CN106908643B - Probe, oscilloscope, motion recognition system and method - Google Patents
Probe, oscilloscope, motion recognition system and method Download PDFInfo
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- 238000001914 filtration Methods 0.000 claims description 5
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- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
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- G—PHYSICS
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- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H17/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the preceding groups
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention provides a probe, an oscilloscope, a motion recognition system and a method, wherein the probe comprises: the probe comprises a probe tip, a signal buffer unit, a coaxial signal wire and a BNC connector, wherein a measured signal acquired by the probe tip is buffered by the signal buffer unit and then transmitted to an oscilloscope through the coaxial signal wire and the BNC connector; characterized in that the probe further comprises: the acceleration sensor is used for sensing the motion of the probe and generating motion data of the probe based on the motion of the probe; the interface board is connected with the acceleration sensor; and the active probe interface is connected with the interface board and is used for sending the motion data to a sensor interface of the oscilloscope. The invention can easily control the oscilloscope when a user tests a tested signal which is far away from the oscilloscope, so that the signal can be completely displayed without returning to the oscilloscope for operation.
Description
Technical Field
The invention relates to the field of signal measurement and display, in particular to a probe, an oscilloscope, a motion identification system and a motion identification method.
Background
The oscilloscope as an instrument for observing electronic signals generally comprises a display screen, various keys and knobs, and a user can set functions such as vertical sensitivity, vertical bias, horizontal sensitivity, triggering and the like through the keys and the knobs, so that the waveform of a detected signal is stably displayed on the display screen in proper amplitude and period, and the user can conveniently observe and analyze the waveform.
The input channel of the oscilloscope is typically connected to the signal under test via an oscilloscope probe or a connecting wire to obtain an electrical signal. Oscilloprobe is generally divided into passive probe and active probe from the power supply type; the types of signals to be measured are generally divided into voltage probes and current probes.
The passive probe is simple, generally comprises a probe tip, a resistance-capacitance attenuation network, a coaxial line and a BNC connector, and is connected with a BNC input of an oscilloscope through the BNC connector.
An active probe typically comprises a probe tip, an active amplifier circuit, a coaxial signal line, a power supply signal line, a BNC connector, an interface board, and a probe, as shown in fig. 1. The coaxial signal line and the power supply signal line can be two different cables or a combined composite cable. The interface board, the probe and the BNC connector are also generally made into a whole body and are matched with the BNC and the interface input by the oscilloscope. The probe is used for detecting a signal to be detected, the amplifier amplifies or attenuates the signal to be detected and outputs the signal, the output signal is connected with an input channel of the oscilloscope through the coaxial signal line and the BNC connector and is displayed on a screen of the oscilloscope through an internal circuit of the oscilloscope. The oscilloscope provides a power supply and a bias voltage of the active probe through the interface board and the probe, is connected to the active amplifier circuit through the power supply signal wire, and provides the power supply and the bias signal for the amplifier so as to enable the amplifier to work.
At present, the functions of an interface board and a probe of an active probe are mainly power supply, bias voltage regulation, probe identification and probe information communication. The existing probe identification technology generally sets different resistors on a probe interface board, when an oscilloscope is connected, the oscilloscope detects the resistors, maps different probe types and probe attenuation ratios according to the resistance values, and automatically sets probe setting signals of the oscilloscope. The probe information communication function is generally used for a high-end probe, a memory or a singlechip is arranged on a probe interface board and used for storing probe information such as a serial number, a calibration signal and the like, when the probe is connected, the probe is communicated with a processor on an oscilloscope, the oscilloscope identifies the serial number and the calibration information of the probe and sets an analog channel and the output of the probe interface board according to the serial number and the calibration information, so that the probe and the oscilloscope analog channel work in a proper state.
No matter a passive probe or an active probe, the function of the conventional oscilloscope probe is only to detect a signal to be detected and transmit the signal to an oscilloscope for displaying, but the oscilloscope cannot be operated and controlled, and a user needs to operate the oscilloscope to enable a waveform displayed by a display to be optimal, and the following conditions are generally available:
(1) if the signal amplitude is not appropriate, the vertical sensitivity of the oscilloscope needs to be adjusted, so that the displayed signal amplitude is full of the oscilloscope screen.
