CN106776332B - Testing device and testing method for testing two-dimensional code decoding algorithm - Google Patents

Testing device and testing method for testing two-dimensional code decoding algorithm Download PDF

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CN106776332B
CN106776332B CN201611223289.9A CN201611223289A CN106776332B CN 106776332 B CN106776332 B CN 106776332B CN 201611223289 A CN201611223289 A CN 201611223289A CN 106776332 B CN106776332 B CN 106776332B
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axis
processor
dimensional code
deflection angle
code decoding
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CN106776332A (en
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不公告发明人
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East China Jiangsu Big Data Trading Center Co., Ltd
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East China Jiangsu Big Data Trading Center Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

Abstract

The invention discloses a test method for testing a two-dimensional code decoding algorithm. A test device for testing a two-dimensional code decoding algorithm is adopted, and the test device comprises: the system comprises a PC, a hardware circuit, a light source and a mechanical platform, wherein the PC is connected with the hardware circuit, the light source is hung upside down on the mechanical platform, the PC is used for storing results and decoding a two-dimensional code algorithm, the light source provides illumination intensity for image acquisition, and the hardware circuit is used for controlling and adjusting the position of a horizontal platform in the mechanical platform, image acquisition, decoding operation of the two-dimensional code algorithm and data transmission and display of test results; the testing method comprises the steps of (1) selecting a testing mode, (2) adjusting the position of a horizontal platform, (3) collecting images, and (4) decoding operation. The method and the device well solve the problems in the prior art, and can be used for generating activity for testing and verifying the algorithm capability of the two-dimensional code.

Description

Testing device and testing method for testing two-dimensional code decoding algorithm
Technical Field
The invention relates to a testing device and a testing method for testing a two-dimensional code decoding algorithm.
Background
The two-dimension code simulation algorithm is developed, various conditions of the mobile phone in the real scanning of the two-dimension code need to be simulated, and whether the two-dimension code decoding algorithm meets the requirements of the original design and the real due to the fact that a certain height and a certain deflection angle exist between the mobile phone and the two-dimension code to be scanned. Therefore, a newly developed set of two-dimensional code decoding algorithm has to be tested under various complex conditions to verify the decoding capability of the algorithm. For example, different two-dimensional codes are perpendicular to the camera, different deflection angles and different illumination intensities for test verification, and test data results are stored or displayed. And finally checking whether the test result can reach the design standard.
In the existing testing technology, a servo mechanism is manually controlled to rotate, and vertical distance change and deflection angle change are simulated to test a two-dimensional code decoding algorithm. In the prior art, the capacity of randomly lifting on a Z axis and rotating two-dimensional code angles on an X axis and a Y axis is lacked; the two-dimensional code angle cannot be monitored and calibrated in real time; the test requirements of various actual two-dimensional code pictures cannot be met; the data transmission speed is low, and the data storage capacity is small; lack of switching between automatic and manual test modes; the automatic test in the dark and the low test efficiency. Therefore, a relatively perfect automatic test system is urgently needed, the test efficiency is improved, and the algorithm test verification progress is accelerated.
Disclosure of Invention
The technical problem to be solved by the invention is that a test system in the prior art can not test the decoding capability of a two-dimensional code algorithm more perfectly, automatically and conveniently, and provides a test device and a test method for testing the two-dimensional code decoding algorithm; the two-dimensional code angle can be monitored and calibrated in real time; various electronic pictures can be stored, and the test requirements of various actual two-dimensional code pictures are met; the data transmission speed is high, and the storage capacity is large; the automatic test mode is provided and the manual test mode can be switched; the automatic test can be carried out in the dark and the test efficiency is improved.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows:
a testing device for testing a two-dimensional code decoding algorithm comprises a PC (personal computer), a hardware circuit module, a light source and a mechanical platform;
the mechanical platform comprises a metal frame for hanging the light source and a horizontal platform with variable Z-axis direction, X-axis deflection angle and Y-axis deflection angle;
the light source is hung upside down on the top end of the metal shelf and used for providing required illumination intensity;
the hardware circuit comprises an image acquisition module, a mechanical control module and a system power supply module;
the mechanical control module is connected with the mechanical platform and is used for controlling the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis;
the image acquisition module is used for acquiring images and is connected with the mechanical control module,
the power supply module is used for supplying power to the hardware circuit;
and the PC is used as an upper computer and is connected with the image acquisition module.
