CN106950237A - A kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle - Google Patents
A kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The invention discloses a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle, comprise the following steps：Step one：Peak-seeking operation is carried out to all diffracting spectrums of experiment gained, position and the integrated intensity of diffraction maximum is obtained.Step 2：Define the base peak differential seat angle sequence D of parameter pointS,iMethod.Step 3：Definition compare 2 points whether be same crystal grain method.Step 4：A kind of traversal method is selected, all points in Experimental Area are traveled through, completes to answer all-pair in Experimental Area the demarcation at the peak of diffracting spectrum, and obtain the crystalline substance in Experimental Area/phase boundary distribution；It is small with amount of calculation, the characteristics of taking short.
Description
Technical field
The present invention relates to the characterizing method technical field of crystal microscopic structure, and in particular to one kind analysis scan-type Laue spreads out
Collection of illustrative plates is penetrated, scan-type Laue diffraction experiment scanning area is obtained while demarcation to diffraction maximum in scan-type Laue diffraction collection of illustrative plates
The method of the crystalline substance in domain/phase boundary segment information.
Background technology
The microstructure of material has significant impact to the mechanical property of material, so as to influence the military service of material to use.Cause
This microstructure to material is characterized mechanical behavior to research material, inefficacy mechanism to improve the material of associated materials
Processing technology etc. is significant.Now there are light microscope, scanning electron to show the conventional characterizing method of material microstructure
Micro mirror (SEM), transmission electron microscope (TEM), EBSD (EBSD), traditional X-ray diffraction (XRD), neutron
Diffraction etc..
Metallography uses the surface topography of observation by light microscope material.But because the resolution ratio of light microscope is limited
System, it is impossible to realize the observation to material microstructure.The observation of SEM (SEM) generally has two kinds of signal sources, its
It is secondary electron and backscattered electron respectively.Wherein secondary electron signal is sensitive to sample surface morphology, backscattered electron is to sample
The Elemental redistribution of product is sensitive, and for the structure under small yardstick, such as dislocation, low angle boundary, this method is difficult to differentiate between.And it is traditional
XRD and the spatial resolution of neutron diffraction be also not enough to differentiate crystal orientation, defect, the material microstructure feature such as twin.
Although transmission electron microscope (TEM) resolution ratio is higher, its is less efficient, and the preparation of sample is complicated, and observation area is smaller, difficult
To carry out statistical process, the resolution capability to strain is weaker.
Scan-type Laue diffraction technology (Scanning Laue Diffraction) is penetrated synchrotron radiation light source as X
Line source, with spatial resolution height (sub-micron rank) (Kunz, M., et al., A dedicated superbend x-ray
microdiffraction beamline for materials,geo-,and environmental sciences at
The advanced light source [J], Rev.Sci.Instrum., 2009), angular resolution height (~0.01 °)
(Tamura,N.,et al.,High spatial resolution grain orientation and strain
mapping in thin films using polychromatic submicron x-ray diffraction[J],
Appl.Phys.Lett., the advantages of 2002), penetration power ability is strong, sample preparation is simple.And scan-type Laue diffraction technology
These advantages, the deficiency to above-mentioned various material characterization technologies is great supplement, so as to embody the technology in material analysis
The importance of representational field.
But the experiment of scan-type Laue diffraction needs to carry out stationary point scanning to sample experiments region, obtains magnanimity (thousands of at least
, at most hundreds thousand of) diffracting spectrum.The existing treatment technology to diffracting spectrum, is that every collection of illustrative plates is independently referred to
Markization is calculated.Other analyses are then carried out again.And this process amount of calculation is huge, extremely take.Carried out on cluster computer
Calculate, still need tens of hours, at most time several weeks at least.And the application for the technology that this inferior position is seriously limited.
