CN106771585A - A kind of data processing method of microwave dark room quiet zone reflectivity level - Google Patents

Abstract

Include the invention discloses a kind of data processing method of microwave dark room quiet zone reflectivity level, the step of the processing method：The measuring system built using vector network analyzer measures reference direction field intensity E under the conditions of wide-band_refWith field intensity E in direction to be measured_freq, each frequency is stored according to the form of " angle field intensity value " to test data；Measurement obtains pattern levels of the reception antenna with angle change；Data are processed, reflective level R is calculated.The advantage of the invention is that proposing a kind of new wideband data method of testing, and a kind of data processing method of microwave dark room quiet zone reflectivity level is provided, the data obtained by test are calculated reflective level, it is low so as to solve single-frequency point testing efficiency in the prior art, and how the data that test is obtained are not processed to obtain the problem of the reflective level in darkroom dead zone in the prior art.

Description

A kind of data processing method of microwave dark room quiet zone reflectivity level

Technical field

The invention belongs to microwave dark room quiet zone performance assessment technology field, more particularly to a kind of microwave dark room dead zone reflection electricity Flat data processing method.

Background technology

When electromagnetic wave incident to metope, ceiling, ground, most electromagnetic waves are absorbed, and are transmitted, reflected few. Microwave also has some characteristics of light, by the implication of optical dark room, therefore is named as microwave dark room.Antenna, radar are done in darkroom The measuring accuracy and efficiency of equipment under test against noise jamming, can be improved Deng radio communication product and electronic product test.

Microwave dark room is widely used in the neck such as antenna performance parameters test, radio frequency Hardware-in-loop Simulation Experimentation, RCS performance tests Domain, the currently research to microwave dark room is concentrated mainly on the following aspects：

1) microwave dark room quiet zone performance theoretical prediction；

2) microwave dark room space layout design；

3) microwave dark room quiet zone reflectivity level method of testing；

4) absorbing material performance and its layout designs；

Above research contents, is not directed to that how the data that test is obtained are processed to obtain the reflection in darkroom dead zone Level.And existing method of testing is using the pattern of " transmitting antenna connects signal source, and reception antenna connects receiver ", for using The method of " vector network analyzer " without reference to.

The content of the invention

Goal of the invention：The present invention proposes a kind of new wideband data method of testing, and it is anti-to provide a kind of microwave dark room dead zone The flat data processing method of radio, the data obtained by test are calculated reflective level, so as to solve single-frequency in the prior art Point testing efficiency is low, and how the data that test is obtained is not processed to obtain darkroom dead zone in the prior art The problem of reflective level.

Technical scheme：To achieve the above object, the technical solution adopted by the present invention is：

The step of a kind of data processing method of microwave dark room quiet zone reflectivity level, processing method, includes：

S1, the measuring system built using vector network analyzer measures reference direction field intensity E under the conditions of wide-band_refWith Field intensity E in direction to be measured_freq, each frequency is stored according to the form of " angle-field intensity value " to test data；

S2, measurement obtains pattern levels of the reception antenna with angle change；

Data are processed by S3, are calculated reflective level R.

Further, the field intensity E in direction to be measured_freqIt is field intensity of the throw line to be measured on level, vertical, fore-and-aft direction Amount.

Further, to reference direction field intensity E in the step S1_refWith field intensity E in direction to be measured_freqMeasuring method, its step Suddenly include：Transmitting antenna is connected to using a port of vector network analyzer, reception antenna is accessed in another port, then distinguishes Successively to reference direction field intensity E under the conditions of wide-band_refWith field intensity E in direction to be measured_freqMeasure.

