CN106896266A - Microwave section high-resolution Michelson interference measuring system - Google Patents
Microwave section high-resolution Michelson interference measuring system Download PDFInfo
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- CN106896266A CN106896266A CN201510955887.4A CN201510955887A CN106896266A CN 106896266 A CN106896266 A CN 106896266A CN 201510955887 A CN201510955887 A CN 201510955887A CN 106896266 A CN106896266 A CN 106896266A
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- 230000003287 optical effect Effects 0.000 claims abstract description 31
- 238000001514 detection method Methods 0.000 claims abstract description 10
- 239000007787 solid Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 7
- 238000002044 microwave spectrum Methods 0.000 abstract description 7
- 238000005259 measurement Methods 0.000 description 8
- 238000001228 spectrum Methods 0.000 description 8
- 230000005855 radiation Effects 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
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- 230000009286 beneficial effect Effects 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
- G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
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Abstract
The invention belongs to microwave spectrum field of measuring technique, a kind of microwave section high-resolution Michelson interference measuring system, including microwave beam-splitting optical grating, stationary mirror, moving reflector, moving reflector kinematic system, microwave detection system and the second stationary mirror are specifically disclosed；Moving reflector is the assembly being formed by connecting by multiple speculums, and the second stationary mirror is provided with the left of moving reflector, and the second stationary mirror coordinates input path by being gone back along original optical path return after multiple reflections with moving reflector.Combination by setting moving reflector and the second stationary mirror of the invention, makes moving reflector under conditions of mobile same distance, increased the path difference that microwave is caused by movable reflecting system, improves the spatial resolution of Michelson interference system.
Description
Technical field
The invention belongs to microwave spectrum field of measuring technique, a kind of microwave section high-resolution Michelson of specific design
Interferometer measuration system.
Background technology
Ultra-wideband microwave spectrum measurement has important answering in Space Microwave radiation and fusionplasma measurement
With.In terms of space dosimetry, it is mainly used in celestial body microwave and communication, microwave frequency is generally from several
The GHz of ten GHz to hundreds of, in communication field, microwave frequency higher means traffic capacity and peace higher
Quan Xing, in order to be able to monitor the microwave spectrum of each frequency range, it is necessary to be measured to microwave spectrum wider.
In fusionplasma, the electronics that its microwave makees circumnutation generation essentially from electronics in magnetic field is returned
Rotation radiation (ECE), the microwave frequency band of its frequency range GHz from tens GHz to hundreds of, electron cyclotron spoke
Many important parameters that intensity carries plasma are penetrated, such as：The temperature of electronics, density, energy and speed
Degree distribution etc..For example under conditions of optics thickness is met, the second harmonic spoke of plasma electron cyclotron radiation
Intensity proportional is penetrated in electron temperature；When there is suprathermal electron, radiation spectrum occurs obvious compared to thermal spectrum
Frequency spectrum move down, higher hamonic wave Spectral structure and electron energy, the angle of pitch and velocity of electrons are distributed closely related.
Therefore the measurement composed by broad band microwave radiation, can obtain abundant physical message.
Prior art has been developed the measuring method of various electron gyroradiation spectrums, most widely used at present to be
Multiple tracks superhet microwave radiometer, its spatial accuracy and time precision are higher, but the multiple frequency conversion of system needs,
Amplify and filtering process, system complex is relatively costly, the spatial point of its measurement is interruption in addition, it is impossible to seen
Observe the consecutive variations of ultra-wideband microwave transmitted spectrum.Frequency sweep microwave radiometer can measure continuous electronics
Cyclotron radiation frequency spectrum, this radiometer system is simple, only needs a broadband Sweep Source and broadband mixer, but
It is that working range is limited by the frequency band of local vibration source, measurement higher-order wave is relatively difficult.
Microwave section Michelson's interferometer is a kind of extraordinary method for measuring microwave spectrum, in Space Microwave
Actinometry, communication, astrophysical plasma and fusionplasma microwave radiometry have important application.
