CN106791512B - A kind of integrating capacitor adjustable reading circuit automatically - Google Patents
A kind of integrating capacitor adjustable reading circuit automatically Download PDFInfo
- Publication number
- CN106791512B CN106791512B CN201611071842.1A CN201611071842A CN106791512B CN 106791512 B CN106791512 B CN 106791512B CN 201611071842 A CN201611071842 A CN 201611071842A CN 106791512 B CN106791512 B CN 106791512B
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- type flip
- flip flop
- integrating capacitor
- branch
- switch
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- 239000003990 capacitor Substances 0.000 title claims abstract description 62
- 230000001143 conditioned effect Effects 0.000 claims abstract description 8
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 230000005611 electricity Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
The invention discloses a kind of integrating capacitor adjustable reading circuits automatically, its main feature is that amplifier reading circuit is equipped with the auto-control that conditioned circuit carries out integrating capacitor, the automatic conditioned circuit is by Schmidt trigger L and d type flip flop D 1With d type flip flop D 2Composition, the output end and d type flip flop D of the Schmidt trigger L 1With d type flip flop D 2The end clk and connect, the input terminal of Schmidt trigger L connect with the output end of transport and placing device OP after for VoutEnd;D type flip flop D 1The end Q and d type flip flop D 2The end D connection;The d type flip flop D 1The end Q and d type flip flop D 2The end D and switch K is accessed after connecing1Carry out the auto-control of integrating capacitor;The d type flip flop D 2Q terminate into switch K2Carry out the auto-control of integrating capacitor.The present invention has structure simple compared with prior art, high sensitivity, and the adjusting of gain is more flexible, improves the intelligence of circuit, also increases the dynamic range of reading circuit, realizes the reading of Larger Dynamic range.
Description
Technical field
The present invention relates to photodetection reading circuit technical field, especially a kind of width is dynamically and intensity of illumination range is wider
Integrating capacitor adjustable reading circuit automatically.
Background technique
Currently, photodetector and solid state image sensor reading circuit, handle the integrating capacitor size of faint photoelectric current
Be it is fixed, when using small integrating capacitor, the sensitivity of reading circuit and noise are relatively high, but dynamic range reduces, and
When using big integrating capacitor, charge capacity can be increased, so that dynamic range is increased, but signal-to-noise ratio and sensitivity can all subtract
It is small, cause circuit to decline the resolution capability of low current, is lost the details of darker area in image scene.In order to clear
Display inspected object details, need reading circuit can be good to the dim light part of inspected object and highlights
It carries out signal to read and handle, extended dynamic range and raising sensitivity are more and more important.In view of quantum dot optoelectronic detects
The photosensitive strength range of device is especially wide, and light excitation current can be even higher for pA, nA and μ A magnitude, and wider photoelectric current range is to reading
Circuit proposes requirement out, should consider highly sensitive advantage, also to avoid the generation of saturation.
Based on problem above, the solution of existing reading circuit is to introduce the adjustable structure of integrating capacitor, i.e., using not
With the integrating capacitor of size, different size of combination is realized by the on-off of switch control integrating capacitor.However, switch closes
Conjunction be by manually controlling, it is very inconvenient in use, and often by ground lead plug circuit is accurately affected greatly,
Intelligentized development trend is not met.
Summary of the invention
The purpose of the present invention is in view of the deficiencies of the prior art and a kind of wide dynamic and intensity of illumination range that provide are wider
Integrating capacitor adjustable reading circuit automatically, using the integrating capacitor auto-control circuit of Schmidt trigger, in small integral electricity
When holding fast be saturated, so that reading circuit is automatic jumped to big integrating capacitor, expand integrating capacitor automatically, substantially increase circuit
Intelligence, also increase the dynamic range of reading circuit, sensitivity and signal-to-noise ratio be greatly improved, realize Larger Dynamic model
The reading enclosed, it is ensured that picture quality.
The object of the present invention is achieved like this: a kind of integrating capacitor adjustable reading circuit automatically, including by transport and placing device
OP, integrating capacitor Ca、Cb、CcWith switch K1、K 2The capacitive feedback transimpedance amplifier reading circuit of composition, integrating capacitor CcWith open
Close K2Concatenation is the first branch, integrating capacitor CbWith switch K1Concatenation is the second branch, integrating capacitor CaWith the first branch and second
Branch is attempted by the inverting input terminal and output end of transport and placing device OP, and photoelectric detector PD is connected to the anti-phase input of transport and placing device OP
On end, the normal phase input end of transport and placing device OP is Vref, its main feature is that capacitive feedback transimpedance amplifier reading circuit is equipped with automatic adjustable
Circuit carries out the auto-control of integrating capacitor, and the automatic conditioned circuit is by anti-phase output Schmidt trigger L and d type flip flop D1With d type flip flop D2Composition, the output end and d type flip flop D of the anti-phase output Schmidt trigger L1With d type flip flop D2's
The end clk simultaneously connects, the input terminal of anti-phase output Schmidt trigger L connect with the output end of transport and placing device OP after for VoutEnd;The D
Trigger D1D termination voltage source VDDD, d type flip flop D1The end Q and trigger D2The end D connection;First branch is by D
Trigger D1The end Q and d type flip flop D2The end D and switch K is accessed after connecing1Carry out the auto-control of integrating capacitor;Described second
Branch is by d type flip flop D2Q terminate into switch K2Carry out the auto-control of integrating capacitor.
