CN106841262A - A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel - Google Patents
A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel Download PDFInfo
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- CN106841262A CN106841262A CN201710112376.5A CN201710112376A CN106841262A CN 106841262 A CN106841262 A CN 106841262A CN 201710112376 A CN201710112376 A CN 201710112376A CN 106841262 A CN106841262 A CN 106841262A
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- ray
- sample
- jewel
- power dissipation
- fluorescent spectrometry
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Abstract
The invention discloses a kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel, it is desirable to provide a kind of detection speed is fast, the method that the accurate x-ray power dissipation fluorescent spectrometry of detection method differentiates jewel, the method comprises the steps successively：Quantitative analysis is carried out to ruby sample, the particulate of 350 meters of sizes is ground using a stone crusher, it is using pestle and grinding body that sample mill is uniform, these powdered samples are well mixed with cellulose.Calculate by weight, the ratio of cellulose and sample is 1：1, mixture is then made 2.5 centimetres of diameter in uniform thickness under 15 2 tons of pressure, weigh 350 milligrams of thin spherolite；3) formula that the concentration of calculating each element is used is Ij=I0GmjKjCj；Belong to jewel detection technical field.
Description
Technical field
It is to be related to a kind of x-ray power dissipation fluorescence spectrum specifically the present invention relates to a kind of discrimination method of jewel
The method that method detects jewel, belongs to jewel detection technical field.
Background technology
With the progress of jewel synthetic technology and enhancement and treatment, the difference of synthetic gem and natural gemstone is increasingly
Small, identification difficulty is increasing.These jewels are identified with traditional Gemstone Identification instrument, just seems helpless sometimes.Because
The conventional tools such as gemolite, refractometer are that optical property and other physical properties by determining mineral distinguish gem and jade,
Qualitatively qualification result can only be made according to these properties and parameter.Moreover, some its photosensitiveness of different types of jewel and physical property
It is closely similar.
The content of the invention
Regarding to the issue above, it is simple it is an object of the invention to provide a kind of detection method, the x-ray energy that testing result prepares
The method that amount dispersion fluorescent spectrometry differentiates jewel.
The technical scheme that the present invention is provided is such：
A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel, comprises the steps successively：
1) quantitative analysis is carried out to ruby sample, the particulate of 350 meters of sizes is ground using a stone crusher, using grinding
Pestle and grinding body are uniform sample mill, and these powdered samples are well mixed with cellulose.Calculate by weight, cellulose and sample
The ratio of product is 1：1；
2) mixture is made 2.5 centimetres of diameter in uniform thickness under pressure 15-2 tons, weighs 350 milligrams of thin spherolite；
3) formula that the concentration of calculating each element is used is Ij=I0GmjKjCj,
Wherein IJ=j-th strips X-ray intensity, I0The intensity of=excitaton source, G=geometrical factors, j-th element of MJ=it is dense
Degree, KJ=is excited plus detection factors and the CJ=absorption correction factors.
4) obtained from 25 millimeters of identical Y-STD 302ppm of diameter using the measured value of ij and CJ and the Kj and MJ of given value
Obtain the value of geometrical factor I0G；
5) by the mass-absorption coefficient in source between measurement placement sample and by detector measurement in another experiment
The X-ray energy of known sample obtains unknown sample data；Use formula ID I0E X are measured to the intensity of X-ray,
The absorption energy factor of each sample is obtained, wherein u is mass-absorption coefficient and CJ=1-ex, and wherein u1 and u2 is respectively quality
Accidental absorption coefficient and Energy X-ray, use Philip, X-ray to spread out in the ruby and sapphire of X-ray diffraction XRD patterns
Instrument is penetrated, including record x ray generator, angular instrument, gas proportional detector and number system；
6) the garnet XRD spectrum of standard is used as standard master drawing.
Further, a kind of above-mentioned x-ray power dissipation fluorescent spectrometry characterizes the method for jewel, described spectrometer
Using Siemens SRS303 type x-ray XRFs；X light tube voltage 20kV, tube current 10mA, analyzing crystal
LiFl00, PET, detector F.C, sweep speed 56min, thick slit, vacuum light path, rotary sample.
Further, the method that a kind of above-mentioned x-ray power dissipation fluorescent spectrometry characterizes jewel, described jewel is
Garnet.
Compared with prior art, the technical scheme that the present invention is provided can identify that jewel is deeply detected quick, lossless, exactly
The various optical properties and inherent composition and structure of gem and jade are studied, and detection method is simple.
Specific embodiment
The present invention is further illustrated below by the mode of embodiment, but does not constitute any limitation of the invention, appointed
The modification of the limited number of time that who is made in scope of the presently claimed invention is still in scope of the presently claimed invention.
Embodiment 1
A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel, comprises the steps successively：
1) quantitative analysis is carried out to ruby sample, the particulate of 350 meters of sizes is ground using a stone crusher, using grinding
Pestle and grinding body are uniform sample mill, and these powdered samples are well mixed with cellulose.Calculate by weight, cellulose and sample
The ratio of product is 1：1；
2) mixture is made 2.5 centimetres of diameter in uniform thickness under pressure 15-2 tons, weighs 350 milligrams of thin spherolite；
3) formula that the concentration of calculating each element is used is Ij=I0GmjKjCj,
Wherein IJ=j-th strips X-ray intensity, I0The intensity of=excitaton source, G=geometrical factors, j-th element of MJ=it is dense
Degree, KJ=is excited plus detection factors and the CJ=absorption correction factors.
