CN106841703A - The fixture of the ultralow resistance product test accuracy of chip - Google Patents
The fixture of the ultralow resistance product test accuracy of chip Download PDFInfo
- Publication number
- CN106841703A CN106841703A CN201710081317.6A CN201710081317A CN106841703A CN 106841703 A CN106841703 A CN 106841703A CN 201710081317 A CN201710081317 A CN 201710081317A CN 106841703 A CN106841703 A CN 106841703A
- Authority
- CN
- China
- Prior art keywords
- plummer
- fixture
- limiting stand
- test
- test accuracy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
The invention discloses a kind of fixture of the ultralow resistance product test accuracy of chip, including base, the base is provided with limiting stand and is provided with plummer side by side with limiting stand, and the limiting stand is provided with and the equal-sized plummer of limiting stand；The plummer inside is hollow, and the plummer side is provided with upper and lower caging bolt, and inside is provided with spring；The plummer top is provided with linking arm, and the linking arm one end probes into plummer inside and is connected with plummer；The linking arm other end is provided with load probe tile, and the load probe tile side is provided with four line probes；Present invention, avoiding due to the inaccurate situation of test caused by human factor (test custom, dynamics, test point position).
Description
Technical field
The invention belongs to a kind of fixture of the ultralow resistance product test accuracy of chip.
Background technology
In recent years, due to small size high accuracy low resistance product development, and data acquisition and processing (DAP) device performance
Significantly lifted, such case causes the technological innovation of traditional electric current detecting method based on current divider principle, and makes new
Using continuing to develop.During the production and use of the ultralow resistance product of chip, frequently refer to examination to ultralow resistance,
Situations such as screening, test.But because ultralow resistance product resistance is too small, operating personnel often occur test in test process
Inaccurate, retest difference is larger, situations such as different reviewer's test datas also have bigger difference.How these are solved
The characteristics of problem is it is necessary to from product, improves the precision of test, reduces artificial factor.
Existing method of testing is mainly operating personnel and is measured using four line test pencils, the dynamics of operating personnel, test pencil
The operating habit of contact point, contact angle and individual have certain randomness, which results in the inaccuracy of test.
The content of the invention
Goal of the invention：The present invention provides a kind of making side of the fixture of the ultralow resistance product test accuracy of chip
Method, this method avoid due to the inaccurate situation of test caused by human factor (test custom, dynamics, test point position).
Technical scheme：A kind of fixture of the ultralow resistance product test accuracy of chip, including base, the base are provided with
Limiting stand and plummer is provided with side by side with limiting stand, the limiting stand is provided with and the equal-sized plummer of limiting stand；It is described
Plummer inside is hollow, and the plummer side is provided with upper and lower caging bolt, and inside is provided with spring；The plummer top sets
There is linking arm, the linking arm one end probes into plummer inside and is connected with plummer；The linking arm other end is provided with load probe tile,
The load probe tile side is provided with four line probes.
Specifically, the limiting stand and plummer size, shape all same.
Specifically, the linking arm is located on the spring in plummer.
Specifically, the four lines probe has two.
Specifically, described two four lines probes are oppositely arranged.
Specifically, the plummer is provided with a groove.
Beneficial effect：Compared with prior art, the advantage of the invention is that：
1st, by the restriction to testing dynamics, the scuffing of product electrode is reduced；
2nd, by the regulation to test point position, production personnel can be made to have unified test mark with user of service
Standard, the carrying out for having foundation is tested；
3rd, by the regulation to testing test pencil contact angle, the actual value of product can more accurately be tested out；
4th, by the regulation of restriction, test point position and test angle to testing dynamics, the repetition of product can be increased
Certainty of measurement, improves measuring accuracy.
Brief description of the drawings
Fig. 1 is structural representation of the invention.
Specific embodiment
With reference to the accompanying drawings and detailed description, the present invention is furture elucidated.
As shown in figure 1, a kind of fixture of the ultralow resistance product test accuracy of chip, including base 1, limiting stand 2, spring
3rd, upper and lower caging bolt 4, linking arm 5, carry probe tile 6, four line probes 7 and plummer 8, the base 1 be provided with limiting stand 2 with
And plummer is provided with side by side with limiting stand 2, the plummer is provided with a groove, and the limiting stand 2 is provided with and the size of limiting stand 2
Equal plummer 8；The inside of the plummer 8 is hollow, and the side of plummer 8 is provided with upper and lower caging bolt 4, and inside is provided with
Spring 3；The top of the plummer 8 is provided with linking arm 5, and the one end of linking arm 5 probes into the inside of plummer 8 and is connected with plummer 8, even
Connect on the spring 3 that arm 5 is located in plummer 8；The other end of the linking arm 5 is provided with load probe tile 6, and the side of load probe tile 6 sets
There are two four line probes 7, two four line probes 7 are oppositely arranged.
Above-mentioned limiting stand 2 and the size of plummer 8, shape all same.
Above-mentioned test dynamics can be measured by modes such as graduated scale, gravitometers；
Above-mentioned test angle can be by product and test pencil relative adjustment；
It is above-mentioned comprising any method that can be by changing test dynamics, test point position and test angle.
Test product is put into the groove of plummer during test, groove and product cooperate, limitation product center with
Four line probes correspondence, slowly declines linking arm, will be stopped during contact product whne probe tips, and regulation carries probe in probe tile
The angle of lateral separation and probe contact product, the regulation of lateral separation should enable probe tips to push to touch tested product
The center of product two end electrodes, the angle of probe contact product is advisable (except should requiring) between should reaching 60 °~80 °；
After regulating, continue to decline linking arm, be that probe tips slowly contact test product electrode two ends, and dynamics is moderate, can
The electrode zone of good contact product, and the probe is had obvious deformation, now linking arm falling head utilizes limiting stand
On caging bolt fix.Connecing lower class can successively measure test product.