In fact, because the orientation difference of a point is minimum in same crystal grain in crystal, for the point in same crystal grain, it is swept
Retouching formula Laue diffraction collection of illustrative plates has great similitude.Therefore certain several click-through row index meter therein are only chosen to each crystal grain
Calculate, by finding and utilizing the similitude for the corresponding diffracting spectrum of point for belonging to same crystal grain, you can complete to these diffraction patterns
The indexing processing of spectrum.This make it that the number of times that the indexing of actual progress is calculated significantly reduces, so as to highly shortened whole
Data handling procedure it is time-consuming, and save computer resource.Moreover, by this method, each diffraction pattern is completed
While the indexing processing of spectrum, crystalline substance/phase boundary distribution of scan-type Laue diffraction experiment scanning area is have also obtained, to follow-up
Analysis process is brought conveniently.
The content of the invention
To meet above-mentioned technical requirements, the present invention is intended to provide a kind of scan-type Laue diffraction compared based on peak-to-peak angle
Atlas analysis method, this method is compared with analysis method to scan-type Laue diffraction collection of illustrative plates of current other, with amount of calculation
It is small, the characteristics of taking short.
In order to achieve the above object, technical scheme is as follows：
A kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle, is comprised the following steps：
Step one：All Laues obtained by (Scanning Laue Diffraction) are tested to scan-type Laue diffraction
Diffracting spectrum carries out peak-seeking operation, obtains the position of all diffraction maximums and integrated intensity on every Laue diffraction collection of illustrative plates；
Step 2：All base peak angle difference sequences for being calibrated diffraction maximum on the Laue diffraction collection of illustrative plates of parameter point
DS,i, including following concrete operation step：
1) indexing calculating is carried out to the corresponding Laue diffraction collection of illustrative plates of indexing point, obtains all positions for being calibrated diffraction maximum
Put, integrated intensity and crystal face Miller indices (Miller indices)；Taking appropriate calculating, (general n takes total diffraction comprising peak number n
The eight of peak number/mono-), according to the integrated intensity at peak, calculate and all are calibrated in diffraction maximum integrated intensity highest n and marked
Determine direction vector k of the diffraction maximum under detector coordinates systemS,i(1≤i≤n)；
2) to direction vector kS,i, its angle with other direction vectors is calculated, obtains what is be made up of (n-1) individual angle
Standard angle difference sequence DS,i(1≤i≤n)；Have
Step 3：Judge specifically to grasp whether as same crystal grain, including as follows for 2 points in scan-type Laue diffraction Experimental Area
Make step：
1) standard angle difference sequence D is definedS,iKnown point is to compare origin, standard angle difference sequence DS,iUnknown point is
By comparison point；
2) appropriate expanding packet Δ containing peak number n (Δ n typically takes n a quarter) is taken, according to the integrated intensity of diffraction maximum,
Calculate by most strong in all diffraction maximums in the Laue diffraction collection of illustrative plates of comparison point that (the individual diffraction maximums of n+ Δs n) are under detector coordinates system
Direction vector ki(1≤i≤n+Δn)；
3) to direction vector ki, its angle with other direction vectors is calculated, obtains being made up of (n+ Δ n-1) individual angle
Comparison differential seat angle sequence Di(1≤i≤n+Δn)；Have
4) each standard angle difference sequence D for comparing origin is determinedS,i, if there is a comparison by comparison point
Differential seat angle sequence DiCorrespond to therewith；Its specific method is as follows：
A) define by the comparison differential seat angle sequence D of comparison pointiIn constituent element be δi,j.By itself and the standard angle for being compared origin
Spend difference sequence DS,iIn constituent element δS,i,jIt is compared.If
Think δi,jWith δS,i,jIt is equal.General T1Take 0.05；
B) D is assumediWith DS,iIn equal constituent element number be miIf meeting
mi≥T2·n
Think DiWith DS,iCorrespondence, and its corresponding peak is also corresponding；Typically take T2Take 0.8；
5) assume to compare origin with by the corresponding D of comparison pointiWith DS,iSum be s, if meet
s≥T3·n
Think to compare origin and same crystal grain is belonged to by comparison point.And the crystal face rice that diffraction maximum is calibrated in origin will be compared
Strangle index to be assigned to by diffraction maximum corresponding in comparison point, be also defined as being calibrated diffraction while crystal face Miller indices will be endowed
Peak；If it is not satisfied, then comparing origin and being not belonging to same crystal grain by comparison point.General T3Take 0.9；
Step 4：Select a kind of as to the experiment of scan-type Laue diffraction from scan-type traversal and radiant type traversal
In scanning area traversal method a little；The border of whole region is set to crystal boundary before beginning stepping through；Then according to choosing
Fixed traversal method is completed to the traversal of institute a little in scan-type Laue diffraction Experimental Area, and obtains these points correspondingly diffraction pattern
All crystal face Miller indices for being calibrated diffraction maximum in spectrum.