The negative sense threshold voltage V of the anti-phase output Schmidt trigger LT-For 0.18V, forward threshold voltage VT+For
0.3V。
The present invention has structure simple compared with prior art, high sensitivity, and the adjusting of gain is more flexible, integrating capacitor
Control it is rapider, improve the intelligence of circuit, also increase the dynamic range of reading circuit, be greatly improved sensitive
Degree and signal-to-noise ratio, realize the reading of Larger Dynamic range, it is ensured that picture quality.
Detailed description of the invention
Fig. 1 is schematic structural view of the invention;
Fig. 2 is the automatic conditioned circuit output curve diagram of integrating capacitor.
Specific embodiment
Refering to attached drawing 1, the present invention is made of capacitive feedback transimpedance amplifier reading circuit 1 and automatic conditioned circuit 2, described
Capacitive feedback transimpedance amplifier reading circuit 1 is by transport and placing device OP, integrating capacitor Ca、Cb、CcWith switch K1、K 2Composition;The product
Divide capacitor CcWith switch K2Concatenation is the first branch, integrating capacitor CbWith switch K1Concatenation is the second branch;The integrating capacitor Cb
With switch K1Concatenation is the second branch, integrating capacitor CaThe anti-phase input of transport and placing device OP is attempted by with the first branch and the second branch
On end and output end, photoelectric detector PD is connected in the inverting input terminal of transport and placing device OP, and the normal phase input end of transport and placing device OP is
Vref。
The automatic conditioned circuit 2 is by anti-phase output Schmidt trigger L and d type flip flop D1With d type flip flop D2Composition,
The output end and d type flip flop D of the anti-phase output Schmidt trigger L1With d type flip flop D2The end clk and connect, anti-phase output
The input terminal of Schmidt trigger L is V after connecting with the output end of transport and placing device OPoutEnd;The d type flip flop D1D terminate electricity
Potential source VDDD, d type flip flop D1The end Q and d type flip flop D2The end D connection;First branch is by d type flip flop D1The end Q and D
Trigger D2The end D and switch K is accessed after connecing1Carry out the auto-control of integrating capacitor;Second branch is by d type flip flop D2
Q terminate into switch K2Carry out the auto-control of integrating capacitor.The Schmidt trigger negative sense threshold voltage VT-For 0.18V,
Forward threshold voltage VT+For 0.3V, work as VoutGradually decline at any time, when dropping to 0.18V, trigger output voltage is jumped as height at this time
Level, the rising edge trigger switch K of jump1Get higher (VDDD), so that switch K1Closure, capacitor CbIt participates in integral, reads at this time
Circuit total mark capacitor is C outa+Cb, VoutBy (Vref-I0T/C0) jump as [Vref-I0T/(C0+C1)], VoutJump very
It is completed in the short time, during this, although VoutTouch VT+It is reduced to anti-phase output Schmidt trigger L output voltage low
Level, but failing edge does not influence switch K1Trigger D1, so switch K1Still keep VDDDHigh level state, integrating capacitor CbOne
It is straight to participate in integral.As the time increases, as new VoutWhen being re-lowered to 0.18V, anti-phase output Schmidt trigger L at this time
Output again by low high jump, under rising edge triggering, so that K2=K1=VDDD, thus by switch K2Closure, CcParticipate in product
Point, total mark capacitor is C at this timea+Cb+Cc, VoutFrom [Vref-I0T/(C0+C1)] jump into [Vref-I0T/(C0+C1+C2)]。
Output characteristics according to capacitive feedback across resistance scale-up version input stage is by following formula (a) it is found that in certain photoelectric current and product
Divide in the case of capacitor, VoutIt is linear at any time, it is known that as time T=VrefCa/I0When, it is integrating capacitor CaReading electricity
Road output saturation.To avoid this type of circumstances from happening, in VoutWhen being soon reduced to 0V, make to control integrating capacitor CbSwitch K1Immediately
Closure, integrating capacitor CbIt is added, to increase total mark capacitor, so that VoutBecoming total mark capacitor is Ca+CbUnder output electricity
Pressure, i.e. following formula (b);If you need to further increase integrating capacitor, C can be similarly introducedc, then in Ca+CbMake to control C when fast saturationcOpen
Close K2It is closed immediately, so that total mark capacitor is Ca+Cb+Cc, output characteristics such as following formula (c):
Refering to attached drawing 2, by being analyzed above it is found that T in its function curve such as figure0、T1And T2Respectively (Vref-0.18)C0/
I0、(Vref-0.18)(C0+C1)/I0And Vref(C0+C1+C2)/I0。
Automatically adjustable output characteristics is the integrating capacitor: VoutBe time T piecewise function, such as following formula (d) institute
Show:
The present invention works as integrating capacitor CaOutput when being soon reduced to 0V, make to control CbSwitch K1It is closed immediately, integrating capacitor
C is addedb, to increase Global integration capacitor, so that VoutBecoming integrating capacitor is Ca+CbUnder output voltage;Similarly in Ca+Cb
Make to control C when fast saturationcSwitch K2It is closed immediately, so that total mark capacitor is Ca+Cb+Cc, this integrating capacitor is automatically adjustable
Design improve the intelligence of circuit, also increase the dynamic range of reading circuit.