In the above technical solution, further, the mechanical control module includes a MUC2 processor, a Z-axis motor lifter connected to the MUC2 processor, an X-axis rotation motor, a Y-axis rotation motor, a gravity accelerometer, a NANDFLASH, LCD lcd 1, and a key 2;
the MUC2 processor is used for controlling the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis;
the NANDFLASH is used for storing the collected electronic pictures;
the key 2 is used for selecting a test mode;
the LCD 1 is used for displaying test results and information;
the gravity accelerometer is used for detecting the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis;
the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis are used for controlling the adjustment of the Z axis direction of the horizontal platform and the adjustment of the deflection angles of the X axis and the Y axis.
Furthermore, the image acquisition module also comprises an MCU1 processor, a light source intensity control module connected with the MCU1 processor, a camera, an SRAM, an LCD 2, a key 1, a PHY circuit and a UART;
the MCU1 processor is used for controlling the camera to acquire images;
the light source intensity control module is used for controlling the intensity of the light source;
the camera is positioned right above the horizontal platform and is used for collecting electronic pictures and supplementing the illumination intensity of a light source;
the LCD 2 is arranged on the horizontal platform controlled by a Z-axis motor lifter, an X-axis rotating motor and a Y-axis rotating motor and is used for displaying electronic pictures called from the NANDFLASH;
the SRAM is used for memory expansion;
the UART is connected between the PC and the MCU1 processor and is used for data transmission between the PC and the MCU1 processor;
the PHY circuit is connected between the PC and the MCU processor and is used for transmitting the acquired image at a high speed;
the key 1 can adjust the illumination intensity of the light source and control the MCU1 processor to perform single operation.
Further, the testing device for testing the two-dimensional code decoding algorithm is used for testing and verifying the capability of the two-dimensional code decoding algorithm.
The invention also provides a test method of the test device for testing the two-dimensional code decoding algorithm, which comprises the following steps:
(1) selecting a test mode through the MUC2 processor by inputting the key 2, entering the step (2) by an automatic test mode, and entering the step (3) by a manual test mode;
(2) automatic test mode:
A. calling any one electronic picture from the NANDFLASH to display on the LCD 2;
B. automatically controlling the horizontal platform to enter the z-axis direction adjustment and the x-axis and y-axis deflection angles through the mechanical module, monitoring and detecting the adjustment state, and entering the step C when the detection is passed;
the MCU2 processor is communicated with the MCU1 processor, test preparation is carried out, a light source is turned on, and light source intensity control is carried out;
the MCU1 processor controls a camera to acquire images, and the acquired images are stored in the SRAM;
E. performing two-dimensional code decoding operation on the image acquired by the image acquisition module;
F. the test result of the decoding operation is displayed on the LCD screen 1 and printed to the PC in a document form;
g, the MCU processor 2 receives the test completion signal and automatically carries out the next test;
(3) manual test mode:
A. the Z-axis direction, the x-axis deflection angle and the y-axis deflection angle of the horizontal platform are adjusted through manual control of a mechanical control module;
B. calling any one electronic picture of NANDFLASH to display on the LCD 2;
C. manually pressing the key 1 to adjust the light source illumination intensity;
D. manually pressing the key 1, and controlling a camera to perform single image acquisition through an MCU1 processor or performing single two-dimensional code decoding operation test according to the step E in the step (2);
E. the test result of the decoding operation is displayed on the LCD screen 1 and transmitted to the PC in the form of a document;
in the above test method, step B in step (2) further includes:
a. automatically setting a z-axis height threshold f0, an x-axis deflection angle threshold f1 and a y-axis deflection angle threshold f2 respectively;
b, automatically controlling a z-axis motor lifter by the MUC2 processor to enable the distance height between the horizontal platform and the camera to reach a z-axis height threshold value f0, and entering the step c;
c, automatically controlling an X-axis motor by the MUC2 processor, adjusting the deflection angle of the horizontal platform on the X axis, detecting the deflection angle as a deflection angle threshold value f1 by using a gravity accelerator, and entering the step d;
and d, automatically controlling a Y-axis motor by the MUC2 processor, adjusting the deflection angle of the horizontal platform on the Y axis, detecting the deflection angle as a deflection angle threshold value f2 by using a gravity accelerator, and passing the detection.