(2) When the signal deviates from the upper part of the screen or is transmitted, the vertical offset level of the oscilloscope needs to be adjusted, so that the signal completely returns to the middle of the screen.
(3) The signal period displayed by the screen is too dense or too sparse, the signal cannot be observed completely, and the horizontal sensitivity of the oscilloscope needs to be adjusted, so that the signal can be displayed completely in one or more periods in the screen, and the oscilloscope is convenient to observe and analyze.
(4) Signals cannot be stably displayed, and the trigger functions of the oscilloscope, such as a trigger mode, a trigger leveling and the like, need to be adjusted, so that the signals are stably triggered and displayed on a screen.
(5) Other functions such as automatic setting, single trigger, etc.
When the existing oscilloscope and the probe are used, if the oscilloscope needs to be adjusted, particularly when the vertical sensitivity, the vertical bias voltage, the horizontal sensitivity or the trigger related to the waveform is adjusted, a user needs to hold the probe with one hand to make the probe tip of the probe stably contact with a measured signal, and the oscilloscope is operated with the other hand.
When the measured signals are two signals, a user needs to hold the probe with two hands to test different measured signals, and at the moment, if the oscilloscope needs to be operated, the user needs to put down the probe or request another person to assist, or needs to use a complex and expensive clamp, so that the use is inconvenient.
Moreover, the length of the probe line of the conventional oscilloscope probe is longer, generally about 1.5 meters, when the probe detects a far-away tested circuit, the hand of a user may not touch the oscilloscope, and at this time, another person is needed to assist in operating the oscilloscope, or the user leaves the tested circuit to operate the oscilloscope and then detect the tested circuit, so that the probe is very convenient to use.
Disclosure of Invention
In order to solve the technical problems, the invention provides a probe, an oscilloscope, a motion recognition system and a motion recognition method.
The present invention provides, in one aspect, a probe, comprising: the probe comprises a probe tip, a signal buffer unit, a coaxial signal wire and a BNC connector, wherein a measured signal acquired by the probe tip is buffered by the signal buffer unit and then transmitted to an oscilloscope through the coaxial signal wire and the BNC connector; the probe further comprises:
the acceleration sensor is used for sensing the motion of the probe and generating motion data of the probe based on the motion of the probe;
the interface board is connected with the acceleration sensor;
and the active probe interface is connected with the interface board and is used for sending the motion data to a sensor interface of the oscilloscope.
In one embodiment, the movement of the probe comprises: the movement of the probe under user operation or the movement of the probe along with the vibration of the object to be measured.
In an embodiment, when the acceleration sensor is a single-axis acceleration sensor, the motion data includes an acceleration signal of the probe in a Z-axis direction, and/or the number and frequency of times the probe is tapped, wherein the Z-axis is perpendicular to a plane in which the single-axis acceleration sensor is located.
In an embodiment, when the acceleration sensor is a dual-axis acceleration sensor, the motion data includes acceleration signals of the probe in directions of an X axis and a Y axis, and/or the number and frequency of times the probe is knocked, wherein a plane defined by the X axis and the Y axis is parallel to a plane in which the acceleration sensor is located.
In an embodiment, when the acceleration sensor is a three-axis acceleration sensor, the motion data includes acceleration signals of the probe in three directions of an X axis, a Y axis and a Z axis, and/or the number and frequency of times the probe is knocked, wherein a plane defined by the X axis and the Y axis is parallel to a plane in which the three-axis acceleration sensor is located, and the Z axis is perpendicular to the plane in which the three-axis acceleration sensor is located.
In one embodiment, the three-axis acceleration sensor is a MEMS accelerometer.
In another aspect, the present invention further provides an oscilloscope for processing motion data of the probe, the oscilloscope including: the BNC input port receives the measured signal, and then enters the display unit for displaying after sequentially passing through the input amplification unit, the A/D conversion unit and the waveform processing unit; the oscilloscope further comprises: the device comprises an acceleration sensor interface, a signal processing chip and a control chip; wherein,
the acceleration sensor interface is connected with the probe through the active probe interface and is used for receiving the motion data generated by the acceleration sensor;
the signal processing chip is connected with the acceleration sensor interface, and is used for identifying the motion data to generate an identification result;
and the control chip controls the oscilloscope to act according to the identification result.
