CN106871816A - A kind of 3 D measuring instrument structured light projection method - Google Patents
A kind of 3 D measuring instrument structured light projection method Download PDFInfo
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- CN106871816A CN106871816A CN201710107067.9A CN201710107067A CN106871816A CN 106871816 A CN106871816 A CN 106871816A CN 201710107067 A CN201710107067 A CN 201710107067A CN 106871816 A CN106871816 A CN 106871816A
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- Prior art keywords
- film
- projection screen
- light source
- light
- structured light
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Eyeglasses (AREA)
Abstract
The invention belongs to three-dimensional measurement technical field, it is related to a kind of 3 D measuring instrument structured light projection method.Including step 1. is by mapping software generating structure light pattern and prints；Step 2. structured light patterns described in film camera capture；Step 3. rinses the film；Step 4. builds three-dimensional measurement platform；Be positioned over measured object in optical path by step 5., and clearly image is formed on the projection screen.Beneficial effects of the present invention are：The projection of structure light can be realized using film cooperation parallel light path, the cost of the 3 D measuring instrument based on structure light mode is reduced, the cost control of future products is conducive to after sizing production, be conducive to market competition.
Description
Technical field
The invention belongs to three-dimensional measurement technical field, it is related to a kind of 3 D measuring instrument structured light projection method.
Background technology
Structure light method three-dimensional measurement technology carries the light of a fixed structure using specific grenade instrumentation to testee projection,
And the structure light image that is deformed through testee surface modulation is shot, then from carrying testee surface three dimension shape
The three-dimensional appearance data of testee are calculated in the image of looks information.Structure light method noncontact, high resolution, offer whole audience letter
Breath, without destruction, no manual intervention measurement, data acquisition speed is fast, have a wide range of application, be easy to implement automation the advantages of, and quilt
It is known as the most promising measuring three-dimensional profile method in actual scientific research and production practices.The projection pattern of current main flow can
It is divided into computer projection mode, but the projecting apparatus of commercialization hundreds of thousands easily, it is expensive, it is unfavorable for promoting on a large scale.
The content of the invention
The purpose of the present invention is directed to the deficiencies in the prior art, there is provided a kind of 3 D measuring instrument structured light projection method,
Including：
Step 1. is by mapping software generating structure light pattern and prints；
Step 2. structured light patterns described in film camera capture；
Step 3. rinses the film；
Step 4. builds three-dimensional measurement platform, including, projection screen is set, in the side of the projection screen, light source is set,
Optical lens is set between the projection screen and the light source, the optical lens position is adjusted so that the light source is located at institute
The focal point of optical lens is stated, film is set between the optical lens and the projection screen, and adjusts the position of the film
Put so that the light that the light source sends on the projection screen by after the optical lens and the film, forming clear
Image；
Be positioned over measured object between the film and the projection screen by step 5., and is placed in the optics of the platform
In path, clearly image is formed on the projection screen.
Further, the mapping software of the step 1 is Matlab.
Further, the structured light patterns of the step 1 are sinusoidal structured light pattern.
Further, the film of the step 2 and the step 3 is color film.
Further, the film of the step 2 and the step 3 is black and white film.
Further, the light source of the step 4 is monochromatic LED light source.
Further, the step 4 is additionally included near the light source and sets radiator.
Further, the projection screen of the step 4 is connected with computer, receives projected image by computer, and pass through
Software is measured to described image.
Beneficial effects of the present invention are：
The projection of structure light can be realized using film cooperation parallel light path, the three-dimensional survey based on structure light mode is reduced
The cost of instrument is measured, the cost control of future products is conducive to after sizing production, be conducive to market competition.
Brief description of the drawings
Fig. 1 is the schematic diagram of the projecting method.
In figure：1- light sources, 2- optical lenses, 3- films, 4- measured objects, 5- projection screens.
Specific embodiment
With reference to the accompanying drawings and detailed description, the present invention is further illustrated.
Embodiment one
The projecting method, as shown in figure 1, including,
Step 1. is by mapping software generating structure light pattern and prints；
Step 2. structured light patterns described in film camera capture；
Step 3. rinses the film 3；
Step 4. builds three-dimensional measurement platform, including, projection screen 5 is set, in the side of the projection screen 5, light source 1 is set,
Optical lens 2 is set between the projection screen 5 and the light source 1, the position of optical lens 2 is adjusted so that the light source 1
Positioned at the focal point of the optical lens 2, film 3 is set between the optical lens 2 and the projection screen 5, and adjusts institute
State the position of film 3 so that after the light that the light source 1 sends is by the optical lens 2 and the film 3, in the throwing
Clearly image is formed on shadow screen 5；
Be positioned over measured object 4 between the film 3 and the projection screen 5 by step 5., and is placed in the platform
In optical path, clearly image is formed on the projection screen 5.
Further, the mapping software of the step 1 is Matlab.
Further, the structured light patterns of the step 1 are sinusoidal structured light pattern.
Further, the film 3 of the step 2 and the step 3 is color film.
Further, the film 3 of the step 2 and the step 3 is black and white film.
Further, the light source 1 of the step 4 is monochromatic LED light source.
Further, the step 4 is additionally included in the light source 1 and nearby sets radiator.