Scan-type traversal in technical scheme described in step 4 is comprised the following specific steps that：
Step 1：The whole Experimental Area for being scanned the experiment of formula Laue diffraction is traveled through by column scan；It is defined on progress
The scanning direction of row is direction of advance, is other column direction to the column direction that changes of next column；Some angle of ergodic process from region
Start；
Step 2：Traversal proceeds in region behind certain point after starting, and judges the opposite direction of the direction of advance and other row side
To the consecutive points of opposite direction whether be set to crystal boundary, then area carries out different operating in the following several ways：
If 1) the opposite direction consecutive points of the opposite direction of direction of advance and other column direction are all crystal boundary, it is believed that the point is indexing
Point, the base peak differential seat angle sequence D to calculating the pointS,i；
2) if the consecutive points of direction of advance opposite direction are crystal boundary, the consecutive points of other column direction opposite direction are not crystal boundary, it is believed that
The point and the consecutive points of direction of advance opposite direction belong to same crystal grain, the base peak differential seat angle sequence D of the pointS,iAlso with advance side
Base peak angle difference sequence to the consecutive points of opposite direction is identical；
3) if the consecutive points of direction of advance opposite direction are not crystal boundary, the consecutive points of other column direction opposite direction are crystal boundary, it is believed that
The point and the consecutive points of other column direction opposite direction belong to same crystal grain, the base peak differential seat angle sequence D of the pointS,iAlso with other row side
Base peak angle difference sequence to the consecutive points of opposite direction is identical；
If 4) the opposite direction consecutive points of the opposite direction of direction of advance and other column direction are not crystal boundary, it is believed that the point and other row
The consecutive points of direction opposite direction belong to same crystal grain, this base peak differential seat angle sequence DS,iTake the phase with other column direction opposite direction
The base peak angle difference sequence of adjoint point is identical；
Step 3：Method defined in step 3 judges the direction of advance and other column direction respectively in application technology scheme
Whether consecutive points belong to same crystal grain with the point；If wherein there is any with it is not same crystal grain, the point is set to crystal boundary；
Step 4：The scanning direction determined according to step 1, calculates next point, repeat step 2 and step 3, until completing
To in scan-type Laue diffraction Experimental Area traversal a little.
Radiant type traversal in technical scheme described in step 4 is comprised the following specific steps that：
Step 1：Randomly selected in the point not being judged in the whole Experimental Area for being scanned the experiment of formula Laue diffraction
One point calculates the base peak differential seat angle sequence D of the point as indexing pointS,i；
Step 2：To each point on this grain boundary, if point adjacent thereto is not all crystal boundary, it is expansible to define the point
Point, method defined in step 2 and step 3 judges the point of the point and non-crystal boundary adjacent thereto in then application technology requirement
Whether same crystal grain is belonged to.If same crystal grain is belonged to, the consecutive points are recorded as to the point in this crystal grain, and the mark of this consecutive points
Quasi- peak angle degree difference sequence DS,iWith the base peak differential seat angle sequence D of expansible pointS,iIt is identical；The consecutive points are set to if being not belonging to
Crystal boundary.Be repeated above-mentioned definition can extend a little with judge its whether be crystal grain operation, be not present until on this grain boundary
Expansible point；
Step 3：The operation of step 1 and step 2 is repeated, until completing to institute in scan-type Laue diffraction Experimental Area
Traversal a little.