In one embodiment, the movement of the probe comprises: movement of the probe under user operation;
the signal processing chip is specifically used for performing gesture recognition on the motion data and generating a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table;
and the control chip is specifically used for controlling the action of the oscilloscope according to the control command.
In one embodiment, the movement of the probe comprises: the probe moves along with the vibration of the measured object;
the signal processing chip is specifically used for converting the motion data into an electric signal;
the control chip is specifically used for controlling the oscilloscope to display the electric signal.
In an embodiment, the oscilloscope further comprises a storage unit, configured to store the gesture and oscilloscope control command mapping table.
In an embodiment, the oscilloscope further includes a signal processing unit, connected between the acceleration sensor interface and the signal processing chip, for converting the analog signal into a digital signal when the motion data is an analog signal.
The present invention also provides a motion recognition system, comprising: at least one said probe and one said oscilloscope.
The invention also provides a motion recognition method, which is applied to the motion recognition system and comprises the following steps:
the acceleration sensor of the probe senses the movement of the probe and generates movement data of the probe based on the movement of the probe;
a signal processing chip of the oscilloscope identifies the motion data and generates an identification result;
and the control chip of the oscilloscope controls the oscilloscope to act according to the identification result.
In one embodiment, the movement of the probe comprises: movement of the probe under user operation;
the signal processing chip of the oscilloscope identifies the motion data and generates an identification result, and the identification result comprises the following steps: the signal processing chip sequentially performs digital filtering and normalization processing on the motion data, then performs feature extraction on the motion data subjected to the normalization processing, performs gesture recognition on the motion data subjected to the feature extraction by using a hidden Markov model, and generates a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table;
the control chip of the oscilloscope controls the oscilloscope to act according to the identification result, and the method comprises the following steps: and the control chip controls the oscilloscope to act according to the control command.
In one embodiment, the movement of the probe comprises: the probe moves along with the vibration of the measured object;
the signal processing chip of the oscilloscope identifies the motion data and generates an identification result, and the identification result comprises the following steps: the signal processing chip converts the motion data into an electric signal;
the control chip of the oscilloscope controls the oscilloscope to act according to the identification result, and the method comprises the following steps: and the control chip controls the oscilloscope to display the electric signal.
The invention can enable a user to operate the function of the oscilloscope by the probe, so that the user can simultaneously operate the probe and the oscilloscope by only one hand, and the other hand can take the other probe to detect other signals or record data and other activities, thereby avoiding the difficulty brought by the user to simultaneously operate the probe and the oscilloscope.
The invention can easily control the oscilloscope when a user tests a tested signal which is far away from the oscilloscope, so that the signal can be completely displayed without returning to the oscilloscope for operation. The probe can also detect vibration signals, the vibration signals are displayed on a screen in an electric signal mode, and flaw detection can be performed on a motor, a machine tool and a steel plate.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a conventional active probe;
FIG. 2 is a schematic structural diagram of a probe according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a schematic structure of a multiplexer according to an embodiment of the present invention;
FIG. 4 is a flowchart illustrating a motion recognition method according to an embodiment of the present invention;
FIG. 5 is a block diagram of the internal structure of ADXL363 according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 2 is a schematic structural diagram of a probe according to an embodiment of the present invention. As shown in FIG. 2, the probe comprises a probe tip 11, a signal buffering unit 12, a coaxial signal line 13 and a BNC connector 14, wherein the signal buffering unit 12 is connected to the BNC connector 14 through the coaxial signal line 13, and the BNC connector 14 is connected with a BNC input port of an oscilloscope. The probe tip 11 is used for detecting a signal to be detected, and the signal to be detected by the probe tip 11 is attenuated or amplified by the signal buffer unit 12 and then transmitted to an analog channel of an oscilloscope through the coaxial signal line 13 and the BNC connector 14, so that the detection function of the probe is realized.
