CN106950226A - Matrix display dirt bad point detection system and its application - Google Patents

Matrix display dirt bad point detection system and its application Download PDF

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Publication number
CN106950226A
CN106950226A CN201610010273.3A CN201610010273A CN106950226A CN 106950226 A CN106950226 A CN 106950226A CN 201610010273 A CN201610010273 A CN 201610010273A CN 106950226 A CN106950226 A CN 106950226A
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CN
China
Prior art keywords
matrix display
bad point
dirty
detection system
point detection
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610010273.3A
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Chinese (zh)
Inventor
杨盼
郑杰
褚佰年
叶重阳
郑锡斌
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Ningbo Sunny Opotech Co Ltd
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Ningbo Sunny Opotech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ningbo Sunny Opotech Co Ltd filed Critical Ningbo Sunny Opotech Co Ltd
Priority to CN201610010273.3A priority Critical patent/CN106950226A/en
Publication of CN106950226A publication Critical patent/CN106950226A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Abstract

One matrix display dirt bad point detection system, it is for automatically carrying out the dirty bad point detection of matrix display, image device and a computing unit are obtained including one, it is connected to the acquisition image device, so through a view data of the display chip for obtaining the matrix display in image device acquirement work, after the arrangement rule that the computing unit sends out region according to Dot array and the non-light of surrounding is averaged by n*n, the dirty bad point of described image data is captured.