Further, in the step S3, data are processed, is calculated the concrete operation step bag of reflective level R Include：

S31, the test data E that will be stored_refAnd E_freqCurve is drawn, maximum standing wave position is primarily determined that；

S32, curve E is sought using difference program_freqDifference value；

S33, according to curve E_freqDifference value judge maximum and minimum position, and store；

S34, according to maximum position point, draws maximum envelope E_max；

S35, according to minimum location point, draws minimum envelope E_min；

S36, largest enveloping width is tried to achieve by maximum envelope and minimum envelope, is designated as D, wherein, D=max {E_max-E_min}；

S37, tries to achieve the corresponding maximum standing wave location point Φ of largest enveloping width D_D；

S38, tries to achieve maximum standing wave location point Φ_DLocate the average value E of envelope_aver；

S39, according to maximum standing wave location point Φ_DThe average value E at place_averWith reference direction field intensity E_ref, obtain reception antenna Pattern levels A；

S310, reflective level R is calculated according to reflective level formula.

Further, in the step S310 shown in reflective level formula such as formula (1)：

Wherein, R is reflective level；E_rTo travel to the synthesis back wave inside dead zone；E_dIt is straight inside dead zone to travel to Up to ripple；A is reception diagram level；B is composite signal maximum；C is composite signal minimum value；D be curve on most Big envelope width.

Beneficial effect：Compared with prior art, the present invention has advantages below：

1) broadband sweep check is realized, testing efficiency can be greatly improved；

2) automaticity of data processing, and the visualization that result shows are improved.

Brief description of the drawings

Fig. 1 is reflective level flow chart of data processing figure of the invention；

Fig. 2 is the original test data curve of embodiments of the invention；

Fig. 3 is the extreme value envelope of embodiments of the invention；

Fig. 4 is the reception diagram level of embodiments of the invention.

Specific embodiment

The step of a kind of data processing method of microwave dark room quiet zone reflectivity level, processing method, includes：

S1, the measuring system built using vector network analyzer measures reference direction field intensity E under the conditions of wide-band_refWith Field intensity E in direction to be measured_freq, each frequency is stored according to the form of " angle-field intensity value " to test data；

S2, measurement obtains pattern levels of the reception antenna with angle change；

Data are processed by S3, are calculated reflective level R.

Foregoing field intensity E in direction to be measured_freqIt is field intensity amount of the throw line to be measured on level, vertical, fore-and-aft direction.

To reference direction field intensity E in abovementioned steps S1_refWith field intensity E in direction to be measured_freqMeasuring method, its step includes： Transmitting antenna is connected to using a port of vector network analyzer, reception antenna is accessed in another port, then exists successively respectively To reference direction field intensity E under the conditions of wide-band_refWith field intensity E in direction to be measured_freqMeasure；Broadband can disposably be measured Under the conditions of field intensity data.

In abovementioned steps S3, data are processed, the concrete operation step for being calculated reflective level R includes：

S31, the test data E that will be stored_refAnd E_freqCurve is drawn, maximum standing wave position is primarily determined that；

S32, curve E is sought using difference program_freqDifference value；

S33, according to curve E_freqDifference value judge maximum and minimum position, and store；

S34, according to maximum position point, draws maximum envelope E_max；

S35, according to minimum location point, draws minimum envelope E_min；

S36, largest enveloping width D is tried to achieve by maximum envelope and minimum envelope；

S37, tries to achieve the corresponding maximum standing wave location point Φ of largest enveloping width D_D；

S38, tries to achieve maximum standing wave location point Φ_DLocate the average value E of envelope_aver；

S39, according to maximum standing wave location point Φ_DThe average value E at place_averWith reference direction field intensity E_ref, obtain reception antenna Pattern levels A；

S310, reflective level R is calculated according to reflective level formula.

In abovementioned steps S36, D=max { E_max-E_min}；

Shown in reflective level formula such as formula (1) in abovementioned steps S310：

Wherein, R is reflective level；E_rTo travel to the synthesis back wave inside dead zone；E_dIt is straight inside dead zone to travel to Up to ripple；A is reception diagram level；B is composite signal maximum；C is composite signal minimum value；D be curve on most Big envelope width.

The present invention is further described with reference to embodiment.

As shown in figure 1, being reflective level flow chart of data processing figure of the invention；

Embodiment one；In certain microwave dark room, the field intensity value for measuring one of frequency with angle change is as shown in the table.