Further, step E in step (2) includes:
a. the two-dimensional code decoding algorithm is placed on the MCU1 processor: the MCU1 processor directly carries out two-dimensional code decoding operation on the collected image, and the test result is displayed on the LCD screen 1 and transmitted to the PC in a document form; or
b. The two-dimensional code decoding algorithm is placed on a PC: and uploading the acquired image through the PHY, performing two-dimensional code decoding operation on the PC, and storing the two-dimensional code decoding operation result in the PC in a document form.
Further, step a in step (3) includes:
and manually pressing the key 2 to control the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis, and adjusting the Z axis direction, the X axis deflection angle and the Y axis deflection angle of the horizontal platform.
Further, in the step (3), the sequence of the step a and the step b is interchanged.
Further, the step (3) further comprises:
manually pressing the key 1 n times to perform two-dimensional code decoding operation n times, and performing two-dimensional code decoding operation once when pressing the key 1 once;
wherein n is not less than 1 and n is an integer.
The present invention selects either the automatic test mode or the manual test mode via the MUC2 processor, button 2.
And the automatic test mode can automatically control the z-axis motor lifter, the X-axis rotating motor, the Y-axis rotating motor, the angle monitoring and calibration and the picture replacement, informs the MCU1 that the test mode of the processor is the automatic test mode, and informs the MCU2 that the processor carries out the next link test after the MCU1 finishes the test.
In the manual control mode, pictures stored in NANDFALSH can be randomly called to be displayed on the LCD 2, the lifting of the motor lifter along the z axis and the angular deflection of the rotating motors along the X and Y axes can be controlled, and the MCU1 processor can perform single two-dimensional code algorithm decoding operation or acquire images and upload the images to a PC (personal computer) through the key 1.
The MCU2 processor controls the lift of z axis motor lift, X and Y axis pivot motor, and the simulation reality life cell-phone sweeps the two-dimensional code, exists certain height and deflection angle between cell-phone camera and the two-dimensional code, and whether the check two-dimensional code decoding algorithm accords with the requirement of application in design requirement and reality. The two-dimensional code image has the multiple types, collects the electron picture in advance, deposits in the NANDFLASH, during the test, only needs to call the picture from NANDFLASH, shows on LCD 2, and button 2 can select the test mode.
The MCU1 processor is mainly used for collecting images, and because the image data volume is large, the memory capacity of the conventional MCU processor is small, and SRAM is used for memory expansion, thereby improving the system efficiency. The adjustable illumination intensity of button 1 simulates and tests under different illumination intensities, and when the MCU2 processor works in a manual mode, the button 1 can also allow the MCU1 processor to perform single operation.
The two-dimensional code decoding algorithm is placed in the MCU1 processor, the collected image is directly decoded on the MCU1 processor, and the decoded information can be displayed on the LCD 1 or transmitted to a PC. When the two-dimensional code algorithm is placed on an upper computer for decoding operation, the PHY circuit is used, and the data transmission efficiency is improved.
The beneficial effects of the invention are that,
the method has the advantages that the method can adapt to various test modes and can be selected;
providing a test scene for testing;
the third effect is that the integrity, the automation degree and the efficiency of the test system are improved;
and fourthly, the testing precision is improved.
Drawings
The invention is further illustrated with reference to the following figures and examples.
FIG. 1 is a system framework diagram of the present invention.
FIG. 2 is a flow chart of the automatic testing of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
FIG. 1 is a hardware block diagram of the system of the present invention, which describes in detail the composition and connection relationship of a PC, a graphic acquisition module, and a mechanical module in a hardware system.
Fig. 2 is a flow chart of the automatic testing method of the present invention, which mainly describes the flow of automatic testing, and the manual testing process is similar to the automatic testing process.
Detailed explanation and description of each figure
Example 1:
the embodiment provides a testing device for testing a two-dimensional code decoding algorithm, which comprises a PC (personal computer), a hardware circuit, a light source and a mechanical platform;
the mechanical platform comprises a metal frame for hanging the light source and a horizontal platform with variable Z-axis direction, X-axis deflection angle and Y-axis deflection angle;
the light source is hung upside down on the top end of the metal shelf and used for providing required illumination intensity;
as shown in fig. 1, the hardware circuit includes an image acquisition module, a mechanical module and a system power supply module;
the mechanical module is connected with the horizontal platform and is used for controlling the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis;
the image acquisition module is used for acquiring images and is connected with the mechanical module,
the power supply module is used for supplying power to the hardware circuit;
and the PC is used as an upper computer and is connected with the image acquisition module.