Description

Matrix display dirt bad point detection system and its application
Technical field
The present invention relates to the detection of a matrix display, more particularly to matrix display dirt bad point detection system and One dirty dead pixel detection method, it improves inspection for automatically carrying out the dirty bad point detection of matrix display The accuracy and detection efficiency of survey.
Background technology
General matrix display is made up of tens of thousands of to hundreds of thousands light-emitting diode pixel point is evenly distributed, and Image-text display and video display can be divided into, wherein because being made up of OLED matrix-blocks, therefore be frequently referred to again OLED matrix displays or OLED display.The image-text display can be with computer simultaneous display Chinese character, English Text and figure.The video display is controlled using microcomputer so that picture and text, image and cyclopentadienyl, Simultaneously through synchronously, clearly information propagation pattern goes to play various information, two dimension, three-dimensional are may also display in addition Animation, TV, video recording, VCD programs and on-the-spot circumstance.So matrix display quilt in society now It is extensive to use, seem for station, harbour, airport, market, hospital, hotel, bank, securities market, Construction market, auction room, Industrial Management and other public places etc..
In addition, matrix display has monochromatic and double-colored two class, it can show red, yellow, green, orange etc..According to pixel Number be divided into, double primary colors, three primary colors etc., word, image etc. according to the difference of picture element colour The color of content is also different, and single primary colors dot matrix is only able to display for example red, green, yellow etc. monochrome of fixed color, double primary colors Combination is lighted with the color of three primary colors lattice display content by different colours light-emittingdiode in pixel to determine, In addition, if controlling the lighting time of diode according to pulse mode, i.e., 256 or higher level gray scale then can be achieved It has been shown that, therefore can realize that RGB is shown.
Now, the utilization of OLED matrix displays is in widespread attention and then quickly grows, advantage therein It is that brightness height, low operating voltage, small power consumption, miniaturization, long lifespan, impact resistance and performance are stable.Therefore The development prospect of OLED matrix displays is extremely wide, at present just towards more high brightness, more high weather resistance, Higher luminous density, higher uniformity of luminance, reliability, panchromaticization direction are developed.
Therefore, during the manufacturing of OLED matrix displays, how to detect and judge one piece of lattice display Device quality and whether have dirty bad point, also as an important problem in the process of the manufacturing.One As the dirty bad point of detection sensor devices be the picture that shoots by the sensor devices to detect, and for matrix display Naked eyes can only be used to detect, however, go to judge the quality of a matrix display using the human eye of testing staff, Because being judged using the human eye of the testing staff, can not fool proof, and the feelings of erroneous judgement can be produced Condition, simultaneously as being to be detected through human eye, due to the relation of human physiological's function, so by for a long time Use human eye, can cause human eye produce fatigue, at this moment except easily produce erroneous judgement situation in addition to, while can make Situation into production efficiency step-down occurs.Also, due to being judged by human eye, so for the inspection The detection experience value requirement also relative raising of survey personnel, and because personnel can always have subjectivity, therefore Detection process also can not be efficient and accurately quantified.
The content of the invention
It is a primary object of the present invention to provide a matrix display dirty bad point detection system, it is for automatically The dirty bad point detection of matrix display is carried out, and then improves the accuracy and detection efficiency of detection.
Another object of the present invention is to provide a matrix display dirty bad point detection system, it is to realize the point The real-time detection of the dirty bad point of battle array display.
It is dirty bad including one another object of the present invention is to provide a matrix display dirty bad point detection system Point detection device, it can capture the dirty bad point of the matrix display automatically, with the mistake manually detected with reduction Miss and lifting prouctiveness, and ensure that the detection process of the matrix display can quantify.
Another object of the present invention is to provide a matrix display dirty bad point detection system, obtained including one Image device, it is used to shooting a matrix display display chip operationally and obtains a view data Afterwards, described image data are carried out with dirty bad point detection.
Another object of the present invention is to provide a matrix display dirty bad point detection system, calculated including one Unit, is advised according to the arrangement that non-light around a Dot array region of the described image data of acquirement and one sends out region Rule is averaging by n*n, and thus excludes interference of the non-luminous region to dirty bad point, judges the matrix display Dirty bad point.
Another object of the present invention is to provide a matrix display dirty bad point detection system, it is for effective The time required to improving the accuracy rate of the dirty bad point detection of matrix display and effectively reducing dirty bad point detection, improve Testing efficiency.
In order to reach object above, the present invention provides a matrix display dirty bad point detection system, and it is for certainly The dirty bad point detection of matrix display is carried out dynamicly, including:
One acquisition image device is connected to a computing unit, so through in the acquisition image device acquirement work The matrix display display chip view data, by the computing unit according to Dot array and week Enclose non-light hair region arrangement rule averaged by n*n after, eliminate the shadow that non-luminous region is captured to dirty bad point Ring, capture the dirty bad point of described image data.
According to one embodiment of present invention, the acquisition image device is a camera.
According to one embodiment of present invention, the computing unit is a computer.
According to one embodiment of present invention, the computing unit is some paroxysm optical chips.
According to a further aspect of the invention, the present invention also provides the one of the dirty bad point detection system of a matrix display Dirty dead pixel detection method, comprises the following steps:
(S01) view data is obtained;
(S02) described image data are pre-processed;
(S03) the arrangement rule for sending out region according to Dot array and the non-light of surrounding is averaged by n*n;And
(S04) the dirty bad point of the described image data after crawl processing.
According to one embodiment of present invention, step (S01), is to obtain image device through one, to work shape One display chip of the matrix display under state is shot, to obtain described image data.
Step (S03), states view data averaging, and it is to eliminate the week between the Dot array Enclose non-light hair region.
According to another embodiment of the invention there is provided the dirty bad point detection system of a matrix display, its for The dirty bad point detection of matrix display is automatically carried out, including:
One obtains image device, a workbench, a support frame and a computing unit, wherein support frame as described above Vertical means are in the workbench, and the acquisition image device is releasably installed on support frame as described above, described Computing unit is connected to the acquisition image device, is so obtained through the acquisition image device and is located at the work Make a view data of a display chip of the matrix display on platform, and described image data are done After pretreatment, the arrangement rule for sending out region according to Dot array and the non-light of surrounding through the computing unit presses n*n Average, and then further capture out the dirty bad point of the matrix display.
According to one embodiment of present invention, the workbench is a mobile platform.
