CN106841253A - A kind of compound diffractometer that can accurately measure albumin crystal data - Google Patents
A kind of compound diffractometer that can accurately measure albumin crystal data Download PDFInfo
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- CN106841253A CN106841253A CN201611249150.1A CN201611249150A CN106841253A CN 106841253 A CN106841253 A CN 106841253A CN 201611249150 A CN201611249150 A CN 201611249150A CN 106841253 A CN106841253 A CN 106841253A
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- compound
- diffractometer
- induction pieces
- diffractometer according
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/612—Specific applications or type of materials biological material
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a kind of compound diffractometer that can accurately measure albumin crystal data, X-ray detection device and control device, the X-ray detection device include being provided with the Angle measurement of sample, it is characterised in that：The Angle measurement is provided with the pressure sensitive unit for perceiving the pressure change put on testing sample.The present invention can not only judge the presence or absence of testing sample, and can quantitatively monitor the stability of diffractometer, exclude influence of the stability of diffractometer to sample analysis data, and simple structure, sensitivity is high, and measurement data is more accurate.
Description
Technical field
The invention belongs to X-ray diffractometer field, albumin crystal data can be accurately measured more particularly, to a kind of
Compound diffractometer.
Background technology
X-ray diffraction measurement is to identify the important means of large biological molecule phase structure.Usual high-precision experimental data is obtained
The diffractometer of the light source, high-quality albumin crystal sample and high stability of high stability must be needed.Due to experimental implementation error,
The situation for also carrying out diffraction analysis by step when albumin crystal sample occurs not on Angle measurement occurs, energy of losing time,
Testing efficiency is low, it is therefore desirable to which one judges whether testing sample carries out one in target location in advance before testing.
When being tested, if there is the undesirable situation of diffraction data, it may be possible to which light there occurs shake, it may be possible to
Albumin crystal sample property is not good, it is also possible to be that sample there occurs and rock, rocking for sample is it could also be possible that rocking for ground
Cause the effect of jitter of diffractometer its stability.For the influence that the unstability for excluding diffractometer is brought to diffraction data, need
Want the unstability of quantitative observation diffractometer, situation of the judgement sample on diffractometer, to attempt solving diffractometer stability band
The data come are undesirable.And diffractometer on the market lacks the Method and kit for of quantitative its stability of monitor in real time at present.
The content of the invention
In order to overcome the deficiencies in the prior art, the present invention to provide a kind of introducing and carry out real-time quantitative to the stability of diffractometer
Monitoring, measurement data more accurately can accurately measure the compound diffractometer of albumin crystal data.
The technical solution adopted for the present invention to solve the technical problems is：One kind can accurately measure albumin crystal data
Compound diffractometer, including X-ray generator, X-ray detection device, control device and data processing equipment, the X penetrates
Line detection device includes being provided with the Angle measurement of sample, and the Angle measurement is provided with the optoelectronic induction list for sensing testing sample
Unit and the pressure sensitive unit for perceiving the pressure change put on testing sample.The number that optoelectronic induction unit will be measured
According to optical signal is converted into, then convert optical signals into electric signal by photoelectric cell, with reach judge testing sample whether position
In the purpose on target location, i.e. angular instrument with the presence or absence of testing sample；Can be quantitatively by the setting of pressure sensitive unit
Monitor sample stability, and then Quantitative Monitoring diffractometer stability, exclude the unstable of diffractometer brought to diffraction patterns
Influence so that the data analysis to albumin crystal is more accurate.
Further, the pressure sensitive unit includes the connecting seat that can be connected with X-ray detection device, is treated for placement
The placement portion of test sample product, for sensing deformation in placement portion produced by pressure change and deformation being converted into the sensing of electric signal
Component and the display device for converting the electrical signal to data signal.
Further, the inductive component includes that induction pieces, the sensor on induction pieces are upper with what placement portion was connected
Connector and the lower connector being connected with connecting seat.
Further, the induction pieces are provided with the thinner wall section for lifting its adaptability to changes.The setting of thinner wall section causes sense
Answer the strain property of part more preferably, larger deformation can be also produced when by less power, sensitivity is higher, final data is more
Precisely.
Further, the sensor is resistance strain gage.
Further, positioned at sensor just to position, thinner wall section is provided with and is set through induction pieces side wall the thinner wall section
The through hole put.
Further, the through hole is made up of the round hole that three horizontal cross are overlapped, wherein middle circle
Round hole area of the perforated area less than both sides.The ingenious setting of three round holes allows that induction pieces preferably sense
Stress changes, and pressure varies slightly just can well passing through the present display device of sensor body after the thickness of induction pieces is reduced
On, and the superposition of round hole sensitivity for other shapes is more preferable, pressure slight change just passes through round hole side
The distortion of edge allows sensor is rapider, more accurately embody deformation quantity.