The probe also comprises an acceleration sensor 15, an interface board 16 and an active probe interface 17, wherein the acceleration sensor 15 senses the motion of the probe and generates motion data of the probe based on the motion of the probe, and the interface board 16 is connected with the acceleration sensor 15 and the active probe interface 17 and sends the motion data to the oscilloscope through the active probe interface 17. In addition, the active probe interface 17 also provides the power supply for the probe and other signals required by the signal buffer unit 12. The interface board 16 is mainly used for power supply, bias voltage regulation, probe identification, probe information communication, and the like, and in the present invention, the interface board 16 is also used for transmitting motion data sent by the acceleration sensor 15.
Generally, the movement of the probe may be a movement of the probe under the operation of a user, or a movement of the probe caused by vibration of an object to be measured.
The invention feeds back the motion data of the probe to the oscilloscope by sensing the motion change of the handheld probe, and correspondingly operates the oscilloscope by the preset gesture function corresponding relation so as to realize the adjustment of vertical sensitivity, vertical offset level, horizontal sensitivity, triggering and other parameters, so that the measured signal can be completely and stably displayed on the display screen of the oscilloscope. In addition, the probe can also detect the vibration signal of the object to be detected, and the vibration signal is displayed on an oscilloscope in the form of an electric signal, so that the probe can be used for flaw detection of motors, machine tools and steel plates.
At present, the acceleration sensor is small in size and can be integrated into a flat chip, and when the acceleration sensor in the form of a chip is used for detecting motion data of a probe, a space coordinate system is generally determined according to a plane where the chip is located.
When the acceleration sensor is a single-axis acceleration sensor, for example, a Z-axis acceleration sensor (the Z-axis is an axis perpendicular to a plane where the single-axis acceleration sensor is located) is selected, and when a user holds the probe to rotate or wave up and down along the Z-axis, the Z-axis acceleration sensor may sense a rotation gesture of the probe along the Z-axis (the direction of the probe body), and may also sense a gesture of the user tapping the probe, where the motion data includes an acceleration signal of the probe in the Z-axis direction, the number of times the probe is tapped, and the frequency of the tap. When detecting the vibration signal, in order to avoid damaging the probe tip 11, the probe tip 11 needs to be removed, the top end of the probe is abutted against the object to be measured to measure, and at this time, the acceleration sensor 15 senses the vibration of the object to be measured in the Z-axis direction to generate Z-axis acceleration data.
When the acceleration sensor is a dual-axis acceleration sensor, the motion data typically includes an acceleration signal of the probe in an X-axis direction and an acceleration signal in a Y-axis direction, and the number of times the probe is knocked and the frequency of knocking, where a plane defined by the X-axis and the Y-axis is parallel to a plane in which the dual-axis acceleration sensor is located, that is, the plane defined by the X-axis and the Y-axis is not constant but varies with the plane in which the dual-axis acceleration sensor is located, and the plane defined by the X-axis and the Y-axis is constantly kept parallel to a plane in which a chip of the dual-axis acceleration sensor is located regardless of how the probe is operated by a user. Similarly, when detecting a vibration signal by a two-axis acceleration sensor, the probe tip 11 is removed and the probe tip is pressed against the object to be measured, and at this time, the two-axis acceleration sensor senses vibrations of the object to be measured in the X-axis and Y-axis directions and generates X-axis acceleration data and Y-axis acceleration data.