Microwave section Michelson's interferometer is also to be used for the i.e. electron gyroradiation measurement of plasma microwave radiation earliest
One of method, its great advantage is that can measure frequency spectrum very wide, is also currently used for measurement ultra wide band
The main method of microwave spectrum.For example in fusionplasma application, on the devices such as JET and DIII-D,
Can be measured that more than 5 times, frequency reaches the harmonic wave of the electron gyroradiation microwave of 500GHz, in last century
The eighties, on the HL-1 devices of state kernel Xi Wuyuan, also achieve the radiation harmonic measure of more than 4 times.Limit
The principal element of microwave section Michelson's interferometer development processed is its space (frequency spectrum) resolution ratio.Michelson
The distance and cycle that the time of interferometer and spatial discrimination are moved by moving reflector are determined.Increase reciprocal distance
Spatial resolution can be improved, but this will substantially reduce time resolution.Limited by moving reflector mechanical movement
System, the time resolution of the system can only accomplish ten milliseconds or so on current each device, and reciprocal distance is about
1-2cm。
The content of the invention
The purpose of the present invention is a kind of microwave section high-resolution Michelson interference measuring system of offer, spatial discrimination
Rate is high.
In order to solve the above-mentioned technical problem, the technical solution adopted by the present invention is：
A kind of microwave section high-resolution Michelson interference measuring system, including microwave beam-splitting optical grating, fixation reflex
Mirror, moving reflector, moving reflector kinematic system, microwave detection system and the second stationary mirror；It is micro-
Ripple beam-splitting optical grating is set with the input path of impinging microwave into 45 degree；Microwave beam-splitting optical grating top and input path
Vertical direction is provided with stationary mirror；The microwave beam-splitting optical grating lower section direction vertical with input path is provided with micro-
The microwave antenna of ripple detection system；Microwave beam-splitting optical grating right side is provided with movable anti-along the direction of input path
Penetrate mirror；Being provided with the downside of moving reflector can drive moving reflector reciprocating along the direction of impinging microwave
Moving reflector kinematic system；It is characterized in that：Described moving reflector be to be connected by multiple speculums and
Into assembly, be provided with the second stationary mirror on the left of moving reflector, the second stationary mirror with it is movable
Speculum coordinates input path by being gone back along original optical path return after multiple reflections.
Described moving reflector be by mutually two speculum groups at a right angle into movable corner cube mirror；Enter
Light is penetrated on movable corner cube mirror by reaching the second stationary mirror after two secondary reflections, fixes anti-by second
Returned along original optical path after penetrating mirror reflection.
Described moving reflector be connected with each other 3 pieces of speculum groups into movable folding face speculum；Movable folding
The angle constituted between adjacent 2 pieces of speculums of face speculum is identical；Incident light sequentially passes through movable folding face reflection
First speculum of mirror, the second stationary mirror, second speculum, second of movable folding face speculum
3rd speculum of stationary mirror, movable folding face speculum, and at the 3rd of movable folding face speculum
Vertically reflected back on speculum, returned along original optical path.
The scope of the angle of composition is between adjacent 2 pieces of speculums of described movable folding face speculum：It is more than
135 degree, less than 180 degree.
The angle constituted between adjacent 2 pieces of speculums of described movable folding face speculum is 165 degree.
Beneficial effects of the present invention are：
The microwave section high-resolution Michelson interference measuring system that the present invention is provided, by setting moving reflector
With the combination of the second stationary mirror, make moving reflector under conditions of mobile same distance, increased micro-
The path difference that ripple is caused by movable reflecting system, improves the spatial resolution of Michelson interference system.
Brief description of the drawings
Fig. 1 is the signal of the first embodiment of microwave section high-resolution Michelson interference measuring system of the invention
Figure；
Fig. 2 is second speculum schematic diagram of embodiment.
In figure：1. impinging microwave, 2. microwave beam-splitting optical grating, 3. stationary mirror, 4. movable corner cube mirror,
5. moving reflector kinematic system, 6. microwave antenna, 7. microwave detection system, 8. the second stationary mirror,
9. it is movable to roll over face speculum.
Specific embodiment
Technical scheme and beneficial effect are further said with specific embodiment below in conjunction with the accompanying drawings
It is bright.