The mechanical control module comprises a MUC2 processor, a Z-axis motor lifter connected with the MUC2 processor, an X-axis rotating motor, a Y-axis rotating motor, a gravity accelerator, a NANDFLASH, LCD liquid crystal display screen 1 and a key 2; the MUC2 processor is used for controlling the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis; the NANDFLASH is used for storing the collected electronic pictures; the key 2 is used for selecting a test mode; the LCD 1 is used for displaying test results and information; the gravity accelerometer is used for detecting the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis; the rotation motor along the Z axis, the rotation motor along the X axis and the rotation motor along the Y axis are used for controlling the adjustment of the Z axis direction of the horizontal platform and the adjustment of the deflection angles of the X axis and the Y axis.
The image acquisition module also comprises an MCU1 processor, a light source intensity control module connected with the MCU1 processor, a camera, an SRAM, an LCD 2, a key 1, a PHY circuit and a UART; the MCU1 processor is used for controlling the camera to acquire images; the light source intensity control module is used for controlling the intensity of the light source; the camera is positioned right above the horizontal platform and is used for collecting electronic pictures and supplementing the illumination intensity of a light source; the LCD 2 is arranged on the horizontal platform controlled by a Z-axis motor lifter, an X-axis rotating motor and a Y-axis rotating motor and is used for displaying electronic pictures called from the NANDFLASH; the SRAM is used for memory expansion; the UART is connected between the PC and the MCU1 processor and is used for data transmission between the PC and the MCU1 processor; the PHY circuit is connected between the PC and the MCU processor and is used for transmitting the acquired image at a high speed; the key 1 can adjust the illumination intensity of the light source and control the MCU1 processor to perform single operation.
The testing device for testing the two-dimensional code decoding algorithm is used for testing and verifying the capability of the two-dimensional code decoding algorithm.
As shown in fig. 2, this embodiment further provides a method for testing a testing apparatus for testing a two-dimensional code decoding algorithm, where the method includes the following steps:
(1) the control key 2 selects the automatic operating mode,
(2) calling any one electronic picture from the NANDFLASH to display on the LCD 2;
(3) automatically setting a z-axis height threshold f0, an x-axis deflection angle threshold f1 and a y-axis deflection angle threshold f 2; the MUC2 processor automatically controls the Z-axis motor lifter to enable the distance height between the horizontal platform and the camera to reach a Z-axis height threshold value f 0; the MUC2 processor automatically controls the X rotating shaft motor, adjusts the deflection angle of the horizontal platform on the X axis, and detects the deflection angle as a deflection angle threshold value f1 by using a gravity accelerator; the MUC2 processor automatically controls the Y-axis motor, adjusts the deflection angle of the horizontal platform on the Y axis, and detects the deflection angle as a deflection angle threshold value f2 by using a gravity accelerator;
(4) the MCU2 processor communicates with the MCU1 processor to prepare for testing, turn on the light source, and control the intensity of the light source
(5) The MCU1 processor controls the camera to collect the image, the collected image is stored in the SRAM
(6) The two-dimensional code decoding operation is carried out on the image acquired by the image acquisition module, and the two-dimensional code decoding algorithm is placed on an MCU1 processor: the MCU1 processor directly carries out two-dimensional code decoding operation on the collected image, and the test result is displayed on the LCD screen 1 and transmitted to the PC in a document form;
(7) the MCU processor 2 controls the MUC2 processor to automatically perform the next round of test through the software platform.
Example 2:
as shown in fig. 2, in this embodiment, on the basis of embodiment 1, a two-dimensional code decoding algorithm is placed on a PC, and the test method is as follows:
the step (6) is as follows: the two-dimensional code decoding operation is carried out on the image acquired by the image acquisition module, the acquired image is uploaded to a PC (personal computer) through a PHY (physical layer) circuit, the two-dimensional code decoding operation is carried out on the PC, and the two-dimensional code decoding operation result is stored on the PC in a document form.
Example 3:
in this embodiment, a manual test mode is selected and used on the basis of embodiment 1, and the test method is as follows:
(1) control key 2 selects manual working mode
(2) And manually pressing the key 2 to control the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis, and adjusting the Z axis direction, the X axis deflection angle and the Y axis deflection angle of the horizontal platform.