According to one embodiment of present invention, the acquisition image device is a camera.
According to one embodiment of present invention, the computing unit is a computer.
Brief description of the drawings
Fig. 1 is showing according to the dirty bad point detection system of a matrix display of first preferred embodiment of the present invention It is intended to.
Fig. 2 is that the dirty bad point detection system of a matrix display according to a preferred embodiment of the present invention passes through one Obtain at the view data that image device obtains the display chip of a matrix display operationally, its explanation View data before reason.
Fig. 3 is that the dirty bad point detection system of a matrix display according to a preferred embodiment of the present invention passes through one The view data that image device obtains the display chip of a matrix display operationally is obtained, it illustrates figure Non-luminous region can be substantially shown in 2 partial enlarged drawing, figure.
Fig. 4 is that the dirty bad point detection system of a matrix display according to a preferred embodiment of the present invention passes through one Obtain at the view data that image device obtains the display chip of a matrix display operationally, its explanation View data after reason.
Fig. 5 is a dirt of the dirty bad point detection system of a matrix display according to a preferred embodiment of the present invention The flow chart of dead pixel detection method.
Fig. 6 is showing according to the dirty bad point detection system of a matrix display of second preferred embodiment of the present invention It is intended to.
Embodiment
Describe to be used to disclose the present invention below so that those skilled in the art can realize the present invention.In describing below Preferred embodiment be only used as citing, it may occur to persons skilled in the art that other obvious modifications.With The general principle of the invention defined in lower description can apply to other embodiments, deformation program, improvement side Case, equivalent and the other technologies scheme without departing from the spirit and scope of the present invention.
As shown in figure 1, being the dirty bad point detection system of a matrix display according to the first advantageous embodiment of the invention System, it improves the accuracy of detection for automatically carrying out the dirty bad point detection of matrix display 90 And detection efficiency.The dirty bad point detection system of the matrix display includes one and obtains the calculating of image device 10 and one Unit 20, it is connected to the acquisition image device 10, so when the acquisition image device 10 shoots described The display chip operationally of matrix display 90 simultaneously obtains a view data, as shown in Fig. 2 it is place View data before reason, and the described image data of before processing are pre-processed, it is shown in Fig. 4, then thoroughly The computing unit 20 is crossed to be averaged by n*n according to the arrangement rule of Dot array and the non-light hair region of surrounding, And then further capture out the dirty bad point of the matrix display 90.In addition, the matrix display 90, As OLED, between the Dot array between around described non-light hair region, but in the detection point During battle array display 90, it is described around non-light hair region be easy to be judged as in described view data it is dirty bad Point, therefore, the present invention are tried to achieve averagely by the described image data of acquirement, and through the computing unit 20 After value, then the non-light hair region of the Dot array and the surrounding of described image data is judged, so in institute Dot array is stated if any any abnormal conditions, is as dirty bad point, at the same can avoid will it is described around non-light It is dirty bad point to send out regional determination.Therefore, the present invention automatically can go out institute in the described image data grabber of acquirement State the dirty bad point of matrix display.It is worth one, the matrix display 90 includes a frame, So when the matrix display 90 shoots the matrix display 90 through the acquisition image device 10, Being possible to can be while obtains the image of the frame, and forms black patch, and the pretreatment is that to remove these black Block.In other words the black patch is the frame of the OLED, is non-luminous, therefore, in different situations Under, what each side (left and right, upper and lower) that the black patch appears in the OLED light-emitting zones was all possible to, Specifically, it is exactly relative position of the acquisition image device 10 when shooting the OLED, therefore institute It is to remove these black patches to state pretreatment, and then obtains the picture in Fig. 2.
In addition, it is noted that the acquisition image device 10 can be embodied as a camera.It is described to calculate single Member 20 can be embodied as a computer or an IC or some paroxysm optical chips.
In addition, as shown in figure 5, also being provided a matrix display dirty bad point according to first preferred embodiment of the invention The dirty dead pixel detection method of the one of detecting system, it comprises the following steps:
(S01) view data is obtained;
(S02) described image data are pre-processed;
(S03) the arrangement rule for sending out region according to Dot array and the non-light of surrounding is averaged by n*n;And
(S04) the dirty bad point of the described image data after crawl processing.
It is noted that being to obtain image device through one, as one is alike, to work in step (S01) The display chip for making the matrix display under state is shot, to obtain described image data.
In step (S03), described image data are averaging, it is to eliminate between the Dot array Non- light hair region around described.
It is the dirty bad point detection system of a matrix display according to the second, preferred embodiment of the present invention as Fig. 6 shows, It is for automatically carrying out the dirty bad point detection of matrix display 90.The dirty bad point detection of the matrix display System includes one and obtains image device 10, a workbench 30, a support frame 40 and a computing unit 20. The vertical means of support frame as described above 40 are in the workbench 30.The acquisition image device 10 is releasably pacified Loaded on support frame as described above 40.The computing unit 20 is connected to the acquisition image device 10.So described point When battle array display 90 is positioned over the workbench 30 and worked, the acquisition image device 10 can be to institute The display chip for stating matrix display 90 obtains a view data, and described image data are pre-processed Afterwards, the arrangement rule for sending out region according to Dot array and the non-light of surrounding through the computing unit 20 is asked by n*n Average value, and then further capture out the dirty bad point of the matrix display 90.
In addition, the workbench 30 may be embodied as a mobile platform, will automatically be positioned over the work The matrix display 90 made on platform 30 moves to a test position, is also the acquisition image device 10 working range.
It is noted that the matrix display 90, as OLED, between the Dot array between across Non- light hair region around described, but when detecting the matrix display, the non-light of surrounding sends out region in institute Be easy to be judged as dirty bad point in the view data stated, therefore, the present invention be by the described image data of acquirement, Tried to achieve with through the computing unit 20 after average value, then judge the Dot array of described image data As it is dirty bad so in the Dot array if any any abnormal conditions with the non-light hair region of the surrounding Point, while it is dirty bad point that can avoid the non-light hair regional determination of surrounding.Therefore, the present invention can be automatic Ground goes out the dirty bad point of the matrix display in the described image data grabber of acquirement.
In addition, the acquisition image device 10 can be embodied as a camera.The computing unit 20 can be embodied as one Computer or an IC or a chip.
It should be understood by those skilled in the art that the embodiments of the invention shown in foregoing description and accompanying drawing are only used as Illustrate and be not intended to limit the present invention.The purpose of the present invention completely and is effectively realized.The present invention function and Structural principle shows and illustrated in embodiment, under without departing from the principle, embodiments of the present invention Can there are any deformation or modification.

