CN106777633A - A kind of solid insulation switch cabinet switch contact temperature computation method and device - Google Patents
A kind of solid insulation switch cabinet switch contact temperature computation method and device Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 63
- 239000007787 solid Substances 0.000 title claims abstract description 60
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- 239000003822 epoxy resin Substances 0.000 claims description 6
- 238000009434 installation Methods 0.000 claims description 6
- 229920000647 polyepoxide Polymers 0.000 claims description 6
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Abstract
The invention discloses a kind of solid insulation switch cabinet switch contact temperature computation method and device, by obtaining multigroup sample data in advance, Mathematical Modeling between each influence factor is set up by PLS, determine the functional relation between the temperature of the temperature of measurement point and the switch contact of solid insulation switch cabinet, influence factor data of the sample data comprising multigroup influence switch contact temperature change, measurement point position is in preset range around switch contact；Obtain the current temperature value that measurement point is monitored；According to current temperature value, the temperature value of the switch contact of solid insulation switch cabinet is calculated by functional relation.The application is based on the Mathematical Modeling Methods dynamic calculation breaker contact point temperature of offset minimum binary, without considering the outer physical parameter for wrapping up in insulating barrier and contact material, facilitates the calculating of contact temperature.The method highly versatile, simple, low cost is realized, the running status that switch cubicle is grasped when can be defined certain provides reference.
Description
Technical Field
The invention relates to the technical field of power systems, in particular to a method and a device for calculating the temperature of a switch contact of a solid insulation switch cabinet.
Background
The switch cabinet is an important device in an electric power system and is mainly responsible for the current of other electrical devices and a power grid. However, in the long-term operation process of the switch cabinet, the contact resistance is increased due to the aging of the contact and poor contact, the local temperature of the switch cabinet is increased due to the increase of the contact resistance, the aging of the insulating layer is accelerated due to the heating of the contact, and fire and power failure accidents caused by the overheating of the contact are rare. Therefore, the on-line monitoring of the temperature of the switch contact of the switch cabinet is more important. Currently, research on the contact temperature of the switch cabinet generally focuses on development and improvement of temperature monitoring equipment, and at present, three main operation technologies are mainly used for monitoring the contact temperature in real time. One method is realized through a camera and a temperature indicating wax sheet device, more contacts need to be monitored in a switch cabinet, the monitoring visual field in front of the camera and the temperature indicating wax sheet cannot be blocked, and the temperature indicating wax sheet and the camera are difficult to be installed one to one in areas with complex structures and narrow space positions. The other is realized by adopting an infrared temperature measurement technology, the temperature data is acquired by receiving infrared radiation of a measured point, but when a temperature measurement probe is placed, attention needs to be paid to avoid cross influence of a light path, and one infrared sensor corresponds to one contact. The temperature measurement technology is wide in measurement range, high in measurement precision, high in cost and greatly influenced by the structure of the switch cabinet, so that the temperature monitoring is unreliable.
Disclosure of Invention
The invention aims to provide a method and a device for calculating the switch contact temperature of a solid insulation switch cabinet, which are used for solving the problems of difficulty in realization, high cost and unreliable monitoring temperature in the conventional switch contact temperature real-time monitoring technology of the switch cabinet.
In order to solve the technical problem, the invention provides a method for calculating the temperature of a switch contact of a solid insulation switch cabinet, which comprises the following steps:
obtaining multiple groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of a switch contact of a solid insulation switch cabinet, wherein the sample data comprises multiple groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is located in a preset range around the switch contact;
acquiring a current temperature value monitored by the measuring point;
and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation.
Optionally, the establishing a mathematical model among the influencing factors by a partial least squares method, and the determining a functional relationship between the temperature of the measurement point and the temperature of the switch contact of the solid insulated switchgear includes:
taking the temperature of the measuring point as a dependent variable y and taking each influencing factor as an independent variable x1、x2、x3、x4、x5、x6、x7Acquiring n groups of sample data, and forming a dependent variable matrix Y ═ Y]n×1And the argument matrix X ═ X1x2x3x4x5x6x7]n×7Normalizing Y and X to obtain normalized dependent variable matrixAnd independent variable matrix
Wherein x isijIs the value of the jth variable, y, for the ith sample in the matrix XiRepresenting the ith sample value in matrix Y;
from E0Sequentially extracting principal components, performing regression analysis of dependent variable to independent variable, converting into regression equation of Y to X, and determining
The regression coefficient β in1～β7。
Optionally, the influencing factors specifically include: x is the number of1Corresponding to the thickness d of the epoxy resin insulating layer; x is the number of2The horizontal distance r from the installation position of the corresponding thermocouple temperature sensor to the switch contact; x is the number of3Corresponding to the actual temperature of the switch contact0；x4Corresponding to the temperature of the switch cabinet1；x5Corresponding to the ambient temperature of the switch cabinet2；x6Working current i corresponding to the bus of the connecting switch contact; x is the number of7Corresponding to the cabinet volume v of the switch cabinet; y corresponds to the temperature Q of the measurement point.
