method specifically includes the following steps:
s101, the controller sends an instruction for driving the action unit to change the test environment of the thickness sensor to be tested, wherein the test environment corresponds to the index to be tested.
Specifically, the sending of the instruction for driving the action unit to change the test environment of the thickness sensor to be tested by the controller specifically includes: sending an instruction for driving the action unit to enable the thickness sensor to be tested to be in a static test environment or a dynamic test environment; the indexes to be tested comprise static indexes and dynamic indexes.
Enabling the instruction of the thickness sensor to be tested to be in a static test environment to comprise a supporting platform displacement instruction; and the instruction for enabling the thickness sensor to be tested to be in the dynamic test environment comprises a support platform displacement instruction and a driving shaft rotation instruction.
S102, the controller acquires and processes test data corresponding to the to-be-tested indexes, which are acquired by the data acquisition driving unit from the to-be-tested thickness sensor.
According to the invention, the testing environment of the thickness sensor to be tested is changed, so that all testing indexes of the thickness sensor to be tested are fully automatically tested, the manual operation is reduced, the testing operation complexity is reduced, and the production efficiency is improved.
Example four
Fig. 4 is a flowchart of a testing method for a thickness sensor according to a third embodiment of the present invention, and a fourth embodiment of the present invention is a further improvement of the third embodiment, which is different from the third embodiment only in that step S203 is added. As shown in fig. 4, the method specifically includes the following steps:
s201, the controller sends an instruction for driving the action unit to change the test environment of the thickness sensor to be tested, wherein the test environment corresponds to the index to be tested.
S202, the controller acquires and processes test data corresponding to the to-be-tested indexes, which are acquired by the data acquisition driving unit from the to-be-tested thickness sensor.
S203, the controller generates a performance test report according to the processing result of the test data and sends an output instruction for outputting the performance test report.
According to the technical scheme, the action unit is controlled by the controller to change the test environment of the thickness sensor to be tested, so that all test indexes of the thickness sensor to be tested are tested fully automatically, manual operation is reduced, the test operation complexity is reduced, and the production efficiency is improved.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (7)
1. A test system for a thickness sensor, the system comprising:
the action unit is used for changing the test environment of the thickness sensor to be tested, the test environment corresponds to the index to be tested, the action unit comprises a supporting platform displacement moving unit, a thickness driving shaft control unit and a clamp, the clamp is used for clamping the thickness sensor to be tested, the supporting platform displacement moving unit and the thickness driving shaft control unit are respectively connected with the controller, the test environment comprises a static test environment and a dynamic test environment, and the supporting platform displacement moving unit drives the supporting platform to move in place so that the thickness sensor to be tested is in the static test environment; the device comprises a support platform displacement moving unit, a thickness driving shaft control unit, a controller and a support platform displacement moving unit, wherein the support platform displacement moving unit drives the support platform to move in place, the thickness driving shaft control unit drives a driving shaft to rotate according to a specified rotating speed, so that a thickness sensor to be tested is in a dynamic test environment;
the data acquisition driving circuit is used for acquiring test data corresponding to the index to be tested from the thickness sensor to be tested;
and the controller is respectively connected with the action unit and the data acquisition driving circuit and is used for sending an instruction for driving the action unit to change the test environment of the thickness sensor to be tested and acquiring and processing test data which is acquired by the data acquisition driving circuit from the thickness sensor to be tested and corresponds to the index to be tested.
2. The system of claim 1, wherein the controller is specifically configured to send an instruction to drive the action unit to place the thickness sensor under test in a static test environment or a dynamic test environment; the action unit is specifically used for enabling the thickness sensor to be tested to be in the static test environment according to the instruction of the static test environment, and enabling the thickness sensor to be tested to be in the dynamic test environment according to the instruction of the dynamic test environment.
3. The system according to any one of claims 1 or 2, wherein the data acquisition driving circuit is specifically configured to acquire static test data corresponding to a static test indicator from the thickness sensor under test if the thickness sensor under test is in a static test environment; and if the thickness sensor to be tested is in a dynamic test environment, acquiring dynamic test data corresponding to the dynamic test index from the thickness sensor to be tested.
4. The system of claim 1, further comprising an output unit, wherein the output unit is connected to the controller, the controller is further configured to generate a performance test report according to a processing result of the test data and send an output instruction for outputting the performance test report, and the output unit outputs the performance test report according to the output instruction.
5. A testing method for a thickness sensor, performed using the system of claim 1, the method comprising:
the controller sends an instruction for driving the action unit to change the test environment of the thickness sensor to be tested, wherein the test environment corresponds to the index to be tested;
the controller acquires and processes test data corresponding to the to-be-tested indexes acquired by the data acquisition driving unit from the to-be-tested thickness sensor.
6. The method according to claim 5, wherein the controller sending the instruction for driving the action unit to change the test environment of the thickness sensor to be tested specifically comprises: the controller sends an instruction for driving the action unit to enable the thickness sensor to be tested to be in a static test environment or a dynamic test environment; the indexes to be tested comprise static indexes and dynamic indexes.
7. The method of claim 5, further comprising: and the controller generates a performance test report according to the processing result of the test data and sends an output instruction for outputting the performance test report.
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