Claims (11)

1. matrix display dirt bad point detection system, it is examined for automatically carrying out the dirty bad point of matrix display Survey, it is characterised in that including:
One acquisition image device is connected to a computing unit, so through in the acquisition image device acquirement work The matrix display a display chip a view data, by the computing unit according to Dot array After around the arrangement rule in non-light hair region is averaged by n*n, eliminate non-luminous region and dirty bad point is captured Influence, capture described image data dirty bad point.
2. the dirty bad point detection system of matrix display according to claim 1, wherein the acquisition image device For a camera.
3. the dirty bad point detection system of matrix display according to claim 2, wherein the computing unit is one Computer.
4. the dirty bad point detection system of matrix display according to claim 2, wherein the computing unit is one Lattice luminous chip.
5. a dirty dead pixel detection method of matrix display dirt bad point detection system, it is characterised in that including as follows Step:
(S01) view data is obtained;
(S02) described image data are pre-processed;
(S03) the arrangement rule for sending out region according to Dot array and the non-light of surrounding is averaged by n*n;And
(S04) the dirty bad point of the described image data after crawl processing.
6. dirty dead pixel detection method according to claim 5, wherein step (S01), are to pass through an acquisition figure As device, a display chip of the matrix display under working condition is shot, to obtain the figure As data.
7. dirty dead pixel detection method according to claim 6, wherein step (S03), state view data and ask flat , it is in order to which the non-light of surrounding eliminated between the Dot array sends out region.
8. matrix display dirt bad point detection system, it is examined for automatically carrying out the dirty bad point of matrix display Survey, it is characterised in that including:
One obtains image device, a workbench, a support frame and a computing unit, wherein support frame as described above Vertical means are in the workbench, and the acquisition image device is releasably installed on support frame as described above, described Computing unit is connected to the acquisition image device, is so obtained through the acquisition image device and is located at the work Make a view data of a display chip of the matrix display on platform, and described image data are done After pretreatment, the arrangement rule for sending out region according to Dot array and the non-light of surrounding through the computing unit presses n*n Average, and then further capture out the dirty bad point of the matrix display.
9. the dirty bad point detection system of matrix display according to claim 8, wherein the workbench is one Mobile platform.
10. the dirty bad point detection system of matrix display according to claim 9, wherein the acquisition image dress It is set to a camera.
11. the dirty bad point detection system of matrix display according to claim 10, wherein the computing unit is One computer.
CN201610010273.3A 2016-01-07 2016-01-07 Matrix display dirt bad point detection system and its application Pending CN106950226A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110174414A (en) * 2019-07-03 2019-08-27 厦门特仪科技有限公司 A kind of Micro-OLED product optical detection apparatus and wafer chip detection method
CN114279683A (en) * 2021-11-22 2022-04-05 浙江大华技术股份有限公司 Automatic detection platform for display screen, method thereof and LED display screen