Optionally, the normalizing Y and X includes:
by usingThe standardized treatment is carried out, and the standard treatment is carried out,
wherein,represents the variable xjAverage value of (1), sjDenotes xjThe standard deviation of (a) is determined,denotes the average value of y, syThe standard deviation of y is indicated.
Optionally, at the slave E0After the main components are sequentially extracted, the method also comprises the following steps:
calculating the contribution degree of the extracted components, and judging that the contribution degree of the extracted components is significant when the contribution degree is greater than a preset threshold value.
Optionally, the acquiring the current temperature value monitored by the measurement point includes:
and monitoring the current temperature value in real time through a temperature sensor arranged at the measuring point, wherein the measuring point is positioned on the outer wall of the insulating layer of the switch contact.
Optionally, after the calculating the temperature value of the switch contact of the solid insulated switchgear through the functional relationship, the method further includes:
and displaying the calculated temperature value to a user.
The invention also provides a solid insulation switch cabinet switch contact temperature calculating device, which comprises:
the model establishing module is used for acquiring a plurality of groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of a switch contact of a solid insulation switch cabinet, wherein the sample data comprises a plurality of groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is positioned in a preset range around the switch contact;
the current temperature acquisition module is used for acquiring a current temperature value monitored by the measurement point;
and the calculation module is used for calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation.
According to the method and the device for calculating the temperature of the switch contact of the solid insulation switch cabinet, provided by the invention, a plurality of groups of sample data are obtained in advance, a mathematical model among all influence factors is established through a partial least square method, and a functional relation between the temperature of a measuring point and the temperature of the switch contact of the solid insulation switch cabinet is determined, wherein the sample data contains a plurality of groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is positioned in a preset range around the switch contact; acquiring a current temperature value monitored by a measuring point; and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation. The method dynamically calculates the temperature of the contact of the circuit breaker based on the partial least square mathematical modeling method, does not need to consider physical parameters of an outer wrapping insulating layer and a contact material, and facilitates calculation of the temperature of the contact. The method has the advantages of strong universality, simple realization and low cost, and can provide reference for accurately and timely mastering the running state of the switch cabinet.
Drawings
In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a flow chart of an embodiment of a method for calculating a temperature of a switch contact of a solid insulated switchgear provided by the present invention;
FIG. 2 is a flow chart of another embodiment of a method for calculating the temperature of a switch contact of a solid insulated switchgear provided by the present invention;
FIG. 3 is a flow chart of an algorithm for establishing a functional relationship between a measurement point and a switch contact by partial least squares;
FIG. 4 is a schematic view showing the installation positions of the temperature sensors;
fig. 5 is a block diagram of a device for calculating the switch contact temperature of a solid insulated switchgear according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 shows a flowchart of a specific embodiment of a method for calculating a temperature of a switch contact of a solid insulated switchgear, where the method includes:
step S101: obtaining multiple groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of a switch contact of a solid insulation switch cabinet, wherein the sample data comprises multiple groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is located in a preset range around the switch contact;
step S102: acquiring a current temperature value monitored by the measuring point;
step S103: and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation.
The method for calculating the temperature of the switch contact of the solid insulation switch cabinet comprises the steps of obtaining a plurality of groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of the switch contact of the solid insulation switch cabinet, wherein the sample data comprises a plurality of groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is located in a preset range around the switch contact; acquiring a current temperature value monitored by a measuring point; and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation. The method dynamically calculates the temperature of the contact of the circuit breaker based on the partial least square mathematical modeling method, does not need to consider physical parameters of an outer wrapping insulating layer and a contact material, and facilitates calculation of the temperature of the contact. The method has the advantages of strong universality, simple realization and low cost, and can provide reference for accurately and timely mastering the running state of the switch cabinet.