When the acceleration sensor is a three-axis acceleration sensor, the gesture of knocking the probe can be sensed, and the gesture of swinging the probe in the directions of an X axis, a Y axis and a Z axis can also be sensed, so that the motion data comprise the frequency and the frequency of knocking the probe and acceleration signals of the probe in the directions of the X axis, the Y axis and the Z axis. The plane determined by the X axis and the Y axis is parallel to the plane where the three-axis acceleration sensor is located, and the Z axis is perpendicular to the plane where the three-axis acceleration sensor is located. The plane determined by the X axis and the Y axis is not fixed and is changed along with the change of the plane of the three-axis acceleration sensor, and the plane determined by the X axis and the Y axis is constantly kept parallel to the plane of the chip of the three-axis acceleration sensor and the Z axis is constantly kept perpendicular to the plane of the chip of the three-axis acceleration sensor no matter how the probe is operated by a user. According to the frequency and the times of knocking the probe, the functions of starting to recognize gestures, automatically triggering and the like of the oscilloscope can be realized, and according to the gestures in the directions of an X axis, a Y axis and a Z axis, the functions of adjusting the vertical sensitivity, the horizontal sensitivity and the vertical offset level of the oscilloscope can be realized. Similarly, when detecting a vibration signal using a three-axis acceleration sensor, it is necessary to remove the probe tip 11 and then apply the probe tip to the object to be measured to measure the vibration signal, and at this time, the three-axis acceleration sensor senses the vibration of the object to be measured in the X-axis, Y-axis, and Z-axis directions to generate X-axis acceleration data, Y-axis acceleration data, and Z-axis acceleration data.
The acceleration sensors used in the three situations can be acceleration sensors outputting analog signals or acceleration sensors outputting digital signals, for example, the three-axis acceleration sensors can adopt MEMS accelerometers, the MEMS accelerometers can be conveniently integrated into the probe due to small size, and the MEMS accelerometers output digital signals, so that the signal processing of the sensors in the oscilloscope can be simplified.
Fig. 3 is a schematic structural diagram of a wave filter according to an embodiment of the present invention. As shown in fig. 3, the oscilloscope includes: the BNC input port 20 receives the signal to be measured sent by the probe, and then the signal to be measured enters the display unit 24 after sequentially passing through the input amplifying unit 21, the A/D conversion unit 22 and the waveform processing unit 23 for displaying. The oscilloscope further comprises: an acceleration sensor interface 25, a signal processing chip 26 and a control chip 27. The acceleration sensor interface 25 is connected with the probe through the active probe interface 17 and is used for receiving the motion data generated by the acceleration sensor 15, the signal processing chip 26 is connected with the acceleration sensor interface 25 and is used for identifying the motion data to generate an identification result, and the control chip 27 is used for controlling the action of the oscilloscope according to the identification result.
The motion data processed by the oscilloscope may be motion data corresponding to the motion of the probe under the operation of the user, or motion data corresponding to the motion of the probe generated along with the vibration of the object to be measured.
The invention feeds back the motion data of the probe to the oscilloscope by sensing the motion change of the handheld probe, and correspondingly operates the oscilloscope by the preset gesture function corresponding relation so as to realize the adjustment of vertical sensitivity, vertical offset level, horizontal sensitivity, triggering and other parameters, so that the measured signal can be completely and stably displayed on the display screen of the oscilloscope. The probe can also detect vibration signals, the vibration signals are displayed on a screen in an electric signal mode, and flaw detection can be performed on a motor, a machine tool and a steel plate.
Generally, when the motion of the probe is a motion under the operation of a user, the signal processing chip 26 is specifically configured to perform gesture recognition on the motion data sent by the probe, and generate a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table, and the control chip 27 is specifically configured to control the oscilloscope to operate according to the control command.
When the probe moves along with the vibration of the object to be measured, the signal processing chip 26 is specifically used for converting the motion data sent by the probe into an electrical signal, and the control chip 27 is specifically used for controlling the oscilloscope to display the electrical signal so as to perform flaw detection on the motor, the machine tool and the steel plate.
Generally, the oscilloscope further comprises a storage unit 28 for storing the mapping table of the gesture and the oscilloscope control command.
When the motion data output by the acceleration sensor in the probe is an analog signal, the oscilloscope further comprises a signal processing unit 29, and the signal processing unit 29 is connected between the acceleration sensor interface 25 and the signal processing chip 26 and is used for converting the analog signal into a digital signal and transmitting the digital signal to the signal processing chip 26.
The invention also provides a motion recognition system comprising at least one probe as described above and shown in figure 2 and an oscilloscope as described above and shown in figure 3. When the motion recognition system comprises a plurality of probes, the corresponding oscilloscopes comprise the acceleration sensor interfaces with the same number as the probes so as to receive the motion data sent by the probes.