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1928535A (en) * 2006-09-07 2007-03-14 哈尔滨工业大学 Machine vision based LCD spot flaw detection method and system
CN101620815A (en) * 2008-07-01 2010-01-06 中茂电子(深圳)有限公司 Detection method and detection machine for defective pixels of panel of flat panel display
CN201570231U (en) * 2009-12-25 2010-09-01 四川虹视显示技术有限公司 Detection device of electro luminescence display screen
KR20100126015A (en) * 2009-05-22 2010-12-01 금오공과대학교 산학협력단 Method for inspecting defect of the pixels in display panel device by image
CN101964166A (en) * 2010-09-13 2011-02-02 南京通用电器有限公司 Circuit for detecting dead pixel of LED display screen and method thereof
KR20140082334A (en) * 2012-12-24 2014-07-02 엘지디스플레이 주식회사 Method and apparatus of inspecting mura of flat display
KR20140087606A (en) * 2012-12-31 2014-07-09 엘지디스플레이 주식회사 Method and apparatus of inspecting mura of flat display
CN104412089A (en) * 2012-07-27 2015-03-11 夏普株式会社 Method of inspecting liquid crystal display panel, and liquid crystal display panel inspection device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1928535A (en) * 2006-09-07 2007-03-14 哈尔滨工业大学 Machine vision based LCD spot flaw detection method and system
CN101620815A (en) * 2008-07-01 2010-01-06 中茂电子(深圳)有限公司 Detection method and detection machine for defective pixels of panel of flat panel display
KR20100126015A (en) * 2009-05-22 2010-12-01 금오공과대학교 산학협력단 Method for inspecting defect of the pixels in display panel device by image
CN201570231U (en) * 2009-12-25 2010-09-01 四川虹视显示技术有限公司 Detection device of electro luminescence display screen
CN101964166A (en) * 2010-09-13 2011-02-02 南京通用电器有限公司 Circuit for detecting dead pixel of LED display screen and method thereof
CN104412089A (en) * 2012-07-27 2015-03-11 夏普株式会社 Method of inspecting liquid crystal display panel, and liquid crystal display panel inspection device
KR20140082334A (en) * 2012-12-24 2014-07-02 엘지디스플레이 주식회사 Method and apparatus of inspecting mura of flat display
KR20140087606A (en) * 2012-12-31 2014-07-09 엘지디스플레이 주식회사 Method and apparatus of inspecting mura of flat display

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110174414A (en) * 2019-07-03 2019-08-27 厦门特仪科技有限公司 A kind of Micro-OLED product optical detection apparatus and wafer chip detection method
CN114279683A (en) * 2021-11-22 2022-04-05 浙江大华技术股份有限公司 Automatic detection platform for display screen, method thereof and LED display screen

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Application publication date: 20170714