On the basis of the above embodiment, the process of establishing a mathematical model among the influencing factors by a partial least squares method and determining the functional relationship between the temperature of the measurement point and the temperature of the switch contact of the solid insulated switchgear may specifically be:
taking the temperature of the measuring point as a dependent variable y and taking each influencing factor as an independent variable x1、x2、x3、x4、x5、x6、x7Acquiring n groups of sample data, and forming a dependent variable matrix Y ═ Y]n×1And the argument matrix X ═ X1x2x3x4x5x6x7]n×7Normalizing Y and X to obtain normalized dependent variable matrixAnd independent variable matrix
Wherein x isijIs the value of the jth variable, y, for the ith sample in the matrix XiRepresenting the ith sample value in matrix Y;
from E0Sequentially extracting principal components, performing regression analysis of dependent variable to independent variable, converting into regression equation of Y to X, and determining
The regression coefficient β in1～β7。
The embodiment calculates the temperature of the switch contact of the switch cabinet in real time through a partial least square algorithm, and after the switch contact generates heat, the heat is transmitted to the outer wall of the insulating layer through convection of air in the insulating layer and conduction of the wall of the insulating layer, and the temperature of the insulating layer is increased. According to the functional relation between the temperature rise of the outer wall of the insulating layer and the switch contact, the latter can be calculated according to the former. The insulation material wrapped outside the inner conductor of the switch cabinet is epoxy resin, a thermocouple sensor which is convenient to assemble and low in price is selected to measure the temperature of the outer surface of the insulation layer near the switch contact, and then a function relation obtained through experimental data is utilized:
the influencing factors in this embodiment specifically include: x is the number of1Corresponding to the thickness d of the epoxy resin insulating layer; x is the number of2The horizontal distance r from the installation position of the corresponding thermocouple temperature sensor to the switch contact; x is the number of3Corresponding to the actual temperature of the switch contact0；x4Corresponding to the temperature of the switch cabinet1；x5Corresponding to the ambient temperature of the switch cabinet2；x6Working current i corresponding to the bus of the connecting switch contact; x is the number of7The volume v of the cabinet body of the corresponding switch cabinet; y corresponds to the temperature Q of the measurement point.
Another embodiment of the method for calculating the temperature of the switch contact of the solid insulated switchgear is further described in detail below with reference to fig. 2 by taking the above influencing factors as examples.
Step S201: acquiring experimental data;
fixing a temperature sensor at a position near a switch contact, measuring the temperature Q of a measuring point of the temperature sensor, the thickness d of an epoxy resin insulating layer, the horizontal distance r between a thermocouple mounting position and the switch contact, and the actual temperature of the switch contact0Temperature of switch cabinet1Ambient temperature of the switch cabinet2The working current i of the bus of the connecting switch contact, the volume v of the specific cabinet body of the switch cabinet and other factors are closely related. The switch cabinet is placed in different external environments and recordedAmbient temperature carries out the simulation experiment to cubical switchboard switch contact in the laboratory, and the heater heating contact of use power 1000w, and the simulation arouses the overheated heat source of contact, and the heater is networked with the computer, adopts the intelligent control mode, and accurate control heating temperature, a plurality of times accuse temperature experiment and record the temperature of heating contact, when the experiment of controlling the temperature at every turn, constantly change the position of the internal other temperature sensor of cabinet simultaneously to acquire a plurality of groups experimental data of each factor. One specific embodiment of the manner of operation and data is shown in table 1.
TABLE 1
Wherein, in the operation mode 1, a switch cabinet experiment is taken, the thickness of the insulating layer is measured and recorded as x11(ii) a Installing the temperature sensor 1 at any position of the insulating layer wrapped outside the contact, and measuring the horizontal distance between the sensor and the contact, and recording as x21(ii) a After all the sensors are installed, the heater heats the contact, the initial heating temperature is set by the computer and is recorded as the contact temperature x31(ii) a The temperature sensor 2 in the cabinet is arranged at the ventilation opening of the switch cabinet, and the temperature of the cabinet body is measured and recorded as x41(ii) a The switch cabinet is arranged in an indoor environment with adjustable temperature, the indoor environment temperature is gradually adjusted from low temperature to high temperature to obtain different environment temperatures, and the initially set environment temperature x is recorded51(ii) a The bus working current is measured in the experiment and is marked as x61(ii) a Measuring cabinet volume, denoted x71(ii) a The temperature sensor 1 measures the outer skin temperature of the insulation layer, and is marked as Y1. The above experimental measurement data are used as the first set of data.