The invention can easily control the oscilloscope when a user tests a tested signal which is far away from the oscilloscope, so that the signal can be completely displayed without returning to the oscilloscope for operation. The probe can also detect vibration signals, the vibration signals are displayed on a screen in an electric signal mode, and flaw detection can be performed on a motor, a machine tool and a steel plate.
The embodiment of the invention also provides a motion recognition method applied to the motion recognition system, and the flow of the motion recognition method is shown in fig. 4. The motion recognition method comprises the following steps:
step S1, the acceleration sensor 15 of the probe senses the movement of the probe, and generates the movement data of the probe based on the movement of the probe.
And step S2, the signal processing chip 26 of the oscilloscope identifies the motion data and generates an identification result.
And step S3, the control chip 27 of the oscilloscope controls the oscilloscope to act according to the identification result.
Generally, when the movement of the probe is a movement of the probe under the operation of the user, the step S2 specifically includes: the signal processing chip 26 performs digital filtering on the motion data, filters unnecessary states such as an idle state and an abnormal state through digital filtering, performs normalization processing on the motion data subjected to the digital filtering processing, and removes influence factors of action duration and action amplitude when different users input the same gesture, so as to facilitate subsequent data processing. Then, the signal processing chip 26 performs feature extraction on the normalized motion data, performs gesture recognition on the motion data after feature extraction by using a hidden markov model, and generates a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table. In this case, step S3 specifically includes: the control chip 27 generates a control command according to the signal processing chip 26 to control the action of the oscilloscope.
The above feature extraction generally adopts short time frame division processing to divide the motion data into a plurality of data segments, and then uses the average value as the key feature of each frame speed.
When the hidden Markov model is used for gesture recognition, meaningful gestures need to be defined in advance, each meaningful gesture is modeled by the hidden Markov model, the model is trained by the gesture model, and the finally trained hidden Markov model is used for recognizing the gestures of the probe.
For example, meaningful gestures defined include: knocking the probe, clockwise rotating, anticlockwise rotating, shaking in the Z-axis direction, shaking in the X-axis direction, shaking in the Y-axis direction and the like. The gestures are defined, trained and recognized in the gesture recognition part, the more times of training, the higher recognition accuracy rate is when the probe is actually used subsequently.
The oscilloscope operation corresponding to each gesture can be a default mode, or can be set by a user through an oscilloscope menu, and the user can also open or close the gesture recognition function through the menu. For example, the setting may be made according to the following mapping: continuously knocking the probe for 3 times, and beginning to recognize other gestures; continuously knocking the probe for 3 times again, and closing other gesture recognition functions; the oscilloscope is automatically set by continuously knocking the probe for 4 times, and automatically sets proper vertical and horizontal gears and trigger to completely and stably display signals on a screen. Table 1 shows an example of a mapping table of gestures and oscilloscope control commands based on a three-axis acceleration sensor.
TABLE 1 gesture and oscilloscope control command mapping table
In addition, when the motion of the probe is a motion of the probe caused by vibration of the object to be measured, the step S2 specifically includes: the signal processing chip converts the motion data into an electric signal. In this case, step S3 specifically includes: the control chip 27 controls the oscilloscope to display the electric signal.
The invention can easily control the oscilloscope when a user tests a tested signal which is far away from the oscilloscope, so that the signal can be completely displayed without returning to the oscilloscope for operation. The probe can also detect vibration signals, the vibration signals are displayed on a screen in an electric signal mode, and flaw detection can be performed on a motor, a machine tool and a steel plate.
The embodiment of the invention adopts the MEMS acceleration sensor with digital output, the MEMS acceleration sensor with digital output has small volume, and the analog signal output by the MEMS acceleration sensor is sampled into the digital signal for output by the ADC inside the MEMS acceleration sensor, thereby greatly simplifying the processing of the sensor signal inside the oscilloscope and being directly connected to a signal processing chip of the oscilloscope. By utilizing the MEMS acceleration sensor, the gesture operation of the probe in the X-axis direction, the Y-axis direction and the Z-axis direction can be detected.