4) obtained from 25 millimeters of identical Y-STD 302ppm of diameter using the measured value of ij and CJ and the Kj and MJ of given value
Obtain the value of geometrical factor I0G；
5) by the mass-absorption coefficient in source between measurement placement sample and by detector measurement in another experiment
The X-ray energy of known sample obtains unknown sample data；Use formula ID I0E X are measured to the intensity of X-ray,
The absorption energy factor of each sample is obtained, wherein u is mass-absorption coefficient and CJ=1-ex, and wherein u1 and u2 is respectively quality
Accidental absorption coefficient and Energy X-ray, use Philip, X-ray to spread out in the ruby and sapphire of X-ray diffraction XRD patterns
Instrument is penetrated, including record x ray generator, angular instrument, gas proportional detector and number system；
6) the garnet XRD spectrum of standard is used as standard master drawing.
Wherein：Described spectrometer uses Siemens SRS303 type x-ray XRFs；X light tube voltage 20kV,
Tube current 10mA, analyzing crystal LiFl00, PET, detector F.C, sweep speed 56min, thick slit, vacuum light path, sample
Rotation；Described jewel is garnet.
Claims (3)
1. a kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel, it is characterised in that comprise the steps successively：
1) quantitative analysis is carried out to ruby sample, the particulate of 350 meters of sizes is ground using a stone crusher, using pestle and
Grinding body is uniform sample mill, and these powdered samples are well mixed with cellulose.Calculate by weight, cellulose and sample
Ratio is 1：1；
2) mixture is made 2.5 centimetres of diameter in uniform thickness under pressure 15-2 tons, weighs 350 milligrams of thin spherolite；
3) formula that the concentration of calculating each element is used is Ij=I0GmjKjCj,
Wherein IJ=j-th strips X-ray intensity, I0The intensity of=excitaton source, G=geometrical factors, the concentration of j-th element of MJ=, KJ
=excite plus detection factors and the CJ=absorption correction factors.
4) obtained several from 25 millimeters of identical Y-STD302ppm of diameter using the measured value of ij and CJ and the Kj and MJ of given value
The value of what factor I0G；
5) by the mass-absorption coefficient in source between measurement placement sample and by known to detector measurement in another experiment
The X-ray energy of sample obtains unknown sample data；Use formula ID I0E X are measured to the intensity of X-ray, are obtained
The absorption energy factor of each sample, wherein u is mass-absorption coefficient and CJ=1-ex, and wherein u1 and u2 is respectively that quality is accidental
Absorption coefficient and Energy X-ray, using Philip in the ruby and sapphire of X-ray diffraction XRD patterns, X-ray diffractometer,
Including record x ray generator, angular instrument, gas proportional detector and number system；
6) the garnet XRD spectrum of standard is used as standard master drawing.
2. the method that a kind of x-ray power dissipation fluorescent spectrometry according to claim 1 characterizes jewel, its feature exists
In described spectrometer uses Siemens SRS303 type x-ray XRFs；X light tube voltage 20kV, tube current
10mA, analyzing crystal LiFl00, PET, detector F.C, sweep speed 56min, thick slit, vacuum light path, rotary sample.
3. the method that a kind of x-ray power dissipation fluorescent spectrometry according to claim 1 characterizes jewel, its feature exists
In described jewel is garnet.
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| CN201710112376.5A CN106841262A (en) | 2017-02-28 | 2017-02-28 | A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel |
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| CN201710112376.5A CN106841262A (en) | 2017-02-28 | 2017-02-28 | A kind of method that x-ray power dissipation fluorescent spectrometry characterizes jewel |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113466197A (en) * | 2021-07-05 | 2021-10-01 | 广东省珠宝玉石及贵金属检测中心(广东省技术监督珠宝贵金属质量检验站) | Method and system for measuring element content in red and sapphire by adopting X-ray fluorescence |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103076352A (en) * | 2012-12-28 | 2013-05-01 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN103226111A (en) * | 2012-01-31 | 2013-07-31 | X射线精密有限公司 | X-ray inspector |
| CN105021640A (en) * | 2015-06-03 | 2015-11-04 | 江苏天瑞仪器股份有限公司 | Rapid X-ray fluorescence spectrometric determination method for elemental selenium in cereals |
-
2017
- 2017-02-28 CN CN201710112376.5A patent/CN106841262A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103226111A (en) * | 2012-01-31 | 2013-07-31 | X射线精密有限公司 | X-ray inspector |
| CN103076352A (en) * | 2012-12-28 | 2013-05-01 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN105021640A (en) * | 2015-06-03 | 2015-11-04 | 江苏天瑞仪器股份有限公司 | Rapid X-ray fluorescence spectrometric determination method for elemental selenium in cereals |
Non-Patent Citations (3)
| Title |
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| 戴振麟等: "能量色散X 射线荧光分析基本参数法研究", 《核电子学与探测技术》 * |
| 李清彩等: "粉末压片制样波长色散X 射线荧光光谱法测定钼矿石中9种元素", 《岩矿测试》 * |
| 陈丁滢等: "运用X射线荧光光谱法对石榴石分类鉴定", 《上海计量测试》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113466197A (en) * | 2021-07-05 | 2021-10-01 | 广东省珠宝玉石及贵金属检测中心(广东省技术监督珠宝贵金属质量检验站) | Method and system for measuring element content in red and sapphire by adopting X-ray fluorescence |
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