Operation mode 2, another switch cabinet experiment is taken, and the thickness x of the insulating layer is measured12(ii) a Changing the position of the temperature sensor 1 on the insulating layer wrapping the contact head, and measuring the horizontal distance x between the sensor and the contact point22(ii) a The temperature of the heater is adjusted by a computer, and after the contact head to be heated is in a stable state, the temperature is recorded as a contact point temperature x32(ii) a The temperature sensor 2 is arranged at the ventilation opening of the switch cabinet and used for measuring the temperature x of the cabinet body42(ii) a Changing the ambient temperature x of the switchgear52(ii) a Experimental measurement of bus working current x62(ii) a Measuring cabinet volume x72(ii) a The temperature sensor 1 measures the outer skin temperature Y of the insulating layer2. The above experimental measurement data are used as the second set of data.
And (3) repeating the steps in the operation mode n by analogy to obtain the temperature rise experimental data of the heat source of the plurality of groups of contacts by linearly adjusting the temperature of the heater.
Step S202: extracting n groups of sample data, modeling by adopting a partial least square method, and determining coefficients in a functional relation;
as shown in fig. 3, a flow chart of an algorithm for establishing a functional relation between a measuring point and a switch contact through partial least squares is shown, wherein the temperature of the measuring point is used as a dependent variable y, and each influencing factor is used as an independent variable x1、x2、x3、x4、x5、x6、x7Acquiring n groups of sample data from the experimental data to form a dependent variable matrix Y ═ Y]n×1And the argument matrix X ═ X1x2x3x4x5x6x7]n×7Normalizing Y and X to obtain normalized dependent variable matrixAnd independent variable matrixThe standardization processing method comprises the following steps:
wherein x isijRepresents the value of the jth variable of the ith sample in the matrix X,represents the variable xjAverage value of (1), sjDenotes xjStandard deviation of (a), yiRepresenting the ith sample value in matrix Y,denotes the average value of y, syRepresents the standard deviation of y;
from E0Extracting the first principal component t1＝E0w1，w1Is t1A weight vector of (2), wherein
In the formula E01～E07Represents E0Column vector of r (x)1,y)～r(x7Y) represents a correlation coefficient of the independent variable and the dependent variable;
then calculate E0For t1Regression coefficient matrix P of1
Calculating residual matrix E of regression equation1
E1＝E0-t1P1 T
Calculating contribution degree of extracted component, and setting yiIs the original data, yi' use all sample points and for t1Fitted value, y, of ith sample point after regression modelingi"is to delete sample point i during modeling and to t1After regression modeling, the model is reusedCalculated yiFitting value
When in useThen, component t is extracted1The contribution of (a) is significant, followed by extraction of a second component; otherwise, stopping the calculation.
From E1To extract the second component t2By E1Alternative E0Calculating t by the above method2Weight of (2)Because E1Instead of normalizing the matrix, w is calculated as follows2
t2＝E1w2
In the formula P2Is E1For t2A regression coefficient matrix of E2Is the residual matrix of the regression equation, cov (E)11,y)～cov(E17Y) represents E11～E17Covariance with y, respectively.
And calculating contribution degree of the extracted componentWhen in useWhen it is, the extracted component t is described2The contribution of (a) is significant, followed by extraction of a third component; otherwise, stopping the calculation.
Continuing the steps by analogy, extracting principal components in the residual error matrix, and calculating the contribution degree of the extracted components; if m components (m < 7) are finally obtained, F is carried out0Regression on m extracted components:
F0＝r1t1+r2t2+...+rmtm
since each extracted component is E0Are linearly combined, therefore
Performing regression analysis of dependent variable to independent variable
Then the variable y is normalized*AboutThe regression equation of (a) is:
then, through the inverse process of normalization, y is obtained with respect to x1～x5Regression equation of
y＝β1x1+β2x2+β3x3+β4x4+β5x5+β6x6+β7x7
The independent variable of the switch contact temperature:
wherein x is1Is the thickness d of the epoxy resin insulating layer; x is the number of2The horizontal distance r from the installation position of the thermocouple temperature sensor to the switch contact; x is the number of3To the actual temperature of the switching contact0；x4For the temperature of the switch cabinet1；x5Is the ambient temperature of the switch cabinet2；x6Working current i for connecting a switch contact bus; x is the number of7The specific cabinet volume v of the switch cabinet, y is the temperature Q of a measuring point, β1～β7Is the determined correlation coefficient in the functional relation.