Compared to the prior art compared with the present invention possesses following advantage：
The inventive method can quickly obtain the visual analyzing to scan-type Laue diffraction experimental data, and processing procedure
Amount of calculation is small；The method of the more existing processing scan-type Laue diffraction of this method, whole data handling procedure takes shorter, consumption meter
Calculation machine resource is few, the PC cluster that former needs are carried out on cluster computer is more commonly calculated on PC
Complete.
Brief description of the drawings
Fig. 1 is the flow chart of the inventive method.
Fig. 2 is [the 00 1] direction of embodiment sample and the angle of sample surfaces normal direction.
Fig. 3 is A points correspondence diffracting spectrum on Experimental Area in embodiment and the demarcation of its superiors.
Fig. 4 is B points correspondence diffracting spectrum on Experimental Area in embodiment and the demarcation of its superiors.
Fig. 5 is C points correspondence diffracting spectrum on Experimental Area in embodiment and the demarcation of its superiors.
Fig. 6 is the crystal boundary distribution results that embodiment is obtained by the present invention.
Specific implementation method
To make the above objects, features and advantages of the present invention more obvious understandable, with reference to the embodiment sample shown in Fig. 2
Product elaborate to the specific implementation method of the present invention.
Embodiment sample shown in Fig. 2 is 304 stainless steels, and the crystal orientation of each point in the sample is can see in fig. 2
Information, hence it is evident that the distribution situation of visible crystal boundary.
As shown in figure 1, the scan-type Laue diffraction atlas analysis method that the present embodiment is compared based on peak-to-peak angle, including such as
Lower step：
Step one：With known method, all Laue diffraction collection of illustrative plates obtained by the experiment of scan-type Laue diffraction are carried out
Peak-seeking is operated, and obtains the position of all diffraction maximums and integrated intensity on every Laue diffraction collection of illustrative plates.
Step 2：All base peak angle difference sequences for being calibrated diffraction maximum on the Laue diffraction collection of illustrative plates of parameter point
DS,i, including following concrete operation step：
1) indexing calculating is carried out with known method to the corresponding Laue diffraction collection of illustrative plates of indexing point, obtains all marked
Position, integrated intensity and the crystal face fan for determining diffraction maximum strangle index.Appropriate calculating is taken to include peak number n=6, it is strong according to the integration at peak
Degree, calculates and all are calibrated integrated intensity highest 6 in diffraction maximum and are calibrated direction of the diffraction maximum under detector coordinates system
Vectorial kS,i(1≤i≤6)。
kS,iComputational methods be：Read the three dimensional angle α (pitch), β (roll), γ (yaw) of detector.Have
Obtain after matrix A, read on the sample point of irradiation to detector plane apart from d, can be obtained using formula
2) to direction vector kS,i, its angle with other direction vectors is calculated, the standard being made up of 5 angles is obtained
Differential seat angle sequence DS,i(1≤i≤6).Have
Step 3：Definition judge in scan-type Laue diffraction Experimental Area 2 points whether as same crystal grain method, including
Following concrete operation step：
1) standard angle difference sequence D is definedS,iKnown point is to compare origin, standard angle difference sequence DS,iUnknown point is
By comparison point.
2) expanding packet Δ containing peak number n=4 is taken, according to the integrated intensity of diffraction maximum, is calculated by the Laue diffraction figure of comparison point
The direction vector k of 10 diffraction maximums most strong in all diffraction maximums under detector coordinates system in spectrumi(1≤i≤10).It is calculated
Method is identical with method described in step 2.
3) to direction vector ki, its angle with other direction vectors is calculated, the comparison angle being made up of 9 angles is obtained
Spend difference sequence Di(1≤i≤9).Have
4) each standard angle difference sequence D for comparing origin is determinedS,i, if there is a comparison by comparison point
Differential seat angle sequence DiCorrespond to therewith.Its specific method is as follows：
A) define by the comparison differential seat angle sequence D of comparison pointiIn constituent element be δi,j.By itself and the standard angle for being compared origin
Spend difference sequence DS,iIn constituent element δS,i,jIt is compared.If
Think δi,jWith δS,i,jIt is equal.