Only the present invention will be further described for above embodiments, is not intended to limit the invention patent, all for the present invention
Equivalence enforcement is intended to be limited solely by within the scope of the claims of the invention patent.
Claims (2)
1. a kind of integrating capacitor adjustable reading circuit automatically, including by transport and placing device OP, integrating capacitor Ca、Cb、CcWith switch K 1、
K 2The capacitive feedback transimpedance amplifier reading circuit of composition, integrating capacitor CcWith switch K2Concatenation is the first branch, integrating capacitor Cb
With switch K1Concatenation is the second branch, integrating capacitor CaThe anti-phase input of transport and placing device OP is attempted by with the first branch and the second branch
On end and output end, photoelectric detector PD is connected in the inverting input terminal of transport and placing device OP, and the normal phase input end of transport and placing device OP is
Vref, it is characterised in that capacitive feedback transimpedance amplifier reading circuit is equipped with the automatic tune that automatic conditioned circuit carries out integrating capacitor
Control, the automatic conditioned circuit is by anti-phase output Schmidt trigger L and d type flip flop D 1With d type flip flop D 2Composition, it is described anti-
The mutually output end and d type flip flop D of output Schmidt trigger L 1With d type flip flop D 2The end clk and connect, anti-phase output Schmidt
The input terminal of trigger L is V after connecting with the output end of transport and placing device OPoutEnd;The d type flip flop D 1D termination voltage source VDDD,
D type flip flop D 1The end Q and d type flip flop D 2The end D connection;First branch is by d type flip flop D 1The end Q and d type flip flop D 2's
The end D simultaneously accesses switch K after connecing1Carry out the auto-control of integrating capacitor;Second branch is by d type flip flop D 2Q terminate into opening
Close K2Carry out the auto-control of integrating capacitor.
2. integrating capacitor adjustable reading circuit automatically according to claim 1, it is characterised in that the anti-phase output is applied close
The negative sense threshold voltage V of special trigger LT-For 0.18 V, forward threshold voltage VT+For 0.3 V.
Priority Applications (1)
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CN201611071842.1A CN106791512B (en) | 2016-11-29 | 2016-11-29 | A kind of integrating capacitor adjustable reading circuit automatically |
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CN201611071842.1A CN106791512B (en) | 2016-11-29 | 2016-11-29 | A kind of integrating capacitor adjustable reading circuit automatically |
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CN106791512B true CN106791512B (en) | 2019-07-26 |
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CN110336553A (en) * | 2019-06-06 | 2019-10-15 | 上海集成电路研发中心有限公司 | A kind of output circuit adjusting dynamic range |
CN112954237A (en) * | 2021-02-07 | 2021-06-11 | 电子科技大学 | Self-adaptive variable gain integrating circuit for photoelectric detector |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1950684A (en) * | 2004-05-10 | 2007-04-18 | 浜松光子学株式会社 | Photo detector apparatus |
CN102291544A (en) * | 2011-06-22 | 2011-12-21 | 华东师范大学 | Amplifier read-out circuit with automatic adjustable gain |
CN102523394A (en) * | 2011-11-23 | 2012-06-27 | 华东师范大学 | Photoelectric conversion front-end detection-type readout circuit with automatically adjustable gain |
EP2645707A2 (en) * | 2012-03-28 | 2013-10-02 | Luxen Technologies, Inc. | Increasing dynamic range for x-ray image sensor |
EP2924979A1 (en) * | 2014-03-25 | 2015-09-30 | IMEC vzw | Improvements in or relating to imaging sensors |
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2016
- 2016-11-29 CN CN201611071842.1A patent/CN106791512B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1950684A (en) * | 2004-05-10 | 2007-04-18 | 浜松光子学株式会社 | Photo detector apparatus |
CN102291544A (en) * | 2011-06-22 | 2011-12-21 | 华东师范大学 | Amplifier read-out circuit with automatic adjustable gain |
CN102523394A (en) * | 2011-11-23 | 2012-06-27 | 华东师范大学 | Photoelectric conversion front-end detection-type readout circuit with automatically adjustable gain |
EP2645707A2 (en) * | 2012-03-28 | 2013-10-02 | Luxen Technologies, Inc. | Increasing dynamic range for x-ray image sensor |
EP2924979A1 (en) * | 2014-03-25 | 2015-09-30 | IMEC vzw | Improvements in or relating to imaging sensors |
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