Further, be provided with the first pad between the upper connector and induction pieces, the induction pieces and lower connector it
Between be provided with the second pad, the cross-sectional area of first pad and the second pad is equal.The shape of the first pad and the second pad
Size is identical so that the lifting surface area of induction pieces is concentrated on the first pad and the second pad such that it is able to which preferably sensing is applied
The pressure size of induction pieces both sides is added in, and pressure size is embodied a concentrated reflection of on induction pieces, display is sent to by sensor
The data of device are more accurate.
Further, the upper connector is provided with the storage tank offset within the specific limits for induction pieces.It is prevented effectively from
Induction pieces are contacted with upper connector causes the inaccurate of test data.
Further, the placement portion is provided with the groove being adapted to optoelectronic induction unit.
Further, the upper connector is provided with the accommodating chamber for housing sensor.Upper connector is avoided with sensing
Part produces the contact surface thought except the first pad.
The beneficial effects of the invention are as follows：Traditional Thinking is broken through, the analysis to diffraction image increases a dimension, in diffractometer
X-ray detection device on be provided for perceiving the pressure sensitive unit of sample stability, and then not only may determine that and treat test sample
The presence or absence of product, can also quantitatively monitor the stability of diffractometer, exclude the shadow of the stability to sample analysis data of diffractometer
Ring, simple structure, sensitivity is high, and measurement data is more accurate.
Brief description of the drawings
Fig. 1 is the structural representation one of pressure sensitive unit in the present invention.
Fig. 2 is the structural representation two of pressure sensitive unit in the present invention.
Fig. 3 is the structural representation three of pressure sensitive unit in the present invention.
Fig. 4 is the fit structure schematic diagram of lower connector and induction pieces.
Fig. 5 is the stressing conditions schematic diagram of induction pieces.
Fig. 6 is the fit structure schematic diagram of part-structure of the invention and light source.
Fig. 7 is the part-structure rough schematic of diffractometer.
Specific embodiment
In order that those skilled in the art are better understood from the present invention program, below in conjunction with the embodiment of the present invention
Accompanying drawing, clear, complete description is carried out to the technical scheme in inventive embodiments, it is clear that described embodiment is only this
A part of embodiment of invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art
The every other embodiment obtained under the premise of creative work is not made, should all belong to the scope of protection of the invention.
Shown in reference picture 1-7, a kind of compound diffractometer that can accurately measure albumin crystal data, including X-ray
Generating means 4, control device, X-ray detection device 5 and data processing equipment, X-ray detection device 5 include being provided with sample
Angle measurement 51, Angle measurement 51 is provided with optoelectronic induction unit and pressure sensitive unit.Pressure sensitive unit includes being penetrated with X successively
The connecting seat 1 that line detection device is connected, the placement portion 3 for placing testing protein crystal prototype, for sensing placement portion 3
Deformation is simultaneously converted into the inductive component of electric signal and for converting the electrical signal to digital letter by deformation produced by pressure change
Number and be displayed in the display device on screen.
Placement portion 3 includes needle tubing 31 for adhesion testing protein crystal prototype, by magnetic part by the company of absorption of needle tubing 31
The upper segment body 32 for connecing and the lower segment body 34 being detachably connected on by knob 33 on upper connector 23.Knob 33 is provided with interior spiral shell
Line, upper connector 23 is provided with the projection being adapted to knob 33, and projection is provided with external screw thread, first places lower segment body 34 during assembling
Above projection, knob 33 is set in the rotation threaded connection of projection outside through lower segment body 34.In order to mitigate overall weight, peace
Put portion 3 to be made up of aluminum, improve overall sensitivity.
Optoelectronic induction unit includes light source, optical path and photoelectric cell, and upper segment body 32 can be hollow structure, and center has
For the through hole that light is passed through, the groove 341 passed through for photoelectric cell etc. is offered on the side of lower segment body 34.Optoelectronic induction unit
Whether can be judged through testing sample by light source, and measurement result is converted into optical signal, then by photo elements
Part converts optical signals into electric signal, conducts to control device and the data processing equipment being electrically connected with control device, so as to directly perceived
Judge testing sample whether in correct position.Optoelectronic induction unit and pressure sensitive unit can be electric with control device respectively
Even, after the presence that optoelectronic induction unit senses testing sample, control device gives pressure sensitive unit sending signal, starts
Pressure sensitive unit is operated.