Step S203: positioning each temperature sensor and determining each measurement parameter x1、x2、x3、x4、x5、x6、x7；
Step S204: the temperature sensor monitors real-time temperature and acquires current temperature values monitored by each measuring point;
step S205: calculating the temperature value of a switch contact of the solid insulation switch cabinet according to the functional relation;
step S206: the calculated temperature value is displayed to the user.
In the actual measurement process, each temperature sensor's mounted position need only be confirmed to the concrete embodiment, fix temperature sensor 1 near insulating layer outer wall ground point, guarantee safe electrical insulation intensity, write in the procedure with the corresponding functional relation formula of the switch contact temperature of confirming and insulating layer outer wall measuring point temperature, temperature sensor 1 conveys the data of monitoring to high in the clouds calculation module, the treater just can be with corresponding contact temperature output and conveying to low pressure instrument display end, can realize the on-line monitoring of contact temperature. Fig. 4 is a schematic view showing the installation position of each temperature sensor.
According to the embodiment of the invention, the distance between the measuring points and the contact and the real-time surface temperature of the insulating layer are taken as basic parameters, factors such as the external environment of the insulating layer are considered, relevant data are measured by experiments, and the mathematical model can directly calculate the temperature of the switch contact in real time and is not influenced by physical parameters of the material of the insulating layer. The calculation method provided by the embodiment of the invention has strong universality, and is suitable for calculating the temperature of the switch contact of the switch cabinet made of any solid insulating material in various external environments; the method is simple to implement, and during online measurement, the contact temperature can be calculated through a trained functional relation formula only by installing a temperature sensor on the outer wall of the switch contact insulating layer, and is displayed in real time through the instrument end. In addition, when the temperature of the contact of the circuit breaker is dynamically calculated by the mathematical modeling method based on partial least squares, physical parameters of an outer wrapping insulating layer and a contact material do not need to be considered, and the calculation of the temperature of the contact is facilitated. Therefore, the method can provide reference for accurately mastering the operation state of the switch cabinet in real time.
The following describes a device for calculating the temperature of the switch contact of the solid insulated switchgear according to an embodiment of the present invention, and the device for calculating the temperature of the switch contact of the solid insulated switchgear described below and the method for calculating the temperature of the switch contact of the solid insulated switchgear described above may be referred to correspondingly.
Fig. 5 is a block diagram of a solid insulated switchgear switch contact temperature calculating apparatus according to an embodiment of the present invention, and referring to fig. 5, the solid insulated switchgear switch contact temperature calculating apparatus may include:
the model establishing module 100 is configured to obtain multiple sets of sample data in advance, establish a mathematical model between the influencing factors by a partial least square method, and determine a functional relationship between the temperature of a measurement point and the temperature of a switch contact of a solid insulated switchgear, where the sample data includes multiple sets of influencing factor data influencing the temperature change of the switch contact, and the measurement point is located in a preset range around the switch contact;
a current temperature obtaining module 200, configured to obtain a current temperature value monitored by the measurement point;
and the calculating module 300 is configured to calculate a temperature value of the switch contact of the solid insulated switchgear through the functional relationship according to the current temperature value.
The solid insulated switchgear switch contact temperature calculation apparatus of this embodiment is configured to implement the foregoing solid insulated switchgear switch contact temperature calculation method, and therefore specific embodiments of the solid insulated switchgear switch contact temperature calculation apparatus can be seen in the foregoing embodiments of the solid insulated switchgear switch contact temperature calculation method, for example, the model establishing module 100, the current temperature obtaining module 200, and the calculation module 300 are respectively configured to implement steps S101, S102, and S103 in the solid insulated switchgear switch contact temperature calculation method, so that the specific embodiments thereof may refer to descriptions of corresponding partial embodiments, and are not described herein again.
The temperature calculation device for the switch contact of the solid insulation switch cabinet, provided by the invention, is characterized in that a plurality of groups of sample data are obtained in advance, a mathematical model among all influence factors is established by a partial least square method, and a functional relation between the temperature of a measuring point and the temperature of the switch contact of the solid insulation switch cabinet is determined, wherein the sample data contains a plurality of groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is positioned in a preset range around the switch contact; acquiring a current temperature value monitored by a measuring point; and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation. The method dynamically calculates the temperature of the contact of the circuit breaker based on the partial least square mathematical modeling method, does not need to consider physical parameters of an outer wrapping insulating layer and a contact material, and facilitates calculation of the temperature of the contact. The method has the advantages of strong universality, simple realization and low cost, and can provide reference for accurately and timely mastering the running state of the switch cabinet.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The method and the device for calculating the switch contact temperature of the solid insulation switch cabinet provided by the invention are described in detail above. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (8)
1. A method for calculating the temperature of a switch contact of a solid insulation switch cabinet is characterized by comprising the following steps:
obtaining multiple groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of a switch contact of a solid insulation switch cabinet, wherein the sample data comprises multiple groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is located in a preset range around the switch contact;
acquiring a current temperature value monitored by the measuring point;
and calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation.