Further, the projection screen 5 of the step 4 is connected with computer, receives projected image by computer, and pass through
Software is measured to described image.
The present invention is not limited to above-mentioned implementation method, in the case of without departing substantially from substance of the present invention, art technology
Any deformation that personnel are contemplated that, improvement, replacement each fall within protection scope of the present invention.
Claims (8)
1. a kind of 3 D measuring instrument structured light projection method, including,
Step 1. is by mapping software generating structure light pattern and prints；
Step 2. structured light patterns described in film camera capture；
Step 3. rinses the film；
Step 4. builds three-dimensional measurement platform, including, projection screen is set, light source is set in the side of the projection screen, described
Optical lens is set between projection screen and the light source, the optical lens position is adjusted so that the light source is located at the light
The focal point of lens is learned, film is set between the optical lens and the projection screen, and adjust the position of the film, made
The light that sends of the light source by after the optical lens and the film, being formed on the projection screen and clearly being schemed
Picture；
Be positioned over measured object between the film and the projection screen by step 5., and is placed in the optical path of the platform
In, clearly image is formed on the projection screen.
2. projecting method according to claim 1, it is characterised in that the mapping software of the step 1 is Matlab.
3. projecting method according to claim 1, it is characterised in that the structured light patterns of the step 1 are sine
Structured light patterns.
4. projecting method according to claim 1, it is characterised in that the film of the step 2 or the step 3 is
Color film.
5. projecting method according to claim 1, it is characterised in that the film of the step 2 or the step 3 is
Black and white film.
6. projecting method according to claim 1, it is characterised in that the light source of the step 4 is monochromatic LED light
Source.
7. the projecting method according to claim 1 or 6, it is characterised in that the step 4 is additionally included near the light source
Radiator is set.
8. projecting method according to claim 1, it is characterised in that the projection screen of the step 4 is connected with computer,
Projected image is received by computer, and described image is measured by software.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710107067.9A CN106871816A (en) | 2017-02-27 | 2017-02-27 | A kind of 3 D measuring instrument structured light projection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710107067.9A CN106871816A (en) | 2017-02-27 | 2017-02-27 | A kind of 3 D measuring instrument structured light projection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106871816A true CN106871816A (en) | 2017-06-20 |
Family
ID=59168775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710107067.9A Pending CN106871816A (en) | 2017-02-27 | 2017-02-27 | A kind of 3 D measuring instrument structured light projection method |
Country Status (1)
| Country | Link |
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| CN (1) | CN106871816A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1140834A (en) * | 1995-07-18 | 1997-01-22 | 李德功 | Three-dimensional structure surveying method |
| CN1529122A (en) * | 2003-10-09 | 2004-09-15 | 四川大学 | Method for realizing Fourier transfrom contour by generating pi phase shift by two-colour grating template |
| US20080084518A1 (en) * | 2006-10-06 | 2008-04-10 | 3M Innovative Properties Company | Stereoscopic 3d liquid crystal display apparatus with structured light guide surface |
| CN201177729Y (en) * | 2008-04-14 | 2009-01-07 | 大连大学 | Raster film of grating projection type three-dimensional photo system |
| CN101915949A (en) * | 2010-08-06 | 2010-12-15 | 上海交通大学 | Designing and manufacturing method of cosine luminous intensity distribution physical structure grating for optical measurement |
| CN102405394A (en) * | 2009-02-27 | 2012-04-04 | 体表翻译有限公司 | Estimating physical parameters using three dimensional representations |
| CN103413309A (en) * | 2013-08-12 | 2013-11-27 | 西北工业大学 | CCD camera nonlinearity degree calibration method based on structured light three-dimensional measurement system |
| CN104345463A (en) * | 2014-09-28 | 2015-02-11 | 东南大学 | Plasmon nanometer structure-based dynamic holographic three-dimensional reconstruction device |
-
2017
- 2017-02-27 CN CN201710107067.9A patent/CN106871816A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1140834A (en) * | 1995-07-18 | 1997-01-22 | 李德功 | Three-dimensional structure surveying method |
| CN1529122A (en) * | 2003-10-09 | 2004-09-15 | 四川大学 | Method for realizing Fourier transfrom contour by generating pi phase shift by two-colour grating template |
| US20080084518A1 (en) * | 2006-10-06 | 2008-04-10 | 3M Innovative Properties Company | Stereoscopic 3d liquid crystal display apparatus with structured light guide surface |
| CN201177729Y (en) * | 2008-04-14 | 2009-01-07 | 大连大学 | Raster film of grating projection type three-dimensional photo system |
| CN102405394A (en) * | 2009-02-27 | 2012-04-04 | 体表翻译有限公司 | Estimating physical parameters using three dimensional representations |
| CN101915949A (en) * | 2010-08-06 | 2010-12-15 | 上海交通大学 | Designing and manufacturing method of cosine luminous intensity distribution physical structure grating for optical measurement |
| CN103413309A (en) * | 2013-08-12 | 2013-11-27 | 西北工业大学 | CCD camera nonlinearity degree calibration method based on structured light three-dimensional measurement system |
| CN104345463A (en) * | 2014-09-28 | 2015-02-11 | 东南大学 | Plasmon nanometer structure-based dynamic holographic three-dimensional reconstruction device |
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Application publication date: 20170620 |