Inductive component includes induction pieces 21, the setting that the lower connector 24 being connected with connecting seat 1 is connected with lower connector 24
Sensor 22 on induction pieces 21 and it is arranged on the upper connector 23 of the top of induction pieces 21.Induction pieces 21 are in rectangular structure,
Sensor 22 is fixedly connected with induction pieces 21, the appearance for housing sensor 22 is offered on the upper connector 23 in cylinder
Receive chamber 232, specifically, accommodating chamber 232 is the circular groove for being opened in the lower surface of upper connector 23, the center of circle of the circular groove with
The center of upper connector 23 essentially coincides.In the present embodiment, sensor 22 includes resistance strain gage and for by resistance-strain
Piece is fixedly connected on the silica gel on induction pieces 21, and the upper surface of induction pieces 21 is centrally through the connected resistance strain gage of silica gel, resistance
The lead of foil gauge is connected by wire 221 with display device.In order to improve the adaptability to changes of sensor, induction pieces 21 and sensing
Device 22 is just provided with thinner wall section to position, specifically, the center position in induction pieces 21 opens up through hole 211, through hole 211 is passed through
The side wall for wearing induction pieces 21 is set, and through hole 211 is made up of three round holes on same straight line, three round holes
Juxtaposition is set, and the round hole cross-sectional area positioned at both sides is equal and more than positioned at middle round hole cross-sectional area.
The left end of the upper surface of induction pieces 21 is in contact with upper connector 23 by the first pad 251 and is connected, induction pieces
The right-hand end of 21 lower surfaces is in contact with lower connector 24 by the second pad 252 and is connected, in order to ensure the He of upper connector 23
The conduction surface that lower connector 24 is applied to the power on induction pieces 21 is equal, the cross section of the first pad 251 and the second pad 252
Shape, size are identical, i.e. the lifting surface area of induction pieces both sides about 21 is equal.In order to avoid the right-hand end of the upper surface of induction pieces 21
Portion is in contact with upper connector 23, a storage tank 231 is formed at the lower surface edge of upper connector 23, even if so that induction pieces 21
Shift within the specific limits, also can guarantee that the right side upper surface of induction pieces 21 will not contact upper connector 23, to induction pieces
21 deformation will not produce influence, and final data measurement is more accurate.In the kidney-shaped structure for bending, it passes through to pass through lower connector 24
The mounting hole for putting on lower wall is connected on connecting seat 1, and X-ray detection device other are supplied at the intermediate recess of lower connector 24
Part passes through.
Display device（Not shown in figure）It is electrically connected by wire 221 and inductive component, display device will be produced on induction pieces 21
Raw deformation is converted into electric signal by sensor, and electric signal is converted into data signal by converter, and data signal can lead to
Cross display screen to show, be easy to intuitively read the pressure being applied in placement portion 3.Data signal passes through human-computer interaction interface simultaneously
Display in real time, all data storages on computers, are called after being easy to.
Operation principle of the invention is：Whether optoelectronic induction unit is located at X-ray detection device to testing sample first
The suitable position of Angle measurement is judged, and after the result of testing sample presence is obtained, pressure sensitive unit is passed through into connecting seat
The Angle measurement of X-ray detection device is connected to, due to Action of Gravity Field, placement portion and upper connector pass through the first pad to induction pieces
Level power to the right is produced, lower connector produces level power to the left, induction pieces to induction pieces by the second pad
Certain deformation is produced to be embodied in display device, original state resets to display device, testing sample is placed in placement portion
When, because the power being applied on the first pad and the second pad changes, induction pieces produce more deformation, and sensor is by deformation
Electric signal is converted into by wire transmission to display device, display device converts electrical signals into data signal, experimenter can be with
Convenient, the pressure change data intuitively read on inductive component.
When sample to be placed placement portion, in display device read instantaneous pressure value relative to original state occur compared with
Big to change, when sample is removed into placement portion, there is larger changing in the instantaneous pressure value read in display device relative to original state
Become, when being analyzed to sample, the pressure value read in display device is in more stable state, under normal condition, will not produce
The larger fluctuation of life.
If it was found that diffraction image is not good, transfer the data stored on computer, if it find that pressure value except setting-out and
Fluctuated during sampling, be constantly in relatively stable state, illustrate the stability of sample preferably, further relate to the stabilization of diffractometer
Property preferably, eliminate the problem of diffractometer；If data display diffraction image is not good, pressure value also produces larger ripple
It is dynamic, illustrate that the stability of sample is not good, it may be possible to the de-stabilising effect of diffractometer diffraction image, asking for light source etc. can be excluded
Topic causes diffraction image not good.Such that it is able to judge associating between the stability of diffractometer and sample diffraction image.