B) D is assumediWith DS,iIn equal constituent element number be miIf meeting
mi≥0.8·n
Think DiWith DS,iCorrespondence, and its corresponding peak is also corresponding.
5) assume to compare origin with by the corresponding D of comparison pointiWith DS,iSum be s, if meet
s≥0.9·n
Think to compare origin and same crystal grain is belonged to by comparison point.And the crystal face rice that diffraction maximum is calibrated in origin will be compared
Strangle index to be assigned to by diffraction maximum corresponding in comparison point, be also defined as being calibrated diffraction while crystal face Miller indices will be endowed
Peak.
Step 4：For the present embodiment, if selection scan-type traversal is tested in scanning area to scan-type Laue diffraction
All points are traveled through.Before traversal starts, the border of whole Experimental Area is set to crystal boundary.
1) definition scanning is by from the bottom to top, and direction from left to right is carried out.It is direction of advance from the bottom to top, from left to right
For other column direction.Ergodic process is since the lower left corner (A points) in region, and the Laue diffraction collection of illustrative plates of A points and the diffraction maximum of demarcation are such as
Shown in Fig. 3.
2) all it is below crystal boundary with left side since the lower left corner.The point is indexing point, calculates the base peak of the point
Differential seat angle sequence DS,i.The method defined with step 3 judges the point on it and it right side (B points) for same crystal grain, the labor of B points
The diffraction maximum of diffracting spectrum in distress and demarcation as shown in figure 4, but be not same crystal grain with the point of its top (C points), the Laue of C points spreads out
Penetrate collection of illustrative plates and the diffraction maximum of demarcation is as shown in Figure 5.The point is to be set to crystal boundary, the base peak differential seat angle sequence D of its right-hand pointS,i
It is same.
3) with the operating method described in 2), by the order in 1), complete in Experimental Area traversal a little.
To the present embodiment, carried out if selection scan-type traversal tests all points in scanning area to scan-type Laue diffraction
Traversal.Before traversal starts, the border of whole Experimental Area is set to crystal boundary.
1) point is randomly selected in the point not being judged in the zone as indexing point.Here the F in selection region
Point is indexing point.Calculate the base peak differential seat angle sequence D of the pointS,i。
2) the first point of this crystal grain its own be point on this grain boundary, and it is not crystal boundary, with step 2 and
The method that step 3 is defined judge its up and down four consecutive points whether belong to same crystal grain with it.It was found that wherein three under left and right
The consecutive points in individual direction are same crystal grain with it.Then these three point base peak differential seat angle sequence DsS,iIt is all identical with the point, it is this
Point in crystal grain.Afterwards using these three consecutive points as the border of the crystal grain, and F points are set to crystal boundary.Compare this crystal grain side again
The adjacent point not being judged and its of boundary's point know that no is same crystal grain, so as to extend the crystal grain, until the crystal grain border all
For crystal boundary.
1) and 2) 3) exemplified by the operation by described in, it is repeated, until completing to scan-type Laue diffraction Experimental Area
Interior traversal a little.
The crystal boundary distribution situation in region shown in the Fig. 2 obtained using the inventive method is as shown in fig. 6, can from figure
Go out, the crystal boundary distribution obtained using this method is corresponding with the crystal orientation distribution shown in Fig. 2, illustrates the knot that this method is obtained
Fruit is correct.And to 2550 Laue diffraction collection of illustrative plates in region, only the indexing of 108 therein progress is calculated, account for
4.23%, amount of calculation is much smaller than existing method.
To sum up, the present invention can automatically process scan-type Laue diffraction collection of illustrative plates, reduce to reducing to scan-type Laue
Diffracting spectrum carries out the time needed for analysis calculating.It is a kind of method of simple possible.