At present, the MEMS acceleration sensor has small volume and can be easily integrated into an oscilloscope probe without greatly increasing the volume of the probe. For example, the MEMS triaxial acceleration sensor available from ADI may be used in a large number of models, such as ADXL363, ADXL375, ADXL343, and the like.
Fig. 5 shows the internal circuit diagram of ADXL363, which has dimensions of only 3.25mm by 3.0mm by 1.06 mm. A three-axis acceleration sensor, a signal conditioning circuit and a 12-bit ADC are integrated in the ADXL363, the ADC output is converted into an SPI (serial peripheral interface) output, and the SPI is a universal interface of a processor and can conveniently communicate with an information processing chip of an oscilloscope. In addition, the ADXL363 has an adjustable threshold motion activation mode inside, which can conveniently filter out useless motion and reduce the power consumption of the probe.
The principle and the implementation mode of the invention are explained by applying specific embodiments in the invention, and the description of the embodiments is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (14)
1. A probe, the probe comprising: the probe comprises a probe tip, a signal buffer unit, a coaxial signal wire and a BNC connector, wherein a measured signal acquired by the probe tip is buffered by the signal buffer unit and then transmitted to an oscilloscope through the coaxial signal wire and the BNC connector; characterized in that the probe further comprises:
an acceleration sensor for sensing movement of the probe and generating movement data for the probe based on the movement of the probe, wherein the movement of the probe comprises: the probe moves under the gesture operation of a user and the probe moves along with the vibration of the measured object;
the interface board is connected with the acceleration sensor;
and the active probe interface is connected with the interface board and is used for sending the motion data to a sensor interface of the oscilloscope so as to enable the oscilloscope to recognize the motion data of the probe under the gesture operation of a user and control the action of the oscilloscope according to a recognition result, wherein the motion data generated by the motion of the probe under the gesture operation of the user is recognized based on a trained hidden Markov model.
2. The probe of claim 1, wherein when the acceleration sensor is a single axis acceleration sensor, the motion data comprises an acceleration signal of the probe in a Z-axis direction, and/or a number of times and a frequency with which the probe is tapped, wherein the Z-axis is perpendicular to a plane in which the single axis acceleration sensor is located.
3. The probe of claim 1, wherein when the acceleration sensor is a dual-axis acceleration sensor, the motion data comprises acceleration signals of the probe in X-axis and Y-axis directions, and/or the number and frequency of taps of the probe, wherein the plane defined by the X-axis and Y-axis is parallel to the plane in which the acceleration sensor is located.
4. The probe of claim 1, wherein when the acceleration sensor is a three-axis acceleration sensor, the motion data comprises acceleration signals of the probe in three directions, an X-axis, a Y-axis, and a Z-axis, and/or the number and frequency of taps of the probe, wherein the X-axis and the Y-axis define a plane parallel to a plane in which the three-axis acceleration sensor is located, and the Z-axis is perpendicular to the plane in which the three-axis acceleration sensor is located.
5. The probe of claim 4, wherein the three-axis acceleration sensor is a MEMS accelerometer.
6. An oscilloscope for processing motion data for the probe of any of claims 1-5, the oscilloscope comprising: the BNC input port receives the measured signal, and then enters the display unit for displaying after sequentially passing through the input amplification unit, the A/D conversion unit and the waveform processing unit; it is characterized in that the oscilloscope further comprises: the device comprises an acceleration sensor interface, a signal processing chip and a control chip; wherein,
the acceleration sensor interface is connected with the probe through the active probe interface and is used for receiving the motion data generated by the acceleration sensor, wherein the motion of the probe comprises: the probe moves under the gesture operation of a user and the probe moves along with the vibration of the measured object;
the signal processing chip is connected with the acceleration sensor interface, and is used for identifying the motion data of the probe under the gesture operation of the user to generate an identification result, wherein the motion data generated by the motion of the probe under the gesture operation of the user is identified on the basis of a trained hidden Markov model;
and the control chip controls the oscilloscope to act according to the identification result.