Above-mentioned specific embodiment is used for illustrating the present invention, rather than limiting the invention, of the invention
In spirit and scope of the claims, any modifications and changes made to the present invention both fall within protection model of the invention
Enclose.
Claims (10)
1. a kind of compound diffractometer that can accurately measure albumin crystal data, including X-ray generator (4), X-ray
Detection device (5), control device and data processing equipment, the X-ray detection device (5) is including being provided with the Angle measurement of sample
(51), it is characterised in that：(51) are provided with optoelectronic induction unit for sensing testing sample and for perceiving on the Angle measurement
Put on the pressure sensitive unit of the pressure change on testing sample.
2. compound diffractometer according to claim 1, it is characterised in that：The pressure sensitive unit includes to be penetrated with X
The connected connecting seat (1) of line detection device, the placement portion (3) for placing testing sample, for sensing pressure in placement portion (3)
Deformation is simultaneously converted into the inductive component of electric signal and for converting the electrical signal to data signal by the produced deformation of change
Display device.
3. compound diffractometer according to claim 2, it is characterised in that：The inductive component include induction pieces (21),
Upper connector (23) that sensor (22) on induction pieces (21) is connected with placement portion (3) and it is connected with connecting seat (1)
Lower connector (24).
4. compound diffractometer according to claim 3, it is characterised in that：The induction pieces (21) are provided with for being lifted
The thinner wall section of its adaptability to changes.
5. compound diffractometer according to claim 3, it is characterised in that：The sensor (22) is resistance strain gage.
6. compound diffractometer according to claim 4, it is characterised in that：The thinner wall section is being located at sensor (22) just
To position, thinner wall section is provided with the through hole (211) set through induction pieces (21) side wall.
7. compound diffractometer according to claim 6, it is characterised in that：The through hole (211) is by three horizontal cross
The round hole composition for overlapping, wherein round hole area of the middle round hole area less than both sides.
8. compound diffractometer according to claim 2, it is characterised in that：The upper connector (23) and induction pieces (21)
Between be provided with the first pad (251), the second pad (252) is provided between the induction pieces (21) and lower connector (24), it is described
The cross-sectional area of the first pad (251) and the second pad (252) is equal.
9. compound diffractometer according to claim 8, it is characterised in that：The upper connector (23) is provided with for sensing
The storage tank (231) that part (21) offsets within the specific limits.
10. compound diffractometer according to claim 2, it is characterised in that：The placement portion (3) is provided with and light inductance
The groove (341) for answering unit to be adapted to.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611249150.1A CN106841253B (en) | 2016-12-29 | 2016-12-29 | A kind of compound diffractometer of energy accurately measure albumin crystal data |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611249150.1A CN106841253B (en) | 2016-12-29 | 2016-12-29 | A kind of compound diffractometer of energy accurately measure albumin crystal data |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106841253A true CN106841253A (en) | 2017-06-13 |
| CN106841253B CN106841253B (en) | 2019-06-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611249150.1A Active CN106841253B (en) | 2016-12-29 | 2016-12-29 | A kind of compound diffractometer of energy accurately measure albumin crystal data |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0875678A (en) * | 1994-09-01 | 1996-03-22 | Mac Sci:Kk | Quadruple shaft-type automatic diffraction apparatus |
| CN101490537A (en) * | 2006-05-09 | 2009-07-22 | 马自达公司 | Automated analyzer using light diffraction |
| US7796726B1 (en) * | 2006-02-14 | 2010-09-14 | University Of Maryland, Baltimore County | Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation |
| CN102435626A (en) * | 2011-09-13 | 2012-05-02 | 丹东通达科技有限公司 | Table type X-ray diffractometer |
| CN205229075U (en) * | 2015-11-12 | 2016-05-11 | 中国科学院上海应用物理研究所 | Response recognition device of protein crystal sample acquisition loop base |
-
2016
- 2016-12-29 CN CN201611249150.1A patent/CN106841253B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0875678A (en) * | 1994-09-01 | 1996-03-22 | Mac Sci:Kk | Quadruple shaft-type automatic diffraction apparatus |
| US7796726B1 (en) * | 2006-02-14 | 2010-09-14 | University Of Maryland, Baltimore County | Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation |
| CN101490537A (en) * | 2006-05-09 | 2009-07-22 | 马自达公司 | Automated analyzer using light diffraction |
| CN102435626A (en) * | 2011-09-13 | 2012-05-02 | 丹东通达科技有限公司 | Table type X-ray diffractometer |
| CN205229075U (en) * | 2015-11-12 | 2016-05-11 | 中国科学院上海应用物理研究所 | Response recognition device of protein crystal sample acquisition loop base |
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| Publication number | Publication date |
|---|---|
| CN106841253B (en) | 2019-06-28 |
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