Claims (6)
1. the fixture of the ultralow resistance product test accuracy of a kind of chip, it is characterised in that：Including base, the base is provided with
Limiting stand and plummer is provided with side by side with limiting stand, the limiting stand is provided with and the equal-sized plummer of limiting stand；It is described
Plummer inside is hollow, and the plummer side is provided with upper and lower caging bolt, and inside is provided with spring；The plummer top sets
There is linking arm, the linking arm one end probes into plummer inside and is connected with plummer；The linking arm other end is provided with load probe tile,
The load probe tile side is provided with four line probes.
2. the fixture of the ultralow resistance product test accuracy of chip according to claim 1, it is characterised in that：It is described spacing
Platform and plummer size, shape all same.
3. the fixture of the ultralow resistance product test accuracy of chip according to claim 1, it is characterised in that：The connection
Arm is located on the spring in plummer.
4. the fixture of the ultralow resistance product test accuracy of chip according to claim 1, it is characterised in that：Four line
Probe has two.
5. the fixture of the ultralow resistance product test accuracy of chip according to claim 4, it is characterised in that：It is described two
Four line probes are oppositely arranged.
6. the fixture of the ultralow resistance product test accuracy of chip according to claim 1, it is characterised in that：The carrying
Platform is provided with a groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710081317.6A CN106841703A (en) | 2017-02-15 | 2017-02-15 | The fixture of the ultralow resistance product test accuracy of chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710081317.6A CN106841703A (en) | 2017-02-15 | 2017-02-15 | The fixture of the ultralow resistance product test accuracy of chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106841703A true CN106841703A (en) | 2017-06-13 |
Family
ID=59128080
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710081317.6A Pending CN106841703A (en) | 2017-02-15 | 2017-02-15 | The fixture of the ultralow resistance product test accuracy of chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106841703A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108037331A (en) * | 2017-11-20 | 2018-05-15 | 中国电子科技集团公司第五十五研究所 | Suitable for the exploration card and designing and manufacturing method of Digital Analog Hybrid Circuits On-wafer measurement |
| CN109342778A (en) * | 2018-11-15 | 2019-02-15 | 南京萨特科技发展有限公司 | A kind of hand-held four-wire method test fixture |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2155571Y (en) * | 1992-07-13 | 1994-02-09 | 张力 | Universal testing clamp for low-resistance testers |
| TW516630U (en) * | 2001-10-08 | 2003-01-01 | Chroma Ate Inc | Four-terminal testing tool |
| CN2896285Y (en) * | 2006-04-21 | 2007-05-02 | 贵州振华云科电子有限公司 | Sheet-type resistance network pressurizing, ageing sieving clamp |
| CN2896286Y (en) * | 2006-04-21 | 2007-05-02 | 贵州振华云科电子有限公司 | Sheet-type resistance pressurizing test clamp |
| CN203479982U (en) * | 2013-09-04 | 2014-03-12 | 中国振华集团云科电子有限公司 | Multi-purpose testing clamp for chip resistor |
| CN205301515U (en) * | 2015-10-16 | 2016-06-08 | 湖南凯杰科技有限责任公司 | Function detection fixture |
| CN106199086A (en) * | 2016-08-31 | 2016-12-07 | 天津华宁电子有限公司 | A kind of detection obliquity sensor wiring board cubing |
| CN205941695U (en) * | 2016-08-24 | 2017-02-08 | 宁德时代新能源科技股份有限公司 | Resistance measuring device |
-
2017
- 2017-02-15 CN CN201710081317.6A patent/CN106841703A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2155571Y (en) * | 1992-07-13 | 1994-02-09 | 张力 | Universal testing clamp for low-resistance testers |
| TW516630U (en) * | 2001-10-08 | 2003-01-01 | Chroma Ate Inc | Four-terminal testing tool |
| CN2896285Y (en) * | 2006-04-21 | 2007-05-02 | 贵州振华云科电子有限公司 | Sheet-type resistance network pressurizing, ageing sieving clamp |
| CN2896286Y (en) * | 2006-04-21 | 2007-05-02 | 贵州振华云科电子有限公司 | Sheet-type resistance pressurizing test clamp |
| CN203479982U (en) * | 2013-09-04 | 2014-03-12 | 中国振华集团云科电子有限公司 | Multi-purpose testing clamp for chip resistor |
| CN205301515U (en) * | 2015-10-16 | 2016-06-08 | 湖南凯杰科技有限责任公司 | Function detection fixture |
| CN205941695U (en) * | 2016-08-24 | 2017-02-08 | 宁德时代新能源科技股份有限公司 | Resistance measuring device |
| CN106199086A (en) * | 2016-08-31 | 2016-12-07 | 天津华宁电子有限公司 | A kind of detection obliquity sensor wiring board cubing |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108037331A (en) * | 2017-11-20 | 2018-05-15 | 中国电子科技集团公司第五十五研究所 | Suitable for the exploration card and designing and manufacturing method of Digital Analog Hybrid Circuits On-wafer measurement |
| CN108037331B (en) * | 2017-11-20 | 2020-08-11 | 中国电子科技集团公司第五十五研究所 | Probe card suitable for digital-analog hybrid circuit on-chip test and design and manufacturing method |
| CN109342778A (en) * | 2018-11-15 | 2019-02-15 | 南京萨特科技发展有限公司 | A kind of hand-held four-wire method test fixture |
| CN109342778B (en) * | 2018-11-15 | 2024-04-02 | 南京萨特科技发展有限公司 | Hand-held four-wire method test fixture |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170613 |