(3) Calling any one electronic picture of NANDFLASH to display on the LCD 2;
(4) manually pressing the key 1 to adjust the light source illumination intensity;
(5) the two-dimensional code decoding algorithm is placed in the MCU1 processor, the key 1 is manually pressed for 1 time, the camera is controlled by the MCU1 processor to acquire images for a single time,
(6) manually pressing the key 1 for 1 time, performing two-dimensional code decoding operation through the MCU1 processor, displaying a test result on the LCD screen 1, and printing the test result to a PC (personal computer) in a document form;
(7) the test result of the decoding operation is displayed on the LCD screen 1 and the document is printed on the PC.
Example 4:
this example further optimizes the procedure of the manual test mode based on example 3, and the method is as follows:
(1) the control key 2 selects a manual test mode;
(2) calling any one electronic picture of NANDFLASH to display on the LCD 2;
(3) and manually pressing the key 2 to control the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis, and adjusting the Z axis direction, the X axis deflection angle and the Y axis deflection angle of the horizontal platform.
(4) Manually pressing the key 1 to adjust the light source illumination intensity;
(5) the two-dimensional code decoding algorithm is placed in the MCU1 processor, the key 1 is manually pressed for 1 time, the camera is controlled by the MCU1 processor to acquire images for a single time,
(6) manually pressing the key 1 for 1 time, performing two-dimensional code decoding operation through the MCU1 processor, displaying a test result on the LCD screen 1, and printing the test result to a PC (personal computer) in a document form;
(7) the test result of the decoding operation is displayed on the LCD liquid crystal display screen 1 and printed to a PC in a document form.
Example 5:
in this embodiment, on the basis of embodiment 3, it is further described that the number of times of decoding operations of the two-dimensional code can be controlled by pressing the key 1, and the method described in embodiment 3 includes the following additional steps:
(8) manually pressing the key 1 for 5 times, and performing two-dimensional code decoding operation for 5 times by the MCU1 processor, wherein the two-dimensional code decoding operation is performed once when the key 1 is pressed once;
(9) and (8) sequentially displaying the test results of the 5 decoding operations on the LCD screen 1, and respectively printing the 5 test results to a PC in a document form.
Although the illustrative embodiments of the present invention have been described above to enable those skilled in the art to understand the present invention, the present invention is not limited to the scope of the embodiments, and it is apparent to those skilled in the art that all the inventive concepts using the present invention are protected as long as they can be changed within the spirit and scope of the present invention as defined and defined by the appended claims.

Claims (3)

1. A test method for a test device based on a two-dimensional code decoding algorithm comprises a PC (personal computer), a hardware circuit, a light source and a mechanical platform;
the mechanical platform comprises a metal frame for hanging the light source and a horizontal platform with variable Z-axis direction, X-axis deflection angle and Y-axis deflection angle;
the light source is hung upside down on the top end of the metal shelf and used for providing required illumination intensity;
the hardware circuit comprises an image acquisition module, a mechanical control module and a system power supply module;
the mechanical control module is connected with the horizontal platform and is used for controlling the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis;
the image acquisition module is used for acquiring images and is connected with the mechanical control module;
the PC is used as an upper computer and is connected with the image acquisition module;
the mechanical control module comprises a MUC2 processor, a Z-axis motor lifter connected with the MUC2 processor, an X-axis rotating motor, a Y-axis rotating motor, a gravity accelerator, a NANDFLASH, LCD liquid crystal display screen 1 and a key 2;
the MUC2 processor is used for controlling a Z-axis motor lifter, an X-axis rotating motor and a Y-axis rotating motor, and controlling the adjustment of the Z-axis direction and the adjustment of the deflection angles of the X-axis and the Y-axis of the horizontal platform;
the NANDFLASH is used for storing the collected electronic pictures;
the key 2 is used for selecting a test mode;
the LCD 1 is used for displaying test results and information;
the gravity accelerometer is used for detecting the adjustment of the z-axis direction of the horizontal platform and the adjustment of the deflection angles of the x-axis and the y-axis;
the image acquisition module also comprises an MCU1 processor, a light source intensity control module connected with the MCU1 processor, a camera, an SRAM, an LCD 2, a key 1, a PHY circuit and a UART;
the MCU1 processor is used for controlling the camera to acquire images;
the light source intensity control module is used for controlling the intensity of the light source;