2. The method of claim 1, wherein the mathematical model is established between the influencing factors by a partial least squares method, and the determining of the functional relationship between the temperature of the measurement point and the temperature of the switch contact of the solid insulated switchgear comprises:
taking the temperature of the measuring point as a dependent variable y and taking each influencing factor as an independent variable x1、x2、x3、x4、x5、x6、x7Acquiring n groups of sample data, and forming a dependent variable matrix Y ═ Y]n×1And the argument matrix X ═ X1x2x3x4x5x6x7]n×7Normalizing Y and X to obtain normalized dependent variable matrixAnd independent variable matrix
Wherein x isijIs the value of the jth variable, y, for the ith sample in the matrix XiRepresenting the ith sample value in matrix Y;
from E0Sequentially extracting principal components, performing regression analysis of dependent variable to independent variable, converting into regression equation of Y to X, and determining
The regression coefficient β in1～β7。
3. Solid insulated switchgear cabinet according to claim 2The switch contact temperature calculation method is characterized in that the influence factors specifically comprise: x is the number of1Corresponding to the thickness d of the epoxy resin insulating layer; x is the number of2The horizontal distance r from the installation position of the corresponding thermocouple temperature sensor to the switch contact; x is the number of3Corresponding to the actual temperature of the switch contact0；x4Corresponding to the temperature of the switch cabinet1；x5Corresponding to the ambient temperature of the switch cabinet2；x6Working current i corresponding to the bus of the connecting switch contact; x is the number of7Corresponding to the cabinet volume v of the switch cabinet; y corresponds to the temperature Q of the measurement point.
4. The method for calculating the switch contact temperature of the solid insulated switchgear according to claim 2, wherein the normalizing Y and X comprises:
by usingThe standardized treatment is carried out, and the standard treatment is carried out,
wherein,represents the variable xjAverage value of (1), sjDenotes xjThe standard deviation of (a) is determined,denotes the average value of y, syThe standard deviation of y is indicated.
5. The method for calculating the temperature of the switch contact of the solid insulated switchgear cabinet according to claim 4, wherein the slave E is0After the main components are sequentially extracted, the method also comprises the following steps:
calculating the contribution degree of the extracted components, and judging that the contribution degree of the extracted components is significant when the contribution degree is greater than a preset threshold value.
6. The method for calculating the switch contact temperature of the solid insulated switchgear cabinet according to any one of claims 1 to 5, wherein the obtaining the current temperature value monitored by the measurement point comprises:
and monitoring the current temperature value in real time through a temperature sensor arranged at the measuring point, wherein the measuring point is positioned on the outer wall of the insulating layer of the switch contact.
7. The method for calculating the temperature of the switch contact of the solid insulated switchgear according to claim 6, wherein after calculating the temperature value of the switch contact of the solid insulated switchgear through the functional relationship, the method further comprises:
and displaying the calculated temperature value to a user.
8. A solid insulated switchgear switch contact temperature calculation device, comprising:
the model establishing module is used for acquiring a plurality of groups of sample data in advance, establishing a mathematical model among all influence factors through a partial least square method, and determining a functional relation between the temperature of a measuring point and the temperature of a switch contact of a solid insulation switch cabinet, wherein the sample data comprises a plurality of groups of influence factor data influencing the temperature change of the switch contact, and the measuring point is positioned in a preset range around the switch contact;
the current temperature acquisition module is used for acquiring a current temperature value monitored by the measurement point;
and the calculation module is used for calculating the temperature value of the switch contact of the solid insulation switch cabinet according to the current temperature value and the functional relation.
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| CN112214939A (en) * | 2020-09-29 | 2021-01-12 | 国网福建省电力有限公司 | Switch cabinet heater installation mode optimization method based on orthogonal test design |
| CN112235170A (en) * | 2020-10-19 | 2021-01-15 | 广州臻悦信息科技有限责任公司 | Intelligent home gateway for detecting equipment failure in real time |
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