7. The oscilloscope of claim 6, wherein when the motion of the probe comprises motion of the probe under a user gesture operation,
the signal processing chip is specifically used for performing gesture recognition on the motion data based on a trained hidden Markov model, and generating a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table;
and the control chip is specifically used for controlling the action of the oscilloscope according to the control command.
8. The oscilloscope of claim 6, wherein when the motion of the probe comprises motion of the probe caused by vibration of the probe with the object being measured,
the signal processing chip is specifically used for converting the motion data into an electric signal;
the control chip is specifically used for controlling the oscilloscope to display the electric signal.
9. The oscilloscope of claim 7, wherein the oscilloscope further comprises a storage unit for storing the mapping table of gestures and oscilloscope control commands.
10. The oscilloscope of claim 6, wherein the oscilloscope further comprises a signal processing unit connected between the acceleration sensor interface and the signal processing chip, for converting the analog signal into a digital signal when the motion data is an analog signal.
11. A motion recognition system, characterized in that the motion recognition system comprises: at least one probe according to any of claims 1-5 and an oscilloscope according to any of claims 6-10.
12. A motion recognition method applied to the motion recognition system according to claim 11, wherein the motion recognition method comprises:
the acceleration sensor of the probe senses the motion of the probe and generates motion data of the probe based on the motion of the probe, wherein the motion of the probe comprises: the probe moves under the gesture operation of a user and the probe moves along with the vibration of the measured object;
the signal processing chip of the oscilloscope identifies the motion data of the probe under the gesture operation of the user and generates an identification result, wherein the motion data generated by the motion of the probe under the gesture operation of the user is identified based on the trained hidden Markov model;
and the control chip of the oscilloscope controls the oscilloscope to act according to the identification result.
13. The motion recognition method of claim 12, wherein when the motion of the probe includes a motion of the probe under a user gesture operation,
the signal processing chip of the oscilloscope identifies the motion data and generates an identification result, and the identification result comprises the following steps: the signal processing chip sequentially performs digital filtering and normalization processing on the motion data, then performs feature extraction on the motion data subjected to the normalization processing, performs gesture recognition on the motion data subjected to the feature extraction by using a hidden Markov model, and generates a corresponding control command by combining a pre-stored gesture and an oscilloscope control command mapping table;
the control chip of the oscilloscope controls the oscilloscope to act according to the identification result, and the method comprises the following steps: and the control chip controls the oscilloscope to act according to the control command.
14. The motion recognition method according to claim 12, wherein when the motion of the probe includes a motion of the probe caused by vibration of the object to be measured,
the signal processing chip of the oscilloscope identifies the motion data and generates an identification result, and the identification result comprises the following steps: the signal processing chip converts the motion data into an electric signal;
the control chip of the oscilloscope controls the oscilloscope to act according to the identification result, and the method comprises the following steps: and the control chip controls the oscilloscope to display the electric signal.
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| CN110388911A (en) * | 2018-04-19 | 2019-10-29 | 上海亨通光电科技有限公司 | A kind of optical fibre gyro with covered detection function |
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| US20020149384A1 (en) * | 2001-04-11 | 2002-10-17 | Reasoner Kelly J. | Test probe including control device |
| US20040239309A1 (en) * | 2003-05-27 | 2004-12-02 | Barr Andrew Harvey | Remotely controllable oscilloscope |
| CN1181320C (en) * | 2003-08-28 | 2004-12-22 | 北京航空航天大学 | Multiple-parameter vibration measuring pen |
| CN2755579Y (en) * | 2004-09-23 | 2006-02-01 | 上海隆延测控信息技术有限公司 | Multifunctional pen vibration measuring device |
| CN202562620U (en) * | 2012-04-25 | 2012-11-28 | 北京时代龙城科技有限责任公司 | Vibration measuring pen |
| CN103869112A (en) * | 2014-04-01 | 2014-06-18 | 福建利利普光电科技有限公司 | Oscilloscope testing pen with trackball function |
| CN204027691U (en) * | 2014-06-23 | 2014-12-17 | 上海瑞视仪表电子有限公司 | A kind of pen type measurement mechanism that utilizes piezoelectric effect to measure rotating machinery double vibrations |
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