the camera is positioned right above the horizontal platform and is used for collecting electronic pictures and supplementing the illumination intensity of a light source;
the LCD 2 is arranged under the control of a Z-axis motor lifter, an X-axis rotating motor and a Y-axis rotating motor;
the horizontal platform is used for displaying an electronic picture called from the NANDFLASH;
the SRAM is used for memory expansion;
the UART is connected between the PC and the MCU1 processor and is used for data transmission between the PC and the MCU1 processor;
the PHY circuit is connected between the PC and the MCU1 processor and is used for transmitting the acquired images at a high speed;
the key 1 can adjust the illumination intensity of the light source and control the MCU1 processor to perform single operation;
the method is characterized in that: the method comprises the following steps:
(1) selecting a test mode through the MCU2 processor by inputting the key 2, entering the step (2) by an automatic test mode, and entering the step (3) by a manual test mode;
(2) automatic test mode:
A. calling any one electronic picture from the NANDFLASH to display on the LCD 2;
B. through mechanical module automatic control horizontal platform advances the adjustment of z axle position, the adjustment of x axle and y axle deflection angle, control and detect the adjustment state, specifically:
a. automatically setting a z-axis height threshold f0, an x-axis deflection angle threshold f1 and a y-axis deflection angle threshold f2 respectively;
b, automatically controlling a z-axis motor lifter by the MCU2 processor to enable the distance height between the horizontal platform and the camera to reach a z-axis height threshold value f0, and entering the step c;
c, automatically controlling an X-axis motor by the MCU2 processor, adjusting the deflection angle of the horizontal platform on the X axis, detecting the deflection angle as a deflection angle threshold value f1 by using a gravity accelerator, and entering the step d;
the MCU2 processor automatically controls a Y-axis motor, adjusts the deflection angle of the horizontal platform on the Y axis, detects the deflection angle as a deflection angle threshold value f2 by using a gravity accelerator, and enters the step C after detection;
the MCU2 processor is communicated with the MCU1 processor, test preparation is carried out, a light source is turned on, and light source intensity control is carried out;
the MCU1 processor controls a camera to acquire images, and the acquired images are stored in the SRAM;
E. performing two-dimensional code decoding operation on the image acquired by the image acquisition module;
F. the test result of the decoding operation is displayed on the LCD screen 1 and transmitted to the PC in a document form;
the MCU2 processor is controlled by the MCU2 processor through the software platform to automatically perform the next test;
(3) manual test mode:
A. the Z-axis direction, the x-axis deflection angle and the y-axis deflection angle of the horizontal platform are adjusted through manual control of a mechanical control module;
B. calling any one electronic picture of NANDFLASH to display on the LCD 2;
C. manually pressing the key 1 to adjust the light source illumination intensity;
D. manually pressing the key 1, and controlling a camera to perform single image acquisition through an MCU1 processor or performing single two-dimensional code decoding operation test according to the step E in the step (2);
E. the test result of the decoding operation is displayed on the LCD screen 1 or transmitted to the PC in a document form;
in the step (3), the sequence of the step a and the step b is interchanged;
the step (3) further comprises:
manually pressing the key 1 n times to perform two-dimensional code decoding operation n times, and performing two-dimensional code decoding operation once when pressing the key 1 once;
wherein n is not less than 1 and n is an integer.
2. The method for testing the testing device based on the two-dimensional code decoding algorithm according to claim 1, wherein the method comprises the following steps: the step E in the step (2) comprises the following steps:
a. the two-dimensional code decoding algorithm is placed on the MCU1 processor: the MCU1 processor directly carries out two-dimensional code decoding operation on the collected image, and the test result is displayed on the LCD screen 1 and transmitted to the PC in a document form;
or
b. The two-dimensional code decoding algorithm is placed on a PC: and uploading the acquired image through the PHY, performing two-dimensional code decoding operation on the PC, and storing the two-dimensional code decoding operation result in the PC in a document form.
3. The method for testing the testing device based on the two-dimensional code decoding algorithm according to claim 1, wherein the method comprises the following steps: the step A in the step (3) comprises the following steps:
and manually pressing the key 2 to control the motor lifter along the Z axis, the motor rotating along the X axis and the motor rotating along the Y axis, and adjusting the Z axis direction, the X axis deflection angle and the Y axis deflection angle of the horizontal platform.
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