So far, angle changing rate formula analysis side of the specific case to the crystal scan-type Laue diffraction collection of illustrative plates of the present invention is applied
The principle and embodiment of method are set forth, and the explanation of above example is only used for help and understands the method for the present invention and core
Thought；Simultaneously for the general technology operating personnel of this area, thought when using the present invention according to the present invention, specific
Exist in occupation mode and scope and change part.Therefore, description of the invention should not be construed as the application mode to the present invention
And the limitation of application etc., protection scope of the present invention should be defined by claims.
Claims (6)
1. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle, it is characterised in that：Including following step
Suddenly：
Step one：All Laue diffraction collection of illustrative plates obtained by being tested to scan-type Laue diffraction carry out peak-seeking operation, obtain every labor
The position of all diffraction maximums and integrated intensity on diffracting spectrum in distress；
Step 2：All base peak differential seat angle sequence Ds for being calibrated diffraction maximum on the Laue diffraction collection of illustrative plates of parameter pointS,i,
Including following concrete operation step：
1) diffraction maximum is demarcated with indexing calculating is carried out to the corresponding Laue diffraction collection of illustrative plates of indexing point, obtains all marked
Determine position, integrated intensity and the crystal face Miller indices of diffraction maximum；Appropriate calculating is taken to include peak number n, according to the integrated intensity at peak,
Calculate and all are calibrated in diffraction maximum integrated intensity highest n and are calibrated direction vector of the diffraction maximum under detector coordinates system
kS,i, 1≤i≤n；
2) to direction vector kS,i, its angle with other direction vectors is calculated, the standard being made up of (n-1) individual angle is obtained
Differential seat angle sequence DS,i, 1≤i≤n；Have
Step 3：Whether judge in scan-type Laue diffraction Experimental Area at 2 points as same crystal grain, including following concrete operations step
Suddenly：
1) standard angle difference sequence D is definedS,iKnown point is to compare origin, standard angle difference sequence DS,iUnknown point be by than
Compared with point；
2) appropriate expanding packet Δ containing peak number n is taken, appropriate expanding packet Δ containing peak number n takes n a quarter, according to diffraction maximum
Integrated intensity, calculates by most strong in all diffraction maximums in the Laue diffraction collection of illustrative plates of comparison point that (the individual diffraction maximums of n+ Δs n) are in detection
Direction vector k under device coordinate systemi, 1≤i≤n+ Δs n；
3) to direction vector ki, its angle with other direction vectors is calculated, the ratio being made up of (n+ Δ n-1) individual angle is obtained
Compared with differential seat angle sequence Di, 1≤i≤n+ Δs n；Have
4) each standard angle difference sequence D for comparing origin is determinedS,i, if there is a comparison angle by comparison point
Difference sequence DiCorrespond to therewith；Its specific method is as follows：
A) define by the comparison differential seat angle sequence D of comparison pointiIn constituent element be δi,j, by itself and the poor sequence of the standard angle for being compared origin
Arrange DS,iIn constituent element δS,i,jIt is compared；If
Think δi,jWith δS,i,jIt is equal；
B) D is assumediWith DS,iIn equal constituent element number be miIf meeting
mi≥T2·n
Think DiWith DS,iCorrespondence, and its corresponding peak is also corresponding；
5) assume to compare origin with by the corresponding D of comparison pointiWith DS,iSum be s, if meet
s≥T3·n
Think to compare origin and same crystal grain is belonged to by comparison point；And crystal face Miller that diffraction maximum is calibrated in origin will be compared refer to
Number is assigned to by diffraction maximum corresponding in comparison point, is also defined as being calibrated diffraction maximum while crystal face Miller indices will be endowed；
If it is not satisfied, then comparing origin and being not belonging to same crystal grain by comparison point；
Step 4：Select a kind of as to the experiment scanning of scan-type Laue diffraction from scan-type traversal and radiant type traversal
In region traversal method a little；The border of whole region is set to crystal boundary before beginning stepping through；Then foundation is selected
Traversal method is completed to institute's traversal a little in scan-type Laue diffraction Experimental Area, and obtains these points correspondingly on diffracting spectrums
All crystal face Miller indices for being calibrated diffraction maximum.
2. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle according to claim 1,
It is characterized in that：Scan-type traversal described in step 4 is comprised the following specific steps that：
Step 1：The whole Experimental Area that scan-type Laue diffraction is tested is traveled through by column scan；It is defined on the scanning of the row of progress
Direction is direction of advance, is other column direction to the column direction that changes of next column；Ergodic process is since some angle in region；
Step 2：Traversal proceeds in region behind certain point after starting, and judges the opposite direction and other column direction of the direction of advance
Whether the consecutive points of opposite direction are set to crystal boundary, and then area carries out different operating in the following several ways：
If 1) the opposite direction consecutive points of the opposite direction of direction of advance and other column direction are all crystal boundary, it is believed that the point is indexing point,
Calculate the base peak differential seat angle sequence D of the pointS,i；
2) if the consecutive points of direction of advance opposite direction are crystal boundary, the consecutive points of other column direction opposite direction are not crystal boundary, it is believed that the point
Belong to same crystal grain with the consecutive points of direction of advance opposite direction, the base peak differential seat angle sequence D of the pointS,iAlso it is anti-with direction of advance
The base peak angle difference sequence of the consecutive points in direction is identical；
3) if the consecutive points of direction of advance opposite direction are not crystal boundary, the consecutive points of other column direction opposite direction are crystal boundary, it is believed that the point
Belong to same crystal grain with the consecutive points of other column direction opposite direction, the base peak differential seat angle sequence D of the pointS,iAlso it is anti-with other column direction
The base peak angle difference sequence of the consecutive points in direction is identical；
If 4) the opposite direction consecutive points of the opposite direction of direction of advance and other column direction are not crystal boundary, it is believed that the point and other column direction
The consecutive points of opposite direction belong to same crystal grain, this base peak differential seat angle sequence DS,iTake the consecutive points with other column direction opposite direction
Base peak angle difference sequence it is identical；
Step 3：Judge whether the direction of advance and other column direction consecutive points belong to the point respectively with the method in step 3
In same crystal grain；If wherein there is any with it is not same crystal grain, the point is set to crystal boundary；
Step 4：The scanning direction determined according to step 1, calculates next point, repeat step 2 and step 3, until completing to sweeping
Retouch in formula Laue diffraction Experimental Area traversal a little.
3. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle according to claim 1,
It is characterized in that：Radiant type traversal described in step 4 is comprised the following specific steps that：
Step 1：A point is randomly selected in the point not being judged in the zone as indexing point, the standard peak angle of the point is calculated
Spend difference sequence DS,i；
Step 2：To each point on this grain boundary, if point adjacent thereto is not all crystal boundary, the point is defined for expansible point, and
Judge whether the point and the point of non-crystal boundary adjacent thereto belong to same crystal grain with the method in step 3 afterwards；If belonging to same
Crystal grain then, the consecutive points is recorded as the point in this crystal grain, and the base peak differential seat angle sequence D of this consecutive pointsS,iWith expansible point
Base peak differential seat angle sequence DS,iIt is identical；
The consecutive points are set to crystal boundary if being not belonging to；The expansible point of above-mentioned definition is repeated and judges whether it is crystal boundary
Operation, until expansible point is not present on this grain boundary；
Step 3：The operation of step 1 and step 2 is repeated, until completing to institute in scan-type Laue diffraction Experimental Area a little
Traversal.
4. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle according to claim 1,
It is characterized in that：The appropriate calculating takes 1/8th of total diffraction peak number comprising peak number n.
5. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle according to claim 1,
It is characterized in that：Appropriate expanding packet Δ containing the peak number n takes n a quarter.
6. a kind of scan-type Laue diffraction atlas analysis method compared based on peak-to-peak angle according to claim 1,
It is characterized in that：T1Take 0.05, T2Take 0.8；T3Take 0.9.
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