As shown in figure 1, microwave section high-resolution Michelson interference measuring system of the invention includes microwave beam splitting light
Grid 2, stationary mirror 3, movable corner cube mirror 4, moving reflector kinematic system 5, microwave detection system 7
With the second stationary mirror 8.
Microwave beam-splitting optical grating 2 is set with the input path of impinging microwave 1 into 45 degree.The top of microwave beam-splitting optical grating 2 with
The vertical direction of input path is provided with stationary mirror 3.The lower section of microwave beam-splitting optical grating 2 is vertical with input path
Direction is provided with the microwave antenna 6 of microwave detection system 7.Along the side of input path on the right side of microwave beam-splitting optical grating 2
To being provided with movable corner cube mirror 4.The left side of movable corner cube mirror 4 is provided with can be anti-along original optical path by incident light
The second stationary mirror 8 being emitted back towards.The downside of movable corner cube mirror 4 is provided with can drive movable right angle to reflect
Mirror 4 along impinging microwave 1 the reciprocating moving reflector kinematic system 5 in direction.Movable corner cube mirror 4 by
Mutually two speculum groups at a right angle into.
Impinging microwave 1 is irradiated in 45 degree of microwave beam-splitting optical gratings 2 of setting, and microwave beam-splitting optical grating 2 is by impinging microwave
To transmit and reflection is divided into two paths of signals；The microwave signal all the way for wherein reflecting is anti-in the first stationary mirror 3
Penetrate, then transmitted through microwave beam-splitting optical grating 2, into microwave antenna 6；The microwave signal all the way for wherein transmiting
By reaching the second stationary mirror 8 after two secondary reflections on movable corner cube mirror 4, by the second fixation reflex
Mirror 8 reflexes to microwave beam-splitting optical grating 2 after reflecting along original optical path.By the reflection of microwave beam-splitting optical grating 2, transmission
Microwave signal is final also into microwave antenna 6 all the way.Two-way is by the microwave signal of different distances in microwave
The combining of reception antenna 6, and measured by microwave detection system 7.
Moving reflector kinematic system 5 drives movable corner cube mirror 4 to be moved back and forth along the direction of impinging microwave 1,
Two beam microwave path differences change, the interference fringe that the measurement of detection system 7 causes by the change of two beam microwave path differences.
Because the microwave signal all the way of transmission, by two secondary reflections, increased light path, institute on movable corner cube mirror 4
To improve the spatial resolution of microwave section high-resolution Michelson interference measuring system.
In an embodiment as illustrated in figure 2, movable corner cube mirror 4 replaces with movable folding face speculum 9.Movably
Folding face speculum 9 is by 3 pieces of speculum groups being connected with each other into the angle constituted between adjacent 2 pieces of speculums is
α.α is desirable to be more than 135 degree, less than the angle of 180 degree, preferably 165 degree.Transmission microwave signal all the way according to
Secondary first speculum, the second stationary mirror 8, movable folding face speculum 9 by movable folding face speculum 9
Second speculum, the second stationary mirror 8, the 3rd speculum of movable folding face speculum 9, and
Vertically reflected back on 3rd speculum of movable folding face speculum 9, returned along original optical path.
Claims (5)
1. it is a kind of microwave section high-resolution Michelson interference measuring system, including microwave beam-splitting optical grating (2), solid
Determine speculum (3), moving reflector, moving reflector kinematic system (5), microwave detection system (7) and
Second stationary mirror (8)；The input path of microwave beam-splitting optical grating (2) and impinging microwave (1) is into 45 degree
Set；Microwave beam-splitting optical grating (2) the top direction vertical with input path is provided with stationary mirror (3)；It is micro-
The microwave that ripple beam-splitting optical grating (2) the lower section direction vertical with input path is provided with microwave detection system (7) connects
Receive antenna (6)；Microwave beam-splitting optical grating (2) right side is provided with moving reflector along the direction of input path；Movably
Being provided with the downside of speculum can drive moving reflector reciprocating movable anti-along the direction of impinging microwave (1)
Penetrate mirror kinematic system (5)；It is characterized in that：Described moving reflector is to be formed by connecting by multiple speculums
Assembly, the second stationary mirror (8), the second stationary mirror (8) are provided with the left of moving reflector
Coordinate with moving reflector and input path is gone back by being returned along original optical path after multiple reflections.