The field strength measurement value of table 1

Original test data curve is as shown in Figure 2 in table 1.

Using flow chart of data processing as shown in Figure 1, envelope is obtained as shown in figure 3, obtaining largest enveloping width D accordingly =0.95dB；

The pattern levels that measurement obtains reception antenna are as shown in Figure 4；

According to D present positions, with reference to Fig. 4, A=-39.46dB is tried to achieve；

According to formula (1),Try to achieve R=- 64.71dB, this matches with theoretical expectation values, so as to demonstrate program correctness and feasibility.

Therefore, this patent can conveniently realize the treatment to test data to obtain quiet zone reflectivity level, and calculate knot Fruit can realize visualization.

The above is only the preferred embodiment of the present invention, it should be pointed out that：For the ordinary skill people of the art For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should It is considered as protection scope of the present invention.

Claims (6)

1. a kind of data processing method of microwave dark room quiet zone reflectivity level, it is characterised in that：The step of processing method, wraps Include：

S1, the measuring system built using vector network analyzer measures reference direction field intensity E under the conditions of wide-band_refWith it is to be measured Direction field intensity E_freq, each frequency is stored according to the form of " angle-field intensity value " to test data；

S2, measurement obtains pattern levels of the reception antenna with angle change；

Data are processed by S3, are calculated reflective level R.

2. the data processing method of microwave dark room quiet zone reflectivity level according to claim 1, it is characterised in that：It is described to treat Survey direction field intensity E_freqIt is field intensity amount of the throw line to be measured on level, vertical, fore-and-aft direction.

3. the data processing method of microwave dark room quiet zone reflectivity level according to claim 1, it is characterised in that：The step To reference direction field intensity E in rapid S1_refWith field intensity E in direction to be measured_freqMeasuring method, its step includes：Use vector network point The a port of analyzer is connected to transmitting antenna, and reception antenna is accessed in another port, then right under the conditions of wide-band successively respectively Reference direction field intensity E_refWith field intensity E in direction to be measured_freqMeasure.

4. the data processing method of microwave dark room quiet zone reflectivity level according to claim 1, it is characterised in that：The step In rapid S3, data are processed, the concrete operation step for being calculated reflective level R includes：

S31, the test data E that will be stored_refAnd E_freqCurve is drawn, maximum standing wave position is primarily determined that；

S32, curve E is sought using difference program_freqDifference value；

S33, according to curve E_freqDifference value judge maximum and minimum position, and store；

S34, according to maximum position point, draws maximum envelope E_max；

S35, according to minimum location point, draws minimum envelope E_min；

S36, largest enveloping width D is tried to achieve by maximum envelope and minimum envelope；

S37, tries to achieve the corresponding maximum standing wave location point Φ of largest enveloping width D_D；

S38, tries to achieve maximum standing wave location point Φ_DLocate the average value E of envelope_aver；

S39, according to maximum standing wave location point Φ_DThe average value E at place_averWith reference direction field intensity E_ref, obtain reception antenna direction Figure level A；

S310, reflective level R is calculated according to reflective level formula.

5. the data processing method of microwave dark room quiet zone reflectivity level according to claim 4, it is characterised in that：The step In rapid S36, largest enveloping width D is solved to：D=max { E_max-E_min}。

6. the data processing method of microwave dark room quiet zone reflectivity level according to claim 4, it is characterised in that：The step Shown in reflective level formula such as formula (1) in rapid S310：

$R=20\lg \frac{E_r}{E_d}=A+20\lg \frac{{10}^{\frac{(B-C)}{20}}-1}{{10}^{\frac{(B-C)}{20}}+1}=A+20\lg \frac{{10}^{\frac{D}{20}}-1}{{10}^{\frac{D}{20}}+1}---\left(1\right)$

Wherein, R is reflective level；E_rTo travel to the synthesis back wave inside dead zone；E_dIt is through inside dead zone to travel to Ripple；A is reception diagram level；B is composite signal maximum；C is composite signal minimum value；D is the maximum on curve Envelope width.