2. a kind of microwave section high-resolution Michelson interference measuring system according to claim 1, it is special
Levy and be：Described moving reflector be by mutually two speculum groups at a right angle into movable corner cube mirror
(4)；Incident light on movable corner cube mirror (4) by reaching the second stationary mirror (8) after two secondary reflections,
Returned along original optical path after being reflected by the second stationary mirror (8).
3. a kind of microwave section high-resolution Michelson interference measuring system according to claim 1, it is special
Levy and be：Described moving reflector be connected with each other 3 pieces of speculum groups into movable folding face speculum (9)；
The angle constituted between adjacent 2 pieces of speculums of movable folding face speculum (9) is identical；Incident light is sequentially passed through
First speculum of movable folding face speculum (9), the second stationary mirror (8), movable folding face speculum
(9) second speculum, the second stationary mirror (8), movable roll over face speculum (9) the 3rd
Speculum, and vertically reflected back on the 3rd speculum of movable folding face speculum (9), along original optical path
Return.
4. a kind of microwave section high-resolution Michelson interference measuring system according to claim 3, it is special
Levy and be：The scope of the angle constituted between adjacent 2 pieces of speculums in described movable folding face speculum (9)
For：More than 135 degree, less than 180 degree.
5. a kind of microwave section high-resolution Michelson interference measuring system according to claim 3, it is special
Levy and be：The angle constituted between adjacent 2 pieces of speculums in described movable folding face speculum (9) is 165 degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510955887.4A CN106896266A (en) | 2015-12-18 | 2015-12-18 | Microwave section high-resolution Michelson interference measuring system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510955887.4A CN106896266A (en) | 2015-12-18 | 2015-12-18 | Microwave section high-resolution Michelson interference measuring system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113252608A (en) * | 2021-04-25 | 2021-08-13 | 江西师范大学 | Device for measuring gas refractive index based on light path folding and vacuumizing modes |
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|---|---|---|---|---|
| CN1412538A (en) * | 2002-07-12 | 2003-04-23 | 天津大学 | Broad-band light source signal detection method and its detector |
| CN101493559A (en) * | 2009-03-02 | 2009-07-29 | 四川大学 | Method for rapidly adjusting michelson interferometer semi-transparent and semi-reflecting mirror |
| CN103323124A (en) * | 2013-05-30 | 2013-09-25 | 湖北久之洋红外系统股份有限公司 | Infrared imaging spectrometer and fast moving target hyperspectral imaging method of infrared imaging spectrometer |
| CN203908680U (en) * | 2014-07-01 | 2014-10-29 | 象山星旗电器科技有限公司 | Window scanning static infrared Fourier transform imaging spectrometer system |
| CN205353202U (en) * | 2015-12-18 | 2016-06-29 | 核工业西南物理研究院 | Microwave section high -resolution mai keerxun interferes measurement system |
-
2015
- 2015-12-18 CN CN201510955887.4A patent/CN106896266A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1412538A (en) * | 2002-07-12 | 2003-04-23 | 天津大学 | Broad-band light source signal detection method and its detector |
| CN101493559A (en) * | 2009-03-02 | 2009-07-29 | 四川大学 | Method for rapidly adjusting michelson interferometer semi-transparent and semi-reflecting mirror |
| CN103323124A (en) * | 2013-05-30 | 2013-09-25 | 湖北久之洋红外系统股份有限公司 | Infrared imaging spectrometer and fast moving target hyperspectral imaging method of infrared imaging spectrometer |
| CN203908680U (en) * | 2014-07-01 | 2014-10-29 | 象山星旗电器科技有限公司 | Window scanning static infrared Fourier transform imaging spectrometer system |
| CN205353202U (en) * | 2015-12-18 | 2016-06-29 | 核工业西南物理研究院 | Microwave section high -resolution mai keerxun interferes measurement system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113252608A (en) * | 2021-04-25 | 2021-08-13 | 江西师范大学 | Device for measuring gas refractive index based on light path folding and vacuumizing modes |
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